Escolar Documentos
Profissional Documentos
Cultura Documentos
com
AN-7017
Reducing Power Losses in MOSFETs by Controlling
Gate Parameters
Alan Elbanhawy, Fairchild Semiconductor
Introduction
The gate Equivalent Series Resistance (ESR) has been
recognized as a factor affecting the losses in MOSFETs for a
number of years. Controlling the losses is exceedingly
important as devices need to produce the highest power
conversion efficiency and lowest losses to operate efficiently
at the target application. From an applications standpoint, an
increase in losses can lead to overheating in the actual
system requiring additional components such as heat sinks
and fans. Additional components add to the overall cost and
size of the end application. This application note explore
ways to control these losses in MOSFETs.
0
2.5e-09
6
5
4
3
2
V2
V3
V4
6
5
4
3
V5
Id
1
Vd
5e-09
4e-09
3e-09
2e-09
Cgs
Rg
REV. A 9/30/05
AN-7017
APPLICATION NOTE
2.
9.02A
8.00A
15.66A
6.00A
12.00A
4.00A
8.00A
2.00A
4.00A
0A
1.39A
145.154us 145.200us
I(M13:d)
145.300us
I(M11:d)
145.400us
145.500us
145.600us
145.700us
0A
Time
9.51A
148.46us
I(M13:d)
148.48us
I(M11:d)
148.50us
148.52us
148.54us
V(M13:d, M13:s)
Time
REV. A 9/30/05
APPLICATION NOTE
AN-7017
Rg
Gate Voltage
Vp
Vgth
t1 t2
Time
t
-------------------
Cgs Rg
e
Vp Cgs Rg Vp Cgs Rg + Vp t
Vgs ( t ) = ------------------------------------------------------------------------------------------------------------tr
t
-------------------
Cgs Rg
e
Vp Cgs Vp Cgs
Ig ( t ) = ---------------------------------------------- ------------------tr
tr
R
Vgs
Igs
Vgp
Vp
-------------------------------------------------------------------------------------------------------------
Vp Gm Cgs Rg
tri : = LambertW e
Vp Gm Cgs Rg + tr Gm Iload
Vp Cgs Rg + Vgth tr
-
------------------------------------------------
Vp Cgs Rg
Vp Cgs Rg / ( Vp Gm )
Gm LambertW e
Where Gm is the MOSFET transconductance while the rest of the variables are the same as above.
REV. A 9/30/05
AN-7017
APPLICATION NOTE
9e-09
8e-09
7e-09
2e-09
6e-09
Cgs
6
4e-09
Rg
Similar equations were derived for calculating the drainsource voltage fall time but they are too long to display here.
Instead, we have Figure 9 depicts the dependency of the rise
time (Z axes) on Cgd and Rg. Again you can clearly see that
Rg has a direct linear influence on the drain-source voltage
fall time in the range of values shown in Figure 9.
In general, the switching drain-source voltage rise and fall
times are functions of MOSFET ESR Rg and gate-drain
capacitance Cgd and the gate-source capacitance Cgs as well
as the gate driver IC parameters of impedance and rise and
fall times.
7e-09
6e-09
5e-09
Conclusion
4e-09
3e-09
2e-09
1e-09
6
5
4
Rg
1e-09
2e-09
2
1
4e-09
3e-09
Qgd
REV. A 9/30/05
AN-7017
APPLICATION NOTE
References
[1] Alan Elbanhawy, Effect of Parasitic Inductance on
switching performance in Proc. PCIM Europe 2003,
pp.251255
[2] A. Elbanhawy, Mathematical Treatment for HS
MOSFET Turn-Off in Proc. PEDS Singapore 2003
[3] A. Elbanhawy, Pitfalls of MOSFET Paralleling in
Proc. Power Electronics Technology 2003, pp. 98106
[4] J. Ejury, Design Issues For DC/DC-Converters With
Respect To Compact SMD MOSFET Packages in Proc.
Power Electronics Conference USA 2004
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER
DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
www.fairchildsemi.com
9/30/05 0.0m 001
Stock#AN00007017
2005 Fairchild Semiconductor Corporation