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Rev. 110214-1

WOOD + GLASS + PAPER

+ Layer/Wall- thicknesses measured safely

TSL measurement solutions for PAPER and WOOD + GLASS POLYCARBONATE and Leather
LAYERS WALLS INCLUSIONS COLOR GLOSS TOPOGRAPHY

Applications PAINTS GLUE PAPER LAMINATE FILM SILICONE UV COMPENSATION NON DRIP PHOTO RESIST also: OFFSET PRINTING SOLAR CD + DVD LCD etc.

In Google + video we present practical applications of the procedure


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Type of Materials/ Processes - Thin / thick films / general thickness / walls / sandwich-u. Multi Layer - Diffusion and surface layers, insulation

Background measurements, solution requirements within the meaning of - Influence of coating on the material properties: Optical / electrical / mechanical / chemical / thermal / porosity
APPLICATION TSLSYSTEMSERIES MATERIAL THICKNESS MT/QS/US/QW/EL/DF/AU/FI/US/FH1/FH 7 FILM THICKNESS PCI / delta / GA / RA / QS / DF COEX / DUPLEX THICKNESS MT / FI / EL / AU + DF THIN PCI / delta / GA / RA GLUE / LAMINATE PCI / delta SURFACE .- roughness / TOPOGRAPHY / PORE PCI / SU / PCT / TH / TY / FI / PO Color, luster, cleanliness / PURITY delta / PG / CC / PCI

SPECIAL APPLICATIONS RADII, INTERNAL PIPE, SMALL AREAS MT / EL / DF / AU / FI / PCI / FH LayerMaterials PAINT / PAINT + CERAMIC other organic THICK QA / MT / DF / EL / AU / FI / RA / delta / PCI / CCS Order process Spraying, powder MT / QA / QW / EL / DF / AU / FI / PCI / delta

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-3 OrdereProcess,specifically Plating STAINLESS STEEL, MT / DF / QS / FH / MT / DF / EL / AU / POWDER SOLGEL, THERM.SPRITZEN, PVD, CVD QA / RA / EL / alpha / delta / PCI / CCS BASE-COAT + el.TAUCH PROCESS alpha / delta ONLINE MEASUREMENT It should be noted that most solutions as online versions, and more extensively for the 8-hour operation to date as budget systems are available.

Please choose in the google video mode, the corresponding measurement applications

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-4 NAVIGATIONNOTICE Dear reader, dear reader of these representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :

>starting from Youren, measured at Materialien >or Yourem Application starting -> >or the already knownn Procedure >or if you apply for a Commercial unit - Interest> >content / editorial Backgrounds- And on -> our problem-solving opportunities, Engineering and want to inform R & D.

-> ->

-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT

We give up the search word input, the experience shows that very often the userExpectations erfllt. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level our desired Services subjects correctly . See Very effective solution for time-determination go You ideally us by phoneConversation. Phone> 0049 - (0) - 9841 - 40-1189 Fax> - 1196 mailto> info@tslmandelkow.de TV Conference> -1197
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-5 Examples of industrially applicable / unused measurement systems + technology

NAVIGATION within the TSL kathegorisierten materials / methods described in the direction of measurement system distribution in each case above TSL-operated working area. Other operations are u.U. very different. Some commercial areas require individual user information, so we ask you for your request-> aA

Ratings are the first orientation, of course, subject to individual review and if profitability analysis. Points 7, 9, 10 and 11, we respond to the knowledge of concrete Questions individually -> a.A.

GLOSSARY Abbreviations used here in RED TSL-system-name in thickness Messs technologies induktiv Wirbelstrom ULTRAschall Hall-sensor Optable Interferometer electricstat Coulommetrisch Tamost Rntgen ThErmisch 03 Area Measurementarea in microns -> useful / border 04 prakt tolerance Tol in the above industries, operating range: under 100 micron in microns, / / About 100 micron-> in% of reading 05 USP- Efficiency and solution height For example: possible power measurement / Physics fits better than conventionally used procedures / simple / safer to use / less need for training .... other benefits 0 -> there is no 10 -> wettbewerbsrelevant 06 measurement data Nutzungs-Grad/Praxis 1 -> low 10 -> high 07 known Risk durch Operator error 1 -> low 10 -> high
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0P USE 01 TYPE 02 Physics

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08 Knowledge needed: Responsible / Operator 1 -> Instruction 5 -> Training 10 -> Training 09 known payback in months with device cuts, frequency / solvent storage 10 TestPart-Costs, under section 10 in the particular environment including staff / training / Test Preparation in EUR 11 possible preventionPotentialzial, Returns /ComplianceCosts 1 -> low 10 -> high

You can find details under Device -> Systems

APPLICATION / measurement of LAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta


u-tube> Video mode: Applications

TSL-SYSTEMS

Largely current EU standard. Built in or external probes. External probes often in the system 2 to about 20 000m Data transfer and / or internal statistics, Internal memory for data series (batches) and / or memory for spec. Adjustment settings (applications). Equipment portable / stationary, by radio, infrared, or via interface multiplexing / Mux. Accessory sets, tripod / handling, roll-additives, Mux, data, radio ... BUTTON > Systems> Hand Measuring-> Options Measuring and transfer programs for every need, BUTTON > Systems> hand-held> Options + programs

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK

KNOWLEDGE InPlace. COSTS

PREV

OP 01 02 03

MT Series

04 05 06 07 08 09

10

11

SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA

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TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK

KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

MT 700 Series

04 05 06 07

08

09

10

11

SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK

KNOWLEDGE Amort.

COSTS

PREV

OP

01 02

03

Sensors

04

05 06 07

08

09

10

11

SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

FH 1 Series

04 05 06 07

08

09

10

11

SDM / WDM FH1 BONDING force 5-20 000 3 / / 3-10 5 / 10 - aA 6 / 1 a.a a.a a.A.

A representative type-section of our extensive product range, - According to fitness, we offer you the system or even more suitable for your needs.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

FH 7 Series

04 05 06 07

08

09

10

11

WDM FH7 HALL 20-18 000 3 / / 2-3 10 10 aA 5 / 2 a.a a.a a.A.

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TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

QW Series

04 05

06

07

08

09

10

11

SDM / WDM QW RF ultrasound 10-5000 2 / 5 10 7 10 10/10 aA aA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

SU Series

04 05

06

07

08

09

10

11

Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

PG Series

04 05

06

07

08

09

10

11

GLOSS SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

PCT Series

04 05

06

07

08

09

10

11

TOPOGRAPHY PCT white light 1-90/14000 0.01/0.1 10 10 2 10 / 6 aA aA aA

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

MI Series

04 05

06

07

08

09

10

11

SDM / WDM PO pulse radar 10 000 10 10 10 3 10 10/10 aA aA


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TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

PT Series

04 05

06

07

08

09

10

11

SDMpulver / wet PT Photo-Thermic 6-25 10.5 10 10 2 10 / 2 aA aA 10

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

MF Series

04 05

06

07

08

09

10

11

DEEP DEFECTS -waves visually AB10 000 10 10 2 10/10 10 aA aA

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

STR Series

04 05

06

07

08

09

10

11

WDM / SDM STR WI 5000-800 000 5 10 6 3 5 / 2 AA AA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

CC Series

04 05

06

07

08

09

10

11

COLORIMETRY WI CC 5000-800 000 5 10 6 3 5 / 2 AA AA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

OLxz Series

04

05

06

07

08

09

10

11

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-10 ONLINE OLyz IND / WI / WLI 20-8000 0.1 / 1 10 10 1 10 / 1 AA AA 10


TSL-TYPE USE PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA FAILURE RISK KNOWLEDGE Amort. COSTS PREV

OP 01 02 03

Delt-C Series

04 05

06

07

08

09

10

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COLORIMETRY CN WI 2400-6000 K 5 10 6 3 5 / 2 AA AA 5 contact

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02

OLxyz Series

04

05

06

07

08

09

10

11

ONLINE OLxyz IND / WI / WLI 1-12 000 0.1 / 1 10 10 1 10 / 1 aA aA 10 contact

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Verbreitete measurement method


Non-destructive coating thickness measurement, SDM Non-destructive measurement of wall thicknesses, WDM

FILM and wall thickness measurement by ultrasonic pulse-echo


The method measures the walls with high precision. Once set for the application, the operation made easy. This factor is very relevant in order to successfully use ultrasound Hightec on the global level with regard to resolution and accuracy achievable for industrial production. All in all, this can solve measurement tasks which require much higher budget, other local requirements regarding equipment and time, the attainable accuracy of the measurement problem is almost unique.

Type: gauges for coating thickness / wall thickness Producer: EPK / Germany Budget Ready-measuring unit, see www.tslmandelkow.com -> Shop

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Use o o Wall thickness measurement 10-2 000m portable and stationary Measurement touching, non-destructive

System-Strken/Alleinstellungs-Merkmale o o o o micron precision thin wall measurements for example: aluminum thickness, etc., especially under 1mm Measurement of metals such as aluminum / steel / brass / copper and gold + non-metals Up to 20 measurements per Minute TSLMultiplexer-prepared

+ Sensor measuring principle o o Ultrasound physics to 100 MHz, pulse-echo Security objective - a single set per application

Sensor o o o o Repeatability precision up to 1 micron opjektiv: local accuracy 5m can be achieved Handling / coupling agent, ultrasound-usual Measured by a sensor-trigger / button / foot switch / multiplexer / Software

Basic equipment / system


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-13 o o o handy, backlit display + beeps very robust, hence mobile via built-in battery, Implementation of the System / Application of EPC / TSL

Usability o o o o handy by moisture-resistant membrane keyboard TSL application of pre-supplied visualized via individual adjustment Manual To use all the settings stored

Measurement data technology o o o o Statistics `read min / max, x bar 'etc. per shift and` total' Data memory, 100 times differentiable Data transfer via RS 232 / A software for image TSLMultiplexer-prepared

Delivery o Gauge / Sensor / Battery / Netz-ladeteil/Koffer

optional o o o Meters protective coat - very useful! Precision Measuring stand TSL-multiplexer for QSstat / SAP etc
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-14 o o Radio data transmission, portable, from 20m Wall thicknesses software with characteristic module for noble metals / glass / ceramics

innovative developments for this Department o o o contactless and online process, nanometer-Sets online Surface, Color, Topography, roughness, porosity etc, TSL-CCS, digital 1-minute DIN DIN 50986 layer-reference methods, imaging

Portable wall thickness measurement, high precision using Hall technology

- Measures walls / channels. Once set for the application, the operation made easy. This factor is pointed out just now, because ultrasonic measuring technique is used. In some very specific applications, we offer very effective support. All in all can be here many measurement tasks can be solved, which need other places much higher budget requirements regarding equipment, time and training (such as destructive), the smooth achievable accuracy of measurement by reference sphere on the opposite (inner) area is hardly training relevant.

Once set by pressing a key on the magnetic properties of the reference sphere, the operation made easy. The achievable precision surpasses even the smallest radii of the known ultrasonic measuring technologies entirely by a factor of 10x. For new, and special applications, we offer our effective support. Other multi-layer by means convert our software to measure, which is a cost-effective networking of different measurement systems (inductive / eddy current / Hall / Ultrasonic / interferometry, etc.) allows ..

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-15 These figures represent a description of the product manufacturers and are usually obtained under ideal conditions. Contact us for your specific measurement environment impacts on your required system performance. The result makes us different from applikationsfernem equipment trade in your senses.

Thus, we can also secure your required properties. Device type: wall thickness gauge / modular system, portable Measurement: NFE layers / walls against FE-ball Messpol Sensor / Probe: Plug, 1.5m cable / 3 optional types Measuring range:. 5 - 4000m / optional: up to 20 000m Minimum area: 1 mm Minimum radius: 3mm convex / concave Resolution: 0.1 microns Features: FH72 meter, probe / calibration certificate

Type: Instruments for wall thicknesses Origin: Germany


Budget under www.tslmandelkow.com -> Shop Use o o Measurement compared to the reference ball 10-4000 / optional 18 up to 000m. Measurement touching, non-destructive measurement point <2mm

+ Sensor measuring principle Physics Hall-probe with high intensity magnet positioning / measurement point from 1 mm o o o o Precision / repeatability down to 0.5 microns opjektiv: Application accuracy is not material-dependent, reached up to 2 micron Handling is carried Refrenzkugel magnetically-opposite pole Measured by triggering sensor / device key / foot switch / multiplexer / software
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System-Strken/Alleinstellungs-Merkmale o o o o o o o Thickness measurement of non-ferrous metals + non-metals, plastics, glass ideal where ultrasonic measurement applications such as the borders with tight radii, laminates, etc. Up to 20 measurements per second no material bhngige adjustment such as in ultrasonic with up to 100 times the accuracy compared to budget the same ultrasound equipment Measured in / on the smallest surfaces and radii in tubes, shapes and containers without any special knowledge / training to use

Basic equipment / system o o o handy, backlit display + beeps very robust, hence mobile via built-in battery, Implementation of the System / Application of EPC / TSL

Usability o o o o handy keyboard slide TSL / EPK Manufacturer preset visualized via individual adjustment Manual To use all the settings stored

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Measurement data technology o o o o Statistics `read min / max, x bar 'etc Data memory, 100 times differentiable Data transfer via RS 232 / Software TSLconvert TSLMultiplexer-prepared

Value / Budget o o o

found in www.tslmandelkow.com -> Shop

Gauge / Sensor / Holder / 200 reference spheres / Cases Meters protective coat - very useful! Excel import software

Options o o o o o o Probe to 4mm 10mm probe Probe up to 18mm Interface with power packs and foot switch Multiplexer for QSstat / SAP etc Bluetooth wireless data transmission above / more than 20m

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Ultrasonic SDM - high frequency to 100Mhz

TSL-QS SERIES

- Layer thickness measurements on organic substrates and multilayers. System cost: systems from about EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.

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Ultrasonic WDM process, - high-frequency 40-100Mhz

TSL-QW-SERIES

- Layer thickness measurements on organic substrates and multilayers. System cost: systems from EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.

TSL-alpha-SERIES Serial measurement of very thin layers with the possibility very thin substrates - the capacitive SDM process
Application Capacitive SDM method for thin films on conductive reference film, the carrier material thickness from about 1 micron hardly relevant. Training needs: 3 Measuring time: 10 sec Preparation / set-up time: 1 min.
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-20 Suitable for reference measurements with films - such as: offset printing. The method can be used on very thin FE-reference materials, in which case the usual measurement errors, such as by magnetization fluctuations in an otherwise very thin FE reference not come into play - perhaps a unique selling feature.

Non-contact measurement of very thin layers with the possibility transparency measurement, - the SDM interferometric method
System Cost: sensors from about EUR 7000 Training Requirements: 6 / 2 Measuring time: 0.1 seconds Preparation / set-up time: 5/0.5 min. Measuring rate up 200/sek.

TSL-delta-SERIES

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Impuls-Radar/Mikrowellen measurement method Application

TSL-MI-SERIES

Walls / thick layers / layer composite,

System Cost: sensors from about EUR 60 000 Training needs: 5 Measuring time: 0.1 seconds Preparation / setup time: minimum 10 min.

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Type: Delta-Meters in wall thickness / layer thickness Origin: TSL, Germany

Non-contact systems: TSL-DELTA


Translucent layers of smooth Substrates-transparent wall thicknesses

Automotive-packaging glass - UV

Verification by REM

delta Lab-Station

Delta-system characteristics 0.2 - 4000 microns, tolerance: <20 nm Schwrmbereich: Up to 5000 x reading Rate: 30 readings / sec Module 1/2x 19 inch
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MEASURING SYSTEM PCI

Non-contact systems: TSL-PCI


Translucent layers of smooth substrates and topographicTransparent wall thickness, steps, topographies

Automotive-packaging glass - UV

PCI System Characteristics 1.2 15 000 microns, tolerance: 20 nm Measuring point: <20/10m Rate: up to 3000 readings / sec Module 1/2x 19 inch PCI as topography measuring station

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Micro Topgrafien, roughness and thickness measurements for non-contact and fast measurements

TSL PCI SERIES

Polychromatic interferometry for smooth and rough surfaces, - microtopography

Application topography measurement

a.A. Thermal process for heavily pigmented coatings, powder and wet measurements, non contact. as a thermal measurement method and to visualize Faults and coupling faults.

System cost: EUR 25 000 from sensors Training Needs: 4 Measuring time: from 2 sec Preparation / set-up time: a few min. Measuring rate up 4000/sek.

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Type: Automatic handling XZ-scanner for thickness / wall thickness / color and gloss-measuring systems Origin: TSL, Germany

For system developers Type: gauges for coating thickness / wall thickness Visualisations and fault-finding by pulse-radar Origin: via TSL, Germany

Fault-finding within thick-walled structures and Werstoffen

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For system developers: Type: gauges for coating thickness / wall thickness Visualisations and fault-finding by photo thermal Origin: via TSL, Germany

Type: methods of measurement of thick layers in the melting process OM

From the granules to the wall: Co-extruded packaging of dangerous goods during the melting process
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-27 The on-line measurement in the machine is then possible.

Eddy current, induction and effects Application

TSL-MT-SERIES

For the most widely used measurement application procedures are established, both of which are from the use of on the effects of a sensor over a metallic base material (GW) as a carrier of measuring Layer define. Each resulting signal response between a sending and a receiving sensor to a Metal as a carrier of the layer is influenced by the distance to be measured (= layer thickness). The thicker the layer, the smaller the sensor effect can be evaluated. Distance measurement between sensors and the respective base material as a reference. This base material (or substrate, or backing material) therefore first determined that, in some cases to use measurement processes. To be measured Wall /Layer defines the distance to the substrate, where it in alloys Changeinteractions with the substrate may.

As a sensor of a measuring unit, these technologies are encapsulated in the different measuring probes almost all manufacturers and measurement principles of portable devices. Many Questions a measuring system resulting from the correct Ratio is a primary fed- for secondary measurable / measured energyResponse. The focus will thus binding the elektrsized/ Magnetic / acoustic / optical Transmission properties der respective
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-28 Workmaterials. Here you can find almost any potential for conflict and solution strategies again.

Eddy current measuring method MTSERIES

TSL-

Device Type: Optical almost identical to the inductive method is the only high-frequency coil of the probe usually horizontally, which the measurement area determines effect.

WDM / SDM from electrically non-conductive media in relation to highly conductive References / substrates. WDM non-conductive materials to Referenz-Leitern/Kugeln - there significant advantages over ultrasound systems at very high accuracy. Suitable for thick layers and materials (fiberglass, carbon fiber, etc.).

Requirements: Electrical adjustment on the uncoated object using standards. also suitable building sites, System Cost: 400
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-29 Training Needs: 4 Measuring time: 10 sec Preparation / set-up time: 1 min. Requirements: Electrical adjustment on the uncoated object using standards. Substrate thickness: approx 40m minimal. For non-magnetic metal substrates with non-conductive coatings. The coating must be tough enough to resist the pressure of each patch Measurement probe tip is not to yield.

Even for non-iron-wall thicknesses measurement:

Magnetic-inductive measuring method

TSL-MT

WDM non-magnetic materials to reference-FE. - Also suitable building sites, measuring time: usually faster than 5 seconds. Each suitability for conductive walls / thick films (galvanizing) to consider! System cost-EUR: 400 Training needs: 5 Measuring time: 5 sec better
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-30 Preparation / set-up time: 5 min Prerequisites: Electric-magnetic alignment at the (same) uncoated object using standards. Perform eddy current fields in the conductor to be measured at constant methodically measuring deviations characteristics, a correction program (see TSLconvert) be einsettzbar. For magnetizable metal substrates with non-magnetizable coating / wall. Substrate thickness: 0.5-1mm minimal, depending on the sensor. The material must be tough enough to be the pressure of each patch test probe tip to yield.

Hochgenaue, special Wall measurements

Hall probes Procedure

TSL-FH 7 SERIES

SDM / WDM non-magnetic walls / FE layers to substrates. WDM non-magnetic materials to reference FE (as a ball), - a Ball serves as Referenzpol, - Often safety-profit and advantages over, for example. Ultrasound systems for multiple precision and very good radius capability to 1mm!. Requirements: Electric-magnetic alignment on the uncoated object using standards. For units of the FH-Series is the adjustment to the FE reference sphere already internally automated ..

Suitable building sites, especially near stream areas .- often for thin substrates - rolling Measuring time: 5 seconds
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-31 System Cost: 700 Training Needs: 4 Measuring time: 1-10 sec Preparation / set-up time: 1 min. For magnetizable metal substrates with non-magnetizable coatings. The coating must be tough enough to be the pressure of each patch test probe tip to yield.

Technology Hall does not require acoustic impedance-dependent adjustments of the wall-material
Properties compared with ultrasonic techniques (US-WDM) with changing metrics and Geometries. It also eliminates the coupling fluid. The wall thickness may be only a few micrometers (microns) are up a millimeter.

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Magnetic Strength-Procedure
Application

TSL-FH 1

WDM of non-magnetic layers (layers) compared with FE-substrates. WDM non-magnetic materials to FE. Also for soft Schhicht / wall materials.

- Also suitable building site System Cost: from 100 Training required: 2 Measuring time: 10 sec Preparation / set-up time: 30 sec Requirements: No adjustment, therefore, close application limits. Substrate thickness note (about 1 mm minimum)! For magnetizable metal substrates with non-magnetizable walls / coatings. The coating must not hard enough so as not to pressure the relevant patch test probe tip to give, since Measurement of release of the pressure goes to zero. Wiche materials such as rubber, are so often measured.
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SURFACE LAYER COLOR WALL THICKNESS, - Examples of equipment series If there is more than one TSL system indicated, the challenge of the application may ask about possibilities:

Online / offline Measuring speed Liquid / dry Size of sensor-spot/point

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AUTOMOTIVE

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Product: Rolls-Royce - wooden dashboards Application: <2 mm transparent coating on wood TSL System: PCI (for scanning), or US-200 ultrasonic

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-37 Product: Bayer Makrolon, polycarbonate Application: <2 mm wall, - and 2-20m coating TSL System: delta 3.2 + PCI (scanning), Wall: delta 3.4 and FH

Product: BMW door shilding, rubber Application: <20m coating measurement TSL System: PCI

Product:

Automotive- Interior, leather

Application: <60 microns coating TSL System: US-200


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-38 -

GLASS, CARBON FIBER - Materials and others

Product:

Automotive interior, carbon

Application: <100 micron coating measurement TSL System: PCI

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Product: Space, glass-fiber Application: 8-20 mm wall thickness TSL System: FH featuring convert

Product:

Car-body, Non metal

Application: 5-120 micron multi-layer coating thicknesses TSL System: U.S.: Filler + cover plus: transparent, delta 2.3
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Product:

Glass-fiber Container

Application: 18 mm wall thickness measurement TSL System: FH

Product: SI-Wafer Application: 1-20 micron multi-layer coating thicknesses TSL System: delta 2.3

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Product:

Wood,- Furnishing

Application: 20-200 micron multi-layer coating thicknesses TSL System: PCI non contact / contact U.S.

Product:

space, Carbon +foam

Application: up to 20mm wall thickness


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-42 TSL System: FH 20

Product:

Glue material on very thin Substrates

Application: 2-50 micron coating thicknesses TSL System: PCI / HSL

Product: CDDVD
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-43 Application: 0.2-10 micron coating TSL System: delta

Product:

Injector, polacarbonate

Application: 0.1-2 micron coating thicknesses and online through wall TSL System: delta 3.9

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-44 Product: Blister packaging

Application: 0.5-5 micron coating thicknesses on Hologram TSL System: HSL

Product:

offset printing

Application: 0.5-5 micron multi-layer coating thicknesses TSL System: HSL

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-45 -

Product:

GlassContainers

Application: 2-5 mm wall thickness TSL System: PCI / delta online and offline FH

PCI at work, - Thin Film: Rubber


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Bottom of a GlassContainer (left) - PCI

Coex container, - 2 x wall thickness Delta plus PCI

Thermo Forming- Wall thickness, - delta / PCI

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Plastic film, - wall-thickness, - PCI

Front windshield of aircraft, wall-thickness, - PCI

Silicone on paper / textile- Si-coating: PCI SI-caterpillar- thickness: PCI

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-48 -

Colour online measurement, Delta - spot, 0.5mm

Special application forms of the SDM of NFE / FE-on materials

Some methods of measurement, especially in layer structures, possibly via the suitability micrograph of Check and correct. With suitable methodological differences and stable processes, the Using an automatic curve-correction program, such as TSLconvert.
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-49 To it, for example, is for highway pavement thickness settlement of this process, a regulatory basis of calculation and shall be trained accordingly.

Nmaybe-conducting materials to a simple aluminum foil as a zero reference auf-/unterlegbarer


Wood thickness FRP thickness Glass thickness

The measurement process in the selection

The conditions in industrial production environments demand meters, which are fast and reliable work and use local are network independent, weather-resistant and temperature-independent. In addition, the required margin of measurement uncertainty, as it is to read from the device manufacturer should be taken into account. Noteworthy are the representations and conditions under which the Lieferanten/Hersteller-Details of Measuring Properties are accessible - even ours. A transparency of the different modes of representation, particularly in relation to the requested application solution out to us essential, as we design solutions with the matching, so different systems.

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-50 -

The appropriate adjustment and fixation-related applications are also used.


Measuring equipment plus TSL-precision stand

With a plurality of measuring devices affect conductivity / Magnetic properties of the measured wall / coating such as nickel rata Selected measuring method for the user imperceptibly or clear. This can provide independent advice from seasoned Apllikationen recognized phenomena in advance and give effect to clarify.

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-51 -

Our test solution can be found inter alia in the following areas:

DESTRUCTIVE / LOSE TRACK MEASUREMENT TECHNOLOGIES AND STRATEGIES

industrial ProductionAreas / concepts

Anodizing - Automobile-accumulators - Aerodynamics Agriculture - Home - Architecture - Antenna - Autobahn Avionics - Automation - Boats - Railways - Buildings Lighting - Concrete - display - floor coverings - oil rigs Cards - Cardan
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-52 -

Castor nukl. - Surgery - Chrome - container Coextrusion - Wire - Design - Anodising - Electricity - Electronics Nutrition - cycling - color - walls - fire protection Filter - Movies - mold - gas supply Electroplating - Dangerous

Health - Foundry - Cross - glass - sliding Rubber - port crane - Semiconductors - Adhesive - holography med skins - Wood - High Voltage - Hydraulic - Implants Instruments Catalysts - Tank - Necklaces - Coal - Construction Adhesive Air - Components - Beauty - Kitchen - Copper - Patent - Storage Laminates - Leather - Aviation Luxuries - tape - Machines Marine - Poles - medical tubing - Models - Motors - Military Walls - microphones - Multi Layer - garbage trucks - Musical Instruments Wet Test - nickel - non-ferrous - Nuclear - Offset - Optics Paper - Paleontology Pharma - Pipeline - Polycarbonate China - powder coatings - rocket - space - Tyres Corrugating Rolls-ray Roles - Sandwich - Headlight - Tubes - Locks Snow - Screens - Screen Printing - safety glass - signaling Switch - Toys - Storage - sheet piling Dams - Teflon - Wings
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-53 -

Transformers - Fuel-caking agent - animal skins - Turbines Carpets Textile tec .- U-boat watches valves Connector Package - Rolls-water supply - water slides Tools - living - heat exchanger - Elect. Toothbrushes Cement - zinc - cylinder

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-54 -

Tag

In the SD measurement GEpreliminary Terms that in communication can confuse: Calibration a measuring instrument: Repatriation on a national / international deposited Standard mass and timed De Documentations Target-state durch a Calibration with certificate and seal. Adjustment/ Setting the meter: Electrical preparation and adjustment of the instrument for the current Messaufgabe.durch the user by means of zero and any film standard.

The Adjustment is often Manuals in more than >Calibration, 'Or' calibration < and on keyboards with> KAL <button called!

, or micron-> microns?
At this point the opportunity to emphasize that according to DIN EN ISO throughout the issue is not the Greek term (micron), but binding of the metrological term microns,Micrometer, Is utilized. 1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm 1mm 1 x 10-3 M 1 Meter: 1000 1000 microns

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-55 -

- Helpful Links to standards and regulations

DIN 50976

Hot dip galvanizing of components (hot dip galvanizing); requirements and testing,

DIN EN ISO 1461 (draft) hot-dip galvanizing of individual pieces

DIN EN ISO 2064 / DIN 50 928 for replacement-1 Metallic and other organic layers, definitions and Provisions relating to the measurement of film thickness: 1987-08) DIN EN ISO 2178 / Replacement for DIN 50 981: 1979-05) Non-magnetic coatings on magnetic substrates; Measurement of coating thickness, Magnetverfah, Ren DIN EN ISO 2360 / Replacement for DIN 50 984: 1978-08 Non-conductive coatings on non-magnetic substrates; Measurement of coating thickness, eddy currentprocess

DIN 1319-1 Fundamentals of Metrology, Basic concepts,


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-56 Quality System-Directive FORD Q-101 or the manuals of the German Society for Quality (DGQ) as a further indication for the calculation of control limits.

DIN 1319-2 Foundations of measurement; definitions for the application of Gauges

DIN 1319-3

Foundations of measurement; evaluation of measurements A single measure, measurement uncertainty

DIN EN ISO 2808 Paints and varnishes-Determination of film thickness

includes: DIN 50 981, DIN 50 984, ISO 2178, 2360, 2808, BS 5411 (3,11) 3900 (c, 5) and ASTM B499, DI 400th

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