2shape Quality of Non-Metals, Plastics, Films, Fibres 03 D-Werkstoff-PIC 3 Kunststoffe - DT 270211.de - en

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Rev. 110214-1
+ LAYER WALLS
D-MATERIAL:PLASTICS
Layer thickness,surface measured safely
TSL measurement solutions for plastics / polymers + NON-METALS

Type of Materials/ Processes - Thin / thick films / general thickness / walls / sandwich-u. Multi Layer - Diffusion and surface layers, insulation
Background measurements, solution requirements within the meaning of - Influence of coating on the material properties: Optical / electrical / mechanical / chemical / thermal / porosity
0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197 www.tslmandelkow.com mailto: info@tslmandelkow.com
-2 APPLICATION TSLSYSTEMSERIES MATERIAL THICKNESS MT/QS/US/QW/EL/DF/AU/FI/US/FH1/FH 7 FILM THICKNESS PCI / delta / GA / RA / QS / DF COEX / DUPLEX THICKNESS MT / FI / EL / AU + DF THIN PCI / delta / GA / RA SURFACE .- roughness / TOPOGRAPHY / PORE PCI / SU / PCT / TH / TY / FI / PO Color, luster, cleanliness / PURITY delta / PG / CC / PCI
SPECIAL APPLICATIONS RADII, INTERNAL PIPE, SMALL AREAS MT / EL / DF / AU / FI / PCI / FH STAINLESS STEEL + AUSTENIT MT / EL / DF / AU / QS / FH LayerMaterials PAINT / PAINT + CERAMIC other organic THICK QA / MT / DF / EL / AU / FI / RA / delta / PCI / CCS Order process MT / QA / QW / EL / DF / AU / FI / PCI / delta
OrdereProcess,specifically Plating STAINLESS STEEL, MT/ DF / QS / FH / MT / DF / EL / AU / POWDER SOLGEL, THERM.SPRITZEN, PVD, CVD QA / RA / EL / alpha / delta / PCI / CCS BASE-COAT + el.TAUCH PROCESS alpha / delta ONLINE MEASUREMENT It should be noted that most solutions as online versions, and more extensively for the 8-hour operation to date as budget systems are available.
Please choose in the google video mode, the corresponding measurement applications
0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197
www.tslmandelkow.com
mailto: info@tslmandelkow.com
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Examples of industrially applicable / unused measurement systems + technology
NAVIGATION within the TSL kathegorisierten materials / methods described in the direction of measurement system distribution in each case above TSL-operated working area. Other operations are u.U. very different. Some commercial areas require individual user information, so we ask you for your request-> aA
Ratings are the first orientation, of course, subject to individual review and if profitability analysis. Points 7, 9, 10 and 11, we respond to the knowledge of concrete Questions individually -> a.A.
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GLOSSARY SDM-> coating being measured WDM-> Walls/material being measured TSL-system-name in thickness Measuremnet technologies inductive Wiedycurrent ULTRAsonics Hall-sensor Optic Interferometer electricstat Coulommetric Tactile R xray Thermic 03 Area Measurementarea in m -> useful / border 04 prakt. Tolerance Tol in the above industries, operating range: under 100 micron in microns, / / About 100 micron-> in% of reading 05 USP- Efficiency and solution height such as: power Measure possible / Physics fits better than conventionally used procedures / simple / safer to use / less need for training .... other benefits 0 -> there is no 10 -> relevance in competition 06 measurement electronic data pratised 1 -> low 10 -> high 07 known Risk per Operator error 1 -> low 10 -> high 08 Knowledge needed: Responsible / Operator 1 -> Instruction 5 -> Training 10 -> education 09 known payback in months with device cuts, frequency / solvent storage 10 TestPart-Costs, under section 10 in the particular environment including staff / training / Test Preparation in EUR 1 -> low 10 -> high 11 possible Potential of Prevention, Returns /ComplianceCosts 0P USE 01 TYPE 02 Physics Abbreviations used as following
finding details visit-> Systems
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APPLICATION / measurement of LAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta

u-tube> Video mode: Applications
TSL-SYSTEMS
Largely current EU standard. Built in or external probes. External probes often in the system 2 to about 20 000m Data transfer and / or internal statistics, Internal memory for data series (batches) and / or memory for spec. Adjustment settings (applications). Equipment portable / stationary, by radio, infrared, or via interface multiplexing / Mux. Accessory sets, tripod / handling, roll-additives, Mux, data, radio ... BUTTON > Systems> Hand Measuring-> Options BUTTON > Systems> hand-held> Options + programs Measuring and transfer programs for every need,
TSL-TYPE USE
PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA
FAILURE RISK
KNOWLEDGE InPlace. COSTS
PREV
OP 01 02 03
MT Series
04 05 06 07 08 09
10
11
SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA
TSL-TYPE USE
FAILURE RISK
KNOWLEDGE Amort.
COSTS
PREV
OP 01 02 03
MT 700 Series
04 05 06 07
08
09
10
11
SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.
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TSL-TYPE USE
FAILURE RISK
KNOWLEDGE Amort.
COSTS
PREV
OP
01 02
03
Sensors
04
05 06 07
08
09
10
11
SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.
TSL-TYPE USE
FAILURE RISK KNOWLEDGE Amort.
COSTS
PREV
OP 01 02 03
FH 1 Series
04 05 06 07
08
09
10
11
SDM / WDM FH1 BONDING force 5-20 000 3 / / 3-10 5 / 10 - aA 6 / 1 a.a a.a a.A.
A representative type-section of our extensive product range, - According to fitness, we offer you the system or even more suitable for your needs.
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
FH 7 Series
04 05 06 07
08
09
10
11
WDM FH7 HALL 20-18 000 3 / / 2-3 10 10 aA 5 / 2 a.a a.a a.A.
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TSL-TYPE USE
COSTS
PREV
OP 01 02 03
GA Series
04 05
06
07
08
09
10
11
SDM GA coulommetr. 0.2 0.3 8 2 20 / 150 aA 10 / 7 a.a a.a a.A.
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
QW Series
04 05
06
07
08
09
10
11
SDM / WDM QW RF ultrasound 10-5000 2 / 5 10 7 10 10/10 aA aA 5
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
U.S. Series
04 05
06
07
08
09
10
11
WDM U.S. ultrasonic 1000-30 000 5 3 4 10 10/10 aA aA 5
TSL-TYPE USE
COSTS
PREV
OP
01
02 03
RA Series
04 05 06 07
08
09
10
11
SDM RA XRF 0.2-20 0.1 5 10 aA 10 / 2 a.a a.a a.A. a.a
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
SU Series
04 05
06
07
08
09
10
11
Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

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TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PG Series
04 05
06
07
08
09
10
11
GLOSS SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PCT Series
04 05
06
07
08
09
10
11
TOPOGRAPHY PCT white light 1-90/14000 0.01/0.1 10 10 2 10 / 6 aA aA aA
TSL-TYPE USE TSL-TYPE USE
PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA
FAILURE RISK KNOWLEDGE Amort. FAILURE RISK KNOWLEDGE Amort.
COSTS COSTS
PREV PREV
OP 01 02 03
PO Series
04 05
06
07
08
09
10
11
PORE TEST PO el-static 50-11000 ---- 10 - 1 7 / 3 AA AA AA
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
MI Series
04 05
06
07
08
09
10
11
SDM / WDM PO pulse radar 10 000 10 10 10 3 10 10/10 aA aA
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TSL-TYPE USE
COSTS
PREV
OP 01 02 03
PT Series
04 05
06
07
08
09
10
11
SDMpulver / wet PT Photo-Thermic 6-25 10.5 10 10 2 10 / 2 aA aA 10
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
MF Series
04 05
06
07
08
09
10
11
DEEP DEFECTS -waves visually AB10 000 10 10 2 10/10 10 aA aA
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
STR Series
04 05
06
07
08
09
10
11
WDM / SDM STR WI 5000-800 000 5 10 6 3 5 / 2 AA AA 5
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
CC Series
04 05
06
07
08
09
10
11
COLORIMETRY WI CC 5000-800 000 5 10 6 3 5 / 2 AA AA 5
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TSL-TYPE USE
COSTS
PREV
OP 01 02 03
OLxz Series
04
05
06
07
08
09
10
11
ONLINE OLyz IND / WI / WLI 20-8000 0.1 / 1 10 10 1 10 / 1 AA AA 10
TSL-TYPE USE
COSTS
PREV
OP 01 02 03
STR Series
04 05
06
07
08
09
10
11
COLORIMETRY CN WI 2400-6000 K 5 10 6 3 5 / 2 AA AA 5 contact
TSL-TYPE USE
COSTS
PREV
OP 01 02
OLxyz Series
04
05
06
07
08
09
10
11
ONLINE OLxyz IND / WI / WLI 1-12 000 0.1 / 1 10 10 1 10 / 1 aA aA 10 contact
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Common measurement method

Non-destructive coating thickness measurement, SDM Non-destructive measurement of wall thicknesses, WDM
Ultrasonic SDM - high frequency to 100Mhz
TSL-QS SERIES
- Layer thickness measurements on organic substrates and multilayers. System cost: systems from EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.
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Ultrasonic WDM process, - high-frequency 40-100Mhz
TSL-QW-SERIES
- Layer thickness measurements on organic substrates and multilayers. System cost: systems from EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.
Serial measurement of very thin layers with the possibility TSL-alpha-SERIES very thin substrates - the capacitive SDM process
Application Capacitive SDM method for thin films on conductive reference film, the carrier material thickness from about 1 micron hardly relevant. Training needs: 3
-13 Measuring time: 10 sec Preparation / set-up time: 1 min. Suitable for reference measurements with films - such as: offset printing. The method can be used on very thin FE-reference materials, in which case the usual measurement errors, such as by magnetization fluctuations in an otherwise very thin FE reference not come into play - perhaps a unique selling feature.
Non-contact measurement of very thin layers with the possibility transparency measurement, - the SDM interferometric method
System Cost: sensors from about EUR 7000 Training Requirements: 6 / 2 Measuring time: 0.1 seconds Preparation / set-up time: 5/0.5 min. Measuring rate up 200/sek.
TSL-delta-SERIES
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Micro Topgrafien, roughness and thickness measurements for non-contact and fast measurements
TSLPCISERIES
Polychromatic interferometry for rough surfaces + micro-topographies
Application topography measurement
Photothermal method for heavily pigmented layers, powder and wet measurements, non contact. as a thermal measurement method and to visualize Faults and coupling faults.
System cost: EUR 25 000 from sensors Training Needs: 4 Measuring time: from 2 sec
-15 Preparation / set-up time: a few min. Measuring rate up 4000/sek.
Impuls-Radar/Mikrowellen measurement method Application
TSL-MI-SERIES
Walls / thick layers / layer composite,
System Cost: sensors from about EUR 60 000 Training needs: 5 Measuring time: 0.1 seconds Preparation / setup time: minimum 10 min.
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Eddy current, induction and effects Application
TSL-MT-SERIES
For the most widely used measurement application procedures are established, both of which are from the use of on the effects of a sensor over a metallic base material (GW) as a carrier of measuring Layer define. Each resulting signal response between a sending and a receiving sensor to a Metal as a carrier of the layer is influenced by the distance to be measured (= layer thickness). The thicker the layer, the smaller the sensor effect can be evaluated. Distance measurement between sensors and the respective base material as a reference. This base material (or substrate, or backing material) therefore first determined that, in some cases to use measurement processes. To be measured Wall /Layer defines the distance to the substrate, where it in alloys Changeinteractions with the substrate may.
As a sensor of a measuring unit, these technologies are encapsulated in the different measuring probes almost all manufacturers and measurement principles of portable devices. Many Questions a measuring system resulting from the correct Ratio is a primary fed- for secondary measurable / measured energyResponse. The focus will thus binding the elektrsized/ Magnetic / acoustic / optical Transmission properties der respective Workmaterials. Here you can find almost any potential for conflict and solution strategies again.
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Eddy current measuring method MTSERIES
TSL-
Device Type: Optical almost identical to the inductive method is the only high-frequency coil of the probe usually horizontally, which the measurement area determines effect.
WDM / SDM from electrically non-conductive media in relation to highly conductive References / substrates. WDM non-conductive materials to Referenz-Leitern/Kugeln - there significant advantages over ultrasound systems at very high accuracy. Suitable for thick layers and materials (fiberglass, carbon fiber, etc.).
Requirements: Electrical adjustment on the uncoated object using standards. also suitable building sites, System Cost: 400 Training Needs: 4
-18 Measuring time: 10 sec Preparation / set-up time: 1 min. Requirements: Electrical adjustment on the uncoated object using standards. Substrate thickness: approx 40m minimal. For non-magnetic metal substrates with non-conductive coatings. The coating must be tough enough to resist the pressure of each patch Measurement probe tip is not to yield.
Even for non-iron-wall thicknesses measurement:
Magnetic-inductive measuring method
TSL-MT
WDM non-magnetic materials to reference-FE. - Also suitable building sites, measuring time: usually faster than 5 seconds. Each suitability for conductive walls / thick films (galvanizing) to consider! System cost-EUR: 400 Training needs: 5 Measuring time: 5 sec better Preparation / set-up time: 5 min Prerequisites: Electric-magnetic alignment at the (same) uncoated object using standards.
-19 Perform eddy current fields in the conductor to be measured at constant methodically measuring deviations characteristics, a correction program (see TSLconvert) be einsettzbar. For magnetizable metal substrates with non-magnetizable coating / wall. Substrate thickness: 0.5-1mm minimal, depending on the sensor. The material must be tough enough to be the pressure of each patch test probe tip to yield.
Hochgenaue, special Wall measurements
Hall probes Procedure
TSL-FH 7 SERIES
SDM / WDM non-magnetic walls / FE layers to substrates. WDM non-magnetic materials to reference FE (as a ball), - a Ball serves as Referenzpol, - Often safety-profit and advantages over, for example. Ultrasound systems for multiple precision and very good radius capability to 1mm!. Requirements: Electric-magnetic alignment on the uncoated object using standards. For units of the FH-Series is the adjustment to the FE reference sphere already internally automated ..
Suitable building sites, especially near stream areas .- often for thin substrates - rolling Measuring time: 5 seconds System Cost: 700 Training Needs: 4
-20 Measuring time: 1-10 sec Preparation / set-up time: 1 min. For magnetizable metal substrates with non-magnetizable coatings. The coating must be tough enough to be the pressure of each patch test probe tip to yield.
Technology Hall does not require acoustic impedance-dependent adjustments of the wall-material
Properties compared with ultrasonic techniques (US-WDM) with changing metrics and Geometries. It also eliminates the coupling fluid. The wall thickness may be only a few micrometers (microns) are up a millimeter.
Magnetic Strength-Procedure
Application
TSL-FH 1
WDM of non-magnetic layers (layers) compared with FE-substrates. WDM non-magnetic materials to FE. Also for soft Schhicht / wall materials.
- Also suitable building site System Cost: from 100

-21 Training required: 2 Measuring time: 10 sec Preparation / set-up time: 30 sec Requirements: No adjustment, therefore, close application limits. Substrate thickness note (about 1 mm minimum)! For magnetizable metal substrates with non-magnetizable walls / coatings. The coating must not hard enough so as not to pressure the relevant patch test probe tip to give, since Measurement of release of the pressure goes to zero. Wiche materials such as rubber, are so often measured.
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SURFACE LAYER COLOR WALL THICKNESS, - Examples of equipment series If there is more than one TSL system indicated, the challenge of the application may ask about possibilities:
Online / offline Measuring speed Liquid / dry Size of sensor-spot/point
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AUTOMOTIVE
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VW Product Reflector, Non-metal Application 10-20m below base-coating aluminum TSL-delta system 2.3
Product
Car headlight, Polycarbonate-
Application 2x 1-12m transparent coating

-26 TSL-delta system 2.3
Product: Rolls-Royce - wooden dashboards Application: <2 mm transparent coating on wood TSL System: PCI (for scanning), or US-200 ultrasonic
Product: Bayer Makrolon, polycarbonate Application: <2 mm wall, - and 2-20m coating
-27 TSL System: delta 3.2 + PCI (scanning), Wall: delta 3.4 and FH
Product: BMW door shilding, rubber Application: <20m coating measurement TSL System: PCI
Product:
Automotive- Interior, leather
Application: <60 microns coating TSL System: US-200
-28 -
GLASS, CARBON FIBER - Materials and others
Product:
Automotive interior, carbon
Application: <100 micron coating measurement TSL System: PCI
-29 -
Product: Space, glass-fiber Application: 8-20 mm wall thickness TSL System: FH featuring convert
Product:
Car-body, Non metal
Application: 5-120 micron multi-layer coating thicknesses TSL System: U.S.: Filler + cover plus: transparent, delta 2.3
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Product:
Car body, Non metal / metal
Application: 5-120 micron multi-layer coating thicknesses TSL System: U.S.: Filler + cover plus: transparent, delta 2.3
Product: Item of automatic-control, Non metal Application: 2-20 micron multi-layer coating thicknesses TSL System: delta 3.2: transparent - plus U.S. filler / base
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Product:
Motor-Cylinder 's by melt-forming coated sand
Application: 200-4000 micron transparent coating thicknesses TSL System: PCI
Product: flexible plastic films Application: <20m transparent thin film measurement TSL System: PCI / delta
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Product:
Glass-fiber Container
Application: 18 mm wall thickness measurement TSL System: FH
Product:
Plastic curtain
Application: 4-12 mm wall thickness TSL System: FH + FH online

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Product: SI-Wafer Application: 1-20 micron multi-layer coating thicknesses TSL System: delta 2.3
Product:
Wood,- Furnishing
Application: 20-200 micron multi-layer coating thicknesses TSL System: PCI non contact / contact U.S.
-34 -
Product:
space, Carbon +foam
Application: up to 20mm wall thickness TSL System: FH 20
Product:
Glue material on very thin Substrates
Application: 2-50 micron coating thicknesses TSL System: PCI / HSL

-35 -
ELECTRICAL / ELECTRONICS
-36 -
Product:
Printed board
Application: 5-100 microns different coating thicknesses TSL System: PCI / delta
Product:
Printed board
Application: 5-10 microns Photo-resist coating thickness TSL System: PCI / delta
-37 -
Product: CDDVD Application: 0.2-10 micron coating TSL System: delta
Product:
Toothbrush, - Coil 5mm diametre
Application: minimum 100 micron coating thickness above coil TSL System: PCI
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Product: Relay/Magnetic-Coil , - Covering thickness Application: 100 micron min covering above coil
Product:
Injector, polacarbonate
Application: 0.1-2 micron coating thicknesses and online through wall TSL System: delta 3.9
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Product:
Blister packaging
Application: 0.5-5 micron coating thicknesses on Hologram TSL System: HSL
Product:
offset printing
Application: 0.5-5 micron multi-layer coating thicknesses TSL System: HSL

-40 -
Product: Liquid-sprayerContainer Application: 2-50 microns and wall thicknesses valve-coating TSL System: PCI / delta - and FH
Product:
GlassContainers
Application: 2-5 mm wall thickness TSL System: PCI / delta online and offline FH
-41 -
PCI at work, - Thin Film: Rubber
Bottom of a GlassContainer (left) - PCI
-42 -
Coex container, - 2 x wall thickness Delta plus PCI
Thermo Forming- Wall thickness, - delta / PCI
Plastic film, - wall-thickness, - PCI
-43 Front windshield of aircraft, wall-thickness, - PCI
Silicone on paper / textile- Si-coating: PCI
Cylinder head-, SI-caterpillar- thickness: PCI
Colour online measurement, Delta - spot, 0.5mm
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Special application forms of the SDM of NFE / FE-on materials
Some methods of measurement, especially in layer structures, possibly via the suitability micrograph of Check and correct. With suitable methodological differences and stable processes, the Using an automatic curve-correction program, such as TSLconvert. To it, for example, is for highway pavement thickness settlement of this process, a regulatory basis of calculation and shall be trained accordingly.
Nmaybe-conducting materials to a simple aluminum foil as a zero reference auf-/unterlegbarer

Wood thickness FRP thickness Glass thickness
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The measurement process in the selection
The conditions in industrial production environments demand meters, which are fast and reliable work and use local are network independent, weather-resistant and temperature-independent. In addition, the required margin of measurement uncertainty, as it is to read from the device manufacturer should be taken into account. Noteworthy are the representations and conditions under which the Lieferanten/Hersteller-Details of Measuring Properties are accessible - even ours. A transparency of the different modes of representation, particularly in relation to the requested application solution out to us essential, as we design solutions with the matching, so different systems.
The appropriate adjustment and fixation-related applications are also used.

Measuring equipment plus TSL-precision stand
With a plurality of measuring devices affect conductivity / Magnetic properties of the measured wall / coating such as nickel rata Selected measuring method for the user imperceptibly or clear. This can provide independent advice from seasoned Apllikationen recognized phenomena in advance and give effect to clarify.
-46 -
Tag
In the SD measurement GEpreliminary Terms that in communication can confuse: Calibration a measuring instrument: Repatriation on a national / international deposited Standard mass and timed De Documentations Target-state durch a Calibration with certificate and seal. Adjustment/ Setting the meter: Electrical preparation and adjustment of the instrument for the current Messaufgabe.durch the user by means of zero and any film standard.
The Adjustment is often Manuals in more than >Calibration, 'Or' calibration < and on keyboards with> KAL <button called!
, or micron-> microns?
At this point the opportunity to emphasize that according to DIN EN ISO throughout the issue is not the Greek term (micron), but binding of the metrological term microns,Micrometer, Is utilized. 1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm 1mm 1 x 10-3 M 1 Meter: 1000 1000 microns
-47 -
- Helpful Links to standards and regulations
DIN 50976
Hot dip galvanizing of components (hot dip galvanizing); requirements and testing,
DIN EN ISO 1461 (draft) hot-dip galvanizing of individual pieces
DIN EN ISO 2064 / DIN 50 928 for replacement-1 Metallic and other organic layers, definitions and Provisions relating to the measurement of film thickness: 1987-08) DIN EN ISO 2178 / Replacement for DIN 50 981: 1979-05) Non-magnetic coatings on magnetic substrates; Measurement of coating thickness, Magnetverfah, Ren DIN EN ISO 2360 / Replacement for DIN 50 984: 1978-08 Non-conductive coatings on non-magnetic substrates; Measurement of coating thickness, eddy currentprocess
DIN 1319-1 Fundamentals of Metrology, Basic concepts,

-48 Quality System-Directive FORD Q-101 or the manuals of the German Society for Quality (DGQ) as a further indication for the calculation of control limits.
DIN 1319-2 Foundations of measurement; definitions for the application of Gauges
DIN 1319-3
Foundations of measurement; evaluation of measurements A single measure, measurement uncertainty
DIN EN ISO 2808 Paints and varnishes-Determination of film thickness
includes: DIN 50 981, DIN 50 984, ISO 2178, 2360, 2808, BS 5411 (3,11) 3900 (c, 5) and ASTM B499, DI 400th
-49 NAVIGATION NOTE Dear reader of our Representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :
>starting from Your material to be measured at Material >or Your Application starting >or the already knownn Procedure >or if you apply for a Commercial unit Interest >content / editorial Backgrounds- And on our problem-solving opportunities, Engineering and want to inform R & D.
-> -> -> ->
-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT
We give up the search word input, the experience shows very often user Expectations not responded. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level
Phone> 0049 - (0) - 9841 - 40-1189
TV Conference> -1197

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-1 -

Layer thickness,surface measured safely

TSL measurement solutions for plastics / polymers + NON-METALS

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

Examples of industrially applicable / unused measurement systems + technology

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

finding details visit-> Systems

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

APPLICATION / measurement of LAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

KNOWLEDGE InPlace. COSTS

SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

WDM FH7 HALL 20-18 000 3 / / 2-3 10 10 aA 5 / 2 a.a a.a a.A.

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM GA coulommetr. 0.2 0.3 8 2 20 / 150 aA 10 / 7 a.a a.a a.A.

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM / WDM QW RF ultrasound 10-5000 2 / 5 10 7 10 10/10 aA aA 5

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

WDM U.S. ultrasonic 1000-30 000 5 3 4 10 10/10 aA aA 5

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM RA XRF 0.2-20 0.1 5 10 aA 10 / 2 a.a a.a a.A. a.a

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

GLOSS SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

TOPOGRAPHY PCT white light 1-90/14000 0.01/0.1 10 10 2 10 / 6 aA aA aA

TSL-TYPE USE TSL-TYPE USE

FAILURE RISK KNOWLEDGE Amort. FAILURE RISK KNOWLEDGE Amort.

PORE TEST PO el-static 50-11000 ---- 10 - 1 7 / 3 AA AA AA

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDM / WDM PO pulse radar 10 000 10 10 10 3 10 10/10 aA aA

0049 - (0) 9841 - 40-1189 Fax - 1196 TV-Conference - 1197

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

SDMpulver / wet PT Photo-Thermic 6-25 10.5 10 10 2 10 / 2 aA aA 10

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

DEEP DEFECTS -waves visually AB10 000 10 10 2 10/10 10 aA aA

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

WDM / SDM STR WI 5000-800 000 5 10 6 3 5 / 2 AA AA 5

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COLORIMETRY WI CC 5000-800 000 5 10 6 3 5 / 2 AA AA 5