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Didier Cottet, Stanislav Skibin, Ivica Stevanovic ABB Switzerland Ltd., Corporate Research, 28.

May 2010

EMC Simulations of Power Electronic Devices and Systems


ABB Group June 2, 2010 | Slide 1

Outline
Introduction Numerical Method Device Simulations System Simulations Conclusion

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ABB Group June 2, 2010 | Slide 2

Introduction PE in Power Supply & Distribution


Where do we find power electronics in power generation, transmission and distribution?

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ABB Group June 2, 2010 | Slide 3

Introduction PE in Power Supply & Distribution

Static excitation systems

SVC Light with energy storage

Solar inverters

Grid stabilization Photovoltaic Power stations


ABB Group June 2, 2010 | Slide 4

Introduction PE in Power Supply & Distribution

HVDC for shore connection

AC drives for pumps

Oil platforms

ABB Group June 2, 2010 | Slide 5

Introduction PE in Power Supply & Distribution

Generator frequency converter

StatComs for grid code

HVDC for shore connection

Wind parks

ABB Group June 2, 2010 | Slide 6

Introduction EMC / EMI in Power Electronics


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EMC (compatibility)
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Standards compliancy Switching harmonics / THD (up to 25th / 40th harmonic) Conducted emissions (150 kHz 30 MHz) Radiated emissions (30 MHz 1 GHz)

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EMI (interferences)
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Malfunction through self disturbance Performance de-rating !! through load imbalance !! through voltage/currents overshoots Low ruggedness in short circuit mode Electric stress through ringing and oscillations

ABB Group June 2, 2010 | Slide 7

Outline
Introduction Numerical Method Device Simulations System Simulations Conclusion

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ABB Group June 2, 2010 | Slide 8

Methodology PEEC Partial Element Equivalent Circuits


1) 3D geometry description and materials definition 2) Geometry subdivision " Nodes

3) Surface mesh " Node capacitances, C to GND to other nodes 4) Volume mesh " Node-to-node resistances, R self inductances, L " Mutual inductances, M 5) RLCM-circuit description

ABB Group June 2, 2010 | Slide 9

Methodology Modeling Procedures

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3D Broadband Solution Time and frequency domain Current and potential distributions E-/H-fields Linear elements only Slow

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Order reduced Z-matrix for defined frequency fextr

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SPICE, Simplorer,

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0D Narrowband Solution Valid around frequency fextr Time and frequency domain Nonlinear elements No current/potential distributions No E-/H-fields Fast

ABB Group June 2, 2010 | Slide 10

Outline
Introduction Numerical Method Device Simulations System Simulations Conclusion

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ABB Group June 2, 2010 | Slide 11

Simulated Device IGBT Power Modules


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Example: HiPak IGBT power module


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Rating: 6.5 kV, 2.4 kA 24 parallel IGBTs 12 anti-parallel diodes

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EMI related design issues


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Dynamic / static current distribution Short circuit capabilities EM noise emission CM coupling through base plate

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Dominant effect
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Local disturbances in IGBT gate voltages, UGE

ABB Group June 2, 2010 | Slide 12

Modeling Package Macro Modeling


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3D PEEC model
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Substrates Bond wires Power terminals Auxiliary terminals

********************************************** *** subcircuit for hipak_package v1.0 ********************************************** .subckt hipak_package_v1 1 2 3 4 5 6 7 8 9 10 1112 13 14 15 16 17 18 19 20 21 22 23 24 25 26 2728 29 30 31 32 33 34 35 36 37 38 LZ_0 1 LZ_1 3 LZ_2 5 LZ_3 7 LZ_4 9 . . . KZ_1_0 KZ_2_0 KZ_2_1 KZ_3_0 KZ_3_1 . . . RZ_0_0 HZ_0_1 HZ_0_2 HZ_0_3 HZ_0_4 HZ_0_5 . . . Vam_18 .ends i_node0_2 i_node1_2 i_node2_2 i_node3_2 i_node4_2 2.25402e-008 1.44454e-008 9.15187e-009 2.30544e-008 1.48664e-008

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Extraction of SPICE compatible Z-matrix (0D narrowband solution)

LZ_1 LZ_2 LZ_2 LZ_3 LZ_3

LZ_0 LZ_0 LZ_1 LZ_0 LZ_1

0.888218 0.662318 0.812005 0.0200939 -0.0428358

i_node0_2 i_node0_3 i_node0_4 i_node0_5 i_node0_6 i_node0_7

i_node0_3 i_node0_4 i_node0_5 i_node0_6 i_node0_7 i_node0_8

0.000948648 Vam_1 0.000703874 Vam_2 0.000529978 Vam_3 4.56201e-005 Vam_4 4.65392e-005 Vam_5 4.79563e-005

i_node18_21 38 dc=0v

ABB Group June 2, 2010 | Slide 13

Modeling Circuit Model


IGBTs & diodes Load Gate signal

Package Z-matrix

IGBTs & diodes

ABB Group June 2, 2010 | Slide 14

Results Switching Analysis


IGBTs 1-4 IGBTs 5-8

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Initial design
Asymmetric current sharing between paralleled IGBTs " up to 140 % current overshoot per IGBT
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Optimized design
Symmetric current sharing between paralleled IGBTs " max 60 % current overshoot per IGBT
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ABB Group June 2, 2010 | Slide 15

Results H-Field Coupling Analysis

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Understand coupling effects through visualization of magnetic field vectors and current density distributions
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Asymmetric coupling into VGE Asymmetric terminal current paths Open coupling loops in gate-emitter paths

(Note: 3D simulation using TLM method, Transmission Line Matrix)


ABB Group June 2, 2010 | Slide 16

Outline
Introduction Numerical Method Device Simulations System Simulations Conclusion

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ABB Group June 2, 2010 | Slide 17

System Simulations New Challenges

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Complexity
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Number of components
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Number of simulation cases


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Physical dimensions
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Availability of input data

ABB Group June 2, 2010 | Slide 18

Case Study Medium Voltage Static Frequency Converter


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Static Frequency Converter


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16 inverter units (IGCTs, 3-level ANPC) 1 common DC bus (~11 m length, +/neutral/-) 18 DC link capacitors (film capacitors)

" Distributed, low resistive LC circuit " Risk of ringing and oscillations " EM noise and thermal stress of DC link capacitors

ABB Group June 2, 2010 | Slide 19

Modeling Objectives
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DC-link system impedance simulation Identify system resonances Analysis of individual impedance contributions (bus bars, junctions, capacitors, cables) Design goal: reduce stray inductances

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ABB Group June 2, 2010 | Slide 20

Modeling Bus Bar Thickness vs. Frequency


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Bus bar thickness:

t = 2 cm

Frequency of interest: DC to 10 kHz

" Skin depth ~ bar thickness " Need for accurate & efficient volume discretization " Non-uniform cross-sectional meshing

ABB Group June 2, 2010 | Slide 21

Model Verification Simulations vs. Measurements


Impedance measurement setup Capacitor cables to bus bar

meas. sim.

short circuit, 0D narrowband

meas. sim.

capacitive load, 0D narrowband

" High accuracy with 0D narrowband solution


ABB Group June 2, 2010 | Slide 22

Model Improvement Acceleration


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Accurate volume discretization for skinand proximity effects


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Large PEEC model Many ports Large RL-matrix in Simplorer

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Acceleration through divide and conquer


(domain decomposition)
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3 small PEEC model Few ports 9 small RL-matrices in Simplorer

left

7 x intermediate

right

ABB Group June 2, 2010 | Slide 23

Model Improvement Full Model

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ABB Group June 2, 2010 | Slide 24

Model Improvement Decomposed (Segmented) Model

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ABB Group June 2, 2010 | Slide 25

Model Improvement Verification

- Full model - Segmented model

- Full model - Segmented model

" High agreement between full and segmented model " High agreement between 3D broadband PEEC and 0D narrowband segmented model

- 0D narrowband ! 3D broadband

ABB Group June 2, 2010 | Slide 26

Results Impedance Discussion

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Single capacitor connected at far end of bus bar


Cap + cables + bus bar Cap + cables Cap

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Nine capacitors connected along bus bar


Complete bus bar Simplified bus bar (no junction elements) Ideal connection

" Impact on fres: bus bar and cables


ABB Group June 2, 2010 | Slide 27

" Impact on Z characteristics: bus bar and junctions

Outline
Introduction Numerical Method Device Simulations System Simulations Conclusion

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ABB Group June 2, 2010 | Slide 28

Conclusion
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Power electronics omnipresent in power T&D EMC and EMI in power electronics are known issues PEEC as promising numerical method for its flexibility
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Frequency range (DC to HF) Scalability (R, L, C) Time- and frequency domain Circuit formulation

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Device simulations: Advanced state-of-the-art for System simulations: Efficient methods in available & in use Effective acceleration methods for large system simulations PEEC simulations as powerful tool for bus bar design

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ABB Group June 2, 2010 | Slide 29

ABB Group June 2, 2010 | Slide 30

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