Michelson Interferometer

The Michelson interferometer is an optical instrument of high precision and

versatility. It is generally used in investigations that involve small changes
in optical path length. With the Michelson interferometer, one can produce
circular and straight-line fringes of both monochromatic light and white
light. One can use these fringes to make an accurate comparison of
wavelengths, measure the refractive index of gases and transparent solids,
and determine small changes in length quite precisely. The Michelson
interferometer was introduced by Albert Michelson in 1881. It has been
used to
provide experimental evidence for special relativity,
discover the hyperfine structure in the energy levels of atoms,
measure tidal effects of the moon on the earth,
enable the use of wavelength of light as the international standard for the
meter.
The Michelson interferometer operates on the principle of division of
amplitude rather than on division of wave front. According to this principle,
the incident beam of light falls on a beam splitter, which reflects roughly half
of the intensity of the wave front in one direction and transmits the other
half of the intensity of the wave front in another direction. The two beams,
which travel different optical paths, are subsequently recombined in a
common region where interference occurs and fringes are formed. The
character of the fringes is directly related to the difference in the optical path
lengths for the two beams. It is therefore related to whatever causes a
difference in the optical path lengths.
In its most common arrangement, a Michelson interferometer is illuminated
by an extended source S and consists of a 50% beam-splitter BS and two
mirrors M1 and M2. The interference pattern is observed on a screen that is
either very far from BS, or a lens is placed one focal length in front of the
screen. Rotation or translation of one or both mirrors changes the
interference pattern.

Interference in a Michelson interferometer can be understood in terms of

thin-film interference. Imagine that the arms of the interferometer are
rotated, such that there is a single optical axis, as shown in the drawing
below.

Then reflection from the mirrors M1 and M2 is analogous to reflection from

two surfaces of an air gap of thickness d. Since the phase shift upon
reflection is the same for both mirrors, we find
2dcos = m
for constructive interference.

If the two mirrors are precisely aligned such that their planes are exactly
perpendicular to one another, thus ensuring that path differences over
different regions of the mirrors are constant, the fringe pattern will consist of
a series of concentric rings. Each ring will correspond to a different angle of
view, measured from the normal to the mirror M1. These fringes are called
fringes of equal inclination. They are analogous to fringes of equal
inclination that we observe when we shine light from an extended source on
a thin film. When the mirror M1 is moved so as to approach the condition for
zero path difference, the fringe pattern appears to collapse, with all fringes
moving towards the center, and disappear.