MAN-22060-US003 Rev C00

Jitter/Wander Option for the E1 Module Part of the MTT and xDSL Family of Products

Users Manual
SSMTT-27M1

302 Enzo Drive San Jose, CA 95138 SSMTT-27M1 Tel: 1-408-363-8000 Fax: 1-408-363-8313

Warning Using the supplied equipment in a manner not specied by Sunrise Telecom may impair the protection provided by the equipment. CAUTIONS!
Do not remove or insert the module while the test set is on. Inserting or removing a module with the power on may damage the module. Do not remove or insert the software cartridge while the test set is on. Otherwise, damage could occur to the cartridge.

End of Life Recycling and Disposal Information DO NOT dispose of Waste Electrical and Electronic Equipment (WEEE) as unsorted municipal waste. For proper disposal return the product to Sunrise Telecom. Please contact our local ofces or service centers for information on how to arrange the return and recycling of any of our products. EC Directive on Waste Electrical and Electronic Equipment (WEEE) The Waste Electrical and Electronic Equipment Directive aims to minimize the impact of the disposal of electrical and electronic equipment on the environment. It encourages and sets criteria for the collection, treatment, recycling, recovery, and disposal of waste electrical and electronic equipment.

2010 Sunrise Telecom Incorporated. All rights reserved. Disclaimer: Contents subject to change without notice and are not guaranteed for accuracy. 2 Jitter/Wander for the E1 Module

Jitter/Wander for the E1 Module 1 Menu....................................................................5

1.1 Jitter. ...................................................................................5 1.1.1 Jitter Measurement. .........................................................6 1.1.1.1 Conguration................................................................6 1.1.1.2 Output Jitter Measurement Result. ...............................8 1.1.2 Jitter Generation............................................................10 1.1.3 Jitter Tolerance..............................................................11 1.1.4 Jitter Transfer.................................................................13 1.1.5 View Test Records.........................................................15 1.2 Wander.............................................................................17 1.2.1 TIE/MTIE Measurement................................................17 1.2.1.1 TIE Measurement Setup. ...........................................17 1.2.1.2 Wander Results..........................................................18 1.2.2 View Test Records.........................................................19

2 PC Based MTIE/TDEV Analyzer. ......................21

2.1 Introduction. .....................................................................21 2.2 Analysis Procedure. ..........................................................21 2.2.1 Masks............................................................................23 2.3 Analysis Screen Feature Description...............................33

3 Applications......................................................37
3.1 Jitter Measurement. ..........................................................37 3.2 Jitter Tolerance.................................................................38 3.3 Wander/TIE/MTIE Measurement......................................40

4 Reference..........................................................41
4.1 Jitter. .................................................................................41 4.2 Wander.............................................................................43 4.2.1 Time Interval Error (TIE) ...............................................44 4.3 Express Limited Warranty. ................................................46

Index.......................................................................47

SSMTT-27M1

Jitter/Wander for the E1 Module

1 Menu
This Users Manual covers the optional Jitter/Wander feature of the E1 Module that is found in the OTHER MEASUREMENT menu: JITTER (SWMTT-27JM and SWMTT-27JG) WANDER (SWMTT-27WM) 1.1 Jitter ITU defines Jitter as Short-term variations of the significant instances of a digital signal from their ideal positions in time (where short-term implies these variations are of frequency greater than or equal to 10 Hz). Jitter is a natural and inevitable occurrence in telecommunications networks. However, excessive jitter can lead to transmission errors and deterioration in network quality. The Jitter feature quickly and accurately determines if a 2M signal has excessive jitter. From the E1 MODULE main menu, select OTHER MEASUREMENT > JITTER. A Downloading... message will be displayed as the feature loads. The test set must be in a E1 SINGLE TEST MODE to perform jitter measurements. After the feature loads, the following items are available: JITTER MEASUREMENT JITTER GENERATION JITTER TOLERANCE JITTER TRANSFER VIEW TEST RECORDS

Note: The test set will require a second memory card installed in the test sets outer slot to perform a jitter histogram. See the test sets Users Manual for more information.

SSMTT-27M1

1.1.1 Jitter Measurement After selecting JITTER MEASUREMENT from the JITTER menu, the following configuration screen is displayed: 1.1.1.1 Conguration 11:50:45 JITTER TEST SETUP FILTER : RX RATE : THRESHOLD : B1 LIMIT : REF CLOCK : TEST DURATION: +P LIMIT : -P LIMIT : 20-100K 2.048 G.823 1.5 INTERN 000:01:00 0.50 0.50 HZ Hz Mbps UIpp H:M:S UIp UIp

WIDEBND HIGHBND

START

Figure 1 Jitter Test Setup Screen Congure as required: FILTER Options: WIDEBND (F1), HIGHBND (F2) Choose the band to lter. WIDEBND: This is a wideband 20Hz100kHz filter and uses the B1 (1.5 UIpp per ITU-T) Maximum Permissible Jitter specification; B1 will appear in the THRESHOLD line. HIGHBND: This is for a highband 18kHz100kHz filter and uses the B2 (0.2 UIpp per ITU-T) Maximum Permissible Jitter specification; B2 will appear in the THRESHOLD item. Note: ITU G.823 requires both a wideband, and then a highband measurement be performed, in order to qualify the E1 link. See Section 4.1 for information on the bands. RX RATE The signal receive rate is xed at 2.048 Mbit/s. THRESHOLD Options: G.823 (F1), USER (F2) Choose the band to lter. G.823: This uses the jitter limit specified by ITU-T G.823. 6 Jitter/Wander for the E1 Module

 USER: Use this to manually determine the jitter limit. If used, select the B1/B2 line, and enter the allowable peak-to-peak value, in unit intervals. B1/B2 LIMIT Options: B1 (0 to 1.5), B2 (0 to 0.2) Set the threshold, if using a USER conguration. REF CLOCK The reference clock is fixed at INTERN. TEST DURATION Options: TIMED (F1), CONTINU (F2) Determine the measurement duration. TIMED: Measurements will run for a specified length of time. Enter the Hours, Minutes, and Seconds (H:M:S) the test will run. The default is one minute, as recommended by the ITU-T. CONTINU: The measurement will run until STOP (F4) is pressed. +P LIMIT Options: Depends on the THRESHOLD B1/B2 limit. Determine the positive phase hit limit; a positive phase hit above this entry will count in the Results screen. -P LIMIT Options: Depends on the THRESHOLD B1/B2 limit. Determine the negative phase hit limit; a negative phase hit beyond this entry will count in the Results screen. When ready, press START (F4) and a NV Histogram Data Would be Erased!!! message appears. Press ENTER to start the measurements with a Configuring... message as the test set reconfigures itself, then the result screen will appear. Note: The Jitter histogram uses the same memory location on the internal memory as the basic E1 histogram. Starting Jitter measurements will erase the E1 histogram record. Save any records you want to keep to an optional second memory card.

SSMTT-27M1

1.1.1.2 Output Jitter Measurement Result Figure 2 presents a sample Jitter Results screen. 11:50:45 ET- 000:02:30 RT- CONTINU OUTPUT JITTER RESULT FILTER : 20-100kHz LIMIT : 1.50 UI

PASS
JITTER RMS +PEAK -PEAK : : : :

CURRENT MAXIMUM 0.002 0.004 0.001 0.001 0.002 0.000 0.000 0.000

PHASE HIT: +0 PHASE HIT: -0 PRINT

STOP

Figure 2 Output Jitter Results Screen If the chassis is equipped with an extra memory card, this screen will then feature a scroll bar on the right side of the screen. It indicates that there is additional information available, in this case a Histogram screen. To access, press , to return to the rst screen press . The rst screen contains: ET: Elapsed Time since START (F4) was pressed. RT: Remaining Time left to the test, CONTIN will be displayed if continuous was selected in the previous setup screen. FILTER: Frequency band lter in use. LIMIT: Jitter limit used. Banner: The overall result is displayed: PASS (jitter maximum is lower than G.823) or FAILED (jitter maximum exceeds G.823). Below the banner, Jitter measurements are given for the CURRENT and MAXIMUM values for the following: JITTER: This is Jitter peak-to-peak in unit intervals. RMS: This is Jitter Route Mean Squared in unit intervals. PEAK +/-: Positive and negative jitter peak values. PHASE HIT +/-: Number of occasions the jitter peak-to-peak value was above/below the THRESHOLD value. The following F-keys are available: PRINT (F1): Press to send the results to the serial port. 8 Jitter/Wander for the E1 Module

STOP/START (F4): Press to stop the test, press again to start the measurement and reset all counters. Press to access the screen shown in Figure 3. Histogram analysis automatically starts when a jitter measurement is started. The histogram presents data for each measurement over time. 11:50:45 ET- 000:02:30 RT- CONTINU JITTER HISTOGRAM TYPE:PEAK-PEAK CURSOR:0.939 03/04/03 11:30:40 Cursor Threshold Measurement Zoom level Seconds, Minutes, or Hours 0.0 0 PRINT 15 TYPE 30 45 ZOOM 60 SEC STOP UI 1.0 2.0

Figure 3 Jitter Histogram Screen This screen contains the following: Threshold: Indicates the ITU jitter threshold. Cursor: Move the vertical cursor by pressing to select a particular area and get results for that area. The CURSOR line indicates the jitter value at that area with its date and time. Measurement: Value of the jitter measurement being performed. The X axis (seconds, minutes, or hours) indicates the duration/ progress of the test. The Y axis indicates the jitter value in UI (Unit Intervals). The following additional F-keys are now available: TYPE (F2): Press to choose a measurement type as indicated at TYPE. They are: PEAK-PEAK: Peak-to-Peak PEAK-BASE Peak positive BASE-PEAK: Peak negative RMS: With RMS results, the threshold line is not displayed, as jitter limit is determined by the peak-to-peak value.

ZOOM (F3): Press to change the resolution in seconds, minutes, or hours centered at the cursor. SSMTT-27M1 9

1.1.2 Jitter Generation Use the following screen to setup and generate jitter. 11:50:45 JITTER GENERATION SETUP FREQUENCY(Hz): 10 PP UI : 00.00

START Figure 4 Jitter Generation Setup Screen FREQUENCY Options: 1099999 kHz Enter the frequency of the transmitted jitter. PP UI Enter the amplitude at which peak-to-peak jitter generation will begin. See O.172 for the ITU recommendation on minimum jitter generation. Press F4 to start generating jitter. Press again to stop generating jitter.

10

Jitter/Wander for the E1 Module

1.1.3 Jitter Tolerance Jitter Tolerance (accommodation) is dened in terms of the sinusoidal jitter amplitude which causes a designated error, when applied to the input of digital equipment. Jitter tolerance is a function of amplitude and frequency of the applied jitter. Equipment must pass the lower limit of maximum jitter tolerance, which is specied in G.823. This jitter tolerance template is used to qualify the performance of digital network equipment. Select JITTER TOLERANCE from the JITTER menu to have the test set generate jitter, and then measure the looped back signal from the EUT (equipment under test). The test set will transmit jitter from point-to-point, from low frequency to high frequency, at different amplitudes, to determine where errors occur (maximum jitter tolerance). Tolerance Indicators : at least +: maximum tolerated 11:50:45 Meas JITTER TOLERANCE TEST UIpp IN PROGRESS 20 10

Y: Tx Jitter Peak-to-Peak 1.0 amplitude 0.1 X: Tx Jitter Frequency .01 TABLE .1 PRINT 1 SAVE 10 kHz 100 STOP

Figure 5 Jitter Tolerance Test, In Progress Screen The following is reported: kHz: The X axis shows the frequency of the generated jitter. UIpp: The Y axis shows the generated jitters peak-to-peak amplitude (UI). :Indicates the lowest value of the maximum tolerable jitter at each frequency point. +: Indicates the maximum jitter value tolerated at the frequency (not shown). The following F-keys are available:

SSMTT-27M1

11

TABLE/GRAPH (F1): Press to see the results in the table format shown in Figure 6, press again to return to the graph view. PRINT (F2): Press to send the results to the serial port. SAVE (F3): Press to save the results. A second memory card must be installed in the chassis to save results. See Section 1.1.5. STOP/START (F4): Press to stop the test, press again to start the measurement resetting all counters. The message will change from IN PROGRESS to COMPLETED when the test is done. Jitter Tolerance Table Results This screen features a scroll bar on the right side of the screen. It indicates that there is additional information available. To access this information, press , to return to the rst screen press . 11:50:45 Meas JITTER TOLERANCE TEST IN PROGRESS FREQ(kHz) MTJ(UI-pp) MASK(UI-pp) 0.020 >20.00(PASS) 1.50 0.036 >20.00(PASS) 1.50 0.066 >20.00(PASS) 1.50 0.120 >20.00(PASS) 1.50 0.220 >20.00(PASS) 1.50 0.400 >20.00(PASS) 1.50 0.730 >20.00(PASS) 1.50 1.300 >20.00(PASS) 1.50 2.400 >20.00(PASS) 1.50 3.400 XXXXXXXXXXXX 1.06 GRAPH PRINT SAVE STOP Figure 6 Jitter Tolerance Test-Table Screen Table view lets you see all of the specific frequencies and amplitudes at which jitter was tested. The following is reported: FREQ (kHz): Frequency tested. MTJ (UI-pp): Maximum Tolerable Jitter (Unit Interval) and PASS/ FAIL status. MASK (UI-pp): Unit Interval Peak-to-peak jitter limit as defined by the ITU standard. To pass, the jitter tolerance must exceed the mask.

12

Jitter/Wander for the E1 Module

1.1.4 Jitter Transfer This is the ratio of output jitter to input jitter amplitude versus jitter frequency for a given bit rate. Often, a portion of received jitter is transmitted at a piece of equipments output. To perform the test, the first step is to perform a calibration. You will see a CONNECT LINE 1 TX TO RX PRESS ENTER TO START CALIBRATE message to remind you to loop the unit. The test set must be calibrated before conducting jitter transfer in order to compensate for jitter, other than from the equipment under test. The message will change to COMPLETED when the calibration process is done. A Before Starting The Test Connect Equipment Under Test message will appear as a reminder. Connect the test set to a looped back EUT and press START (F4) to begin the test. The test set starts transmitting jitter at a low frequency, then increases it. Results are displayed in dB. Results allow you to calculate how much jitter was added by the EUT. The test set transmits jitter, then receives the signal back from the EUT, and compares the measurements to see the gain or loss in jitter from the EUT. 11:50:45 JITTER TRANSFER TEST dB IN PROGRESS 10 ITU Jitter Mask 0 -10 Jitter Transfer Values Green: OK Red: not OK -20 .01 TABLE .1 PRINT 1 SAVE 10 kHz 100 STOP
xxx

xxxxxxxxxxx

Figure 7 Jitter Transfer Test, In Progress Screen The following is reported: kHz: The X axis shows the frequency of the generated jitter at each sampling point. 10 -20: The Y axis shows the ratio of jitter in to jitter out in dB. Progress bar: The bar at the is a representation of the tests progress. X: These represent the jitter transfer value. indicates that the transfer value was below the ITU maximum limit (exceeds stanSSMTT-27M1 13

dards). Values below the mask pass, values above it fail. The line above the Xs represent the ITU jitter mask. The following F-keys are available: TABLE/GRAPH (F1): Press to see the results in a table format (Figure 8), press again to return to the graph view. PRINT (F2): Press to send the results to the serial port. SAVE (F3): Press to save the results. A second memory card must be installed in the chassis to save results. See Section 1.1.5. STOP/START (F4): Press to stop the test, press again to start the measurement (this will reset the test). Jitter Transfer Table Results This screen features a scroll bar on the right side of the screen. It indicates that there is additional information available. To access this information, press . To return to the rst screen press . 11:50:45 JITTER TRANSFER TEST IN PROGRESS FREQ(kHz) 0.020 0.036 0.066 0.120 0.220 0.400 0.730 1.300 2.400 3.400 GRAPH TRANSFER(dB) MASK(dB) 0.001(PASS) 0.500 -0.000(PASS) 0.500 -0.000(PASS) 0.500 -0.011(PASS) 0.500 0.012(PASS) 0.500 0.000(PASS) 0.500 -0.004(PASS) 0.500 -0.020(PASS) 0.500 -0.005(PASS) 0.500 -0.005(PASS) 0.500 PRINT SAVE STOP

Figure 8 Jitter Transfer Test-Table Screen In Table view you can easily see all of the specific frequencies and amplitudes at which jitter was tested, and the corresponding PASS or FAIL status. Jitter out (transmitted by the test set) is divided by the jitter in (from the EUT), and the results shown in dB. The following is reported: FREQ (kHz): Measured Frequency. TRANSFER (dB): Jitter in divided by jitter out value, in dB, and the PASS/FAIL status. MASK (dB): Maximum jitter transfer limit defined by the ITU. 14 Jitter/Wander for the E1 Module

1.1.5 View Test Records A total of ten records may be stored via this menu (an additional memory card is required), including the current results (record 01; stored in the test sets memory). Records are stored by pressing SAVE in any jitter results screen or by pressing STOP from any wander results screen. The test set rewrites record 01 each time a test is run. The record numbers are shown in accordance with the jitter/wander results that are in memory. For wander measurement there are two types of records in each measurement. The first wander measurement and histogram is stored in the SRAM card and is mentioned in the previous paragraph. In the second the raw data is stored in the MMC card. This data is used by the MTIE/TDEV analyzer for post analysis as discussed in Section 2.
11:50:45 VIEW TEST RECORDS REC NAME TYPE STATUS UNLOCKED 22:46:58 22:47:09 UNLOCKED 22:47:16 22:59:37

1. WAN-00 TIE CARD START 2004-11-24 STOP 2004-11-24 2. JITRES01 TRANS. CARD START 2004-11-24 STOP 2004-11-24

EDIT

PAGE-UP PAGE-DN

MORE

VIEW

LOCK

UNLOCK

MORE

CLR

CLR-ALL

MORE

Figure 9 View Test Records Screen The following F-keys are available: EDIT (F1): Relabel and save a record. See Editing a Label. PAGE-UP (F2), PAGE-DN (F3): Scroll through the records. VIEW (more, F1): Press to view the saved Results screens (these contain a PRINT F-key). Press ESC when finished. LOCK (more, F2): Press to lock the record, so it cannot be deleted. Press UNLOCK (more, F3) so it can be deleted. SSMTT-27M1 15

CLR (more, F1): Press to delete a selected unlocked record. If 10 records are already stored, a record will need to be deleted before storing a new one. CLR-ALL (more, F2): Deletes all unlocked records, except the current record. Editing a Label 1. Select a record in the VIEW TEST RECORDS screen and press EDIT (F1) and a character entry screen is displayed. 2. At this point the cursor is on the rst character of the label, and three F-keys are available: - INSERT (F1): Use to insert characters. - DELETE (F2): Use to remove characters. - TOGGLE (F3): Use to access characters. - : Use to position the cursor in the LABEL line. 3. Once finished with step 2, press TOGGLE (F3) to access the character grid and the A will be selected. 4. Use to select a desired character. Press SELECT (F4) and the character is inserted into the LABEL line at the cursor point. Repeat until the label is nished. If a mistake in the label is made, press TOGGLE (F3) and move the cursor to the incorrect character, then press either: - DELETE (F2): Use to remove characters. - INSERT (F1): Use to insert characters. Press TOGGLE (F3) to reenter the character grid and continue with your label. 5. When nished, press TOGGLE (F3), then ENTER and your record is saved with a new name in the VIEW TEST RECORDS screen.

16

Jitter/Wander for the E1 Module

1.2 Wander From the E1 module main menu, select OTHER MEASUREMENT > WANDER. You will see a Downloading... message while the feature loads. You must be in a E1 SINGLE TEST MODE to perform wander measurements. After the feature loads, the following items are available: TIE/MTIE MEASUREMENT VIEW TEST RECORDS 1.2.1 TIE/MTIE Measurement The long-term variation (less than 10 Hz) of a digital signal is called Wander. To measure select TIE MEASUREMENT and the Wander Test Setup screen is displayed as shown in Figure 10. 1.2.1.1 TIE Measurement Setup
11:50:45 WANDER TEST SETUP FILTER : RX RATE : REF CLOCK : TEST DURATION: <10 Hz 2.048 Mbps L2-RX 003:20:00 H:M:S

L2-RX

TTL-L2

START

Figure 10 Wander Test Setup Screen Configure the following: FILTER Options: None, xed at <10 Hz. RX RATE Options: None, xed at 2.048 Mbps. REF CLOCK Options: L2-RX (F1), TTL-L2 (F2) Select a reference for the measurement. L2-RX: The clock is derived from the E1 signal at the E1-RX2 port (Dual E1 module) or REFCLK port (Single E1 module). TTL-L2: The clock is derived from the G.703 2 MHz Synchronization clock or TTL signal at the E1-RX2 port (Dual E1 module) or REFCLK port (Single E1 module). SSMTT-27M1 17

TEST DURATION Options: TIMED (F1) CONTINU (F2) Select whether to perform a timed or continuous test. If TIMED is selected, press SHIFT and use the numeric keypad to enter from 1 second up to 999 hours, 59 minutes, 59 seconds (One minute is recommended by the ITU-T). If CONTINU is selected, press F4 to stop the test. When nished, press START (F4) and refer to Figure 11. 1.2.1.2 Wander Results 11:50:45 ET-000:02:36 RT- 003:17:04 WANDER RESULTS

TIE MTIE +TIE Max -TIE Max

: : : :

-0.971 11.228 0.981 -6.617

ns ns ns ns

PRINT

STOP

Figure 11 Wander Result Screen The following is reported: TIE: Time Interval Error, defined as: The difference between the measure of a time interval as provided by a clock and the measure of the same interval as provided by a reference clock (per ITU-T G.810) in nanoseconds measured in a one-second interval. MTIE: Maximum time interval error, maximum TIE during a specied observation period of time. +TIE Max: Maximum TIE peak during a measurement period. -TIE Max: Lowest TIE peak during a measurement period. The following F-keys are available: PRINT (F1): Press to send the results to the serial port. STOP/START (F4): Press to stop taking measurements, press again to restart your measurement. Pressing STOP automatically saves your test measurement in VIEW TEST RECORDS. Press 18 to view the next screen: Jitter/Wander for the E1 Module

11:50:45 ET-000:02:36 RT- 003:17:04 WANDER HISTOGRAM TYPE: TIE: 0.9/-6.9 ns DATE: 11/24/04 11:50:45 10 5 ns 0 - 5 -10 0 PRINT 15 JUMP 30 45 ZOOM 60 SEC STOP

Figure 12 Wander Histogram Screen Note: The test set will require a second memory card installed in the test sets outer card slot in the inner slot to perform a wander histogram. See the test sets Users Manual for more information. This screen presents a visual representation of the wander received. It contains the following: PRINT (F1): Press to send the results to the serial port. JUMP (F2): Moves the cursor in 15 unit intervals, press move the cursor in 1 unit intervals. to

ZOOM (F3) Change the time view of the display; seconds, minutes, or hours. STOP/START (F4): Press to stop taking measurements, press again to restart your measurement. Pressing STOP automatically saves your test measurement in VIEW TEST RECORDS. : Press to switch between the WANDER HISTOGRAM and the WANDER RESULT screens. : Press to move the cursor to the previous /next point and the TIE value will be updated accordingly at the point. ESC: Press to return to the WANDER TEST SETUP screen. 1.2.2 View Test Records See Section 1.1.5.

SSMTT-27M1

19

20

Jitter/Wander for the E1 Module

2 PC Based MTIE/TDEV Analyzer

2.1 Introduction The MTIE/TDEV Analysis option for the SSMTT-27 module extends the wander analysis capabilities of the test set to a PC environment where the MTIE/TDEV calculation can be done quickly and efciently. This clear diagnostic tool helps you determine whether the collected measurements meet ITU-T requirements. It retrieves standard TIE measurements and displays them graphically. Once they are stored on your PC, the software will calculate MTIE/ TDEV conforming to ITU-T recommendations O.171 and O.172. The pass/fail report will be based on predefined masks defined by ITU-T recommendations G.811, G.812, G.813, and G.823. 2.2 Analysis Procedure MTIE/TDEV analysis is based on TIE measurements which have already been collected and stored in the chassis MMC card under RESULTS > WANDER folder. The TIE data must be transferred to a PC. Once transferred, the MTIE TDEV Analyzer software will calculate MTIE and TDEV per ITU-T, and display them graphically; for up to 100,000 seconds. Finally, ITU-T masks for MTIE and TDEV may be displayed, to determine if the device under tests meets ITU-T requirements. Follow this procedure to perform MTIE/TDEV analysis: 1. If not done previously, install the MTIE TDEV Analyzer software on your PC. Open the MTIE_xx.xxx.exe file, and follow the on screen instructions. 2. Perform Jitter/Wander measurements with the SunSet MTT test set, according to the procedures in Section 3.3 and save the measurement results. 3. Shut down the test set and remove its MMC card. Insert it into any commercially available MMC card adaptor connected to a PC, then copy the WANDER folder on the card to the PC.
Folders
128MB

X
PROFILE RESULT BIN

MMC Card

SUNRISE TELECOM
Model

S/N

SA728

WANDER

Figure 13 WANDER Folder in the MMC Card SSMTT-27M1 21

4. Open the MTIE TDEV Analysis software by going to the Windows Start button, and select Programs > Sunrise Telecom > MTIE Analysis. After the program starts up, the MTIE TDEV Analysis window will appear. 5. Click File > Open and in the File Open dialog box navigate to the file that was copied to the PC. The following figure is a sample:

Figure 14 Sample TIE Plot Screen 6. Click MTIE/TDEV > Start MTIE/TDEV Analysis to perform both analyses on the file. It will take some time for the process to complete. When it has, you will see the results at the bottom of the window. Basic analysis is complete. 7. To perform further analysis, click Mask to display a list of specication masks, as shown in Figure 15, which may be imposed. The active mask is marked by a check mark. Click a mask to select it; the analysis will be performed. The name of the mask in use is shown in the title bar near the bottom of the plot/graph.

Figure 15 ITU-T Mask Selection 22 Jitter/Wander for the E1 Module

2.2.1 Masks For MTIE and TDEV related masks, see G.811, G.812, G.813, and G.823 for details. Here is a series of mask analysis on the same original data le.
100000 10000 MTIE Analysis Data TDEV Analysis Data MTIE Mask

Figure 16 G.823 Primary Reference Clock Mask SSMTT-27M1 23

TDEV Mask

nsec 0.1 0.1

10000

1000

100

10

G823 Network Interface Primary Reference Clock

10

100 Observation Interval in Seconds

1000

24
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000 10000

10000

1000

100

MTIE Mask

10

TDEV Mask

nsec 0.1 100000

Figure 17 G.823 Synchronization Supply Unit Mask

G823 PDH Synchronization Interface

Jitter/Wander for the E1 Module

10000

SSMTT-27M1
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000 10000

1000

MTIE Mask

100

TDEV Mask 10

Figure 18 NI Equipment Slave Clock Mask

G.823 SDH Network Interface Equipment Slave Clock

nsec 0.1 100000

25

26
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000 10000

10000

1000 MTIE Mask

100

TDEV Mask

10

Figure 19 PDH Synchronous Interface Mask

G823 PDH Synchronization Interface

nsec 0.1 100000

Jitter/Wander for the E1 Module

1000000

SSMTT-27M1
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000

100000

10000

1000

100

MTIE Mask

10

Figure 20 G.811 Primary Interface Clock

G.811 Primary Reference Clock

TDEV Mask

nsec 10000

27

28
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000

100000

10000

1000 MTIE Mask

100

TDEV Mask

10

nsec 10000

Figure 21 G.812 Synchronization Supply Unit I Mask

G.812 Synchronization Supply Unit Type I

Jitter/Wander for the E1 Module

100000

SSMTT-27M1
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000

10000

1000

MTIE Mask

TDEV Mask 100

10

nsec 10000

Figure 22 G.812 Synchronization Supply Unit II Mask

G.812 Synchronization Supply Unit Type II

29

30
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000

100000

10000

1000

MTIE Mask

TDEV Mask 100

10

nsec 10000

Figure 23 G.812 Synchronization Supply Unit III Mask

G.812 Synchronization Supply Unit Type III

Jitter/Wander for the E1 Module

1000

Figure 24 G.813 SDH Synchronization Slave Clock 1 Mask

MTIE Analysis Data 10 1 TDEV Analysis Data 1 10 Observation Interval in Seconds 100

SSMTT-27M1
G.813 SDH Synchronization Slave Clock 1 Mask

100

MTIE Mask

TDEV Mask

0.1

0.01

nsec 0.001 0.1

1000

31

32
MTIE Analysis Data 1 TDEV Analysis Data 1 10 100 Observation Interval in Seconds 1000

100

MTIE Mask

10 TDEV Mask

Figure 25 G.813 Synchronization Slave Clock 2 Mask

G.813 SDH Equipment Slave Clock Option II

Jitter/Wander for the E1 Module

nsec 0.1

10000

Menu Bar Tool Bar

2.3 Analysis Screen Feature Description

SSMTT-27M1
Plot Area Plot Key Mask In Use Status Bar

Figure 26 MTIE/TDEV Screen with Tool Bar Details

St a

Tool Bar Details Vi ew A rt Vi ll M V Bo ie ew T w th B IE a V Bo Vi ie M e Vi w V oth nd TI ew w M Vi th TD iew TD TD Vi ew M St St E a e T T T ar art nd Sto IE IE M IE EV TD EV EV w tM T T p S P Pl TI Pl Pl E Pl P ot E ot ot V ot lot erie TI DE DE An lot M M E V V y Da Da a an Da a an an s D Fi A A A A le d t t s d t s d Ab O S nal nal nal nal a O a O k O M a O k O M M ata pe av ys ys ys ys a a a ou is is is is nly nly nly sk nly nly sk sk . . . n e t

33

The features are: Menu Bar: Access the programs features, including starting and stopping analysis, applying different ITU-T masks, and saving results. File - Open: Select a le to open from the Open dialog box. - Save: Store the analysis as a .plt (plot), .txt (text) or .jpeg (graphic) le. - Save As: Save an analysis under a new name. - Download Wizard: Not applicable to this application. - Print: Print the window through a windows printer. - Exit: Close the program. View: Hide or display the Tool Bar and Status Bar. MTIE/TDEV: Perform or view MTIE and/or TDEV analysis and view the data in a table as shown in Figure 27. - Start MTIE Analysis - Start TDEV Analysis - Start MTIE/TDEV Analysis - Stop Any Analysis - View TIE Plot - View MTIE Plot View MTIE Plot Only View MTIE Mask Only View MTIE Plot and Mask - View TDEV Plot View TDEV Plot Only View TDEV Mask Only View TDEV Plot and Mask - View MTIE/TDEV Plot - View Data Grid, shown in the following figure.
Data Display
sec 1 2 3 4 5 6 7 8 9 10 20 30 40 50 60 70 80 MTIE Data (nsec) 17.04 17.83 17.83 17.83 17.83 17.88 17.88 17.88 18.47 18.47 18.47 18.47 18.98 18.98 18.98 18.98 18.98 OK MTIE Mask (nsec) 20.00 20.00 27.89 33.89 43.40 47.27 50.90 54.26 57.42 60.00 60.00 60.00 60.00 60.00 60.00 60.00 60.00 Cancel TDEV Data (nsec) 0.79 0.70 0.40 0.31 0.31 0.34 0.29 0.25 0.24 0.25 0.20 0.22 0.23 0.25 0.26 0.28 0.29 TDEV

Figure 27 View Data Series 34 Jitter/Wander for the E1 Module Mask: Impose an ITU-T standard mask by clicking on a mask

from the drop down list. A check mark will appear next to the active mask. Figure 15 shows the drop down list and Figures 16 through 25 show a sample of each mask. Help: View the About MTIE window. Plot Area: As shown in Figure 26, this presents the actual analysis. As an analysis proceeds, watch the plot update in the Plot Area and Status Bar. Key shows the plot colors associated with each analysis and mask. MTIE mask and data are displayed in red; TDEV mask and data are displayed in blue. The orange title bar shows the currently applied mask. Status Bar presents the overall analysis results, including the current activity state of the analysis, the Passed or Failed result, and how long the analysis process took. Tool Bar: Shortcuts to commonly used functions. Initially, only the analysis buttons are available (such as Start MTIE); after an analysis has been performed, the remaining buttons become available, allowing you to view the data in the desired format and for a particular analysis. Refer to Figure 26.

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36

Jitter/Wander for the E1 Module

3 Applications
3.1 Jitter Measurement Jitter can be measured in two ways by using an undefined quasirandom traffic signal, when the line is in use, or by using specific test sequences when the line is not in use.

RX EUT TX

E1-TX1 E1-RX1

Intrinsic Jitter Measurement

E1-RX1 RX EUT TX TX EUT RX

Network Jitter Measurement

Figure 28 Jitter Measurement Setup 1. Connect the equipment for intrinsic or network jitter measurements, as shown in Figure 28. 2. From the E1 module main menu, select OTHER MEASUREMENT > JITTER > JITTER MEASUREMENT and configure as required. 3. Press START (F4). Measure the ltered output jitter and record the true peak-to-peak jitter amplitude. Perform a wideband measurement, followed by a highband measurement. 4. Look at the results and the Histogram for an overview of the measurement. Press TYPE (F2) to see each result; peak-topeak, base-to-peak, peak-to-base, and RMS (a good averaging measurement). Use ZOOM (F3) to look at the values over time. Confirm that the measurement is within limits. 5. Repeat measurements for all desired settings. SSMTT-27M1 37

3.2 Jitter Tolerance Equipment must be able to tolerate a certain level of jitter, as defined by ITU-T G.823. One way to test jitter tolerance is by checking for the onset of errors. The onset of errors criterion is dened as the maximum amplitude of jitter at a specied frequency that causes more than two errored seconds during 30 second measurement intervals. To perform this test, connect the test set to the EUT and generate a pseudorandom test sequence at a specic frequency. The EUT should loop the signal and send it back to the test set, which will measure any errors that occur. The test set will increase and decrease the jitter amplitude. Look at the results to determine where maximum jitter tolerance was reached.

RX EUT TX Loop a Test Pattern E1-TX1 E1-RX1

Figure 29 Jitter Tolerance Setup 1. Connect the test set to the equipment under test (EUT). The EUT should be in a received clocking mode, and have a loopback in place to loop back the test pattern. 2. From the E1 module main menu, select OTHER MEASUREMENT > JITTER > JITTER TOLERANCE and the test will start immediately. The test set will transmit jitter at each frequency, at varying amplitudes. 3. You may watch the test in progress or look at it when it has completed. The bar at the top of the screen indicates the tests progress. See Figure 30 for an explanation of the screen. Conrm that the jitter measurement passes tolerances and or requirements.

38

Jitter/Wander for the E1 Module

Tolerance Indicators : at least +: maximum tolerated

11:50:45 Meas JITTER TOLERANCE TEST UIpp IN PROGRESS 20 10

Y: Tx Jitter Peak-to-Peak 1.0 amplitude 0.1 X: Tx Jitter Frequency .01 TABLE .1 PRINT 1 SAVE 10 kHz 100 STOP

Figure 30 Tolerance Test in Progress Screen An indicates the EUT has met (or exceeded) the ITU specication for that frequency. A + shows where the EUT hit its maximum jitter tolerance. A + above the ITU mask line indicates a pass for that frequency; a + below the mask line, indicates a fail for that frequency (not shown). Press TABLE (F1) to see the results as a table (Figure 6). - FREQ (kHz): Frequency tested. - MTJ (UI-pp): Peak-to-peak Maximum Jitter Tolerance (in Unit Intervals), and PASS/FAIL status. PASS is declared when the EUT added less than the maximum allowable jitter. - MASK (UI-pp): Peak-to-peak jitter limit (in UI) as defined by the ITU standard. The mask values are for your information. 4. Repeat measurements for all desired settings.

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3.3 Wander/TIE/MTIE Measurement 1. Connect the equipment for wander measurements, as shown in Figure 31. Note the presence of an synchronization clock, which is normally used to synchronize the network.

E1-RX1 RX EUT TX E1 TX EUT RX REF CLK

Synchronization Clock 2.048 Mbit/s or 2 MHz

Or
E1-RX1 Terminal Equip. E1 Terminal Equip. REF CLK

GPS or Cesium Reference Clock

Figure 31 Wander Measurement Setups 2. From the E1 module main menu, select OTHER MEASUREMENT > WANDER > TIE MEASUREMENT and configure as required. 3. When ready, press START (F4) and the test set will start measuring TIE, MTIE, +TIE MAX and -TIE MAX. 4. Observe the results by pressing to switch between the WANDER HISTOGRAM and the WANDER RESULT screens. Press ZOOM (F3) to look at the values over time. 5. Press STOP (F4) and the results are stored. Post-processing analysis of TIE measurements is available as a PC software option. It calculates MTIE/TDEV per ITU-T O.171/O.172, and display the results graphically with a clear pass/fail indication using your Windows based PC. Refer to Section 2 for more information. 40 Jitter/Wander for the E1 Module

4 Reference
4.1 Jitter Jitter affects both digital (generation of bit errors, uncontrolled slips) and analog signals (unwanted phase modulation of the transmitted signal). Essentially, jitter is an unwanted phase modulation of the digital signal. Jitter may cause errors or bit slips in a digital circuit, and deteriorate the performance of a transmission network (which is why you look for bit and other errors when testing jitter tolerance). Jitter is classied as systematic and random jitter: Systematic jitter is pattern-dependent. In lower-rate digital systems, systematic jitter is dominant. Random jitter is independent of the transmitted pattern. In higher-rate systems, the random jitter may become more important. Test environment parameters which affect jitter performance are test sequences, bit rate, pulse shape, cable characteristics, temperature, cross-talk, and noise. Network equipment must be able to operate in the presence of some jitter (tolerance). Output jitter measurement can be classified into two categories: Network output jitter (at hierarchical interface) Intrinsic jitter (generated by individual digital equipment) Table 1 shows the maximum allowable jitter at 2.048 Mbit/s, as defined by ITU-T G.823. Network Limit Bit Rate B1 Unit Interval Peak-to1.5 B2 Unit Interval Peak-to0.2 Measurement Filter Bandwidth Cut-off Frequency Lower f1 20 Hz Lower f3 18 kHz 700 Hz Higher f4 100 kHz

2.048 Mbit/s

Table 1 Maximum Jitter Allowed for 2.048 Mbit/s Figure 32 shows how jitter should be measured per ITU G.823.

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Hierarchical Interface or Equipment Output Port

Jitter Detector

Band pass filter cut-off & f1 & f4

Band pass filter cut-off & f3 & f4

B1 Unit Intervals

B2 Unit Intervals

Measured Jitter Amplitude

Figure 32 Measuring Jitter Note the Wideband and Highband filters. Each has a lower frequency cutoff value (f1 or f3 ) and a higher frequency cutoff value (f4 ). The B1 and B2 peak-to-peak unit intervals correspond to the measurements. Refer to G.823 for details on jitter tolerances.

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Jitter/Wander for the E1 Module

4.2 Wander Phase deviations with a frequency content of less than 10 Hz are referred to as wander. If a signal with a lot of wander is examined using an oscilloscope, you will perceive a sharp clock signal, which gradually moves back and forth, compared to the Exact Clock as in Figure 33.
Exact Clock Clock with Wander

Figure 33 Clock Wander ITU-T O.172 also specifies some requirements for wander measuring equipment. O.172 says that TIE can be interpreted as the time difference between the signal being measured and the reference clock. It is typically measured in nanoseconds and set to zero at the start of the measurement period. Therefore, TIE gives the timing change since the measurement began. The reference clock can be 2.048 MHz or a 2.048 Mbit/s. The test set currently measures real time TIE. It requires a reference clock connected to the REF CLK port (2.048 MHz) or a 2.048 Mbit/s signal connected to the receiver of the second line (L2-RX). The test set wont run the measurements without external clock, as opposed to jitter measurements which can be performed using the internal clock as reference. Other wander measurements such as MTIE (Maximum Time Interval Error) and TDEV (Time Deviations) are used to compare the status of the network clock sources against standard ITU-T masks and determine whether the signal passes or fails the limits established by ITU. ITU-T recommends performing real-time TIE measurements for at least 100,000 seconds to collect sufcient information about the presence of wander in the network. MTIE/TDEV calculation is based on this data, and is normally done offline with additional software that processes the information according to ITU.

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4.2.1 Time Interval Error (TIE) TIE is defined by ITU-T G.810 as the time difference between the measure if a time interval as provided by a clock (as recovered from a data signal) and the measure of that same time as provided by a reference clock. This reference clock can be a 2.048 MHz or a 2.048 Mbit/s signal. TIE is normally measured in ns. Maximum Time Interval Error (MTIE) MTIE is defined by ITU-T G.810 as the maximum peak-to-peak delay variation of a given timing signal within an observation time, for all observation times of that length within the measurement period (T). This is a useful tool for identifying phase transients in the synchronization network. MTIE is an offline measurement that is normally performed by offline software packages and high-speed processors, to calculate the value for all the time observation intervals (from 1 second up to 100,000 seconds). The following procedure is used to calculate MTIE: 1. Examine all of the one-second intervals. 2. Find the maximum time deviation within those intervals and display it in a table as the one second MTIE value. 3. Examine all of the two-second intervals. 4. Find the maximum time deviation within those intervals and display it in a table as the two second MTIE value. 5. Repeat for all other intervals (3, 4, 5 to 9). 6. From 10 to 100, the procedure is the same. The only difference is that the intervals calculation will be made in steps of 10 seconds. Start with all 10 seconds intervals, and the maximum value will be assigned to the 10-second value in the table. The next intervals to be evaluated will be 20 seconds, 30 seconds, and so forth. 7. Once it reaches 100 seconds, the intervals will be evaluated in steps of 100 up to 1,000, in steps of 1,000 up to 10,000 seconds, and in steps of 10,000 seconds up to 100,000 seconds (as recommended by ITU-T O.172). MTIE analysis must meet ITU-T requirements by comparing the analyzed data against predened masks according to recommendations ITU-T G.811, G.812, G.813, G.823, and G.825.

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Jitter/Wander for the E1 Module

SSMTT-27M1
MTIE Analysis Data 1 TDEV Analysis Data 0.1 1 10 100 Observation Interval in Seconds 1000 10000

10000

1000 MTIE Mask

100

TDEV Mask

10

nsec 0.1 100000

Figure 34 MTIE/TDEV Plots by MTIE/TDEV Analyzer

G.823 PDH Synchronization Interface

45

The following procedure is used to calculate off-line TDEV: 1. Examine all of the one second intervals. 2. Find the standard deviation within those intervals and display it in a table as the one second TDEV value. 3. Examine all of the two-second intervals. 4. Find the standard deviation within those intervals and display it in a table as the two second TDEV value. 5. Repeat for other intervals (3, 4, 5 to 9). 6. From 10 to 100, the procedure is the same. The only difference is that the intervals calculation will be made in steps of 10 seconds. Start with all 10 seconds intervals, and the maximum value will be assigned to the 10-second value in the table. The next interval to be evaluated will be 20 seconds, 30 seconds, and so forth. 7. Once it reaches 100 seconds, the intervals will be evaluated in steps of 100 up to 1,000, in steps of 1,000 up to 10,000 seconds, and in steps of 10,000 seconds up to 100,000 seconds (as recommended by ITU-T O.172). MTIE measurement ranges also apply to TDEV analysis, and the TDEV is defined by ITU-T G.811, G.812, G.813, G.823, and G.825. See Figure 34 for a MTIE and TDEV plot example. 4.3 Express Limited Warranty This Sunrise Telecom product is warranted against defects in materials and workmanship during its warranty period. The warranty period for this product is contained in the warranty page on http://www.sunrisetelecom.com. Sunrise Telecom agrees to repair or replace any assembly or compo nent found to be defective under normal use during this period. The obligation under this warranty is limited solely to repairing or replacing the product that proves to be defective within the scope of the warranty when returned to the factory. This warranty does not apply under certain conditions, as set forth on the warranty page on http://www.sunrisetelecom.com. Please refer to the website for specific details. THIS IS A LIMITED WARRANTY AND THE ONLY WARRANTY MADE BY SUNRISE TELECOM. SUNRISE TELECOM MAKES NO OTHER WARRANTY, REPR SENTATION OR CONDITION, EXPRESS OR IMPLIED, AND EXPRESSLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT OF THIRD PARTY RIGHTS. 46 Jitter/Wander for the E1 Module

Index
A Applications Jitter Measurement; 37 Jitter Tolerance; 38 Wander/TIE/MTIE Measurement; 40 C Cautions; 2 F Figures 01 Jitter Test Setup Screen; 6 02 Output Jitter Results Screen; 8 03 Jitter Histogram Screen; 9 04 Jitter Generation Setup Screen; 10 05 Jitter Tolerance Test, In Progress Screen; 11 06 Jitter Tolerance Test-Table Screen; 12 07 Jitter Transfer Test, In Progress Screen; 13 08 Jitter Transfer Test-Table Screen; 14 09 View Test Records Screen; 15 10 Wander Test Setup Screen; 17 11 Wander Result Screen; 18 12 Wander Histogram Screen; 19 13 WANDER Folder in the MMC Card; 21 14 Sample TIE Plot Screen; 22 15 ITU-T Mask Selection; 22 16 G.823 Primary Reference Clock Mask; 23 17 G.823 Synchronization Supply Unit Mask; 24 18 NI Equipment Slave Clock Mask; 25 19 PDH Synchronous Interface Mask; 26 20 G.811 Primary Interface Clock; 27 21 G.812 Synchronization Supply Unit I Mask; 28 22 G.812 Synchronization Supply Unit II Mask; 29 23 G.812 Synchronization Supply Unit III Mask; 30 24 G.813 SDH Synchronization Slave Clock 1 Mask; 31 25 G.813 Synchronization Slave Clock 2 Mask; 32 26 MTIE/TDEV Screen with Tool Bar Details; 33 27 View Data Series; 34 28 Jitter Measurement; 37 29 Jitter Tolerance Testing; 38 30 Tolerance Test in Progress Screen; 39 31 Wander Measurement Setups; 40 32 Measuring Jitter; 42 33 Clock Wander; 43 34 MTIE/TDEV Plots by MTIE/TDEV Analyzer; 45 SSMTT-27M1 47

J Jitter; 41 Jitter Generation; 10 Jitter Generation Setup Screen FREQUENCY; 10 PP UI; 10 Jitter Results Screen Banner; 8 ET; 8 FILTER; 8 JITTER; 8 LIMIT; 8 PEAK +/-; 8 PHASE HIT +/-; 8 RMS; 8 RT; 8 Jitter Test Setup Screen +P LIMIT; 7 -P LIMIT; 7 B1/B2 LIMIT; 7 FILTER HIGHBND; 6 WIDEBND; 6 REF CLOCK; 7 RX RATE; 6 TEST DURATION; 7 THRESHOLD G.823; 6 USER; 7 Jitter Tolerance; 11 Jitter Tolerance Test-Table Screen FREQ (kHz); 12 MASK (UI-pp); 12 MTJ (UI-pp); 12 Jitter Transfer; 13 Jitter Transfer Test-Table Screen FREQ (kHz); 14 MASK (dB); 14 TRANSFER (dB); 14 Jitter Transfer Test Screen 10 -20; 13 kHz; 13 X; 13

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P PC MTIE/TDEV Analyzer Analysis Procedure; 21 Masks; 23 Screen Feature Description; 33 R Results Histogram screen; 9 T Tables 01 Maximum Jitter Allowed for 2.048 Mbit/s; 41 V View Test Records Screen; 15 Editing a Label; 16 W Wander; 43 Wander Result Screen +TIE Max; 18 -TIE Max; 18 MTIE; 18 TIE; 18 Wander Test Setup Screen FILTER; 17 REF CLOCK L2-RX & TTL-L2; 17 RX RATE; 17 TEST DURATION; 18 Warnings; 2

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