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    Microelectronics and Reliability Volume 23, Issue 3, 1983, Page 590. J s smith, e.g. Reliability of components, tubes, transistors and ICs. Part 7: the reliability of hybrid integrated circuits.

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    Microelectronics and Reliability Volume 23, Issue 3, 1983, Page 590. J s smith, e.g. Reliability of components, tubes, transistors and ICs. Part 7: the reliability of hybrid integrated circuits.

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    161 visualizações1 página

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    Enviado por

    tmbajenesco
    Microelectronics and Reliability Volume 23, Issue 3, 1983, Page 590. J s smith, e.g. Reliability of components, tubes, transistors and ICs. Part 7: the reliability of hybrid integrated circuits.

    Direitos autorais:

    Attribution Non-Commercial (BY-NC)
    Baixe no formato TXT, PDF, TXT ou leia online no Scribd
    Sinalizar o conteúdo como inadequado
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    Quick Search Title, abstract, keywords Author e.g. j s smith


    Journal/book title Volume Issue Page

    Microelectronics and Reliability


    Volume 23, Issue 3, 1983, Page 590

    PDF (109 K)

    doi:10.1016/0026-2714(83)91216-7
    Copyright © 1983 Published by Elsevier Science Ltd.
    World abstract on microelectronics and reliability 2. Reliability of components,
    tubes, transistors and ICs

    The reliability of electronic components. Part 7: the reliability of hybrid


    integrated circuits

    . Feinwerktechnik Messtechnik 90 (6), 309 (1982) (in German)

    Available online 11 February 2003.

    Microelectronics and Reliability


    Volume 23, Issue 3, 1983, Page 590

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