Daewoo CMC 1701 ME, M2

Fig. 1. The fragment of a site of a circuit of the target cascade of lower case development(display) As a
result of failure of transistor Q536 a pressure(voltage) of a feed(meal) 185 In becomes isolated on a circuit
drain - source Q583, 2-4 507, L503, 2-6 505 on the ground. There is an overload of transistor Q583 on
a current, having warmed up and failure of the last. Therefore after replacement of transistor Q536 it is
expedient to be convinced of serviceability Q583, and also visually to check up serviceability of a winding
2-4 507 on absence of short-circuited coils. Sintering top layer 507 with a high
probability specifies malfunction 507. At absence of throttle -2520 of it(him) it is easy to rewind. For
this purpose it is necessary an element to heat up the core a powerful soldering iron or an
electrohair drier, to disassemble a throttle. To wind a winding 2-4 and new. A direction of winding
noncritically. To stick together the transformer glue such as "Moment", "88". To check up serviceability
Q356, 507, Q583 and to replace a faulty element. Recommended replacement of transistor IRF731 at
absence of specified type IRF740, IRF741, IRF840. Circuit Q356, 507, Q583 is serviceable. The circuit of
a feed(meal) is faulty In To check up serviceability of circuit Q352 (2SC4924), windings 2-4 506, Q571.
The analysis of refusals of monitor CMC 1701, connected with failure of target transistor Q356 occurs in
two cases more often.
In replacement of the microprocessor on same, but with the changed program of management; in blocking
circuit AFC for the period of switching. The first way of elimination is possible(probable) only in the
technical centres on service of monitors " DAEWOO ". The second way more is acceptable and consists in
shemno-technical completion of circuit AFC and introduction of a key of blocking of a loop of frequency
trim. The circuit of the key cascade of blocking of circuit AFC is given on fig. 2. Elements of the key
cascade are the best way for establishing on the basic payment of the block of lower case
development(display) (the bottom payment of the monitor). Installation hinged with the soldering to contact
platforms. Installation of elements on the part of printed conductors. Fixing of installation by mastic -8 or
glue - rasplavom. Refusal of the target cascade of lower case development(display) at switching
inputs(entrances) with "D-SUB" on "BNC" is the result, described above as during switching
inputs(entrances) occurs having dug loops AFC. For the period of a presence(finding) of the switch of
inputs(entrances) in uncertain (average) position the entrance signal "H.SYN" does not act on the
processor neither through an input(entrance) "D-SUB", nor through an input(entrance) "BNC". The
switchboard of inputs(entrances) is in a uncertain condition. Loop AFC does not work.

The reason of malfunctions consists in incorrect work of a loop of frequency trim (AFC), in result there are mistakes
in the program of the microprocessor responsible for scanning of entrance frequency "H.SYN", "V.SYN". At work of
the monitor in a mode 1280x1024 (60 ) transistor Q536 is in the heaviest thermal mode (a limiting mode for the
monitor). At switching a mode of operation for a while equal 10-15 (time of scanning) occurs switching-off of
circuit AFC and the generator of lower case development(display) LA7850, not having on an input(entrance) of a
signal (contact 1), gives out on an output(exit) (contact 12) a signal with frequency 100. 120 . Such mode of
operation of the specifying generator of lower case development(display) results in sharp increase of the capacity
selected on the target transistor of lower case development(display), local and to failure of the last.
Application instead of the transistor 2SC4891 about more best frequency characteristics (2SC5270A etc.) positive
result does not give transistors