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    Reliability and Failure of Electronic Materials and Devices
    Unavailable
    Reliability and Failure of Electronic Materials and Devices
    Unavailable
    Reliability and Failure of Electronic Materials and Devices
    Ebook623 pages12 hours

    Reliability and Failure of Electronic Materials and Devices

    By Milton Ohring

    5/5

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    Currently unavailable

    Currently unavailable

    About this ebook

    Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.
    The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise.
    • Discusses reliability and failure on both the chip and packaging levels
    • Handles the role of defects in yield and reliability
    • Includes a tutorial chapter on the mathematics of reliability
    • Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints
    • Considers defect detection methods and failure analysis techniques
    LanguageEnglish
    PublisherAcademic Press
    Release dateJun 12, 1998
    ISBN9780080516073
    Unavailable
    Reliability and Failure of Electronic Materials and Devices
    Author

    Milton Ohring

    Dr. Milton Ohring, author of two previously acclaimed Academic Press books,The Materials Science of Thin Films (l992) and Engineering Materials Science (1995), has taught courses on reliability and failure in electronics at Bell Laboratories (AT&T and Lucent Technologies). From this perspective and the well-written tutorial style of the book, the reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices; acquire skills in the mathematical handling of reliability data; and better appreciate future technology trends and the reliability issues they raise.

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