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n s"stem
C. %en!, &. 'r!nco, A. (iusto.
Instituto )e Ingenier*! El+ctric! '!cult!) )e Ingenier*! $ni ersi)!) )e l! &ep,blic! - $rugu!"
(r!nt .DT /0102 3inisterio )e E)uc!ci4n " Cultur! - $rugu!"
.l!n
5 Intro)uction 5 .ower s"stem st!bilit" !n) )ist!nce protection 5 .ower swing )etection met#o)s 5 %imul!tions 5 Tests 5 &esults !n) conclusions
Intro)uction
E ents t#!t c!use signific!nt tr!nsient response7
5 5 5 5 5 loss or !pplic!tion of l!rge blocks of lo!), line switc#ing, gener!tor )isconnection, f!ults, etc.
Impe)!nce seen b" ! )ist!nce rel!" loc!te) !t t#e bus C7 8in c!se | EA | 9 | E: |)
ZC =
(ZA +
ZB + ZL ) 1 j cot 2 2
2008 IEEE T&D LA Conference 2
5 Time s#orter
- s#ort circuit tripping of t#e rel!" is !llowe)
5 E !lu!tion of tr!=ector"7
- spee) - monoton" - @ones of ste!)" st!te inst!bilit"
200; )!t!
Incorpor!tion of new consumer wit# gener!tion c!p!cit" 5 T#erm!l units for D/03C 8D0I of m!B. lo!)G 5 in=ecting t#e surplus to t#e $rugu!"!n power s"stem
D0
DD
%election of t#e set of p!irs >contingenc" J protection line rel!"s of interest? to be simul!te) furt#er in AT.
2008 IEEE T&D LA Conference D2
IX
D/
D2
5 t#ree p#!se s#ort-circuit in 3E&-LM$ D20 kE line 8ne!r 3E&G 5 o er critic!l time 5 wit#out !utom!tic reclosing
2008 IEEE T&D LA Conference D;
':E%KA rel!" .icks-up7 5 t#e re erse time-)el!"e) @one !n) 5 t#e non-)irection!l time-)el!"e) @one 5 onl" !t t#e en) of s#ort-circuit
Currents
I/A
10
t/s
-20
iL1
iL2
iL3
iE
Voltages
U/V
50
t/s
-50
&el!"s fl!gs7
uL2
uL3
-0.10
0.00
0.10
0.20
0.30
0.40
0.50
D8
t/s
Conclusions
%imul!tions !n) tests un)er )ifferent s"stem con)itions #! e s#own7 5 line )ist!nce protections loc!te) ne!r t#e new consumer oper!te properl" un)er power swing con)itions, blocking t#e rel!"s ! oi)ing t#em to oper!te !n) le!) to m!=or out!ges.
2008 IEEE T&D LA Conference DA
20