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DATA SHEET
TJA1050
High speed CAN transceiver
Preliminary specification
File under Integrated Circuits, IC18
1999 Sep 27
Philips Semiconductors
Preliminary specification
TJA1050
FEATURES
GENERAL DESCRIPTION
Thermally protected
Short-circuit proof to battery and ground
An unpowered node does not disturb the bus lines
At least 110 nodes can be connected.
QUICK REFERENCE DATA
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VCC
supply voltage
VCANH
DC voltage at CANH
VCANL
DC voltage at CANL
Vi(dif)(bus)
dominant
1.5
tPD(TXD-RXD)
VS = 0 V
250
ns
Tamb
40
+125
4.75
5.25
27
+40
ORDERING INFORMATION
TYPE
NUMBER
PACKAGE
NAME
TJA1050T
SO8
TJA1050U
1999 Sep 27
DESCRIPTION
plastic small outline package; 8 leads; body width 3.9 mm
VERSION
SOT96-1
bare die
Philips Semiconductors
Preliminary specification
TJA1050
BLOCK DIAGRAM
VCC
8
60 A
VCC
GND
TEMPERATURE
PROTECTION
200
A
TXD
TXD
DOMINANT
TIME-OUT
TIMER
DRIVER
7
VCC
RXD
RECEIVER
0.5VCC
25
k
GND
GND
6
Vref
CANH
25
k
REFERENCE
VOLTAGE
CANL
TJA1050
2
MGS374
GND
PINNING
SYMBOL
PIN
DESCRIPTION
TXD
GND
ground
VCC
supply voltage
GND 2
RXD
VCC
RXD
Vref
CANL
CANH
1999 Sep 27
handbook, halfpage
TXD 1
8 S
7
CANH
CANL
Vref
TJA1050T
MGS375
Philips Semiconductors
Preliminary specification
TJA1050
Control line S (pin 8) allows two operating modes to be
selected; high speed mode or silent mode.
FUNCTIONAL DESCRIPTION
The TJA1050 is the interface between the CAN protocol
controller and the physical bus. It is primarily intended for
high speed automotive applications using baud rates from
40 kbaud up to 1 Mbaud. It provides differential transmit
capability to the bus and differential receiver capability to
the CAN protocol controller. It is fully compatible to the
ISO 11898 standard.
TXD
CANH
CANL
4.75 to 5.25 V
0 (or floating)
HIGH
LOW
dominant
4.75 to 5.25 V
0.5 VCC
0.5 VCC
recessive
4.75 to 5.25 V
1 (or floating)
0.5 VCC
0.5 VCC
recessive
0 V <CANH< VCC
0 V <CANL< VCC
recessive
>2 V
0 V <CANH< VCC
0 V <CANL< VCC
recessive
1999 Sep 27
Philips Semiconductors
Preliminary specification
TJA1050
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134). All voltages are referenced to GND (pin 2).
Positive currents flow into the IC.
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
0.3
+5.25
27
+40
0.3
VCC + 0.3 V
time limit is 1 s
55
+55
note 1
200
+200
VCC
supply voltage
VCANL, VCANH
VTXD, VRXD,
Vref and VS
Vtrt(CANH),
Vtrt(CANL)
Vesd
note 3
+4
kV
note 3
+2
kV
note 4
200
+200
Tstg
storage temperature
55
+150
Tamb
40
+125
Tj
junction temperature
40
+150
note 2
Notes
1. The waveforms of the applied transients shall be in accordance with ISO 7637 part 1, test pulses 1, 2, 3a and 3b,
(see Fig.6).
2. In accordance with IEC 747-1. An alternative definition of Tj is: Tj = Tamb + P Rth(j-a), where Rth(j-a) is a fixed value
to be used for the calculation of Tj. The rating for Tj limits the allowable combinations of power dissipation (P) and
ambient temperature (Tamb).
3. Human body model; C = 100 pF R = 1.5 k.
4. Machine model; C = 200 pF R = 25 .
THERMAL CHARACTERISTICS
According to IEC 747-1.
SYMBOL
Rth(j-a)
PARAMETER
thermal resistance from junction to
ambient; TJA1050T(SO8)
CONDITIONS
in free air
QUALITY SPECIFICATION
Quality specification SNW-FQ-611 part D is applicable.
1999 Sep 27
VALUE
UNIT
160
K/W
Philips Semiconductors
Preliminary specification
TJA1050
CHARACTERISTICS
VCC = 4.75 to 5.25 V; Tamb = 40 to +125 C; RL = 60 unless specified otherwise; all voltages are referenced to GND
(pin 2); positive currents flow into the IC; all parameters are guaranteed over the ambient temperature range by design,
but only 100% tested at Tamb = 25 C unless specified otherwise.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Supply (VCC)
ICC
supply current
dominant; VTXD = 0 V
tbf
75
mA
tbf
13
mA
output recessive
2.0
VCC + 0.3 V
VIL
output dominant
0.3
+0.8
IIH
VTXD = VCC
30
+30
IIL
VTXD = 0 V
100
200
300
Ci(TXD)
not tested
tbf
pF
silent mode
2.0
VCC + 0.3 V
VIL
0.3
+0.8
IIH
VS = VCC
30
60
100
IIL
VS = 0 V
30
+30
tbf
tbf
tbf
mA
IOL
VRXD = 0.45 V
8.5
20
mA
0.45VCC
0.5VCC
0.55VCC
2.0
3.0
27 V < VCANH,
VCANL < 32 V;
0 V < VCC < 5.25 V
2.5
+2.5
mA
Vo(CANH)
VTXD = 0 V
2.8
4.5
Vo(CANL)
0.5
2.0
Vi(dif)(bus)
VTXD = 0 V;
42.5 < RL < 60
(dominant)
1.5
3.0
500
+50
mV
Vref
Vref
Io(sc)(CANH)
VCANH = 0 V;
VTXD = 0 V
35
95
mA
Io(sc)(CANL)
VCANL = 36 V;
VTXD = 0 V
35
150
mA
1999 Sep 27
Philips Semiconductors
Preliminary specification
SYMBOL
PARAMETER
TJA1050
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Vdif(th)
0.7
0.9
Vi(dif)(hys)
100
200
mV
Ri(cm)(CANH);
Ri(cm)(CANL)
10
25
50
Ri(cm)(m)
VCANH = VCANL
+3
20
50
100
20
pF
10
pF
500
155
165
180
tbf
tbf
150
ns
tbf
tbf
100
ns
Ri(dif)
Ci(CANH);
Ci(CANL)
Ci(dif)
ILI(CANH);
ILI(CANL)
see Fig.5
VCC = 0 V;
VCANH = VCANL = 5 V
Thermal shutdown
Tj(sd)
shutdown junction
temperature
td(TXD-BUSoff)
td(BUSon-RXD)
td(BUSoff-RXD)
1999 Sep 27
VS = 0 V
Philips Semiconductors
Preliminary specification
TJA1050
+ 5 V halfpage
handbook,
47
F
100
nF
VCC
TXD
Vref
RXD
3
1
RL
60
TJA1050
6
4
2
15 pF
CANH
CL
100 pF
CANL
8
GND
MGS376
HIGH
TXD
LOW
CANH
CANL
dominant
(BUS on)
0.9 V
Vi(dif)(bus)(1)
0.5 V
recessive
(BUS off)
HIGH
RXD
0.3VCC
t d(TXD-BUSon)
0.7VCC
LOW
t d(TXD-BUSoff)
t d(BUSon RXD)
t d(BUSoff RXD)
t PD(TXD RXD)
t PD(TXD RXD)
1999 Sep 27
MGS377
Philips Semiconductors
Preliminary specification
TJA1050
MGS378
VRXD
HIGH
LOW
hysteresis
0.5
0.9
Vi(dif)(bus)
+5 V
47
F
100
nF
VCC
TXD
Vref
RXD
3
1
1 nF
TRANSIENT
GENERATOR
TJA1050
6
4
2
15 pF
CANH
CANL
1 nF
8
GND
MGS379
The waveforms of the applied transients shall be in accordance with ISO 7637 part 1, test pulses 1, 2, 3a and 3b.
1999 Sep 27
Philips Semiconductors
Preliminary specification
TJA1050
+5 V
47
F
120
100
nF
VCC
TXD
TX0
3
1
7
SJA1000
Vref
CAN
CONTROLLER
RXD
RX0
CANH
CAN
BUS LINE
TJA1050
6
CANL
4
2
8
GND
S
120
MGS380
handbook, halfpage
TJA1050U
test pad
x
0
0
y
2 3
4
MGS381
1999 Sep 27
10
PAD
x
TXD
103
103
GND
740.5
85
VCC
886.5
111
RXD
1371.5
111
Vref
1394
1094
CANL
1006
1111
CANH
542.5
1111
103
1097
Philips Semiconductors
Preliminary specification
TJA1050
PACKAGE OUTLINE
SO8: plastic small outline package; 8 leads; body width 3.9 mm
SOT96-1
A
X
c
y
HE
v M A
Z
5
Q
A2
(A 3)
A1
pin 1 index
Lp
1
4
e
detail X
w M
bp
2.5
5 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
A2
A3
bp
D (1)
E (2)
HE
Lp
Z (1)
mm
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
5.0
4.8
4.0
3.8
1.27
6.2
5.8
1.05
1.0
0.4
0.7
0.6
0.25
0.25
0.1
0.7
0.3
0.01
0.019 0.0100
0.014 0.0075
0.20
0.19
0.16
0.15
0.244
0.039 0.028
0.050
0.041
0.228
0.016 0.024
inches
0.010 0.057
0.069
0.004 0.049
0.01
0.01
0.028
0.004
0.012
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT96-1
076E03S
MS-012AA
1999 Sep 27
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
95-02-04
97-05-22
11
8
0o
Philips Semiconductors
Preliminary specification
TJA1050
SOLDERING
Reflow soldering
Wave soldering
Manual soldering
1999 Sep 27
12
Philips Semiconductors
Preliminary specification
TJA1050
Suitability of surface mount IC packages for wave and reflow soldering methods
SOLDERING METHOD
PACKAGE
REFLOW(1)
WAVE
BGA, SQFP
not suitable
suitable
suitable(2)
suitable
suitable
suitable
not
recommended(3)(4)
suitable
not
recommended(5)
suitable
Notes
1. All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum
temperature (with respect to time) and body size of the package, there is a risk that internal or external package
cracks may occur due to vaporization of the moisture in them (the so called popcorn effect). For details, refer to the
Drypack information in the Data Handbook IC26; Integrated Circuit Packages; Section: Packing Methods.
2. These packages are not suitable for wave soldering as a solder joint between the printed-circuit board and heatsink
(at bottom version) can not be achieved, and as solder may stick to the heatsink (on top version).
3. If wave soldering is considered, then the package must be placed at a 45 angle to the solder wave direction.
The package footprint must incorporate solder thieves downstream and at the side corners.
4. Wave soldering is only suitable for LQFP, TQFP and QFP packages with a pitch (e) equal to or larger than 0.8 mm;
it is definitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.
5. Wave soldering is only suitable for SSOP and TSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is
definitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.
1999 Sep 27
13
Philips Semiconductors
Preliminary specification
TJA1050
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification
This data sheet contains preliminary data; supplementary data may be published later.
Product specification
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
BARE DIE DISCLAIMER
All die are tested and are guaranteed to comply with all data sheet limits up to the point of wafer sawing for a period of
ninety (90) days from the date of Philips' delivery. If there are data sheet limits not guaranteed, these will be separately
indicated in the data sheet. There is no post waffle pack testing performed on individual die. Although the most modern
processes are utilized for wafer sawing and die pick and place into waffle pack carriers, Philips Semiconductors has no
control of third party procedures in the handling, packing or assembly of the die. Accordingly, Philips Semiconductors
assumes no liability for device functionality or performance of the die or systems after handling, packing or assembly of
the die. It is the responsibility of the customer to test and qualify their application in which the die is used.
1999 Sep 27
14
Philips Semiconductors
Preliminary specification
TJA1050
NOTES
1999 Sep 27
15
Internet: http://www.semiconductors.philips.com
SCA 68
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The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
285002/01/pp16
Sep 27