Você está na página 1de 14

PRODUCT RELIABILITY, MAINTAINABILITY, AND SUPPORTABILITY

HANDBOOK
SECOND EDITION

2009 by Taylor & Francis Group, LLC

PRODUCT RELIABILITY, MAINTAINABILITY, AND SUPPORTABILITY

HANDBOOK
SECOND EDITION

MICHAEL PECHT

Edited by

Boca Raton London New York

CRC Press is an imprint of the Taylor & Francis Group, an informa business

2009 by Taylor & Francis Group, LLC

CRC Press Taylor & Francis Group 6000 Broken Sound Parkway NW, Suite 300 Boca Raton, FL 33487-2742 2009 by Taylor & Francis Group, LLC CRC Press is an imprint of Taylor & Francis Group, an Informa business No claim to original U.S. Government works Printed in the United States of America on acid-free paper 10 9 8 7 6 5 4 3 2 1 International Standard Book Number-13: 978-0-8493-9879-7 (Hardcover) This book contains information obtained from authentic and highly regarded sources. Reasonable efforts have been made to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all materials or the consequences of their use. The authors and publishers have attempted to trace the copyright holders of all material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not been obtained. If any copyright material has not been acknowledged please write and let us know so we may rectify in any future reprint. Except as permitted under U.S. Copyright Law, no part of this book may be reprinted, reproduced, transmitted, or utilized in any form by any electronic, mechanical, or other means, now known or hereafter invented, including photocopying, microfilming, and recording, or in any information storage or retrieval system, without written permission from the publishers. For permission to photocopy or use material electronically from this work, please access www.copyright.com (http:// www.copyright.com/) or contact the Copyright Clearance Center, Inc. (CCC), 222 Rosewood Drive, Danvers, MA 01923, 978-750-8400. CCC is a not-for-profit organization that provides licenses and registration for a variety of users. For organizations that have been granted a photocopy license by the CCC, a separate system of payment has been arranged. Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used only for identification and explanation without intent to infringe. Library of Congress Cataloging-in-Publication Data Product reliability, maintainability, and supportability handbook / editors, Michael Pecht. -- 2nd ed. p. cm. Includes bibliographical references and index. ISBN 978-0-8493-9879-7 (alk. paper) 1. Electronic apparatus and appliances--Reliability--Handbooks, manuals, etc. 2. Electronic apparatus and appliances--Maintainability--Handbooks, manuals, etc. I. Pecht, Michael. II. Title. TK7870.P748 2009 658.575--dc22 Visit the Taylor & Francis Web site at http://www.taylorandfrancis.com and the CRC Press Web site at http://www.crcpress.com 2008044162

2009 by Taylor & Francis Group, LLC

Contents
Preface......................................................................................................................vii Editor.........................................................................................................................xi Contributors............................................................................................................ xiii Chapter 1 Product Effectiveness and Worth. ...............................................................................1 Harold S. Balaban, Ned Criscimagna, Michael Pecht Chapter 2 Reliability Concepts. ................................................................................................. 19 Diganta Das, Michael Pecht Chapter 3 Statistical Inference Concepts. .................................................................................. 31 Jun Ming Hu, Mark Kaminskiy, Igor A. Ushakov Chapter 4 Practical Probability Distributions for Product Reliability Analysis....................... 57 Diganta Das, Michael Pecht Chapter 5 Confidence Intervals................................................................................................. 83 Diganta Das, Michael Pecht Chapter 6 Hardware Reliability. ................................................................................................ 95 Abhijit Dasgupta, Jun Ming Hu Chapter 7 Software Reliability................................................................................................ 141 Richard Kowalski, Carol Smidts Chapter 8 ............................................... 185 Failure Modes, Mechanisms, and Effects Analysis. Sony Mathew, Michael Pecht Chapter 9 Design for Reliability.............................................................................................. 201 Diganta Das, Michael Pecht Chapter 10 System Reliability Modeling.................................................................................. 219 Michael Pecht
V
2009 by Taylor & Francis Group, LLC

VI

CONTENTS

Chapter 11 Reliability Analysis of Redundant and Fault-Tolerant Products............................. 239 Joanne Bechta Dugan Chapter 12 Reliability Models and Data Analysis for Repairable Products............................. 299 Harold S. Balaban Chapter 13 Continuous Reliability Improvement...................................................................... 325 Walter Tomczykowski Chapter 14 Logistics Support.................................................................................................... 357 Robert M. Hecht Chapter 15 Product Effectiveness and Cost Analysis............................................................... 391 Harold S. Balaban, David Weiss Chapter 16 Process Capability and Process Control................................................................. 421 Diganta Das, Michael Pecht

2009 by Taylor & Francis Group, LLC

Preface
To ensure product reliability, an organization must follow certain practices during the product development process. These practices impact reliability through the selection of parts (materials), product design, manufacturing, assembly, shipping and handling, operation, maintenance, and repair. The following practices are described in this book:
Define realistic product reliability requirements determined by factors including the targeted life-cycle application conditions and performance expectations. The product requirements should consider the customers needs and the manufacturers capability to meet those needs. Define the product life-cycle conditions by assessing relevant manufacturing, assembly, storage, handling, shipping, operating, and maintenance conditions. Ensure that supply-chain participants have the capability to produce the parts (materials) and services necessary to meet the final reliability objectives. Select the parts (materials) that have sufficient quality and are capable of delivering the expected performance and reliability in the application. Identify the potential failure modes, failure sites, and failure mechanisms by which the product can be expected to fail. Design the process to capability (i.e., the quality level that can be controlled in manufacturing and assembly), considering the potential failure modes, failure sites, and failure mechanisms obtained from the physics of failure, analysis, and the lifecycle profile. Qualify the product to verify the reliability of the product in expected life-cycle conditions. Qualification encompasses all activities that ensure that the nominal design and manufacturing specifications will meet or exceed the reliability goals. Ascertain whether manufacturing and assembly processes are capable of producing the product within the statistical process window required by the design. Variability in material properties and manufacturing processes will impact the products reliability. Therefore, characteristics of the process must be identified, measured, and monitored. Manage the life-cycle usage of the product using closed-loop, root-cause monitoring procedures.

Chapter 1: Product Effectiveness and Worth. This chapter presents a definition of product effectiveness and discusses the relationships between product effectiveness and its related functions (availability, dependability, and capability). The chapter concludes with a discussion of assignment responsibility and product worth. Chapter 2: Reliability Concepts. This chapter presents the fundamental mathematical theory for reliability. The focus is on reliability and unreliability functions, probability density function, hazard rate, conditional reliability function, and key time-to-failure metrics. Chapter 3: Statistical Inference Concepts. This chapter introduces statistical inference concepts as ways to analyze probabilistic models from observational data. The chapter discusses basic types of statistical estimation, hypothesis testing, and reliability regression model fitting.
VII
2009 by Taylor & Francis Group, LLC

VIII

PREFACE

Chapter 4: Practical Probability Distributions for Product Reliability Analysis. In this chapter, basic types of discrete and continuous probability distributions are introduced. Two discrete distributions (binomial and Poisson) and four continuous distributions (Weibull, exponential, normal, and lognormal) commonly used in reliability modeling and hazard rate assessments are presented. Chapter 5: Confidence Intervals. This chapter presents the concept of confidence interval and its relationship with tolerance, sample size, and confidence levels. Examples of confidence interval calculations and estimations are provided. Chapter 6: Hardware Reliability. Using failure models and examples, this chapter focuses on reliability assessment and its associated validation techniques for engineering hardware. The chapter provides a case study on wirebond assembly in microelectronic packages to illustrate the implementation of a probabilistic physicsof-failure approach in reliability prediction and modeling. Chapter 7: Software Reliability. This chapter provides a definition of software, software reliability, software quality, and software safety. It also discusses software development models and techniques for both improving and assessing software reliability. Chapter 8: Failure Modes, Mechanisms, and Effects Analysis. Knowledge of failure mechanisms that cause product failure is essential in implementation of appropriate design practices for design and development of reliable products. This chapter presents a new methodology called failure modes, mechanisms, and effects analysis (FMMEA) to identify potential failure mechanisms and models for potential failure modes and to prioritize failure mechanisms. FMMEA enhances the value of failure modes and effects analysis (FMEA) and failure modes, effects, and criticality analysis (FMECA) by identifying high-priority failure mechanisms to help create an action plan to mitigate their effects. The knowledge about the cause and consequences of mechanisms found through FMMEA helps in efficient and costeffective product development. Chapter 9: Design for Reliability. There are steps that must be taken to develop a product that meets reliability objectives. This chapter provides an overview of product requirements and constraints, product life-cycle conditions, parts selection and management, failure modes, mechanisms, effects analysis, design techniques, qualification, manufacture and assembly, and closed-loop monitoring. Chapter 10: System Reliability Modeling. This chapter describes how to combine reliability information from parts and subsystems to compute system level reliability. Reliability block diagrams are used as a means to represent the logical system architecture and develop system reliability models for a system. This chapter also presents fault-tree analysis for system reliability modeling. Chapter 11: Reliability Analysis of Redundant and Fault-Tolerant Products. A fault-tolerant product is designed to continue operating correctly despite the failure of some constituent components. This chapter presents methods for evaluating reliability in several types of fault-tolerant conditions. Chapter 12: Reliability Models and Data Analysis for Repairable Products. This chapter describes methods for modeling and analyzing failures of repairable products (particularly nonelectronic equipment) that normally exhibit wearout characteristics.

2009 by Taylor & Francis Group, LLC

PREFACE

IX

Analytical background and data analysis techniques that describe the reliability behavior of repairable products are provided. Chapter 13: Continuous Reliability Improvement. Reliability improvement techniques can be applied to a new product that has passed its major hardware and/ or software design reviews, to a developed product that the manufacturer wishes to make more competitive, or to an existing product that is not meeting the customers expectations of reliability performance. This chapter discusses the principles of reliability growth, accelerated testing, and management of a continuous improvement program. Chapter 14: Logistics Support. Integrated logistics support (ILS) applied to products constitutes a life-cycle approach to maintenance and support. This chapter discusses the influence of reliability on logistics support requirements, emphasizing how the reliability of product, equipment, or assembly influences the need for spare or repair parts, support equipment, and maintenance personnel. Chapter 15: Product Effectiveness and Cost Analysis. This chapter shows how reliability and maintainability data can be combined with performance data to assess overall product effectiveness and how cost aspects can be introduced to provide a more complete basis for design decisions. Chapter 16: Process Capability and Process Control. Quality is a measure of a products ability to meet the workmanship criteria of the manufacturer. This chapter introduces the concepts of process capability and the basics of statistical process control techniques. Chapter sections present the concepts of average outgoing quality, process capability, defects calculation, and statistical process control, with examples. THE AUDIENCE FOR THIS BOOK This book is for professionals interested in gaining knowledge of the practical aspects of reliability. It is equally helpful for students interested in pursuing this challenging career in liability, as well as maintainability and supportability teams.

2009 by Taylor & Francis Group, LLC

Editor
Michael Pecht is visiting professor in Electrical Engineering at City University of Hong Kong. He has an MS in Electrical Engineering and an MS and PhD in Engineering Mechanics from the University of Wisconsin at Madison. He is a professional engineer, an IEEE Fellow, an ASME Fellow, and an IMAPS Fellow. He was awarded the highest reliability honor, the IEEE Reliability Societys Lifetime Achievement Award in 2008. He served as chief editor for IEEE Transactions on Reliability for eight years and was on the advisory board of IEEE Spectrum. He is chief editor for Microelectronics Reliability and is an associate editor for IEEE Transactions on Components and Packaging Technology. He is the founder of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland, College Park, where he is also the George Dieter Chair Professor in Mechanical Engineering and a professor in Applied Mathematics. He has written more than 20books on electronic products development, use, and supply chain management, and over 400 technical articles. He has been leading a research team in the area of prognostics for the past ten years. He has consulted for over 100 major international electronics companies, providing expertise in strategic planning, design, test, prognostics, IP, and risk assessment of electronic products and systems. He has previously received the European Micro and Nano-Reliability Award for outstanding contributions to reliability research, the 3M Research Award for electronics packaging, and the IMAPS William D. Ashman Memorial Achievement Award for his contributions in electronics reliability analysis.

XI
2009 by Taylor & Francis Group, LLC

Contributors
Harold S. Balaban has over 40 years experience in developing weapon system models for cost and effectiveness analyses for Department of Defense and other government agencies. He is currently employed by the Institute for Defense Analyses (IDA), where he specializes in applying reliability and maintainability concepts to weapon system life-cycle costs and effectiveness modeling. He has developed a number of models and cost-estimating relationships that enable such work to be accomplished efficiently and accuratelynotably the IDA IMEASURE program for maintenance manpower estimation, the airlifter mission capable rate simulation model, and the IDA CER model for estimating depot level reparable and consumables costs. Prior to his work at IDA, Dr. Balaban was employed by ARINC Research Corporation; his last position was director, advanced analysis. He was responsible for developing and applying analytical and simulation models to perform studies of cost, effectiveness, and reliability, maintainability, and availability of military systems. He led the team that developed the highly successful System Testability and Maintenance Program, which was the forerunner of products used today to improve organizational diagnostics of military systems. He was also a major contributor to efforts to introduce long-term warranties and logistic controls in military systems acquisition. Dr. Balaban has presented and published numerous papers on reliability and maintainability, contributed chapters for three textbooks, and taught graduate courses in reliability theory and operations research at George Washington University and at University College, University of Maryland. He holds a PhD degree in mathematical statistics from the George Washington University. He contributed to Chapters 1, 12, and 15 of this book. Ned Criscimagna is president and owner of Criscimagna Consulting, LLC. He provides training, program assessment, and related reliability consulting services for industry and government. Prior to starting his own business, Mr. Criscimagna worked at Alion Science & Technology (previously IIT Research Institute, IITRI), where he was a senior science advisor and served in various capacities, including 5years as the deputy director of the Reliability Analysis Center. Before joining IITRI in 1994, he served in various positions with the ARINC Research Corporation. Prior to his career with private industry, he served 20 years as an Air Force officer in various engineering, maintenance, and staff positions. While on the Air Force staff and the staff of the Air Force Systems Command, he helped develop and implement policies on reliability and maintainability, quality, and system acquisition. He was a member of the Air Forces repair and maintenance 2000 study team and was involved with the initial efforts to implement the Department of Defenses total quality management approach to acquisition. He is a member of the American Society of Quality Assurance and the Society of Automotive Engineers, and a senior member of the Society of Logistics Engineers. He holds a BS in mechanical engineering from the University of Nebraska, Lincoln, and an MS in systems engineeringreliability from the Air Force Institute of Technology. He contributed to Chapter 1 of this book.
XIII
2009 by Taylor & Francis Group, LLC

XIV

CONTRIBUTORS

Diganta Das has a PhD in mechanical engineering from the University of Maryland, College Park, and a BTech in manufacturing science and engineering from the Indian Institute of Technology. He is a member of the research staff at the Center for Advanced Life Cycle Engineering. His expertise is in reliability, environmental and operational ratings of electronic parts, uprating, electronic part reprocessing, technology trends in electronic parts, and parts selection and management methodologies. He performs benchmarking processes and organizations of electronics companies for parts selection and management and reliability practices. Dr. Das also assists organizations in design improvements. He has published more than 50 articles on these subjects and has presented his research at international conferences and workshops. He served as technical editor for two IEEE standards and is currently coordinator for two additional IEEE standards. He is an editorial board member for Microelectronics Reliability and the International Journal for Performability Engineering. He is a Six Sigma black belt and is a member of IEEE and IMAPS. He contributed to Chapters 2, 4, 5, 9, and 16 of this book. Abhijit Dasgupta is a faculty member and researcher in the CALCE Electronic Packaging Research Center at the University of Maryland. He received his PhD in theoretical and applied mechanics from the University of Illinois. He conducts research in the area of micromechanical modeling of constitutive and damage behavior of heterogeneous materials and structures, with particular emphasis on fatigue and creepfatigue interactions. His research also includes associated stress analysis techniques under combined thermomechanical loading, formulating physics-offailure models to evolve guidelines for design, validation testing, and screening and derating for reliable electronic packages. He contributed to Chapter 6 of this book. Joanne Bechta Dugan was awarded a BA in mathematics and computer science from La Salle University, Philadelphia, in 1980 and an MS and a PhD in electrical engineering from Duke University, Durham, North Carolina, in 1982 and 1984, respectively. Dr. Dugan is currently associate professor of electrical engineering at Duke University and visiting scientist at the Research Triangle Institute. She has performed and directed research on the development and application of techniques for the analysis of computer systems designed to tolerate hardware and software faults. Her research interests include hardware and software reliability engineering, faulttolerant computing, and mathematical modeling using dynamic fault trees, Markov models, Petri nets, and simulation. Dr. Dugan is a senior member of the IEEE and a member of the Association for Computing Machinery, Eta Kappa Nu, and Phi Beta Kappa. She contributed Chapter 11 of this book. Robert M. Hecht is a senior principal engineer with the ARINC Research Corporation. He specializes in the evaluation of reliability, maintainability, and testability problems of fielded equipment and the planning and management of product improvement programs. He has supported numerous weapon systems programs, including the P-3C, E-2C, bA-6E, EA-6B, ES-3, GUARDRAIL, QUICK FIX, EF-111A, and the M1 Abrams main battle tanks. He has extensive experience in the design for reliability of electronic, electromechanical, and mechanical systems.

2009 by Taylor & Francis Group, LLC

CONTRIBUTORS

XV

Prior to joining ARINC Research, Mr. Hecht was a reliability engineer with the Bell Aerospace Companys New Orleans operation. At Bell, he conducted reliability analysis in support of U.S. Navy surface effect ship and air cushion vehicle programs. While with the U.S. Army, Mr. Hecht managed the reliability and maintainability demonstration testing of general military equipment. He received a BS in aerospace engineering from Pennsylvania State University and an MS in engineering from the University of New Orleans. Mr. Hecht is an ASQC certified reliability engineer. He contributed Chapter 14 of this book. Jun Ming Hu is the managing director of Microsoft Asia Center for Hardware (MACH) in Shenzhen, China. The MACH team is responsible for the design, engineering, testing, and manufacturing of Microsoft hardware products, including mice, keyboards, Webcams, Xbox controllers, gaming text input devices, Zune music accessories, and other hardware products for world markets. The team also provides supporting work for Xbox console manufacturing, testing, and component sourcing and qualification. The MACH team manages many design and manufacturing partners in China. Dr. Hu joined Microsoft Corporation at Redmond in 2000 as the engineering manager of hardware reliability and component engineering. He moved to Shen Zhen in February 2004 to set up the MACH organization. Before joining Microsoft, Dr. Hu worked for Ford Motor Company in Michigan for 8 years as a senior technical specialist and engineering manager of computer-aided design for automotive electronics development. Dr. Hu received a BS in 1982 and an MS in 1985 from Shanghai Jiao-Tong University; he received a PhD from the University of Maryland in 1989. Dr. Hu holds more than 14 U.S. and international patents for electronics products and qualification methods. He was the associate editor of IEEE Transactions on Reliability and an editorial board member of Journal of the Institute of Environmental Sciences from 19931998. He is a recipient of the Asian American Corporate Achievements Award and two Henry Ford Technology Awards. He contributed to Chapters 3 and 6 of this book. Mark Kaminskiy is the chief statistician at the Center of Technology and Systems Management of the University of Maryland, College Park. He is a researcher and consultant in statistical and probabilistic reliability, life data analysis, and risk analysis of engineering systems. He has performed research and consulting projects funded by government and industrial companies such as the Department of Transportation, Coast Guard, Army Corps of Engineers, the Navy, Nuclear Regulatory Commission, American Society of Mechanical Engineers, Ford Motor, Qualcomm Inc., andseveral other engineering companies. Dr. Kaminskiy is the author and co-author of over 100 publications in journals, conference proceedings, reports, and books, including Modeling Population Dynamics for Homeland Security Applications, co-authored with B. Ayyub, in Wiley Handbook of Science and Technology for Homeland Security, edited by J. G. Voeller (John Wiley & Sons, 2008); Reliability Engineering and Risk Analysis: A Practical Guide, co-authored with M. Modarres and V. Krivtsov (Marcel Dekker, 1999, 2009); Accelerated Testing (Chapter 5) in Statistical Reliability Engineering (John Wiley & Sons, 1999); and Statistical Analysis of Reliability Data in Encyclopedia of IEEE (John Wiley & Sons, vol. 20, 1999). He received an

2009 by Taylor & Francis Group, LLC

XVI

CONTRIBUTORS

MS in nuclear physics at the Polytechnic University of St. Petersburg (Russia) and a PhD in electrical engineering at the Electrotechnical University of St. Petersburg (Russia). He contributed to Chapter 3. Richard Kowalski retired as director, product assurance, from ARINC Incorporated in 2002 after 27 years with the firm. He was responsible for the development and execution of hardware and software quality program policy. Dr. Kowalski was trained in software capability evaluation (SCE), using the capability maturity model and the integrated model developed by the Software Engineering Institute at CarnegieMellon, and he conducted SCEs at several U.S. and European companies and for several programs at ARINC. Dr. Kowalski is a member of Sigma Xi and is a life senior member of the Institute of Electrical and Electronic Engineers (IEEE). For more than 20 years, Dr. Kowalski was a member of the IEEE Reliability Societys Administrative Committee and is a past editor of the IEEE Transactions on Reliability. Dr. Kowalski received a BS in mathematics from Northeastern University and an MS and PhD in mathematics from Case Institute of Technology. He contributed to Chapter 7. Sony Mathew is a faculty research assistant at the Center for Advanced Life Cycle Engineering in the Mechanical Engineering Department of the University of Maryland, College Park. He is also pursuing his PhD in mechanical engineering from the A. James Clark School of Engineering at the University of Maryland. His areas of research are reliability, tin whiskers, and prognostics and health management of electronic products. He earned his MS in mechanical engineering from the University of Maryland in May 2005. He has a BA in mechanical engineering (1997) and an MBA (1999) from Pune University, India. He contributed to Chapter 8. Carol Smidts is an assistant professor in the Department of Materials and Nuclear Engineering, Reliability Program, University of Maryland, College Park. She obtained an MS in physics engineering in 1986 from the Universite Libre de Bruxelles, Belgium, and her PhD in physics engineering in 1991 from the same university. Her research has focused mainly on dynamic system reliability, Markovian analysis, and human reliability. Her recent work has been devoted to software reliability. She contributed to Chapter 7. Walter Tomczykowski the director of the Life Cycle Management and Operations Support Department at ARINC Engineering Services, reporting to the vice president of the Advanced Systems Division. He received an MS in reliability engineering from the University of Maryland and a BS in electrical engineering technology from Northeastern University in Boston. For over 25 years he has been leading specialized teams in the areas of reliability, maintainability, life-cycle cost, human factors, counterfeit prevention, and obsolescence management for the Office of the Secretary of Defense, Defense Logistics Agency, and Department of Defense (DoD) programs throughout the services and various federal agencies, such as the Department of Homeland Security and the Department of the Treasury. As the director for the Life Cycle Management and Operations Support Department, Mr. Tomczykowski is responsible for personnel in Boston, Annapolis (including

2009 by Taylor & Francis Group, LLC

CONTRIBUTORS

XVII

Patuxent River), Maryland, Dayton, Ohio, San Antonio, Texas, Oklahoma City, and Panama City, Florida. Specifically, for obsolescence management (DMSMS diminishing manufacturing and material shortages), his teams provide support to the Defense MicroElectronics Activity, Defense Supply Center, Columbus, NAVAIR Aging Aircraft IPT, Coast Guard, AWACS, B-2, USMC H-1, and a variety of other DoD programs. He is a primary author of the DMSMS Cost Factors, the DMSMS Program Managers Handbook, and the DMSMS Acquisition Guidelines. He is often requested as a keynote speaker at aging aircraft, DMSMS, and other obsolescence management conferences to share his knowledge of reliability, life-cycle cost, and obsolescence management. His work in reliability has also been published in the Wiley Encyclopedia of Electrical and Electronics Engineering. He contributed Chapter 13. Igor A. Ushakov taught for approximately 15 years at the Moscow Institute of Physics and Technology. In 1989 he was invited to be a distinguished visiting professor at George Washington University in Washington, D.C. Later, he taught at George Mason University and the University of California, San Diego. He has also worked at well-known American companies such as MCI, Qualcomm, Hughes Network Systems, and Mantech. His experience is focused on reliability and effectiveness analysis of large-scale telecommunication systems and mathematical and computer modeling of communication systems. He has been chair of sessions at numerous international conferences (in the United States, Russia, Ukraine, Canada, Japan, Great Britain, France, Italy, Germany, Norway, Poland, Hungary, and Bulgaria). He has authored more than 300 papers in various prestigious international math and engineering journals in operations research, reliability engineering and theory, and telecommunication network modeling. Professor Ushakov has written approximately 30 books in Russian, English, German, and Bulgarian, including three published in the United States. Publications include Histories of Scientific Insights (Lulu, Morrisville, North Carolina, 2007), Course on Reliability Theory (Drofa, Moscow, 2007), Statistical Reliability Engineering (John Wiley & Sons, New York, 1999), Probabilistic Reliability Engineering (John Wiley & Sons, New York, 1995), and Handbook of Reliability Engineering (John Wiley & Sons, New York, 1994). A member of Sigma Xi, Omega Rho, and Tau Beta Pi, Professor Ushakov is a founder of the Gnedenko Forum, an informal international association of specialists in probability and statistics. He contributed to Chapter 3. David Weiss is a consultant in the fields of reliability and systems analysis. For 10 years he served as the manager for reliability programs in the Engineering Research Center at the University of Maryland, working with faculty in the creation of a graduate program in reliability engineering. Prior to joining the University of Maryland, he was a reliability manager with General Electric Company and a partner in the consulting firm Booz Allen Hamilton. He contributed to Chapter 15.

2009 by Taylor & Francis Group, LLC

Você também pode gostar