CHAPTER 1

INTRODUCTION
The

objective

of

this

work

is

to

fabricate,

interface

and

calibrate

Gnathodynamometer for measurement of biting force in dental subjects. The interfacing

of Gnathodynamometer with Personal Computer is done using a National Instrument's
data card (PCI-6024E). The National Instrument's LabVIEW is used as software for
acquiring signals from data card (PCI-6024E) and do the post signal processing on the
acquired signal according to the calibration data and display the result.
Introduction to different aspects of the project is explained below:
1.1. Gnathodynamometer
Numerous instruments have been devised for measuring the maximum biting force in
human beings (Howell & Manly, 1948). The gnathodynamometer is the instrument for
measuring such biting force. Its utilities, as described by Gutkin & Osipovich (Gutkin &
Osipovich, 1990), include, (1) possibility to produce a graphical record of the investigation
process; (2) increase the quality of diagnosing the functional condition of the chewing
muscles; (3) compare results of the investigation with a myogram and other processes; (4)
determine the sensitivity to stress load developed in muscles acting on the lower jaw and
chewing pressure during varied degrees of separation of the jaws; (5) measure the pressure
which can be sustained by the dental periodontium or group of teeth as a result of tension in
the muscles of the tooth-jaw system; (6) determine simultaneously the resistance of teeth to
pressure, along with their mobility; (7) determine the force exerted by the chewing muscles in
three mutually perpendicular directions of lower jaw motion; (8) measure the pressure from
the tongue muscles on the upper and lower front teeth; (9) the force to hold dental prostheses
during motion of the lower jaw; and (10) the chewing force in the case of lower jaw trauma or
tooth loss.
To predict individual patients ability to chew test foods, dentists cannot rely on
subjective responses to questionnaires on chewing difficulties or on the complete denture.
However, a series of chewing tests can determine the individual masticatory performance. An
objective test of masticatory performance can provide useful information of edentulous
1

subjects wearing complete dentures; later this information can support advice and decisions
made by dentists to patients on the treatment and its outcome.
The wearing of complete dentures also resulted in changes in masticatory function
compared with dentate subjects as reported by Fiske and Lewis (1995). Therefore, a
measurement of the performance and the efficiency of masticatory function is important as
restoring the masticatory function is one of the purposes of complete denture construction.
The process of Mastication is the process of chewing food for swallowing and digestion
(Glossary of Prosthodontics, 2005). Mastication has been described as consisting of two
separated processes, the food being placed between the teeth for it to be broken (selection)
and then breakdown of the particles (breakage) (Lucas et al, 1986).
Mastication is influenced by many variables such as,
Dental status (Kapur et al, 1964);
Gender (Julien et al, 1995);
Rate of chewing (Dahlberg, 1942); and
Bite force (Fontijn et al, 2000).
Masticatory performance has been evaluated by objective measures (masticatory tests)
and subjective measures (individual perception). The individual perception of masticatory
performance is often measured by questionnaire (Demers et al, 1996). No positive correlation
has been found between the patients perceptions of the ability to chew the test food with the
masticatory test (Garrett et al., 1996). Therefore the self-assessment of chewing ability is not
sufficient for evaluation of masticatory performance (Miura et al, 1998) and also it lacks the
necessary objectivity for repeatability and validity.

1.2. LabVIEW
LabVIEW is a graphical programming environment used to develop sophisticated
measurement, test, and control systems using intuitive graphical icons and wires that
resemble a flowchart. It offers integration with thousands of hardware devices and provides
hundreds of built-in libraries for advanced analysis and data visualization.

1.3. PCI-6024E Data Card

The PCI E Series boards are high-performance multifunction analog, digital, and timing
I/O boards for PCI bus computers. Supported functions include analog input, analog output,
digital I/O, and timing I/O.
2

The PCI-6024E features 16 channels of analog input, two channels of analog output, a
68-pin connector and eight lines of digital I/O.

CHAPTER 2

DESIGN AND FABRICATION

The design of the gnathodynamometer comprises of its mechanical parts and the
electronic circuit. The measuring element is in the form of a fork which is inserted into the
mouth Fig. 2.1. The design data is derived from previous work of Mr Ambuj Saxena.

Figure 2.1 Sketch of the gnathodynamometer measurement system

The fork is connected to the handle through a revolute joint, so that its angle with the
handle may be changed. Strain gauges are bonded on the inner side of the prongs of the fork,
towards the root. The wires emanating from the strain gauges are led to the electronic circuit
through the handle. The bite is applied at the free end of the fork. A small projection is
provided here so that the bite is always at this location.
The fork is made of stainless steel as it is to be inserted into the mouth. Safety and
hygiene require that there should be no rust formation on the fork. Stainless steel serves this
purpose effectively. Other non-ferrous metals are not suitable for this application because
they have smaller modulus of elasticity and would deform more for the same applied force.
These non-ferrous materials usually have a tendency to accumulate static charge on the
surface, which could result in shocks. Stainless steel has a high modulus of elasticity, 190
200 GPa, and hence offers possibility to have a compact fork, which may be easily inserted
into the mouth for measurement of biting force. The percentage of carbon, nickel and
chromium in stainless steel are .08%, 11% and 10.5% respectively.

2.1. Design Specification

The functional requirements of the fork are given below
Range of biting force = 0-600 N
Therefore, the fork is designed to measure the bite force up to 600N. The lateral
deflection of the prongs should not exceed 1 mm.

Figure-2.2 Cantilever Beam with strain gauge mounted at its root.

The design of the Fork is based on the principle of a cantilever beam, which is shown in
the Fig. 2.2
Now we know that the normal stress at a cross-sectional fibre is,

(2.1)

Where, = normal stress along the beam length,

M is the bending moment due to the force F at the location, and
y is the transverse distance of the fiber from the neutral axis. At the surface of beam,
y = t/2, I =

t is the thickness of the beam, b is the width and I is the moment of inertia.
Substituting the values of M, y and I, in (2.1), put the value of M , y and I,

(2.2)
From Hooks law,
=E
Where, E = Modulus of Elasticity and = Strain in the normal direction.
Putting the value of from equation number (2.2)

(2.3)

The bending moment at the root of the cantilever is

M = F l,

(2.4)

The deflection at the free end of the cantilever beam is given as:
(2.5)

2.2. Stress and Strain analysis of fork

A finite element model of the fork was generated using ALGOR software from the
solids model prepared in Pro-E. The solids model was meshed, and properties of materials
were specified. Boundary conditions were then specified. Force of 600 N was applied at the
tips of prongs. It was distributed across the width of the prong. The rear end surface of the
fork was fixed. The von-mises stress and strain analysis performed through ALGOR in shown
in Fig. 2.3 and Fig. 2.4. Displacement is shown in Fig. 2.5.

Figure-2.3 Stress analysis of fork Von Mises stresses

Figure-2.4 Strain analysis of fork Von Mises strains

Figure-2.5 Displacement of fork

2.3. Fabrication of Gnathodynamometer Fork

The material selected for the fork is stainless steel based on the consideration of
maximum force and deflection limit consideration. The fork is cut out from a stainless steel
bar which is available commercially. Several forks are cut out from one such bar. Since the
material is very hard and difficult to machine using HSS, the wire cut EDM technique is used
to cut out the desired shape from the plate. An array of forks is cut out from the bar in one
such operation. Shown in Fig. 2.6.

Figure-2.6 Stainless steel bar after the cutting of forks from it.

Another important reason for using wire cut EDM for the machining is that the gap
between the prongs of the fork is quite small and difficult to access and fixture using
conventional machining methods. The surface finish obtained is just appropriate for bonding
of strain gauges on the surface of prongs. Stress concentration is completely avoided because
of the EDM operation as strain hardening due to machining does not occur.
The holes in the fork, shown in the view of Fig. 4.1, have been drilled on a CNC
drilling machine. This is because the material is extremely hard and the dimensions of the
fork are very small. Required accuracy is thus obtainable. The operations have proved to be
extremely difficult and wasteful on conventional machines.

2.4. Strain Gauges

The strain manifested at the root of the prong of the fork is measured using strain
gauges. A brief background of resistive strain gauges is provided here. We begin with a
derivation of the change in resistance due to change in resistance due to change in physical
configuration of a wire segment (Wolfram Stadler, 1995).Shown in Fig. 2.7.
We suppose that the wire segment has an unstretched length L and a uniform cross-sectional
area A. If is the resistivity of the material, the load resistance of the segment in is given
by
(2.6)
We take
A = kD2

(2.7)

Where k is proportionality constant depending on the section shape and D is some characteristic
dimension. The segment is now strained and we assume that all quantities change, then the total
change in resistance may be expressed as the differential

Figure- 2.7 Wire segment

]
Which we write in the form
10

(2.8)

(2.9)

The average longitudinal and lateral strains are defined by

average axial strain
average lateral strain
With these definitions the bracketed quantity in (2.9) may be written in the form

(2.10)

Which is now termed the gauge factor. Consequently,

(2.11)
In practice, finite rather than infinitesimal changes are considered, and we then consider
an average strain
(2.12)

The resistance of a wire type resistive strain gauge depends on its resistivity which is a
material property, length and area of cross section.
When the strain gauge is stretched within the limits of its elasticity, it will become
narrower and longer. Its electrical resistance increases. Conversely, if it is compressed, it will
broaden and shorten. Its electrical resistance decreases. The measurement of the change in
resistance of the gauge indicates the strain it undergoes. A typical strain gauge arranges a
long, thin conductive strip in a zig-zag pattern of parallel lines such that a small amount of
stress in the direction of the orientation of the parallel lines results in a multiplicatively
larger strain over the effective length of the conductor and hence a multiplicatively larger
change in resistance than would be observed with a single straight-line conductive wire.
For metallic foil gauges, the gauge factor is usually a little over 2. Foil gauges typically
have active areas of about 2-10 mm2 in size. With careful installation, the correct gauge, and
the correct adhesive, strains up to at least 10% can be measured.
Foil strain gauges are used in many situations. Different applications place different
requirements on the gauge. In most cases the orientation of the strain gauge is significant.
11

Gauges attached to a load cell would normally be expected to remain stable over a period of
years, if not decades; while those used to measure response in a dynamic experiment may
only need to remain attached to the object for a few days, be energized for less than an hour,
and operate for less than a second.
Variations in temperature cause a change in the resistance of the gauge. The gauge
changes in size due to thermal expansion, and these results in a change in the actual strain
measured.
Standard gauge resistances in use are 120 , 350 , 600 and 1000 . Although a
current of about 10 mA, is normally applied when measuring materials of poor heat radiation,
the gauge having a large resistance should be used, otherwise the voltage and current applied
must be reduced. Attention should be given not to cause over current through the gauge
having small area of resistance wire grid. When large objects and uniformly distributed
stresses are encountered, a gauge of large gauge length can be successfully used. When
analysing complicated stresses, gauge of shorter gauge length can be successfully used.
All paper gauges are provided with a resistance wire, wound ideally in a grid form
between two sheets of paper. Carefully chosen paper of high quality is used. The paper is
uniform in thickness, free of fiber direction effects and hence of irregularities in
characteristics. Junction of the resistance wire grid and lead wire are specially treated to be
highly resistant to wear and breakage and are also provided with a strip of paper to maintain
good insulation. Resistance wire grid and lead wire junction is spot welded to minimize
junction resistance and increase the junction strength. Gauge factor is strictly checked on a
precision calibrator using a large number of samples taken at random. Maximum operating
range of paper based strain gauge is 80C continuous or 100C intermittent. For the
gnathodynamometer, the following strain gauge has been selected. The grid size required is
very small, as the width of the prong is 10 mm, and its length is 18 mm. The gauge factor is
2.7.
Gauge type

BKKWR-1A

Grid size

Base size

LW mm

LW mm

1.50.5

86

Resistance

Grid style

120

Table-2.1 Gauge specification

12

2.5. Bonding of Strain Gauge on fork

Bonding in a strain gauge is a work of precision. The position of gauges affects the
readings. The surface of the prong where the gauges are to be bonded is thoroughly cleaned.
A mix of adhesive polymer resin: hardener in the ratio of 10:1 is prepared. The adhesive
is applied on one side of the gauge. The gauge is then placed on the prong of the fork. Care is
taken to ensure that no air is trapped between the surface of the gauge and the prong.

Figure-2.8 Strain Gauge Positions

The gauges are then taped to the prongs and left for 24 hours for curing. Before
soldering connectors to the gauge terminals, it is necessary to check whether the gauges short
with the surface of the prongs. There should be no shorting. The connectors are then joined to
points on the Wheatstone bridge.

13

CHAPTER 3

ELECTRONIC CIRCUITS AND DATA CARD

INTERFACING

3.1. Design of circuit for measurement

Figure-3.1 Circuit of Wheatstone Bridge and amplifier

The strains at the root of the cantilever beam are maximum, and these have to be
converted to voltage for measurement and display. The strains are measured using strain
gauges bonded on the inside of the prongs near the fixed end. A Wheatstone bridge is used
for measurement of the change in resistance due to strain at the gauge locations. All the four
resistances on the arms of the Wheatstone bridge are chosen to be the same, R, by design.
The change in resistance R produces a potential difference at the output of the bridge.
The voltage output is quite low, of the order of micro volts, and needs to be amplified. The
amplification is done using an op-amp inverting amplifier configuration as shown in Fig. 3.3.
Strain gauges are placed on the arms AB and CD of the Wheatstone bridge. Both the strain
gauges will be under compression when force is applied due to biting at the free end of fork.
Due to compression, the resistance of strain gauges will be R-R. The circuit for the
Wheatstone bridge and amplifier is shown in Fig. 3.1. Point C on the bridge is grounded. The
amplification by the op-amps is the 94. Value of feedback resistance Rf is chosen as 470k
and the value of input resistances R1 and R2 are 5k each. The output voltage can be
displayed on an oscilloscope. We use a potentiometer at RG to correct the zero offset after
amplification.
14

The design of the circuit is based on the principle of a Wheatstone bridge and
Operational amplifier, which is shown in the Fig. 3.2.
The resistance at each of the arms of the bridge is R. Strain gauges are placed at arms
AB and CD.
Due to application of biting force, the strain gauges undergo compression. If the
resistance change in each gauge is R, the resistance of each gauge becomes R (1-

).

The potential at point C is 0, then the voltage at point A becomes,

VA = Vin
Where, Vin = Supply voltage, R = Wheatstone bridge resistance, R = Change in
resistance
CVB

(3.1)

Where CVB = Potential at the point B with respect to C.

Potential at point D with respect to C is,
CVD

(3.2)

Voltage difference between point B and D

DVB

= CVB - CVD

(3.3)

=
DVB

(3.4)

DVB

is the output of the Wheatstone bridge.

In this equation R in the denominator is very small in comparison to R, and can be

neglected. Eq. (3.4) can be simplified as
DVB

(3.4)

15

Figure-3.2 Wheatstone bridge arrangement

.

Where

Gf = Gauge factor of the strain gauge and has been explained later.
Hence,

DVB=

(3.5)

This voltage input is applied to the inverting configuration of the operational amplifier.
The output voltage can be obtained as follows (Fig. 3.3).
Step-1:

VP VN

(3.6)

The gain A of the op amp is very large. Hence VP VN.

Where VP = Voltage at the non-inverting end and VN = Voltage at the inverting end.
Step-2: The input impedance of the op amp is extremely large, hence
Where ip and iN are currents as shown in Fig. 3.3.
0,

= 0. Hence,

.
i2 and iG are currents as shown in Fig. 3.3.

16

Figure-3.3 Operational Amplifier in inverting configuration.

Then,

If RG = RF, the currents can be written as,

(3.7)
Where R2 and RF are resistances as shown in Fig. 3.4.
0,

i1 + iF =

=0

i1 and iF are currents as shown in Fig. 3.4.

Now from Eq. (3.7),

(

)=

,
=

(3.8)

Now from (3.7),

(

)=

17

(3.9)

From (3.6) we know that, VP VN,

(
Taking,
(
=

) =

(3.10)

, in (3.10),
+

)=
(

(3.11)

Substituting the values of (V2 V1) = (VB -VD) from equation (3.3),
=

.Vin

(3.12)

Substitutes value of from (2.5) in (3.12)

=

.Vin.

.F

(3.13)

Eq. (3.13) shows that the output of the circuit V0 is proportional directly to the force F.

3.2. Input offset adjustment

Resistors used in practical solid-state op-amp circuits are typically in the k range.
Resistors much greater than 1 M cause excessive thermal noise and make the circuit
operation susceptible to significant errors due to bias or leakage currents. Practical
operational amplifiers draw a small current from each of their inputs due to bias requirements
and leakage. These currents flow through the resistances connected to the inputs and produce
small voltage drops across those resistances. In AC signal applications this seldom matters. If
high-precision DC operation is required, however, these voltage drops need to be considered.
The design technique is to try to ensure that these voltage drops are equal for both inputs, and
therefore cancel. If these voltage drops are equal and the common-mode rejection ratio of the
operational amplifier is good, there will be considerable cancellation and improvement in DC
accuracy. If the input currents into the operational amplifier are equal, to reduce offset
voltage the designer must ensure that the DC resistance looking out of each input is also
matched. In general input currents differ, the difference being called the input offset current,
Ios. Matched external input resistances Rin will still produce an input voltage error of RinIos.

18

Figure-3.4 Circuit diagram of potentiometer in operational amplifier

Most manufacturers provide a method for tuning the operational amplifier to balance
the input currents (e.g., "offset null" or "balance" pins that can interact with an external
voltage source attached to a potentiometer).
The OP07 op-amp selected for use in this application has a very low input offset
voltage, and usually does not require external nulling. The OP07 is particularly useful for
high gain instrumentation applications, and is well suited for our gnathodynamometer. It is
commonly available at low cost. Details of the OP07 are provided in Appendix-A.
In the Fig. 3.5, the combination of resistance R and capacitor C works as a low pass
filter. In the low pass filter lower frequencies are passed to the output with almost no
attenuation and higher frequencies are significantly attenuated (Alciatore & Histand 2007).
For the low pass filter portion, using the voltage divider rule for the complex
impedances of the resistor R and capacitor C, the output voltage Vout for the network can be
written as,
Vout = [

].V

(3.14)

Where is frequency of the input signal, V is the input voltage.

Therefore, the output-to-input ratio as a function of frequency is
(3.15)

19

Where Vout/V is the gain of the filter as a function of frequency.

The magnitude of this complex number gives us the amplitude ratio as a function of
frequency:
|

(3.16)

The cut off frequency c for the circuit is

(3.17)
Because
|
When

Using

|
c.

c, the

amplitude ratio can also be expressed as

If
r

(3.18)

and

(3.19)

| , it may be noted that, as

approaches 0, Ar approaches 1 as

approaches , Ar approaches 0.

The noise picked up by the circuit is usually of high frequency, whereas, the output
signal due to bite force is considered at almost zero frequency. The low pass filter therefore
attenuates noise and permits the signal due to bite force to pass through.
The force produced due to biting results in a voltage output at the amplifier circuit. The
force - voltage relationship has to be calibrated so that a definite relationship between the
applied biting force and the voltage output is established.

20

3.3. Final Circuit

Figure-3.5 Final Circuit diagram

The components that have been used in the circuit have been briefly described.

3.4. Data Card (PCI-6024E)

The PCI-6024E features 16 channels of analog input, two channels of analog output, a
8-pin connector and eight lines of digital I/O. The board uses the National Instruments DAQSTC system timing controller for time-related functions. The DAQ-STC consists of three
timing groups that control analog input, analog output, and general-purpose counter/timer
functions. These groups include a total of seven 24-bit and three 16-bit counters and a
maximum timing resolution of 50 ns. The DAQ-STC makes possible such applications as
buffered pulse generation, equivalent time sampling, and seamless changing of the sampling
rate.
With other DAQ boards, we cannot easily synchronize several measurement functions
to a common trigger or timing event. This board has Real-Time System Integration (RTSI)
bus to solve this problem. The RTSI bus consists of the National Instruments RTSI bus
interface and a ribbon cable to route timing and trigger signals between several functions on
as many as five DAQ boards in computer.
These boards can interface to an SCXI systemthe instrumentation front end for plugin DAQ boardsso that you can acquire analog signals from thermocouples, RTDs, strain
gauges, voltage sources, and current sources. You can also acquire or generate digital signals
for communication and control.

21

Figure-3.6 I/O Connector Pin Assignment for the PCI-6024E

22

Signal Name Reference

Direction

Description
Analog Input GroundThese pins are the reference
point for single-ended measurements in RSE
configuration and the bias current return point for
differential measurements. All three ground
referencesAIGND, AOGND, and DGNDare
connected together on your board.
Analog Input Channels 0 through 15Each channel
pair, ACH<i, i+8> (i = 0..7), can be configured as
either one differential input or two single-ended
inputs.
Analog Input SenseThis pin serves as the reference
node for any of channels ACH <0..15> in NRSE
configuration.
Analog Channel 0 OutputThis pin supplies the
voltage output of analog output channel 0.
Analog Channel 1 OutputThis pin supplies the
voltage output of analog output channel 1.
Analog Output GroundThe analog output voltages
are referenced to this node. All three ground
referencesAIGND, AOGND, and DGNDare
connected together on your PCI E Series board.
Digital GroundThis pin supplies the reference for
the digital signals at the I/O connector as well as the
+5 VDC supply. All three ground references
AIGND, AOGND, and DGNDare connected
together on your PCI E Series board.
Digital I/O signalsDIO6 and 7 can control the
up/down signal of general-purpose counters 0 and 1,
respectively.
Port A bidirectional digital data lines for the 82C55A
programmable peripheral interface on the PCI-6025E.
PA7 is the MSB. PA0 is the LSB.
Port B bidirectional digital data lines for the 82C55A
programmable peripheral interface on the PCI-6025E.
PB7 is the MSB. PB0 is the LSB.
Port C bidirectional digital data lines for the 82C55A
programmable peripheral interface on the PCI-6025E.
PC7 is the MSB. PC0 is the LSB.

AIGND

---

---

ACH
<0..15>

AIGND

Input

AISENSE

AIGND

Input

DAC0OUT1

AOGND

Output

DAC1OUT1

AOGND

Output

AOGND

---

---

DGND

---

---

DIO<0..7>

DGND

Input or
Output

PA<0..7>2

DGND

Input or
Output

PB<0..7>2

DGND

Input or
Output

PC<0..7>2

DGND

Input or
Output

+5V

DGND

Output

+5 VDC SourceThese pins are fused for up to 1

A of +5 V supply. The fuse is self-resetting.

Table 3.1 I/O Connector Signal Descriptions

23

3.5 Pins of Interest

The signal from Wheatstone bridge is of order of tens of millivolt, so it is amplified
using OpAmp (OP07CP) amplifier circuit. Output of amplifies circuit is directly given to
Analog Input Pins of data card. The following pins can be used for analog input in data card :
ACH0 (PIN 68)

ACH1 (PIN 33)

ACH2 (PIN 65)

ACH3 (PIN 30)

ACH4 (PIN 28)

ACH5 (PIN 60)

ACH6 (PIN 25)

ACH7 (PIN 57)

ACH8 (PIN 34)

ACH9 (PIN 66)

ACH10 (PIN 31)

ACH11 (PIN 63)

ACH12 (PIN 61)

ACH13 (PIN 26)

ACH14 (PIN 58)

ACH15 (PIN 23)

ACH<i, i+8> forms analog input pair. Analog signal can be given to data card in
Differential mode or two single-ended mode.
We have used ACH8 (PIN 34) to acquire signal to LabVIEW via Data card. This signal
is given in reference to AIGND (PIN 24 : Analog Input Ground).

24

CHAPTER 4

LABVIEW PROGRAMS
LabVIEW (short for Laboratory Virtual Instrumentation Engineering Workbench) is a
graphical programming environment used to develop sophisticated measurement, test, and
control systems using intuitive graphical icons and wires that resemble a flowchart. It offers
integration with thousands of hardware devices and provides hundreds of built-in libraries for
advanced analysis and data visualization.
4.1. Graphical programming
LabVIEW ties the creation of user interfaces (called front panels) into the development
cycle. LabVIEW programs/subroutines are called virtual instruments (VIs). Each VI has three
components: a block diagram, a front panel and a connector panel. The last is used to
represent the VI in the block diagrams of other, calling VIs. Controls and indicators on the
front panel allow an operator to input data into or extract data from a running virtual
instrument. However, the front panel can also serve as a programmatic interface. Thus a
virtual instrument can either be run as a program, with the front panel serving as a user
interface, or, when dropped as a node onto the block diagram, the front panel defines the
inputs and outputs for the given node through the connector panel. This implies each VI can
be easily tested before being embedded as a subroutine into a larger program.
The graphical approach also allows non-programmers to build programs by dragging
and dropping virtual representations of lab equipment with which they are already familiar.
4.2 Program used in project
The LabVIEW programs for the project can be divided into three modules for
simplicity and better understanding. These are:
(a) Data Acquisition Module
(b) Trigger Mechanism Module
(c) Data Processing and Display Module
Figure 4.1 shows the complete LabVIEW program where all the modules work in
correlation to produce the result.
Figure 4.2 shows the Front Panel which is user interface part of the program. This panel
interacts with user to take input and display results in form of text and Graphs.
Figure 4.3 shows the Data Acquisition Module which is responsible for reading data
coming from Amplifier circuit to Analog Input Pins in Data Acquisition Card.
Figure 4.4 shows the Trigger Module which is responsible to trigger the start of Data
Acquisition according to user as the use command and to allow data recording only for
specified period of time.
25

Figure 4.5 shows the Data Processing and Display Module which is responsible for
processing data coming from Data Acquisition Module, process the data according to signal
coming from Trigger Module and Displaying the results.

Figure 4.1 LabVIEW working program containing all the modules.

The program uses several sets of sub-VI, each explained later in this chapter. The
different functionality of program can be divided in three groups for the ease of understanding
of programming. Dividing programs in smaller modules helps the simplification of program
and ease of dubbing in an error occurs. The modules have been discussed below.

26

Figure 4.2 Front panel showing User Interface.

4.2.1 Data Acquisition Module

Figure 4.3 Data Acquisition Module

Work of this module is to read analog signal from data card though proper channel. The
input channel to be used for the acquisition of data via data card is specified in this module by
the use of proper built-in sub-VI. For the acquisition of data via data card several parameters
27

are needed to be specified explicitly such as physical channel, maximum and minimum value
of inputs, sample rate, sample per channel, sample mode and timeout.
The different sub-VIs used(in sequence) in this module are:

DAQmx Create Virtual Channel

DAQmx Timing
DAQmx Start
DAQmx Read

4.2.2 Trigger Module

Figure 4.4 Trigger Module to trigger the Recording when commanded by user.

Work of this module is mainly to control start-stop of data acquisition and control of
display of signal. In this user gives input to program to start with the help of a push button
provided in front panel. This triggers the program to start. This module keeps track of time
passed since the user pressed the push button and stops the data acquisition and display when
the timer runs out. The time window can be specified by the user using text-box provided in
the user interface or front panel. The user input the time window(in second) for which he/she
want to record the bite force history.

28

The different components used in this module are:

Select
Formula Node
Equal?
String indicator
String control
Tick Count (ms)
Feedback Loop

4.2.3 Data Processing and Display Module

Figure 4.5 Data Processing and Display Module

This module work to process the data coming from Data Acquisition Module when "go
signal" is provided by "trigger module". The signal coming from Data Acquisition Module is
processed upon to find the maximum voltage signal within the time window provided by the
user. The different components used in this module are :

Waveform Chat
Array To Matrix
Array Max & Min

29

4.3. Sub-VIs and components

4.3.1. DAQmx Create Virtual Channel

Figure 4.6 DAQmx Create Virtual Channel

The NI-DAQmx Create Virtual Channel function creates a virtual channel and adds it to
a task. It can also be used to create multiple virtual channels and add all of them to a task.
When a task is not specified, the function creates a task. The NI-DAQmx Create Virtual
Channel function has numerous instances. These instances correspond to the specific type of
measurement or generation the virtual channel(s) perform.
Creating a Channel in LabVIEW:
The inputs to the NI-DAQmx Create Virtual Channel function differ for each instance
of the function. However, certain inputs are common to most, if not all, of the function's
instances. For example, an input is required to specify the physical channels (analog input and
analog output), lines (digital), or counter that the virtual channel(s) will use. Additionally,
analog input, analog output, and counter operations use minimum value and maximum
value inputs to configure and optimize the measurements and generations based on the
minimum and maximum expected values of the signals. Furthermore, a custom scale can be
applied to many types of virtual channels.
The parameters used in projects are:
Minimum value: -10 V
Maximum value: 10 V
Physical Channel: Dev1/ai8
Mode: "AI Voltage"

30

4.3.2. DAQmx Timing

Figure 4.7 Sample Clock VI

The NI-DAQmx Timing function configures the timing for hardware-timed data
acquisition operations. This includes specifying whether the operation will be continuous or
finite, selecting the number of samples to acquire or generate for finite operations, and
creating a buffer when needed.
For operations that require sample timing (analog input, analog output, and counter),
the Sample Clock instance of the NI-DAQmx Timing function sets both the source of the
sample clock, which could be an internal or external source, and its rate. The sample clock
controls the rate at which samples are acquired or generated. Each clock pulse initiates the
acquisition or generation of one sample for each virtual channel included in the task.
The parameters used in this project are:
Rate: 1000
Samples per channel: 1000
Sample Mode: Finite Sample
Clock Mode: Sample Clock(Analog/Counter/Digital)

4.3.3. DAQmx Start

Figure 4.8 DAQmx Start VI

The state model used by NI-DAQmx eliminates unnecessary reconfiguring to obtain a
high level of efficiency and maximize performance. This state model consists of five states in
which a task can reside. The NI-DAQmx Start Task function explicitly transitions a task to
the running state. In the running state, the task performs the specified acquisition or
generation. A task will be implicitly transitioned to the running state, or automatically started,
if the NI-DAQmx Start Task function is not used, when the NI-DAQmx Read function
executes. This implicit transition also occurs if the NI-DAQmx Start Task function is not used
and the NI-DAQmx Write function executes with its auto start input specified accordingly.

31

Although it is not always required, using the NI-DAQmx Start Task function to
explicitly start a task involving a hardware-timed acquisition or generation is preferred.
Furthermore, if the NI-DAQmx Read function or the NI-DAQmx Write function will be
executed multiple times, such as in a loop, the NI-DAQmx Start Task function should also be
used. Otherwise, the task performance will be reduced because it will be repeatedly started
and stopped.
4.3.4 DAQmx Read

Figure 4.9 DAQmx Read VI

The NI-DAQmx Read function reads samples from the specified acquisition task. The
different instances of the function allow for the type of acquisition (analog, digital, or
counter), the number of virtual channels, the number of samples, and the data type to be
selected. After the specified number of samples have been transferred from the FIFO on the
DAQ board to the PC Buffer in RAM, the NI-DAQmx Read function moves samples from the
PC Buffer to the Application Development Environment (ADE) Memory.
Instances of the NI-DAQmx Read function that are capable of reading multiple samples
include an input to specify the number of samples per channel to read when the function
executes. For finite acquisitions, by specifying a number of samples per channel of -1, the
function waits for all of the requested samples to be acquired and then reads these samples.
Specifying a number of samples per channel of -1 for a continuous acquisition results in the
function reading all of the samples that are currently available in the buffer when the function
executes.
The parameters used in this project:
Timeout: 10000

4.3.5. Select

Figure 4.10 Select function

Returns the value wired to the t input or f input, depending on the value of s. If s is
TRUE, this function returns the value wired to t. If s is FALSE, this function returns the value
wired to f.

32

4.3.6. Formula Node

Figure 4.11 Formula Node

Evaluates mathematical formulas and expressions similar to C on the block diagram.
The following built-in functions ate allowed in formulas: abs, acos, acosh, asin, asinh, atan,
atan2, atanh, ceil, cos, cosh, cot, csc, exp, expm1, floor, getexp, getman, int, intrz, ln, lnp1,
log, log2, max, min, mod, pow, rand, rem, sec, sign, sin, sinc, sinh, sizeOfDim, sqrt, tan, tanh.
4.3.7. Equal?

Figure 4.12 Equal Function

Returns TRUE if x is equal to y. Otherwise, this function returns FALSE. The
comparison mode of this function can be changed.
If you compare two matrices, the default comparison mode is Compare Aggregates, and
this function returns a scalar. Comparing an array or cluster of a data type to a scalar of the
same data type produces an array or cluster of Boolean values. The connector pane displays
the default data types for this polymorphic function.
4.3.8. Waveform Chart

Figure 4.13 Waveform Chart (display)

The waveform graph displays one or more plots of evenly sampled measurements. The
waveform graph plots only single-valued functions, as in y = f(x), with points evenly

33

distributed along the x-axis, such as acquired time-varying waveforms. The following front
panel shows an example of a waveform graph.
The waveform graph can display plots containing any number of points. The graph also
accepts several data types, which minimizes the extent to which you must manipulate data
before you display it.
4.3.9. Tick Count (ms)

Figure 4.14 Tick Counter

Returns the value of the millisecond timer.
The base reference time (millisecond zero) is undefined. That is, you cannot convert
millisecond timer value to a real-world time or date. The value of the millisecond timer wraps
from (2^32)1 to 0.

34

CHAPTER 5

CALIBRATION

The force produced due to biting results in a voltage output at the amplifier circuit. The
force - voltage relationship has to be calibrated so that a definite relationship between the
applied biting force and the voltage output is established.
5.1. Steps of calibration
A dead weight tester has been designed and fabricated for calibration of the
gnathodynamometer. The tester was designed for loads up to 40 kg. Weight masses of 5, 10,
15 and 20 kg have been used. The tester has been fabricated out of wood for the following
reasons. Wood is light, low in cost, easily machineable and has good load carrying capacity.
The parts of the dead weight tester are indicated in Fig. 5.1. The fork is placed between the
base and the bottom end of the rod. Weights are then added at the platform on the top. Force
is thus transmitted to the desired location on the fork through the loading edge. Weights are
progressively increased and corresponding voltage output readings are recorded.

Figure-5.1 Dead weight tester for calibrating the gnathodynamometer.

35

The resulting relationship between the applied forces and the voltages yields the curve
for calibration. Any unknown force applied to the ends of the prongs on the fork can be
determined from the load-voltage relationship established during calibration.
The strain gauges on the fork are connected to the Wheat stone bridgeamplifierfilter
circuit. Regulated DC supply of 5V is applied to the circuit. Output of the circuit is
connected to the oscilloscope, which displays the output wave form. The scale on both axes
of the oscilloscope is then set.

Figure-5.2 Experimental setup

Calibration of the gnathodynamometer has been done up to 196 N. The calibration

curve is discussed in the following section.
5.2. Calibration
The values of voltage outputs for various input loads are plotted in the Fig. 5.3.

Force (N)
voltage (mV)
49
40
98
60
147
85
196
118
Table-5.1 Calibration results

36

Calibration Result
140
120

Voltage (mV)

100
80
60
40
20
0
0

50

100

150

200

250

Force (N)
Figure-5.3 Calibration of Gnathodynamometer. The output voltage is calibrated against
known forces.

The loads applied on the fork are tabulated in Table 5.1. These vary from 49 N to 196N.
Corresponding output voltages vary from 40 mV to 118 mV. The relationship between
applied load and output voltage is linear.

37

CONCLUSIONS
The design, interfacing and calibration of gnathodynamometer in this project are meant
for the purpose of measuring the biting force of patient, to be used by a dental surgeon. The
dental force helps to reflect the success of diagnostic methods being applied. By comparing
the bite before and after the diagnosis at different position in teeth a proper conclusion can be
made
The project uses National Instrument's Data Card (model: PCI-6024E) to acquire analog
signal from Amplifier Circuit Board. The Data card is equipped with 16 channels for analog
input. These are the input pins that can be used for taking analog signal without any
requirements of external ADC as the data card has built-in Analog-to-Digital converter
installed, which is necessary for the direct analog acquisition of signals. The project uses
LabVIEW software, developed by National Instrument, to process and display the calibrated
form of signal to the user in form of Graphs and Text Outputs.
A proper user interface has been designed in the program for ease in use of the software
by any user. User is provided with information like Bite Force History and Maximum Bite
Force over a specified period of time. The time window for measuring the bite force can be
changed by user according to his need, the default value is set as 7 second. This value has
been used after measuring the average time taken by a user to apply the bite force and a
minimum time is provide for the circuit to stabiles and provide a correct reading. According
to design criteria a maximum of 600N force is allowed on gnathodynamometer. The main
components namely: fork, circuit (for amplification and signal acquisition) and LabVIEW
program has been explained in detail. The circuit comprises of Wheatstone bridge, amplifier,
input offset correction circuit and LabVIEW program.
Further this project can be extended so that the signal acquisition is done without using
NI's data card so that a normal user can use the device without being have to install the NI's
data card which may be costly on user end.

38

APPENDIX-A
OPERATIONAL AMPLIFIER
A.1. Features of OP07
low voltage - 25V max
Low Vos drift - .6V/C max
Ultra stable vs time 1.0V/month/max
Low noise

- .60Vp-p max

Wide input voltage range - 14V

Wide supply voltage range - 3V to 18V
Fits 725,741,108A/308A,741,AD510 sockets
125C temperature-tested dice
A.2. General description of OP07
The OP-07 has very low input offset voltage (25V max for OP-07A) which is obtained
by trimming at the wafer stage. These low effect voltages generally eliminate any need for
external nulling. The OP07 is particularly useful for high gain instrumentation applications.
The wide input voltage range of 13V minimum combined with high CMRR of dB
(OP_07A) and high input impedance provides high accuracy in the non-inverting circuit
Configuration. Excellent linearity and gain accuracy can be maintained even at high closed
loops gains. Stability of offsets and gain with time and variation in temperature is excellent.
The accuracy and stability of OP07, when at high gain, combined with the freedom from
external nulling have made the OP07 a new industry standard for instrumentation and military
applications.
The OP07 is available in five standard performance grades. The OP07A and OP07 are
specified for operation over the full military range of -55C to 125C the OP07E is specified
for operation over at the 0C to +70C range, and OP07C and Dover the -40C to +85C
temperature range. The OP07 is available in hermitically sealed TO-99 metal can or ceramic
8 pin mini-DIP, and in epoxy 8-pin Mini DIP. It is a direct replacement of 725,108A and
OP05 amplifiers 741 types may, be directly replaced by removing the 741s nulling

39

potentiometer. The OP207, a dual OP07, is available for applications requiring close
matching of two OP07 amplifiers.

Figure-A.1 8-pin Mini DIP

A.3. Pin connections

Figure-A.2 Pin connections

A.4. Absolute maximum ratings
Symbol

Parameter

Value

Unit

VCC

Supply Voltage

22

Vid

Differential input voltage

30

Vi

Input Voltage

22

Toper

Operating Temperature

-40 to +105

Tstg

Storage Temperature

-65 to +150

Table-A.1 Absolute maximum ratings

40

C
C

APPENDIX-B
POTENTIOMETER

B.1. Technical specification of 3006 103 model potentiometer

Property

Value

Power rating

750mw

Resistance

10.0k

Voltage ratio(DC)

500V

Weight

1.13g

Operation temperature

-55.0C

Resistance tolerance

-10.0% to 10.0%

Colour

Blue

Lead free status

Contains Lead

Mounting type

Through hole

Packaging

Tube

ROHS

Non compliant

Termination style

Radial
Table-B.1 Specification of 3006 103 model potentiometer

Figure-B.1 Potentiometer

41

B.2. Common dimensions

Dimension are in mm/inches

Figure-B.2 Potentiometer dimensions

42

APENDIX-C

DATA CARD SPECIFICATION

C.1. Input Characteristics
Number of channels :

16 single-ended or 8 differential

(software-selectable per channel)

Type of ADC :
Resolution :
Sampling rate :
Input signal ranges :
Input coupling :
Max working voltage :
(Signal + common mode)
FIFO buffer size :
Data transfers :

Successive approximation
12 bits, 1 in 4,096
200 kS/s guaranteed
Bipolar only
DC
Each input should remain within
11 V of ground
512 S
DMA, interrupts,

Programmed I/O
DMA modes :

Scatter-gather

(Single transfer, demand transfer)

Configuration memory size :

512 words

43

REFERENCES
1. http://www.ptc.com/
2. http://www.ni.com/
3. http://www.wikipedia.com/
4. Saxena, Ambuj (2011), Design and Development of an Instrument for
Measurement of Biting Force in Human Beings
5. Gutkin, V. I. and Osipovich, L. A. (1990), Devices for measuring the force of
dental bite (Gnathodynamometer).
6. Brawley, R. E., and Sedgwick, H. J.(1938): J. Orthodontics 24: 256.
7. Howell, A.H. and Manly, R.S. (1948, 1948); 27: 705, An Electronic Strain
Gauge for Measuring Oral Forces.
8. Worner, H. K.(1939) : Australian J. Dent.43: 381.
9. Baker, C. R., Brekhus, P. J., and Dowell, R. L.(1940): J. D. Res. 19: 314.
10. Koehler, L., and Etling, O.(1922) : Zeitschr. f. Stom.20: 11.

44