Escolar Documentos
Profissional Documentos
Cultura Documentos
Techniques
DEFCON 12
Friday, July 30
38 (Photos from ADSR Ltd. and FIB International) © 2004 Grand Idea Studio, Inc.
Chip Decapping and Die Analysis:
Voltage Contrast Microscopy
z Detect variances of voltages and display them as
contrast images
– Performed with a SEM
z Ex.: Could extract information from a Flash ROM
storage cell