This document provides an overview of memory testing. It begins with an introduction to different types of semiconductor memory, including DRAM and SRAM. Memory architecture is then described, showing the typical components of a memory chip. Fault models for memory are discussed, including examples of single-cell faults like stuck-at faults and transition faults, as well as two-cell coupling faults. Finally, the document outlines parametric and functional testing approaches for memories.
This document provides an overview of memory testing. It begins with an introduction to different types of semiconductor memory, including DRAM and SRAM. Memory architecture is then described, showing the typical components of a memory chip. Fault models for memory are discussed, including examples of single-cell faults like stuck-at faults and transition faults, as well as two-cell coupling faults. Finally, the document outlines parametric and functional testing approaches for memories.
This document provides an overview of memory testing. It begins with an introduction to different types of semiconductor memory, including DRAM and SRAM. Memory architecture is then described, showing the typical components of a memory chip. Fault models for memory are discussed, including examples of single-cell faults like stuck-at faults and transition faults, as well as two-cell coupling faults. Finally, the document outlines parametric and functional testing approaches for memories.