Escolar Documentos
Profissional Documentos
Cultura Documentos
Industrial metrology
objectives.
metrology.
Our services range from complete solutions for diffe-
Ground surfaces
Turned surfaces
Lasered surfaces
Honed surfaces
Textured surfaces
State-of-the-art roughness
and contour measurement
WAVELINE measuring systems offer you extensive evaluation possibilities for surface measurement
also possible in combination, depending on the system.
Roughness parameters
Angle
Crosshatch angles
Radius
Area of blowholes
Profile parameters
Distance
Radius
Waviness parameters
Parallelism
Motif parameters
Crowning
JIS parameters
Gothic arcs
Topography evaluation
Edge geometries
Dominant waviness
Line profile
Twist parameters
Threads
Diameter
Roughness measurement
Contour measurement
needs.
in day-to-day operations
technology allowing an almost limitless range of applications. In contour measurement, digital probing systems
with flexibility
limitations.
production lines
Surface inspection
Short description
Page
6 11
Systems
EVOVIS mobile
12 13
C8000
surfscan and
nanoscan
EVOVIS
28 33
wavemove
toposcan
48 49
TOPOWIN
50 51
surface inspection
W5
Easy-Paper-Loading
Function keys
Large color
display
Easy operation
with click wheel
Wireless
data transfer
Highlights HOMMEL-ETAMIC W5
Portable and battery-supplied
function
No calibration necessary
Battery capacity for up to 800
measurements
W5
Mobile measurement
Universal roughness measuring instrument for
use on the production line, on machine tools or
in incoming goods inspection
Ideal for measurements on big workpieces
Measurement in all possible measuring positions,
including on perpendicular surfaces or overhead
Precise workpiece support, even on small shafts
Secure positioning and stable workpiece support on precisely
ground support shafts on the underside of the measuring device
Vee-block rest for small shafts with a diameter of 10 mm and
above for reliable centering on the correct measuring position;
can also be used as probe protection for bores with a diameter
of 12 mm and above
Exchangeable probes
Probes for a range of different measuring tasks
Probe cover to protect probe from damaging
Measurement position lighting to view the exact
measurement position
Tolerance evaluation
Colored display of measurement results depending on
the tolerance evaluation
Assessment of measurement results at a glance
Model
Probe
Parameters
Printer
Statistics
Measuring Roughness
programs standard
W5
with skid
23
optional
no
no
no
yes
optional
W10
Rest and
barrel jack
Wireless data
transfer
HOMMEL-ETAMIC W10
W10
Transverse probing
90 tilting of the probe for measurements in grooves and
incisions or between collars
Probing of the surface transversely to the traverse direction
without complex conversion
Model
Probe
Parameters
Printer
W10
with skid
40
integrated yes
yes
yes
Statistics
Measuring Roughness
programs standard
yes
integrated
W20
HOMMEL-ETAMIC W20
10
W20
Model
Probe
Parameters
Printer
W20
skidless
68
integrated no
yes
yes
Statistics
Measuring Roughness
programs standard
yes
integrated
11
EVOVIS mobile
The optional EVOVIS mobile software is specifically designed for operation with mobile measuring instruments.
In online mode, the mobile measuring instrument is directly controlled by the software and turns into a stationary
measuring station. In offline mode, the locally measured parameters and profile data saved in the measuring
instrument are transferred and evaluated on the PC.
12
Customer
Jenoptik
Order
A-42BE
Operator
Schmidt
Comment
EVOVIS mobile
Workpiece
W32-AC33
Drawing number
Z-12344
Serial number
S122
Name
Unit
Ra
Rz
Rmax
m
m
m
0,00
0,00
0,00
1,50
5,80
14,00
Value
Bar chart
1,01
5,95
7,50
Roughness profile
Z [m]
3
2
1
0
-1
-2
-3
-4
0,40
1,20
Name
2,00
Unit
Ra
Rz
Rmax
2,80
3,60
4,40
X [mm]
Evaluation conditions
c:
0,80 mm
m
m
m
0,00
0,00
0,00
1,50
5,80
14,00
Value
Bar chart
1,10
5,58
7,14
Roughness profile
Z [m]
3
2
1
0
-1
-2
-3
-4
0,40
1,20
Unit
Ra
Rz
Rmax
2,80
3,60
4,40
X [mm]
Evaluation conditions
c:
0,80 mm
Name
2,00
m
m
m
0,00
0,00
0,00
1,50
5,80
14,00
Value
Bar chart
1,08
5,49
7,03
Roughness profile
Z [m]
3
1
0
-1
-2
-3
-4
0,40
Evaluation conditions
c:
0,80 mm
03.11.2014 15:33:07
1,20
2,00
2,80
3,60
4,40
X [mm]
EVOVIS 1.42.0.0
Multiprint log
Seite 1/1
13
Printer paper
Adapter W20
14
Measuring range
100 m
Measuring range
50 m
240087 TK050
90
22
17.5
1.85
10.5
TKO 50
Measuring range
100 m
Skid depth
3 mm
Measuring range
100 m
Measuring range
300 m
T1 K
256504
67
21.9
3.9
3.3
10.5
13.5
22.5
1.9
1.8
64.5
T1K
8.5
Measuring range
10.5
TKPK 100
15
T8000 R
Universally applicable
roughness measuring system
HOMMEL-ETAMIC T8000 R120-400 with optional wavecontrol basic control panel and measuring table MT1 XYO
Modular structure
metrology lab.
16
T8000 R
measuring tasks.
Model
Vert.measuring range*
Min.
resolution*
Granite plate
Topography Twist
option
option
Contour
option
T8000 R120-400
300 or
600 m
1 nm or
2 nm
120 mm/0.1 m
400 mm
780 x 500 mm
yes
yes
yes
T8000 R120-800
300 or
600 m
1 nm or
2 nm
120 mm/0.1 m
800 mm
1000 x 500 mm
yes
yes
yes
17
C8000 digital
HOMMEL-ETAMIC C8000-400 digital with optional measuring table MT1 XYO and vee-block
18
C8000 digital
Model
Vert.
Min.
Measuring range/ Vertical
measuring resolution horizontal
travel
range
resolution
Granite plate
C8000-400 digital
60 mm
50 nm
120 mm/0.1 m
400 mm
780 x 500 mm
no
no
no
no
C8000-800 digital
60 mm
50 nm
120 mm/0.1 m
800 mm
1000 x 500 mm
no
no
no
no
60 mm
50 nm
120 mm/0.1 m
400 mm
780 x 500 mm
no
yes
yes*
yes*
60 mm
50 nm
200 mm/0.01 m
800 mm
1000 x 500 mm
no
yes
yes*
yes*
19
C8000 digiscan
HOMMEL-ETAMIC T8000 C120-400 digiscan with optional measuring table MT1 XYO and vee-block
20
C8000 digiscan
Model
Vert.
Min.
Measuring range/ Vertical
measuring resolution horizontal
travel
range
resolution
Granite plate
C8000-400 digiscan
yes
no
no
no
C8000-800 digiscan
yes
no
no
no
yes
yes
yes*
yes*
yes
yes
yes*
yes*
21
T8000 RC
HOMMEL-ETAMIC T8000 RC120-800 digital with optional wavecontrol basic control panel, measuring table MT1 XYO and vee-block
22
T8000 RC
be specified as an option.
Model
Vert. measuring
range*
Min.
resolution*
Granite plate
Topography Twist
option
option
R: 300 or 600 m
C: 60 mm
R: 1 or 2 nm
C: 50 nm
120 mm/0.1 m
400 mm
780 x 500 mm
yes
yes
R: 300 or 600 m
C: 60 mm
R: 1 or 2 nm
C: 50 nm
120 mm/0.1 m
800 mm
1000 x 500 mm
yes
yes
R: 300 or 600 m
C: 60/90 mm
R: 1 or 2 nm
C: 50/75 nm
120 mm/0.1 m
400 mm
780 x 500 mm
yes
yes
R: 300 or 600 m
C: 60/90 mm
R: 1 or 2 nm
C: 50/75 nm
120 mm/0.1 m
800 mm
1000 x 500 mm
yes
yes
* R = roughness, C = contour
23
surfscan
24
surfscan
possibilities.
Model
Min.
resolution
Granite plate
Topography Twist
option
option
surfscan 120-400
6 or 12 mm
6 or 12 nm
120 mm/0.1 m
400 mm
780 x 500 mm
yes
yes
surfscan 120-800
6 or 12 mm
6 or 12 nm
120 mm/0.1 m
800 mm
1000 x 500 mm
yes
yes
25
nanoscan 855
26
nanoscan 855
Model
Vert. measuring
range*
Min. resolution*
Measuring range/
hor. resolution
Vertical
travel
Granite plate
Topography
option
nanoscan 855
24 or 48 mm
0.6/1.2 nm
200 mm/0.01 m
550 mm
850 x 600 mm
yes
27
EVOVIS
automatic functions
Individual test plan creation
Wizard for selecting the measuring conditions
All common roughness and waviness parameters in
accordance with ISO 4287 and other ISO and national standards (DIN, JIS, Motif, etc.)
Robust Gaussian filter in accordance with
ISO/TS 16610-31
Optionally can be extended to include function-oriented parameters such as dominant waviness (VDA
2007), twist parameters (MBN 31007-07) and other
factory standard-specific parameters
Open design of the print log
Electronic archiving of logs with PDF printout
28
EVOVIS
EVOVIS is the quick and reliable way to evaluate geometric features of workpieces, such as radii, angles or
distances.
Additional evaluation tools are offered by
the line profile deviation with variable tolerance range,
the comparison option with stored nominal profiles, as
well as the automatic evaluation of complex geometric
elements such as Gothic arcs or workpiece edges.
Contour evaluation
or co-ordinate systems
Automatic alignment functions of the
measured profile
Automatic evaluation run with clear workflow
Powerful zoom functions
Automatically generated results table
Graphic representation of line profile deviations
with variable tolerance range
Morphological filter
Evaluation of complex geometric elements
such as Gothic arcs or edge geometries
Open design of print logs
Electronic archiving of logs with PDF printout
and automatic save function
29
EVOVIS
Combined evaluation of
roughness and contour
EVOVIS supports innovative, combined, measurement
Johnson Corp.
Contour 1
Contour 1
Roughness 1
30
on measured profiles
EVOVIS
31
HOMMEL MAP
Topography evaluation:
option for roughness measurement
HOMMEL MAP 3D topography analysis software offers
Document management
Multilayer surfaces
Topography evaluation
32
EVOVIS
Die
dem Amplitudenspektrum
des WD-Profils ermittelte mittlere horizontale
85 - Horizontale
Welligkeitskenngre
Abb. aus
Gre der Profilelemente (mittlere Periodenlnge der dominanten Welligkeit).
Die mittleren Hhen der Profilelemente WDc der Welligkeitsprofile WD sind die
Mittelwerte aus den vertikalen Differenzen der hchsten und tiefsten Punkte der
des WD-Profils
Abb. 86 - Gesamthhe
Profilelemente
der Messtrecke in Anlehnung an DIN EN ISO 4287
Total
profile innerhalb
height WDt
Abschnitt 4.1.4
WDc
Die mittleren Hhen der Profilelemente WDc der Welligkeitsprofile WD sind die
Mittelwerte aus den vertikalen Differenzen der hchsten und tiefsten Punkte der
Abb. 86 - Gesamthhe
des WD-Profils
Profilelemente
innerhalb
der Messtrecke in Anlehnung an DIN EN ISO 4287
Abschnitt 4.1.4
WDc
Static tightness
Dynamic tightness
Noise emission
Avoidance of increased wear or malfunctions
Pre-processing conditions
WDc
81
Number of threads
DG
Twist depth
Dt [m]
Period length
DP [mm]
DF [m]
DLu [%]
Twist angle
D []
33
3.1
1.9
0.75
11.2
12.4
0.75
0.13
34
75
1.9
34
3.2
40
90
90
12.9
40
75
3.252
1.9
35
300 m
0.25
100 m
1.0
0.2
Measuring range
17
78.5
100 m
13/17 mm
11.5
0.2
Measuring range
3.7
36
42
32
Probe arm
9
79 0
170
175
32
Probe arm
22
pre-filtering is desired.
230
Stylus tip
22
Probe arm
32
90
170
175
90
79
Stylus tip
Bores from 4 mm
2.9
Probe arm
4.4
35.8
35.8
170.9
Stylus tip 1 mm
10
10
22
M2
37
Stylus tip
Art.no. 244799
Stylus tip
38
90
1.75
5.25
63.25
63.25
79
1.006
90
63.25
90
10
10
63.25
or on recessed surfaces.
90
13
90
63.25
90
25.5
25,5
25 mm
90
7 mm
39
100 mm
150 mm
200 mm
HAA holder
Twist-protected holder for fixed alignment of the
roughness probe.
HAA150
40
Probe adapter
Enables the operation of roughness probes under the
traverse unit, alternatively to position on the drive bar.
41
Parallel vises
M32
XYO axis
M50
XY axis
MT2
M32/GF32
M50/GF50
Vee-block
Four different sized, finely ground vees ensure a
holding range of shafts and round workpieces with
diameters between 1 and 150 mm.
Art. no. M0 435 084
Y positioner
With motor drive for recording of topographies or for
automatic positioning transversely to the probing direction. Load capacity approx. 30 kg. Guiding accuracy
Angle vise
two axes with Nonius scale and screw for fine adjust-
Y positioner
Y positioner
with fine adjustment
42
Standards
profile method:
measurement tasks.
Our DAkkS-DKD accreditation includes the measurement of variables such as roughness, profile depth,
Twist standards
43
POU
Measurement in bores
Measurement on shafts
testers.
the workpiece.
44
waveslide
Individual, semi-automatic
production measuring stations
HOMMEL-ETAMIC waveslide measuring stations are individually tailored to suit specific measurement tasks.
They are based on proven T8000 system components and provide reliable, semi-automatic measurements in
the manufacturing environment. The measuring systems are extremely robust and operate with high precision.
The workpiece is positioned manually via guided air slides and the measuring process is fully automated.
45
wavemove
46
wavemove
and tailstock
System check via integrated roughness and
contour standards
Application example:
HOMMEL-ETAMIC wavemove
for cubic workpieces
Fully automated measurement of roughness and
contour on cylinder heads and blocks
Workpiece-specific fixing device with optional
workpiece carrier detection
Various fixing devices enable flexible use for
different workpieces
Twist and tilt axis for workpiece positioning
Extensive safety devices for monitoring the
workpiece
Optional light curtain to protect operating
personnel
47
toposcan
48
finest structures
Automatic determination of crosshatch angle
toposcan
at any position
Mobile workstation for easy transport in the
production environment
For cylinder bores from 60 mm diameter
Model
Diameter*
Measurement
height
Scan-/
Roughness
Tabletop
measuring mode measurement model
Workstation
model
60-110 mm
150 or
210 mm
yes
no
yes
yes
60-110 mm
150 or
210 mm
yes
yes
yes
yes
49
TOPOWIN
The user-friendly TOPOWIN software can be operated intuitively and offers a standardized interface for optical
surface inspection and roughness measurement.
50
TOPOWIN
Customer
Kunde
Demo
2014
Smith Corp.
Test
Plan
Test Plan
demo
2014.rpg
motor14.rpg
Messsystem
Measuring System
HOMMEL-ETAMIC
toposcan
HOMMEL-ETAMIC toposcan
Werkstuek
Workpiece
44 Zyl
Motorblock
cylinder
motor block
Serial Number
Seriennummer
88 150
201
88
1501010
201
Workpiece
Werkstueck
Nr.
4711
4711
Order Number
Auftrag
Demo
123 4782014
001
Bediener
Operator
Gayko
Schmidt
Johnson
SW-Version
SW version
7.60
7.60
Date: 2014/04/02
02.04.2014
Date
Time: 15:47 15:47
Time
Results
Roughness
Evaluation
Ergebnisse
Rauheit
Results
Optical Evaluation
Ergebnisse
Optik
Results
Laser Structures
Ergebnisse
Lasertaschen
HOMMEL-ETAMIC
HOMMEL-ETAMIC
TURBO
WAVE
TURBO WAVE
V7.60 V7.60
Messbedingungen
Measuring Conditions
Taster
:
Probe:
Messbereich :
Measurig range:
Taststrecke :
Traverse length:
Lc
/ Ls:
T1E
T1E
80 m
80 m
4.80 mm
4.80 mm
300
Lc/Ls: 300
10.0
Rz
Rz
Mr1
Mr1
Mr2
Mr2
CV(70.0
CV(70,0 %) %)
Rpk
Rpk
Rk
Rk
Rvk
Rvk
7.92 m
7.92
m
%
%
0.55681m/m
0.55681
m3/m2
0.52 m
0.52 m
2.03 m
2.03 m
3.23 m
6.4 %6.4
79.3 79.3
%
3.23 m
Angle
47.40Gr
Las O O
Winkel
47.40GradLas
Radius
mm Las
Radius
1.97 1.97
mr
Las U U
Abstand
mm T-L
Distance
1.20 1.20
mr
T-L
T-AH
Flche
Surface
0.63 0.63m/U
m
T-AH
T-AV
Toleranzfeld Honwinkel ---.-Tolerance range honing angle
---.-T-AV
T-V
T-V
T-Br
mm
mm
mm
---.-----.-- mm
---.-- mm
---.----.-- mm
---.----.-- m
---.-----.----.-----.--
T-Br
profile ausgerichtet
filter ISO 11562
= 0.800
mmLc = 0.800 mm
R-R Profil
Filter Lc
ISO
11562
0.0
Mr.
Hendrik GAYKO
78056 VS-Schwenningen
Alte Tuttlinger Strasse 20
Germany
D-78056 VS-Schwenningen
Germany
---.-----.--
Phone
Fax +49
+49 (0)7720
7720 602-123 602 580
Tel
Fax +49 (0)7720 602 123
Internet www.jenoptik.com/metrology
---.--
web: www.jenoptik.com
Simple documentation
0.0
[m]
-10.0
ProbeT1E
T1E
Taster
Angle
Winkel
Lt =
mm/s mm/s
Lt
=4.80
4.80mm
mm vt =Vt0.50
= 0.50
47.40
47.40Grad
Radius
Radius
1.971.97
mm
mm
4.804.80
Distance
Abstand
[m]
11.0
0%
1.20
mm mm
1.20
20%
40%
Surface
Flche
60%
80% 100%
0.630.63m/U
m/r
Logging
51
Technical data
Technical data stationary roughness and/or contour measuring systems (pages 16 27)
Roughness measurement
Contour measurement
HOMMEL-ETAMIC
T8000 R120-400 /
T8000 R120-800
C8000-400 digital /
C8000-800 digital
C8000-400 digiscan /
C8000-800 digiscan
Probing system
wavecontour digital
wavecontour digital
wavecontour digiscan
wavecontour digiscan
Measuring range
Resolution
Probe arm identification
Probe force setting
Top/bottom measurement
Measuring stroke limitation
300 m or 6005) m
1 nm or 2 nm1)
60 mm
50 nm
0 20 mN
programmable
60 mm
50 nm
0 20 mN
programmable
60 or 904) mm
50 or 754) nm
electronic, RFID
electronic
optional
programmable
60 or 904) mm
50 or 754) nm
electronic, RFID
electronic
optional
programmable
Probe arm
Stylus tip
Mounting
diamond 2 m/90
exchangeable6)
carbide 20 m
quick fastener
carbide 20 m
quick fastener
carbide 20 m
magnetic holder
carbide 20 m
magnetic holder
Traverse unit
Measuring range (traverse length)
Resolution
Measurement speed vt
Positioning speed
Straightness accuracy
120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm
120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm
120 mm / 200 mm
0.1 m / 0.01 m
0.1 3 mm/s
max. 3 mm/s / max. 9 mm/s
0.4 m/120 mm /
0.8 m/200 mm
120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm
120 mm / 200 mm
0.1 m / 0.01 m
0.1 3 mm/s
max. 3 mm/s / max. 9 mm/s
0.4 m/120 mm /
0.8 m/200 mm
Measuring column
Vertical travel
Auto-null function
Positioning repeatability
Travel spreed
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
Measuring station
Granite plate (L x W x H)
Damping
Instrument table (L x W x H)
Working table (L x W x H)
Power supply: 100-240 V AC 50/60 Hz; operating temperature: +18 to +25 C, relative humidity max. 85 %, without condensation ( T 2 C/h); storage temperature: +10 to 50 C.
1) In smallest measuring range
2) Optional passive damping or optional active level control
3) Optional instrument tables (except nanoscan) (L x W x H): GTR4 2000 x 800 x 700 mm or GTR5 2200 x 800 x 700 mm
4) 1.5 fold probe arm length
5) 2 fold probe arm length
6) Optional: magnetic holder with collision protection
Description
Measuring range/resolution
Metric system
m/inch selectable
Filter: cut-offs
0.08/0.25/0.8/2.5/8 [mm], selectable in -2 to +1 cut-off steps; variable from 0.001 80 in 0.001 steps
EN ISO 13565-1
ISO/TS 16610-31
ISO/TS 11610-21
ISO/TS 16610-22
ISO 3274/11562
Measurement speed vt
Traverse length lt
Evaluation length ln
Cut-off [mm]
0.08/0.25/0.8/2.5/8
Rt, Ra, Rz, Rp, Rv, Rq, RSm, Rc, Rsk, Rku, Rq, Rmr, C(Rmr), Rmr(c), Rdc
Pt, Pa, Pz, Pp, Pv, Pq, PSm, Pc, Psk, Pku, Pq, Pmr, C(Pmr), Pmr(c), Pdc
Wt, Wa, Wz, Wp, Wv, Wq, WSm, Wc, Wsk, Wku, Wq, Wmr, C(Wmr), Wmr(c), Wdc
Rz-JIS
Ra, RPc
Wsa, Wca
Rmax, RzISO, D, a, q, L0
52
Technical data
surfscan 120-400 /
surfscan 120-800
nanoscan 855
R: ; C: 0 20 mN
programmable
R: 2 m/90; C: carbide 20 m
R: exchangeable6); C: quick fastener
R: 2 m/90; C: carbide 20 m
R: exchangeable6); C: m
agnetic holder
120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm
120 mm
0.1 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm
120 mm
0.1 10 m
0.1 3 mm/s
max. 3 mm/s
0.4 m/120 mm
200 mm
0.01 m
0.1 3 mm/s
max. 9 mm/s
0.4 m/200 mm
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
400 mm / 800 mm
in Z-, programmable
50 m
0.1 12 mm/s / 0.1 50 mm/s
400 mm / 800 mm
in Z-, programmable
10 m
0.1 12 mm/s / 0.1 50 mm/s
550 mm
in Z+/Z-, programmable
10 m
0.1 50 mm/s
Diameter*
60 110 mm
60 110 mm
150 / 210 mm
150 / 210 mm
Optical zoom
40 times: 5.1 x 3.8 mm; 100 times: 2.0 x 1.5 mm; 210 times: 0.9 x 0.7 mm
40 times: 5.1 x 3.8 mm; 100 times: 2.0 x 1.5 mm; 210 times: 0.9 x 0.7 mm
Illumination
Axial position
motor-driven
motor-driven
Radial position
manual
manual
Focus adjustment
motor-driven
motor-driven
Operating modes
Optical evaluation
Roughness evaluation
Parameters EN ISO 4287
Parameters EN ISO 13565-1, -2
Parameters Motif EN ISO 12085
ASME B46
JIS B601
EN 10049
Daimler MBN 31007
Probe
1.5/4.8/15 mm
Cut-off (ISO/JIS)
0.25/0.8/2.5 mm
Measurement speed vt
Logging
110 x 90 x 640 mm, 5.2 kg** / 110 x 90 x 760 mm, 5.4 kg**
650 x 800 x 1180, 70 kg (with PC)
110 x 90 x 640 mm, 5.5 kg** / 110 x 90 x 760 mm, 5.7 kg**
650 x 800 x 1180, 70 kg (with PC)
Power supply 100-240 V AC 50/60 Hz; power consumption 200 W; operating temperature +5 to +40 C without condensation.
* Further diameters on demand
** Including 80 mm centering plate
53
Technical data
HOMMEL-ETAMIC
W5
W10
W20
Measuring principle
class 1
class 1
class 1
Traverse unit
Suitable probes
Tracing length
Probing direction
Probing range
Control elements
LV17
skid probe
17 mm
axial, transverse probing
over 360
integrated start button
waveline 20
skidless probe
20 mm
axial
over 360
integrated start button, inclination reference level
Probe (standard)
T1E, 2 m/90
T1E, 2 m/90
Measuring range/resolution
Traverse length lt
according to ISO/JIS
according to Motif
max.
1.5/4.8/15 mm
0.64/3.2/16 mm
17.5 mm
1.5/4.8/15 mm
0.64/3.2/16 mm
17.5 mm
1.5/4.8/15 mm
0.64/3.2/16 mm
20 mm
Cut-off according to
EN ISO 4288/JIS B601
0.25/0.8/2.5 mm
0.08/0.25/0.8/2.5/8 mm
0.08/0.25/0.8/2.5/8 mm
Sampling length lr
1 to 5 selectable
Filter
Measurement speed vt
Display
23 parameters
Ra, Rz, Rmax, Rt, Rq, RSm, Rmr(c)[%],
Rmr(c)[m], Rp
40 parameters
Ra, Rz, Rmax, Rt, Rq, RSm, Rc, Rp, Rv, Rsk, Rku, Rdc,
Rdq, RzISO, Rmr, Rmr(c), C(Rmr)
EN ISO 13565-1, -2
Motif EN ISO 12085
ASME B46.1
JIS B601 (2001)
EN 10049
Daimler MBN 31007
Specific parameters
Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*, Vo0.001
R, AR, Rx, CR, CF, CL, Nr
Rp, Rpm
Rz-JIS
RPc
R3z
Sealing parameter Rmr (factor*parameter)
68 parameters
Ra, Rz, Rmax, Rt, Rq, RSm, Rc, Rp, Rv, Rsk, Rku, Rdc,
Rdq, RzISO, Rmr, Rmr(c), C(Rmr), Pt, Pz, Pa, Pc, Pp,
Pv, PSm, Pq, PSk, Pku, Pdq, Pdc, Pmr, Pmr(c), C(Pmr)
Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*
R, AR, Rx, CR, CF, CL, Nr
Rp, Rpm
Rz-JIS
RPc
R3z
Sealing parameter Rmr (factor*parameter)
Waviness parameters
EN ISO 4287
Motif EN ISO 12085
Wt, Wz, Wa, Wp, Wv, WSm, Wq, WSk, Wku, Wdq, Wc
W, Wx, Aw
Measuring programs
Interfaces
USB
optional printer P5
static thermal print lines
57 0.5 mm/48 mm
= 31 mm
8 points/mm, 384 points/line
measuring conditions, parameters, roughness
profile, Abott curve
battery pack, 1500 mAh
Bluetooth wireless technology
integrated
static thermal print lines
57 0.5 mm/48 mm
= 31 mm
8 points/mm, 384 points/line
measuring conditions, parameters, roughness
profile, Abott curve, statistics
via basic unit
via basic unit
integrated
static thermal print lines
57 0.5 mm/48 mm
= 31 mm
8 points/mm, 384 points/line
measuring conditions, parameters, roughness
profile, Abott curve, statistics
via basic unit
via basic unit
Printer
Printing method
Paper/printing width
Paper roll
Resolution
Printing functions
Battery
Interfaces
Ra
Rz
Rmax
Art.no.
Type EN
ISO 5436-1
Comments
approx. 0.5 m
approx. 1 m
approx. 3 m
approx. 3 m
approx. 0.5 m
approx. 1 m
approx. 3 m
approx. 1.6 m
approx. 3 m
approx. 10 m
approx. 10 m
approx. 1.6 m
approx. 3 m
approx. 10 m
approx. 1.6 m
approx. 3 m
approx. 10 m
approx. 10 m
approx. 1.6 m
approx. 3 m
approx. 10 m
256 314
231 498
230 292
1006 6899
256 318
256 125
233 213
1000 7576
233 234
233 232
1000 7589
256 143
233 233
type C
type C
type C
type C
type C
type C
type C
RSm 0.1 mm
RSm 0.1 mm
RSm 0.1 mm
RSM 0.1 mm
RSm 0.1 mm
RSm 0.1 mm
RSm 0.1 mm
approx. 0.3 m
approx. 0.7 m
approx. 1.1 m
approx. 2.5 m
approx. 1.15 m
approx. 2.6 m
230 744
226 251
230 832
224 935
type C
type C
Roughness standards
Roughness standard step 1
Roughness standard step 2
Roughness standard step 3
Set of roughness standards (steps 1 3)
Roughness standard super fine step 2
Roughness standard super fine step 3
Roughness standard ISO 10049, step 2
Roughness standard ISO 10049, step 3
approx. 0.2 m
approx. 0.5 m
approx. 1.5 m
approx. 0.2/0.5/1.5 m
approx. 0.05 m
approx. 0.08 m
approx. 1.25 m
approx. 1.9 m
approx. 1.5 m
approx. 3 m
approx. 8.54 m
approx. 1.5/3/8.5 m
approx. 0.3 m
approx. 0.45 m
approx. 6.1 m
approx. 9 m
approx. 2 m
approx. 4 m
approx. 9.5 m
approx. 2/4/9.5 m
approx. 0.4 m
approx. 0.6 m
1000 7524
1000 7525
1000 7526
1000 7527
1007 1807
1007 1808
1000 7486
1000 7453
type D
type D
type D
type D
type D
type D
type D
type D
226 252
1000 7540
224 937
type A
type A
Pt approx. 1/4/9 m
Pt approx. 9 m
54
Power supply: 100-240 V AC 50/60 Hz; operating temperature: +5 C to +40 C, relative humidity max. 85 %, without condensation ( T 2 C/h); storage temperature: -20 C to +50 C.
* Depending on probe used
Product lines
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Copyright JENOPTIK Industrial Metrology Germany GmbH. All rights reserved. Subject to change without notice. The photos may show options and are not legally binding.
1007 2148
05/2016
metrology@jenoptik.com