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//// Introduction
For the past twenty years, CSM Instruments and its mother company CSEM (Swiss Center for
Electronics and Microtechnology) have been a very active part in the development and also the
normalization of the Scratch testing method. Scratch testing instrumentation was first used to analyze
the mechanical properties of PVD and CVD materials. The first Revetest Scratch Tester (designed by
CSEM at the time as a Macro Scratch Tester) has seen a huge success over the past thirty years
reaching more than 500 users on various applications. New functionalities and measurements
capabilities have been introduced over the years and provide state-of-the-art technology of scratch
testing.
CSM Instruments has largely continued this philosophy of instrumental design development and has
brought to the market new Micro and Nano Scratch Testers. Following a large collaboration between
the most advanced industrial and academic researchers on Nano Scratch testing, the CSM Nano
Scratch Tester instrument has reached unmatched functionalities. The Nano Scratch Tester is
completely unique in its design and capabilities. It is clearly the best Nano Scratch testing device in
terms of force accuracy in the mN range over long distances of scratch and/or wear tests.
First and foremost, it must be highlighted that the CSM Nano Scratch Tester has been specifically
designed with scratch testing in mind. It is not an indentation tester that has been marketed or slightly
modified to have Scratch testing abilities. CSM's Nano Scratch Tester is designed for the on-line
measurements of both vertical and lateral forces, providing robustness, reliability and measurements
accuracy over long periods of time. This is not the case with an indentation system that has been
modified to perform some scratch tests and has a detrimental effect on the long-term performance of
the system.
Penetration depth measurements with profilometry, analysis of elastic and plastic behaviour,
adhesion, scratch resistance or/and wear testing, Nano Scratch combined with 3D imaging (AFM or
ConScan) are among other things important features of the Nano Scratch Tester with no compromise
on force accuracy over the scratch distance or sample shape.
It must be also highlighted that a new ASTM standard, ASTM D7187, specifically written around the
CSMs Nano Scratch Tester, has been now released for Scratch/Mar Behaviour of paint coatings.
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-100
100
-80
90
-60
80
-40
70
-20
60
50
20
40
40
30
60
20
80
10
100
depth (m)
Active force-feedback makes reproducible scratch testing possible even with more complex surface
geometries like non-parallel, rough or curved samples (as shown in the example below). CSM scratch
testers are the only commercially available systems that have active force feedback. This becomes an
absolute necessity in environments where you'd like to spend the majority of your time performing
analysis rather than focusing on sample preparation.
Pd (m)
Rd (m)
Profile (m)
Fn (mN)
0
0
4
6
scratch length (mm)
10
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Plastic
Deformation
Elastic
Recovery
Penetration depth, Pd
(during scratch)
Figure 4. Performing elastic recovery and deformation studies using the Nano Scratch Tester
//// NST : TECHNICAL FEATURES
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> Advantage of the fast response control (high speed load control feedback)
A further investigation of CSMs Active Force Feedback design warrants an explanation a feature
called High Speed Load Control (HSLC). HSLC is made available by the incorporation of a
piezoelectric nanopositioning device that controls the load applied by the measurement head at a very
rapid rate, with response as fast as few milliseconds. This ensures that the normal force applied will
not deviate from the programmed force. The importance of load control at high speeds is made
apparent in the example below, a test of the NST on an AFM calibration step sample. Without HSLC,
each step of the calibration sample causes a significant jump or dip in the force applied to the surface
at that point. With CSM Instruments HSLC, the normal force remains always constant.
100nm
250m
AFM calibration sample
1mm
Without
With
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Nano Hardness
Micro Scratch
Micro Hardness
Micro Combi (Micro Scratch + Micro
Hardness)
with an additional 3D imaging head:
AFM objective
ConScan objective
(confocal-based objective)
Figure 8. The CSM modular platform
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Figure 9. Nano Scratch Tester module on a CSM platform (left) and Nano Scratch design with the
double cantilever beam associated with a piezoelectric (right)
It is important to understand that the Nano Scratch Tester has been specifically designed for scratch
testing under low loads and provide unique and exceptional technical characteristics compared to any
other existing instrument. The technical reasons of the unmatched capabilities of the Nano Scratch
Tester are explained in the following paragraphs.
The double cantilever beam associated with a piezoelectric for fast response time, two sensors for
continuous force and depth measurements during the Nano Scratch test, as well as the active force
feedback loop control combined with the piezoelectric are key characteristics for scratch testing under
low loads (from microNewtons to one Newton force).
Among the various measurements capabilities, a few technical features can be introduced:
Accurate force application even in the presence of cracks and failure of the sample
Wear testing capabilities with monitoring of normal force applied and resultant friction force
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The load is applied by a double cantilever beam, while the position of the Nano Scratch head is
controlled by the displacement actuator.
The displacement sensor, FN, measures the deflection of the double cantilever beam and the
displacement sensor, DZ, monitors the surface profile of the sample under load.
Pre-scan and post-scan modes are very useful methods of measuring the penetration depth
during a scratching operation and the residual depth after a scratch test has been completed.
Three interchangeable cantilevers of varying stiffness can be mounted on the measuring head
to provide maximum applied load ranges of 10 mN, 100 mN and 1 N with respective resolutions
of 0.15, 1.5 and 15 N.
Several loading modes available: progressive and constant force mode, applied either as a
single pass or a multipass scratch. Numerous automation matrices options available
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//// Applications
The CSM Nano Scratch Tester (NST) has been used for a very wide range of applications. It
represents a very efficient automated method of determining the adhesion or scratch resistance of
coatings and thin films.
A variety of sample configurations and types of materials have been analyzed, from very thin hard
coatings to soft polymeric films, from bulk materials to very thin films ((DLC of 10 nm thickness).
Optical coatings, automotive varnish clear coats, hard disk coatings, semiconductor wafers,
components for spatial and aerospace applications, amongst many other devices, have been
investigated.
The NST is equipped with a thorough, easy-to-use Scratch software package that allows the user to
perform scratch and wear tests in a wide variety of testing modes, including simple scratch (with
increasing, incremental or constant loads), advanced scratch (with pre-scan and post-scan
profilometry), multi-cycle scratch wear testing, automated matrices, and location-pinpointed scratch
testing.
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> Options
Friction module
High resolution force spring
High resolution friction table
High load force spring
AFM Objective
ConScan Objective
Micro Scratch
Micro, Nano Indentation
> Consumables
The Nano Scratch instrument includes an anti-vibration table with the Compact Platform and
Open Platform. It should be placed in an environment isolated from mechanical vibrations
Temperature-controlled room (preferable)
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Standard
200 m
0.6 nm
High Range
2 mm
6 nm
Standard (ST)
100 mN
1.5 N
10 N/min
Standard Table
1N
6 N
Open Platform
60 mm
Compact Platform
30 mm
245 mm
120 mm
The Nano Scratch head is installed on a CSM platform. The possibility of installing a Nano Indentation
head on the same platform (even at a later stage) is an important advantage for these platforms.
For combination of Nano Scratch and Nano Indentation, please consult CSM Instruments about the
scratch length
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Figure 12. Indentation and/or Scratch CSM modules can be mounted on one of two platforms,
depending on how many modules will be required. The Compact Platform (a) can accommodate 2
modules, whereas the Open Platform (b) can accommodate 3 modules total. A full video microscope
comes standard on either platform.
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OPX Range
CPX Range
245 mm
120 mm
30 mm
120 mm
20 mm
30 mm
Standard
Resolution
0.25 m
0.25 m
10 nm
Compact Platform:
Open Platform:
Compact Platform : 70 x 20 mm
Open Platform :
195 x 120 mm
System Dimensions
(with anti-vibration table)
Compact Platform:
Open Platform :
Total weight:
High Resolution
(optional)
0.1 m
0.1 m
-
The usable areas of analysis indicate the areas of possible automated analysis in the X&Y directions.
This area will also vary with the other modules installed (Scratch, AFM and/or ConScan).
For the high resolution tables, please ask CSM Instruments for more details.
All table movements (X, Y, Z) can be controlled with Joystick.
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Fully user definable scratch modes (single and multiple scratches, multicycle wear, constant
load, incremental or progressive loads, user-defined load profiles, etc.)
Full integration of AFM and Video imaging into the indenter control software (with AFM option)
MultiFocus Image
Critical loads, LC, as a function of normal loads, FN, and optical observation
Powerful and fully integrated statistical module (data and graphical tools)
Data export in ASCII format top open files in Excel and Text software
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Sample positioning with industrial joystick, keyboard, mouse, table crosshairs, or vectors.
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Different Scratch Cantilevers are available (Standard, High Resolution, High Load)
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During the measurement process, real-time monitoring of the scratch curves is displayed:
Record and display the force applied (FN), tangential force (FT), frictional coefficient (), penetration
depth (Pd) and residual depth (Rd) profile.
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Using the automated correlation between a graphical cursor on the left-hand screen and the real-time
image of the scratch on the right-hand screen, define the optical critical loads and capture the relevant
sample pictures
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Single scratch
- Multi-pass scratch (uni- or bidirectional wear test)
Scratch options:
Load parameters:
- Constant load
- Progressive load (initial/final/loading rate)
- Incremental load (initial/final/loading rate)
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//// Microscope
The measuring head and the microscope are mounted side-by-side and linked by the two Xand Y- translation tables
- Stroke
- Coarse focusing
- Fine focusing
- Distance optical axis
Mounting surface
30 mm
5.2 mm/rotation
0.1 mm/rotation
141 mm
Objectives available:
- 5x
- 20x
- 50x
- 100x
22.50 mm
3.10 mm
0.54 mm
0.30 mm
Revolving Nosepieces
- Nosepiece
Working distance
Working distance
Working distance
Working distance
4 or 5 objectives
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An AFM objective can be mounted together aside the standard optical objectives
The AFM head is approached automatically until its cantilever tip contacts the sample surface
Scan modes
Deflection detection
Laser
Wave length
Class
Max. Power
40 x 40 m / 80 x 80 m
780 nm
3a
5 mW (direct at diode)
500 W (at the fibre end)
4 m 6 m respectively
(estimated maximum depths of analysis)
Resolution:
X, Y, Z < 1 nm
Data acquisition
Scan control
Power supply
Security class
Security type
150 V
0-60 V
2D and 3D imaging
Image treatment (plane and step correction, filtering, rotation, contrast, mirror, size, colours)
Image analysis (profile, roughness, asperity count, Fourier transformation)
Export format : .bmp (256 Colour Bitmap
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//// Contact us
info@csm-instruments.com
usinfo@csm-instruments.com
T : +41 32 557 56 00
F : +41 32 557 56 10
T : (781) 444-2250
F : (781) 444-2251
deinfo@csm-instruments.com
cninfo@csm-instruments.com
T : +49 7 61 47 87 150
F : +49 7 61 47 87 100
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