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REQUEST NO.

SEM & EDX ANALYSIS REPORT

Subject : Sem &EDX Foreign material

KCE P/N Cust.P/N: N/A Cust. Name: Request Date : Jun 30, 2007
Wo. D/C : Final Date : Jun 31, 2007
Request By Position Section : Division : Department :

Subject; Sem &EDX Foreign material

Quantity: 3 Sample
Equipment: Scanning electron microscope (SEM): Jeol- JSM 5600LV.

Coupon 1
SEM result:

SEM image: 50X SEM image: 500X

EDX result:

Spectrum result:

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FM: QA-LAB-12 REV. : 00
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Chart result:

080-1

60
50

40

30

20
10

0
C 51.84 O 38.21 Si 5.09 S 0.87 Ba 3.99

Element%

Coupon 2
SEM result:

SEM image: 50X SEM image: 500X

EDX result:

Spectrum result:

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Chart result:

080-2
80

60

40

20

0
C 67.94 Na 0.55 Si 2.57 Cl 0.28 Cu 0.31 Sn 0.68
O 23.03 Mg 0.15 S 2.07 Ca 0.14 Br 0.34 Ba 1.95

Element%

Coupon 3
SEM result:

SEM image: 50X SEM image: 500X

EDX result:

Spectrum result:

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Chart result:

080-3

80

60

40

20

0
C 79.67 O 17.93 Mg 0.13 Si 0.26 S 0.29 Cu 0.15 Ba 1.58

Element%

Test By Check By Approve By

QA-Technician QA-Engineer QA-Engineer

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FM: QA-LAB-12 REV. : 00