Escolar Documentos
Profissional Documentos
Cultura Documentos
discussions, stats, and author profiles for this publication at: http://www.researchgate.net/publication/278329290
DOWNLOADS
VIEWS
18
8 AUTHORS, INCLUDING:
Muhammad Younas
Fahad Azad
13 PUBLICATIONS 72 CITATIONS
2 PUBLICATIONS 0 CITATIONS
SEE PROFILE
SEE PROFILE
Asghari Maqsood
SEE PROFILE
SEE PROFILE
RSC Advances
c5ra09002d
PAPER
10
15
20
25
30
10
15
20
25
30
35
35
40
40
45
45
50
50
ART C5RA09002D_GRABS
Paper: c5ra09002d
Title: Role of multivalent Cu, oxygen vacancies and CuO nanophase in the ferromagnetic properties of ZnO:Cu
thin films
10
Editor's queries are marked like this... 1 , and for your convenience line numbers are inserted like this... 5
10
Please ensure that all queries are answered when returning your proof corrections so that publication of your
article is not delayed.
15
Query
Reference
Query
For your information: You can cite this article before you receive
notication of the page numbers by using the following format:
(authors), RSC Adv., (year), DOI: 10.1039/c5ra09002d.
Ref. 1 and 40: Please provide the initial(s) for the 1st author.
Ref. 4: Please provide the last name for the 7th author.
20
25
30
Remarks
15
20
25
30
35
35
40
40
45
45
50
50
55
55
ART C5RA09002D_GRABS
RSC Advances
PAPER
1
1
10
Comprehensive microstructural, electronic and magnetic analyses have been carried out on ZnO:Cu thin
lms grown by pulsed laser deposition on c-plane sapphire under dierent oxygen partial pressures.
10
Detailed X-ray diraction (XRD), X-ray photoelectron spectroscopy (XPS) and high resolution
transmission electron microscopy (HRTEM) analyses reveal that increase in oxygen growth pressure
degrades the epitaxy of ZnO:Cu thin lms due to inclusion of nanosize CuO in the ZnO host lattice.
15
HRTEM and magnetization studies suggest that thin lm quality plays a less eective role in governing
15
the magnetic properties of these samples. Instead, room temperature ferromagnetism (FM) of these
ZnO:Cu thin lm samples are highly tunable by the simultaneous presence of CuO nanophases and
multivalent Cu and V$$
O concentrations, which are in strong contest with each other. For low oxygen
1
network is the main contributor to the
partial pressure grown sample, the eective Cu2 V$$
O Cu
20
Received 14th May 2015
Accepted 15th June 2015
observed FM and is in completion with CuO nanophases only when there is a relatively low V$$
O
concentration with a dominant Cu2+ oxidation state. For vacuum grown samples containing high V$$
O
20
1
concentration and Cu1+ as dominant oxidation state, the Cu2 V$$
network becomes less
O Cu
eective and a CuO nanophase (45 nm) is the dominent FM supplier. The extrinsic FM in the vacuum
25
DOI: 10.1039/c5ra09002d
grown sample, which is the best epitaxial quality sample, is further conrmed by the zero eld cooled
www.rsc.org/advances
1. Introduction
30
35
40
The control over the distribution of magnetic ions in a semiconducting host is crucial for the functionality of diluted
magnetic semiconductors (DMS). It is one of the major challenges to avoid secondary phases and precipitates due to the
clustering tendency of transition metal (TM) elements and their
oxides. Under nonequilibrium growth conditions, a strong
attractive interaction between TM impurities stimulates the
spinodal decomposition of magnetically robust nanocrystals.
Therefore, chemical phase separation in TM doped wide band
gap semiconductors such that GaN and ZnO is signicantly
anticipated.15 ZnO is an encouraging wide band gap semiconductor having ability to laser spontaneously at ultraviolet
wavelengths. Because of its long spin-coherence time at room
45
a
Department of Physics, The University of Hong Kong, Pokfulam Road, Hong Kong, P.
3 R. China
b
Department of Physics, Hong Kong University of Science and Technology, Clear Water
Bay, Kowloon, Hong Kong, P. R. China
50
c
School of Natural Sciences, National University of Sciences and Technology, H-12,
Islamabad, Pakistan
d
25
30
35
40
45
50
RSC Advances
10
15
20
25
30
35
40
45
50
55
2.
Experimental
Paper
3.
3.1
10
15
20
25
30
35
40
45
50
55
Paper
10
15
20
25
30
35
40
45
50
55
RSC Advances
10
15
20
25
30
35
Fig. 1 (a) XRD patterns for all three as-grown samples of ZnO:Cu thin
lms. The inset shows normalized (002) peak intensity. The marks
shows (002) peak positions for all three pristine ZnO samples grown
under same conditions, and (b) XRD patterns after annealing all three
ZnO:Cu samples at 750 C. Secondary phase peaks are represented by
black squares.
40
45
Cu-2p3/2 peak at 932.6 eV and Cu-2p1/2 peak at 952.5 eV corresponding to the peak positions of Cu1+ in Cu2O),26 and the
tting results are presented in Table 1. By employing XPS
integrated areas and Cu-2p3/2/Zn-2p3/2 ratio aer proper
normalization of corresponding atomic sensitivity factor, we
estimated the Cu at.% of 2.31, 2.57 and 1.55 for the S-1, S-2 and
S-3 samples, respectively. For S-1 sample, the relative peak
intensity for Cu1+-2p3/2 compared to Cu2+-2p3/2 is high, without
any satellite structure. Strong satellite peaks due to electron
shakeup are commonly found between 940 eV and 945 eV for
Cu2+ (Cu-3d9)18 and no satellites are expected for Cu0 and Cu1+.
The S-1 sample with relatively high Cu1+-2p3/2 peak intensity
and absence of a satellite structure suggest the presence of Cu1+
50
55
RSC Advances
Paper
10
15
20
25
30
35
40
45
Fig. 2 Cu-2p XPS spectrum for S-1 sample. The left and right insets
show Cu-2p XPS spectra for S-2 & S-3 samples, respectively.
10
15
20
25
30
35
40
45
Fig. 3 O-1s XPS spectra for S-1 sample. The left and right insets show
O-1s XPS spectra for S-2 & S-3 samples, respectively.
50
50
Table 1
55
S-1
S-2
S-3
a
FWHM (eV)
Cu-2p1/2 (eV)
FWHM (eV)
SP-1a (eV)
SP-2a (eV)
933.02 0.02
933.16 0.02
932.83 0.01
1.33
1.88
1.77
952.81 0.05
952.93 0.05
952.72 0.03
1.49
2.09
2.14
943.47 0.3
940.88 0.3
963.00 0.4
961.03 0.2
55
Paper
10
15
20
25
30
35
Microstructural properties
XPS results for S-2 and S-3 samples show a possible presence of
CuO phases, but discard their presence in the S-1 sample. XPS is
a surface sensitive technique and has some detection limit
problems. Moreover, the S-1 sample is grown in vacuum, which
is not a favourable condition for the growth of large and stable
CuO secondary phases. The CuO nanophases that are very small
in size, present either at the surface or within the bulk of the
host material, might remain undetected by XPS. Therefore, in
order to investigate the defect structure, phase segregation and
Cu related secondary phases; we performed a detailed HRTEM
analysis on all three as grown samples. Fig. 4 shows a crosssectional HRTEM image at the lmsubstrate interface for the
S-1 sample. The HRTEM image in Fig. 4 shows a perfect ZnO
growth along the (002) plane and the interface is atomically
sharp. The diraction pattern from the lmsubstrate interface
(inset Fig. 4) shows absence of spots apart from those belonging
to the lm and substrate. The native ZnO:Cu lm in this
micrograph shows some image contrast in the form of a lattice
distortion (white circle in Fig. 4). By employing HRTEM, Klenov
et al.35 reported that CuO planar clusters (with cluster concentrations more than 2 atom%) can be incorporated in (001)
cationic planes of ZnO at Zn atom positions, with oxygen atoms
situated in the adjacent anion planes resulting in the appearance of a dislocation loop. Moreover Zn and Cu atoms are
almost equal to each other in their scattering properties, so the
substitution of Cu for Zn does not aect the image contrast, and
the associated oxygen lattice distortion provides additional
contrast in the HRTEM images. XPS and XRD results did not
reveal any Cu clustering, and the Cu atomic concentrations is
also higher than 2 atom% for S-1 sample (i.e. 2.3 atom%).
RSC Advances
Hence, the observed defects along the (001) planes (white circle
in Fig. 4) are likely to be of a dislocation nature in the S-1
sample.
To further conrm the origin of these dislocations, we
carried out a low magnication TEM analysis of native ZnO:Cu
thin lm of S-1 sample as shown in Fig. 5. The micrograph in
this gure reveals randomly dispersed Moire fringes, as seen by
the bending/wrinkling of the lattice fringes (white circle in
Fig. 5) with average size in 34 nm range. Moire fringes normally appear between two crystal structures with parallel or
rotated sets of planes.36 The high magnication image presented in the le inset of Fig. 5 shows a lattice distortion caused
by such a Moire fringe. This lattice distortion is primarily
caused by lattice mismatch between the host material (ZnO:Cu)
and CuO secondary phase. The estimated interplanar distance
from such a distorted lattice is 0.25 nm, which corresponds to
11) planes of monoclinic CuO
the reection from (1
(JCPDS#720629). Furthermore, the interplanar distance of
0.26 nm corresponds to the (002) planes of wurtzite ZnO. This is
in good agreement with XRD results of the S-1 sample where the
(002) plane is dominant in the ZnO:Cu lms. A very small
dierence (0.01 nm) between the interplanar distances of the
distorted lattice and the undistorted wurtzite ZnO indicates the
11) planes of CuO to the (002)
parallel overlapping of the (1
planes of wurtzite ZnO. This is further conrmed by the electron
diraction pattern (right inset of Fig. 5), for which we are unable
to observe separate diraction spots for the CuO secondary
phase. Instead, relatively elongated diraction spots are seen
here, probably due to a very small dierence in the interplanar
11) planes of CuO to the (002)
distances of the overlapping (1
planes of wurtzite ZnO. Thus, some of the Cu atoms alloyed with
ZnO exist as planar nanophases of CuO (34 nm), intermingled
10
15
20
25
30
35
40
40
45
45
50
50
55
55
Cross-sectional HRTEM image at the lmsubstrate interface
for S-1 sample. The inset shows an electron diraction pattern from
the lmsubstrate interface of the same sample.
Fig. 4
Fig. 5 Low magnication image for the S-1 sample. The left inset
shows an HRTEM image of the selected Moire fringes. The right inset
shows an electron diraction pattern from the native ZnO:Cu lm of
sample S-1.
RSC Advances
10
15
20
25
30
35
40
45
50
55
Fig. 6 Low magnication image for the S-2 sample. The left inset
shows an HRTEM image at the lmsubstrate interface for the same
sample. The right inset shows an electron diraction pattern from the
lmsubstrate interface of sample S-2.
Paper
10
15
20
25
30
35
40
45
50
55
Paper
10
15
Fig. 7 Low magnication image for sample S-3. The left inset shows
20
25
30
35
40
45
50
55
3.3
Magnetic properties
RSC Advances
10
15
20
25
30
35
40
45
50
55
RSC Advances
10
15
20
25
30
35
40
45
50
55
1
Cu2 V$$
network.18 However, S-1 is conducting
O Cu
(carrier concentration 3.32 1018) and a large amount of V$$
O
concentrations may convert Cu2+ to Cu1+ thereby reducing
1
eective Cu2 V$$
complexes. Therefore, due to the
O Cu
highly conducting nature of sample S-1, the indirect double
1
exchange ferromagnetic Cu2 V$$
network becomes
O Cu
less eective in mediating ferromagnetic ordering. On the other
hand, small size CuO crystals oer higher coercivity and create
noticeable changes in the magnetic properties, since CuOCu
superexchange is strongly dependent on both, bond angels and
bond lengths on size reduction.42,43 Therefore, the intermediate
Ms and high Hc of sample S-1 compared to S-2 is mainly originating from ferromagnetic CuOCu superexchange due to
uncompensated Cu spins at the surface of small size CuO
nanophases. These observations are in agreement with previous
reports on doped ZnO and GaN1,5,44 where TM based nanophases were clearly detected and found responsible for the
observed FM. Moreover, we suggest that if an indirect double
1
exchange ferromagnetic Cu2 V$$
network is playing
O Cu
any role in tuning the magnetism in sample S-1, it is dominated
by the pronounced ferromagnetic signal coming from the
surface of CuO nanophases embedded in the (001) plane of the
ZnO:Cu thin lm host.
In the case of sample S-2, we notice the highest value of Ms
compared to the S-1 and S-3 samples. Although we observe
relatively lower epitaxial quality of S-2 sample compared to S-1
sample, the HRTEM analysis still showed epitaxial thin lm
growth along with the presence of CuO nanophases. This
reveals that the high Ms value is not coming from the interface
distortion or metal clustering at the interface. Core level XPS
study for sample S-2 showed a more dominant Cu2+ signal than
$$
Cu1+ with small amount of V$$
O concentration. This low V O
2+
1+
$$
concentrations leads to high Cu /Cu ratio and the VO have
Paper
10
15
20
25
30
35
40
45
50
55
Paper
10
15
20
25
30
35
40
45
50
55
4. Conclusions
We have studied PLD grown ZnO:Cu thin lms prepared under
dierent oxygen partial pressures. All the samples contain CuO
secondary phases irrespective of the growth conditions. An
increase in oxygen partial pressure during growth leads to the
reduction in the (002) peak and enhancement in FWHM of this
peak suggesting degradation in the epitaxial quality of the
ZnO:Cu lm. Core level XPS result shows existence of mixed Cu
oxidation states and CuO secondary phases. Detailed HRTEM
analysis reveals that an increase in oxygen growth pressure
degrades the epitaxy of these thin lm samples due to the
inclusion of nanosize CuO in the ZnO host lattice. The magnetic
properties of ZnO:Cu thin lm samples are highly tuneable by
This journal is The Royal Society of Chemistry 2015
RSC Advances
Acknowledgements
The work presented here was supported by the Research Grant
Council of HKSAR under the GRF scheme (HKU703612P), as
well as HKUST DAG12SC05-4, FSGRF12SC13 and HKU Seed
Funding Program for Basic Research (201111159037).
10
15
References
1 Bonanni, A. N. Quezada, T. Li, M. Wegscheider, Z. Matej,
V. Holy, R. T. Lechner, G. Bauer, M. Rovezzi, F. D. Acapito,
M. Kiecana, M. Sawicki and T. Diet, Phys. Rev. Lett., 2008,
101, 135502.
2 K. Sato, H. Katayama-Yoshida and P. H. Dederichs, Jpn. J.
Appl. Phys., Part 2, 2005, 44, L948.
3 M. Younas, L. L. Zou, M. Nadeem, Naeem-ur-Rehman,
S. C. Su, Z. L. Wang, W. Anwand, A. Wagner, J. H. Hao,
C. W. Leung, R. Lortz and F. C. C. Ling, Phys. Chem. Chem.
Phys., 2014, 16, 16030.
4 M. Tay, Y. Wua, G. C. Han, T. C. Chong, Y. K. Zheng,
S. J. Wang, Y. C. and X. Pan, J. Appl. Phys., 2006, 100, 063910.
5 T. Dietl, Nat. Mater., 2010, 9, 965.
6 K. R. Kittilstved, W. K. Liu and D. R. Gamelin, Nat. Mater.,
2006, 5, 291.
7 K. R. Kittilstved, N. S. Norberg and D. R. Gamelin, Phys. Rev.
Lett., 2005, 94, 147209.
8 M. Venkatesan, C. B. Fitzgerald, J. G. Lunney and
J. M. D. Coey, Phys. Rev. Lett., 2004, 93, 177206.
9 P. Sharma, A. Gupta, K. V. Rao, F. J. Owens, R. Sharma,
R. Ahuja, J. M. Osorio-Guillen, B. Johansson and
G. A. Gehring, Nat. Mater., 2003, 2, 673.
10 J. M. D. Coey, M. Venkatesan and C. B. Fitzgerald, Nat.
Mater., 2005, 4, 173.
11 M. Venkatesan, C. B. Fitzgerald, J. G. Lunney and
J. M. D. Coey, Phys. Rev. Lett., 2004, 93, 177206.
12 L. M. Huang, A. L. Rosa and R. Ahuja, Phys. Rev. B: Condens.
Matter Mater. Phys., 2006, 74, 075206.
13 Q. Ma, D. B. Buchholz and R. P. H. Chang, Phys. Rev. B:
Condens. Matter Mater. Phys., 2008, 78, 214429.
14 L. H. Ye, A. J. Freeman and B. Delley, Phys. Rev. B: Condens.
Matter Mater. Phys., 2006, 73, 033203.
15 L. M. Huang, A. L. Rosa and R. Ahuja, Phys. Rev. B: Condens.
Matter Mater. Phys., 2006, 74, 075206.
16 M. H. N. Assadi, Y. B. Zhang and S. Li, J. Phys.: Condens.
Matter, 2010, 22, 486003.
17 T. F. Shi, Z. G. Xiao, Z. J. Yin, X. H. Li, Y. Q. Wang, H. T. He,
J. N. Wang, W. S. Yan and S. Q. Wei, Appl. Phys. Lett., 2010,
96, 211905.
18 T. S. Herng, D. C. Qi, T. Berlijn, J. B. Yi, K. S. Yang, Y. Dai,
Y. P. Feng, I. Santoso, C. S. Hanke, X. Y. Gao, A. T. S. Wee,
20
25
6
7
30
35
40
45
50
55
RSC Advances
1
19
5
20
21
10
22
23
15
24
25
26
20
27
28
25
29
30
30
31
32
35
33
34
35
40
36
Paper
10
15
20
25
30
35
40
45
45
50
50
55
55