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Power Transformers
Juan L. Velsqueza Miguel A. Sanz-Bobib Miguel Gutierrezc Alexander Kraetgea
a
OMICRON Electronics GmbH, Oberes Ried 1 , A-6833 Klaus, Austria
b
Universidad Pontificia Comillas, Instituto de Investigacin Tecnolgica, IIT, Santa Cruz de
Marcenado 26, 28015 Madrid, Spain
c
OMICRON Electronics Corp., 12 Greenway Plaza, Suite 1510, Houston Texas
juan.velasquez@omicron.at, Miguel.gutierrez@omicronusa.com
Abstract
The FRA method provides comprehensive and unique
information about the mechanical and electrical
integrity of the active part of transformers. For taking
advantage of the potential of this method, certain
knowledge bases are necessary in order to assist the
automatic process of diagnosis. In this work such bases
are presented from the point of view of the
understanding of the waveform of the plots and from the
standpoint of assessment of the results. Moreover, an
attempt for the characterization of different failure
modes by using transformer-specific sub-bands is also
provided as well as an overview to the effects of the
factors affecting the repeatability of FRA results. At the
end the formulation of algorithms for automatic
detection of abnormalities and its relationship to the
development of an expert system is presented.
CMC
RMC
RLC Network
U2
Rm=50
Magnitude (dB)
Rref=50
U1
U
1.000e+003
1.000e+004
1.000e+005
f/Hz
-20
-30
H( f ) =
-40
-50
-60
U2( f )
Rm
(1)
=
U1 ( f ) Rm + Z tra
-70
-80
-90
k = 20 log10 (U 2 / U1 ) (2)
-100
dB
Phase ()
50
150
100
= tan
1.000e+002
1.000e+003
1.000e+004
1.000e+005
H0 H1
H0 H2
( U 2 / U 1 ) (3)
f/Hz
H0 H3
Amplitude [dB]
-50
L=200 mH
L=2 mH
L=20 H
-100
-150
10
10
Frequency (Hz)
(a)
10
Amplitude [dB]
0
-50
-100
C=1uF
C=20nF
C=1pF
-150
-200
10
(b)
10
Frequency (Hz)
10
5
0
Amplitude [dB]
X L = L = 2fL (4)
1
1
XC =
=
(5)
C 2C
-5
-10
C=1nF
C=10nF
C=50nF
-15
-20
-25
-30
10
If
10
-20
10
Frequency (Hz)
(c)
Amplitude [dB]
-40
-60
-80
C=1nF
C=10nF
C=50nF
-100
-120
-140
10
10
Frequency (Hz)
10
(d)
Figure 3. Series and parallel resonances of RLC
networks
Cs1
Cs2
C12
LV Winding
R1
L2
L1
R2
Lm
HV Winding
L1, R1
Cg1
Rn
Cg2
L2, R2
Cg1
Cs1
Cs2
Cg2
CHL
1. 0 00 e+00 3
1. 0 00 e+00 4
1. 0 00 e+00 5
f/Hz
-2 0
-3 0
-4 0
-5 0
-6 0
dB
x 0 01
x0 x2
x0 x3
1.000e+003
1.000e+004
1.000e+005
f/Hz
-10
E
1. 000e+003
1.000e+004
1.000e+005
-20
Magnetizing
inductance (Lm)
-30
-40
-50
-60
-20
f/Hz
F
Measurement
setup and leads
1. 000e+002
-10
-15
Series capacitace
(Cs)
-70
Parallel capacitance
(Cg)
dB
Iteraction between
windings
From
B1
B2
B3
B4
B5
A
B
C
D
E
Til
l
B
C
D
E
F
Dominant elements
Lm
Lm and Cg
L1, Cg, and mutual couplings
Cs
Internal leads
-25
-30
-35
-40
dB
x0 x1
x0 x2
x0 x3
A1 vs.A2
B1 vs.B2
Trace Phase A2
C1 vs.C2
Trace Phase B1
Trace Phase B2
Trace Phase C1
Deviations
Phase
comparison for
further
investigation is
required
Trace Phase C2
Analysis of Deviations by
means of Algorithms of
automatic detection
Similar threephase
deviations
No deviations
Single-phase
or Bi-phase
deviations
Connection lead's
integrity is suspected
Deformation in connection's
leads is suspected
Expert System
Clamping structure's
integrity is suspected
Core integrity is
suspected
Winding's integrity is
suspected
Core deformation
is suspected
Deformation in windings
is suspected
Test 3
Test 1
Test 2
Trace Phase A1
Trace Phase A3
Trace Phase B1
Trace Phase B3
Trace Phase B2
Trace Phase C1
Trace Phase C3
Trace Phase C2
Construction-based
comparison
Phase-based
comparison
A1 vs B1
B1 vs C1
C1 vs A1
B1 vs B3
Trace Phase A2
Construction-based
comparison
A2 vs A3
C1 vs C3
Analysis of
Deviations by means
of Algorithms of
automatic detection
No deviations
A1 vs A3
B2 vs B3
Expert System
Analysis of
Deviations by means
of Algorithms of
automatic detection
Deviations
Measurement
mistakes
B3 vs C3
C3 vs A3
C2 vs C3
Deviations
Phase-based
comparison
A3 vs B3
Test 2
Time-based Comparison
No deviations
Three-phase
deformation
Short-circuits in bushing's CT
Loose clamping
Shorten leads
Spiral tightening
High impedance
Transformer conditions
Temperature
Moisture
Oil
Insulation degradation
Core grounding
Tertiary windings
Bushings
Tank
Tester
Remanence
FRA instrument
Measurement cables
Injection point
Electromagnetic environment
Reverse connection
Stochastic factors
Measurement
mistakes
Arrangement of
cables
6. Conclusions
An understanding of the frequency response of RLC
networks constitutes the bases for understanding the FRA
response of a real transformer. A generalization of the
FRA response of transformers is difficult, but for
transformers of the same family is possible to describe
general patterns. Identification of transformer-specific
sub-bands is a key element for the automatic detection
and diagnosis of FRA results. Patterns of the effects of
both failure modes and factors affecting the repeatability
of FRA results in the sub-bands can be built by means of
algorithms and subsequently be used as input to an
expert system for an automatic and reliable diagnosis of
the results what is one of the biggest challenges of the
FRA method.
Injection point
7. References
Reverse connection
Arrangement of cables
Measurement mistakes
Modeling
Mathematical
Z=
Physical
Feature Extraction
Circuit synthesis
without physical
meaning
A0 + A1s + A2 s 2
B0 + B1s + B2 s 2
8. Curriculum Vitae
Juan L. Velsquez received the B.Sc. degree in
Electrical Engineering from the Universidad Antonio
Jos de Sucre in Barquisimeto, Venezuela in 2002. In
October 2008 he jointed Omicron Electronics GmbH
in Austria, where he works as product manager of
diagnostic instruments for high voltage assets.
Dr. Miguel A. Sanz Bobi is professor at the
Computer Science Department and also researcher at
the Institute for Research and Technology (IIT) both
inside the Engineering School of the Pontificia
Comillas University, Madrid (Spain).
Miguel Gutierrez Received his Bachelor in electronic
and Licenciatura in Power System from the
University of Costa Rica in 1985 and 1988
respectively. He worked as a field engineer since
1985 to 1996 at the Costa Rican Institute of
Electricity in Costa Rica. In 1997 he worked for
Rochester Instruments Systems (USA) as a testing
engineer and Since 1999 he has been working for OMICRON
electronics (USA) as a sales and application engineer for Latin
America. He is member of the IEEE.
Dr. Alexander Kraetge received the Doctoral degree in Electrical
Engineering from the Technical University of Berlin, Germany in
2007. From 2006 he jointed Omicron Electronics GmbH in Austria,
where he works as product manager of diagnostic instruments for high
voltage assets.