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355
P R E F E R E N T I A L S P U T T E R I N G OF OXIDES: A C O M P A R I S O N
O F M O D E L P R E D I C T I O N S W I T H E X P E R I M E N T A L DATA
J.B. M A L H E R B E
Department of Physics, University of Pretoria, Pretoria 0002, Rep. of South Africa
Experimental data on the composition of the altered layer of some oxides bombarded with
noble gas ions are compared with different model predictions based on Sigrnund's sputtering
theory. It is shown that although the difference in mass of the metal atoms is the dominant factor
in the preferential sputtering of oxygen, the additional consideration of the surface binding
energies yields an improved agreement between theory and experiment.
I. Introduction
356
where Y~ represents the component sputter yield [7] of the metal (M) or of the
oxygen (O).
From Sigmund's sputtering theory in the linear cascade regime [2] it follows
that the ratio of the component sputter yields can be approximated by
Ao]
\Uo]
'
(2)
where A, and U, denote the atomic mass and surface binding energy respectively. Substitution of (2) into (1) yields
357
Table l
Composition and thickness d of the oxygen depletion layer of the different oxides after sputtering
with 3 keV Ar + ions in the steady state region
Oxide
Decomposition
to
A1203
TiO2
ZrO 2
.
.
TizO + TiO
ZrO + Zr
(ZrO + Zr + ZrO 2)
HfO + Hf
NbO2 + NbO
TaO 2 + TaO + Ta
HfO2
Nb205
TaeO5
Surface layer
composition
(mole fraction)
Oxygen
loss
(at%)
Surface layer
thickness d
(nm)
.
X~i = 0.43
X~r = 0.62
(0.53)
X~r = 0.62
X~b = 0.47
S ~ a = 0.50
10
29
(19)
29
18
21
1.8 _+0.6
1.3 + 0.5
(2.2)
2.0 _+0.6
2.2+0.7
2.5 + 0.7
Xo ] = ( X o ]
exp~
).
(4)
358
2m =0.25
I v20~
2 MnO
3 BeO
4. ZnO
5 MgO
6 GazO 3
7 CrzO3/VO / V203
8 MoO3
g Sn02
10 FeO/Fe304/Fe20
c~
11
UM= Uo
HfO~
ZrO~
q
':d=13nm)
Ta2Ost
Co304
ZI.02I
(d=22nm) I Nb20,
2
0
X
i
0.5 ~
0.5
,11
1
1
L
1.5
[(XM/Xo)
s / (XM/Xo)
b] calc
Fig. 1. The experimentally determined surface composition ratios of the altered sputtered layers
XM/Xo)b]calc
as calculated from eq. (3) when only mass effects are taken into account, i.e. when UM ~- Uo for
2rn = 0.25.
the range 3500 to 4500 K (i.e. 0.3 < k T (eV) < 0.4). He explains the preferential sputtering of oxides in terms of the stability and decomposition of the
various oxides at these temperatures.
In eq. (4), the surface composition ratio of the sputtering surface depends
exponentially on the surface binding energies. Thus, a relatively small difference in the individual values taken may make a tremendously large difference in the predicted composition ratio.
However, it is unlikely that spike sputtering is the dominant process during
the sputtering of oxides. A better fit between theory (i.e. eq. (3) or (4)) and
359
experiment is obtained for a value of the factor 2m other than 0.5 which is the
value applicable to spike sputtering (see section 2.3).
x+y
D(M-M)+
x+y
D(0-0)+
x+y
D(M-O)
o)2,
where D ( M - M ) denotes the m e t a l - m e t a l bond energy, D ( O - O ) the dissociation energy of the oxygen molecule and D ( M - O ) the m e t a l - o x y g e n bond
energy of the di-atomic oxide MO. The mean energy required to remove only
an oxygen atom from this molecule will, to a zeroth order, exclude the
m e t a l - m e t a l bond energy term and will, therefore, be given by
Uo=
x+yXD(M-O) + x+yYD(O-O) + (
M-
2.
(5)
The bond energies in eq. (5) were obtained from ref. [16] while the electronegativities e were obtained from ref. [17].
In the case of TiO 2, BeO, MgO and ZrO 2 the dissociation energy required
to remove a single oxygen atom from the oxide molecule is tabulated by
Samsonov [18]. Therefore, for these oxides the tabulated values were taken.
In the case of binary alloys the surface binding energy U M of a metal atom
is usually taken to be equal to the sublimation energy H s of the metal [19]. In
this case of oxides the value for the surface binding energy must be modified
to account for the effect of the chemical binding energy between the metal and
oxygen atoms. Once again an approach similar to the Pauling scheme using
360
(6)
In table 2 the values used to approximate the surface binding energies of the
metals as well as the oxygen are summarized.
For the case when mass difference effects are ignored, i.e. A M = A o, Blaise
[20] used an equation which is equivalent to setting 2m = 0 in eq. (3). It is,
however, obvious that for most of the oxides considered in this paper, the
mass difference effects cannot be ignored. This view is supported by the
results presented in fig. 2.
2.3. Combined mass and binding energy effects
In fig. 3 the results are shown for the case when both the mass difference
and surface binding effects according to Sigmund's theory of sputtering in the
linear cascade regime (eq. (3)) are included. The exponent parameter 2m = 0.33
(i.e. m = 0.165) was chosen in accordance with the range suggested in the
li.terature [2,7] and since it gives a satisfactory fit to the experimental results of
table 1.
The case of BeO, MgO and A1203 are particularly interesting since the
atomic masses of these metals are comparable to that of the oxygen atom. In
table 2 the model calculations according to eqs. (3), (5) and (6) show a
considerable enrichment of oxygen during ion b o m b a r d m e n t in the cases of
BeO and MgO. In ref. [18] the dissociation energies required to remove a
single oxygen atom from certain oxide molecules are tabulated. If these values
for BeO and MgO are taken for Uo in eq. (3) the calculated values show only a
slight enrichment of oxygen during ion bombardment. However, as pointed
out by Taglauer and Heiland [21] this enrichment probably could result in
spontaneous desorption of oxygen. Whereas no reduction effects have been
published for MgO, a light reduction of BeO has been observed [21] with AES
(where electron induced desorption can occur).
In the case of A1203 the model calculation according to eq. (5) and the
tabulated energy in Samsonov [18] give nearly the same value for the oxygen
binding energy term Uo. From table 2 it can be seen that the predicted values
are in excellent agreement with the measured value. However, in the cases of
ZrO 2 and TiO 2 better agreement between theory and experiment is obtained if
the tabulated oxygen dissociation energy is taken. Unfortunately, Samsonov
[18] lists these energies only for a few oxides.
Cr203 and Ga203 have been reported as non-reducible by ion b o m b a r d ment [22-24], which is in contrast to the prediction of 25% oxygen loss. It is
interesting to note that the lack of suboxides in both systems requires detailed
and quantitative measurements because changes in the shape of AES or XPS
peaks may not be observable.
361
Table 2
A compilation of the experimentally determined composition of the altered layer of different
oxides (from refs. [3-7,11] and the parameters used in the calculations
Molecule
BeO
BeO
MgO
MgO
A1203
A1203
SiO 2
TiO 2
TiOe
VO
V203
V205
Cr203
MnO2
FeO
Fe304
Fe203
CO304
ZnO
Ga203
ZrO2
ZrO 2
Nb205
MoO3
SnO 2
HfO 2
Ta205
AMa)
Se b>
EN c)
D(M-O)
Surface BE d)
(XM/Xo)S/(XM/Xo)b
(amu)
D(M-M)
(eV)
e
(eV)
(eV)
UM
(eV)
Uo
(eV)
Calc.
Exp.
9.01
9.01
24.31
24.31
26.98
26.98
28.09
47.90
47.90
50.94
50.94
50.94
52.00
54.94
55.85
55.85
55.85
58.93
65.37
69.72
91.22
91.22
92.91
95.94
118.69
178.49
180.95
3.39
3.39
1.53
1.53
3.39
3.39
4.70
4.89
4.89
5.34
5.34
5.34
4.12
2.91
4.34
4.34
4.34
4.43
1.35
2.82
6.34
6.34
7.49
6.89
3.12
6.31
8.11
1.47
1.47
1.23
1.23
1.47
1.47
1.74
1.32
1.32
1.45
1.45
1.45
1.56
1.60
1.64
1.64
1.64
1.70
1.66
1.82
1.22
1.22
1.23
1.30
1.72
1.23
1.33
4.24
0.00
4.17
0.00
4.64
0.00
8.16
7.28
0.00
6.47
6.47
6.47
4.43
4.21
4.30
4.30
4.30
3.79
2.86
3.04
7.89
0.00
7.03
5.08
5.43
7.64
8.59
5.45
5.45
4.11
4.11
5.45
5.45
6.25
7.27
7.27
7.44
7.44
7.44
6.00
4.71
6.07
6.07
6.07
6.05
3.04
4.23
8.94
8.94
10.07
9.31
4.70
8.89
10.46
6.76
4.66*
7.24
4.43*
7.01
7.07"
7.71
8.24
6.68*
7.92
7.79
7.64
6.75
6.65
6.46
6.52
6.55
6.19
5.70
5.72
8.67
7.20"
8.27
7.56
6.83
8.56
8.49
0.72
0.92
0.79
1.09
1.00
1.00
1.05
1.32
1.52
1.41
1.42
1.44
1.36
1.19
1.45
1.44
1.44
1.51
1.04
1.33
1.81
2.05
2.04
2.08
1.51
2.27
2.56
1.00
1.00
1.00
1.00
1.00
1.00
1.00
1.50
1.50
1.00
1.00
1.67
1.00
1.34
1.05
1.05
1.05
1.33
1.00
1.00
2.26
2.26
2.22
1.50
1.00
3.26
2.50
The heats of sublimation of the metals were obtained from refs. [26,27] and the binding energies
D ( M - O ) of the di-atornic molecule MO were obtained from spectroscopic or mass spectrometric
data summarised in ref. [16]. The values indicated by an asterisk are the tabulated [18] dissociation
energy required to remove a single oxygen atom from the oxide molecule. The binding energy
D ( O - O ) of the oxygen molecule was taken to be equal to 5.16 eV. The electronegativities were
obtained from Luder [17] and the value 3.50 eV was used for oxygen.
AM := atomic mass.
b) SE = sublimation energy.
~') EN = electronegativity.
a) BE = binding energy.
a)
362
AM =
I v2os
2 MnO2
3 BeO
Ao
2m =0
, ot2 ]
ZnO
5
6
7
8
9
10
11
MgO
Ga2Os
Cr203
VO
SnOz
FeO
Co30,
12 MoO3
Fe30~/Fe20~
14 V~O~
Q.
I//~d:z2nm
".0,il'r0
Ta,O~
13
2,
(d =13nm
1~i02~
J lle I
.12
~S8
0.5
[(XM/Xo)S
15
/ ( X M / X o ) b] calc
collected in table 3 for comparison with the predictions using eq. (3).
Results from Naguib and Kelly [25] for different oxides by high energy ion
bombardment (40 keV) and by using electron microscopy for analysis are also
included in table 3. However, it is felt that this type of study is not
representative because generally a mixture of different phases occurs which are
not distinguishable by electron diffraction.
363
2m = 0.33
I v20s
MnOz
3 BeO
4 ZnO
5 MgO
6 OazO 3
7 CrzO3
8 VO / V203
9 Sn02
I0 FeO/Fe30~ /Fez03
2
CL
X
to
o
X
,,o,
11 Co30,
12
MoO3
Nb20s
X
cO
le
o
X
12
2,//" 'Jll
AI20,1.,~5,
L------.J
Io
6"Tt;e 9
'SiO,
[(XM/Xo) s / (XM/Xo)b]
3
calc
364
Table 3
Comparison between predicted and qualitative observed composition changes of oxides by noble
gas ion bombardment (adapted from Betz and Wehner [7])
Oxide
Prediction
eq. (3)
2m =0.33
Observations
TiO
Ti203
CoO
C0203
NiO
Ni 203
Cu20
CuO
GeO2
NbO
NbO 2
RuO2
Ag20
Ti enrichment (AES)
No reduction (400 eV Ar + )
Co enrichment
CoO mainly
Ni enrichment (400 eV Ar + )/no reduction (3 keV Ar + )
Ni enrichment (400 eV Ar ~ )
Cu enrichment (XPS)/light O enrichment (AES)
Cu enrichment
SnO
WO2
WO3
PbO
Ti302
TiOH5
C000.65
CoO
NIO0.65
NiO
Cu00.36
CuO0.73
Oe203
Nb20
NbO
RuOo.86
Ag40
AgOo89
Sn302
WOo.72
WO
PbOo,61
PbO2
PbO1.24
Bi 203
BiOosv
Ag 203
Nb enrichment
Nb enrichment
Ru enrichment (400 eV Ar +, XPS)
Ag enrichment (400 eV Ar +, XPS)
Ag enrichment (400 eV Ar +, XPS)
W enrichment (400 eV Ar +, XPS)
WO2 + W (400 eV Ar +, XPS)/W enrichment
Pb enrichment (400 eV Ar +, XPS)/no reduction
Pb enrichment (400 eV Ar +, XPS)
Bi enrichment
VM
Vo
X ,D(M-M) + Xo D(M-O)
X D(M-O) + x b D ( o - o )
3. Conclusions
The preferential sputtering of the oxides considered in this paper can be
q u a n t i t a t i v e l y explained to a reasonable degree of accuracy b y using S i g m u n d ' s
e q u a t i o n for cascade sputtering. It is shown that the p r e p o n d e r a n t effect for
the preferential sputtering is the difference in mass b e t w e e n the metal a n d
365
References
[1] H.H. Andersen, J. Vacuum Sci. Technol. 16 (1979) 770.
[2] P. Sigmund, in: Sputtering by Particle Bombardment, Ed. R. Behrish (Springer, Berlin, 1981)
ch. 2.
[3] S. Hofmann and J.M. Sanz, J. Trace Microprobe Tech. 1 (1982-83) 213.
[4] S. Hofmann and J.M. Sanz, Microchim. Acta Suppl. 10 (1983) 135.
[5] J.M. Sanz, PhD Thesis, Stuttgart University (1982).
[6] S. Hofmann and J.H. Thomas III, J. Vacuum Sci. Technol. B1 (1983) 43.
[7] G. Betz and G.K. Wehner, Sputtering by Particle Bombardment II, Ed. R. Behrish (Springer,
Berlin, 1984) ch. 2.
[8] H. Shimizu, M. Ono and K. Nakayama, Surface Sci. 36 (1973) 813.
[9] P.S. Ho, J.E. Lewis and W.K. Chu, Surface Sci. 85 (1979) 19.
[10] T. Ishitani and H. Jamura, Radiation Effects Letters 43 (1979) 149.
[11] D.F. Mitchell, G.I. Sproule and M.J. Graham, J. Vacuum Sci. Technol. 18 (1981) 690.
[12] P.K. Haft, Appl. Phys. Letters 31 (1977) 259.
[13] R. Kelly, Nucl. Instr. Methods 149 (1978) 553.
[14] R. Kelly, Surface Sci. 100 (1980) 85.
[15] L. Pauling, The Nature of the Chemical Bond, 3rd ed. (Cornell Univ. Press, Ithaca, NY,
1960).
[16] J.A. Kerr and A.F. Trotman-Dickenson, CRC Handbook of Chemistry and Physics, Ed. R.C.
Weast, 53rd ed. (CRC Press, Cleveland, OH, 1972) pF-183.
[17] W.F. Luder, The Electron-Repulsion Theory of the Chemical bond (Reinhold, New York,
1967) p. 33.
[18] GV. Samsonov, The Oxide Handbook, 2nd ed. (IFI-Plenum, New York, 1982) pp. 86-92.
[19] J.-C. Pivin, J. Mater. Sci. 18 (1983) 1267.
[20] G. Blaise, in: Material Characterization Using Ion Beams, Eds. J.P. Thomas and A. Cachard
(Plenum, New York, 1978) p. 143.
[21] E. Taglauer and W. Heiland, in: Proc. Syrup. on Sputtering, Perchtoldsdorf/Vienna, Eds. P.
Varga, G. Betz and F.P. Viehb/Sck (1980) p. 423.
[22] N.S. Mclntyre and D.G. Letaruk, J. Vacuum Sci. Technol. 14 (1977) 181.
[23] C.C. Chang, B. Schwartz and S.P. Murarka, J. Electrochem. Soc. 124 (1977) 922.
[24] K.S. Kim, W.E. Baitinger, J.W. Amy and N. Winograd, J. Electron Spectrosc. Related
Phenomena 5 (1974) 351.
[25] H.M. Naguib and R. Kelly, Radiation Effects 25 (1975) 79.
[26] A.J. Moses, The Practizing Scientists Handbook (Van Nostrand-Rheinhold, New York,
1978) ch. 2.
[27] R. Hultgren, R.L. Orr, P.D. Anderson and K.K. Kelly, Selected Values of Thermodynamic
Properties of Metal and Alloys (Wiley, New York, 1963).
[28] H.H. Brongersma, M.J. Spaarnay and T. Buck, Surface Sci. 71 (1978) 657.
[29] F.L. Williams and D. Nason, Surface Sci. 45 (1975) 377.
[30] H.H. Andersen, in: Ion Implantation and Beam Processing, Eds. J.S. Williams and J.M.
Poate (Academic Press, Sydney, 1984) ch. 6.