Escolar Documentos
Profissional Documentos
Cultura Documentos
Threats
in
Computer-Based
Assessment
TAO
Days
2013
Bern
(Switzerland)
-
October
1-2,
2013
herve.cholez@tudor.lu
patrick.plichart@taotesHng.com
Conclusion
Introduction
As
Server failure
Man in the middle attack
SQL injections
DDoS attacks
Conclusion
Intro
IT Risks
Conclusion
Intro
IT Risks
There
exist
encrypHng
standards
like
SSL
or
TLS
to
transfer
sensiHve
data
via
HTTPS
Conclusion
Intro
IT Risks
Captcha
Conclusion
Intro
IT Risks
Conclusion
Intro
IT Risks
Communicate on assets
Communicate on risks
Conclusion
Intro
IT Risks
Conclusion
Intro
Conclusion
Intro
Conclusion
Intro
Items design
Dynamic QuesHons
Conclusion
Intro
A
web
monitoring
Try
to
remove
this
illegal
disclosure
Through
simple
leRers
or
through
invoking
policies
Conclusion
Intro
Conclusion
Intro
Conclusion
Intro
Conclusion
Intro
mouse
acHons
Invasion
of
the
user
right
to
privacy,
thus
test-takers
should
know
that
they
will
be
monitored
and
give
wriRen
consent
StaHsHcal
detecHon
of
answer
copying
([Frary1977],
[Bellezza1989],
[Bay1995],
[Wollack2004])
assessments [Cizek2001]
Conclusion
Intro
their
tests
bank accounts)
Conclusion
Intro
Conclusion
Intro
response,
one-Hme
passwords,
etc
badges, etc
Conclusion
Intro
Conclusion
Intro
ConHnuous authenHcaHon
Video
monitoring
Fingerprint
mouse
Mouse
and/or
keystroke
analyse
Conclusion
Intro
224 References
Legend:
-
Not
covered
or
very
briey
exposed
+
ParHally
covered
++
Playing
a
central
role
Conclusion
Intro
Conclusion
Intro
Main concerns:
Results
integrity
cheaHng
Test
takers
integrity
authenHcaHon
Test/item
condenHality
brain
dump
Lacks:
Availability
classical
security
Results
condenHality
Isolated
soluHons:
Research
works
focus
on
specic
risk/context
Intro
Intro
Future Work:
Intro
Contexts variables:
SummaHve
purpose
/
FormaHve
purpose
/
Low
stake
High
stake
/
Small
scale
Large
scale
/
PopulaHon
scope
Individual
scope
/
Manual
scoring
AutomaHc
scoring
Centralized
collecHon
/
Decentralized
collecHon
/
Physical
delivery
Network
delivery
/
Low
exposure
High
exposure
herve.cholez@tudor.lu
patrick.plichart@taotesting.com
contact@tao.lu