SCANNING PROBE

MICROSCOPES
Resolve details of surfaces down
to atomic level
Measure surface topography of
samples
Reveal details on x and y axes of
samples and on z-axis, which is
perpendicular to the surface.
Based on scanning the surface of
the sample in a xy raster pattern
with a sharp tip that moves up
and down along z-axis as the
topography changes.

The movement measured and

translated by a computer into an
image of surface topography.
Scanning Tunneling
Microscope (STM)
Capable of resolving features on
an atomic scale on the surface of
a conducting solid.
Principle : Sample surface is
scanned by a very fine metallic
tip in a raster pattern, based on
quantum mechanical tunneling.
ie., a small bias voltage is
applied between the sharp tip

and conducting sample, which

are few nanometers away.
Up and down motion of the tip
then reflects the topography of
the surface.
Components
Sample Scanner
Three piezoelectric (produce
current
under mechanical stress)
transducers arranged
orthogonally.
Application of a dc voltage along
its length varies the length of

each transducer, to move the tip

in a 3D pattern.
Modern scanning microscopes
use hollow tube piezoelectric
device.
Computer Interface
Computer control is an essential
part of STM. The computer
processes the voltages applied
to the x,y and Z piezo electric
elements and converts them into
contour map

Atomic Force Microscope

(AFM)
It permits resolution of individual
atoms on both conducting and
insulating surfaces.

A flexible force-sensing
cantilever stylus is scanned in
the raster pattern over the
surface of the sample.
The force acting between the
cantilever and the sample
surface causes minute
deflections of the cantilever,
which are detected by optical
means.
As in STM, the motion of the tip
or sometimes the sample is
achieved with a piezo electric
tube.

Cantilevers were cut from metal

foil and tips were made from
crushed diamond particles.

APPLICATIONS OF STM AND

AFM
To see surface structures with
unprecedented resolution
Characterzation of silicon
surfaces and defects on these
surfaces
In biotechnology, imaging of
materials like DNA, proteinenzyme interaction etc.
Under water imaging of
biological samples

STM of iodine atoms adsorbed

on platinum

AFM of DNA on mica