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Chapter 3 The PN Junction

3.1
3.2
3.3
3.4
3.5
3.6

PN-Junction Electrostatics
I-V Characteristic
Dynamic Behavior
Diode Circuit Models
Diode Applications and Circuits
SPICE Analysis

Literature:
Pierret, Chapter 5-7
Jaeger Blalock, Chapter 3
Acknowledgement Oliver Brand for slides
ECE 3040: Chapter 3 PN Junction

The PN Junction
Circuit Symbol
P

I-V Characteristic

Forward Bias
Reverse Bias

I = Is eqVA / kT 1

ECE 3040: Chapter 3 PN Junction

3.1 PN Junction: Electrostatics


3.1.1 PN Junction Basics
Junction Approximations
Band Structure
Built-In Potential
3.1.2 Step PN Junction
Equilibrium VA = 0
External Bias VA 0
Pierret, Chapter 5, page 195-226

ECE 3040: Chapter 3 PN Junction

3.1.1 PN Junction Basics


Net Doping
ND N A

Pierret, Fig. 5.1


Example: Diffusion of acceptor atoms (e.g. boron) in n-substrate
Metallurgical junction at NA = ND or ND NA =0
ECE 3040: Chapter 3 PN Junction

Doping Profile Approximations


for PN Junctions
Step Junction

Linearly Graded Junction

Pierret, Fig. 5.2


Approximations for doping profile in pn junctions:
Step Junction: approximation for ion implantation or shallow
diffusion into lightly doped wafer
Linearly Graded Junction: approximation for deep diffusion in
moderately to heavy doped wafer
ECE 3040: Chapter 3 PN Junction

PN Junction
Band Diagram
Equilibrium requires the Fermi
level to be constant across the
device
Regions far away from the
metallurgical junction will be
unaffected
Electrons diffuse from n- to pside, holes from p- to n-side,
leaving behind unbalanced
dopant site charges
This space charge creates an
electric field (band bending),
resulting in a carrier drift
balancing the carrier diffusion
(Jtot = 0)
Pierret, Fig. 5.3
ECE 3040: Chapter 3 PN Junction

qVbi

PN Junction
Band Diagram
Equilibrium requires the Fermi
level to be constant across the
device
Regions far away from the
metallurgical junction will be
unaffected
Electrons diffuse from n- to pside, holes from p- to n-side,
leaving behind unbalanced
dopant site charges
This space charge creates an
electric field (band bending),
resulting in a carrier drift
balancing the carrier diffusion
(Jtot = 0)
Pierret, Fig. 5.5
ECE 3040: Chapter 3 PN Junction

PN Junction Built-in Potential


The built-in potential can
be calculated from the
band diagram:
Vbi =

1#
E EF
q %$ i

)pside + (EF Ei)nside &('

Pierret, Fig. 5.4

With the results from Chapter 2.5

p = NA = ni e(Ei EF )/ kT p side with NA >> ni


n = ND = ni e(EF Ei )/ kT n side with ND >> ni

we obtain

" NA %
" ND % + kT (NAND +
1(
Vbi = *kT ln$ ' + kT ln$ ' - =
ln*
2
q)
# ni &
# ni & , q * n ) i ,
ECE 3040: Chapter 3 PN Junction

PN Junction Depletion Approximation

To obtain quantitative solutions for


the electrostatic variables, the
Poisson equation needs to be
solved:

q p n + ND NA

=
=
K s 0
K s 0

This requires the knowledge of the


charge distribution, which itself (n
and p) is influenced by the potential
The depletion approximation is
often used to approximate the charge
distribution:
1. The carrier concentration n and
p is negligible in the depletion
region, i.e. for -xp x xn
2. The charge density outside the
depletion region is zero
ECE 3040: Chapter 3 PN Junction

Pierret, Fig. 5.6

Electrostatics
From charge distribution to
electric field:

=
or in 1D
=
K s 0
dx K s 0
(x)

Example:
Step Junction

1
d = (x) =
K s0

(x) dx

From electric field to electrostatic


potential:

Pierret, Fig. 5.9

dV
= V or in 1D =
dx
V(x)

dV = V(x) =

(x) dx

ECE 3040: Chapter 3 PN Junction

10

3.1.2 Step Junction: VA = 0


Assuming depletion approximation
and a step junction, the charge
density in the depletion region is

% qNA
'
= &+qND
' 0
(

xp x 0
0 x xn
x < xp or x > xn

The electric field is obtained by


integration

(x)
d =
0

1
K s 0

(x) dx

with the boundary conditions


(-xp) = (xn) = 0

Pierret, Fig. 5.9

ECE 3040: Chapter 3 PN Junction

11

Step Junction with VA = 0


Resulting electric field:

% qNA
'' K xp + x
(x) = & s 0
' qND xn x
'( K s 0

xp x 0

0 x xn

The electric potential is obtained by


a second integration

V(x)

Pierret, Fig. 5.9

dV = (x) dx

with the boundary conditions


V(-xp) = 0 and V(xn) = Vbi

ECE 3040: Chapter 3 PN Junction

12

Step Junction: Charge Considerations


The electric field must be continuous at x = 0, yielding:

qNA
qND

xp =
xn
K s 0
K s 0
qNA xp = qND xn
This constitutes that the total charge within the
depletion region must sum to zero, i.e. the positive
charge
on the n-side is balanced by the negative
charge on the p-side of the junction
This overall charge neutrality is a direct consequence
of the assumption that the electric field vanishes
outside the depletion region, as follows from Gauss
law
ECE 3040: Chapter 3 PN Junction

13

Step Junction with VA = 0


Resulting electric potential:
2
%
qNA
x
+
x
p
'' 2K
s 0
V(x) = &
'Vbi qND xn x 2
'(
2K s 0

xp x 0
0 x xn

The electric potential is continuous at


x = 0, yielding:

qNA 2
qND 2
xp = Vbi
x
2K s 0
2K s 0 n

Pierret, Fig. 5.9

Together with the charge neutrality


relationship NA xp = ND xn, this
equation can be used to determine xn
and xp
ECE 3040: Chapter 3 PN Junction

14

Step Junction Depletion Layer Width


We obtain for xn and xp:
2K s 0
NA
xn =
Vbi
q ND NA + ND

xp =

2K s 0
ND
Vbi
q NA NA + ND

Thus, the depletion layer width W is

2K s 0 NA + ND
W = xn + xp =
Vbi
q
NAND
ECE 3040: Chapter 3 PN Junction

15

Step Junction
with VA 0

Pierret, Fig. 5.12

Assumption: Externally
applied voltage VA is
completely dropped
across the depletion
region
I.e., negligible voltage
drop at contacts and
across the quasi-neutral
regions
p

VA > 0: Reduces potential


step across junction

n
+

VA

VA < 0: Increases potential


step across junction

ECE 3040: Chapter 3 PN Junction

16

Step Junction
with VA 0
Forward Bias VA > 0:
Potential drop across
the depletion region
decreases; majority
carrier diffusion
dominates, resulting in a
large forward current
flow
Reverse Bias VA < 0:
Potential drop across
the depletion region
increases; minority
carrier drift dominates,
resulting in a small
reverse current flow
ECE 3040: Chapter 3 PN Junction

Pierret, Fig. 5.12

17

Step Junction with VA 0

Bias VA can be implemented in equations by


replacing Vbi with Vbi VA:

2K s 0 NA + ND
W=
Vbi VA
q
NAND

Pierret, Fig. 5.11

Forward Bias VA > 0


Reduced depletion layer width
Reduced space charge
Reduced electric field
Reduced potential drop across junction
Reverse Bias VA < 0
Increased depletion layer width
Increased space charge
Increased electric field
Increased potential drop across junction
ECE 3040: Chapter 3 PN Junction

18

3.2 PN Junction: I-V Characteristic


3.2.1 Qualitative Derivation
3.2.2 Quantitative Derivation
Minority Carrier Distribution
Minority Carrier Currents
I-V Characteristic
Saturation Current
3.2.3 Junction Breakdown
Avalanche Breakdown
Zener Breakdown
Pierret, Chapter 6.1, page 235-259

ECE 3040: Chapter 3 PN Junction

19

3.2.1 Qualitative Derivation


(a) Equilibrium
Under equilibrium, the
net current flow is zero,
i.e. the electron/hole
drift and diffusion
currents balance each
other

J = Jdrift + Jdiff = 0

Pierret, Fig. 6.1


Electron Currents:
Majority carrier diffusion current from n- to p-side
Minority carrier drift current from p- to n-side
Hole Currents:
Majority carrier diffusion current from p- to n-side
Minority carrier drift current from n- to p-side
ECE 3040: Chapter 3 PN Junction

20

Qualitative Derivation
(b) Forward Bias
Forward bias (VA > 0)
reduces the potential
drop across the
depletion region
As a result, the majority
carrier (electron and
hole) diffusion over the
potential hill increases
exponentially, resulting
in a net current flow
across the junction
The minority carrier
drift currents remain
constant
ECE 3040: Chapter 3 PN Junction

Majority carrier
density decreases
exponentially with
increasing energy

n(E)
p(E)

Pierret, Fig. 6.1


21

Qualitative Derivation
(c) Reverse Bias
Reverse bias (VA < 0)
increases the potential drop
across the depletion region
As a result, the majority
carrier (electron and hole)
diffusion current over the
potential hill is suppressed
for VA > few kT
The minority carrier drift
currents remain constant,
thus resulting in a
saturation current flowing in
reverse direction
Pierret, Fig. 6.1
ECE 3040: Chapter 3 PN Junction

22

3.2.2 Quantitative Derivation


Solution Strategy
1. Calculate the minority carrier concentration in the
quasineutral regions on the p- and n-side of the
junction by solving the continuity equation
2. Calculate the minority carrier current densities at
the edges of the depletion region x = xn
and x = -xp
3. Calculate the total current density flowing through
the diode by adding the hole and electron minority
carrier density, assuming no generation/
recombination effects in the depletion region

ECE 3040: Chapter 3 PN Junction

23

1-D Continuity and Current Equations


1-D Current Density Equation
dp
dx
dn
Jn = q n n + q Dn
dx

Jp = q p p q Dp

1-D Continuity Equation


np (x,t)
t

2np

np np0

= +np n
+ n
+ Dn 2 + GL
x
x
n
x
np

pn (x,t)
pn
2pn
pn pn0

= pn p
p
+ Dp 2 + GL
t
x
x
p
x

Which terms do we have to consider?


ECE 3040: Chapter 3 PN Junction

24

PN Junction: IV Characteristic
Assumptions for Quantitative Derivation

Steady state conditions


Non-degenerately doped step junction
One-dimensional pn-junction
Low-level injection in quasineutral regions
No generation/recombination processes other than
thermal recombination/generation in the diode

=0
Quasineutral
p-region

0
xp

=0
xn

Depletion
region

Quasineutral
n-region

x
ECE 3040: Chapter 3 PN Junction

25

PN Junction: IV Characteristic
Continuity Equation
Continuity equation for quasineutral regions
Steady state (dpn/dt = dnp/dt = 0)
No E-field, i.e. all drift terms are zero
No R-G other than thermal R-G (e.g., GL = 0)
0 = Dn
0 = Dp

d2 np
2

dx#
d2 pn
2

dx

np
n

= Dn

d2np
2

dx#
d2pn

np np0
n

pn
p pn0
= Dp
n
p
p
dx2

for x# 0
for x 0

with np = np0 + np and pn = pn0 + pn

ECE 3040: Chapter 3 PN Junction

26

PN Junction: IV Characteristic
Minority Carrier Concentration
General solution
np (x#) = A e x# / Ln + Bex# / Ln
pn (x) = Ce

x / Lp

+ De

x / Lp

for x# 0
for x 0

with Ln = Dn n and Lp = Dp p

Boundary conditions at ohmic contacts:


Assumption: wide quasineutral regions, i.e.

(
)
pn ( x ) = 0

np x# = 0 B = 0
D=0

ECE 3040: Chapter 3 PN Junction

27

PN Junction: IV Characteristic
Minority Carrier Concentration
Boundary conditions at edge of depletion region:
kT NAND kT pp0nn0
Vbi =
ln
=
ln
2
q
q
ni
ni2

pp0 np0 =ni2

kT nn0
ln
q np0

nn0 = np0 eqVbi / kT

Assumption: Equation is true also for applied VA!

Vbi Vbi VA

q Vbi VA / kT

nn = np e
np = nn e

q Vbi VA / kT

weak injection

nn nn0

nn0 eqVbi / kT eqVA / kT


!#
#"##
$

ECE 3040: Chapter 3 PN Junction

=np0
28

PN Junction: IV Characteristic
Minority Carrier Concentration
Boundary conditions at edge of depletion region (cont.):

np = np0 eqVA / kT
pn = pn0 eqVA / kT

and similar

qV /kT
np = np0 #$e A 1%& at x p , i.e. x' = 0

or

qVA /kT
#
pn = pn0 $e
1%& at + x n , i.e. x = 0

A = np0 eqVA / kT 1

ECE 3040: Chapter 3 PN Junction

and C = pn0 eqVA / kT 1

29

Minority Carrier
Concentration

Forward Bias

Reverse Bias

ECE 3040: Chapter 3 PN Junction

30

Thus, the minority


carrier distributions
in the quasi-neutral
regions become:
np (x#) = np0

eqVA / kT 1 e x# / Ln

pn (x) = pn0

eqVA / kT 1 e

x / Lp

PN Junction: IV Characteristic
Minority Carrier Concentrations

Forward Bias

Reverse Bias
Pierret, Fig. 6.8
ECE 3040: Chapter 3 PN Junction

31

PN Junction: IV Characteristic
Diffusion Current Densities
The minority carrier diffusion currents in the
quasineutral regions can be derived from the minority
carrier distributions by
Jn (x") = +qDn

dnp
dx"

qDnnp0
Ln

qDppn0
dpn
Jp (x) = qDp
=+
dx
Lp

[
[e

]
1] e

eqVA / kT 1 e x" / Ln
qVA / kT

x / Lp

Thus, at the edges of the depletion region

Jn x = xp = Jn (x# = 0) = +

Jp x = +xn = +Jp (x = 0) = +

qDnnp0
Ln

qDppn0
Lp

ECE 3040: Chapter 3 PN Junction

[
[e

]
1]

eqVA / kT 1
qVA / kT

32

PN Junction: IV Characteristic
Diffusion Current Densities
Pierret, Fig. 6.7

ECE 3040: Chapter 3 PN Junction

33

PN Junction: IV Characteristic
Total Current
Assuming that there is no R-G in the depletion region,
the total current density flowing through the pn
junction is the sum of the minority carrier currents at
the edges of the depletion region

J = Jn x = xp + Jp x = +xn

#qDnnp0 qDppn0 & qV / kT


=%
+
1
( e A
Ln
Lp '
$!#
##"###$
Js

ECE 3040: Chapter 3 PN Junction

]
34

PN Junction: IV Characteristic
Pierret, Fig. 6.6

Reverse Bias VA < 0


For |VA| > few kT/q, a small
saturation current Js is
flowing through the pn
junction

Forward Bias VA > 0


For |VA| > few kT/q, the
current flowing through the
junction increases
exponentially

ECE 3040: Chapter 3 PN Junction

35

PN Junction: Saturation Current


The saturation current density is given by

Js =

qDnnp0
Ln

qDppn0
Lp

qDnni2
LnNA

qDpni2
LpND

The saturation current depends on the intrinsic


carrier concentration ni and, thus, is strongly
temperature and material dependent
The saturation current is dominated by the
contribution from the lower doped side of the junction
in case of asymmetrical junctions

ECE 3040: Chapter 3 PN Junction

36

Real IV Characteristic
Junction Breakdown

Junction Breakdown

Pierret, Fig. 6.9


ECE 3040: Chapter 3 PN Junction

37

3.2.3 Junction Breakdown

Junction or Reverse-Bias Breakdown: current flowing in a pnjunction under reverse bias suddenly increases drastically if reverse
bias is increased over the so-called breakdown voltage VBR;
breakdown process is reversible if the junction is not overheated
(current must be limited)
The breakdown voltage depends on
Junction doping (the non-degenerate doping in case of a n+-p or
p+-n junction)
Temperature
Radius of curvature in case of junctions with curved non-planar
edges because of larger electric fields in the curved edges; this
effect becomes important for shallow junctions
The basic breakdown processes are
Avalanching
Zener process (dominating if VBR < 4.5 Eg/q)
ECE 3040: Chapter 3 PN Junction

38

Breakdown Voltage in Planar p+-n/n+-p Junctions

VBR

1
NB0.75

Avalanche
dominating

Zener
dominating

Doping conc. of lightly doped side!


ECE 3040: Chapter 3 PN Junction

Pierret, Fig. 6.11


39

Avalanche Breakdown
Avalanching Process
Minority carriers in junction
depletion region gain enough
kinetic energy to generate
electron-hole pairs during
an impact; this is called
impact ionization
This way, the
number of carriers
can increase
tremendously,
similar to a snow
avalanche, ultimately causing
a junction breakdown
ECE 3040: Chapter 3 PN Junction

Pierret, Fig. 6.12

40

Zener
Breakdown
Breakdown current due
to quantum mechanical
carrier tunneling in
highly-doped, degenerate
pn-junctions
Physical background:
there is a quantum
mechanical probability
that a particle can tunnel
through a potential
barrier even if its energy
is smaller than the barrier
height
Pierret, Fig. 6.13 & 6.14
ECE 3040: Chapter 3 PN Junction

41

3.3 PN Junction: Dynamic Behavior


Small-Signal Analysis
Equivalent Circuit
Forward-Bias / Reverse-Bias Characteristics
Depletion Layer Capacitance
Diffusion Admittance

Pierret, Chapter 7, page 301-324

ECE 3040: Chapter 3 PN Junction

42

Small-Signal Analysis
Equivalent Circuit
AC current i flowing through
the diode biased by small
AC voltage va superimposed
on DC bias VA
Small-signal admittance Y
consists of capacitive C and
conductive G component:

Y = i / va = G + jC

Equivalent circuit of diode


consists of junction
admittance Y and series
resistance Rs of quasineutral
regions
Pierret, Fig. 7.1 & 7.2
ECE 3040: Chapter 3 PN Junction

43

PN Junction: Small-Signal Behavior


(a) Reverse Bias
Small signal behavior is dominated by junction or depletionlayer capacitance Cj
The junction capacitance Cj arises from majority carrier
(charge) oscillations at the edges of the depletion region
Conductance is very small (i.e., very high resistance)

(b) Forward Bias


With increasing forward bias, the diffusion admittance
Yd = Gd + i Cd dominates the small signal behavior
The diffusion capacitance Cd arises from minority-carrier
(charge) oscillations in the quasineutral regions adjacent to
the depletion region
ECE 3040: Chapter 3 PN Junction

44

Junction
Capacitance
The so-called junction or depletionlayer capacitance originates from
charge oscillations at the edge of
the depletion region caused by the
applied ac voltage va
The capacitance resulting from the
small oscillations of the depletion
region around its steady-state width
W is equivalent to that of a parallel
plate capacitor with width W
Cj =

dQ(VA ,va ) K s 0 A
=
dva
W(VA )

Pierret, Fig. 7.4

ECE 3040: Chapter 3 PN Junction

45

Junction Capacitance Cj
Junction capacitance Cj depends on the applied dc bias VA,
because the depletion layer width W is a function of VA; in case
of a step junction, the depletion layer width becomes

W=
Cj =

2K s 0 NA + ND
Vbi VA
q
NAND

K s 0 A
=
W(VA )

K s 0 A
2K s 0 NA + ND
Vbi VA
q
NAND

Characteristics of Cj
Cj originates from majority carrier oscillations
C decreases with increasing reverse bias -V

j
A
Varactor diodes use Cj as voltage-controlled capacitor
Majority carrier response time in Si is < 10-10 s, i.e. Cj is
frequency-independent up to very high frequencies
ECE 3040: Chapter 3 PN Junction

46

Junction Capacitance Cj
The junction capacitance Cj can be expressed in terms of its value
Cj0 for VA = 0:

Cj =

K s 0 A

2K s 0 NA + ND
% VA (
V
1
q
NAND bi '& Vbi *)
!###"###$

C j0
% VA (
'1
*
& Vbi )

=C j (Vbi )C j0

The measurement of the junction capacitance is used as diagnosis


tool (C-V measurement) to get an inside view of the junction;
assuming an asymmetric step junction, e.g. ND NA = NB, one
obtains:
1
2
=
Vbi VA
2
2
C j qK s 0 A NB

The linear 1/Cj2 vs. VA relationship has a slope proportional to NB-1


and an intersection with the V-axis at VA = Vbi

ECE 3040: Chapter 3 PN Junction

47

Forward-Bias Diffusion Admittance


The diffusion admittance

YD = GD + jCD

is caused by minority carrier


oscillations in the quasi-neutral
regions adjacent to the
depletion region
Small signal equivalent circuit
of forward-biased pn-junction
consists of
junction capacitance Cj,
diffusion capacitance CD, and
diffusion conductance GD
Minority carrier lifetime limits the
frequency up to which the
minority carriers can follow va
ECE 3040: Chapter 3 PN Junction

Pierret, Fig. 7.8


48

Diffusion Admittance Relationship


AC behavior can be extracted similar to dc behavior from
continuity equations (example: p+-n junction)
Continuity equation for n-side minority carriers

pn (x,t)
2 pn (x,t) pn (x,t)
= Dp

2
t
p
x
with the minority carrier distribution

pn (x,t) = pn (x) + pn (x,) e jt

Using separation of variables, two DEs for the dc and ac terms


result:
2 pn pn
0 = Dp

same as dc
2

x
p

similar to dc
2pn
pn

0 = Dp

p = p /(1+ jp )
but
x2 p / 1+ jp

ECE 3040: Chapter 3 PN Junction

49

Diffusion Admittance Relationship

Boundary Conditions:

v(t) = VA + va e jt
"#$

= va

pn (,t) = 0

ni2 % q( VA + v a ) / kT (
pn (xn ,t) =
e
1
'
*)
ND &

ni2 qVA / kT
ni2 % qVA / kT qv a / kT
(
=
e
1 +
e
e

1
*)
ND
ND '&
"$$#$$% "$$$$#$$$$%

=pn (xn ,) e jt

=pn (xn )

for qva kT, we can simplify using ex 1 + x for small x

pn (xn ,) e jt

qv
=
eqVA / kT a
ND
kT
ni2

ni2 qVA / kT qva

pn (xn ,) =
e
ND
kT
ECE 3040: Chapter 3 PN Junction

50

Diffusion Admittance Relationship


Using the new boundary conditions and the modified minority
carrier lifetime, the ac diffusion current becomes (in analogy to
the dc diffusion current)
DC

Idiff = qA

Dpni2
LpND

eqVA / kT

Dp ni2 qV / kT
1 = qA
e A
1
p ND
!#"#$

=Is

AC

idiff = qA

Dp
p

ni2
1+ jp
ND

%qva qVA / kT (
' kT e
*
&
)

q qVA / kT
= IS e
1+ jp va = YD va
!kT
#
#"##
$
=G0 =

dI
dVA

ECE 3040: Chapter 3 PN Junction

51

Diffusion Admittance Relationship


The diffusion admittance YD for the p+n diode

idiff
YD = GD + jCD =
= G0 1+ jp
va
consists of a conductive part GD and a capacitive part CD

GD =

G0 $
1+ 2 p2 + 1'
)(
2 &%

1/ 2

G0 $
CD =
1+ 2 p2 1'
)(
2 &%

p <<1

G0

1/ 2

p <<1

G0

p
2

CD0

For p = 1 s, we get p = 1 at f = /2 = 160 kHz

ECE 3040: Chapter 3 PN Junction

52

Frequency Dependence of GD and CD

Pierret, Fig. 7.10


ECE 3040: Chapter 3 PN Junction

53

3.4 PN Junction: Diode Models


3.4.1
3.4.2
3.4.3
3.4.4

Load-Line Analysis
Ideal Diode Model
Constant Voltage Drop Model
Breakdown Model

Jaeger & Blalock, Chapter 3.10-3.12, page 96-112

ECE 3040: Chapter 3 PN Junction

54

Diode Circuit Analysis


Establish simple diode
models to facilitate (dc)
analysis of circuits containing
diodes
Example: Series circuit of
voltage source, resistor and
diode
Note: V and R may represent
Thvenin equivalent of more
complicated two-terminal
network
Goal: Find quiescent
operating point or Q-point of
diode

Jaeger, Blalock, Fig. 3.22

V = IDR + VD
What are the values
for VD and ID?

ECE 3040: Chapter 3 PN Junction

55

3.4.1 Load-Line Analysis

Load-Line Analysis =
Graphical analysis if diode
I-V characteristic is only
available in graphical form
Analysis approach:
Write load-line equation

V=10 V
R = 104

V = IDR + VD
10 = ID 10 4 + VD
ID = 104 VD +103

Plot load-line and diode I-V


characteristic
Q-point is defined by
intersection of load line and
diode I-V characteristic

Q-point = (0.95mA, 0.55V)

ECE 3040: Chapter 3 PN Junction

Jaeger, Blalock, Fig. 3.23


56

Load-Line Analysis
The Mathematical Approach
Goal: Find intersection of load line and diode I-V
characteristic using mathematical software package

1
V
ID = VD +
R
R
qVD /kT
"
ID = IS #e
1$%
Given are R = 104 , V = 10 V, IS = 10-13 A and
kT/q = 0.026 V, unknown are VD and ID
The Mathematica function FindRoot yields
VD = 0.597 V and ID = 0.940 mA
ECE 3040: Chapter 3 PN Junction

57

3.4.2 Ideal-Diode Model


Approximation of non-linear diode
characteristic by piece-wise linear
model
Ideal Diode Model =
Approximation with two straightline segments
If diode is forward-biased, voltage
across diode is zero
vD = 0 for iD > 0, i.e. short circuit
If diode is reverse-biased,
current through diode is zero
iD = 0 for vD < 0, i.e. open circuit
Diode is assumed to be either
on or off
Jaeger, Blalock, Fig. 3.26
ECE 3040: Chapter 3 PN Junction

58

Ideal Diode Model


Analysis procedure:
Select model for diode
Identify diode anode (positive
terminal) and cathode (negative
terminal) and label VD and ID
Make (educated) guess on
diode region of operation based
on circuit configuration
Analyze circuit with appropriate
diode model
Check results for consistency
with assumptions

Jaeger, Blalock, Fig. 3.26

What about our simple


example?
Jaeger, Blalock, Fig. 3.27
ECE 3040: Chapter 3 PN Junction

59

Example: Analysis with Ideal-Diode Model

Jaeger, Blalock, Fig. 3.27&28

Voltage source tries to forward-bias diode, so we replace it by


short-circuit (ON state)
V
ID = = 1mA
ID is now easily obtained:

R
VD = 0 V

The current (positive) is consistent with the assumption that the


diode is ON
ECE 3040: Chapter 3 PN Junction

60

3.4.3 Constant Voltage Drop Model


Piecewise linear model
accounting for constant
voltage drop across forwardbiased diode (associated
with turn-on voltage of
diode)
Turn-on voltage
= voltage required to obtain
significant conduction;
typically 0.5-0.7 V
Constant voltage drop (CVD)
model: simulation of diode
by series connection of
ideal diode and voltage
source
ECE 3040: Chapter 3 PN Junction

Jaeger, Blalock, Fig. 3.8

61

Constant Voltage Drop Model

Jaeger, Blalock, Fig. 3.31

If diode is forward-biased, voltage across diode is turn-on


voltage vD = Von for iD > 0, i.e. constant voltage source
If diode is reverse-biased, current through diode is zero
iD = 0 for vD < Von, i.e. open circuit
We choose Von = 0.6 V .
ECE 3040: Chapter 3 PN Junction

62

Example: Analysis with CVD Model

Voltage source tries to


forward-bias diode, so we
replace it by voltage source
(ON state)
ID is again easily obtained:

Jaeger, Blalock, Fig. 3.32

V Von
= 0.94 mA
R
VD = 0.6 V
ID =

ECE 3040: Chapter 3 PN Junction

63

Multi-Diode Circuits

Ideal diode and CVD model


enable hand-analysis of more
complex diode circuits having
two or more diodes
Alternative: SPICE analysis
(see Chapter 3.6)
Example problem: Find Q-points
of both diodes in two-diode
circuit!
Approach: Try all (four) possible
diode states (one after the
other) and check whether
results are consistent with
assumptions
Result (using ideal diode model):
D1 off: (0 mA; 1.67 V)
D2 on: (1.67 mA; 0 V)
ECE 3040: Chapter 3 PN Junction

64

3.5 Diode Applications & Circuits


3.5.1 Temperature Sensors
Diode Temperature Coefficient
PTAT Sensor
3.5.2 Rectifier Circuits
Half-Wave Rectifier Circuits
Full-Wave Rectifier Circuits
Full-Wave Bridge Rectifier Circuits
3.5.3 Voltage Regulators
3.5.4 Additional Applications
Jaeger & Blalock, Chapter 3.13-3.16, page 113-128
ECE 3040: Chapter 3 PN Junction

65

3.5.1 Temperature Sensors


Diode Temperature Coefficient
Forward-biased diode (operated with constant bias current) is
frequently used for temperature sensing:
qV /kT
ID = IS "#e D 1$%

kT "ID $ kT " ID $
VD =
ln ' +1(
ln '
(
q # IS % q #IS (T) %

Challenge: IS is proportional to ni2 and thus (strongly) depends


on temperature; as a result, the VD vs. T relationship is
nonlinear
dVD k !ID $ kT 1 dIS
= ln # &
dT q " IS % q IS dT
Work-around: PTAT circuit using a differential setup with 2
identical diodes

ECE 3040: Chapter 3 PN Junction

66

PTAT Electronic Thermometer

PTAT = proportional to absolute


temperature
Concept
Two identical diodes biased by current
sources I1 and I2
Resulting PTAT voltage, i.e., difference
in voltage drop across the two diodes is
proportional to the absolute temperature

VPTAT = VD1 VD2

" I %+ kT " I %
kT ( " ID1 %
*ln $ ' ln $ D2 '- =
=
ln $ D1 '
q *) # IS &
# IS &-, q # ID2 &

dVPTAT k " ID1 % VPTAT


= ln $ ' =
dT
q # ID2 &
T

PTAT voltage circuit is heart of most of


todays digital thermometers
ECE 3040: Chapter 3 PN Junction

Jaeger, Blalock, page 88


67

3.5.2 Rectifier Circuits


Rectifier circuit converts an ac voltage to a pulsating dc
voltage; in combination with a filter, a nearly constant dc output
voltage can be generated
Virtually every electronic device plugged into the wall utilizes a
rectifier circuit to convert the 120-240V, 50-60Hz ac power line
source to a proper dc voltage
DC power supplies are a commodity and fairly inexpensive
Power Cube

Cell Phone Charger

Jaeger, Blalock, page 128


ECE 3040: Chapter 3 PN Junction

68

Half-Wave Rectifier with Resistive Load

Sinusoidal voltage source vS = VP sint is


connected to a series combination of diode
D1 and resistor R
Using the ideal diode model, we find that the
diode is ON for vS > 0 and OFF for vS < 0,
resulting in a pulsating output voltage v0

Jaeger, Blalock, Fig. 3.42 & 3.44


ECE 3040: Chapter 3 PN Junction

69

Half-Wave Rectifier
with Resistive Load

If the input voltage amplitude


(e.g. VP 10 V) is not large
compared to the voltage drop
(0.5-1.0 V) across the forwardbiased diode, the CVD model
should be used for circuit analysis

v S 0 v 0 = VP sint Von
vS < 0

v0 = 0

In many applications, a
transformer is used to stepdown the power line voltage to a
desired level
To remove time-varying
components from output
waveform, a filter capacitor is
usually added
Jaeger, Blalock, Fig. 3.45 & 3.46
ECE 3040: Chapter 3 PN Junction

70

Rectifier Filter Capacitor


Peak Detector Circuit
Assumption: initially uncharged
capacitor, i.e. v0(0)=0
As input voltage rises, diode turns on
and capacitor is charged to
v0 = Vdc = VP Von
At peak of input voltage waveform,
the current through the diode tries to
reverse direction (because
iD = C d(vS Von)/dt), thus reverse
biasing the diode and disconnecting
the capacitor from the power supply
With no discharge possibility,
v0 = Vdc = VP Von stays constant;
in a rectifier however, a resistive load
R is connected in parallel to C,
providing a discharge path

Jaeger, Blalock, Fig. 3.48 & 3.50

ECE 3040: Chapter 3 PN Junction

71

Half-Wave Rectifier with RC Load

v0 > vS Von: diode off; capacitor


discharged through resistor R
v0 < vS Von: diode on; capacitor
charged by voltage source
During discharge process, the
voltage across the capacitor
decreases exponentially with a
time constant RC; slow voltage
decay requires large RC and thus
large capacitances C
Characteristics of rectifier circuit
Output voltage Vdc
Ripple voltage Vr
Conduction interval T
Peak diode current IP
Surge current ISC
Peak-Inverse-Voltage Rating
Diode power dissipation

Jaeger, Blalock, Fig. 3.51 & 3.53

ECE 3040: Chapter 3 PN Junction

72

Ripple Voltage Vr
The ripple voltage Vr should be as small as possible
Voltage across capacitor during discharge process
v 0 (t!) = VP Von e t!/RC

for

t! = t

T
0
4

The ripple voltage is thus given by

) (
) $&%e e (

Vr = v 0 t! = 0 v 0 t! = T T

= VP Von
TTRC

(V

(V

Von

'
)(

* $ T T ',1 &1+
)/
RC
(.
+ %

Von T

R C

= Idc

TT

TT /RC

T
Vr = Idc
C
ECE 3040: Chapter 3 PN Junction

73

Conduction Interval T
At the beginning of the conduction interval t = TT, we have
v 0 (t! = T T) = v s (t! = T T) Von

(V

Von e(TT)/RC = VP cos $% T T &' Von

Assuming TRC and TT, both cosine and exponential function


can be expanded in a Taylor series (cos(T-T) = cos(T))

VP Von

2&
#
# T T &
T
( V
%1
( = VP %1
%
RC ('
2 ( on
%$
$
'

Solving for T yields

1 2T VP Von 1 2Vr
T
=
RC VP
VP

Conduction angle C
2Vr
C = T
VP
ECE 3040: Chapter 3 PN Junction

74

Peak Diode Current IP

The charge lost during the


discharge period must be
supplied to the capacitor during
the short charging cycle,
resulting in large diode currents
Assuming TT, the charge
lost during one period T is
Q = Idc T; this charge must be
supplied to the capacitor during
the charging interval T
Assuming a triangular shaped
current pulse through the diode
(see SPICE simulation), the
resulting peak diode current IP
becomes

T
2T
Q = Idc T = IP
IP = Idc
2
T

Jaeger, Blalock, Fig. 3.54

Note: the peak current


can be 10s of ampere

ECE 3040: Chapter 3 PN Junction

75

Surge Current ISC

Surge current ISC = Peak current


during initial charging process of
capacitor
During the initial charging, the
diode current is determined by
the charging current of the
(uncharged) capacitor

#d
&
id (t) = iC (t) C % VP sint(
$ dt
'
= CVP cos t

= ISC

ISC = C VP

In actual devices, ISC is reduced


due to series resistances of
diode and transformer (you can
investigate this with SPICE)

ECE 3040: Chapter 3 PN Junction

Jaeger, Blalock, Fig. 3.54

76

Peak-Inverse-Voltage (PIV) Rating


and Diode Power Dissipation
Peak-Inverse-Voltage (PIV) is maximum reverse bias voltage
of rectifier diode during operation; thus, minimal breakdown
voltage must be PIV (typically PIV is given with safety margin of
25-50%)
PIV Vdc v min
= 2VP Von 2VP
S
Power dissipation in rectifier diode
T
V
1
PD1 = v D (t) iD (t) dt = on
T0
T

IP T
i
(t)
dt
=
V
= VonIdc
D
on

2
T
TT

current only flows during charging cycle

Additional power dissipation due to diode series resistance RS


T

R
1
PD2 = RS iD2 (t) dt = S
T0
T

IP2 RS T 4 T
2
i
(t)
dt
=
=
R
I

3 T
3 T S dc
TT
2
D

Note: PD2 can be substantially larger than PD1


ECE 3040: Chapter 3 PN Junction

77

Half-Wave Rectifier Example


Assume:
VP = 10 Vrms = 14.1 Vp (60 Hz)
R = 15
C = 25,000 F !!
Von = 1 V (because of large currents)
RS = 0.2

Vdc = VP Von = 13.1V


DC output voltage Vdc:
Idc = Vdc / R = 0.87 A
Output current Idc:
Vr = (Idc T) / C = 0.58 V
Ripple voltage Vr:
1
Conduction interval T and angle C: T 2Vr / VP = 0.761ms
C = T = 0.287 rad = 16.4
IP = (2 Idc T) / T = 38 A
Diode peak current IP:
ISC = C VP = 133 A
Diode surge current ISC:
PIV:
PIV 2VP = 28.2 V
4 T
2
Diode power dissipation:
PD1 = VonIdc = 0.87 W PD2 =
RS Idc
= 4.42 W
3 T

ECE 3040: Chapter 3 PN Junction

78

Half-Wave Rectifier with Negative


Output Voltage

Jaeger, Blalock, Fig. 3.57

By grounding either the top of the capacitor (compared to the


bottom in Jaeger/Blalock, Fig. 3.48) or reversing the diode, the
rectifier circuit produces a negative output voltage, i.e. the
diode conducts on the negative half-cycle of the transformer

Vdc = VP Von

ECE 3040: Chapter 3 PN Junction

79

Full-Wave Rectifier Circuits


Operation Principle
Center-tapped transformer generates two voltages with equal
amplitude but 180 phase shift
Resulting are two half-wave rectifier circuits operating on
alternate half-cycles of input waveform
D1 charges C during one half cycle, D2 charges C during the
other half cycle
Advantages
Capacitor discharge
time cut in half
Thus, requires only
one-half the filter
capacitance for a
given ripple voltage
Jaeger, Blalock, Fig. 3.58
ECE 3040: Chapter 3 PN Junction

80

Full-Wave Rectifier Circuit


Equivalent circuit for vS > 0:

Equivalent circuit for vS < 0:

Jaeger, Blalock, Figs. 3.59-3.61

RC load receives 2 current


pulses per cycle!
ECE 3040: Chapter 3 PN Junction

81

Full-Wave Rectifier Circuit


DC output Voltage Vdc:

Vdc = VP Von

Ripple Voltage Vr:

Vr =

Conduction Interval T:

1 2 T VP Von 1 2Vr
T
=
2RC VP
VP

Conduction Angle C:

C = T

Peak Diode Current IP:

IP = Idc

PIV:

PIV = 2 VP

(V

Von
R

T
T
= Idc
2C
2C

2Vr
VP

2T
2T

ECE 3040: Chapter 3 PN Junction

82

Full-Wave Bridge Rectification


Jaeger, Blalock, Fig. 3.63

Bridge arrangement of 4 diodes eliminates the need for a center-tapped


transformer
vS > 0 half cycle: D2 and D4 ON; D1 and D3 OFF
vS < 0 half cycle: D1 and D3 ON; D2 and D4 OFF
Output dc voltage is now reduced by 2 diode voltage drops

Vdc = VP 2 Von

PIV rating for each diode is reduced: PIV VP


ECE 3040: Chapter 3 PN Junction

83

Full-Wave Bridge Rectification


Half Cycle vS > 0:

Half Cycle vS < 0:

Jaeger, Blalock, Figs. 3.64 and 3.65

ECE 3040: Chapter 3 PN Junction

84

Rectifier Comparison
Rectifier
Parameter
Filter Capacitor
PIV Rating
Peak Diode
Cur. (const. Vr)
Comments

Half-Wave
Rectifier
C=

VP Von T
Vr
R

Full-Wave
Rectifier
C=

VP Von T
Vr
2R

Full-Wave
Bridge
Rectifier
C=

VP Von T
Vr
2R

2 VP

2 VP

VP

Highest
IP

Reduced
IP/2

Reduced
IP/2

Least complexity

Smaller capacitor
Requires centertapped transformer
2 diodes

ECE 3040: Chapter 3 PN Junction

Smaller capacitor
4 diodes

85

3.5.4 Additional Diode Applications


(not discussed in ECE3040)
DC-to-DC Converters
Wave-Shaping Circuits
Clamping or DC Restoring Circuit
Clipping or Limiting Circuit
Piecewise Linear Transfer Function Circuit
Optoelectronic Devices
Photo Diodes
Solar Cells
Light-Emitting Diodes
ECE 3040: Chapter 3 PN Junction

86

3.6 Diode SPICE Model


3.6.1 Circuit Simulation using SPICE
OrCAD Capture and PSPICE
Introduction to PSPICE Simulation
3.6.2 SPICE Diode Model
3.6.3 Sample Problem
Jaeger & Blalock, Chapter 3.9, page 94-96
M.E. Herniter, Schematic Capture with Cadence
PSPICE, Prentice Hall, 2nd edition, 2003

ECE 3040: Chapter 3 PN Junction

87

3.6.1 Circuit Simulation using SPICE


SPICE is a general purpose circuit simulation program
originally developed at EECS Department of UC Berkeley
Capabilities:
Analysis Types: DC, AC, transient (and more)
Circuit elements: resistors, capacitors, inductors, mutual
inductors, independent and dependent voltage and current
sources, lossless and lossy transmission lines, switches,
uniform distributed RC lines, semiconductor devices
including diodes, BJTs, JFETs, MESFETs, and MOSFETs
Implementations:
PSPICE: http://www.orcad.com/; a limited student version of
PSPICE (version 9.1) is distributed with Jaeger & Blalock; a
demo CD with version 15.7 can be downloaded from OrCAD
PSPICE (Cadence) and HSPICE (Synopsys) are
implemented in major integrated circuit design tools
ECE 3040: Chapter 3 PN Junction

88

Limits of PSPICE Student Version


Circuit simulation limited to
64 nodes
10 transistors
2 op-amps or 65 digital primitive devices
10 transmission lines
Device characterization using Model Editor limited to diodes
Stimulus generation limited to sine waves (analog) and clocks
(digital)
Sample library of approx. 39 analog and 134 digital parts
(compared to 11,300 analog and 1,600 digital device models in
the standard package)
Display of simulation data only (no saving, except Print Screen)
ECE 3040: Chapter 3 PN Junction

89

Start Capture Student

ECE 3040: Chapter 3 PN Junction

90

Start New Project

ECE 3040: Chapter 3 PN Junction

91

Place Parts from Database

ECE 3040: Chapter 3 PN Junction

92

PSPICE Model Parameters

ECE 3040: Chapter 3 PN Junction

93

Place Ground

Note: One GND must be named 0!!!

ECE 3040: Chapter 3 PN Junction

94

Wire Circuit, Define Parameters


and Create Simulation Profile

circuit must have a GND named 0

ECE 3040: Chapter 3 PN Junction

95

Simulation Settings Time Domain

RUN

ECE 3040: Chapter 3 PN Junction

96

Run Simulation and


Display Results in OrCAD PSPICE

ECE 3040: Chapter 3 PN Junction

97

Plot Traces in OrCAD PSpice

ECE 3040: Chapter 3 PN Junction

98

3.6.2 SPICE Diode Model

Nonlinear behavior of diode is


modeled by voltage
controlled current source iD
Model equation for iD includes
ideal exponential diode
behavior plus term that
accounts for carrier
generation in the depletion
region of the diode
Junction Cj and diffusion CD
capacitances are connected
in parallel
Series resistance Rs
accounting for finite
resistance of quasi-neutral
regions

Jaeger, Blalock, Fig. 3.20

ECE 3040: Chapter 3 PN Junction

99

SPICE Diode Model


(
! v $ +
iD = IS *exp # D & 1*)
" NVT % -,

CD = TT

kT
VT =
q

Cj =

iD
NVT

CJO
M

# v &
%1 D (
$ VJ '

for v D 0
for v D 0

ECE3040
Symbol

SPICE

Default
Value

Saturation Current

IS

IS

10 fA

Series Resistance

Rs

RS

Ideality Factor

Transit Time

TT

0 sec

Zero-Bias Junction Cap. for unit area

Cj A

CJO

0F

Built-In Potential

Vbi

VJ

1V

Junction Grading Coefficient

0.5

Relative Junction Area

RAREA

Parameter

ECE 3040: Chapter 3 PN Junction

100

Sample Problem
Half-Wave Rectifier without Transformer
Voltage Source VSIN
Amplitude = 15 V
Frequency = 60 Hz
Offset = 0V
Ideal Diode
IS = 10 fA, N = 1
RS = 0, Cj = CD = 0
Filter Capacitance
C = 20 mF = 20,000 F
Load Resistance
R = 15

ECE 3040: Chapter 3 PN Junction

101

DC Output Voltage & Current


voutput
ioutput

vinput

DC Output Voltage: Vdc 14 V


DC Output Current: Idc 0.93 A
ECE 3040: Chapter 3 PN Junction

102

Diode Current
ISC

IP

Peak Diode Current: IP 33 A


Diode Surge Current: ISC 115 A
ECE 3040: Chapter 3 PN Junction

103

DC Output Voltage for C = 1 mF


voutput

vinput

Modification: filter capacitance decreased from C = 20 mF to C = 1 mF


Increased ripple voltage due to reduced RC time constant
ECE 3040: Chapter 3 PN Junction

104

Diode with RS = 0.1


voutput
ISC

vinput
IP

Modification: introduce diode series resistance RS = 0.1


Reduced IP and ISC; C only charged after several cycles
ECE 3040: Chapter 3 PN Junction

105

Diode with RS = 0.1


ISC

IP

Modification: introduce diode series resistance RS = 0.1


Reduced IP and ISC; C only charged after several cycles
ECE 3040: Chapter 3 PN Junction

106

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