Table of Contents Session 01C 2011RM0171 Bayesian Planning of Optimal Step-Stress Accelerated Life Test Tao Yuan, Ohio

University (United States); Xi Liu, Ohio University (United States) 2011RM0174 Degradation test plan for Wiener degradation processes Julien Baussaron, RENAULT (France); Paul Schimmerling, RENAULT (France); Lo GervilleRache, University of Bordeaux (France); Mihaela Barreau-Gurin, LASQUO (France) 2011RM0102 Reliability Growth Test Design; Connecting Math to Physics Milena Krasich, Raytheon (USA) 2011RM0291 Pseudo-conjugated prior distribution for parametric ALT model Voiculescu Sorin, Bombardier Aerospace (Canada); Guerin Fabrice, LASQUO- University of Angers, FRANCE. (FRANCE)

Session 01D 2011RM0024 Reliability Prognostics for Electronics via Built-in Diagnostic Tools Tongdan Jin, Texas State University (United States) 2011RM0078 Modelling Fault Propagation in Phased Mission Systems using Petri Nets Rasa Remenyte-Prescott, University of Nottingham (UK); John Andrews, University of Nottingham (UK) 2011RM0085 Condition Recognition of Complex System Based on Multifractal Analysis Yanqing Lui, State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China (China); Jianmin Gao, Manufacturing Quality and Systems Engineering Institute, School of Mechanical Engineering, Xi'an Jiaotong University (China);

Jiang Hongquan, School of Mechanical Engineering,State Key Laboratory for Manufacturing System Engineering (China); Kun Chen, Xi'an Jiaotong University (China) 2011RM0031 Improving Software and System R&M with Better Error Processing Nathaniel Ozarin, The Omnicon Group Inc. (United States)

Session 02C 2011RM0218 Mastering safety and reliability in a Model Based process Robin Cressent, ENSI Bourges (France); vincent idasiak, prisme (france); frederic kratz, prisme ensi de bourges (France); Pierre David, Heudiasyc (France) 2011RM0292 A Spreadsheet Tool for Managing Probabilistic Risk Assessment Data Gary Epstein, Lockheed Martin Space Systems (usa); Michael Heckwolf, Reliability, Lockheed Martin Space Systems (USA) 2011RM0113 Mitigating technical risks by creative problem solving approaches Alexandra Ottong, Fraunhofer-Institute for Production Technology IPT (Germany); Robert Schmitt, WZL, RWTH Aachen University (Germany); Hans Gut, MAN Turbo AG Schweiz (Switzerland) 2011RM0089 AVAILABILITY GROWTH. MODELLING AND ASSESSMENT. Zigmund Bluvband, ALD (Israel); Sergey Porotsky, ALD Software (Israel)

Session 02D 2011RM0037 Quantifying the Value of Risk-Mitigation Measures for Launch Vehicles Elisabeth Morse, Valador, Inc. (United States); Joseph Fragola, Valador, Inc. (United States) 2011RM0064

Surviving the Lead Reliability Engineer Role in High Unit Value Projects Reinaldo Perez, Jet Propulsion Laboratory (USA) 2011RM0076 Developing the Stockpile Reliability Program Plan for a New Missile Eric Hunt, US Army Aviation and Missile Research, Development and Engineering Center (USA) 2011RM0225 Creating an Expert System Risk Assessment Tool for Precursor Analysis Anthony Hall, Information Systems Laboratories (USA)

Session 04C 2011RM0026 Reliability of Multi-State Systems subject to Competing Failures Liudong Xing, University of Massachusetts Dartmouth (United States); Gregory Levitin, Israel Electric Corporation; University of Electronic Science and Technology of China (Israel) 2011RM0029 Reliability Growth Planning for Discrete-Use Systems J. Brian Hall, U.S. Army Test and Evaluation Command (United States) 2011RM0243 Assessing Multi-Layered Social Networks using Reliability Models Kellie Schneider, Univeristy of Arkansas (USA); Chase Rainwater, University of Arkansas (USA); Ed Pohl, University of Arkansas (United States) 2011RM0284 System Reliability Models with Stress Covariates for Changing Load Profiles Akira Hada, Rutgers University (USA); David Coit, Rutgers University (USA); Mark Agnello, US Navy (USA); Keith Megow, US Navy (USA)

Session 05C 2011RM0143

System Reliability Assessment as Components Undergo AcceleratedTesting Wei Luo, National University of Defense Technology (China); Chun hua Zhang, National University of Defense Technology (China); Xun Chen, National University of Defense Technology (China); Yuan-yuan Tan, National University of Defense Technology (China) 2011RM0280 Reliability Assessments of HCPV Trackers Jon Elerath, SolFocus (USA) 2011RM0175 Practical applications of Structural Reliability for mechanical Eng. Julio Pulido, Ingersoll Rand (USA) 2011RM0147 Optimization of the Test Stress Levels of an ADT Jingrui Zhang, (China); Xiaoyang Li, Beihang University (China); Tongmin Jiang, Beihang University (China); Zhengzheng GE, School of Reliabilty and system engneering, Beihang University (China)

Session 05D 2011RM0129 Equipment Degradation Monitoring for Sustained Reliability Edwin Vijay Kumar, VIZAG STEEL (India); SYAMSUNDAR ANNAMRAJU, VISAKHAPATNAM STEEL PLANT (INDIA); Sanjay Chaturvedi, Indian Institute of Technology (India) 2011RM0193 Sensor Recovery for Robust Multivariate Condition Monitoring Haitao Liao, The University of Tennessee (USA); Jian Sun, University of Tennessee (USA) 2011RM0267 Hybrid Causal Models for System Diagnostics Chengdong Wang, ASML (USA) 2011RM0194 Impact of Cartridge Performance on Weapon Reliability & Life Cycle Cost sandy sheng, ATEC (usa)

Session 06C 2011RM0177 Maintenance of wind turbine systems under continuous monitoring Zhigang Tian, Concordia University (Canada); Tongdan Jin, Texas State University (United States) 2011RM0141 Mission Need-based System Supportability Objectives Determination Tailiang Song, Beijing Institute of Technology/University of Massachusetts Dartmouth (China); Liudong Xing, University of Massachusetts Dartmouth (United States) 2011RM0170 Improving City Sustainability - RAMS Applied to Urban Rail Transit Emil Vlad, Thales Rail Signalling Solutions Canada (Canada); Valeriy Tatarnykov, Thales Rail Signalling Solutions (Canada) 2011RM0095 Developing Competency-Based Engineering Curriculum and Certifications Patrick Dallosta, Defense Acquisition University (United States)

Session 06D 2011RM0039 An Improved Modular Approach for Dynamic Fault Tree Analysis Olexandr Yevkin, Dyadem Int. (Canada) 2011RM0061 Designing Reliability Demonstration Testing for Repairable Systems Huairui Guo, (USA); Haitao Liao, The University of Tennessee (USA); Athanasios Gerokostopoulos, ReliaSoft (USA); Adamantios Mettas, (USA) 2011RM0188 Repairable System Modeling of Natural Gas Transmission Networks James Parks, NiSource (USA); John Cox, NiSource (USA)

2011RM0135 Optimal Design of Repairable k-out-of-n Systems Considering Maintenance Ramin Moghaddass, University of Alberta (Canada); MIng J Zuo, University of Alberta (Canada)

Session 07C 2011RM0186 Case Study Risk Management for Medical Devices (Based on ISO 14971) Vaishali Hegde, Philips Respironics (USA) 2011RM0263 Probabilistic Availability Risk Assessments without Simulation Jan Smith, Independent Consultant (USA) 2011RM0073 Green Reliability Mike Silverman, Ops A La Carte (USA) 2011RM0052 New Approach for Risk Analysis and Management in Medical Engineering Thomas Zentis, Fraunhofer Institute for Production Technology IPT (Germany); Robert Schmitt, WZL, RWTH Aachen University (Germany)

Session 07D 2011RM0144 Optimal Resurfacing Decisions for Road Maintenance: A POMD Perspective Mariem Zouch, Ecole des Mines de Nantes / IRCCyN (France); Thomas Yeung, Ecole des Mines de Nantes / IRCCyN (France); Bruno Castanier, Ecole des Mines de Nantes (France) 2011RM0197 Incorporating Repair Information into Maintenance Optimization Models Elizabeth Lorna Wong, Centre for Maintenance Optimization & Reliability Engineering (CANADA); Andrew Jardine, University of Toronto (Canada); Dragan Banjevic, Centre for

Maintenance Optimization & Reliability Engineering, Department of Mechanical & Industrial Engineering, University (Canada) 2011RM0200 Data-Driven Approach for Imperfect Maintenance Model Selection Yu Liu, University of Electronic Science and Technology of China (United States); Hong-Zhong Huang, University of Electronic Science and Technology of China (China); Xiaoling Zhang, University of Electronic Science and Technology of China (China) 2011RM0276 Comparison of high-availability automation networks Alban PERONNE, ALSTOM Transport Information Solutions (FRANCE); Pierre Dersin, ALSTOM Transport Information Solutions (FRANCE)

Session 08C 2011RM0086 An approach to capture system interaction failures of a complex system Manu Augustine, Malaviya National Institute of Technology (India); Om Prakash Yadav, North Dakota State University (USA); Rakesh Jain, Malaviya National Institute of Technology (India); Ajay Rathore, Malaviya National Institute of Technology (India) 2011RM0125 A Method of Quantitative Analysis for Dynamic Fault Tree Zhang Hong-Lin, National University of Defense Technology (China); Zhang Chun-Yuan, National University of Defense Technology (China); Liu Dong, Academy of Equipment Command & Technology (China); Li Rui, National University of Defense Technology (China) 2011RM0244 Degradation Analysis of Solar Photovoltaic Modules Rong Pan, ASU (USA); Joseph Kuitche, ASU (USA); Govindasamy Tamizhmani, ASU (USA) 2011RM0281 Reliability of Wear-out Items in Electric Motors for Spacecraft Jacob Burke, NASA GSFC (USA); John W Evans, NASA GSFC (USA)

Session 08D

2011RM0168 Field damage analysis (FDA) concept: analysis of complex damage causes Stefan Bracke, University of Wuppertal (Germany); Stephan Haller, Cologne University of Applied Sciences (Germany) 2011RM0268 Case Study Post Market Product Monitoring System Vaishali Hegde, Philips Respironics (USA); Krishna Konakanchi, Philips Respironics (USA) 2011RM0213 A novel design of interval prediction for telemetry data Tang Jian, Beijing University of Aeronautics and Astronautics (China); Luan Jiahui, Beijing University of Aeronautics and Astronautics (China); Liu Yalong, Beijing University of Aeronautics and Astronautics (China); Lu Chen, Beijing University of Aeronautics and Astronautics (China) 2011RM0116 Trend analysis of the power law process with censored data Sharareh Taghipour, Department of Mechanical & Industrial Engineering, University of Toronto (Canada); Dragan Banjevic, Centre for Maintenance Optimization & Reliability Engineering, Department of Mechanical & Industrial Engineering, University (Canada)

Session 08E 2011RM0234 ASSESSING THE LIKELIHOOD OF RARE MEDICAL EVENTS IN ASTRONAUTS Jerry Myers, NASA Glenn Research Center (USA); Beth Lewandowski, NASA Glenn Research Center (USA); John Brooker, NASA Glenn Research Center (USA); Aaron Weaver, NASA Glenn Research Center (USA) 2011RM0238 Predicting the Reliability of a Complex Military System of Systems Carol Vesier, Army Test and Evaluation Command (USA); Angelo Christino, Army Test and Evaluation Command (USA); Brian Hampton, Army Test and Evaluation Command (USA) 2011RM0016

A Quantitative Approach for Medical Device Health Hazard Analysis Mingxiao Jiang, (United States); Kathy Herzog, (United States); Thomas Pepin, (United States); Mike Baca, (United States) 2011RM0107 Engine Fleet Reliability Data Management Optimization John Gebhard, Rolls-Royce Corporation (United States); Jason Boschert, Rolls-Royce Corporation (United States)

Session 09C 2011RM0126 An ADT Data Evaluation Method of SLD Based on Bayesian Theory Lizhi Wang, Beihang University (China); Xiaoyang Li, Beihang University (China); Tongmin Jiang, Beihang University (China); Junbo Wan, Beihang University ( China ) 2011RM0204 CSADT Life prediction based on DAD using time series method li wang, Beihang University ( China); Xiaoyang Li, Beihang University (China); Tongmin Jiang, Beihang University (China) 2011RM0270 A Study of Scaling Effect on DRAM Reliability Jin Qin, University of Science and Technology of China (P R China); Mark White, JPL (USA); Joseph Bernstein, Bar-Ilan University (Israel) 2011RM0162 Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality Zhengzheng GE, School of Reliabilty and system engneering, Beihang University (China); Xiaoyang Li, Beihang University (China); Tongmin Jiang, Beihang University (China); Tingting Huang, Beihang University (China)

Session 09D 2011RM0121

Allocating Redundancy for Optimal System Reliability and Series MTBF Meng-Lai Yin, Cal Poly Pomona (USA); John Angus, Claremont Graduate University (USA); Rafael Arellano, Raytheon Company (USA) 2011RM0181 Software Reliability Model with Bathtub-shaped Fault Detection Rate Lance Fiondella, University of Connecticut (USA); Swapna Gokhale, University of Connecticut (USA) 2011RM0187 FaRBS: a New PoF Based VLSI Reliability Prediction Method Jin Qin, University of Science and Technology of China (P R China); Hava Avshalom, Motorola (Israel); Joseph Bernstein, Bar-Ilan University (Israel) 2011RM0206 Condition Diagnosis with Complex network based Time Series Analysis Pan Jiacheng, (China); Jiang Hongquan, School of Mechanical Engineering,State Key Laboratory for Manufacturing System Engineering (China); Jianmin Gao, Manufacturing Quality and Systems Engineering Institute, School of Mechanical Engineering, Xi'an Jiaotong University (China); Yang Peilin, Mechanical Engineering,State Key Laboratory for Manufacturing System Engineering (China)

Session 11C 2011RM0068 Planning a Reliability Growth Program Utilizing Historical Data Larry Crow, CRR (USA) 2011RM0074 Birnbaum Importance in Solving Component Assignment Problems Xiaoyan Zhu, University of Tennessee (United States); Qingzhu Yao, University of Tennessee (United States); Way Kuo, City University of Hong Kong (Hong Kong) 2011RM0067 Special Topics for Consideration in a Design for Reliability Process. Georgios Sarakakis, ReliaSoft (USA); Athanasios Gerokostopoulos, ReliaSoft (USA); Adamantios Mettas, (USA) 2011RM0196

Reliability Engineering As a Practical Application to Improving System Performance From Concept to System Retirement Sean Carter, NASA JSC (USA)

Session 11D 2011RM0065 Aviation Safety Analysis Based on Man-Machine-Environment Coupling Jin Tian, (P.R.China); Ting di Zhao, (P.R.China); Yang Wu, (P.R.China); Xiao yun Wang, (P.R.China) 2011RM0211 An Optimization Approach for Safety Instrumented Systems Design Konstantin Machleidt, University of Kaiserslautern (Germany); Lothar Litz, Institute of Automatic Control, University of Kaiserslautern (Germany) 2011RM0283 Human Rating of Launch Vehicles: Historical and Potential Future Risk Joseph Fragola, Valador, Inc. (United States); Benjamin Franzini, Valador, Inc. (USA) 2011RM0032 Analyzing Interconnection Design Safety Using Bent Pin Analysis Nathaniel Ozarin, The Omnicon Group Inc. (United States)

Session 11E 2011RM0212 Modeling Damage in Large/Heavy Electronic Due to Dynamic Loading Ed Habtour, US Army material Systems Analysis Activity (USA) 2011RM0002 The Web-Accessible Repository of Physics-based Models (WARP) 2011RM0180 Environment-Provoked Early Failures of Mass-Produced Complex Electronics David Verbitsky, Aerotek (USA)

2011RM0248 Soft Error Trends and Mitigation Techniques in Memory Devices Charles Slayman, Ops A La Carte (USA)

Session 12C 2011RM0034 Reliability Growth and the Caveats of Averaging: a Centaur Case Study Elisabeth Morse, Valador, Inc. (United States); Joseph Fragola, Valador, Inc. (United States); Blake Putney, Valador, Inc. (United States) 2011RM0124 Reliability Predictions to Support a Design For Reliability Program Lori Bechtold, Boeing (USA) 2011RM0081 Dynamic Fault Tree Analysis based on the structure function Guillaume Merle, LURPA, ENS Cachan (France); Jean-Marc Roussel, LURPA, ENS Cachan (France); Jean-Jacques Lesage, LURPA, ENS Cachan (France) 2011RM0176 Advanced Models for Software Reliability Prediction Zigmund Bluvband, ALD (Israel); MICHAEL TALMOR, RAFAEL Ltd (ISRAEL); Sergey Porotsky, ALD Software (Israel)

Session 12D 2011RM0269 Integrated Developmental/Operational Testing To Evaluate Reliability Jane Krolewski, RAM Directorate, Army Evaluation Center, ATEC (USA); Richard Sullivan, RAM Directorate, AEC, ATEC (USA); Beth Harpel, Manuever Ground Evaluation Directorate, AEC, ATEC (USA) 2011RM0241

Modeling The Gain Due To Maintenance Over Transformer Lifespan Jean AUPIED, EDF-R&D (France); Anne BARROS, UTT (France); Yacine GUESSOUM, EDF R&D (France); Antoine Grall, Troyes University of Technology (France) 2011RM0275 Reliability and Maintainability in Photovoltaic Inverter Design Janet Ma, schneider electric (Canada); Spyros Thomas, schneider electric (canada) 2011RM0098 A Practical Method for Reliability Analysis of Phased-Mission Systems Suprasad Amari, Parametric Technology Corporation (USA)

Session 13C 2011RM0036 The Art & Practice of Tracking DFMEA Failure Modes Over Time Gary Wasserman, Wayne State University (United States) 2011RM0062 Using FMECA to Design Sustainable Products Richard Herman, Raytheon Technical Services Company LLC (USA); Keith Janasak, Raytheon Space and Airborne Systems (USA) 2011RM0083 Model-driven Automated Software FMEA Neal Snooke, Aberystwyth University (UK); Chris Price, Aberystwyth University (UK) 2011RM0133 Risk Assessment Using Design Review Based on Failure Mode (DRBFM) Roland Schmidt, ABB Switzerland Ltd (Switzerland); Gernot J. Riedel, ABB Switzerland Ltd. (Switzerland); Klaus Kangas, ABB Oy Drives (Finland)

Session 13D 2011RM0130

Equipment Health Management through Information Fusion for Reliability Edwin Vijay Kumar, VIZAG STEEL (India); Sanjay Chaturvedi, Indian Institute of Technology (India) 2011RM0239 Impact of Information on the quality of a Prognostic Indicator Ariane Lorton, EADS (FRANCE); Antoine Grall, Troyes University of Technology (France); Mitra Fouladirad, University of Technology of Troyes (France) 2011RM0252 Materiel Availability Modeling and Analysis for a Complex Army System Dennis Anderson, Sandia National Laboratories (USA); Matthew Hoffman, Sandia National Laboratories (USA); Jeffrey Martin, US Army, CASCOM, Force Development Directorate (USA); David Gunther, US Army, PEO Integration, Logistics Integration (USA) 2011RM0119 Optimal Spares Analysis for a Networking Systems Manufacturer Daniel Jacob, PTC (USA); Duane Huffman, PTC (USA); Ryan Crytzer, PTC (USA)

Session 14C 2011RM0055 Spare Provisioning for Repairable Systems under Fleet Expansion Loon Ching Tang, Dept of ISyE, National Univ of Singapore (Singapore); Xiao Liu, National University of Singapore (Singapore) 2011RM0013 Lithium Battery Analysis:Probability of Failure Assessment Travis Moebes, SAIC (United States) 2011RM0060 Optimized Acoustic Microscopy Screen for Multilayer Ceramic Capacitors Andrew Kostic, The Aerospace Corporation (USA); Stanley Schwartz, Lockheed Martin Space Systems (USA) 2011RM0250 Modeling Science Objectives within a Probabilistic Risk Assessment Clayton Smith, Johns Hopkins University Applied Physics Laboratory (USA); Kristen Fretz,

Johns Hopkins University Applied Physics Laboratory (USA); Melissa Jones, Johns Hopkins University Applied Physics Laboratory (USA); Sanae Kubota, Johns Hopkins University Applied Physics Laboratory (USA)

Session 14D 2011RM0112 Achieving Reliability Goals for an EFV LRU through Laboratory Testing Neil Loychik, General Dynamics Land Systems (USA); John Pan, Curtiss Wright Controls Electronic Systems (USA); Erwin Mercado, Curtiss Wright Controls Electronic Systems (USA) 2011RM0242 Warranty cost optimization in the bidding process and during operation Gisela Lanza, Karlsruhe Institute of Technology, wbk Instiute of Production Science (Germany); Patrick Werner, Karlsruhe Institute of Technology, wbk Institute of Production Science (Germany); Benjamin Behmann, Institute of Production Science (wbk)- Karlsruhe Institute of Technology (KIT) (Germany); Dominic Appel, Karlsruhe Institute of Technology, wbk Institute of Production Science (Germany) 2011RM0203 Reliability Estimate of Mobile Agent System for QoS MANET Applications CHANDREYEE CHOWDHURY, Jadavpur University (India); SARMISTHA NEOGY, Jadavpur University (India) 2011RM0035 Improvements In Estimating Software Reliability From Growth Test Data David Dwyer, BAE Systems (United States)

Session 99 2011RM0017 Reliability Analysis of Warm Standby Systems using Sequential BDD Ola Tannous, University of Massachusetts Dartmouth (United States); Liudong Xing, University of Massachusetts Dartmouth (United States); Joanne Dugan, (United States) 2011RM0071

A Systematic Fault Root Causes Tracing Method for Process Systems Xinlin Huang, State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University (China); Jianmin Gao, Manufacturing Quality and Systems Engineering Institute, School of Mechanical Engineering, Xi'an Jiaotong University (China); Jiang Hongquan, School of Mechanical Engineering,State Key Laboratory for Manufacturing System Engineering (China); Kun Chen, Xi'an Jiaotong University (China) 2011RM0096 PRA as a Design Tool Diana DeMott, (US) 2011RM0108 Software Reliability Accelerated Testing Method Based on Test Coverage shuanqi wang, Beihang University, China (China); Yumei Wu, Beihang University (China); Minyan Lu, School of reliability engineering and system of Beihang University (China); Haifeng Li, Beihang University, China (China) 2011RM0115 Fault Tree Analysis Using Stochastic Logic: A Reliable and High Speed Computing Hananeh Aliee, Amirkabir Univ. of Tech. (IRAN); Hamid R. Zarandi, Amirkabir Univ. of Tech. (IRAN) 2011RM0185 Evaluating down time and maintenance time in communication networks Tatsuya Matsukawa, Nippon Telegraph and Telephone Corporation (Japan); Hiroyuki Funakoshi, Nippon Telegraph and Telephone Corporation (Japan); Kohjun Koshiji, Nippon Telegraph and Telephone Corporation (Japan)