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VDSS
RDS(on)
ID
500V
< 0.25
20 A
DESCRIPTION
The MDmesh is a new revolutionary MOSFET
technology that associates the Multiple Drain process with the Companys PowerMESH horizontal
layout. The resulting product has an outstanding low
on-resistance, impressively high dv/dt and excellent
avalanche characteristics. The adoption of the
Companys proprietary strip technique yields overall
dynamic performance that is significantly better than
that of similar competitions products.
3
2
1
TO-247
APPLICATIONS
The MDmesh family is very suitable for increasing
power density of high voltage converters allowing
system miniaturization and higher efficiencies.
Value
Unit
500
500
30
ID
20
ID
12.6
80
VDS
VDGR
VGS
IDM (l)
PTOT
dv/dt (1)
Tstg
Tj
Parameter
214
Derating Factor
1.44
W/C
15
V/ns
65 to 150
150
August 2002
1/8
STW20NM50
THERMAL DATA
Rthj-case
Max
0.585
C/W
Rthj-amb
Max
30
C/W
300
Tl
AVALANCHE CHARACTERISTICS
Symbol
Max Value
Unit
IAR
Parameter
10
EAS
650
mJ
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 A, VGS = 0
IDSS
IGSS
Gate-body Leakage
Current (VDS = 0)
V(BR)DSS
Min.
Typ.
Max.
500
Unit
V
100
VGS = 30V
100
nA
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
RDS(on)
Static Drain-source On
Resistance
Min.
Typ.
Max.
Unit
0.20
0.25
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
Parameter
Forward Transconductance
Test Conditions
VDS > ID(on) x RDS(on)max,
ID = 10A
VDS = 25V, f = 1 MHz, VGS = 0
Min.
10
Ciss
Input Capacitance
1480
pF
Coss
Output Capacitance
285
pF
Crss
Reverse Transfer
Capacitance
34
pF
Equivalent Output
Capacitance
130
pF
1.6
2/8
STW20NM50
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Parameter
Turn-on Delay Time
Rise Time
Qg
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
Test Conditions
Min.
VDD = 250V, ID = 10 A
RG = 4.7 VGS = 10 V
(see test circuit, Figure 3)
VDD = 400 V, ID = 20 A,
VGS = 10 V
Typ.
Max.
Unit
24
ns
16
ns
40
56
nC
13
nC
19
nC
SWITCHING OFF
Symbol
tr(Voff)
Parameter
Off-voltage Rise Time
tf
Fall Time
tc
Cross-over Time
Test Conditions
Min.
VDD = 400 V, ID = 20 A,
RG = 4.7, VGS = 10 V
(see test circuit, Figure 5)
Typ.
Max.
Unit
ns
8.5
ns
23
ns
Max.
Unit
Source-drain Current
20
ISDM (2)
80
VSD (1)
Forward On Voltage
ISD = 20 A, VGS = 0
1.5
trr
Qrr
Irrm
350
4.6
26
ns
C
A
trr
Qrr
Irrm
435
5.9
27
ns
C
A
ISD
Parameter
Test Conditions
Min.
Typ.
Thermal Impedance
3/8
STW20NM50
Output Characteristics
Transconductance
4/8
Transfer Characteristics
Capacitance Variations
STW20NM50
Normalized Gate Thereshold Voltage vs Temp.
5/8
STW20NM50
Fig. 1: Unclamped Inductive Load Test Circuit
6/8
STW20NM50
DIM.
mm.
MIN.
TYP
inch
MAX.
MIN.
TYP.
MAX.
0.19
0.20
4.85
5.15
2.20
2.60
0.08
0.10
0.40
0.80
0.015
0.03
1.40
0.04
0.05
F1
0.11
F2
0.07
F3
2.40
0.07
0.09
F4
3.40
0.11
0.13
10.90
0.43
15.45
15.75
0.60
0.62
19.85
20.15
0.78
0.79
L1
3.70
4.30
0.14
L2
L3
18.50
14.20
0.17
0.72
14.80
0.56
0.58
L4
34.60
1.36
L5
5.50
0.21
0.07
0.11
V2
60
60
Dia
3.55
3.65
0.14
0.143
7/8
STW20NM50
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consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
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