Description:

A two dimensional graphical presentation, in rectangular coordinates, in which the travel time
of an ultrasonic pulse is represented as a displacement along one axis, and transducer
movement is represented as a displacement along the other axis. In the presentation, reflected
pulses are shown as an event. The event marks represent the echo by different evaluations:
(1) if the echo signal amplitude exceeds a preset threshold within a gate, thus drawing a mark
(0/1 method).
(2) the echo exceeds a preset threshold within a gate and the drawn color palette (or
grayscale) is proportional to the amplitude of the signal.
Illustrations:

B-scan principle

Introduction
Since the beginning of ultrasonic inspection era the numerous attempts were made to
bring the testing results output to the easy understandable and interpretable level. The
inspector's conclusion "GO / NO GO", manual marks of the defects location and
coordinates on the inspection was the typical ultrasonic inspection output in the near
past. Recently such output was significantly improved since the digital ultrasonic
instruments capable to store the A-Scan shots along with corresponding calibration
damps and to convert them either into the hard copy or computer file appeared.
However it is still not enough for the "non-ultrasonic" people who actually are the end
clients for the inspection results - the A-Scans are
still not saying them nothing.
As an alternative to the typical A-Scan ultrasonic
inspection the automatic and semiautomatic units
were created by many organizations. Depending
on the inspection technology the testing
machines are capable to record the ultrasonic
data providing the B-, C-, D-, P- scans and
TOFD images represented in real time with the
hardcopy and file outputs, which are already
welcomed by the end clients. Some successful
models of the said testing machines found their
niche in the field but the manual scanning using portable ultrasonic instrument still
remains the sole economical and practical solution for the huge number of routine
inspections.
In order to close a gap between market demand in getting the ultrasonic testing results
imaged and the practically and economically reasonable way of doing inspection the
manufacturers of ultrasonic equipment started to promote the new portable
instruments equipped with simplified rapid imaging features and options allowing to
present separate sections of the object under test as real time B-scan displays as well
as to generate the hardcopy and to store the B-Scan images. The B-Scan feature
existing in the technical data sheet of an instrument often becomes a lead to the
purchase decision because in many cases (hard access to the test object, limited space
for the probe manipulations, etc) the simplified B-Scan imaging of the separate
sections of the test object is the only solution to get some highly demanded graphical
record in the inspection report.
On the other hand just a note on the B-Scan in the list of features may lead to the
wrong instrument selection because the existing advertising and technical literature in
many cases does not explain exactly what are the B-Scans modes available among the
plurality.
The present article is an attempt to distinguish between the different modes of the
rapid B-Scan imaging implemented by the portable ultrasonic units.

1. True-to-Location (Encoded) and Time-based (Timed) B-Scan

Generally the B-Scan is defined as two-dimensional graphical presentation, in

rectangular coordinates, in which the travel time of an ultrasonic pulse is represented
as a displacement along one axis, and the probe movement is represented as a
displacement along the other axis. In the B-Scan presentation the signals are
represented as event marks, said event is defined by the way of evaluation [1].
The encoded (true-to-location) B-Scan may be obtained through the processing of the
signals received while scanning over the section to be displayed with probe fitted into
one-axis coordinate encoder interfaced to the instrument.
The timed (time-based) B-Scan may be obtained through the processing of the signals
received along the scanning over the section to be displayed with some probe driven
with the approximately constant speed during the certain measurement period in one
direction.

2. Thickness profile B-Scan - B-Scan(Th)

The B-Scan(Th) may be obtained with the straight beam probe either single element
or dual through the recording of the successive thickness readouts along the scanning
path or in time progress. Fig.1 is the typical example for the instrument screen while
capturing the B-Scan(Th) (all screenshots and movies in this article were obtained
using ISONIC 2001 unit manufacturer - Sonotron NDT [2]). The dynamic example
(movie) on getting B-Scan(Th) for the stepped block is available here
[182 KB].

Fig 1: Typical instrument screenshot for the

capturing of the B-Scan(Th)

The B-Scan(Th) presentation is the only possible mode of getting the cross-sectional
image for the most of known instruments however, to our regret, it is still noted as BScan in the advertising and technical literature without the additional comments.
However it's obvious that such form of presentation is not applicable to the straight
beam and angle beam pulse echo inspection based on the processing and recording of
all signals and their amplitudes.

3. Multiecho Ampliude Straight Beam Inspection B-Scan - B-Scan(A)

The B-Scan(A) may be obtained with the straight beam probe either single element or
dual through the recording of the successive echo amplitude and time of flight
multiple echo readouts along the scanning path or in time progress. Fig.2 is the typical

example for the instrument screen while capturing the B-Scan(A). The dynamic
example (movie) on getting B-Scan(A) for the test block with side drilled holes is
available here
[132 KB].

Fig 2: Typical instrument screenshot for the

capturing of the B-Scan(A)

The B-Scan(A) mode is applicable mainly to the straight beam inspection allowing to
capture the echo-amplitudes and depths for all reflectors returning the echoes
matching with the gate independently on the number of signals received in the each
one firing-receiving shot.

4. RF B-Scan (TOFD Map)

The RF B-Scan may be obtained through the capturing and recording of the
successive RF A-Scans along the scanning path or in time progress. This way of
presentation is mostly used for the TOFD technique [3]. It is important that the
instrument stores not the image but the array of successive unprocessed RF A-Scans
and the RF B-Scan is reconstructed from the said array. Fig.3 is the typical example
for the instrument screen while capturing the RF B-Scan. The dynamic examples
(movies) on getting RF B-Scan - TOFD Map for the test block with the diffractor are
available here
[210 KB] (scanning along the diffractor) and here
[192 KB]
(scanning across the difractor).

Fig 3: Typical instrument screenshot for the

capturing of the RF B-Scan - TOFD Map

Thanks to the raw data storing mechanism each A-Scan obtained along the scanning
path may be recovered at the postprocessing stage (off-line). This feature is a must for
the TOFD defects sizing and localizing of the defects tips.

5. Enhanced A-Scan with Angle and Skip Distance Correction and

Capturing and Storing of all A-Scans (B-Scan-Enh)
The most advanced B-Scan-Enh imaging will be obtained through the capturing and
recording of the successive unprocessed A-Scans along the scanning path or in time
progress. As in the above case of RF B-Scan the B-Scan-Enh presentation is obtained
through the reconstruction from the stored array of the A-Scans. This allows easy to
implement the angle and skip distance correction and to provide color grading of the
echo amplitudes.
Fig.4 is the typical example for the instrument screen while capturing the B-Scan-Enh
for the straight beam pulse echo inspection. The dynamic example (movie) is
available here
[92 KB].

Fig 4: Typical instrument screenshot for the

capturing of the B-Scan-Enh for the straight
beam pulse echo inspection

Fig.5 is the typical example for the instrument screen while capturing the B-Scan-Enh
for the angle beam pulse echo half skip inspection and the corresponding movie is
available here
[86 KB].

Fig 5: Typical instrument screenshot for the

capturing of the B-Scan-Enh for the angle

beam pulse echo half skip inspection

Fig.6 is the typical example for the instrument screen while capturing the B-Scan-Enh
for the angle beam pulse echo full skip inspection and the corresponding movie is
available here
[88 KB].

Fig 6: Typical instrument screenshot for the

capturing of the B-Scan-Enh for the angle
beam pulse echo full skip inspection

Main advantage of the B-Scan-Enh mode is the ability of the detailed off-line analysis
at the postprocessing stage including:
o Recovery of the single shot and dynamically changing A-Scans along the
scanning path
o Amplitude filtering with suppressing of the B-Scan-Enh segments
corresponding to the echo amplitudes below the variable threshold level
o Determining of the defects coordinates and projection sizes
The Fig.7 illustrates the above

Fig 7: Off-line analysis of the B-Scan-Enh

Conclusion

1. In many cases (hard access to the test object, limited space for the probe
manipulations, etc) the simplified B-Scan imaging of the separate sections of
the test object is the only solution to get some graphical record for the
inspection report.
2. The simplified B-Scan imaging of the separate sections of the test object
became the standard feature of the portable ultrasonic instruments.
3. There are the different modes of performing the simplified B-Scan imaging.
The proper mode must be selected for each inspection and recording task.

References
1. Non-destructive Testing Encyclopedia at NDT.net http://www.ndt.net/article/az/ut/bsc.htm
2. ISONIC Workstation from Sonotron NDT - A Number of Smart Inspection
Systems In One Portable Unit - Operating Manual revision 7.00 http://www.sonotronndt.com/pdf/opman70.pdf
3. Non-destructive Testing Encyclopedia at NDT.net http://www.ndt.net/article/az/ut/info/tofdp.htm