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MEASUREMENTS
A. GENERAL PRECAUTIONS 2
B. HANDLING PRECAUTIONS 2
C. BIAS CIRCUIT 3
1.) DC SUPPLY CIRCUIT 3
2.) RF BIAS CIRCUIT 4
A. GENERAL PRECAUTIONS
Absolute Maximum Ratings are the limits one should not exceed under any conditions and does
not mean actual applicable bias condition. Fujitsu recommends the following conditions for long
life and reliable operation.
3) Do not apply RF power until the FET is biased on. Turn-off RF power before removing bias.
4) Use only properly designed RF circuits and decoupling circuits to prevent bias circuit oscillations.
Bias oscillations are one of the most common modes of failure for microwave GaAs FETs.
Destruction of the FET often occurs in microseconds. Refer to the individual data sheets or
Figure III-3 , for the recommended bias circuit configuration.
B. HANDLING PRECAUTIONS
GaAs FETS are sensitive to electrostatic discharge. Fujitsu ships all GaAs FETs in electrostatic
protection packaging. User must pay careful attention to the following precautions when taking
FETs out of their packaging.
1) Personnel handling GaAs FETs should be properly grounded by a wristlet chain or equivalent.
2) When mounting the FET in a circuit, the circuit gate and drain connections should be shorted to
ground.
3) When soldering the FET leads, an iron with a grounded tip is required.
C. BIAS CIRCUIT
This application note is intended to instruct the user in proper DC biasing of GaAs FET devices. Areas to
be discussed include D.C. supply circuit and RF bias circuit.
1) DC Supply Circuit
When applying D.C. bias to a device in a common source configuration, a negative gate voltage
must be supplied first, followed by a positive drain voltage. Conversely, when removing DC bias,
the drain voltage must be removed first, followed by the gate voltage. A GaAs FET, with drain
voltage applied and floating or zero gate voltage, is likely to oscillate and may damage the device.
In the case of a bias application, a self sequencing, fault protected bias supply is recommended.
Fujitsu has developed a voltage-regulated bias supply which satisfies the requirements for safely
biasing GaAs FETs. An example of the bias supply circuit is shown in Figure III-1.
E1 E2
VIN TR1 VOUT
+12V +10V
R14 R11
+ R15 R16 R18 R13
D12 C2 R17 +
- TR2 C6
D7 D5 -
+ TR3
+ D10 C1 R12
- C7 -
D8
GND C3 GND
+ +
3 + - C5 - C4 D9
2 4
-
8 IC2 5 IC1 E3
VOUT
-5V
Figure III-1. Suggested Circuit
This regulated bias circuit is designed to provide a constant positive drain voltage (+VDS) of 10V
and an output current of 20 Amperes.
+Vout (V)
10
+Vout (V)
5
10 msec
-2
-4
-Vout (V)
-6 -Vout (V)
2) RF Bias Circuit
The injection of bias voltages into a GaAs FET RF circuit is typically accomplished via a quarter-
wave transformer line as shown in Figure III-3. It is intended to provide a DC connection to the GaAs
FET gate and drain, while perturbing the RF performance characteristics as little as possible.
R2 C2
R1
C1
}
R1 Chosen for desired
R4 R3 VGS, IDS and
C4
R4 gate impedance
C3 R2 : 50Ω Chip
C6 C3, C4: 1000pF feed thru
R3 x R4 C5, C6: about 10µF
Rg=R1 + C5
-VGS +VDS
R3 + R4
POWER POWER
METER METER
VGS VDS
POWER POWER
SENSOR SENSOR
Rg *
50 Ω term.
-VGG +VDD
DC POWER SUPPLY
SCALER
RF RF POWER NETWORK
AMP SOURCE ANALYZER
VGS VDS
50 Ω term.
DETECTOR DETECTOR
DC DC
Rg * Block Block
POWER
SENSOR ATTEN.
50 Ω term. 50 Ω term.
IGS IDS
POWER
METER POWER
SENSOR
-VGG +VDD
DC POWER SUPPLY POWER
METER
50 Ω term.
RF POWER
Ω
50 Ω
50 RF
SOURCE
term. AMP
Freq.=f SPECTRUM
3 dB ANALYZER
Hybrid
RF RF POWER
AMP SOURCE
Freq.=f+∆f VDS
ATTEN.
VGS
50 Ω term.
DC DC
Rg * Block Block
POWER
SENSOR ATTEN.
50 Ω term. 50 Ω term.
IGS IDS
POWER
METER POWER
SENSOR
-VGG +VDD
DC POWER SUPPLY POWER
METER
Be sure that the power level of signals input to the spectrum analyzer remain in the linear
range of the analyzer's internal mixer.
0 10 20 30
IM3 (F) - IM3 (D)
CONVERTER/ VECTOR
RF RF POWER TEST SET NETWORK
AMP SOURCE ANALYZER
REF TEST
LOW
PASS
FILTER 50 Ω term.
DC DC
Block Block
Rg *
POWER
SENSOR ATTEN.
50 Ω term. 50 Ω term.
IGS IDS
POWER
METER POWER
SENSOR
-VGG +VDD
PULSE
DRIVER
Pulsed Trig.
VGS Drain
CH-1 OSCILLO-
Bias SCOPE
CH-2
DC DC ATTEN.
Block Block
Rg *
50 Ω term.
50 Ω term. 50 Ω term.
POWER POWER
SENSOR IGS SENSOR
PEAK PEAK
POWER POWER
METER METER
-VGG +VDD
DC POWER SUPPLY
LOCAL
OSCILLATOR
NOISE FIGURE
AND GAIN
METER
MIXER
VGS VDS
LOW NOISE
AMPLIFIER
Rg *
50 Ω term. 50 Ω term.
IGS IDS
-VGG +VDD
DC POWER SUPPLY
D.U.T.
S3
S1 S2 VGS Detector
S4
IDS
IM
-VGS +VDS
DC POWER SUPPLY
MEASUREMENT PROCEDURE
Open and close switches S1, S2, S3, and S4 according to the timing diagram illustrated in Figure 2. The heat
interval should be much longer than the thermal response time of the device under test (10 seconds). The
measurement interval should be as short as possible (less than 50 µsec.). The constant measurement current
(IM) is a small current so selected that the measurement power dissipation may be neglected compared to the
heat power dissipation.
Note: DC bias conditions and accept/reject criteria shall be included in individual device specifications.