Basic Protection Courses Notes 2008 TU2.22 Rev2

Substation Safety and Protection Testing Principles
1.1
Substation Safety and Protection Testing

Principles
Safety
1. Only authorised personnel is allowed to enter and/or work in a
substation.
2. The persons doing so must adhere to the Operating Regulations for
High Voltage Systems (ORHVS) at all times.
3. When entering a substation observe all potential hazard, i.e. Live
Chambers, Construction Sites, etc.
4. Always wear appropriate Personal Protection Equipment (PPE), i.e.
hardhat, safety boots, overall etc. when entering the HV yard.
5. Before work can commence the equipment must be made safe to
work on by an authorised person.
Before working on any HV equipment make sure that the equipment is:
1. Isolated
2. Safety tested
3. Earthed
4. Barricaded
5. Permit issued
6. Workmen's Declaration signed
Remember: You are responsible for your own life as well as all action you
take!
1.2
Dos and Dont When Testing Protection Schemes

1. Make sure that the protection panel you are going to work on is made
safe - as described above.
2. Always use the settings directly from a settings sheet, i.e. do NOT
read settings from the relay. In this way the testing will verify that the
settings on the settings sheet and relay correspond.
OMICRON Test Universe 2.22
3. A current transformer should never be open-circuited while current is

passing through the primary winding.
If the burden is removed from the secondary winding while current is
flowing, most of the primary winding current becomes magnetizing
current, but the phase angle changes in such a way as to keep the
total current in the primary the same as before. As the main circuit is
now mostly magnetizing current, the flux in the core increases to a
high level and a very high voltage appears across the secondary
terminals. Due to the high turns ratio, the voltage in this unsafe mode
of operation can reach dangerously high levels, which can break
down the insulation, be a hazard to personnel and last but not least
cause the current transformer to destroy itself.
4. Disable the breaker fail/bus-strip signal from the panel that is under
test to the buszone panel by selecting the Test Normal Switch (TNS)
to Test or disconnect the signal wires going to the buszone panel.
Failing to do this can inadvertently trip the whole substation.
5. First pull the Current Transformer (CT) test block cover Figure 1-1
before the Voltage Transformer (VT) test block cover Figure 1-2.
Impedance and directional overcurrent protection relays will issue a

trip if this is done in the wrong sequence under live conditions
because the relay will then measure current without any voltage
which will appear as a close-up fault to the relay.
Figure 1-1: Four pole CT

test block
TOP (Relay Side)
Red
White
Blue
Neutral
BOTTOM (CT Side)
Substation Safety and Protection Testing Principles
Figure 1-2: Four pole VT

test block
TOP (Relay Side)
Red
White
Blue
Neutral
BOTTOM (VT Side)

6. Ensure that the CT test plug is fitted with shorting strips before
inserting it into the test block - Figure 1-3. This will prevent the CT
from being open-circuited when testing under live conditions.
Figure 1-3: Four pole CT
test plug (PK-2)
Shorting Strips
7. Ensure that the VT test plug does NOT have shorting strips - Figure
1-4. Shorting the VT secondary will cause the VT fuse to blow and/or
be damaged.
Figure 1-4: Four pole VT
test plug (PK-2)
NO! Shorting Strips
Configuration and Utilities
2
2.1

System Settings
The System Settings menu provides entry fields for system-wide default
settings.
2.1.1
Opening the System Settings menu

1. Open the OMICRON StartPage.
2. Under the Setup menu select System Settings.
3. Select User Information. Update the Username, Manager and

Company text fields as required. These text fields will be filtered
trough to the Document Properties of the Control Center
documents.
Figure 2-1: User
Information
4. Select Directories - Figure 2-2 1. These are the shortcuts to the

default directories for test documents, Control Center, Test Wizard
templates, etc.
5. The shortcuts to the default directories can be changed by clicking on
the Change Directory button - Figure 2-2 2 and browsing for the
folder - Figure 2-3. "File Save" - Figure 2-4 1 and "File Open" - Figure
2-5 1 commands also use these default directories, making browsing
easier.
Figure 2-2: Directories
1
Figure 2-3: Folder browser
6. Two user defined shortcuts to user specific test document directories

can be added in the "Additional Test Document Directories" by
clicking in the Name field and typing in the name of the new shortcut
- Figure 2-2 3. Click on the target button - Figure 2-2 4 and browse
for the new folders location - Figure 2-3.
You can quickly change to the two directories specified here with
"personalized" buttons in the "File Save" - Figure 2-4 1 and "File
Open" - Figure 2-5 1 dialogs. The names specified will label those
buttons, and all it takes is one mouse-click to browse to the respective
directory.
Figure 2-4: File Save As

dialog
Figure 2-5: File Open

dialog
7. The default phase names for all the Test Modules can be changed by
clicking on Phase Names - Figure 2-6 1 and selecting the required
format in the relevant check boxes. The phase names can also be
customized by selecting the "Custom" check box and enter the

names of your choice - Figure 2-6 2.
Note: Use single or double letter labels only
Figure 2-6: Phase Names
8. To change the nominal values off all Test Modules, click on Default
Values - Figure 2-7 1 and define the default values for the phasephase voltage, the nominal current and frequency of the system in the
"Nominal Values menu - Figure 2-7 2.
9. The values entered here under "Limits" are software limits imposed in
terms of voltage and current for all default Test Objects - Figure 2-7
3.
10.In "Report" define the default setting for the test reports. Reports can
be set to a Short form or a more comprehensive Long form Figure 2-7 4.
11. Under "Binary Inputs" enter the default DC voltage value for a wet
(voltage applied) binary inputs - Figure 2-7 5. The value set here will
appear in the Hardware Configuration as the Nominal Range value.
12.The "Potential Free" check box - Figure 2-7 6, pre-selects whether
the binary inputs are wet (voltage applied) or dry (potential-free). This
pre-selection is reflected on the Binary / Analog Inputs tab's of the

hardware configuration.
The default values defined on the Default Values page are generic
settings meant for all Test Modules. If test object specific values
deviate from these generic settings, these can be changed in the
Device Setting and Hardware Configuration of the actual Test
Module.
Figure 2-7: Default Values
1
3
OMICRON News is an information service that provides you with

relevant messages concerning your actual Test Universe installation
updates and general OMICRON product information. The news also
include non-Test Universe product lines such as the CP line for
primary testing, CT Analyzer, FRAnalyzer and so on. This service is
based on the RSS Dynamic Bookmark Technology. To use this
service, your computer needs access to the Internet.
13.The OMICRON News settings can be changed by clicking on the
News Window Settings tab - Figure 2-8 1 and selecting the required
Show News notification option - Figure 2-8 2.
Figure 2-8: News Window

Settings
1
14.The latest news can be viewed by clicking on the Show News Now...
button - Figure 2-8 3.
Figure 2-9: OMICRON
News
)
10
The PC must be connected to the internet for latest news reports.
2.2
Adding License Files

This chapter describes how to add a new/updated Omicron license to an
existing master license file on a personal computer (PC).
)
2.2.1
A new license file omicron.lic is issued for every new Omicron purchased.
The license file is included on the software CD supplied with the unit. The
license file can also be e-mailed to the user on request.
Opening the License Manager menu

2. Under the Setup menu select License Manager.
3. Click on Browse - Figure 2-10 1.

Figure 2-10: Browsing for
license file
1
4. Browse for the location of the folder that contains the new or updated
Omicron license file - Figure 2-11 1.
5. Select the folder and click on OK - Figure 2-11 2.
11
Figure 2-11: Browse for

Folder
6. Click on Search - Figure 2-10 2.

Figure 2-12: Search for
license file
7. The new license file will be displayed underneath the existing master
license file in the path window Figure 2-12 1.
8. Select the new license file and click on Merge file - Figure 2-13 1.
12
Figure 2-13: Merge license

file
9. Close the window.
The new license file is now added to the master license file and the Omicron
test set is ready for use.
13
2.3
NET-1 Configuration for CMC256

This chapter describes how to configure a CMC256 that is equipped with the
NET-1 option.
2.3.1
Opening the Test Set Configuration menu

2. Under the Setup menu select Test Set Association.
3. Click on Search - Figure 2-14 1 if no device is already detected.

Figure 2-14: Test Set
Association
1
4. Select the test set that you want to associate with your Personal
Computer - Figure 2-14 2 and click on Associate - Figure 2-14 3.
5. After the Associate CMC 256-6 (???????) prompt is displayed Figure 2-15, press the Associate button on the back of the CMC 256
- Figure 2-16 1.
Figure 2-15: Press
Associate button prompt
14
Figure 2-16: Associate

button on back of CMC
256
6. Click on OK - Figure 2-15 3.

Figure 2-17: Test Set
Associated to PC
1
7. The test set will now be associated with your PC - Figure 2-17 1 and
is ready for use.
8. Close the Test Set Association and Configuration window and
continue using the test set as usual.
15
2.4
Auxiliary DC for CMC256

This chapter describes how to use the auxiliary DC on the Omicron
CMC256.
)
2.4.1
The Auxiliary DC is very useful when testing a protection relay in a

laboratory environment. The DC voltage can be set from 0 to 264 V with a
maximum power of 50 W.
Defining the Output DC voltage

2. Under the Test Tools menu select AuxDC.
Figure 2-18: Set AuxDC

with sliding scale
2
3. Click on the sliding scale and drag to required voltage - Figure 2-18 1
4. Click on Set - Figure 2-18 2.
5. Alternatively drag the scale to Other - Figure 2-19 1 and define the
required voltage in the field - Figure 2-19 2.
16
6. Click on Set - Figure 2-19 3.

Figure 2-19: Set AuxDC
with Other
3
1
2
7. By selecting Default means that immediately after the CMC 256 is

powered up and switched ON, this DC voltage is injected on the
auxiliary DC voltage output, regardless whether a PC is connected to
it or not - Figure 2-19 4.
17
2.5
Hardware Check Logfile

This chapter describes how to locate the hardware check file
(HWCHECK.LOG).
Everytime the Omicron CMC is switched on and a software module is

started, a self diagnostic test is performed on the hardware. The results of
this test are saved in a text file on the PC.
If the CMC for some reason failed the HWCHECK.LOG might provide the
necessary information as to what the failure might be.
On request this file needs to be e-mailed to Omicron Customer Support for
analysis.
2.5.1
Opening the Hardware check file

2. Under the Support menu click on Calibration & Diagnosis... and
select Hardware Check.
Figure 2-20: HW check file
18
3. Select File|Save As....

4. Browse for a location to save the file under a unique file name.
5. Click on Save.
6. E-mail this file to Omicron Support on request.
19
2.6
Software Communications Logfile

This chapter describes how to generate a logfile from the Omicron software.
In addition to the hardware check file a software communications logfile

might be requested from Omicron Support to analyze the Omicron software
and its communication to the CMC.
2.6.1
Open the CM Engine Log Viewer

2. Under the Support menu click on Calibration & Diagnosis... and
select Log File.
3. Select Edit|Logging On (Debug) in the CM Engine Log Viewer

Figure 2-21 1.
Figure 2-21: Logfile
4. Minimize the CM Engine Log Viewer window. Note to not close this
window, as it keeps on running while you leave it open.
20
5. Start QuickCMC from the OMICRON StartPage.

6. Return to the CM Engine Logfile Viewer.
7. Select File|Save
8. In the File Save As dialog browse for a location to save the file.
9. Rename the file and click on Save -Figure 2-22 1.
Figure 2-22: Saving the
Logfile
10.E-mail this file to Omicron Support on request.
21
22
QuickCMC
Manual Testing with QuickCMC

QuickCMC is a test module that can be used to output analog voltages and
currents and / or binary signals statically, i.e. in steady state.
In addition, the CMC binary inputs are monitored. Basic timing
measurements can be performed using these inputs.
QuickCMC is simple and intuitive to use. The StartPage of the OMICRON
Test Universe provides a hyperlink for starting QuickCMC in stand-alone
mode.
Figure 3-1:
QuickCMC user interface
23
3.1
QuickCMC Features
y Numeric or graphic specification of analog voltages and currents for
up to 16 generators in terms of amplitude, phase angle and
frequency.
y Nine modes of operation
-
Direct (Line to Neutral): this mode reflects the "traditional"

QuickCMC functionality of setting generators independently. All
generators and their combinations can be stepped in the
step/ramp section to perform for example, pick-up or drop-off
tests.
Line-Line: same as the Line to Neutral but sets and ramps the
voltage as line to line voltage.
Symmetrical Components
Power
Fault values (supports Impedance Plane view)
Z mode with constant test current (supports Impedance Plane

view)
Z mode with constant test voltage (supports Impedance Plane

view)
Z% mode with constant test current (supports Impedance Plane

view)
Z% mode with constant test voltage (supports Impedance Plane

view)
y Manual or automatic step (Auto-step) of the analog output quantities.

y Monitoring of binary inputs. The first state transition of any binary
input after the last change of any output is timed.
y Manual setting of binary outputs.
y Display of the measured values for the DC analog inputs (20mA or
10V).
y User-defined report and assessment.
y The Unit Manager function allows:
24
toggling between Primary and Secondary values using the

entered CT and VT ratios.
toggling between Absolute and Relative values using the entered

nominal values for voltage, current and frequency.
QuickCMC
3.2
toggling time measurements between Seconds and Cycles
QuickCMC Views
QuickCMC comprises of a total of four views:
Testview
used for defining the quantities of the

output values.
Vector Diagram
a graphical tool for displaying the output,

input, line to neutral, line to line,
symmetrical,power, fault values and fault
impedance of the defined analogue
outputs.
Impedance View
a graphical tool for displaying the R/X

plane.
Report View
3.3
used to view the report.
Unit manager
The unit manager is used to toggle the displayed values as described
below:
Time in seconds
used for displaying all time measurements

and settings in seconds.
Time in cycles
used for displaying all time measurements

and settings in cycles (time/(1/fnom)).
Absolute value
used for displaying the absolute values, i.e

Volts, Amps, Hertz etc.
Relative value
used to display the relative value in respect

of the nominal values defined in the Device
Settings.
25
Secondary value
used for displaying the injected values as

secondary values
Primary value
used for displaying the injected values as

primary values, by applying the CT and VT
ratios.
26
QuickCMC
3.4
QuickCMC Example: Pick-up and trip time

Task
An under-voltage relays pick-up, drop-out, and trip times need to be
tested. As the test is to be conducted manually, no automatic test is
necessary. A report should be compiled.
Solution
The OMICRON Test Universe offers the test module QuickCMC to
perform manual tests. QuickCMC offers the advantage, that it is
simple and easy to operate. Yet it provides the functionality to
independently adjust up to sixteen voltage or current generators in
terms of amplitude and phase angle, to vary the system frequency, to
manually step or automatically ramp all quantities and to perform
simple timing tests. A vector diagram shows the specified analog
output quantities graphically. A reporting function is incorporated.
QuickCMC is designed to be used for quick and easy tests, and is
ideally used stand alone, although it can also be used as part of the
OMICRON Control Center.
3.4.1
Establishing the Wiring Between the Relay and the CMC

Please ensure that the correct operating procedures and test
instructions for your company with respect to testing of relays are
followed and adhered to.
For this example the relay is assumed to be tested stand-alone, i.e. it
is not connected to the electrical system in any way. It is also
assumed, that a CMC 256 is used to inject the voltages and currents
to the relay.
1. Connect the voltage inputs of the relay to the corresponding voltage
outputs of the CMC.
2. Connect the trip signal of the relay to binary input 1 of the CMC.
3. A detailed wiring configuartion is shown in Figure 3-2 on page 28.
27
Figure 3-2:
Wiring Diagram between
Omicron CMC256 and
Relay
Trip
IA
IB
IC
IN
VA
VB
VC
28
QuickCMC
3.4.2
Starting QuickCMC
2. Under Test Modules click on "QuickCMC".
3. Open the Test View by selecting View|Test.
3.4.3
Entering the Test Object Parameters

1. Select "Parameters|Test Object".
2. Open the Device Settings menu by double clicking on the Device
block - Figure 3-3 1 or by selecting the Device block and clicking on
Edit - Figure 3-3 2.
29
Figure 3-3:
Test Object
3. Enter the parameters on the "Device Settings" page - Figure 3-4.

Figure 3-4:
Test Object parameters
4. Click "OK" to close the Device Settings parameters - Figure 3-4 1.

5. Click OK to close the Test Object - Figure 3-3 3.
30
QuickCMC
3.4.4
Configuration the Hardware

1. Select "Parameters|Hardware Configuration".
Figure 3-5:
Hardware Configuration
2. Select the test equipment hardware used (CMC test set and
amplifiers) - Figure 3-5 1.
The selected hardware configuration is summarized in Figure 3-5 2.

If the hardware was disconnected from the CMC software, or if it was
not yet switched on when the software was started, or communication
was lost for whatever reason, the communication to the CMC can be
re-established by clicking on the Search button - Figure 3-5 3.
The present hardware configuration settings can be exported to (or
imported from) other test modules - Figure 3-5 4.
3. Click on Details to configure the outputs of the selected hardware Figure 3-5 5.
31
Figure 3-6:
Output Configuration
Details
1
4. Select the output configuration of the hardware used - Figure 3-6 1.
Note: Figure 3-6 2 illustrates the wiring of the outputs for the
selected configuration.
The compliance voltage of the current outputs of a CMC 156 and
CMC 256 can be controlled manually - Figure 3-6 3. By default the
compliance voltage is set to maximum enabling the testing of high
burden relays. When injecting low burden test objects for long
periods, e.g. numerical energy meters, it might be desirable to reduce
the compliance voltage to reduce the amount of power and resulting
heat generated inside the linear amplifiers. Too much heat generation
might result in an unexpected over temperature shutdown.
5. Click OK to return to the Hardware Configuration - Figure 3-6 4.
6. Click on the Analogue Outputs page.
32
QuickCMC
3.4.5
The Analog Outputs Page

The analog Outputs page is used to define all analog outputs. This is CMC
hardware dependent, i.e. it is different for a CMC 56, CMC 151, CMC 156 or
CMC 256.
Figure 3-7:
Analog Outputs page
Even though the table
rows are arranged in
alternating yellow- and
white-colored blocks with
three lines each, this
grouping does not
necessarily represent
functional blocks, e.g.
CMC output triples.
1
3
5
2
As defined in the Output

Configuration Details
dialog, there is one
voltage and one current
triple available.
Figure 3-7 1
The physical test equipment terminals of the outputs

configured are shown in the columns of the hardware
configuration matrix.
Figure 3-7 2
The wiring matrix graphically illustrates which test signal is

connected to which test equipment hardware terminal. If
connections need to be changed, instead of swapping the
actual test leads, the connections can be swapped in this
wiring matrix.
A connection is made by left-clicking into the appropriate
field. Clicking into the same field again, de-connects the
signal.
Figure 3-7 3
The Test Module Output Signal defines the analog input

signal required by the relay (or test object) under test. This
could be a generic description when a generic test module
is used (e.g. V A-N in QuickCMC), or a test module specific
signal when a relay specific test module is used (e.g. Iprim
33
A in a differential test modules). A list of pre-defined names

is available via a drop-down list.
Figure 3-7 4
Display Name is the name for the test signal that is

connected between the test object input terminal and the
test equipment output terminals - as defined in the wiring
matrix. Normally this name is the same as the Test Module
Output Signal. A custom or user specific name can be
defined, if the predefined list of names does not provide the
signal name required or if an ambiguity exists between
different Test Module Output Signals.
Figure 3-7 5
Connection Terminal is an optional field used to document

the terminal to which a test signal is connected on the test
object. This could be either a relay panel connector, or the
connector on the relay itself. Such information improves the
completeness and thus the quality of the test report. If no
terminal details are available, this field may be left blank.
Figure 3-8:
Visualization of the terms
Connection Terminal and
Display Name.
Test
Object
VOLTAGE OUTPUT
1
AUX DC
3
BINARY OUTPUT
ANALOG DC INPUT
0.. 20mA
0.. 10V
CURRENT OUTPUT A
1
BINARY / ANALOG INPUT

1
10
CURRENT OUTPUT B
1
The column for the common terminal (N) of a CMC is provided to

document the physical connection of this terminal to the test object.
Note, that no test module output signal can be defined for such a
connection.
Right-clicking on one of the Row selection buttons of the wiring matrix
opens a context-menu allowing you to add, insert, or delete test
signals, i.e. a row in the wiring matrix.
34
QuickCMC
1. Define the test module output signals required for each analogue
output - Figure 3-7 3.
2. Define suitable names for each test signal - Figure 3-7 4.
3. Enter the terminal connection references - Figure 3-7 5.
4. Click on the Binary / Analogue Inputs page.
3.4.6
The Binary / Analog Inputs Page

The Binary / Analog Inputs page is used to specify how the binary inputs are
being used. The type of inputs available is CMC hardware dependent.
Figure 3-9:
Binary / Analog Inputs
page
1
2
3
1. Select the mode of the binary input - Figure 3-9 1. For testing of
protective relays, i.e. timing of the relay output contacts, the binary
inputs need to be configured as Binary. For the testing of energy
meters, the inputs need to be configured as Counter. For the CMC
256 with the Enerlyzer option, the inputs can also be configured as
analogue voltage or current inputs in conjunction with the Enerlyzer
software.
2. Define the mode of the binary inputs, i.e. is the signal from the relay
potential free or voltage sensing - Figure 3-9 2.
3. If the binary inputs are used in a voltage sensing mode, the nominal
voltage of the binary input has to be defined. The threshold is set by
35
default to 70% of the nominal voltage, although this can be changed Figure 3-9 3.
If the test software does not recognize a relay operation, remember to

verify the set-up of the binary inputs.
4. Define a suitable Test Module Input Signal, name to display for this
test signal as well as document the connection terminal on the test
object for each binary signal required in the test - Figure 3-9 4.
3.4.7
The Binary Outputs Page

The Binary Outputs page is used to specify how the binary outputs are used.
The number of available binary outputs is CMC hardware dependent.
Figure 3-10:
Binary Outputs page
The column of the wiring matrix summarize the binary relay outputs and
Transistor outputs 1 available.
For each binary output signal required for a test, the Test Module Output
Signal, the name to display for this test signal and the connection terminal
on the test object needs to be documented.
36
The CMC 56 test devices do not have transistor outputs. The CMC 56 can be upgraded if its
serial number is equal to or higher than DAxxxx.
QuickCMC
3.4.8
The DC Analog Inputs Page

The DC Analog Inputs page specifies how the analog DC inputs are
configured. These inputs are used exclusively for transducer testing.
Figure 3-11:
DC Analog Inputs page
Two types of DC analogue inputs are available: 0...10V or 0...20mA. For a

CMC 256, the range of the current input can be set to either 20mA or
1mA.
The DC analogue input signal needs to be defined in terms of the Test
Module Input Signal, the name to display for this test signal and the
connection terminal on the test object.
37
3.4.9
Entering the Default Voltages

1. Select Direct mode - Figure 3-131.
2. Set the amplitude of V1 to 63.51V - Figure 3-132.
3. While pointing at the field for the amplitude of V1, click the right
mouse button and select "Equal magnitudes". Note how the voltages
of all three phases are set to 63.51V.
4. Set the phase angle of V1 to 0 - Figure 3-133.
Lagging phase angles have to be entered as negative values.

5. While pointing at the field for the phase angle of V1, click the right
mouse button and select "Balance Angles". Note how the phase
angle displacement between the voltages are set to a balanced
system, which is 120 phase displaced.
6. Current amplitudes and phase angles are entered in the same way Figure 3-13 4.
7. The vector diagram on the right shows the voltage and current
vectors graphically. The scaling can be changed by right clicking into
the vector diagram and then selecting "Zoom In".
8. Specify the frequency to 50Hz - Figure 3-13 5.
9. While pointing at the field for the frequency of V1, click the right
mouse button and select "Equal"- Figure 3-12 3. Note how the
frequencies of all three phases are set to 50Hz.
The nominal frequency can also be selected by pointing at the
frequency field of the generator, click the right mouse button and
select Nominal Value - Figure 3-12 1.
DC can also selected by clicking on DC - Figure 3-12 2. The phase
angle fields as well as the vector diagram are disabled in this case.
To have the frequencies of all the generators changed at the same
time, select Link Frequencies - Figure 3-12 4.
38
QuickCMC
Figure 3-12:
Frequency Selection
1
2
3
4
10.The binary outputs can be set as Normally Open or Normally Closed

contacts - Figure 3-13 6.
Note that the binary output will only be active while the output is
switched ON.
11. If the PC is connected to a CMC, the status of the binary inputs would
be shown on-line - Figure 3-13 7. In the off-line mode, however, all
binary inputs are flashing at random intervals.
Figure 3-13:
Test View of QuickCMC
1
2
12.Select "Test | Outputs ON" (or press the F5 key) to switch the
voltage outputs ON.
39
3.4.10
Manually Stepping the Voltages

1. Select the Output for all three voltages - Figure 3-14 1.
2. Select the Quantity to Magnitude - Figure 3-14 2.
3. Specify a step size of 1V - Figure 3-14 3.
4. Click on the Down button until the relay picks up - Figure 3-14 4.
The ramp quantity can also be adjusted by using the mouse wheel.
Select the Mouse wheel button - Figure 3-14 5 and turn the mouse
wheel up or down to increase or decrease the output quantity.
Figure 3-14:
Step Function
1
7
5
4
3.4.11
Automatic Ramping of the Voltages

1. Reset the voltages to nominal voltages, i.e. 63.51V for all phases.
2. Specify a time per step of 1s - Figure 3-14 6.
3. Select the "Auto Step" check box - Figure 3-14 7.
4. Again click the Down button - Figure 3-14 4.
Note how the voltage slowly ramps down at a rate 1 Volt per second.
Also note that the Down button stays selected. To stop the
automatic ramp, click on the Down button again, i.e. de-select it.
Note: As soon as any of the binary inputs pick-up or drop-out, the
ramp will also stop and the outputs will automatically be switched
OFF.
If the outputs should remain ON, when any of the binary inputs
trigger, deselect Switch off on trigger" - Figure 3-13 7.
40
QuickCMC
3.4.12
Pulse Ramping of the Voltages

The pulse ramping function allows for a reset time between the steps.
During the reset time the outputs will return to the value that was
entered in the output field before the stepping function was initiated.
The Pulse Ramp function is only avaible when the Auto Step is
selected.
Figure 3-15:
Pulse Ramp Step Function
1
2
4
1. Reset the voltages to nominal voltages, i.e. 63.51V for all phases.
2. Specify a step size of 1V - Figure 3-14 1.
3. Specify a time per step of 1s - Figure 3-15 2.
4. Select the "Auto Step" check box - Figure 3-15 3.
5. Select the "Pulse Ramp" check box - Figure 3-15 4.
6. Specify a Reset time of 2s - Figure 3-15 5.
7. Click the Down button - Figure 3-15 6.
Note: As soon as any of the binary inputs pick-up or drop-out, the

ramp will stop and the outputs will automatically be switched OFF.
If the outputs should remain ON, when any of the binary inputs
trigger, deselect Switch off on trigger" - Figure 3-13 7.
3.4.13
Using the Hold Function

Multiple quantities can be stepped at once:
1. Specify the default voltage configuration, i.e. the pre-fault voltages.
2. Select "Test|Hold Values" (or press the F9 key) to freeze the outputs
of the CMC in the current configuration.
3. Enter the voltages of the new State:
V1 = 40V@-20; V2 = 40V@-100.
41
Note that the values on the outputs of the CMC are not updated online.
4. De-select Test|Hold Values (or press the F9 key).
Now, the outputs of the CMC are updated instantaneously with the
new values set for both V1 and V2.
Note: The hold function is only available if the Auto Step is deselected.
3.4.14
Performing a Trip Time Test

The timing functionality in QuickCMC records the time from the last change
applied to any of the outputs until any of the binary inputs pick-up or dropout.
The "last change applied" can be a manual change applied to a voltage
amplitude, current amplitude, phase angle or frequency, any quantity
stepped manually, the outputs switched ON, or depressing the Hold
function. If an automatic ramp is running, the time from the last step change,
i.e. the last time the step quantity was changed, is displayed.
1. Specify nominal voltages for all three phases.
2. Select Test|Hold values.
3. Decrease all voltages to 20 V.
4. De-select Test|Hold values.
Note: The timing function only works in the on-line mode, i.e. with a
CMC connected. The binary input which triggered, is then shown in
the "Binary Inputs" field - Figure 3-16 1.
5. The drop-out time can be determined by either manually or
automatically stepping the voltages up again.For this test the Switch
off on trigger" function should be de-selected.
42
QuickCMC
Figure 3-16:
Test View of QuickCMC
43
3.4.15
Defining the Report Format

1. Select "Parameters|Report".
2. Select "Long Form" and click OK.
Figure 3-17:
Report Settings
Note: The report can be customized even further by selecting

"Define...".
For more information, refer to the relevant chapter on this subject.
3. Select "View|Report" to view the report.
Figure 3-18:
Report View
4. Close the report view.
44
QuickCMC
3.4.16
Compiling a Report
As QuickCMC is a manual test module, the instances which should be
reported also have to be specified manually; it would be inefficient to report
or log each manual change specified during a test.
The report function "Add to Report" logs a snapshot of all voltages and
currents, the status of the binary inputs including any timing measurements
made.
Note: It is the responsibility of the tester to activate this function after
each sensible test, or else the data will be lost without notice.
1. Specify nominal voltages for all three phases.
2. Select "Test|Add to Report" (or press the F10 key).
3. Specify Healthy system as title and click on "Passed" - Figure 3-19.
Figure 3-19:
Add to Report
4. Step all voltages to 20 V. Ensure that the trip time is recorded.

5. Again select "Test|Add to Report": Title: Trip time test. Comment:
Setting for trip time = 1.2s. The test is passed.
6. Select "View|Report" to view the test report.
7. Continue conducting tests and adding the relevant tests steps to the
report.
45
Figure 3-20:
Test report
3.4.17
Printing the Test Report

1. Select "File|Print" to print the report.
2. Select the printer to use.
3. Click on "OK".
Note: This option can be executed even if no printer is connected
(e.g. when using the test equipment out in the field). The print request
is then queued in the print manager. As soon as the specific printer is
connected (e.g. when back in the office), the user will be prompted
whether to print the report or not.
3.4.18
Saving the Test

1. Select "File|Save As" to save the test.
2. Enter the directory and file name where the test should be saved to.
Remember to use a descriptive file name for easy identification later.
3. Click on "Save".
Note: To prevent any data loss, remember to regularly save your data
by clicking on the Save icon or selecting "File|Save".
46
Overcurrent
Testing Overcurrent Relays

The Overcurrent test module allows manual or automatic testing of
directional and non-directional overcurrent relays with definite time, inverse
time, thermal I2T, and custom curve characteristics.
Ground faults, phase faults and three phase faults can be simulated using
the positive sequence model. When testing generator and motor protection
relays, it is possible to simulate negative- and zero sequence faults.
Figure 4-1:
User interface of test
module Overcurrent.
4.1
Overcurrent Features
The Overcurrent test module has several useful features for testing
directional and non-directional relays.
4.1.1
Fault Simulation
This test module allows the testing of single phase-, phase to phase and
three phase faults by using a positive sequence model. The negative- and
zerosequence fault models allows the testing of the negative- and zerosequence functions found in generator and motor protection relays.
4.1.2
Characteristic Definition
The test module allows the choice between several predefined
characteristics (such as the IEC defined inverse curves) as well as
47
customized curves available in the CMC.DCC file. (Manufacturer specific

definite time or inverse time characteristics according to IEEE, etc.)
Special or custom characteristics that do not follow a generic mathematical
formula can be defined point by point in a current-time table, which is also
saved in the CMC.DCC file.
4.1.3
Testing the Trip Characteristics

Test points can be defined by clicking directly on the desired current in the
trip time characteristic.The actual trip time corresponding to the applied test
current is tested for. An automatic assessment of the actual trip time, in
accordance with the tolerances specified, is performed.
In Addition, a minimum pick-up test is integrated into the Overcurrent
module.
The Overcurrent module is comprised of three views:
y Test View
In the Test view all parameters and settings for a test are defined.
y Report View
In the Report View a pre-view of the report is displayed. The format of
the report can be customized.
y Vector Diagram View
Displays the phasors of the injected fault on a vector diagram.
48
Overcurrent
4.2
Overcurrent and Earthfault Theory

Overcurrent and earthfault relays can be used in a wide range of
applications, i.e. feeder protection, transformer protection and backup protection for feeder impedance or differential protection. The
relay measures the current from the current transformer (CT). If the
current exceeds a preset threshold, a timer will time out (depending
on the relay characteristic) and issue a trip signal to the breaker.
There are basically three methods of achieving discrimination
between relays for grading purposes in a power system, i.e. current
discrimination, time discrimination and discrimination by both time
and current.
In Figure 4-2 a typical configuration for overcurrent and earthfault
protection on a feeder is illustrated.
Figure 4-2: Application for

OC and EF on a feeder
O/C for A phase

O/C for B phase
O/C for C phase
E/F
4.2.1
Current Discrimination
This method relies on the fact that fault current varies with the
position of the fault in a power system due the impedance between
the source and the fault. Its commonly known as an instantaneous
relay. The relay doesnt have any time delay and will pick-up and trip
if the current threshold is exceeded - Figure 4-3 1.
4.2.2
Time Discrimination
With this method an appropriate time delay is set on the relays
protecting a power system. The quantity of the fault current doesnt
49
have any influence on the time delay, although the current threshold
must be exceeded to initiate the definite time - Figure 4-3 2.
4.2.3
Discrimination by both Time and Current (IDMT)

The two methods explained earlier, i.e. time discrimination and
current discrimination have a few fundamental disadvantages.
Current discrimination can only be applied when there is a sufficient
difference in impedance between two relays that results in varied fault
current. On the other hand, discrimination with time will result in
unnecessary long operating time for severe fault currents.
It is because of these disadvantages that discrimination with time and
current was developed in the form of an inverse overcurrent relay with
a specific operating characteristic. With this characteristic, the
operating time is inversely proportional to the level of fault current and
is a function of both time and current. What this means is that the
higher the fault current, the quicker the operating time. With this type
of relay satisfactory grading can be achieved on a power system by
varying the current and time settings of the relays protecting the
power system - Figure 4-3 3.
The most common inverse characteristics available are defined by
IEC 60255 - Table 4-1.
Table 4-1:IEC
characteristic
Characteristic
Equation
Normal Inverse
0.14
triptime = ---------------------------------- TM
PSM 0.02 1
Very Inverse
13.5
triptime = ----------------------- TM
PSM 1
Extremely Inverse
80
TM
triptime = ------------------------PSM 2 1
Long Time Inverse
120
triptime = ----------------------- TM
PSM 1
y PSM = Plug Setting Multiplier (or multiples of pick up), where PS =

relay setting and
IFault
PSM = ---------------PS
50
Overcurrent
y TM = Time Multiplier Setting

All the methods described can be combined into one operating
characteristic (I/t diagram) to utilise the advantages of the different
discrimination techniques - Figure 4-3.
Figure 4-3: Inverse
Characteristic
Trip time in seconds
PSM
4.2.4
4.2.4.1
Different types of faults

Three phase faults
During a three phase fault the currents in all three phases has the
same amplitude but the angle between these phases are symmetrical
at 120 as shown in Figure 4-4.
51
Figure 4-4:Three phase

fault vector diagram
90
IC
IB
120
0
180
120
120
IA
Scale: 2A
4.2.4.2
270
Phase to phase faults

During a phase to phase fault the currents in the two faulted phases
has the same amplitude but the angle between these phases is 180
Figure 4-5:Phase to phase

90
IB
180
180
IA
Scale: 2A
52
270
Overcurrent
4.2.4.3
Phase to earthfaults faults

During a phase to earth fault, the fault current will flow between the
faulted phase and earth.
Figure 4-6:Phase to earth

90
180
180
IA
Scale: 2A
270
53
4.3
Overcurrent Example: Pick-Up and Trip Times

Task
A Siemens 7SJ600 overcurrent relay is to be tested. The pick-up
current and the trip-times are tested with a PSM (plug setting
multiplier) of 2, 4, 6, 8, and 10 for an A-N and a B-C fault.
The following settings are given for a ground fault:
Pick-up (I>)
0.2A
Time Multiplier
1.0
Characteristic
IEC normal inverse
Instantaneous (I>>)
2A
The following settings are given for a phase fault:
Pick-up (I>)
1.2A
Time Multiplier
0.5
Characteristic
IEC very inverse
Instantaneous (I>>)
12A
Solution
OMICRON Test Universe has a dedicated test module for testing
overcurrent relays, called Overcurrent.
If only a manual test of pick-up and trip time were required, the test
could have been performed using QuickCMC.
Overcurrent allows the testing of one fault loop at a time. If an
automatic test is desired, i.e. where all fault loops are tested after
each other, the OMICRON Control Center will have to be used. In an
OCC test document an Overcurrent test module can be inserted for
each fault loop or test to be run.
For simplicity, the Overcurrent module will be used stand-alone in this
example.
54
Overcurrent
4.3.1

assumed, that a CMC 256 is used to inject the currents to the relay.
1. The current inputs of the relay are connected to the current outputs of
the CMC.
2. The starpoint of the relay input CTs is connected to N on the CMC.
3. The trip contact of the relay is connected to binary input 1 of the CMC.
In a similar fashion, the start contact of the relay may be connected to
binary input 2 of the CMC see Figure 4-7 for more detail.
55
56
Start
Trip
Figure 4-7:
Omicron CMC256 and
Siemens 7SJ600 Relay
Overcurrent
4.3.2
Entering the Test Object Parameters with the Generic

Overcurrent and Earthfault Converter
For easy entry of relay settings into the OMICRON software, XRIO1
converters are available. This converter enables the user to enter the
setting of a relay directly into the Test Universe Overcurrent software.
4.3.3
Starting the Overcurrent Test Module

2. Select the Overcurrent test module.
3. Open the Test View by selecting View|Test.

4. Select Parameters|Test Object to open the Test Object dialog box.
5. Select File|Import- Figure 4-8 1.
XRIO = Extended Relay Interface by OMICRON. For technical background information

about the XRIO file format, please contact OMICRON.
57
Figure 4-8:
Device Settings Import
Function
1
6. Click on Test Objects in Test Library Folder - Figure 4-9 1.

7. Open the Generic XRIO Files - Figure 4-9 2 folder by double
clicking on the folder or selecting Open Figure 4-9 3.
Figure 4-9:
Change to OMICRON
Folder
8. Select Generic Overcurrent & Earthfault Converter.xrio Figure 4-10 1 and click on Open - Figure 4-10 2.
58
Overcurrent
Figure 4-10:
File Browser
1
9. Enter the device information in the General dialog block displayed

Figure 4-11 1.
Figure 4-11:
XRIO Converter General
Information
10.Enter the overcurrent settings of the relay into the Overcurrent

Settings dialog - Figure 4-12 1.
59
Figure 4-12:
XRIO Converter
Overcurrent Settings
11. Enter the earthfault settings of the relay into the Earthfault Settings
dialog - Figure 4-13 1.
Figure 4-13:
XRIO Converter Earthfault
Settings
12.Click on OK Figure 4-13 2.
60
Overcurrent
4.3.4
Configuring the Hardware

1. Select "Parameters|Hardware Configuration" to open the dialog for
the hardware configuration.
Any hardware related configuration of the CMC or any connected
external amplifiers is specified in this dialog.
The configuration of the CMC amplifiers and any external OMICRON
amplifiers can be specified by clicking on Details. Here the user
specifies, which outputs are used and how they are connected, e.g. in
a three phase configuration, or connected in parallel or in series to
boost the output range or power.
Special signal names and connection configurations for the analog
outputs and binary inputs can be specified on the relevant tabs.
The configuration of the binary inputs used to pick-up potential free or
voltage sensitive signals is specified on the binary inputs page.
To perform a pick-up test for a numerical relay which has a dedicated
pick-up contact, ensure that a Start contact has been defined. - Figure
4-15 1
Figure 4-14:
Hardware
Configuration:Analog
Outputs
61
Figure 4-15:
Hardware Configuration:
Binary inputs
For more detail refer to Figure 4-7 on page 56
4.3.5
Defining the Tests for the A-N Fault Loop

1. In the Test view, select the A-N fault type - Figure 4-16 1.
2. Define the test currents in multiples of pick-up current - Figure 4-16 2
- and press "Add". The first shot should be executed at a current of 2
times pick-up.
Note: Test points can also be defined directly in the diagram by
holding the Ctrl key down and then left clicking on the required test
current (i.e. vertical line). An alternative is to Right mouse click on the
required test current and select "Add test point").
62
Overcurrent
Figure 4-16:
Test View
1
2
Individual manual shots can be executed from the characteristic

diagram by holding the Shift key down and then left clicking on the
required test current, or right mouse click on the required test current
and select "Shot at X.xx").
Note: The test current can also be entered in absolute currents by
selecting "abs" values with the unit manager
3. Repeat the last step for PSMs of 4, 6, 8 and 10.
The width of the columns in the test table can be adjusted with the
mouse.
63
4.3.6
Defining the Pick-up Test

1. Select the General tab.
2. Define a pick-up test for "Relays with Start contact".
Note: This test is only possible, if a start or pick-up contact is
available from the relay. This input must be configured as a "Start"
contact in the hardware configuration. Also the trigger condition of the
"Start" contact must be set to "X", as the trigger logic only applies to
the trip time test.
If no Start contact is available and the relay has a delayed reset
characteristic (e.g. Electro-mechanical induction disc overcurrent
relays), the "EM relays without Start contact" pick-up test can be
chosen.
For this technique, the relay is tripped with the current specified by
the "Trip value". Then the test current is decreased until the relay
resets, which is an indicator that the disc is rotating backwards. By
slowly increasing the test current again, the disc motion can be
stopped. By continuing to increase the test current, the moment at
which the disc starts to rotate forward again, can be determined. This
is approximately equal to the pick-up value of the relay.
Figure 4-17:
Test View - General tab
4.3.7
Defining the Trigger Conditions

1. Define the trigger condition for the trip test. In our case the "Trip"
contact is the only choice.
At least one relay contact must be specified as trigger, i.e. set to "1".
2. Select the "Test" tab.
64
Overcurrent
4.3.8
Performing a Test
1. To run a test, select "Test|Start".
The nominal and actual trip times are shown Figure 4-18 1.
Figure 4-18:
Running a test
1
2
An assessment for the tests is shown in the test table Figure 4-18 2
and in the graph - Figure 4-18 3.
The green + indicates that a test is passed.
The red x indicates that a test has failed.
The purple O indicates that a test point was out of range, the test
current was higher than the I max limit and/or more than what the test
set can deliver.
The blue O indicates that the absolute maximum time was set
shorter than the triptime, set the absolute maximum time longer.
The grey O indicates that a test point was not tested.
The green + with the exclamation mark indicates that a test passed
but an overload occurred during the test.
The red x with the exclamation mark indicates that a test failed but
an overload occurred during the test.
65
A test is only possible, if no results are present. To be able to run a

test, first save the results, then clear the results by selecting
Test|Clear.
2. View the report.
Figure 4-19:
Report view
4.3.9
Saving the Test

3. Click on "Save".
Note:To prevent any data loss, remember to regularly save your data
66
Overcurrent
4.3.10
Repeat the test for a B-C fault

1. Select the Test view.
2. Clear the results from the previous test.

3. Select fault type B-C.
4. Re-run the test.
5. Save the test under a different file name.
Note: To test multiple fault loops in one automatic test, the OMICRON
Control Center would have to be used.
67
68
Advanced Distance
Testing Distance Relays

Present testing requirements include the ability to efficiently define, execute
and automate test plans. An equally important requirement is the ability to
effectively report on the results of the executed tests. All these requirements
are fulfilled by the Advanced Distance module.
5.1
Overview
Advanced Distance provides the same features offered in the Distance
module plus advanced functionality:
y Search and Check test
y Impedance setting as percentages of zone reaches (relative
impedance)
y Testing of several fault loops in one test
y Additional user interfaces
5.1.1
Shot, Search, and Check Test Modes

y Shot Test
In the Shot test mode, similar to the Distance test module, test points
are added by mouse or keyboard to the table of test points. This table
is separated into the fault loops A-N, B-N, C-N, A-B, B-C, C-A and AB-C.
Figure 5-1:
Advanced Distance:
Shot Test View
69
y Search Test
In the Search test mode, the exact zone borders are determined
automatically. Zone reaches are searched along lines in the
impedance plane using a time-optimized algorithm. It is possible to
define single search lines as well as multiple lines. All the search lines
are entered into the search table. A separate table is available for
each different fault loop.
Figure 5-2:
Advanced Distance:
Search Test View
y Check Test
In the case of routine tests, there is often the need to verify a relays
correct operating characteristic in the shortest possible time. In these
cases a detailed evaluation of the relays performance is usually not
required. The Check test mode allows a quick overall test of the relay
with minimum testing time.
Test lines in the impedance plane are defined in the same way as in
the Search test mode. Instead of determining the exact zone reach
along these lines (which would require many shots which extends the
testing time), shots are only placed at the upper and lower tolerance
border for each intersection of a check line with a zone border. If
these two shots are within their respective time tolerance band, the
reach can be assumed to be somewhere between these two test
points. A verification, that the reach is within tolerance, is thus
possible with just two shots. The operating characteristic can
70
Advanced Distance
therefore be verified efficiently, i.e. quickly with a limited number of

shots.
Figure 5-3:
Advanced Distance:
Check Test View
5.1.2
Relative Impedance
This feature, is the ability to set impedance values as percentages of zone
reach. This feature is called relative impedance. Test point data is not
entered in R, X, or Z values. Instead, it is entered as percentages of zone
reach (e.g. 90% of zone 1, 110% of zone 1, 90% of zone 2, etc.). This
makes it possible to create generic test documents without knowing the
relay settings (reaches). When loading the relay parameters, the exact
impedance values are automatically calculated and the relay is tested
accordingly.
This enables the user to use one test template on various relays with
different settings. The relays will all be tested at the same significant points
of the characteristic.
5.1.3
Follow the line angle change

This feature, when selected will link test points or testlines to the test
objects line angle setting. If the line angle value is changed in the Test
object these test points/testlines will automatically be updated.
different settings. The relays will all be tested at the same significant points
of the characteristic.
71
5.1.4
Testing Several Fault Loops

Several fault loops can be tested within one test plan (e.g. for all phase and
ground faults). It does not matter if the relays zone reaches are set
differently for the different fault loops. By entering the test point data as
relative impedances, the software automatically calculates the actual
impedance values for all fault loops selected. Each single fault loop can be
tested differently. Individual test points can be added to or removed from the
table of test points.
A test plan for a distance relay can also be any combination of Shot, Search,
or Check tests. At test execution, the whole test plan is processed
sequentially.
5.1.5
User Defined Interface

The following user interfaces are available:
y Impedance plane with Shot, Search and Check test tables
Tests are defined and transferred to the test tables. After the test
execution, this view displays the results graphically in the impedance
plane. A detailed overview of the results is displayed numerically in
the corresponding table of test points.
y Z/t diagram
This view shows the time grading characteristic of the relay in a trip
time vs. impedance graph. The impedance values shown are along a
straight line in the impedance plane, particularly along search and
check lines.
Note that this view displays the test results only graphically. It is
possible to define additional test points.
y Vector view
Here the vectors of the voltages and currents, as well as zero,
positive, and negative sequence components for the selected test
point are displayed.
y Time signal view of analog and binary test signals
Here the analog voltages and currents for the selected test point are
shown. Any monitored contact switching on the relays output is also
displayed. This provides a means to perform more detailed
investigations (e.g. time measurements using cursors).
72
Advanced Distance
5.2
Distance Protection Theory
5.3
Impedance Protection
A distance relay, as the term distance implies, is a relay that can
determine the location or distance to a fault on the protected
overhead line or cable.
The impedance of an overhead line or cable is directly proportional to
the line length of the protected object. The relay measures the fault
current flowing through the line as well as the voltage at the relay. By
comparing these quantities the impedance of the line up to the point
where a fault occurred can be determined. By comparing the
measured impedance to a predetermined reach setting, the relay can
determine whether the measured impedance is within its zone of
operation. If the measured impedance is less than the reach setting, a
trip will be issued.
5.3.1
Protection Zones
To achieve correct co-ordination between different relays, zones of
protection are implemented. Each zone has an individual reach and
trip time settings. There are normally at least three zones of
protection. For more detailed description refer to NPAG1.
5.3.1.1
Zone 1
Due to the errors of current transformers (CT), voltage transformers
(VT) and the relay itself, the zone 1 reach can not be set to 100 % of
the protected lines impedance as these errors might cause the relay
to overreach, meaning that the relay may trip for faults on adjacent
lines. Therefore the zone 1 reach is normally set to protect only 80 %
of the line. The zone 1 trip time is normally set to instantaneous,
because the zone 1 will operate only for faults on the actual protected
line which can be cleared immediately.
5.3.1.2
Zone 2
Zone 2 covers the remaining 20 % of the line and about 50 % the
shortest adjacent line or 120 % of the protected line which ever is
greater. Care must be taken not to set the zone 2 reach more than the
Network Protection & Automation Guide 1st Edition published by Alstom in July 2002
73
shortest adjacent lines zone 1 reach, as this may cause incorrect

tripping for faults on adjacent lines. The zone 2 trip time must be set
long enough for the adjacent lines zone 1 to clear the fault, for which
the breaker trip time must also be considered. Zone 2 trip time is
therefore normally set to 400 ms.
5.3.1.3
Zone 3
Zone 3 provides back up for faults on adjacent lines. The reach must
be set so that 100 % of the shortest adjacent line is protected, but it
mustnt see faults beyond any transformers at the remote end. Zone 3
is normally set to 180 % of the protected lines impedance. The zone 3
trip time must be set long enough for the adjacent lines zone 2 to
clear the fault and again the breaker trip time must be considered.
Zone 3 trip time is therefore set to at least 1 second.
5.3.2
Fault Impedance Calculation in a Single Phase System

The fault impedance for a single phase system can be calculated with
the following simplified formula:
ZF = VF / IF
In Figure 5-4 a simplified single phase system is shown with the line
impedance ZF, the voltage across the fault VF and the fault current
flowing IF.
Figure 5-4: Simplified

single phase equivalent
circuit
ZF
VF
IF
Fault
Please note that the equation: ZF = VF / IF is only relevant for a single

phase system. The calculation of ZF for a three phase systems is
more complicated. In a three phase system the different types of fault
74
Advanced Distance
loop, i.e. single phase to earth faults, two phase faults and three
phase faults or a combination of these faults have to be considered.
5.3.3
5.3.3.1
Fault Impedance Calculation in a Three Phase System

Three phase faults
In Figure 5-5, a three phase fault is displayed where VF is the L-N
voltage in any phase and IF the current flowing towards the fault in
that same phase. From these two quantities ZF can be calculated.
Figure 5-5: Equivalent

circuit for a three phase
fault
IF
ZS
EA
EB
ZF
ZS
ZF
ZS
ZF
EC
VF
ZSE
ZE
The quantities for a three phase fault could be as follows:

VA = 20 V0, VB = 20 V-120 and VC = 20 V120.
IA = 2 A-75, IB = 2 A-195 and IC = 2 A45.
These quantities can be illustrated in a vector diagram as shown in
Figure 5-6.
75
Figure 5-6: Three phase

90
VC
IC
IB
0
180
VA
75
VB
Scale: 2A; 63.5V
IA
270
Calculation of ZF for three phase fault

The following formula is used to calculate ZF for a balanced three
phase fault:
VF
ZF =
IF
For this type of fault ZF can be calculated from any of the phases. In
our example we will use A-phase i.e.:
VF = VA = 20 V0
IF = IA = 2 A-75
ZF = 20 V0 / 2 A-75
= 10 75
This impedance of 10 75 is then compared with the reach
setting on the relay to determine in which zone the fault occurred. The
relay issues a trip to the breaker accordingly.
76
Advanced Distance
5.3.3.2
Phase to phase faults

In Figure 5-7 a fault between the B and C phase is displayed where
VF is the voltage between the B and C phase and IF the current
flowing in those phases. From these two quantities ZF can be
calculated.
Figure 5-7: Phase to

phase fault equivalent
Circuit
ZS
ZS
ZS
EA
EB
ZL
IF
VF
IF
ZL
ZL
EC
ZSE
ZE
The quantities for a phase to phase fault could be as follows:

VA = 63.509 V0, VB = 37.53 V-147.8 and VC = 37.53 V147.8
IA = 0 A0, IB = 2 A-165 and IC = 2 A15.
Figure 5-8.
77

phase fault vector diagram
90
VC
IC
0
180
IB
VA
75
VB-C
VB
Scale: 2A; 63.5V
VF
270
Calculation of ZF for a phase to phase fault

The following formula is used to calculate ZF for a phase to phase
fault:
VF
ZF =
2 x IF
VF is in phase with VB-C (see Figure 5-8) and is calculated by the
following formula:
VB-C = VB - VC ( Note: Vectorial subtraction)
IF = IB
VF = VB-C
= 37.53 V-147.8 37.53 V147.8
= (-31.758 - j20) - (-31.758 + j20)
= -31.758 - j20 + 31.758 - j20
= 0 - j40 = 40.0 V-90
IF = IB = 2 A-165
78
Advanced Distance
ZF = 40.0 V-90 / (2 x 2 A-165)

= 40.0 V-90 / 4 A-165)
= 10 75
This impedance of 10 75 is then compared with the reach
setting on the relay to determine in which zone the fault occurred. The
relay issues a trip to the breaker accordingly.
5.3.3.3
Phase to earth faults

In Figure 5-9 a simplified single phase to earth fault is displayed. The
following points need to be considered when calculating the fault
impedance for an earthfault:
y The voltage of the faulted phase will decrease.
y Fault current will only flow in the faulted phase.
y The earth return impedance must be considered
Earthfault Compensation Factor
The earthfault compensation factor compensates for the difference
between the earth return impedance and the phase impedance
measured by the relay.
The way to express the compensation factor differs between the relay
manufacturers. The following table summarises the techniques used
by the manufacturers:
Table 5-1: Compensation

Factors
Compensation Technique
Manufacturer
kL
(magnitude & angle)
LZ 32, L3WyS & LI41 from BBC,

R3Z27 & 7SL27 from Siemens
YTG from GEC, SEL, Alstom and
Reyrolle relays.
Z0/Z1
(magnitude & angle)
TLS & SLS from GE.
RE/RL and XE/XL
7SA51x relays from Siemens
Z0; Z1 (magnitude & angle)
REL5xx & REL6xx from ABB.
79
The kL factor can be calculated with the following formula:

kL =
ZE
1
=
ZL
3
Z0
-1
Z1
Where:
ZE = Earth impedance.
ZL = Line impedance = Z1.
Z1 = Positive sequence impedance of the protected line.
Z0 = Zero sequence impedance of the protected line.
In Figure 5-9 the VF is the L - N voltage of the A phase and IF the
current flowing in that same phase and then back to the source via
ZE. From these two quantities ZF can be calculated.
Figure 5-9: Phase to earth
fault equivalent Circuit
IF
ZS
EA
EB
ZL
ZS
ZL
ZS
ZL
EC
VF
ZSE
IF
ZE
The quantities for a phase to earth fault could be as follows:

VA = 36.0 V0 , VB = 63.509 V-120 and VC = 63.509 V120
IA = 2 A75; IB = IC = 0 A.
80
Advanced Distance

Figure 5-10.
earth fault vector diagram.
90
VC
180
VA
75
VB
Scale: 2A; 63.5V
IA
270
Calculation of ZF for a phase to earth fault

The fault impedance is calculated with the following formula:
ZF =
VF
IF x (1 + k)
The fault impedance can now be calculated. Note that the healthy
phases dont need to be considered for this calculation.
VF = VA and IF = IA
For this example k = 0.80.
ZF = VF / [IF x (1 + k)]
= 36.0 V0 / [2 A-75 x (1 + 0.80)]
= 36.0 V0 / (2 A75 x 1.80)
= 36.00 / 3.6 A-75
= 10 75
81
This impedance of 10 75 is then compared with the reach setting

on the relay to determine in which zone the fault occurred. The relay
issues a trip to the breaker accordingly.
5.3.4
Impedance Relay Characteristics

An impedance relay measures the fault impedance and then
determines if operation is required according to the boundaries
defined in an R/X diagram. The boundaries can be represented by
different characteristics, i.e mho, quadrilateral, lens or tomato.
5.3.4.1
MHO Characteristic
The characteristic of a Mho impedance element, when plotted on an
R/X diagram, is a circle with the circumference passing through the
origin - Figure 5-11. Therefore this impedance element is directional
and will only operate for faults in the forward direction. The reach Z
is the actual secondary impedance for the protected zone and the
angle is set to the positive sequence angle of the protected line.
Figure 5-11: Mho

Characteristic
X
Z
5.3.4.2
Quadrilateral Characteristic
The characteristic is provided with individual settings for the reactive
and resistive reaches. It provides better resistive coverage than any
of the Mho characteristics. This is especially the case for earth faults,
where the arc resistance of the fault contributes significantly to the
fault impedance.
82
Advanced Distance
Figure 5-12: Quadrilateral

Characteristic
X
Z
5.3.4.3
Lens Characteristic
In some cases the reach setting of a Mho characteristic can be so
large (e.g. if a long line needs to be protected) that a normal Mho
characteristic might encroach with the load characteristic. To avoid
this, a lenticular characteristic is used to restrict the resistive
coverage.
Figure 5-13: Lens

Characteristic
X
Z
83
5.3.4.4
Tomato Characteristic
This characteristic is employed to provide a Mho characteristic with
better resistive coverage. This characteristic is only suitable for lines
with low loading. Therefore this type of characteristic is seldom used.
Figure 5-14: Tomato

Characteristic
84
Advanced Distance
5.4
Automatically Testing a Mho Distance Relay

Test the reaches and trip times
Task
A SEL 321 distance relay is to be tested. The automatic test should:
y Perform a shot test on the line angle for all fault loops at 75% of
Zone 1, Zone 2, Zone 3 and Zone 4 reach.
y Verify the reaches to be within the tolerance limits on the line angle,
for an A-N and a B-C fault.
y Determine the exact reach of the relay on the line angle of all zones
for an A-B and a C-N fault.
The following settings are given for the relay:
y General Settings:
-
Inom: 1 A
Vnom: 110 V (L-L)
fnom: 50 Hz
Z1MAG: 10
Z1ANG: 85
K0M: 0.95
K0A: -5.5
Potential transformers (PTs or VTs) are connected on the line
Current transformer (CT) starpoint is on line side
The characteristic is set to mho for all fault loops
y Tripping Zone Settings:

Table 5-2:Relay Settings
Setting
DIR*
Z*P
Z*MG
Z*PD
Z*GD
Zone 1
Forward
8.000
8.000
inst.
inst.
Zone 2
Forward
12.000
12.000
20 cycles
20 cycles
Zone 3
Reverse
8.000
8.000
100 cycles
100 cycles
Zone 4
Forward
18.000
18.000
50 cycles
50 cycles
85
The operating characteristic in the impedance plane looks as follows:

Figure 5-15:
Impedance characteristic
of an SEL 321 relay
Solution
The OMICRON Test Universe offers a dedicated test module, Advanced
Distance, for testing the impedance measurement function of distance
relays. This module models the line impedance of a transmission line. It is
recommended that this module is used to test the distance function of the
above relay. A manual test of this function is possible, but it can prove to be
very laborious and time consuming.
Individual fault shots can be placed anywhere in the impedance plane with
the single shot test. The check test places shots at the impedance tolerance
limits of each zone to verify that the reach is within the tolerance limits. The
exact reach of a zone can be determined with the search test.
Normally an automatic test will be carried out. Here the impedance
measurement function (trip time and reach) and all auxiliary functions of the
relay (e.g., Fusefail [or LOP], Manual Close [or SOTF], Auto-reclose,
Powerswing detection, etc.) are tested in one integrated test. This can be
achieved by embedding the Advanced Distance and other test modules into
an OMICRON Control Center document.
To simplify this example, however, the Advanced Distance module is used
stand-alone.
86
Advanced Distance
5.4.1
Establishing the Wiring between the Relay and the CMC

to the relay.
outputs of the CMC.
2. Connect the current inputs of the relay to the corresponding current
outputs of the CMC. Ensure that the current outputs of the relay, i.e.
the output side of the relay current transformers, are connected
together in a starpoint.
3. Connect the trip signal of the relay to binary input 1 of the CMC see
Figure 5-16 for more detail.
87
Figure 5-16:
Omicron CMC256 and
Relay
88
Advanced Distance
5.4.2
Entering the Test Object Settings and Parameters for SEL 321
For easy entry of relay settings into the OMICRON software, XRIO1
converters are available. These converters enable the user to enter
the setting of a relay directly into the Test Universe Advanced
Distance software.
The parameters and settings can also be directly entered manually
into the Test Object.
5.4.3
Starting Advanced Distance

2. Select test module "Distance..." and then "Advanced Distance".
3. Select Parameters|Test Object to open the dialog for the test object
specific data.

89
Figure 5-17:
Function
1

6. Open the Schweitzer folder - Figure 5-18 2 folder by double clicking
on the folder or selecting Open Figure 5-18 3.
Figure 5-18:
Change to OMICRON
Folder
7. Select Schweitzer SEL 321 Converter.xrio - Figure 5-19 1 and click

on Open - Figure 5-19 2.
90
Advanced Distance
Figure 5-19:
File Browser

Figure 5-20 1.
9. Enter the relay settings into the Zone Settings and Zone Timers
dialogs - Figure 5-21 1.
Figure 5-20:
Information
91
Figure 5-21:
XRIO Converter Relay
Settings
92
Advanced Distance
5.4.4

Figure 5-22:

outputs, binary inputs and binary outputs can be specified on the
relevant pages.
The configuration of the binary inputs, i.e. which inputs are used to
pick-up potential free or voltage sensitive signals is specified on the
binary inputs page.
For more detail refer to the specific chapter on this subject.
93
5.4.5
5.4.5.1
Defining a Test
1. Click on the Trigger page in the Test View.
2. Ensure that a trigger conditions for the Trip signal is set to 1.
When testing the relay with a single pole tripping scheme, the phase
selective tripping signals for each phase (i.e. Trip A, Trip B and Trip
C) have to be monitored.
3. Ensure that the trigger logic is set to OR -Figure 5-23 1.
Figure 5-23:
Test View: Trigger page
1
94
Advanced Distance
5.4.5.2
Defining a Shot Test

y Click on the Shot page in the Test View.
Single fault shots can be entered in one of the following ways:
Numerically as absolute impedance.

i) Enter the impedance either in polar (|Z| and phi) or in
rectangular (R and X) format.
ii) Click on Add to add the shot to the list of test points of the
selected fault type or Add To... to add the shot to a selection
of fault types.
(or) Numerically as relative to a zone reach.

i) Select the Relative selection box.
ii) Select the zone relative to which the impedance should be
specified, e.g. Z1.
iii) Enter the percentage of zone reach required, e.g. 75%.
iv) Click on Add or Add To....
(or) Graphically in the impedance plane.

i) Point with the mouse at the required impedance.
ii) Press Ctrl and click with the left mouse button (or Right
mouse click and select Add Shot) to add this shot to the list of
test points.
iii) Press Shift and click with the left mouse button (or Right
mouse click and select Shot at....) to immediately execute a
single shot.
1. Enter the line angle (85)to this test angle - Figure 5-24 1.
2. Select Relative - Figure 5-24 2.
3. Select Z1 from the Zone drop-down menu - Figure 5-24 3.
4. Specify the relative impedance required (75%) - Figure 5-24 4.
5. Click on Add To... - Figure 5-24 5, select All and click OK.
6. Repeat for 75% of Zone 2 and 4.
95
7. Specify the reverse angle (265)1 for Zone 3 -Figure 5-241.

9. Select Z3 from the Zone drop-down menu - Figure 5-24 3.
10.Specify the relative impedance required (75%) - Figure 5-24 4.
11. Click on Add To... - Figure 5-24 5, select All and click OK.
Note:
The colour of the fault tabs at the bottom of the test

point table indicate that test points have been added
to each fault loop, thus all are shaded dark grey.
The column widths in the test point table can be adjusted by dragging
the respective split bar in the column header. Complete columns can
also be hidden by right clicking in the table and selecting the columns
to be hidden.
Figure 5-24:
Test View: Mho Shot test
page
1
4
2
96
5
3
180 must be added to the test angle for a reverse shot test
Advanced Distance
5.4.5.3
Defining a Check Test

1. Click on the Check page in the Test View.
Note: A check test line consists of the origin point, the check test
angle, and the length of a check test line. This can be defined in one
of the following ways:
-
Numerically as absolute impedance.

i) Enter the impedance of the origin point either in polar (|Z| and
phi) or in rectangular (R and X) format.
ii) Enter the check test angle.
iii) Enter the length of the check test line in . The length of the
check test line can also be specified relative to a zone reach by
selecting the Relative option, e.g. 120% of all zones.
iv) Click on Add or Add To....
(or) Graphically in the impedance plane.

i) Point at the impedance for the origin point.
i) To add a check test line to the list, press Ctrl, click the left
mouse button and drag a check test line at the required angle
and length.
ii) To execute a single check test, press Shift, click the left
mouse button and drag a check test line. The test starts as
soon as the left mouse button is released.
2. Enter 0 for the origin point - Figure 5-25 1.

3. Enter the line angle (85) for check test angle - Figure 5-25 2.
5. Select 120% of All Zones - Figure 5-25 4.
6. Click on Add To... - Figure 5-25 5, select A-N and B-C and click
on OK.
Note: The program automatically places shots at both the lower and
upper reach tolerance limit. If during testing, these two shots are OK,
the check test is passed, because it can be assumed that the reach is
somewhere within the tolerance limits.
97
7. Enter the reverse line angle (265) for check test angle Figure 5-25 3
8. Click on Add To... - Figure 5-25 5, select A-N and B-C and click
on OK.
A sequence of check test lines at uniform test angle steps, e.g. from
0 to 90 at 30 steps can be specified by clicking on Sequence... Figure 5-25 6.
Figure 5-25:
Test View: Check test page
1
2
5
3
6
5.4.5.4
Defining a Search Test

1. Click on the Search page in the Test View.
Defining search test lines for a search test is conducted in exactly the
same way as for a check test. The only difference lies in the way that
the actual test is performed and the way in which the results are
presented.
In a search test, the software searches for the exact border between
two zones by applying a modified bisection algorithm starting from the
theoretical reach and moving outwards.
2. Enter 0 for the origin point - Figure 5-26 1.
98
Advanced Distance
3. Enter the line angle (85) as the search test angle - Figure 5-26 2.
5. Select 120% of All Zones - Figure 5-26 4.
6. Click on Add To..., - Figure 5-26 5, select C-N and A-B and click
on OK.
7. Enter the reverse line angle (265) as the search test angle - Figure
5-26 2.
8. Click on Add To..., - Figure 5-26 5, select C-N and A-B and click
on OK.
9. Click on the Settings page.
10.Check the settings for the Search resolution.
The search resolution is the accuracy to which a reach is to be
determined. It is entered either as a relative value or as an absolute
value. The test is terminated as soon as two consecutive tests points,
i.e. in different zones, are separated by less than either of these two
settings.
Warning: This test executes a significant number of test shots to the
relay. This might strain the relay unneccessarily, especially in the
case of electro-mechanical relays. Be careful and do not specify too
many search lines and test shots!
99
Figure 5-26:
Test View: Search test
page
1
5
2
3
4
100
Advanced Distance
5.4.5.5
Viewing the Report Format

1. Select View | Report.
Figure 5-27:
Report View
5.4.6
Performing a Test
1. Select Test | Start.
This consecutively executes all shot, check, and search tests
specified.
For the shot test the results are shown in terms of the actual trip time
(tact column) and an assessment. The assessment states whether
the test was within the specified time tolerance limits (Status
column).
101

Test | Clear.
5.4.7
View Options
In addition to the impedance plane (or R/X view), the following test views
are available:
1. Z/t diagram view:
In this view, the trip time is plotted vs. impedance for a specified test
line. The stepped time grading characteristic of the relay can clearly
be seen. The impedance and time tolerance bands are also shown.
Tests can be executed from this view graphically in the same way as
for a shot test.
Figure 5-28:
Z/t diagram view
102
Advanced Distance
2. Vector view
This view displays the injected natural and symmetrical quantities for
the current test point. This view is View only. The displayed values
cannot be edited.
Figure 5-29:
Vector View
To display the different groups, right click in the vector diagram, select
the group and click to select.
Figure 5-30:
Group selection
103
3. Time signal view

This view displays the voltage and current quantities plotted vs. time.
This option is only available after a test has been executed.
The time signal view can be zoomed and the display signals can be
switched off via the properties sheet. (Right Mouse click anywhere in
the time signal view window.) For more details on these options,
please refer to the example of the Advanced Transplay module.
Figure 5-31:
Time signal view
5.4.8
Saving the Test

3. Click on "Save".
104
Advanced Differential
Testing Differential Relays

OMICRON Advanced Differential Software is a family of test modules for
testing differential protection relays. These consist of the Diff Operating
Characteristic module, the Diff Trip Time module, the Diff Harmonic
Restraint module and the Diff Configuration module.
The Advanced Differential
Software modules are
typically used within the
OMICRON Control Center
(OCC). These test
modules are embedded as
objects into an OCC test
document.
25 MVA
138 kV
13.8kV
2000 / 5
200 / 5
Relay
The OCC test document

allows multiple modules to
be controlled together for sequential testing of the desired protective
functions. For example, all common settings of a specific device can be
controlled globally and do not have to be entered for each successive test
module.
The OCC test document contains the tests results and the format of the data
to be represented in the test report. This allows creation of a customized
report that includes the test data, graphics, text fields and text editing by the
user.
Once the test document is complete, the OCC can run the embedded tests
automatically. The results will automatically be included in the report.
The test document provides three functions:
y the test specifications
y the archive of all test results pertaining to this test
y the actual report.
All test data is captured and maintained so the report format can be
changed, saved, and reused at any time, thus making summary reports and
detailed reports available from the same document.
105
6.1
Overview
All differential modules have a similar user interface and can be easily
understood as soon as one of the modules has been grasped. All differential
modules use the same dialog for setting the parameters of the protection
device, the protected object and other relevant system settings. The settings
data is managed globally and made available to each of the test modules.
The test modules differ from each other in function or type of characteristic.
which is to be tested:
y Operating Characteristic
y Trip Time Characteristic
y Harmonic Restraint
y Configuration
6.1.1
The Diff Operating Characteristic Module

The Diff Operating Characteristic test module is for verifying the operating
characteristic of the differential relay and testing the relay's ability to
differentiate between faults within the protected zone and faults outside the
protected zone.
This test module offers two testing possibilities:
Shot Test
a test with specific shots in the Idiff/Ibias plane, to verify the

tolerances defined by the manufacturer.
Search Test
a test to determine the exact operating characteristic.
The currents to be injected into the relay on the HV and LV are calculated on
the basis of a ldiff / Ibias pair, the fault type, the relay settings and the relay
algorithm.
6.1.2
The Diff Trip Time Module

The Diff Trip Time Characteristic test module tests whether the trip times of
the relay are within the specified tolerance bands.
The test module measures trip time for specific test points along a straight
line in the operating characteristic plane. In the graph, the trip time of the
relay is plotted vs. the differential current of the relay. The test can be
executed for all fault-loops. For some relays a pre-fault load current is
required for a specified time.
106
6.1.3
The Diff Harmonic Restraint Module

The Diff Harmonic Restraint test module verifies the correct operation of the
harmonic restraint function of the relay. A specific harmonic order can be
selected with the magnitude of the harmonic specified as a percentage of
the fundamental current. The harmonic can be applied per phase or threephase to the primary or HV winding. Both Search and Shot tests are
possible.
The Shot test applies a static amount of harmonics and determines if the
relay trips. In the Search Test, the harmonic content is varied to determine
the actual harmonic restraint characteristic.
The module can be used to test the inrush blocking (2nd harmonic) as well
as overfluxing blocking (5th harmonic) functions of a relay.
6.1.4
The Diff Configuration Module

The other differential modules mainly test for faults within the protected
zone. The Diff Configuration Test module tests the relay for through-fault
conditions. The protected object settings, the zero sequence elimination, CT
mismatch correction as well as vector group correction are tested for
stability with faults outside the protected zone. Even conventional differential
protection schemes, consisting of an electro-mechanical differential relay
and an interposing current transformer, can be tested for wiring faults.
Diff Configuration tests:
y The wiring of the secondary circuits and interposing transformers
(electromechanical and static relays)
y Correct parameter settings of digital relays (specification of protected
object)
y Zero-sequence elimination for ground-faults outside the protected
zone.
107
6.2
Differential Protection Theory

A differential relay operates on the principal of Kirchhoff Law: The
sum of currents flowing into a node add up to zero. On a power
transformer the same principal applies although the primary currents
on the different voltage levels are not the same. The secondary
currents are manipulated to give the correct reflection of the system.
The following considerations must be taken into account to correctly
apply Kirchhoffs law:
y Current Transformer (CT) mismatch correction.
y Vector Group correction.
y Zero sequence elimination.
A transformer differential relay provides unit protection for the
transformer. This means that the differential relay must only operate
for faults on the transformer (between the HV and LV CTs). For this
reason all the functions on the relay must be tested to ensure correct
operation of the relay.
The following tests must be done to prove correct relay operation:
y Stability, i.e. relay must be stable for through faults.
y Operating characteristic.
y Harmonic restraint.
y Operating time.
6.2.1
CT Mismatch Correction
For transformer differential schemes the primary rating of the CT
should be selected as close as possible to the full load current of the
transformer. As an exact match is seldom possible,
electromechanical and static relay schemes use custom and
handwound interposing CTs to get the secondary current as close as
possible to the nominal current of the relay, i.e 1 or 5 Amp.
In the newer digital/numerical relays, correction of the secondary
currents is performed internal to the relay. This correction is called the
CT mismatch correction. On some relays the CT mismatch correction
is calculated automatically from the transformer rating, rated voltage
and CT primary rating (e.g. Siemens and SEL). On other relays a
factor, i.e CT mismatch correction factor (CTCF), which is the factor by
which the secondary current must be amplified, has to be calculated
and entered manually (e.g. ABB SPAD, Reyrolle Duobias and Alstom
KBCH)
108
The CT mismatch correction factor can be calculated as follows:

CT R a t i o
CT CF = ------------------I FL
S Nom
I FL = -------------------------VL L 3
Where
.....1
......2
with SNom in MVA, VL-L in kV and IFL in kA
6.2.2
Vector Group Correction

The vector group shifts the phase angle of the LV current with respect
to the HV current on a power transformer. For instance the LV current
of a YD1 transformer is lagging the HV current by 30.
Vector Groups
Transformer Connection
Phase shift of LV
with Respect to HV
YNd1, Dyn1 & Yz1
-30
YNd11, DYn11 & Dz11
+30
Yy0, Dd0, Zd0 & Dz0
Yy6, Zd6, Dz6, & Dd6
180
This shift in phase angle must be corrected to ensure that the

measured HV and LV currents are in phase.
On electromechanical and static differential relays schemes the
vector group correction is accomplished by appropriately wound
interposing CTs or by connecting the secondary of the CTs in delta,
instead of star.
The vector group correction on digital/numerical relays is corrected by
the relays software algorithm.
6.2.3
Zero Sequence Elimination

The zero sequence currents in a delta connected transformer winding
are filtered out. If there is an out of zone earthfault on the HV side of a
YD connected transformer, positive, negative and zero sequence
currents will flow through the transformers HV winding and CTs. For
109
the same fault only positive and negative sequence current will flow
through the transformers LV winding and CTs. To compare the HV
and LV currents of such a transformer the zero sequence current
must be filtered out on the secondary of the HV side of the
transformer.
The vector group correction interposing CTs perform this task on
electromechanical and static relays. For this reason the interposing
CTs always have to be connected on the star side of a transformer.
Additional zero sequence interposing CTs are sometimes necessary.
The zero sequence currents on digital/numerical relays are eliminated
by the relays algorithm as follows:
IL = IL I0
Where IL = measured current, I0 = Calculated or measured zero

sequence current & IL = corrected current.
1
13
13
1
+2 3
Example: I L = 0 I 0 = 1 3 I L = 0 1 3 = 1 3
0
1 3
13
13
0
Note the -1, 2, -1 current distribution after the zero sequence

elimination has been applied.
Note: This kind of zero sequence elimination must always be
performed on the star side of a transformer or if a NEC/R earthing
device is part of the protected zone on the delta side of a transformer
to prevent the differential relay operating incorrectly for out of zone
earth faults.
6.2.4
Reference Side
Numerical relays calculate the bias and operating quantities to either
the HV or LV side of a transformer. This side is called the reference
110
side. For numerical relays the reference side is manufacturer

dependent:
Table 6-1: Reference side
6.2.5
Reference side
Manufacturer
Delta side
electro-mechanical and static

relays used on YD transformers,
ABB SPAD 346
Primary
numerical relays from Siemens,

SEL and ABB
Secondary
numerical relays from Reyrolle,

GE Multilin and Alstom
Magnetizing Inrush Stability

When a transformer is energized an initial current surge, called the
magnetic inrush current is observed on the winding which is switched
to the system. The magnetizing inrush produces a current in the
energized winding of the transformer without any equivalent current
on the other transformer windings. The inrush current therefore
appears to be unbalanced for the differential relay and tripping might
occur. Energizing a transformer, however, is a normal operating
condition and not a fault. Tripping under such conditions must
therefore be avoided. A large amount of 2nd harmonic is present
during inrush conditions. Inrush currents can therefore be detected
with harmonic filters. These 2nd harmonic currents are filtered out by
the differential relay and compared to a preset value.
If the 2nd harmonic content is larger than the preset value on the
relay, it will block the differential relay from tripping. The reason being
that it can be deduced that the transformer was energized which
resulted in large 2nd harmonic currents being present.
If the 2nd harmonic content is smaller than the set value the relay can
issue a trip to the circuit breakers, as an inrush condition is not
identified.
Another scenario that must be guarded against is that there might be
an internal fault in the transformer when energizing the transformer
where the differential current is very large. In this case the relay must
still allow tripping of the circuit beakers irrespective of the amount of
2nd harmonic. This is achieved by an unrestrained IDiff >>
characteristic.
111
Trip area
6.2.6
Block area
Figure 6-1: Harmonic

Blocking Characteristic
Overfluxing of the Transformer Core

In overvoltage conditions (due to switching or lightning strikes) the
magnetic flux in the transformers can become saturated. This results
in large amounts of 5th harmonic current to flow in the windings of the
transformer, which results in an unbalanced current scenario
measured by the differential relay. To prevent incorrect tripping under
such normal operating conditions, the relay blocks tripping, if large
amounts of 5th harmonic current are measured.
6.2.7
Operating Characteristic
A differential relay makes use of a bias/differential characteristic to
allow for stability during through faults and sensitivity for in zone
faults. The characteristic uses either two or three sections depending
on relay manufacturer.
The first section up to nominal current allows for CT errors and
transformer magnetizing current - see Figure 6-2 1.
The second section allows for tap changer operation. The differential
relay is set to work on nominal current, but the current can vary if the
112
transformer is tapped away from the nominal tap, i.e -5% to +15%
range - see Figure 6-2 2.
The third section caters for high through fault currents, which may
result in CT saturation - see Figure 6-2 3.
Figure 6-2: Operating
Characteristic
Trip area
3
Block area
2
1
113
6.3
6.3.1
Ibias, Idiff and Slope Calculation

Ibias Calculation
To plot the bias and differential currents correctly on the operating
characteristic the values of Ibias and Idiff must first be calculated. The
bias current formula differs between manufacturers as summarized in
Table 6-2.
Table 6-2: Calculation

methods for Ibias
Ibias formula
K1 factor
Manufacturer
Ip + Is )
(------------------------K1
K1 = 1
K1 = 2
K1 = 3
Siemens
Alstom, Reyrolle, SEL
GE Multilin 3-winding
Ip + Is )
(------------------K1
K1 = 1
K1 = 2
K1 = 3
conventional relays
AEG, ABB SPAD
AEG 3-winding
K1 = 1
ABB RET / REG, GE Multilin
max ( I p, I s )
Where Ip is the equivalent secondary current on the HV side of the

relay element and Is is equivalent secondary current on the LV side of
the relay element.
6.3.2
Idiff Calculation
The differential current is calculated with the following formula:
I Diff = I p + I s
=> For a through fault condition Ip flows into the relay and Is flows
out of the relay, i.e. Is is 180 out of phase with Ip.
For a vectorial addition thus I Diff = I p
I s can be assumed.
Where Ip is the secondary current on the HV side of the relay element

and Is is the secondary current on the LV side of the relay element.
114
6.4
Example: Differential Relay

Task
A Schweitzer SEL387 differential relay is to be tested:
y Test the operating characteristic for bias currents of 0.5, 3.0, 5.0, 7.5
and 10.0 for an A-N and a B-C fault.
y Test the trip time characteristic for differential currents of 1.0, 2.0, 3.0,
4.0 and 5.0 for a B-N and a C-A fault.
y Test the harmonic inrush restraint characteristic of the A, B and C
phase for differential currents of 0.5, 1.0, 2.0, 3.0 and 3.5.
y Test the configuration (or stability) of the relay for a C-N and an A-B
through-fault for test currents of 0.5, 1.0 and 2.0 A.
The relay forms part of the following transformer scheme:
Figure 6-3:
Protected Object
The following settings are given:

y Inom: 1 A
y fnom: 50 Hz
y Pick Up (O87P): 0.2 multiple of TAP
y High Set (U87P): 4 multiple of TAP
y Slope 1 (SLP1): 20 %
y Slope 2 (SLP2): 100%
y Turning Point (IRS1): 2.5 multiple of TAP
y 2nd Harmonic Restraint (PCT2): 15 %
115
y 5th Harmonic Restraint (PCT5): 35%

y Trip time: Instantaneous
y The starpoint of all CTs are connected towards the transformer
The operating characteristic in the Idiff vs. Ibias plane looks as follows:
Figure 6-4:
Operating characteristic of
a SEL 387 relay
IOP
Operating Region
Slope 2
(SLP2)
Slope 1
(SLP1)
Restraining Region
O87P
IRS1
IRT
Solution
The OMICRON Test Universe offers dedicated test modules to test the
operating characteristic, the trip time characteristic, the harmonic restraint
characteristic as well as the stability (or configuration) of a differential relay.
All modules model the transformer scheme taking the vector group, CT ratio
and zero sequence elimination into account. For numerical relays the vector
group correction, CT mismatch correction as well as the zero sequence
elimination are performed inside the relay, i.e. in the relay software
algorithm. For such relays interposing CTs are no longer necessary to allow
for the above effects. For testing the relay, however, this requires the relay
to be injected with the exact equivalent of the primary currents flowing in the
transformer scheme. This implies that up to six independent currents are
required to test a two winding transformer scheme.
To calculate all six currents manually is a laborious mathematical
calculation, especially for faults that are not clear through-faults or in-zone
faults. The use of the OMICRON Advanced Differential test modules
116
Operating Characteristic, Trip Time Characteristic, Harmonic Restraint and

Configuration are therefor recommended to test the relay.
Normally an automatic test will be carried out, where all the above functions
plus any other auxiliary functions are tested in one integrated test
document. This can be achieved by embedding the various differential test
modules and any other test modules into an OMICRON Control Center
document.
To simplify this example, however, the Advanced Differential modules will be
used stand-alone.
6.4.1
Establishing the Wiring between the Relay and the CMC / CMA
is not connected to the electrical system in any way.
In this example the default configuration of a CMC 256 is used to
supply the primary and secondary currents to the relay:
1. Connect the HV current inputs of the relay to the corresponding
current outputs on the CMC 256 Group A.
2. Connect the LV current inputs of the relay to the corresponding
current outputs of the CMC 256 Group B.
3. Ensure that the current outputs of the relay, i.e. the output side of
the current transformers, are connected together in a starpoint, which
is connected to the N terminals of the CMC.
4. Connect the trip signal of the relay to binary input 1 of the CMC see
Figure 6-3 for more detail.
117
Figure 6-3:
Omicron CMC256 and
SEL387 Relay
118
6.4.2
Entering the Test Object Settings and Parameters with the

Schweitzer SEL387 Converter
For easy entry of relay settings into the OMICRON software XRIO1
converters are available. This converter enables the user to enter the
setting of a relay directly into the Test Universe Advanced Distance
software.
The parameters and settings can also be entered manually into the
Test Object. See Chapter 15. Close the Configuration test
module..
6.4.3
Starting Diff Operating Characteristic

2. Select test module "Differential...", select "Advanced Differential" and
click on Diff Operating Characteristic.
specific data.

119
Figure 6-5:
Function
1

6. Open the Schweitzer folder -Figure 6-6 2 folder by double clicking
on the folder or selecting Open Figure 6-6 3.
Figure 6-6:
Change to XRIO
OMICRON Folder
7. Select Schweitzer SEL387 Converter.xrio - Figure 6-7 1 and click

on Open - Figure 6-7 2.
120
Figure 6-7:
File Browser

Figure 6-8 1.
9. Enter the relay settings into the Transformer Data -Figure 6-9 1 and
Relay Data dialogs -Figure 6-10 1.
Figure 6-8:
Information
121
Figure 6-9:
XRIO Converter
Transformer Data Relay
Settings
Figure 6-10:
Data Relay Settings
122
6.4.4

Figure 6-11:
General
1

relevant tabs.
The configuration of the binary inputs, i.e. if the signal is potential free
or voltage sensitive is specified on the binary inputs.
2. Select CMC256(?????) from menu - Figure 6-11 1.
3. Click on Details - Figure 6-11 2.
4. Select 6x12.5A... - Figure 6-12 1 and click on OK - Figure 6-12 2.
123
Figure 6-12:
Hardware
Configuration:Output
5. Assign the Test Module Output Signals as shown in Figure 6-13.

Figure 6-13:
Hardware
Outputs
124
6. Assign the Test Module Input Signals as shown in Figure 6-14.

Figure 6-14:
Binary inputs
125
6.4.5
6.4.5.1
The Operating Characteristic Test

Performing a Shot Test
1. Click on the Shot page in the Operating Characteristic Test View.
Note: Shot and Search tests cannot be executed at the same time. To
execute a Shot test, ensure that all Search test points have been
removed and vice versa.
2. Enter test points for bias currents of 1.0, 4.0, 6.5 and 10.0 at the
tolerance border below and above the operating characteristic.
Note: Specifying shots BETWEEN the tolerance borders will always
be assessed as OK, as here the relay could either trip or be stable.
The test is thus of little use. Therefore always place shots OUTSIDE
the tolerance borders. If the relay operates incorrectly outside the
designed tolerance limits, the test point will be marked as NOT OK.
Single test points can be entered in one of the following ways:
-
Numerically:
i) Enter the test point defined by specifying Idiff and Ibias - Figure
6-15 1
ii) Click on Add to add the test point to the list of test points.
(or) Graphically:
i) Point with the mouse at the required Idiff and Ibias test point in
the actual graphic.
ii) Press Ctrl and click with the left mouse button (or Right
mouse click and select Add testpoint) to add this test point to
the list of test points.
iii) Press Shift and click with the left mouse button (or Right
mouse click and select Shot at....) to immediately execute a
single test.
The column widths in the test point table can be adjusted by dragging
the respective split bar in the column header.
3. Specify an A-N fault - Figure 6-15 2.

4. To run a test, select Test|Start.
126
The test results are shown in terms of the actual trip time (tact
column) and an assessment in the status column and in the graph.
The assessment states whether the trip time was within the specified
trip time tolerance limits - Figure 6-15 3.
A test is only possible, if no results are present. Before clearing the
results, first save the results, then select Test|Clear.
The test quantities can also be output in steady state by selecting
Test|Static Output.
Figure 6-15:
Test: Shot Test
1
2
127
6.4.5.2
Viewing the Report

1. Select View|Report.
Figure 6-16:
Report View
128
6.4.5.3
Saving the Test

Use a descriptive file name for easy identification later.
3. Click on "Save".
by selecting "File|Save".
129
6.4.5.4
Performing a Search Test

1. Click on the Search page in the Operating Characteristic Test View.
execute a Search test, ensure that all Shot test points have been
removed.
2. Enter the test lines for bias currents of 0.5, 3.0, 5.0, 7.5 and 10.0.
Test lines can be entered in one of the following ways:
-
Numerically:
i) Enter the vertical test line defined by Ibias - Figure 6-17 1
ii) Click on Add to add the test line to the list of test lines.
(or) Graphically:
i) Point with the mouse at the required test line, i.e. anywhere on
the vertical line.
ii) Press Ctrl and click the left mouse button (or Right mouse
click and select Add Testpoint) to add this test line to the list of
test lines.
iii) Press Shift and click the left mouse button (or Right mouse
click and select Search at....) to immediately execute a single
test.
3. Specify a A-N fault - Figure 6-17 2

The test results are shown in terms of the differential current at which
the relay picks up (Idiff column).
The assessment states whether the pick-up found was within the
specified current tolerance limits (Status column).
A test is only possible, if no results are present. Before clearing the
results, first save the results, then select Test|Clear.
130
Figure 6-17:
Test: Search Test
1
2
5. View the report as before.

6. Save the test under a different filename.
7. Clear the results.
8. Change the fault type to B - C fault - Figure 6-17 2
9. Run test by selecting Test|Start.
10.View the report as before.
11. Save the test under a different filename.
12.Close the Operating Characteristic test module.
6.4.5.5
Exporting an XRIO File

specific data.
2. Select File|Export- Figure 6-18 1.
3. Select the folder the file must be saved in - Figure 6-19 1.
4. Name the file - Figure 6-19 2.
5. Select the Save As type for XRIO files (*.xrio)- Figure 6-19 3.
131
Figure 6-18:
XRIO File Export
1
Figure 6-19:
File Save As Dialog
3
1
6. Click on Save- Figure 6-18 4.

7. The XRIO file will now be available for all other differential Test
Modules
132
6.4.6
The Trip Time Test

1. From the OMICRON Start Page select Differential..., then
Advanced Differential... and then the Test Module Diff Trip Time
Characteristic.
specific data.
3. Click on File|Import and browse for the XRIO file exported during
the previous example.
4. Verify the hardware configuration as before.
5. Enter test points for differential currents of 1.0, 2.0, 3.0, 4.0 and 5.0.
-
Numerically:
i) Enter the test point defined by Idiff - Figure 6-20 1
(or) Graphically:
i) Point with the mouse at the required differential current, i.e.
anywhere on a vertical line defined by Idiff.
click and select Add testpoint) to add this test point to the list
of test points.
click and select Shot at....) to immediately execute a single
test.
6. Specify a B-N fault - Figure 6-20 2.

The test results are shown in terms of the actual trip time (tact
column) and an assessment in the status column as well as in the
graph. The assessment states whether the trip time was within the
specified trip time tolerance limits - Figure 6-20 3.
The test quantities can also be output in steady state by selecting
Test|Static Output.
133
Figure 6-20:
Trip Time Test
1
3

9. Save the test as before.
10.Repeat the test for a C-A fault.
11. Close the Trip Time Characteristic test module.
134
6.4.7
The Harmonic Restraint Test

Advanced Differential... and then the test module Diff Harmonic
Restraint.
specific data.
the earlier example.
6.4.7.1
Harmonic Shot Test

1. Click on the Shot page - Figure 6-21 1.
execute a Shot test, ensure that all Search test points have been
removed.
2. Specify a test with second harmonic - Figure 6-21 2.
3. Specify the test phase as ABC, i.e. to superimpose the harmonic
current on all three phase currents - Figure 6-21 3. Testing the
harmonic function only on a single phase can lead to inconsistent
results, especially if the relay does not have a harmonic crossblocking function.
4. Enter the test points for differential currents of 0.5, 1.0, 2.0, 3.0 and
3.5 at the upper and lower harmonic tolerance borders.
-
Numerically:
i) Enter the test point defined by specifying Idiff and Ixf/Idiff, i.e.
the percentage of harmonic current - Figure 6-21 4.
(or) Graphically:
i) Point with the mouse at the required Idiff and Ixf/Idiff.
135
click and select Add testpoint) to add this test point to the list
of test points.
test.
The test results show if the relay tripped or restrained correctly. The
assessments are shown in the status column as well as in the graph.
For tests to the left of the harmonic threshold, tripping is expected, i.e.
if the relay tripped the test is assessed OK. For tests to the right of
the harmonic threshold, restraining is expected, i.e. if the relay did not
trip, the test is assessed with OK.
Figure 6-21:
Harmonic Restraint Test:
Shot Test
1

136
6.4.7.2
Harmonic Search Test

1. Click on the Search page - Figure 6-22 1
execute a Search test, ensure that all Shot test points have been
removed.
2. Specify a test with second harmonic.
3. Specify the test phase as ABC.
4. Enter test lines for differential currents of 0.5, 1.0, 2.0,3.0 and 3.5.
Test lines can be entered in one of the following ways:
-
Numerically:
i) Enter the test line defined by specifying Idiff - Figure 6-22 2.
ii) Click on Add to add the test line to the list of test lines.
(or) Graphically:
i) Point with the mouse at the required test line, i.e. anywhere on
the horizontal line defined by Idiff.
click and select Add testpoint) to add this test line to the list of
test lines.
test.

The test results are shown in terms of the percentage harmonic at
which the relay starts to restrain tripping. The assessment states
whether the threshold found was within the specified harmonic
tolerance limits (Status column).
137
Figure 6-22:
Harmonic Restraint Test:
Search Test
1
2

8. Close the Harmonic Restraint test module.
138
6.4.8
The Configuration Test

Advanced Differential... and then the Test Module Diff
Configuration.
specific data.
the earlier example.
The goal of the configuration (or stability) test is not to confirm the
non-tripping of the relay, but to verify, that for an out-of-zone or
through-fault condition, the differential current measured by the relay
is close or equal to zero. For conventional relays, this can only be
performed manually, by physically measuring the current in the
differential winding with a clip-on CT. For numerical relays, the
differential current can be displayed in the setting software or on the
User Interface of the relay. As the measurements are manual, the
assessment of the test also needs to be done manually.
5. Click on the Test Data page.
6. Enter a test point at a test current of 0.5A - Figure 6-23 1.
7. Click on Add to add the test point to the list of test points.
8. Repeat for a test current of 1.0A and 2.0A.
9. Specify a C-N fault - Figure 6-23 2.
11. For each test point:
a) Measure the differential current for each phase on the relay.
b) Manually assess, if this differential current is equal or almost equal
to zero by selecting Passed or Failed - Figure 6-23 3.
The test software will only proceed to the next test point after either
Passed or Failed has been selected. The assessment of the test
results are shown in terms of the manual assessment entered.
The measurement of the Ibias and Idiff current for each phase can be
entered on the test page. These results are then displayed on the test
report.
139
Figure 6-23:
Configuration Test
12.View the report as before.

13.Save the test as before.
14.Repeat the test for an A-B fault.
15.Close the Configuration test module.
140
Ramping
Testing with the Ramping Module

The Ramping test module is designed to provide the user with a versatile
tool for performing various types of ramp tests.
It is possible to simultaneously ramp two functions of any signal combination
with up to fourthy ramp states. Each state contains individual trigger
conditions and assessments.
7.1
Ramping Features
The most significant features are:
y Any two output signal combinations can be varied simultaneously
with respect to magnitude, phase angle and frequency.
y Up to nine generators can be varied independently.
y Complex ramp state sequences can be constructed, as each ramp
state can be defined individually.
y The ramp states are displayed graphically immediately at definition.
During a test the output ramp states and the corresponding binary
input responses are displayed on-line.
y Individual trigger conditions to stop the ramp state or to continue with
the next ramp can be defined for every ramp state.
y Binary outputs are configurable for each state.
A wide variety of tests can be performed using the Ramping module. The
following are a few examples:
y Relay pick-up test
y Relay drop-out test
y Overcurrent directional test
y Synchronization test (synchro-check)
y Voltage regulator test for transformers
y Voltage regulator test for generators
141
Figure 7-1:
User interface of the
Ramping test module.
The Ramping test module provides 4 different views:

y Test view
y Detail view
y Measurement view
y Signal view
y Report view
7.1.1
Test View
In the Test View, the shape of the ramp can be selected. Also all individual
ramping parameters can be set.
On the general tab the number of test repetitions and the ramp states to be
considered for the pick-up / drop-out ratio calculation can be specified.
142
Ramping
7.1.2
Detail View
In the Detail view the user can:
y specify the static values for the magnitude, phase angle and
frequency of those analog outputs which are not changed during a
specific ramp state.
y activate or deactivate the binary and/or the transistor outputs during
the execution of individual ramp states.
y set individual trigger conditions for each ramp state.
Note: As the ramp state transitions can occur at any time, i.e.
whenever the relay picks up, the behavior of the phase angle at this
transition needs to be carefully considered.
If the option Force absolute phases is selected, the new state will
start with the absolute phase angles as specified by the user. If the
previous state finished at any other phase angle a phase jump will
thus result.
If the above option is de-selected, the rotation of the phase angle
during the state transition is continuous, i.e. no phase jump will
occur. This means, however, that the absolute phase angles at which
the new state is starting, are adjusted automatically to the phase
angles at which the previous state stopped.
Please refer to the on-line help system of the Ramping module for a
detailed example on this subject.
7.1.3
Measurement View
The Measurement view allows specification of pick-up or drop-out events
and assesses the measurements as either passed or failed based on the
defined nominal values and deviation
7.1.4
Time Signal View

The time signal view displays the proposed analog ramp signals and the
output ramp states before a test is executed. During execution of the test,
the real output signal as well as the binary responses are displayed in real
time.The time and signal values can be determined using two markers. The
displayed values are effective rms values.
A properties menu (Right Mouse click) allows:
y Displaying or hiding certain diagrams of the view.
y Displaying or hiding certain signals in a diagram.
y Zooming.
143
7.1.5
Report View
The Report View displays the test document with the data and the
assessment results from testing.
7.1.6
Additional Functions in the Signal View

y Marker
The markers act as anchor points for the measuring cursors.
To position the markers on the time axis, either drag them with the
mouse to the desired position, or use the arrow keys on the keyboard.
y Cursor Data dialog box
The Cursor Data is displayed at the top of the Time Signal view. The
position of cursors 1 and 2 on the time axis and the time difference Dt
between the cursors is displayed. Furthermore the corresponding
instantaneous values of the signals selected are displayed.
The exact cursor position can also be entered directly into the
corresponding time field.
Note: The cursors "stick" to the events to aid the definition of their
positions.1
y Ramp state transitions
Ramp state transitions from one ramp state to another are
represented by vertical lines which are displayed in all diagrams of
the view. Each ramp state transition is designated with the name of
the ramp state which starts at that point. This means that the first
ramp state transition is displayed at position t = 0 s and named "State
1".
y Ramped quantity
The ramped signal quantities are displayed in the diagram as a
function of time. A different line format is used for each quantity that is
ramped. The legend for the line types used is displayed at the bottom
of the diagrams. If more than one quantity is ramped simultaneously,
an additional ordinate with a corresponding scaling is displayed on
the right hand border of the diagram. The displayed values are
effective rms values.
144
An event is defined either as a state transition or as a change at a binary input.
Ramping
y Binary output signals

The binary output signals are labeled with the designations assigned
in the hardware configuration. The binary state 0 is represented by a
thin line and the binary state 1 is represented by a stylized rectangle.
y Binary input signals
Like the binary output signals, the binary input signals are also
labeled with the designations assigned in the hardware configuration.
The binary state 0 is represented by a thin line and the binary state 1
is represented by a stylized rectangle.
7.1.7
Navigation Toolbar
Figure 7-2:
Navigation toolbar of the
Ramping test module.
The navigation toolbar is used to move between the various ramp states.
This is particularly useful when defining analog-, binary- and trigger
conditions in the Detail View.
For more detailed information, please refer to the context sensitive on-line
help for the Ramping test module.
145
7.2
Example Ramping: Pick-up Test

Task
Test the under-frequency function of a relay, e.g. a Load shedding
relay. The pick-up/drop-out value of the first stage is of particular
interest. This stage is set at 49.5 Hz and trips in 500ms.
Under-Frequency Relay Theory
Load shedding schemes can increase system reliability by preventing

total system collapse during emergency operating situations when
load exceeds generation. Large decreases in frequency can only
occur when an area is separated from the interconnected system and
is left with a generation-load imbalance. If the generation does not
match the load in the isolated area, an automatic load shedding
scheme based on system frequency can be used to maintain system
stability and provide additional protection for remaining loads and
other equipment. The frequency is measured on the system voltage.
Solution
The test will be performed using the dedicated Ramping module of
the OMICRON Test Universe.
To carry out a pick-up and drop-out test for a frequency function, two
consecutive ramp states have to be defined.
y Ramp state 1 from 50 Hz to 49 Hz for the pick-up test.
y Ramp state 2 from 49 Hz to 50 Hz for the drop-out test.
The assessment of the pick-up/drop-out values can be automated by
entering the nominal values for pick-up (49.5 Hz) and drop-out (49.52
Hz) and the corresponding tolerances (0.01 Hz).
During the test, the test module analyses and evaluates, whether the
measured values are within the defined tolerance band and assesses
the test with "passed" or failed. All entered values and the measured
values are recorded automatically to allow a detailed view of the test
process after completion of the test.
Normally all the available protection functions of a relay are tested
sequentially. For these cases, it would make sense to embed the test
module in an OCC test document, together with the other tests. The
OMICRON Control Center can then run and process all of the tests in
the test document automatically.
As in this case only a single test needs to be performed, it is quicker
to start the Ramping test module in stand-alone mode.
146
Ramping
7.2.1
Establishing the Wiring between relay and CMC

to the relay.
outputs of the CMC.
2. The trip contact of the relay is connected to binary input 1 of the CMC
see Figure 7-3 for more detail.
147
Figure 7-3:
Omicron CMC256 and
Siemens 7SJ63 Relay
148
Ramping
7.2.2
Starting the Ramping Test Module

2. Click on test module "Ramping...." and select Ramping.
3. Activate the Test View by selecting View|Test.
7.2.3

1. Select "Parameters|Test Object" to open the dialog for the test object
specific data.
2. Select Device - Figure 7-4 1 and click on Edit - Figure 7-4 2.
Figure 7-4:
Test object parameters.
149
Figure 7-5:
Device Settings page
4. Click "OK" - Figure 7-5 1 to close the Test object parameters.

5. Click on OK Figure 7-4 3.
150
Ramping
7.2.4

Figure 7-6:

amplifiers can be specified by clicking on Details - Figure 7-6 1. Here
the user specifies, which outputs are used and how they are
connected, e.g. in a three phase configuration, or connected in
parallel or in series to boost the output range or power.
relevant pages.
The configuration of the binary inputs, i.e. if they are used to pick-up
potential free or voltage sensitive signals, is specified on the binary
inputs tab.
3. Select 3x300V... - Figure 7-7 1 and click on OK - Figure 7-7 2.
151
Figure 7-7:
Hardware

Figure 7-8:
Hardware
Outputs
152
Ramping

Figure 7-9:
Binary inputs
153
7.2.5
Defining the Ramp States

1. Click on the "Add state to end of table button" icon to specify two
consecutive ramp states - Figure 7-10 1.
Figure 7-10:
Test View - Ramp Settings
2
4
3
5
2. For V A-N,B-N,C-N - Figure 7-10 2, define the Frequency as the

function to be ramped - Figure 7-10 3.
3. Ramp state 1 will determine the pick-up of the under-frequency relay
at 49.5 Hz. The frequency should be ramped over a range from 50 Hz
Figure 7-104 to 49 Hz - Figure 7-10 5.
y The step size df should be set to 1.000 mHz - Figure 7-10 6.
y The step time dt shall be greater than the longest possible trip time
of the relay. In our example set dt to 1s - Figure 7-10 7.
y This results in a ramp state with a rate of change df/dt of

-1.000 mHz / 1000 ms = -1.000 mHz/s - Figure 7-10 8.
Note: Instead of changing the step size df or step time dt, the
desired rate of change df/dt for the ramp state can be entered
directly - Figure 7-10 8.
4. Ramp state 2 is defined in the same way. The parameters of ramp
state 2 are opposite to those of ramp state 1.
5. The condition that should stop a ramp state is defined in the Stop
condition field - Figure 7-10 9.
6. Activate the Signal View by selecting View|Signals.
Note, that the defined ramp states are automatically displayed in the
signal view:
154
Ramping
Figure 7-11:
Signal view
7.2.6
Defining the Static Output Values

1. Activate the Detail View by selecting View|Detail.
All output values that do not change, i.e. are not ramped during the
ramp test, are defined on the "Analog Outputs" tab in the Detail View.
These values are shown on a yellow or white background and can be
edited in this view. Values to be ramped are shown on a grey
background.
Note: As individual output values can be specified for EACH state,
they need to be entered and/or verified for EACH state.
The name of the active ramp state is displayed at the top of the table.
Use the navigation toolbar to alternate between the individual ramp
states - Figure 7-13.
155
Figure 7-12:
Detail View
7.2.7

The test module must know, which contacts (i.e. binary inputs of the CMC)
to react to during the ramp state of a test.
1. Select the "Trigger" tab in the Detail View.

Note: The trigger condition has to be defined for EACH ramp state
individually. Use the navigation toolbar to alternate between the
individual ramp states.
Figure 7-13:
Navigation toolbar
2. Select the Stop Condition Ramp State 1 to Binary trigger - Figure

7-14 1.
3. During ramp state 1, the trip contact should pick up, i.e. change from
state "0" to state "1". Consequently set the binary trigger condition for
the trip contact to 1 as we are waiting for a 1 - Figure 7-14 2.
4. Set the binary trigger condition of the trip signal for ramp state 2 to 0
to trigger on the dropping out of the pick-up signal, i.e. we are waiting
for a 0 during this state.
156
Ramping
Figure 7-14:
Detail View - Trigger tab.
The feature "Step Back" - Figure 7-14 3 - enables a sub ramp to be

executed, which makes it possible to find pick-up values as accurate
as possible in the shortest possible time.
7.2.8
Defining Measurement Conditions

The pick-up and drop-out values to be measured are defined in the
Measurement View.
1. Select the Measurement View.
Note: The Name of the measurement can be change, by a delayed
click on the Name field and typing in the new measurement name Figure 7-15 1.
2. Select the Ramp state for the measurement - Figure 7-15 2.
3. Define the trigger Condition tor the measurement.The actual pick-up
value measured, the deviation and an assessment are displayed as
soon as the trigger condition is fulfilled - Figure 7-15 3.
Ramp state 1: Nominal pick-up value 49.5 Hz - Figure 7-15 4 - with
a tolerance of 10 mHz - Figure 7-15 5.
Ramp state 2: Nominal drop-out value 49.52 Hz with a tolerance of
10 mHz.
157
Figure 7-15:
Nominal and measured
pick-up values and
assessment.
4. Calculations can be performed between any two of the Ramp

Measurements. In this example the Drop off over Pick-up value is
determine -.Figure 7-15 6.
7.2.9
Defining and printing the Test Report

1. Select View|Report to activate the Report View.
2. View the report.
3. Select File|Print to print the report.
7.2.10
Saving the Test Report

1. The last step is to save the test document to the desired location
using the menu item "File|Save As...". The test process and the test
results are saved and can be retrieved at any time.
Note: Remember to save a new test to a new file name, otherwise the
old test document might be overwritten. To prevent any data loss,
also remember to regularly save your data.
If this test is to be repeated at a later time, only the test document
needs to be loaded, which can be re-executed after deleting the
previous results. This saves time and makes it possible to exactly
reproduce a standard test. The exact recording of behavior trends of
protection devices are thus possible.
158
Ramping
7.3
7.3.1
Using the LinkToXRIO with a XRIO Converter

What is a XRIO Converter?
A XRIO Converter is a customized user interface that can be
structured in such a way to resemble the relays software and/or front
panel. This allows error free entry of relay specific settings.
Complex calculations and construction of relay charteristic can be
defined with these XRIO converter.
The parameters required for the Test Universe software is calculated
and/or linked to the correct fields within the XRIO Converter.
A few XRIO Converters for the most common protection relays is
available in the Test Object Library. Users can create there own
XRIO converters, for more information refer to the XRIO user
manual. As shortcut to this manual is available from the Test
Universe Startpage.
7.3.2
What is LinkToXrio?
The LinkToXrio functionality allows the user to link certain fields in
Test Modules to parameters defined in the XRIO Converter. This
functionality will update the field link to a XRIO parameter when the
parameter is changed in the XRIO Converter.
The LinkToXrio function makes it possible to create generic test
documents without knowing the relay settings. When loading the
relay parameters, the linked parameters are automatically updated
and the relay is tested accordingly.
different settings.
159
Task
Test the under-frequency function of a relay, e.g. a Load shedding
relay. The pick-up/drop-out value of the first stage is of particular
interest. This stage is set at 49.5 Hz.
Solution
The test will be performed using the dedicated Ramping module of
the OMICRON Test Universe.
To carry out a pick-up test for a frequency function one ramp state
has to be defined.
y Ramp state 1 from 50 Hz to 49.5 Hz for the pick-up test.
7.3.3
Starting the Ramping Module

2. Click on test module "Ramping...." and then Ramping.
7.3.4

specific data.
160
Ramping
Figure 7-16:
Function
3. Browse for the XRIO Converter required -Figure 7-17 .

Figure 7-17:
Change to XRIO
OMICRON Folder
1
4. Select the XRIO Converter - Figure 7-17 1 and click on Open Figure 7-17 2.
5. Enter the relay settings - Figure 7-18 1.
161
Figure 7-18:
XRIO Converter
6. Click on OK Figure 7-18 2.
7.3.5
Defining the Ramp State with the LinkToXRIO function

1. Click on the "Delete last state" button so that only one ramps state
can be defined - Figure 7-19 1.
Figure 7-19:
Test View - Ramp Settings
2
2. For V A-N,V B-N,V C-N - Figure 7-19 2, define the Frequency as

the function to be ramped - Figure 7-19 3.
Note: When testing pick-up and/or drop-out values its recommended
that the From and To values is defined to at least double the test
objects tolerance.
3. In this example the tolerance of the relay is 10%. There for the From
value should be 20% above the expected pick-up and the To value
should be 20% below expected pick-up.
Note: The LinkToXRIO function defines the actual value for the linked
parameter as a multiplier of the set value.This multiplier is defined in
the Factor field.
162
Ramping
4. The Factor for the From value is thus 1 + 20% = 1.2 and the To
value is 1 - 20% = 0.8.
5. Link the From value to the XRIO parameters by right clicking in the
From field and selecting LinkToXRIO - Figure 7-20 1.
Figure 7-20:
LinkToXRIO function
6. Browse the XRIO tree to link the From parameter to an XRIO

parameter, in this example Stage 1 - Figure 7-21 1. Define the
Factor as 1.2 - Figure 7-21 2.
Figure 7-21:
XRIO tree
1
2
4
The Result displays the actual value the From value will be set to
with the Factor of the Parameter value - Figure 7-21 3.
8. Link the To value by repeating steps 5 to 7.
To change this link, right-click it and select "LinkToXRIO" once

again. Repeat the procedure mentioned above.
To remove the link, right click it and select "Remove Link".
163
If you position the cursor over - or, depending on the type, into - the
field of an established LinkToXRIO, a tooltip displays the entire path
of the parameter. The tooltip differentiates between absolute and
relative mode - Figure 7-22.
Figure 7-22:Tooltip
information
9. If the linked parameter in the XRIO Converter is changed the field is

automatically updated to the new value, for example the value of
Pick Up is changed to 49 Hz - Figure 7-23 1.
10.The From value is automatically updated to 1.2 * 49.0 Hz = 58.80 Hz
- Figure 7-24 1.
Figure 7-23:
XRIO Converter
164
Ramping
Figure 7-24:
Updated parameters
165
7.4
Testing with the Pulse Ramping Module

Pulse Ramping provides functionality to ease the testing of pick-up values of
a multi-functional protection relay with more than one protection function
and/or elements.
To do so, Pulse Ramping generates a sequence of pulses (each pulse width
representing the fault time) with an increasing (or decreasing) step size. In
between two consecutive ramp pulses, a "reset" state is inserted. Therefore,
a pulse ramp is actually a ramp that is interrupted after each pulse for a
defined period of time.
The ramp pulses are increased by the step size until the ramp either
reaches its maximum value or the pick-up threshold.
Figure 7-25:A typical pulse

ramp
7.4.1
Example Pulse Ramping: Instantaneous Pick-up Test

Task
Test the instantaneous (I>>) pick-up of an overcurrent relay. The I>>
is set at 8 A and the inverse pick-up (I>) is set to 1 A, the
instantaneous function will typically trip within 50ms.
Solution
The test will be performed using the dedicated Pulse Ramping
module of the OMICRON Test Universe.
To carry out a pick-up test for a Instantaneous function a reset and
ramp states have to be defined.
y During the Reset state the current must be set below the I> pickup with a duration long enough so that the relay resets, i.e. 0 Amp
for 500mS.
y The From value for the ramp state must be set to 10% below the
expected I>> pick-up, i.e. 8 * 0.9 = 7.2 A
166
Ramping
y The To value to 10% above the I>> pick-up,i.e. 8 * 1.1 = 8.8 A

The assessment of the pick-up values can be automated by entering
the nominal values for I>> pick-up (8 A) and the corresponding
tolerances of 5% (0.4 Amp).
During the test, the test module analyses and evaluates, whether the
measured values are within the defined tolerance band and assesses
the test with "passed" or failed. All entered values and the measured
values are recorded automatically to allow a detailed view of the test
process after completion of the test.
Normally all the available protection functions of a relay are tested
sequentially. For these cases, it would make sense to embed the test
module in an OCC test document, together with the other tests. The
OMICRON Control Center can then run and process all of the tests in
the test document automatically.
As in this case only a single test needs to be performed, it is quicker
to start the Pulse Ramping test module in stand-alone mode.
7.4.2
Establishing the Wiring between relay and CMC

to the relay.
outputs of the CMC.
2. The trip contact of the relay is connected to binary input 1 of the CMC.
167
7.4.3
Starting the Ramping Test Module

2. Click on test module "Ramping...." and select Pulse Ramping.
7.4.4

1. Select "Parameters|Test Object" to open the dialog for the test object
specific data.
Figure 7-26:
168
Ramping
Figure 7-27:
4. Click "OK" - Figure 7-27 1 to close the Device Settings page.

5. Click on OK Figure 7-26 3 to close the Test object parameters.
169
7.4.5

Figure 7-28:

3. Select 3x12.5A... - Figure 7-29 1 and click on OK - Figure 7-29 2.
Figure 7-29:
Hardware
170
Ramping

Figure 7-30:
Hardware
Outputs

Figure 7-31:
Binary inputs
171
7.4.6
Defining the Pulse Ramp States

Figure 7-32:
Test View - Pulse Ramp
Settings
10
1
3
2
5
7
9
2. For I A,B,C - Figure 7-32 1, define the Magnitude as the quantity

to be ramped - Figure 7-32 2.
3. Enter 0 Amp for the Reset value - Figure 7-32 3.
4. Enter the start value of the ramp state in From value field, i.e. 7.2 A
Figure 7-32 4.
5. Enter the end value of the ramp state in To value field, i.e. 8.8 A
Figure 7-32 5.
y The step size should be set to 50.00 mA - Figure 7-32 6.
y The Reset time should be set long enough for the I> pick-up to
reset. In our example 500ms - Figure 7-32 7.
172
Ramping
y The Fault time should be set long enough for the I>> pick-up to
operate, i.e. typically twice the expected time. In this example
100mS - Figure 7-32 8.
y Define a nominal I>> pick-up value of 8 A and a tolerance of 400
mA - Figure 7-32 9.
6. Select the Analog outputs page - Figure 7-32
Figure 7-33:
Test View - Analog outputs
All output values that do not change, i.e. are not ramped during the
ramp test, are defined on the "Analog Outputs" tab. These values are
shown on a yellow or white background and can be edited in this
view. Values to be ramped are shown on a grey background.
7. Balance the angles in the Fault state - Figure 7-33 1.
8. Select the Test conditions page - Figure 7-33 2.
Figure 7-34:
Test View - Test conditions
9. Select the test to start immediatly - Figure 7-34 1.

The prefault time - Figure 7-34 1, is a time interval that precedes the
first fault time of the pulse ramp with the same conditions as the
Reset state.
173
10.Select to stop the ramp as soon as the measurement conditions are

met - - Figure 7-34 2.
11. Activate the Signal View by selecting View|Signals.
Note, that the defined ramp states are automatically displayed in the
signal view:
Figure 7-35:
Signal view
7.4.7
Performing a Test
2. To activate the Time Signal view, which displays the actual voltages
and currents given out, select "View|Time Signal".
174
Ramping
Figure 7-36:
Time Signal View
3. The time signal display can be zoomed by first enabling the Zoom
function. (Right Mouse click anywhere in the time signal view window
and select Zoom). One can zoom IN by pulling open a window while
keeping the left mouse button pressed. Zooming OUT is possible by
selecting Right Mouse Click Optimize. Also by left clicking on either
the horizontal or vertical scale the scale can be enlarged and by right
clicking on the horizontal or vertical scale the scale can be reduced.
Figure 7-37:
Time Signal View:
Current signals zoomed
175
7.4.8
Defining and printing the Test Report

1. Select View|Report to activate the Report View.
2. View the report.
3. Select File|Print to print the report.
7.4.9
Saving the Test Report

1. The last step is to save the test document to the desired location
using the menu item "File|Save As...". The test process and the test
results are saved and can be retrieved at any time.
Note: Remember to save a new test to a new file name, otherwise the
old test document might be overwritten. To prevent any data loss,
also remember to regularly save your data.
If this test is to be repeated at a later time, only the test document
needs to be loaded, which can be re-executed after deleting the
previous results. This saves time and makes it possible to exactly
reproduce a standard test. The exact recording of behavior trends of
protection devices are thus possible.
176
State Sequencer
Testing with the State Sequencer Module

The test module State Sequencer allows a sequence of states to be defined.
This sequence can then be put out in real time.
The test object's responses can be measured and recorded as functions of
time and analyzed either automatically or manually after a test.
Trigger conditions can be specified to control the sequence progression.
The following trigger conditions can be defined:
y maximum state duration
y change of state on the binary inputs
y manual key pressed
y external synchronizing signals, such as a GPS timing pulse.
8.1
State Sequencer Views

State Sequencer comprises a total of six views:
Detail View
used for defining the parameters for each

state of a sequence.
Table View
provides an overall view of all the states in

a sequence in contrast to the Detail View,
which provides an in-depth view of the
parameters for only one state at a time.
Report View
displays a pre-view of the report. The

format of the report can be customized.
Vector Diagram View
a graphical tool for displaying and defining

the voltage and current values of a state.
Time Signal View
displays the analog voltage and current

signals, binary input states (1 or 0), and
state transitions as functions of time.
Measurement View
allows specification of timing events and

assesses the measurements as either
passed or failed based on the defined
nominal time and deviation. Interactive time
measurements are also possible within the
Time Signal View.
Impedance View
a graphical tool for displaying the R/X
177
8.2

9
State Sequencer Example: Zone 1 trip time

Task
Test the zone 1 trip time of the SEL321 distance relay in Chapter 5.4
on page 85.
Solution
A multi-step automatic program is required for testing the zone 1 trip
time.
Step 1:
Healthy system.
Step 2:
Zone 1 fault condition, the fault impedance should be

less than the Zone 1 set value of 8 85. Inject a
fault at 4 85. Z = V/I, therefor the three phase
voltages should be set to 8 Volt and the three phase
test currents to 2 Amp with angle that lags the voltage
by 85.
This is an ideal application for the State Sequencer, where any number of
voltage or current states can be defined. Transition from one state to the
next is instantaneous and depends either on a fixed time elapsing or on a
trigger condition being met, as defined for the binary inputs.
Normally this test will be incorporated into an automatic test sequence for a
distance relay. In such an instance, the test should be embedded in an
OMICRON Control Center (OCC) document, where it can be integrated with
the tests to verify the reach, trip times, manual close, power swing detection,
etc.
If only a single test needs to be executed, the State Sequencer Module can
also be used stand-alone, as demonstrated in this example.
8.2.1

to the relay.
1. The voltage and current inputs of the relay need to be connected to
the voltage and current outputs of the CMC respectively. The
178
State Sequencer
starpoint of the input CTs and VTs of the relay are to be connected to
N of the CMC outputs.
2. The trip contact of the relay is connected to binary input 1of the CMC.
8.2.2
Starting the State Sequencer

2. Select the test module "State Sequencer".
3. Activate the Detail View by selecting View|Detail.

4. Activate the Table View by selecting View|Table.
8.2.3
Entering the Test Object Parameters and Settings

1. Select "Parameters | Test Object" to open the dialog box for the test
object specific data.
179
Figure 8-1:

Figure 8-2:
4. Click "OK" to close the Test object parameters - Figure 8-2 1.

180
State Sequencer
8.2.4

Figure 8-3:
General page

relevant tabs.
The configuration of the binary inputs, i.e. used to pick-up potential
free or voltage sensitive signals is specified on the binary inputs page.
2. Click on Binary/Analog Input page - Figure 8-3 1.
181
Figure 8-4:
Binary/Analog Input page
3. Define binary input 1 as Trip - Figure 8-4 1.

4. Click OK - Figure 8-4 2.
8.2.5
Defining State 1: Healthy System
Figure 8-5:
Test View.
Detail View for State 1
3
1
2
182
State Sequencer
1. Select Direct in the Set Mode menu - Figure 8-5 1.

2. Define state 1 in the "Detail View" - Figure 8-5 2: Balanced nominal
voltages at 63.509 V with balanced angles. Balanced load current at
100 mA and a load angle of 5 lagging. Name this state "Healthy
system.
Note: The properties sheet (right mouse click) to equal magnitudes or
balance angles is available for all amplitude or phase angle field
respectively.
The values entered in the "Detail View" are automatically transferred
to the "Table View" - Figure 8-5 3.
3. Click on the "Trigger" page in the "Detail View".
Figure 8-6:
Detail View: Trigger page
4
1
4. Select Timeout - Figure 8-6 1.

5. The healthy state should be put out for a fixed period of 5 seconds Figure 8-6 2.
Note: By selecting "Use binary trigger condition as specified below" Figure 8-6 4, a trigger condition for the binary inputs can be set.
Which binary inputs should be used as trigger can be specified in
Figure 8-6 3.
Also a fixed time delay after a trigger condition has been met can be
defined - Figure 8-6 5.
183
8.2.6
Defining State 2: Zone 1 Fault State

1. To define a new state, select "Edit|Insert State". Note how the settings
of the presently highlighted state have been copied into the new state.
2. Balance the voltages at 8.0 V with balanced angles.
3. Balance the currents at 2.0 A at 85 lagging and balance the angles.
Name this state "Zone 1 fault - Figure 8-7.
Note: To calculate the impedance for a fault the formula Z = V/I is
used. For this reason a negative angle of current will result in a
positive impedance angle. This will ensure that the simulated fault is
in the relays operating characteristic.
Figure 8-7:
Fault State
4. This state should be output for a maximum of 1 second Figure 8-8 1. Set a binary trigger condition - Figure 8-8 2 - for the
trip signal - Figure 8-8 3 in the event that the relay trips. Also define a
delay after trigger of 40 ms - Figure 8-8 4.
184
State Sequencer
Figure 8-8:
Test View. Defining state 3.
2
4
5
3
Note: The "Table View" provides a very useful overview of these

voltages and currents for all three states.
To activate the Vector Diagram, select "View|Vector Diagram". The
currently selected state, in this case state 2, is shown in the vector
diagram - Figure 8-8 5.
8.2.7
Defining Measurement conditions

1. Select View|Measurement.
2. Enter a Name to identify the time measurement - Figure 8-9 1.
3. Enter the Nominal time (Tnom), which will be the expected time the
trip for a zone 1 fault - Figure 8-9 2.
4. Define the time deviations (Tdev- & Tdev+) allowed for the relay. Figure 8-9 3.
185
Figure 8-9: Measurement

View
1
5. Select the Zone 1 fault in the Ignore before drop down menu
Figure 8-9 4.
Tip: Always select the Ignore before the same as the Start condition
of the time measurement.
6. Select the Zone 1 fault for the Start condition Figure 8-9 5 and the
Trip 0>1 for the Stop condition Figure 8-9 6.
8.2.8
Defining the Report Format

1. The report view can be activated by selecting "View|Report".
186
State Sequencer
Figure 8-10:
Report View
8.2.9
Performing a Test
2. To activate the Time Signal view, which displays the actual voltages
and currents given out, select "View|Time Signal".
187
Figure 8-11:
Time Signal View
3. The time signal display can be zoomed in and out and each individual
signal shown can be switched off using the properties sheet. (Right
Mouse click anywhere in the time signal view window.)
Figure 8-12:
Time Signal View:
Voltage signals zoomed
188
State Sequencer
1. Select View|Measurement.
2. The actual time measured for the predefined conditions Figure 8-13
1 and an assessment Figure 8-13 2 are displayed.
Figure 8-13:
Assessed Measurement
View
8.2.10

3. Click on "OK".
8.2.11
Saving the Test

3. Click on "Save".
Note:To prevent any data loss, remember to regularly save your data
189
190
Transducer
Testing Transducers
Due to the high accuracy of the voltage and current outputs, the CMC test
equipment lends itself to the testing of electrical measurement transducers.
The low level output signal of the transducer is measured by the dedicated
DC analog input. Both manual and automatic calibrations are possible. The
following transducers (amongst others) can be tested:
y Voltage, current and frequency transducers
y Active, apparent and reactive power transducers (single and three
phase, two and three element type)
y Phase angle and power factor transducers
y DC transducers (voltage, current, and power)
Figure 9-1:
Transducer:
Test View and Error Curve
View
191
9.1
Example: Active Power Transducer

Task
A Measuretronic active power transducer is to be tested. The automatic test
should verify the calibration of the transducer at a minimum of 20 test points
for a variety of importing and exporting load conditions with unity power
factor. In particular the full-scale error graph in dependency of load should
be established.
The following settings are given for the transducer:
y General Settings:
Inom: 1 A
Vnom: 110 V (L-L)
fnom: 50 Hz
Input range: -200W. 0W. +200W
Output range: -5mA. 0mA. +5mA
Class: 0.5
Type: 3 element / 4 wire
Solution
The OMICRON Test Universe offers a dedicated test module Transducer,
which is recommended to be used to test this transducer.
Individual calibration test points can be defined. An automatic test, where all
test points are sequentially tested, can be run. For multi-function
transducers, the various output functions of the transducer can be calibrated
by embedding multiple tests into an OMICRON Control Center document.
To simplify this example, however, the Transducer module is used standalone.
192
Transducer
9.1.1
Establishing the Wiring between the Transducer and the CMC

instructions for your company with respect to testing of measurement
devices are followed and adhered to.
For this example the transducer is assumed to be tested stand-alone,
i.e. it is not connected to the electrical system in any way. It is also
to the device.
1. Connect the voltage inputs of the transducer to the corresponding
voltage outputs of the CMC.
If a two element transducer is calibrated, the neutral voltage output
(VN) of the CMC is not connected to the transducer.
2. Connect all three current inputs of the transducer to the
corresponding current outputs of the CMC. Ensure that the current
outputs of the transducer, i.e. the output side of the current
transformers, are connected together in a starpoint, which is
connected to the neutral current output (IN) of the CMC.
If a two element transducer is calibrated, only the current inputs for
phase A and phase C need to be connected to the current outputs of
the CMC. Current output 2 of the CMC (normally for phase B) must
be shorted directly to the neutral point of the CMC.
3. Connect the analog output signal of the transducer to the DC analog
input (current or voltage) of the CMC.
193
Figure 9-2:Wiring Diagram

between Omicron
CMC256 and Transducer
194
Transducer
9.1.2
Starting the Transducer module

2. Select test module "Transducer".
9.1.3
Entering the Test Object Settings and Parameters

1. Select "Parameters | Test Object" to open the dialog box for the test
object specific data.
2. Select Device - Figure 9-3 1 and click on Edit - Figure 9-3 2
Figure 9-3:Test object

parameters.
195

Figure 9-4:
4. Click "OK" to close the Test object parameters.

Note to specify a sensible value for the Vmax and Imax limits, to
ensure that the transducer is not subjected to unneccessarily high
voltages or currents.
5. If the setting of Imax is smaller or equal to 1.25A, the Extended
Precision range of a CMC EP is automatically activated.
196
Transducer
Figure 9-5:Test object

parameters.
6. Select Transducer - Figure 9-5 1 and click on Edit - Figure 9-5 2

7. Select the transducer function as shown in Figure 9-6 1.
If a multi-function transducer is tested, more than one function can be
selected. A separate operating characteristic can be defined for each
function, each shown on a separate page - Figure 9-6 2.
8. Enter the accuracy class for the transducer, whether the transducer is
a single phase or three phase device, if the operating characteristic is
linear (other options are compound or quadratic) and if the
characteristic is symmetrical about the minimum value Figure 9-6 3.
9. For the operating characteristic the corresponding transducer input
and output values need to be entered. In this case, the characteristic
is symmetrical. Only the positive portion of the characteristic, i.e. for
exporting power needs to be entered:
Minimum value: 0W <=> 0mA
Maximum value: +200W <=> +5mA
The resulting characteristic is shown in the adjacent graphic.
10.Specify the transducer output signal (voltage or current) Figure 9-6 4.
11. In addition the settings for the reference vector for angle calculations,
the full scale error reference, the CT starpoint connection as well as
the settling time of the transducer have to be entered - Figure 9-6 5.
197
Figure 9-6:
Transducer Properties:
Transducer page
1
12.Click OK to close the dialogue box for Transducer Properties.
198
Transducer
9.1.4

1. Select "Parameters|Hardware Configuration" to open the dialogue
box for the hardware configuration.
Figure 9-7:
1
Any hardware related configuration of the CMC is specified in this

dialog.
amplifiers can be specified by clicking on Details. Which outputs are
used and how they are connected, e.g. in a three phase configuration
or connected in parallel or in series to boost the output range, can be
set.
outputs and DC analog inputs can be specified on the respective
pages.
2. Select CMC256(?????) from menu - Figure 9-7 1.
4. Select 3x300V.... - Figure 9-8 1 and 3x12.5A... - Figure 9-8 2
199
Figure 9-8:
Hardware
6. Assign the Test Module Output Signals as shown in Figure 9-9 and
click on OK
Figure 9-9:
Hardware
Outputs
200
Transducer
7. Assign the Test Module Input Signals as shown in Figure 9-10 and
click on OK.
Figure 9-10:
DC Analog Inputs

.
201
9.1.5
Performing a manual calibration test

1. Select "Test|Static Output" to perform a manual calibration test.
2. For each phase specify the voltages and currents to be injected in
terms of amplitude and phase angle - Figure 9-11 1. A context
sensitive menu (right mouse click) is available to aid the entry of the
generator settings.
Note: Test points can also be specified in terms of the power, which is
the input quantity of this transducer. A summary of the power set for
each phase is given at the bottom of the screen - Figure 9-11 2.
3. Switch the outputs ON - Figure 9-11 3.
Figure 9-11:
Static Output
6
4
5
3
4. The output of the transducer is measured on-line - Figure 9-11 4. At

the same time the full-scale error is calculated and an assessment is
performed: If the actual full-scale error is smaller or equal to the
theoretical full-scale error, the test is passed.
5. The analog quantities can also be manually stepped using the step
function - Figure 9-11 5.
6. After the manual tests are finished, close the Static Output View Figure 9-11 6.
202
Transducer
9.1.6
Defining an Automatic Test

1. Specify the input values, for which a calibration test should be
performed - Figure 9-13 1.
2. Click on Add - Figure 9-13 2.
Figure 9-12:
Test View with test points
defined
1
3
3. The test points added is displayed in the list view - Figure 9-13 3.
A sequence of test points can be entered by using the Add
Multiple.... function.
4. To add a test sequence, click on Add Multiple.... - Figure 9-13 4.
Figure 9-13:
Sequence Definition
4
1
2
3
5. Define the From and To values - Figure 9-13 1.

6. Select the variable to Current - Figure 9-13 2.
203
7. Select the number of points to 21, which will result in a step size of
20W - Figure 9-13 3.
8. Click on Add to Table- Figure 9-13 4.
Figure 9-14:
Test View with test points
defined
9.1.7
Performing a Test
1. Select Test | Start.
This consecutively executes all calibration test points defined.
Test | Clear.
204
Transducer
Figure 9-15:
Test view with test results
The table summarized the transducer output measured, the full-scale

error and an assessment for each test point.
205
2. View the error curves by selecting View | Error Curves.
Figure 9-16:
Test view with test results
The formulae for the above error functions are:

-
Absolute error = Pact - Pnom [in Watts in this case]
Relative error = (Pact - Pnom) / Pnom * 100% [in%]
Full-scale error = (Pact - Pnom) / P full scale * 100% [in%]
Where:
Pact - Actual measured value
Pnom - Nominal or theoretical value
P full scale - full-scale deflection of transducer
206
Transducer
3. Select View | Report.

Figure 9-17:
Report View
207
9.1.8

3. Click on "OK".
9.1.9
Saving the Test

3. Click on "Save".
208
The OMICRON Control Center
10
Automatic Testing with OMICRON Control Center

The OMICRON Control Center (OCC) is simultaneously a test manager,
word processor, and script editor. The OCC is the starting point for every
test document and extends the usefulness of every test module.
10.1
Test Modules in Test Document

A single test module focuses on an area of protection or measurement
device testing. It can be embedded in a test document or run stand-alone.
Double-clicking on a test module embedded in a test document starts up
that test module's software application.
Figure 10-1:
Example of an OCC test
document containing
multiple test objects,
hardware configurations,
and test modules.
209
Figure 10-1 depicts a test document used by the OCC. It shows how a
single definition for a test object can be used by multiple modules. Likewise,
a global definition for the hardware configuration can be used by multiple
test modules while still maintaining the ability to tweak the hardware
definition locally.
Specific test settings are made through the individual applications interface.
The test process can be initiated either from the module or from the
OMICRON Control Center. The actions that a test module takes after
assessing the pass/fail results of the test, can be defined.
10.1.1
Multiple Test Modules in a Single Test Document

When creating comprehensive overall tests, test modules can be embedded
multiple times in an OCC test document for each type of test to be
performed.
Each time a test module is embedded, its properties can be specified so that
different aspects and functions of the test object can be tested.
Embedding the same test module repeatedly into one OCC test document
can be useful for testing, say, all fault loops for a test object with similar (but
not necessarily identical) settings.
10.1.2
Multiple Test Objects in a Single Test Document

An OCC test document is not restricted to only one test object (e.g.,
protection device or relay).
For example, it could be useful to have a comprehensive test for all the
protection devices within the same relay panel. Inserting independent test
objects in one test document makes it possible, to create a complete test
report for the whole panel.
Figure 10-1 on page 209 shows an example of a test document with more
than one test object.
10.1.3
Multiple Hardware Configuration Objects in a Single Test

Document
An OCC test document is not restricted to only one hardware configuration
object. Whereas a global hardware configuration can be used by multiple
test modules, sometimes testing requires that new wiring to the test
hardware or to other test hardwares be carried out. Thus, a new hardware
configuration is required. It is possible to have the execution of the test
document paused at that point precisely for this purpose.
Figure 10-1 on page 209 shows an example of a test document with more
than one test hardware configuration objects.
210
10.1.4
Variable Information in Fields

Every test document generally has information associated with the test
report that must be kept up to date. Sometimes this information is available
from the system or user profile. This information can be inserted into the test
document using fields.
The OCC supports two types of fields:
System Fields
include present date, time of day, creation date, date

of last modification, date of test, date printed, etc.
User-information Fields
include company name, title of the document, etc.
User-information fields are created using
File | Properties. The fields are inserted into the
document using Insert | Field.
View | Options can be used to set general
information, such as the phase descriptions.
211
10.2
Defining Reports
Test | Report opens a small dialog box for the report settings. A drop-down
menu specifies whether the test document is to be a short form or a long
form, which indicates how verbose/detailed the document is.
The Define button opens a dialog box, where the contents of the report
can be defined. The various portions of the report can be included or
excluded by selected or de-selecting the appropriate check boxes.
A drop-down menu allows the selection of an existing test report template.
Clicking Add opens a dialog box to define a new report template based on
an existing template. Clicking on Delete removes the selected report
template.
10.2.1
Tree Structure of Test Document

When selecting a test document (report) template, its definition is shown in
the dialog box as a tree structure:
Figure 10-2:
Define Reports:
Tree structure of test
document
The root of the tree is the left-most item. In the example shown, "Report
Operating Char. Shot Test" is the root of the template.
10.2.2
Local and Global Templates

Changes made in the Define Reports dialog box are recorded in a local
template, which is saved as part of the test where the settings were made.
A global template exists from which each NEW test copies its report setting
definitions for its own local template. The location of the global template is
shown in the Define Report Settings dialog. The Report Settings for any test
can be reset to that of the global template by clicking on the Read button in
the Global Template box.
212
When closing the report settings option, you are prompted to save template
changes in the Global Template. Select Yes to update the global template to
use the same settings as in the current local template for all newly
generated test documents, or No to leave the global template settings as
is.
10.2.3
Set Short Form and Set Long Form

Selecting Set Short Form defines the Short Form of the report to be
defined by the current settings. Similarly, selecting Set Long Form defines
the Long Form to be defined by the current settings.
The name of the form which has been set to Short Form is followed by the
comment "OCC Short", and the form set to Long Form is followed by the
comment "OCC Long". A report setting cannot be both the Long Form and
the Short Form at the same time.
When using Test Modules from inside Control Center, it is possible to give a
single command that will tell all Test Modules to use either the Long Form or
the Short Form, rather than setting the requirement for each Test Module
individually. Selecting Test|Set All Reports, the "OCC Long" or "OCC
Short" form can be defined for all modules.
213
10.3
Running Tests from the OCC

The OMICRON Control Center is used for controlling the tests. This
includes configuration of the test modules as well as starting and stopping of
the test executions.
Figure 10-3:
Test toolbar for the OCC
10.3.1
Selecting and De-selecting Test Modules

Each test module within a test document can be individually selected or deselected for inclusion in an overall test execution.
1. Select View | Report View.
2. Check the boxes to the left of the test module names that are to be
included - Figure 10-4.
Figure 10-4:
Report View
10.3.2
Verification of Hardware Configuration

To verify the hardware configuration for a single test module:
1. Select the test module for which the hardware is to be verified either
-
from the navigation list in the report view.
or from View | List View.
2. Select "Test | Verify Hardware.
214
The Report view permits verification of the hardware configuration for the
one selected test module or for all test modules defined in the test
document.
To verify the hardware configuration for all of the test modules in the test
document:
1. In the navigation list check the boxes to the left of the test module
names that are to be included.
2. Select "Test | Verify Hardware All.
10.3.3
Starting or Continuing a Test

The OMICRON Control Center supports running single tests in a test
document or running all tests in the test document automatically.
When running all tests from the test document, the tests are performed in
sequential order. Status information on the progress of the test is displayed
in the Status Bar (or the Status History Bar).
The OCC supports the establishing of conditional controls for the test
document. In other words, it can be specified what should occur if a given
single test from the test document fails. Should the execution of the entire
test document be terminated when a single test1 fails or when a test step2
fails?
It is also possible to execute/test any of the selected test modules
individually.
To start an individual test:
1. Select the test module to be tested. To re-run a test, clear any existing
results first.
2. Select "Test | Start.
A sequence of several tests can be started from the Report view. To start a
selection of the test modules:
names that are to be included.
2. Select "Test | Start/Continue All.
Test: All test steps of a single embedded test module.
Test step: One test step of a single embedded test module.
215
10.3.4
Stopping or Pausing a Test

To stop an individual test:
1. Select the test module to be stopped.
2. Select "Test | Stop.
3. If a test is stopped, all the currents and voltages are immediately shut
down; a running test step is aborted. If the start button is clicked
again, the current test step is re-run.
To pause an individual test:
1. Select the test module to be paused.
2. Select "Test | Pause.
3. The test step running at that moment is finished. If the start button is
clicked, the test continues with the next step test.
10.3.5
Clearing Results
After a test has been run, the results are placed directly into the test
document together with the other test module information. If an individual
test or the overall (entire) test document needs to be re-run, the existing
results have to be cleared out of the test document.
To clear results in a single test:
1. Select the test module to be cleared of results.
2. Select "Test | Clear.
To clear results in more than one test:
names that are to be cleared.
2. Select "Test | Clear All.
10.3.6
Changing a Pass/Fail Test Assessment

Upon completion of a test, each test module provides information about
whether the test was successful (or not). These results are evaluated and
displayed in the OCC. An overall result is derived from these results which
represents the assessment of the entire OCC test document. These are
available as document fields. Fields can be included in the document and
updated automatically.
If the user does not agree with the automatic assessment of a test module,
the test assessment may be corrected manually to achieve a correct overall
216
assessment. However, actual test results cannot be changed or

manipulated. Test results can only be cleared and re-tested.
1. Select the test module for which the assessment is to be changed.
2. Select "Test | Assess Passed or Test | Assess Failed as
appropriate.
Note: A message appears beside the assessment saying that it is a manual
assessment.
217
10.4
Test Document Layout

The entire look and feel of the test document can be changed to suit userdefined needs. The Report view (View | Report View) in the OMICRON
Control Center is a rudimentary word processor. It permits page layout,
paragraph layout, and character formatting.
Moreover, the Report view allows test modules to be embedded and
manipulated.
In addition, other objects like graphic images or text can be embedded into a
test document. These could be schematic or wiring diagrams or other useful
images that help explain how the test is to be carried out.
10.4.1
Page Setup
File | Page Setup... opens a dialog box where the paper size, orientation of
print, and margins can be specified, as well as a paper source for printing.
The Printer dialog box may be opened from here to set printer specific
parameters
Instead, File | Print... is used for printing after its settings have been made.
10.4.2
Paragraph Formatting
Format | Paragraph... opens a dialog box that permits specification of
paragraph characteristics, such as indentation and alignment. The settings
apply to the selected paragraph or to new paragraphs created with a
carriage return (ENTER) after the current cursor position.
Indention specifies not only the left and right margins for the paragraph, but
also any special first line indenting. The alignment for a paragraph can be
set from a drop-down menu to left-justified, right-justified, or centered or
from the icons in the Format Toolbar found under View | Format Toolbar.
Figure 10-5:
Paragraph Formatting
218
Note: If text is selected before performing these actions, this text is

formatted as specified. Unselected text is not changed. If no text has been
selected, then formatting starts from the current cursor position and is
reflected in new text. If the cursor is in the middle of a paragraph, the
paragraph is reformatted and the other paragraphs remain unchanged.
10.4.3
Text Font and Colors

Any text font that is installed on the PC, which is used to generate or read
the test document, can be used to format information. As such, it is best to
choose common fonts that are available on all systems (e.g., Times New
Roman, Arial, etc.).
Format | Font.... opens a dialog box where the specific font, font style,
size, and effects (e.g., colors, strikeout, underline) can be specified. These
changes are applied to any text that was highlighted before opening this
dialog box.
Note: If text is selected before performing these actions, the text is
formatted as specified. Unselected text is not changed. If no text has been
selected, then formatting starts from the current cursor position and is
reflected in new text.
10.4.4
Text Formatting Tool Bar

The text formatting toolbar can be used instead of the Format pull-down
menu to achieve some of the same text formatting effects. To view the
toolbar, select View | Format Toolbar.
Figure 10-6:
Formatting toolbar
10.4.5
Headers, Footers, and Page Numbers

Headers are lines of text that appear at the top of every page of a test
document, while footers appear at the bottom of every page. Where exactly
the headers or footers appear on the page can be determined from
File | Header/Footer....
The Header/Footer dialog box permits the entry of a position for the header
relative to the top of the page and for the footer relative to the bottom of the
page.
The fonts that are used in the headers and footers can be changed using
the items from the Format pull-down menu or the Format toolbar.
219
Page numbers are inserted into a test document as a field. Page numbers
are most common in either the header or the footer of the document, where
the number placement can be more accurately controlled and standardized
for the entire test document.
To insert a page number:
1. Select "View | Page Header or View | Page Footer, for where the
page number is to be placed.
2. Insert a Page Number field at the required position.
10.4.6
Object Icons in Test Document

Objects that are embedded in the test document can be displayed either as
icons or as non-editable text information. It can be helpful to have only the
information that really needs to be considered, displayed. Extraneous
information can be iconized in the test document so that it does not distract
from other, possibly more important information.
Figure 10-7:
The hardware
configuration in a test
document report view
It is possible to switch back and forth between these two representations.

1. Select the object whose representation is to be changed.
2. Select "Edit | Object Properties".
3. Select the View page.
4. Select the appropriate radio button setting: either Display as Editable
Information or Display as Icon.
220
10.5
Exporting Data
Test results and data from the test document can be exported in a CSV
format, which then facilitates importing to an external database. This is
accomplished using File | Export Data.
Likewise, the report can be exported in RTF format, which then facilitates
importing to another word processing program. This is accomplished using
File | Export Report.
10.6
Protecting the Test Document

A test document can be protected from accidental or unauthorized changes.
This is important because a test document can grow to represent a
significant amount of time from a responsible test engineer in development,
refinement, and maintenance. The test documents become valuable
company assets, just like the OMICRON Test Universe equipment and
software.
Thus, the OMICRON Control Center provides tools to protect these test
document assets.
File | Protect... opens the dialog box, shown in Figure 10-8.
Figure 10-8:
Protection dialog box for
test documents
No Protection
allows all changes to the test document.
No Scripting
disallows changes to scripting that help automate the

test, but allows changes to the test document itself.
The test document can still be run.
No Changes
disallows changes to the test document with respect

to test definition, test module inclusion, settings, etc.
However, the test document can still be run and the
results saved.
221
View/Print Only
disallows all changes to the test document. The test

document cannot be run. It can only be viewed or
printed.
The protection level can be changed at any time if no password has been
entered. If a password has been entered, then only those with access to the
password can change the protection levels and/or change items in the test
document.
To change the protection level of a document:
1. Open the document and select File | Protect..... The Protect dialog
opens.
2. If the Old Password field is active, then the document already has a
password associated with it, and this password needs to be entered
before the protection level can be edited. Type the password in the
Old Password field and change focus, for example by pressing Tab. If
the password was correct the protection levels become enabled for
change.
3. Select the new protection level, and enter a new password for the
document by entering it in the New Password and Confirm New
Password fields. The new protection level is now set, as well as a
new document password, which will be needed to change the
protection level in future.
222
10.7
Example: Complete test of a differential scheme

Task
A Siemens SEL387 differential relay is to be tested with one automatic test.
The protected object is specified as follows:
y Ratio: 132KV: 22KV
y Vector group: YND1
y Rating: 30MVA
y HV CTs: 150:1
y LV CTs: 800:1
The relay has the following settings:
y Inom: 1 A
y fnom: 50 Hz
y Pick Up (O87P): 0.2 multiple of TAP
y High Set (U87P): 4 multiple of TAP
y Slope 1 (SLP1): 20 %
y Slope 2 (SLP2): 100%
y Turning Point (IRS1): 2.5 multiple of TAP
y 2nd Harmonic Restraint (PCT2): 15 %
y 5th Harmonic Restraint (PCT5): 35%
The following functions are to be tested:
-
The exact pick-up of the Operating characteristic at bias currents

of 0.5, 1.0, 2.0, 3.0, 4.0 and 5.0 for an A-N and a B-C fault.
Trip time characteristic at differential currents of 0.25, 0.50, 0.75

and 1.0 for a B-N and a C-A fault.
The exact pick-up of the Harmonic restraint characteristic at

differential currents of 0.25, 0.50, 0.75 and 1.0 for a three phase
test.
Configuration test for a test current of 1 A and 4 A for a C-N and

an A-B faults on the HV and LV side of the transformer.
223
Solution
OMICRON Test Universe has a dedicated test module for each of the
above functions that needs to be tested.
As an automatic test is desired the pre-defined occ doucment should
be used. Only the settings of the relay, test hardware as well as test
modules (test points) still needs to be entered.
10.7.1

is not connected to the electrical system in any way.
In this example the default configuration of a CMC 256 to supply the
primary and secondary currents to the relay:
1. Connect the primary current inputs of the relay to the current outputs
of the CMC 256 Group A.
2. Connect the secondary current inputs of the relay to the
corresponding current outputs of the CMC 256 Group B.
3. Ensure that the current outputs of the relay, i.e. the output side of
the current transformers, are connected together in a starpoint, which
are connected to the N terminals of the CMC.
4. Connect the trip signal of the relay to binary input 1 of the CMC.
10.7.2
Opening the OMICRON Control Center

Select Open Existing Document from the OMICRON StartPage to
start the OMICRON Control Center (OCC) with an empty document.
224
10.7.3
Verifying and Editing of Test Object Parameters and Settings

1. Double click on the Test Object" to open the dialog box for the test
object specific data (Figure 10-9 1).
Figure 10-9:
Predifined OCC document
1
1
21
2. Enter the device information in the General dialog block

(Figure 10-10 1).
3. Enter the relay settings into the Transformer Data (Figure 10-11 1)
and Relay Data dialogs (Figure 10-12 1).
Figure 10-10:
Information
225
Figure 10-11:
XRIO Converter
Transformer Data Relay
Settings
1
Figure 10-12:
Data Relay Settings
4. Click on OK to close the Test Object and to return to the Control

Center - Figure 10-12 2.
226
10.7.4
Verifying the the Hardware Configuration

1. Double click on the Hardware Configuration" to open the dialog box
for the hardware configuration.
2. Connect relay to Omicron as shown in the "Analog Outputs" page
(Figure 10-13) and the Binary Inputs page (Figure 10-14)
Figure 10-13:
Analog Outputs
Figure 10-14:
Binary Inputs
3. The binary outputs and DC analog inputs are not required for this test.
4. Click "OK" to return to the Control Center.
5. Add test points and check fault type for all modules.
227
10.7.5
Performing a Test
A test can be performed from either inside the test module or from the OCC
test document.
10.7.5.1
Testing from Inside a Test Module

1. Open the test module by double clicking on the test module object in
the Navigation list or Report view.
2. Select "Test|Start".
Note: A test is only possible, if no results are present. To be able to
run a test, first save the results, then clear the results by selecting
Test|Clear
The nominal and actual trip times as well as the assessments are
shown in the same way as if this module was run stand-alone.
Figure 10-15:
Running a test from inside
a test module
3. To view the report, select "View|Report".

4. Close the Test view to return to the Control Center.
228
10.7.5.2
Starting a Single Test from the Control Center

The same test can also be run from the Control Center.
1. Select the test module for which a test is to be performed in the
navigation list by single clicking on the test module name.
2. Select "Test|Start".
Note a Single Test can only be started, if a test module is selected.
Further a test is only possible, if no results are present. To be able to
run a test, first save the results, then clear the results by selecting
Test|Clear.
Figure 10-16:
Running a single test from
the Control Center
10.7.5.3
Starting a Fully Automatic Test from the Control Center

1. Select "Test|Start All". Depending on the number of tests defined, this
test may take several minutes to complete.
Note: Some test modules already contain results, these test modules
will be skipped during the automatic test. Individual test modules can
be excluded from the fully automatic test by de-selecting the check
box in the navigation list - Figure 10-16 1
Select Test|Clear All to clear all results from a list. The user will be
prompted to save the results before the results are cleared.
After the test has finished, the report can be assessed.
At the bottom of each test module a summary of the test is given,
stating how many test points passed and how many failed. If test
points from a single test have failed, this test can be re-run, by
clearing the results of this single test, and re-running it after the
reason for failure has been rectified.
Remember to save the test at regular intervals.
229
10.7.6
Print Preview of the Report Format

1. Select File | Print Preview.
Figure 10-17:
Print preview of page 1
2. Click on Next Page to view more pages - Figure 10-17 1.
230
Figure 10-18:
Print preview of page 2
231
232
Omicron
Protection Test Equipment
Hardware Overview
Key Features - Hardware

9 Portability / light weight
9 High power
9 High accuracy
9 Reliability
Alectrix 2009
(c) Alectrix (Pty) Ltd, 2009
Slide 2
Applications
9
9
9
9
9
Distance / Transmission feeder relays

Differential relays / Transformer relays
Overcurrent / Distribution feeder relays
Generator / Motor relays
Transducers
9 Energy meters
Alectrix 2009
Slide 3
The CMC 156 Test set
3 voltage outputs
3 current outputs
10 binary inputs
Weight: 9.8 kg
Alectrix 2009
Slide 4
The CMC 256/356 Test set
4 voltage outputs
6 current outputs
Analogue measuring /
recording function
DC power supply
Weight: 15.9
15.9 / 16.6 kg
Alectrix 2009
Slide 5
CMC 156: Voltage Outputs
Range:
3x 0..125V
1x 0..250V (L(L-L)
Power:
3x 50VA @ 125V
1x 100VA @ 125V (L(L-N)
Iload:
3x 0.4A
1x 0.8A (L(L-N)
Accuracy: 0.01% rg.

rg. +
0.03% rd.
THD+N:
0.015%
All values shown are typical values

Alectrix 2009
Slide 6
CMC 156: Current Outputs
Range:
3x 0..12.5A
1x 0..21A (3
(3 in II)
Power:
3x 40VA @ 12.5A
1x 65VA @ 21A (3
(3 in II)
1x 75VA @ 12.5A (L(L-L)
Vcomp:
Vcomp:
3x 6Vpk
1x 12Vpk (L(L-L)
Accuracy: 0.01% rg.

rg. +
0.03% rd.
THD+N:
0.03%

Alectrix 2009
Slide 7
CMC 256/356: Voltage Outputs
Range:
4x 0..300V
3x 0..300V
1x 0..600V (L(L-L)
Power:
4x 75VA @ 100..300V
3x 100VA @ 100..300V
1x 200VA @ 100..300V (L(L-N)
Iload:
Iload:
3x 1A
1x 2A
(L(L-N)
Accuracy: 0.01% rg.

rg. +
0.03% rd.
THD+N:
0.015%

Alectrix 2009
Slide 8
Range:
6x 0..12.5A
3x 0..25A (Gr
(Gr A||B)
1x 0..75A (6
(6 in II)
Power:
6x 80VA @ 8.5A
3x 160VA @ 17A (Gr
(Gr A||B)
1x 480VA @ 51A (6
(6 in II)
1x 320VA @ 8.5A (L(L-L-L-L)
Vcomp:
Vcomp:
6x 15Vpk
1x 60Vpk
(L(L-L-L-L)
Accuracy: 0.005% rg.

rg. +
0.015% rd.
THD+N:
0.025%

Alectrix 2009
Slide 9
Range:
6x 0..32A
3x 0..64A (Gr
(Gr A||B)
1x 0..128A (LL(LL-LN)
Power:
6x 430VA @ 25A
3x 860VA @ 50A (Gr
(Gr A||B)
1x 1160VA @ 60A (LL(LL-LN)
1x 1740VA @ 20A (L(L-L-L-L)
Vcomp:
Vcomp:
6x 35Vpk
1x 140Vpk
(L(L-L-L-L)
Accuracy: 0.02% rg.

rg. +
0.05% rd.
THD+N:
0.05%

Alectrix 2009
Slide 10
CMC: Block Schematic
PC
DSP
D/A
4xV
6xI
Filter
6
CMC 256/356
Ll out 11-6
Alectrix 2009
Slide 11
CMC 256/356 Hardware: NET-1 Board

Replaces existing DSP communications board
Two Ethernet interfaces:
10/100Mbit/s Copper
Copper
RJ45 connector
autoauto-sensing, autoauto-crossover
100Mbit/s Fiber Optic
Optic
MTRJ connector
End to end or via LAN hub
IEC 61850 compliant
Alectrix 2009
Slide 12
CMC: Amplifiers
Linear amplifiers
DC coupled amplifiers
Bandwidth: dc .. 3.1 kHz
Protected outputs:
Open / short circuit
OverOver-burden
OverOver-temperature
Alectrix 2009
Slide 13
CMC: Measurements
10 binary inputs
Potential free (dry) or voltage sensing
CMC 256/356: 5 groups; CMC 156 / 56: 2 groups
CMC 256/356: 10 analogue inputs (voltages <600V)
4 binary relay outputs / 4 TTL outputs

2 low-level analog inputs (0.. 10V, 0.. 20mA)
6 low-level analog outputs (0..5Vrms)
Alectrix 2009
Slide 14
CMS 251/2: Specifications

Application: Electromechanical relays
Single phase / dual mode:
Current: 1x 0..12.5 Arms
Voltage: 1x 0..120Vrms / 1x 0..176Vpeak
Output power: 1000VA cont. / 1400 VA peak
Technology: Class D switch mode
Accuracy: 1 %
Weight: 15kg
CMS 252: Two phase amplifier
Alectrix 2009
Slide 15
CMS 251/2: Compliance Voltage

200
150
100
VOLTAGE (V)
50
0
0
10
12
14
16
18
-50
-100
-150
-200
TIME (ms)
CDG 16 E/F relay: Plugsetting 0.2, tested at 2 Amp
Alectrix 2009
Slide 16
CMS 156: Voltage Outputs
Range:
3x 0..250V
1x 0..500V (L(L-L)
Power:
3x 75VA @ 75..250V
1x 150VA @ 75..250V (L(L-N)
Iload:
Iload:
1x 2A (L(L-N)
Accuracy: 0.03%
THD+N:
0.1%
Weight:
14.7kg

Alectrix 2009
Slide 17
CMS 156: Current Outputs
Range:
3x 0..25A
1X 0..75A (3
(3 in II)
Power:
3x 70VA @ 7.5A
1x 210VA @ 22.5A (3
(3 in II)
1x 140V (L(L-L)
Vcomp:
Vcomp:
15Vpk
30Vpk (L(L-L)
Accuracy: 0.03%
THD+N:
0.1%

Alectrix 2009
Slide 18
CMA 156: Current Outputs
Range:
6x 0..25A
3x 0..50A (Gr A||B)
1x 0..150A (6
(6 in II)
Power:
6x 70VA @ 7.5A
3x 140VA @ 15A (Gr
(Gr A||B)
1x 420VA @ 45A (6
(6 in II)
1x 280VA @ 7.5A (L(L-L-L-L)
Vcomp:
Vcomp:
15Vpk
60Vpk (L(L-L-L-L)
Accuracy: 0.03%
THD+N:
0.1%
Weight:
15.4kg

Alectrix 2009
Slide 19
Certifications
ISO 9001
CE (certified by TV Bayern)
TV-GS, UL, CUL
EMC:
EMI:
Safety:
Vibration:
Shock:
Alectrix 2009
EN50081EN50081-2, EN61000EN61000-3-2/3
EN50082EN50082-2, IEC610004IEC610004-2/3/4/5/6/11
IEC/EN61010IEC/EN61010-1, EN60950
IEC68IEC68-2-6
IEC68IEC68-2-27
Slide 20
10

Basic Protection Courses Notes 2008 TU2.22 Rev2

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Substation Safety and Protection Testing Principles

Substation Safety and Protection Testing

Dos and Dont When Testing Protection Schemes

OMICRON Test Universe 2.22

3. A current transformer should never be open-circuited while current is

Impedance and directional overcurrent protection relays will issue a

Figure 1-1: Four pole CT

TOP (Relay Side)

BOTTOM (CT Side)

Substation Safety and Protection Testing Principles

Figure 1-2: Four pole VT

TOP (Relay Side)

BOTTOM (VT Side)

OMICRON Test Universe 2.22

NO! Shorting Strips

Configuration and Utilities

Configuration and Utilities

Opening the System Settings menu

3. Select User Information. Update the Username, Manager and

OMICRON Test Universe 2.22

4. Select Directories - Figure 2-2 1. These are the shortcuts to the

Figure 2-3: Folder browser

6. Two user defined shortcuts to user specific test document directories

Configuration and Utilities

Figure 2-4: File Save As

Figure 2-5: File Open

OMICRON Test Universe 2.22

customized by selecting the "Custom" check box and enter the

Note: Use single or double letter labels only

Figure 2-6: Phase Names

Configuration and Utilities

pre-selection is reflected on the Binary / Analog Inputs tab's of the

Figure 2-7: Default Values

OMICRON News is an information service that provides you with

OMICRON Test Universe 2.22

Figure 2-8: News Window

The PC must be connected to the internet for latest news reports.

Configuration and Utilities

Adding License Files

Opening the License Manager menu

3. Click on Browse - Figure 2-10 1.

OMICRON Test Universe 2.22

Figure 2-11: Browse for

6. Click on Search - Figure 2-10 2.

Configuration and Utilities

Figure 2-13: Merge license

9. Close the window.

OMICRON Test Universe 2.22

NET-1 Configuration for CMC256

Opening the Test Set Configuration menu

3. Click on Search - Figure 2-14 1 if no device is already detected.

Configuration and Utilities

Figure 2-16: Associate

6. Click on OK - Figure 2-15 3.

OMICRON Test Universe 2.22

Auxiliary DC for CMC256

The Auxiliary DC is very useful when testing a protection relay in a

Defining the Output DC voltage

Figure 2-18: Set AuxDC

Configuration and Utilities

6. Click on Set - Figure 2-19 3.

7. By selecting Default means that immediately after the CMC 256 is

OMICRON Test Universe 2.22

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