Escolar Documentos
Profissional Documentos
Cultura Documentos
Features
Y
Y
Y
Y
3.0V to 15V
100 nW (typ.)
0.45 VDD (typ.)
8 mA (min.) at VO e 0.5V
and VDD e 10V
Applications
Y
Y
Y
Y
Automotive
Data terminals
Instrumentation
Medical electronics
Y
Y
Y
Y
Alarm system
Industrial controls
Remote metering
Computers
Dual-In-Line Package
TL/F/5945 2
TL/F/5945 4
Top View
Top View
Order Number CD4009 or CD4010
CD4009M/CD4009C
CD4010M/CD4010C
TL/F/5945 1
TL/F/5945
TL/F/5945 3
RRD-B30M105/Printed in U. S. A.
February 1988
b 55 C to a 125 C
b 45 C to a 85 C
b 65 C to a 150 C
700 mW
500 mW
260 C
VSS a 3V to VSS a 15V
DC Electrical Characteristics
Symbol
Limits
Test
Conditions
(Volts)
Characteristics
VO
CD40XXM
b 55 C
CD40XXC
a 25 C
a 125 C
b 40 C
Units
a 25 C
a 85 C
Typ Max Min Max Min Max Min Typ Max Min Max
ICC
Quiescent Device
Current
5
10
0.3
0.5
0.01 0.3
0.01 0.5
20
30
3
5
0.03 3
0.05 5
42
70
PD
Quiescent Device
Dissipation/Package
5
10
1.5
5
0.05 1.5
0.1
5
100
300
15
50
0.15 15
0.5 50
210 mW
700 mW
Output Voltage
Low Level
High Level
5
10
5
10
0.01
0.01
0.05
0.05
0.01
0.01
4.99
9.99
4.99
9.99
0
0
5
10
5
10
5
10
5
10
1
2
1.6
3.2
1.4
2.9
1
2
1.5
3
1.5
3
2.25
4.5
2.25
4.5
2.25
4.5
VOL
VOH
0.01
0.01
mA
mA
0 0.01
0.05
0 0.01
0.05
5
4.95
10
9.95
4.95
9.95
4.99
9.99
4.99
9.99
0.9
1.9
1.4
2.9
1.5
3
1
2
1.6
3.2
1.4
2.9
1 2.25
2
4.5
1.5 2.25
3
4.5
1.5 2.25
3
4.5
2.1
5.6
b 0.9
b 0.4
3.6
9.6
b 1.5
b 0.72
V
V
V
V
Noise Immunity
(All Inputs)
VNL
CD4009M
VNL
CD4010M
VNH
IDN
IDP
IIN
Input Current
VO t 4.0
VO t 8.0
VO t 1.5
VO t 3.0
VO t 3.5
VO t 7.0
0.4
0.5
2.5
9.5
5 3.75
10
10
5 b1.85
10 b0.9
3
4
8
10
b 1.25 b 1.75
b 0.6 b 0.8
3
8
b 1.25
b 0.6
10
0.9
1.9
1.4
2.9
1.5
3
V
V
V
V
V
V
2.4
6.4
b1
b 0.48
mA
mA
mA
mA
10
pA
Note 1: This device should not be connected to circuits with the power on because high transient voltage may cause permanent damage.
Note 2: IDN and IDP are tested one output at a time.
AC Electrical Characteristics*
TA e 25 c, CL e 15 pF, unless otherwise noted. Typical Temperature coefficient for all values of VDD e 0.3%/ C
Test
Conditions
Limits
CD40XXM
Characteristics
VCC e VDD
VCC e VDD
Typ
Max
Min
Typ
Max
5
10
15
10
55
30
15
10
70
40
10
25
10
35
50
25
80
55
50
25
100
70
15
30
15
40
20
16
80
50
5
45
40
125
100
20
16
80
50
5
60
50
160
120
5
10
VDD e 10V
VCC e 5V
Transition Time:
High-to-Low Level (tTHL)
VCC e VDD
VCC e VDD
Any Input
Units
Min
VDD e 10V
VCC e 5V
Low-to-High Level (tPLH)
CD40XXC
VDD
(Volts)
5
10
5
10
ns
ns
ns
ns
pF
Typical Application
TL/F/5945 5
National Semiconductor
Europe
Fax: (a49) 0-180-530 85 86
Email: cnjwge @ tevm2.nsc.com
Deutsch Tel: (a49) 0-180-530 85 85
English Tel: (a49) 0-180-532 78 32
Fran3ais Tel: (a49) 0-180-532 93 58
Italiano Tel: (a49) 0-180-534 16 80
National Semiconductor
Hong Kong Ltd.
13th Floor, Straight Block,
Ocean Centre, 5 Canton Rd.
Tsimshatsui, Kowloon
Hong Kong
Tel: (852) 2737-1600
Fax: (852) 2736-9960
National Semiconductor
Japan Ltd.
Tel: 81-043-299-2309
Fax: 81-043-299-2408
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.