Escolar Documentos
Profissional Documentos
Cultura Documentos
KENNETH WYATT
his article describes one o f the most valuable tools i n the E M C engineers "bag o f t r i c k s " - the h i g h - f r e q u e n c y c u r r e n t probe. C u r r e n t probes are i n v a l u able for m e a s u r i n g h i g h - f r e q u e n c y c o m m o n - m o d e (or "antenna") currents f l o w i n g on w i r e s or cables. Experience has p r o v e n that p o o r l y t e r m i n a t e d (bonded or filtered) cables are t h e n u m b e r - o n e cause for r a d i ated emissions failures at a test f a c i l i t y . By m e a s u r i n g t h e c o m m o n - m o d e ( C M ) currents (sometimes referred t o as " a n t e n n a " c u r r e n t s ) o n these cables it's possible t o t r o u b l e s h o o t and apply fixes t o a p r o d u c t r i g h t there i n y o u r d e v e l o p m e n t lab. Y o u can also p r e d i c t , t o a g o o d degree o f accuracy, w h e t h e r a given cable c u r r e n t w i l l pass or f a i l i n t h e m e a s u r e m e n t chamber. T h i s w i l l save y o u tons o f t i m e t r y i n g t o apply fixes at t h e test f a c i l i t y w h i l e t h e c l o c k is t i c k i n g away y o u r test t i m e . I ' l l also show y o u several ways t o create d o i t - y o u r s e l f ( D I Y ) probes t h a t are q u i c k t o make and v e r y u s e f u l i n a p i n c h .
i m p e d a n c e i n a n y g r o u n d i n g system ( i n c l u d i n g c i r c u i t b o a r d signal/power r e t u r n planes), there w i l l be a voltage d i f f e r e n c e between any t w o p o i n t s w i t h i n t h a t r e t u r n plane. T h i s is d e n o t e d by ^Q^jy, and V^j^^^ in the figure. T h i s difference i n potential w i l l drive C M currents t h r o u g h c o m m o n c a b l i n g or c i r c u i t traces between c i r c u i t s or sub-systems. I n a d d i t i o n , u n b a l a n c e d geometries - for example, d i f f e r e n t lengths or p a t h r o u t i n g s for high-speed d i f f e r e n t i a l pairs - can create voltage sources t h a t drive associated C M c u r r e n t s . Finally, r o u t i n g a h i g h - s p e e d clock trace across a s p l i t i n t h e r e t u r n plane or r e f e r e n c i n g i t t o m u l t i p l e planes, can also be a source of C M c u r r e n t . Because t h e c u r r e n t phasors i n Figure 1 are a d d i t i v e , t h e r e s u l t i n g r a d i a t e d phasor may be q u i t e large c o m p a r e d t o those generated by d i f f e r e n t i a l - m o d e ( D M ) , or signal c u r r e n t s , w h i c h are opposite i n d i r e c t i o n , and so t e n d t o cancel. T h e r e f o r e , C M emissions t e n d t o be m o r e o f an issue t h a n D M emissions.
T h e RF c u r r e n t p r o b e is an " i n s e r t e d p r i m a r y " type of radio frequency current t r a n s f o r m e r . W h e n t h e probe is c l a m p e d over t h e c o n d u c t o r or cable i n w h i c h c u r r e n t is t o be measured, t h e c o n d u c t o r f o r m s the p r i m a r y w i n d i n g . T h e c l a m p - o n feature o f t h i s p r o b e enables easy placem e n t a r o u n d any c o n d u c t o r or cable. T h i s is essentially a b r o a d b a n d h i g h - f r e q u e n c y t r a n s f o r m e r . H i g h - f r e q u e n c y c u r r e n t s can
COMMON-MODE CURRENTS
are generated, because i t is n o t i n t u i t i v e as to h o w c u r r e n t may travel the same d i r e c t i o n t h r o u g h b o t h the s i g n a l and s i g n a l r e t u r n w i r e s i n a cable or PC b o a r d . Ref e r r i n g t o Figure 1, note t h a t due t o f i n i t e
14 INTERFERENCE TECHNOLOGY
Source
Signal
Load
R.
t o r o i d or c l a m p - o n core t h a t offers g o o d h i g h - f r e q u e n c y c h a r a c t e r i s t i c s i n the 10 to 1000 M H z range. W i n d i n g a few (not too c r i t i c a l ) t u r n s a n d t e r m i n a t i n g w i t h a coax c o n n e c t o r is a l l y o u need. Keep(as
Signal Return
inter-winding
c a p a c i t a n c e a n d y i e l d b e t t e r r e s u l t s at the h i g h e r frequencies. T h i s is one of the V, V largest d r a w b a c k s i n p e r f o r m a n c e of the c l a m p - o n ferrites (as i n Figure 5).
GND1
d = 3m
Phasor from far wire Phasor from near wire Resultant phasor
GND2
TRANSFER IMPEDANCE
(V)
T h e C M c u r r e n t (Ic) i n m i c r o a m p s i n the c o n d u c t o r u n d e r test is d e t e r m i n e d f r o m the r e a d i n g o f the c u r r e n t probe o u t p u t i n m i c r o v o l t s d i v i d e d by the c u r r e n t (ZT). probe transfer i m p e d a n c e Ic = V / Z T Or, i n dB Ic(dBuA) = V ( d B u V ) - Z T ( d B n ) The typical transfer impedance (2) of the
Figure 1. Common-mode currents in a circuit loop. The source is a digital signal (with harmonics) and we'll assume a resistive load. Because the phasor current in the far wire is in the same direction as the phasor current in the near wire, the resultant phasor is relatively large compared to that produced by differential-mode current phasors. In this case, lowering the harmonic content (by slowing the digital rise/fall-times) or diverting/blocking the CM current is very important in limiting radiated emissions.
be m e a s u r e d i n cables w i t h o u t p h y s i c a l l y d i s t u r b i n g the circuit. Since the c u r r e n t p r o b e is i n t e n d e d f o r " c l a m p - o n " o p e r a t i o n , the p r i m a r y s h o w n i n Figure 2 is a c t u a l l y the e l e c t r i c a l c o n d u c t o r i n w h i c h C M c u r r e n t s are to be measured. T h i s p r i m a r y is considered as one t u r n since i t is assumed t h a t the C M c u r r e n t s f l o w t h r o u g h the c o n d u c t o r a n d r e t u r n to the source via a r e t u r n c o n d u c t o r such as a f r a m e , c o m m o n g r o u n d plane, or e a r t h . O n some c u r r e n t probe models the s e c o n d a r y o u t p u t t e r m i n a l s are resistively loaded i n t e r n a l l y to p r o v i d e s u b s t a n t i a l l y c o n s t a n t transfer i m p e d a n c e over a w i d e r f r e q u e n c y range. Or
(1)
c o n d u c t o r a n d n o t i n g the voltage ( V ) developed across a 5 0 - O h m load. Then, Z T = V / I c (in standard units) Z T ( d B n ) = V(dBjV) - I c ( d B j A ) (3)
(4)
T h e Fischer F-33-1 probe is a c o m m o n l y used t r o u b l e s h o o t i n g t o o l a n d has a f l a t f r e q u e n c y response f r o m 2 to 250 M H z (Figure 6). T h e t r a n s f e r i m p e d a n c e is about S n ( a p p r o x i m a t e l y +14 d B f l o n the graph), therefore, a 1 u A c u r r e n t w i l l p r o d u c e a 5 u V o u t p u t voltage f r o m t h e c u r r e n t probe.
W h i l e c o m m e r c i a l c u r r e n t probes are pricey, the advantage is t h a t t h e y can open up a n d snap a r o u n d a cable, r a t h er t h a n h a v i n g to be threaded o n t o the cable to be m e a s u r e d . See F i g u r e 3. T h e y are also a l o t m o r e r u g g e d a n d can take a l o t of abuse as c o m p a r e d to the " d o - i t - y o u r s e l f " ( D I Y ) versions below. Finally, they are also accurately c h a r a c t e r i z e d , a l l o w i n g v e r y precise m e a s u r e m e n t s of cable c u r r e n t s .
Noise Current
a n d 5. I t y p i c a l l y t r y to f i n d a f e r r i t e
current
transformer).
16 INTERFERENCE TECHNOLOGY
PROBE CALIBRATION
the f i x t u r e a n d the f r e q u e n c y is swept w h i l e m e a s u r i n g the probe o u t p u t . M y test setup was a l i t t l e m o r e r u d i m e n t a r y (Figure 7), but for t r o u b l e s h o o t i n g purposes, it's g o o d e n o u g h . I used a short piece of s t i f f w i r e across the o u t p u t p o r t w i t h a 5 0 0 resistive load i n series. I t h e n adjusted the generator for zero d B m - a c o n v e n i e n t a m o u n t . T h i s is e q u i v a l e n t to an o u t p u t voltage of 224 m V (or 73 d B u A of c u r r e n t ) i n t o 5 0 0 . T h e a c t u a l generator o u t p u t doesn't matter, so l o n g as the r e s u l t i n g p r o b e voltage is large e n o u g h to be seen r e a d i l y i n the receiver or s p e c t r u m analyzer. I m o n i t o r e d the p r o b e o u t p u t w i t h a T h u r l b y T h a n d e r T T i PSA2701T h a n d h e l d s p e c t r u m analyzer. K n o w i n g the c u r r e n t t h r o u g h the w i r e i n d B u A a n d the p r o b e o u t p u t in dBuV, the transfer impedance may be p l o t t e d g r a p h i c a l l y by subt r a c t i n g : V ( d B u V ) - I c ( d B u A ) (expressed i n dB). I n t h i s case, Z T ( d B O ) = V ( d B u V ) - 73. W h i l e t h i s may be u s e f u l for e d u c a t i o n a l p u r p o s e s , I w o u l d n ' t be too i n c l i n e d to use the D I Y probes to p r e d i c t "pass/fail", as described f u r t h e r d o w n . However, because t h e y c o m p a r e f a v o r a b l y to the c o m m e r c i a l probes as far as o u t p u t voltage, I believe (and have p r o v e n i n p r a c t i c e ) t h a t t h e y are c o m p l e t e l y s u i t e d for t r o u b l e s h o o t ing. You o n l y need to k n o w w h e t h e r an E M C design f i x made the cable c u r r e n t better or worse.
Lab Highlights
NARTE Certified Technicians, E3 Technologists & Eiectricai/Mechanicai Engineers 5 Anechoic Chambers HIRE Test Facilities High Voltage Lab Mechanical Engineering & Design Engineering and analysis of materials and components Custom Fabrication Machining, MIG, TIG Welding
PREDICTING PASS/FAIL
Compliance Testing
Aeronautical DO-160, Airbus, Boeing Automotive SAE, CISPR, ISO E-Mark Commercial MIL-STD, CISPR, CEDEF-STAN Mark, ANSI Medical Military CISPR Nuclear NUREG Rail EN for EMC & Surges Space IEEE Telecom Telcordia, FCC, iC Wireless FCC, industry Canada, European, ETSI
E L E C T R O l ^ n i c S
T E S T C E N T R E
I t is possible to p r e d i c t w h e t h e r a p a r t i c u l a r cable w i l l pass or fail r a d i ated emissions by m e a s u r i n g the C M c u r r e n t at the o f f e n d i n g frequency, r e a d i n g o f f the t r a n s f e r i m p e d a n c e of the probe, Z t ( d B H ) i n Figure 6, and s o l v i n g for I c (using E q u a t i o n 2 above). P l u g g i n g I c ( A m p s ) i n t o E q u a t i o n 5 w i l l calculate the E - f i e l d level i n V/m. T h e l e n g t h o f the cable is L(rn) a n d the o f f e n d i n g h a r m o n i c f r e q u e n c y is f ( H z ) . Use a test d i s tance, d, of either 3 or 10m to p r e d i c t the o u t c o m e at those test distances.
= 1.257 x i r *
(5) O n c e you've d e t e r m i n e d a part i c u l a r cable has C M c u r r e n t s t h a t may cause a RE f a i l u r e , y o u s h o u l d to e x a m i n e t h e c o n n e c t o r where the cable is attached to the p r o d u c t
302 Legget Drive, Unit ICQ | Kanata | Ontario 613-599-6800 | etc-mpb.com | inquiries@etc-mpb.com
18 INTERFERENCE TECHNOLOGY
WYATT
enclosure. V e r y o f t e n , I f i n d p o o r or n o n - e x i s t e n t b o n d i n g between the c o n n e c t o r shield a n d enclosure shield. These p o i n t s m u s t be b o n d e d w e l l to p e r m i t the C M c u r r e n t s to f l o w back to t h e i r source w i t h i n the p r o d u c t , a v o i d i n g associated cable r a d i a t i o n . Please refer to m y p r e v i o u s articles o n t r o u b l e s h o o t i n g r a d i a t e d emissions for more i n f o r m a t i o n (references below).
probes.
As p r e v i o u s l y m e n t i o n e d , one of the m o s t c o m m o n sources of r a d i a t e d e m i s s i o n s is due to p o o r l y b o n d e d connectors m o u n t e d on shielded p r o d u c t enclosures. T h i s o c c u r s especially i f the c o n n e c t o r s are c i r c u i t b o a r d m o u n t e d and penetrate loosely t h r o u g h the shielded enclosure. Poorly b o n d e d c o n n e c t o r s a l l o w i n t e r n a l l y generated C M c u r r e n t s to leak o u t and f l o w o n the outside o f I/O, mouse or k e y b o a r d cables. T h i s w i l l also a l l o w ESD discharges inside the p r o d u c t - m o r e bad news. I f these c u r r e n t s are a l l o w e d o u t of the enclosure, the attached cables w i l l act as r a d i a t i n g antennas - o f t e n r e s o n a t i n g a r o u n d 300 M H z , due to t h e i r t y p i c a l I m l e n g t h . T h i s was the case for a new d i g i t i z i n g o s c i l l o s c o p e p r o t o t y p e I w o r k e d o n recently. T h e I/O c o n n e c t o r s were all soldered o n t o the PC b o a r d and the b o a r d was fastened to the rear h a l f of the enclosure. T h e c o n n e c t o r s s i m p l y poked up t h r o u g h c u t o u t s i n the rear m e t a l shield. W h i l e u s i n g a c u r r e n t probe to measure the C M c u r rent f l o w i n g o n the outside of the USB cable u n d e r test, I s i m p l y j a m m e d the s c r e w d r i v e r blade o f m y Swiss A r m y k n i f e b e t w e e n the c o n n e c t o r b o n d i n g fingers and m e t a l chassis enclosure a n d was able to d r o p the o v e r a l l cable c u r r e n t s by 10 to 15 d B . T h e s o l u t i o n was to f a b r i c a t e a c u s t o m s h i m w i t h s p r i n g - f i n g e r s t h a t w o u l d slip over a l l the c o n n e c t o r s crea t i n g a f i r m b o n d between the c o n n e c t o r g r o u n d shell and inside o f the shielded enclosure. M o r e a n d m o r e l o w - c o s t p r o d u c t s are r e l y i n g o n PC b o a r d m o u n t e d I/O connec-
Figure 4. Examples of DIY current probes based on a large toroid core. These photos were taken prior to installing the E-field shield which consists of a layer of copper tape overthe windings, leaving a small gap around the inside of the toroid. 14 turns of Teflon-insulated wire wound around a Wiirth Electronik #74270097 ferrite core (4W620 material) was used, which is useful from 10 to 1000 MHz.
FigureS. Examples of DIY current probes based on clamp-on ferrite chokes. I used a couple sample Steward (now a unit of Laird Technologies) chokes - a round one (model 28A3851-0A2) and a square one (model 28A2024-0A2), They each had 7 turns of Teflon-insulated wire wound around one-half and glued down on the inside to hold the windings. I later epoxied a PC boardstyle BNC connector to the outside, making sure there was enough epoxy to hold the outer turns together. Type 28 material was used, which is useful from 10 to 1000 MHz.
Figure 6. Transfer impedance (ZT) graph of an F-33-1 current probe (courtesy of Fischer Custom Communications). The x-axis is frequency, while the y-axis is dBCl. Use this to calculate the value of Ic (Equation 2), given the measured voltage at the probe terminals (V,JandZT. INTERFERENCE TECHNOLOGY 19
interferenceteohnology.com
Figure 7.1 used a short wire and 50O load (two parallel WOO resistors) across the generator output for probe characterization. Obviously, there are shortcomings at higher frequencies, due to the inductance of the wire. In fact, the system impedance starts to go capacitive at 100 MHz and it's difficult to keep a fixed 224 mV across the load resistor with frequency.
Frequency (MH2)
Figure 8 Transfer impedance (ZT) graph of a commercial current probe versus the DIY toroidal probe. The x-axis is frequency, while the y-axis is dBCl. Note that the commercial probe is only designed and characterized to 250 MHz, so the data above that, while interesting, is probably not valid. The DIY probe, as well, performs poorly above 200 MHz and frankly, the wire loop used to introduce a "calibrated" current (while as short as possible) affects the measurement, as well.
1. W h e n e v a l u a t i n g the h a r m o n i c s o n a cable by using a c u r r e n t probe, i f s l i d i n g the probe back and f o r t h changes the h a r m o n i c levels, p a r t of the c o u p l i n g m a y b e near-field, rather t h a n c o n d u c t e d . 2. W h e n u s i n g a p a i r o f c u r r e n t probes; one o n each of t w o cables, i f the h a r m o n i c s are the same i n each, t h e source is i n the m i d d l e . I f one cable has stronger h a r m o n ics, t h e n y o u ' l l w a n t t o w o r k o n t h a t side f i r s t . See Figure 12 below. 3. M e a s u r i n g t h e c u r r e n t s o n t w o suspect legs o f a d i p o l e s h o u l d read t h e same. P l a c i n g t h e t w o suspect legs t b r o u g b t h e same c u r r e n t probe s h o u l d cause a b i g decrease due t o c u r r e n t c a n c e l l a t i o n . See Figure 12 below. 4. W h e n m e a s u r i n g video cable c u r r e n t s and large cable m o v e m e n t s cause b i g changes i n a m p l i t u d e , the c o u p l i n g is likely i n d u c t i v e - o t h e r w i s e , it's m o r e likely c o n d u c t i v e . 5. I f y o u suspect i n d u c t i v e c o u p l i n g , t h e phase at t h e v i c t i m w i l l be 180-degrees f r o m t h e source. T h i s may be observed o n a n oscilloscope w i t h H - f i e l d probes or c u r rent probes. T r y s y n c i n g the scope t r i g g e r at the source using a scope probe. M y colleague, D o u g S m i t h , has m a n y m o r e examples o n b o w t o use c u r r e n t probes for m e a s u r i n g cable and PC b o a r d resonances, i n j e c t i n g pulses f o r t r o u b l e s h o o t i n g , i n t e r p r e t i n g the relative phase o f c o m m o n - m o d e c u r r e n t s and t r o u b l e s h o o t i n g ESD issues. Refer t o t h e references below.
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Use o f a c u r r e n t p r o b e is v i t a l d u r i n g t h e t r o u b l e -
s h o o t i n g process. P o o r l y b o n d e d cable c o n n e c t o r s can be r e a d i l y i d e n t i f i e d a n d f i x e d . T h e r a d i a t e d E - f i e l d f r o m a p r o d u c t I/O cable may be c a l c u l a t e d by m e a s u r i n g t h e high-frequency common-mode currents f l o w i n g i n the cable. A l l t h i s may be p e r f o r m e d r i g h t at t h e designer's
ITEM
2 0 INTERFERENCE TECHNOLOGY
WYATT
w o r k b e n c h a n d w i t h o u t t h e expense o f a t h i r d - p a r t y test f a c i l i t y o r s h i e l d ed chamber.
C o m m e r c i a l v e r s u s DIY C u r r e n t P r o b e (Wire L o o p )
100
T-
REFERENCES - PAPERS
. [1] Mat Aschenberg & Charles Grasso, Radiation from Common-Mode Currents Beyond 1 GHz (Three Methods Compared) [2] Dave Eckhardt, Homebrew ClampOn Current Probe, private correspondence (January 2009), Email: davearea51@wildbiue.net. [3] 31-34. . [4] Michel Mardiguian, EMI Troubleshooting Techniques, McGraw-Hill, 2000, pages 39-49. [5] Montrose & Nakauchi, Testing for
Frequency (MHz)
> a
60
40
20
Jasper Goodblood,
Electromagnetic
-20 -40
E M C Compliance, 2004, VXAley Interscience, pages 116-124, 143-145, and 159-161. [6] Henry Ott, Electromagnetic Compatibility Engineering, Wiley, 2009, pages 690-693. [7] Henry Ott, Measuring CommonMode Currents on Cables, www.hottcon-
figure 9. Probe output voltage (V^J graph of a commercial current probe versus the DIY toroidal probe. The x-axis is frequency, while the y-axis is dBuV. This shows that the probes are very comparable in output voltage versus frequency. For troubleshooting purposes, absolute accuracy is not required - just consistency in measurements. All one really needs to know is, "did the fix 1 implemented make the CfYI current go up or down?" The DIY probe works well for this.
Modular, expandable system Surge v o l t a g e t o 4.4 kV E F T / B u r s t t O 4.8 kV/1 M H z PQT t o 1 6 A / 2 6 0 VAC 8, DC Easy-to-operate 7" touchscreen color display TA (Test A s s i s t a n c e ) f o r r a p i d t e s t r e s o l u t i o n Parameters can be changed during test
Teseq Inc. New Jersey 0883/ USA 1-^1 732 417 0501 wv.w.tesequsa.com
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21
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I I II II II I I I
o o o
tt010110.htm. [18] Doug Smith, Predicting Cable Emissions from Common Mode Current, http:// emcesd.com/tt2006/tt030106.htm. [19] Douglas Smith, High Frequency Measurements and Noise in Electronic Circuits, Van Nostrand Reinhoid, 1993, pages 41-44, 159-182, 192-209. [20] Allen WoifT, Building a Ferrite Core Antenna Current Probe, Technical Correspondence, QST, August 2009, page 53. [21] Kenneth Wyatt, Troubleshooting Radiated Emissions Using Low-Cost BenchTop Methods, interference Technology (ITEM) - E M C Directory & Design Guide 2011, May 2011, page 10-21, http://www.interferencetechnoiogy.com/upioads/media/ VX'yatt-DDGU.pdf. [22] Kenneth XX'yatt, Troubleshooting Radiated Emissions - Three Case Studies,
J\l
Frequency (MHz)
Figure W. Probe output voltage (V^J graph of a commercial current probe versus two DIY toroidal probes and two different clamp-on probes. The x-axis is frequency, while the y-axis is dBuV. This shows that all these probes are very comparable in output voltage versus frequency and therefore, useful for troubleshooting purposes. Just don't try using the DIY probes to determine "pass or fail" predictions. Commercial probes are better-suited for that.
sultants.com/techtips/tips-cm.html [8] Clayton Paul, Introduction to Electromagnetic Compatibility (2nd Edition), Wiley Interscience, 2006, pages 518-532. [9] Ridao, Carrasco, Galvin and Franquelo, Implementation of low cost current probes for conducted EMI interference measure in Power Systems, EPE 1999 (Lausanne). [10] H . Ward Silver, Hands-On Radio column. Detecting RF - Part 2, QST, August 2011, page 54-55. [11] Doug Smith, Current Probes, More http://emcesd.com/pdf/iprobe98. Useful Than You Think, IEEE E M C Symposium 1998, pdf. [12] [13] Doug Smith, The Two Current Probe Doug Smith, Using Current Probes Part 1, Puzzle, http://emcesd.com/tt061999.htm. to Inject Pulses for Troubleshooting, http:// emcesd.com/tt2007/ttl20307.htm
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REFERENCES - SUPPLIERS
[23] Fischer Custom Communications (FCC), Phone: (310) 303-3300, Email: sales fischercc.com, Web: www.fischercc.com. They provide a very wide range of HF current
Tost setup. Current probe on USB cable. Connection between connector ground shell and chassis enclosure made with screwdriver blade.
Before
After
probes - their specialty. . [24] Laird Technologies, Web: http:// www.lairdtech.com/Products/EMi-Solutions/. Tliey offer a complete line of ferrite cores and chokes. [25] Pearson Electronics, Phone: (650)
Figure 11. Cables should be tested individually. Here, I have a current probe clamped around the cable under test and am monitoring the harmonics with a simple hand-held spectrum analyzer. As I ground the connector shell to the chassis with the Swiss Army screwdriver blade, the harmonics were reduced 10-15 dB! 22 INTERFERENCE TECHNOLOGY
494-6444, Email: sales@pearsonelectronics. com, XX'eb: www.pearsonelectronics.com. They have a good selection of probes.
WYATT
KENNETH Technical and WYATT, SR. EMC Engineer, Wyatt
Service.^ LLC, holds degrees in biology engineering for for and has worked as Hewlett-Packard 21 years. He also for
electronic
a senior and
Agilent
engineer
firms
ranging
power for
systems A prolific
author
Figure 12. When measuring two cables from a system and the harmonic currents are approximately the same (point I is the same as point 2), the source is at the center (the BUT) and the two cables are acting as a dipole antenna. You may notice a peak in harmonic strength at the half-have length of the two cables combined. If the harmonic currents are larger in one side or the other, then you'll want to troubleshoot just that cable.
[26] Rhode & Schwartz USA, Phone: (888) info@rohde-schwarz.com, teseq.us. They have a very limited selection. [29] Thurlby Thander instruments, Phone: +44-1480-412451, Email: sales@tti-test. com, Web: http://www.tti-test.com/contacttti.htm. They offer a low-cost handheld spectrum analyzer for under $2,000 USD. [30] Wurth Electronics Midcom, (605) www. 886-4385, midcom@we-online.com,
or presented design, RF of
EMC design
EMC troubleshooting
techniques. such
in magazines
EMC Design
837-8772, Email:
Web: www.rohde-schwartz.us. They have a very limited selection. [27] Solar Electronics, Phone: (800) 9525302, Email: sales@solar-emc.com, Web: www.solar-emc.com. They have a limited selection. [28] Teseq USA, Phone: (732) 417-0501, Email: usasales@teseq.com, Web: www.
and is a Contact
Wyatt
ken@emc-seminars.com. emc-seminars.com.
His website
is www.
we-oniine.com. I used one of their large ferrite cores for my DIY current probe.
Ess-S30n/B3on /Lien
ESS-6002/6008
INS-4020/4040/AX2 Series
NEW Lightning Surge Simulator-Compact type LSS-6S30 Emission Maasuramant System for PCS EPS-BOOO
Conforms to IEC-61000-4-5 (1.2/50; 8/20xis) ANSI/IEEE 062.45 Ring Wave (0.5AS-1 OOkHz) Max. voltage 8.6kV
Measures PCB Near field emission in X.Y.Z.S directions 3D Photo/distribution map data image
www.noiseken.com
Interferencetechnology.com
INTERFERENCE TECHNOLOGY 23