ELECTRICAL DIAGNOSTICS FOR PULSED POWER

Rishi Verma, R. S. Rawat, P. Lee, S. V. Springham, T. L. Tan

NSSE, NIE, Nanyang Technological University
1 Nanyang Walk, 637616, Singapore

M. Krishnan
Alameda Applied Sciences Corporation, San Leandro, CA 94577, USA
 Abstract

Pulsed power systems are integral part of any pulsed plasma radiation device
and hence the associated electrical diagnostics plays vital role in investigating the
overall device performance and its characteristics. The typical diagnostic
parameters of interest in any pulsed power system are linked with the measurement
of high frequency, high voltages and currents. There is wide range of available
diagnostics being used by practicing researchers for the measurement of mentioned
parameters but even though they operate on simple laws of electromagnetics and
the conceptual understanding is clear; the bandwidth response of such diagnostics
is often limited by various parasitic effects that impairs the factual measurement of
parameters. The scope of the paper is to introduce various invasive and non-
invasive electrical diagnostics used in pulsed power systems and highlight the
concealed causes that affect their behavioral response.
 Purpose

This talk is meant to provide an overview of standard electrical

diagnostic techniques used in pulsed power systems driving pulsed
plasma devices. …….. Impulse Measurements!

The main focus will be on pulsed electric and magnetic field (Voltage
& Current) measurement techniques having bandwidth response in ns
to ms regimes.

Parasitic effects that impairs the factual measurement of parameters

will be discussed.

Overview of design methodology.

Noise and Shielding.

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Categorization
Pulsed Power Electrical Diagnostic Tools

Current measuring devices Voltage measuring devices

Non-intrusive Intrusive Intrusive Non-intrusive

Rogowski Coils
Current Transformers
Current Shunt
Simple resistive dividers
Compensated dividers
Capacitive Voltage dividers
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 Rogowski Coils
“most effective, economic and extensively
r r used diagnostic”
i = ∫ H .d l Amperes Law
It is an air-cored toroidal coil
that surrounds the conductor
carrying the current to be
measured.

Faraday’s Law

dφ
Vcoil = n×
dt

# Gennadiy Frolov et al., Microbridge Technologies; EE Times-India, December 2007

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Sensitivity of Rogowski Coil

The current to be measured is related to the induced

voltage by a proportionality constant i.e. the mutual
inductance of the coil.

di
Vcoil = − M 21 × M = µ 0 nA
dt
M = Coil Sensitivity (Vs/A)
(depends on the coil winding design)
di/dt = rate of change of current (A/s)
n & A = design and geometry parameters
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 Sensitivities for different cross-sections

Rectangular
Cross-section

Circular
Cross-section

Oval
Cross-section

# Jan Hlavacek et al., 16th IMEKO TC4 Symposium, Exploring New Frontiers of Instrumentation and
Methods for Electrical and Electronic Measurements, Sept. 22-24, 2008, Florence, Italy

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Time response consideration
Differentiating / Integrating !
- depends on circuit parameters

dφ dI c I c
=L +
dt dt R
1 dφ L dI c
= + Ic
R dt R dt

Differentiating Self-Integrating

L dI c dφ L dI c
<< I c R >> ωL Ic α >> I c ωL >> R Ic α φ
R dt dt R dt

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Realistic lumped circuit model

I(t)

- solution is complex !
# M. Argueso et al., www.aedie.org/9CHLIE-paper-send/252-argueso.pdf

High frequency response (bandwidth) is determined by :

 Coil inductance (Lc)  Stray capacitance of winding (Cc)
 Coil resistance (Rc)  Termination impedance (Z)
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 High bandwidth issues

1. The rise time (tr) of the 2. Role of termination

measuring pulse is impedance (Z) is very
limited by the wave important.
transit time (T) in the R >> ωL ωL >> R
coil winding.
tr >T always

20 ns/div
5 ns/div

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 High bandwidth issues

3. Highest frequency 4. Non-uniform excitation

measurement limited by due to dislocation of
resonant frequency (LC) current centroid may lead
of the coil. to strong oscillations in
“distributed capacitance the sensor signal
due large no. of turns”

# http://www.pemuk.com

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 High bandwidth issues

5. High voltage 6. Shielding - is placing the

consideration Rogowski coil inside the
slotted metallic housing.

# http://www.pearsonelectronics.com

“Some times coupling capacitance b/w the winding

and shielding may affect the signal response”
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 Design methodology for differentiating Rogowski

Step 1: Estimate the di/dt in the circuit.

di 2π C
= × I pk T = 2π LC I pk = Vch
dt T L

Step 2: Fix the max. limit for the induced voltage (Vcoil).
Step 3: Use the basic equation:
µ 0 di
Vcoil = NA × ×
2πR dt
A = a×b
Step 4: Choose optimum values for –
a,b, R and N. # John Anderson, RSI 42,7,1971

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Current Monitors

# Chris Waters, PCIM Article 86;

# http://www.pearsonelectronics.com http://www.pearsonelectronics.com

- are similar to self integrating Rogowski Coils in

response but utilize high permeability magnetic
core for coil winding.
- the presence of high permeability core is important
for the extension of flat response to low frequency.
- Usage: CT’s – Universal / Rogowski Coil - Customized.
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 Major limitation with CT’s
“Core Saturation i.e. I × T ”
dφ
Vcoil = n×
dt ∫ V (t )dt = n ∆φ
∆φ - is the change in flux in the core

Since the max. flux is limited by core saturation there is

a corresponding limit on : I × T
n 2 B max A
In terms of design parameters : ∫ I (t ) dt ≤
R
“Core may also get saturated by the DC component of the
current being measured, Biasing overcomes this problem”
# Chris Waters, PCIM Article 86; http://www.pearsonelectronics.com

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Important time domain parameters

(I × T )max - current – time product rating must not exceed

I max - highest measurable current (related with (I × T )max )

t r (10 − 90%) - Useable rise time (<10% overshoot)

Sensitivity(Volt/Ampere) - typical range 0.001 - 0.01V/A

Droop – it’s the distortion in
the pulse shape of longer
duration current pulses
(ms to 100’s of ms)
# http://www.pemuk.com

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Current Shunts/ CVR’s

“Use of shunt is based on measurement of the

voltage drop across the resistance of known value”

ECVR = RCVR ∫ I max

2
dt
# Mark E. Savage, Pulsed Power Electrical Diagnostics, IEEE
Pulsed Power-Plasma Science Mini-course, June 23 2007 “Ideally – Ohmic (Non-Inductive)”
Current shunts/ CVR’s have: # Hansjoachim Bluhm, Pulsed Power Systems; ISBN-
10 3-540-26137-0, ISBN-13 978-3-540-26137-7
Springer Verlag Berlin Heidelberg 2006
High peak power
High frequency response
Large pulse energy handling capacity
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 CVR’s from T & M Research, USA
Hi-Wattage (225W - R Series) CVR’s

Sub-milliohms Up to sub-nanosecond

Up to 100’s of MHz Up to 10’s of kJ’s

# http://www.tandmresearch.com

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 High voltage impulse measurements
1. Simple resistive dividers
C o p pe r casin g
(grou n de d to ch a m be r fram e )
GND
 R2 
Vin Vout = Vin  
(HV)  R1 + R2 
In su lato r BNC
51 Ω C o n n e cto r
R esisto r ch ain (1 0×5 10 Ω )
To p o sitive flan ge (R2)
(R1)
LV Arm
HV Arm
Limitation:
“Measurement of fast signals with
large division ratio”
# E. Kuffel et al., High Voltage Engineering Fundamentals, ISBN 0 7506 3634 3

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 High voltage impulse measurements
2. RC compensated dividers
Shunt capacitance and inductance of Resistor

L = 30nH , C = 534 fF
For R = 1 kΩ
RC ≈ 500ps
L/R ≈ 30ps
Equivalent circuit of Resistor

It is necessary to balance the time

constants of both the arms

R1C1 = R2C 2
# Mark E. Savage, Pulsed Power Electrical Diagnostics, IEEE
Pulsed Power-Plasma Science Mini-course, June 23 2007

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 High voltage impulse measurements
3. Capacitive voltage dividers

Equivalent circuit
 V   C + C2   R1 + R2 
Attn. Ratio  2  =  1   
V
 1  C1  R2 

dV1
=
V1 (C +C ) dV2
+ 1 2
# Hansjoachim Bluhm, Pulsed Power Systems; ISBN-10 3-540-26137-0, dt (R1 + R2 )C1 C1 dt
ISBN-13 978-3-540-26137-7 Springer Verlag Berlin Heidelberg 2006

Differentiating Integrating
(R1 + R2 ) (C1 + C2 ) << tr (R1 + R2 ) (C1 + C2 ) >> tr
dV1  C1 
V2 = (R1 + R2 )C1 V2 =   V 2
dt  C1 + C2 
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
 Safe practices for maintaining wave shape fidelity

When long length cables are used it is advisable to use 50Ω

termination at scope end. Noise travels faster in air than cables.
The instrument grounds must be isolated from the equipment
ground for avoiding ground loop noise.
Using differential probes giving (Ch1 – Ch2):
– Ch1: +Vreal+Vparasite
– Ch2: -Vreal+Vparasite
Noise reduction by ferrite cores. Enhances Shield Inductance.
Spurious ringing is produced
due to high frequency currents
flowing out side the cable shield
# http://www.pearsonelectronics.com

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Conclusion

Awareness of data quality is an important issue and it can only be

improved by proper understanding of response of the diagnostic tools
and the factors limiting their bandwidths.

Noise problems are often challenging and shield currents are the main
cause. Good cabling and grounding practices solve most noise
problems (e.g. use of double shield cables)

High bandwidth response of data acquisition system i.e. oscilloscopes/

fast digitizers is equally important for good data quality for e.g. –
tr – rise time 0 .4
BWsignal = BWscope = n × BWsignal
BW - bandwidth tr
(# http://www2.tek.com/cmsreplive/pirep/3802/55W_18024_2_2009.04.07.10.03.56_3802_EN.pdf)
(# http://cp.literature.agilent.com/litweb/pdf/5989-5733EN.pdf)

For n = 3, 5GHz/80ps 1.66GHz/240ps 1/50ps ~20GS/s

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009

 Thanks

International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009