IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 38, NO.
3, AUGUST 1996
Numerical Modeling for LEMP Effect Evaluation
Inside a Telecommunication Exchange
Mauro Bandinelli, Fulvio Bessi, Stefan0 Chiti, Marco Infantino, and Roberto Pomponi
Abstruct- This paper presents a numerical modeling method
developed for evaluating electromagnetic (EM) interference on
the equipment inside a telecommunication exchange caused by
a direct lightning stroke to a telecommunication tower close
(i.e., a few meters) to the exchange building. Considering two
different bonding configurations, EM interference is evaluated
by calculating the electrical parameters: the EM fields, voltages,
and currents. A special Method of Moment (MOM) wire-grid
procedure using dipole and loop type basis and test func-
tions was used as a numerical tool. A simple model was also
developed for simulating the equipment mechanical structures
which modify the field distribution inside the building. The
voltages and currents induced on shielded cables were evaluated
by means of a mixed technique, where the MOM procedure is
combined with a SPICE analysis. Numerical modeling was used
for two different situations: to simulate some experimental tests
carried out in the field, where a 1.6 kA lightning current of
a pulse generator was injected on the top of the 25 m high
telecommunication tower close to a small exchange building; and
to calculate the same parameters when a real lightning current
strikes the telecommunication tower.
I. INTRODUCTION
F IELD EXPERIENCE has shown that lightning directly
striking a building or an adjacent structure is a source of
damage to the electronic equipment inside the building. The
damage mechanism is as follows: the lightning current flows
through the metallic component of the building or of the ad-
jacent structure and creates a strong lightning electromagnetic
pulse (LEMP); this pulse couples with the cables internal to
the building and connecting the equipment inside the building
and induces overvoltages and overcurrents that can destroy
electronic components of the equipment interfaces with these
cables.
An important reason for this damage is to be found in
the lack of dedicated protection against LEMP and defined
equipment resistibility. Recently, IEC worked on the pro-
tection of structures against LEMP and the first standard
on General Principles has just been published [l]. This
standard is based on the concept of dividing the building into
lightning protection zones and on the use of different bonding
configurations, i.e., cabling routing and equipotential bonding
connections.
On the second subject, ITU-T has recently decided to
prepare a new recommendation applying to telecommunication
Manuscript received May 11, 199.5; revised April 9, 1996.
M. Bandinelli, F. Bessi, and S. Chiti are with IDS, Ingegneria dei Sistemi,
Pisa, Italy.
M. Infantino and R. Pomponi are with CSELT, Centro Studi e Laboratori
Telecomunicazioni, Torino, Italy.
Publisher Item Identifier S 0018-937.5(96)06296-5.
0018-9375/96$05.00 0 1996 IEEE
265
equipment installed inside an exchange building which will
specify the impulse resistibility of the equipment interfaces
with the internal cables, i.e., cables routed entirely inside the
exchange building.
In investigating this EM interference problem, we followed
several different and complementary approaches. The first
approach was to define a numerical modeling method for
evaluating the LEMP effects inside the building [ 2 ] . This
approach consists in calculating the overvoltages and over-
currents conducted to the equipment, due to the coupling of
the EM fields with the cabling loops inside the building.
The second approach was to experimentally simulate the
LEMP effects inside a real exchange building by injecting
a lightning current on the top of a telecommunication tower
close to this exchange where the electrical parameters of
interest were measured [3].
The third approach, which is presented in this paper, vali-
dates and improves the numerical modeling method through a
comparison of the measured and calculated electrical param-
eters.
In particular, the paper describes:
1) a special Method Of Moment (MOM) wire-grid proce-
dure which has been identified as a numerical tool;
2) a simple model for simulating the equipment mechanical
structure; and
3) a mixed technique for simulating interference on
shielded cables.
This numerical modeling method is used for two different
situations:
to simulate the tests carried out in the field, where a 1.6
kA peak current of a pulse generator was injected on the
top of a high telecommunication tower close to a small
pilot exchange building: the test case; the comparison
between measured and calculated electrical parameters
is presented;
to calculate the same parameters when a real light-
ning current strikes the telecommunication tower; some
results of this calculation are also shown.
11. STATEMENT OF THE PROBLEM
A. Electrical Parameters of Interest
The purpose of the simulation was to calculate the overvolt-
ages and overcurrents induced by the LEMP, as a result of a
direct lightning stroke to the telecommunication tower, at the
equipment interfaces with the internal cables.
266 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 38, NO. 3, AUGUST 1996
Open circuit voltage (Vo)and short circuit current ( I c )at
the equipment interfaces with the internal cables were selected
as parameters of major interest. In particular, in the study case
of the small exchange building, we considered the interfaces
of the switching equipment with the following conductors
(Fig. 1):
1) the dc power conductors: the shielded cable between the
power station and the switching equipment;
2) the subscriber conductors: the conductors between the
main distribution frame (MDF) and the switching equip-
ment:
3) the transmission conductors: the coaxial pairs between
switching and transmission equipment.
Calculating these overvoltages and overcurrents calls for eval-
uating the EM fields and the currents flowing in the cable
shields. Moreover, numerical modeling must be capable of
taking the different bonding configurations suggested by the
International Standard [ 11 or recommendation [4] into account.
B. Bonding Conjigurations
The bonding configuration inside the Italian telecommu-
nication exchange was Star-IBN (isolated bonding network)
[4], without the Common Bonding Network (CBN): i.e.,
each system block [4], e.g., the switching system, is isolated
from the others sharing a single point connection (SPC) to
the earthing system, the main earthing terminal (MET). By
contrast, Mesh-BN (Bonding Network) configuration implies
that each system block has multiple connections to the CBN
and to the nearest system blocks [4].
To introduce the CBN and to evolve from Star-IBN to
Mesh-BN configuration, Telecom ltalia decided to build a pilot
telephone exchange, i.e., the study case.
The exchange is located inside a single store building which
has the following dimensions: length 9 m, width 7 m and
height 5.3 m. The building houses the MDF (where all the
subscriber lines are connected), the power station (that supplies
all the telecommunication equipment), and the transmission
and switching equipment (Fig. 1).
The 25 m high telecommunication tower is located about
5 m away from the wall on the long side of the building.
A waveguide connects the antenna with the transmission
equipment. The CBN, approximating a Faraday cage, was
defined as follows:
1) one ring conductor along the inside perimeter and close
to the roof of the building; and
2) connections of the ring conductor to the ring earth
electrode (which has multiple connections to the tower
earth electrode) with six vertical down conductors (three
per each lengthwise side).
For bonding configurations, we considered two cases in the
calculation:
1) Case 1: Star-IBN configuration without the CBN;
2) Case 2: Mesh-BN configuration.
C. Modeling Methods
Various modeling techniques have been used in the past to
estimate induced effects due to lightning strokes on electronic
to ring
electrode eaah
Fig. 1. Building of the pilot exchange: test setup for the Star-IBN config-
uration.
systems and equipment. Some of these techniques are based
on circuit concepts, while others are based on a full wave
approach solved by means of numerical techniques such as
the MOM.
While the former modeling techniques have limited appli-
cability (all the radiat aspects of the problem, such as the
LEMP interaction and EM field evaluation cannot be properly
and effectively faced), the latter ones in principle make it
possible to analyze the overall EM phenomena; moreover,
they can take into account the real geometrical and electrical
configuration of the plant. Among the full-wave techniques,
a suitable one for the analysis of exchange configurations
subjected to lightning interferences is the MOM technique
based on electric field integral equation (EFIE). Widely used
since around 1970 in antenna problems, EFIE MOM [51,
[lo] procedures make it possible to analyze virtually all the
geometrical configurations of interest. Particularly interesting
for applications on exchange are wire-grid MOM procedures,
which are well suited for modeling cables and straight conduc-
tors forming the CBN, where the thin-wire approximation
can be assumed, as long as the wire radius is normally much
less than both the length of the conductor and the wavelength
of the EM field.
111. MODELLING
FEATURES
A. Low Frequency Extension of Wire-Grid MOM Procedure
Frequency domain Method of Moment codes are usually
used in analysis of radiation problems and EM field inter-
actiodscattering by structures. Together with a Fast Fourier
Transform (FFT) procedure, they can be used to analyze
problems characterized by impulsive EM excitations (LEMP,
NEMP, ESD). Today many MOMEFIE formulations are
known, including wire-grid, surface-patches, and mixed [61,
[7], [SI, [lo], [21]. These formulations are implemented in
well organized codes that are capable of analyzing three-
dimensional (3-D) problems, where the scatterer geometry is
also very complex [SI, [9], [12]-[15], [22]. However, all these
codes work with difficulty at very low frequencies, where the
scatterer dimensions D are much smaller than the wavelength
BANDINELLI et aL: NUMERICAL MODELING FOR LEMP EFFECT EVALUATION 267

A; this is the case in the analysis of impulsive phenomena Source dipole "i",Ji (*) '
which are significantly extented in the Rayleigh region, such P
as lightning phenomena. The problems that are usually found
in those cases may depend on the following concurrent factors:
1) inadequate expansion functions; and
2) numerical problems, depending on the fact that the
vector potential contribution to the electric field loses
importance with decreasing frequency; the electric field
becomes more nearly conservative and the moment
Fig. 2. "Wire domain" D i e ) for electrical (dipole) basis and test functions.
method matrix becomes ill-conditioned.
A number of researchers have worked on the problem of
scattering analysis at very low frequencies [16]-[20]. At
present, we know of no "general purpose" MOM code capable
of solving the problem of scattering at very low frequencies.
In order to overcome this problem, a "general purpose" MOM
wire-grid procedure has been implemented which makes it
possible to analyze interactiodscattering problems on complex
3-D structures in the Rayleigh region ( D << A), while still source loop "i",

-
retaining the ability to work correctly in the "resonance region"
(D A), using an unique geometrical model.
A detailed description of the method and validation exam-
Fig. 3. "Wire domain" for magnetic (loop) basis and test functions.

ples for relevant geometrical configurations are given in [23], 3') and a(') represent, respectively, the well known "mag-
[24], which also discuss the problem of "traditional" wire- netostatic current" and "electrostatic charge" density.
grid MOM procedures, such as NEC, in the lower part of A MOM solution of the integral equation (2) is constructed
the frequency spectrum. The main features of the proposed by expanding the unknown current density J' as [16]
procedure carried out by means of this analysis are described
below.
Consider a perfectly conducting body, with external surface z=1 2=1

S , in free space, illuminated by a harmonic incident field

(,??,I?') at angular frequency w (in the following the elWt where 3"'
will be vector functions suitable for approximating
dependence will be understood). Between the induced current magnetostatic type current distribution, while 2") will be
and charge densities f ( r ' )and a(?), where r' is the position chosen so that 0: . 3"' are suitable for representing the
vector on S , the following relationship is true: electrostatic type charge distribution. Both expansion functions

+
v' . f(?) j w a ( ? ) = 0.
will be independent of k. Em) and Eel are unknown complex
(1) coefficients to be determined, while kp,, is a dimensionless
scale factor, whose exact value is not critical to the solution.
Moreover, the EFIE states:
For a "wire-grid' procedure, these conditions are, respectively,
6 x (13~) + 8")) = o on s (2) satisfied by the following:
where @ is the scattered field, due to f(?)and a(?) radiating
in free space. In the very low frequency region (i.e., when
D << A, D being the major linear dimensions of the scatterer)
it is possible to obtain a better insight into the phenomenon
by expanding f(?) and o(?) in Rayleigh series [16, p. 3311: where the segments (G - ?') and (< - 6) constitute the
"wire domain" D,!"' represented in Fig. 2
(3)

n=O
k = 17M2
-1 (9)
where Jn) and a(n) are independent of k ( k = 2 r / A is the where the segments (Tk+' - gk)joined to form a Mz sided
wavenumber). Only the first terms in (3) and (4) are important
piecewise loop constitute the "wire domain" 0:"' shown in
at low frequencies. For these terms, the following relationships
Fig. 3.
are satisfied:
The same functions will be used as test functions (Galerkin
(5) formulation)
"ji")= Z " ) , j= l,Ne; = E"), j 1,".
(10)
268 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 38, NO. 3, AUGUST 1996

Substituting (7) into (2) and making the symmetric product Rn Ll2 VI2 VI2 u2 w2
with each test function, the following MOM linear system is
obtained [ 5 ] :

zme zmm (11)

With this system, it is possible to solve for the induced current
Jboth in the resonance region and in the Rayleigh region of
the scatterer (down to a few Hertz for a 1 m side square
loop has been proved in [23], [24]), making use of the same
wire-grid model. 2and 2 are the submatrices relative
to expansion and test functions of electric and magnetic type,
respectively. 2(2,) is the submatrix relative to electric
(magnetic) type basis functions and magnetic (electric) type
weighting functions. V and V m are the voltage vectors,
relative to the electric and magnetic test functions respectively.
B. Mixed Techniques for Simulating
Inte$erences to Shielded Cables
Many signal cables in an exchange are shielded and are
typically coaxial cables grouped in a bundle. For evaluating
EM interferences on electronic equipment, voltage and current
on the load located at the end of the cable are parameters of
major interest.
Solving such a problem by means of a direct MOM appli-
cation is not possible because of the granularity of the tech-
nique, whereby of external-large scale enviroments (such
as the cables layout) cannot be modeled at the same time as
internal small scale ones (such as the internal transmission
line problem relevant to the evaluation of the load voltage
and current spectrum). Analysis techniques described in the
literature face the problem through the concept of Transfer
Impedance Z t ( w ) [25]-[27]. Owing to the fact that the ex-
ternal and internal environments can actually be considered
decoupled, it is possible to relate the current I , ( w ) induced on
the external surface of the sheath directly to voltage generators in the lightning frequency spectrum. For the commonly used
representing the voltage induced along the inside of the cable.
Analytical and numerical procedures have been widely used in
the past [25] to evaluate the external induced currents I,, but
the majority are concerned only with simplified configurations,
where, for example,
1) the cable layout is a very simple one (typically an critical for analysis.
isolated straight wire located parallel to the ground):
2) interference is represented by a time-harmonic plane-
wave EM field.
I(
i 4
I
Fig. 4. Elementary lumped element cell.
equipment) was modeled by means of a MOM procedure. It
was thus possible to evaluate the outer sheath current I,, taking
into account the overall complex interacting enviroment of the
exchange subjected to a lightning stroke. In the second step of
the analysis, the cable internal problem was solved by means
of a lumped element model of the transmission line and its
loads. The external and internal problems are coupled through
the relationship (12). In particular, following the constraints
of the MOM technique, the interfered cables were divided
into n segments, each measuring not more than X / l O at the
upper frequency of the lightning spectrum. Subsequently, for
the internal problem, each of these segments was modeled
through a lumped element cell, as shown in Fig. 4.
The circuit compounded by the cascade of the n-cells
representing the aforementioned n-segments and the loads at
its ends, represents the model of the shielded cable used for
evaluating the interference levels on the load.
Referring to L, C, Rfor the per-unit-length cable parame-
ters, which can be evaluated from the geometrical and physical
characteristics of the cable, the cell parameters for a segment
of length I are
L = Ll, C = Cl, R = R1 (13)
.z.
V ( w )=Z t ( w ) . I s ( w ) (14)
It should be noted that a knowledge of Z t ( w ) is not critical
coaxial lines, Z t ( w ) is often declared on cable data sheets,
while suitable testing procedures can be used to measure the
same when not standard cables are used. Well established
computer programs for circuit analysis, such as SPICE, are
capable of solving this second step of the interference evalu-
ation problem. Cell topologies other than the T-one shown in
Fig. 4 can be selected in order to model the internal problem,
such as for example n,L or r. However, the choice is not
I v . MEASURED VERSUS MODELING mSULTS

Even if these features are suitable for modeling some geometri-

cal and electrical practical configurations, they certainly cannot A. Setup Description [2]
be used for the subject of this work, where the cable is located The purpose of this test was to make a full-scale test of
in a larger contest with interacting elements (other cables, a lightning stroke. One terminal of the test generator was
equipment, bonding and grounding conductors) whose layout connected to the top of the tower and the other terminal to
is very different from a straight one and where the interferences one leg of the tower through a 2 cm width and 2 mm thick
come as a complex near field radiated from a lightning channel. aluminum strap. The test setup is shown in Fig. 5.
In order to overcome these limitations, our investigation The test circuit can simulate the current derivative variation
followed a new approach, where the entire plant (the cables, effects of the first lightning stroke through a 25 kHz damped
CBN, protection conductors, and the mechanical structure of sinusoidal current with peak value of around 1.6 k4 (Fig. 6).
BANDINELLI et al.: NUMERICAL MODELING FOR LEMP EFFECT EVALUATION 269

Pilot Ouside Inside building

Exchange

Fig. 5. Loop of injected current.

63
H

10
5
Il(r
. ...
:.:.:.
.:.:.:

..:.:.
...:.
.:.:.,
...:.:
... ...
::::::
.. .. ..

kA 1 3 5 7 9
2.5
Distance [m]

Fig. 7. Magnetic field distribution.

nts
-21
-50

50 150 250 350 450
J
Pa

Fig. 6 . Waveform of test current.

B. Exchange Modeling
Numerical modeling of an exchange for LEMP analysis is
very complex and involves study of suitable circuit config-
uration in order to correctly characterize the different EM
interactions involved. The different elements of the system Fig. 8. Electromagnetic model for MESH BN configuration.
can be classified as follows: a) metallic structures of exchange
facilities; b) grounding and bonding conductors; c) electronic
can reproduce the magnetic field distribution inside the ex-
system chassis; and d) cable and cable bundle layout.
change building, as shown in Fig. 7.
Of these categories, the first is generally not very critical;
For category d elements, the model used the mixed approach
metallic structure interactions are mainly due to incident field
reported in Section 111-B. In this approach, the MOM tech-
coupling and subsequent scattering, which can modify the
nique was first applied to compute the induced currents on a
EM environment of the electronic system. At the frequency
macroscopic cable bundle model, after which a circuit scheme
band considered, such structures can be analyzed as thin wire
was applied to a refined geometrical electrical model of the
elements which are not critical from the standpoint of the
cable layout. An example of an exchange macroscopic model
simulation. Category b conductors are really very important for
is shown in Fig. 8.
the EMC evaluation, but the model is still not too critical and
can be configured according to the thin wire approximation, as
C. Measured versus Modeling Results
for the previous class. For category c elements, the problem is
extremely complicated. Electronic system chassis elements are Many different parameters have been considered in order to
typically quite extended in dimension with respect to exchange compare the results of numerical modeling with experimen-
structure and their shape cannot be easily modeled (i.e,, tal results. These parameters range from the simple (e.g.,
geometrically reproduced) by means of suitable simulation the magnetic field close to the telecommunication tower) to
technique. In particular, the MOM based technique used in complex (e.g., the open circuit voltage at signal conductors
the case considered here would require a large number of of shielded cables). In detail, they can be classified as:
unknowns which are not allowed for the whole exchange magnetic field induced outside and inside the exchange
apparatus modeling. To overcome this problem, an equiv- building;
alent geometrical structure was considered as the result of current induced on the bonding conductors;
a specific testing activity. The purpose of this model testing current induced on cable shields connected to the chassis
was to define a singular geometrical chassis model capable of of electrical and electronic equipment (e.g., the power
accounting for the macroscopic (i.e., with respect to detailed supply subsystem or the switching equipment);
chassis layout) interaction phenomena inside the exchange open circuit voltage induced on cable shields with re-
global configuration. The criteria then applied consider the 3-D spect to the ground reference on the chassis of electrical
chassis layout equivalent to a planar loop structure with an and electronic equipment, at the connection point; and
area which approximates the principal component of structure short circuit currents and open circuit voltages (with
induced current. respect to the ground reference on the chassis) on the
Despite this simplification (which, however, implies an signal conductors inside shielded cable, at electronic
extremely complete model for the entire exchange), the model systems ports.
270 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 38, NO. 3, AUGUST 1996
125
v LVl
15
0 75
0
-0 I5
-1 5
-2 25
50 0 50 100 150 200 t[ps1250
@)
Fig 9 (a) Measured and simulated current waveforms mduced on the dc
power supply cable in STAR-IBN configuration (b) Measured and simu-
lated voltage waveforms induced on the transmssion cable in MESH BN
configuration
A representative set of comparisons is given in this paper.
Fig. 9(a) and (b) show the comparison between the computed
and measured waveforms related respectively to the current on
the dc power supply internal cable and to the voltage on the
transmission cable (switching equipment side).
The curves are very close to each other both in terms
of absolute amplitude and shape of the waveform. Table I
contains a summary of the comparison between measured and
calculated induced interferences on the system.
For a correct interpretation of the comparisons presented
here, it must be pointed out that the measurements were
performed on a real and operative exchange, where some data
to be used as modeling input were not exactly known (for
example, cable pigtail termination characteristics) and some
details were not considered in the engineering numerical model
(for example, the air-conditioned plant).
V. REALLEMPAPPLICATION
A. Introduction
The numerical procedure described in the previous para-
graphs has been extensively applied to simulations of natu-
ral (i.e., not experimentally simulated) lightning strokes on
telecommunication centers and associated bonding configura-
tions. These extensive simulations made it possible to collect
a number of results in terms of
1) near EM field behavior during lightning phenomena;
2) currents induced on signal cables and bonding conduc-
tors; and
3) voltage induced at equipment ports.
On the basis of the IEC standard [ 11, the following analytical
expression has been adopted for the lightning-return stroke
current. This expression is suitable both for the first and the
second lightning strokes
where
1) 1, = peak value;
2) 7 = amplitude correction factor;
3) T~ = front time constant;
4) 72 = decay time constant.
The values of (3.15) parameters are shown above in Table 11.
B. Computation of the Induced EM Fields
Fig. 10(a) shows the vertical component of the electric field
(frequency domain) in a point inside the building when a
lightning first stroke falls 5 m from the building; the figure
contains the values with and without the building. Fig. 10(b)
shows the time domain results for the same case as Fig. 10(a).
The shielding capability of the building's metal-reinforced
walls is quite clear from the figures. In general, values found
for shielding range from around 10 dB for the electric field and
around 5 dB for magnetic field, referring to usual reinforced
concrete buildings in the case of lightning strokes on antenna
towers close to the exchange building.
C. Computation of the Induced Voltages
Voltages induced on the cables were calculated for both
the first and the second stroke; in particular, the cables
connecting the switching equipment to transmission equipment
were analyzed. The following expression was assumed for
transfer impedance:
Zt = Rt + j w L t with Rt = 10 mR/m
and Lt = 1.6 nH/m. (16)
For the termination connections, two values associated with
a medium-short pigtail and a 360" connector, respectively,
were considered
Zt, = R +j w L with R = 0.02 R and L = 50 nH
Zt,=R$jwL with R = 0 . 0 2 R and L = 2 n H .
(17)
The results confirm that it is important to provide a good ter-
mination at cable shields; in particular, the pigtail connections
to the mechanical frame must be avoided in view of their
negative effects, as shown in Fig. 11.
VI. CONCLUSIONS
The paper presented a numerical modeling method for eval-
uating EM interference due to LEMP on the equipment inside a
telecommunication exchange where experimental reproduction
BANUlNOLLl et al.: NUMhKlCAL MOUtLlNG POK LOMI' OPbOC1 OVALUAllUN

TABLE I
COMPARISON MEASURED
BETWEEN AND COMPUTED PEAK VALUES OF INDUCED VOLTAGES AND CURRENTS

n internal conductor,

ductor; shield grounded

on chassis
MESH BN Transmission cable; short 1A 1A
circuit current on shield
STAR IBN Power positive conductor; 4.3 A 4.3 A
short circuit current on
Induced current internal conductor;shield
not grounded
MESH BN Power positive conductor; 3A 1.5 A
short circuit current on
bhield I 1
MESH BN bround conductor 25A 16 A

First stroke Second stroke

1 (W 100 25
n 0.93 0.993

22 485 143

of interference is difficult. The main parameters of interest

are:
0
1) EM fields (E, H);
2) current flowing in the bonding conductors; and
-50
3) open circuit voltage and the short circuit current at the
-100 interfaces of switching equipment with some shielded
-150 cables.
-200 The proposed technique was validated by comparing the
0.01 0. I I 10
numerical results with experimental data measured during
f[MHz]
a special testing activity performed in the field, where a
(a) 1.6 kA pulse current was injected on the top of the tower
close to a telecommunication exchange building. Comparisons
E [MV/m]
between measured and calculated data for different bonding
100
configurations show that results were very close in terms of
75 absolute amplitude and waveform.
In addition to verifying the model, it was also possible to
50
optimize the representation of specific subsystems in the plant,
25
such as mechanical equipment frames. These were replaced
with a planar loop structure with an area equivalent to the
0 actual structure. In this way, it was possible to reproduce the
0 4 8 12 16 20
t IWI modification of the EM field in the area inside the building
(b) due to the equipment.
Fig. 10. (a) Electric field behavior (frequency domain). (b) Electric field The main parameters were also evaluated simulating a direct
behavior (time domain). lightning stroke to the tower. Two different lightning currents
212 EEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILlTY, VOL. 38, NO. 3, AUGUST 1996
v [VI
150 I
100
50
0 electric field integral equation at low frequencies, U.R.S.I. Nut. Radio
- 50
-100
-150
0 0.2
I
0.4 0.6 0.8
I
1.o
t [PI
Fig. 11. Calculated voltage waveforms induced by a subsequent stroke on
the transmission cable in MESH BN configuration.
were considered (100 kA,101350 ps for the first stroke and
25 kA,0.25/100 ps for the subsequent strokes) and different
impedance values for shield cable connections were simulated.
The numerical model presented here can be used in de-
signing different telecommunication centre equipment layouts
(antenna tower, equipment location) and grounding config-
urations (different bonding networks) subject to a lightning
threat.
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Mauro Bandinelli was bom in Florence, Italy,
in 1959 He received the degree in electncal en-
gineenng at the University of Florence, Italy, in
1986.
Since 1986 he has been a Researcher at the Elec-
tromagnetic Engineenng Division of I D S Ingegne-
na Dei Sistemi He has been involved in research
achvihes on asymptotic and numencal techniques,
especially in the framework of EMC applications
Computational Electromagnetic Society Journal
Mr Bandinelli received the annual Italian Telecom Company SIP award
for h s thesis work on numema1 methods for antenna array design
Fulvio Bessi received the degree in electncal engi-
neenng from the University of Florence, Italy.
He is presently Manager of the Electromagnetic
Engineering Divison of I.D.S. Ingegnena Dei Sis-
temi S.p.A. He has been the coordinator of a course
on numencal techniques for EMC control at the
Scuola Supenore Reiss Romoli He is involved in
research activitles within the geometncal theory of
diffraction and numerical techniques, furthermore,
he carried out achvihes regardmg RCS calculation
and reduction for military platforms, NEMP and
LEMP studies, and the analysis of antenna performances in complex envi-
ronments He took part in the main European projects of space, naval, and
avionic platforms.
Mr Bessi is an Editor of the Applied Computational Electromagnetic
Society Journal.
BANDINELL1 et al.: NUMERICAL MODELING FOR LEMP EFFECT EVALUATION 213

Stefan0 Chiti received the degree in electrical en-
gineering from the University of Florence, Italy, in
1983.
Since 1983 he has worked at 1.D.S. Ingeneria
Dei Sistemi S.p.A. within the Electromagnetic En-
gineering Division. He has been involved in main
projects conceming the development of numerical
techniques and their application to problems of
antenna siting, and EMCEMI system performance
for naval, airport, avionic, and space fields. He
gained experience in both low-frequency (Method
of Moments) and high-frequency (GTD, PO) techniques as well as special
EMC topics like lightning and EMP. He is responsible for the Electromag-
netic Shielding chapter of EUCLID CEPA 3, RTP 3.8 Naval Application
Technology research. He teaches the short course Numerical Techniques for
the Prediction and Control of EM Compatibility for the areas of lightning,
transmission lines, and EM numerical code validation at Scuola Superiore
Reiss Romoli STET. He has contributed as a reviewer for the Applied
Computational Electromagnetic Society Joumal.
Roberto Pomponi received the degree in elec-
trotechnical engineering from the Polytechnic of
Turin, Italy, in 1972.
In the same year he joined CSELT, where he
carried out activities in protection of telecommu-
nication plants against lighting and low frequency
electromagnetic interference. In 1989 he was as-
signed the responsibility of the CSELT Group for
Protection, Safety and ElectromagneticCompatibil-
ity.
Mr. Pomponi chairs the Working Party 3/5 of
ITU-T Study Group 5 for protection,-earthing and bonding of telecommuni-
cation installations, and the CENELEC Task Force BMF 69-4 for protection
of telecommunication lines against lightning.

Marco Infantino was bom in Tricarico (Matera),

Italy, in 1963. He received the degree in electrical
engineering from the Polytechnic Institute of Turin,
Italy, in 1990.
In 1990 he joined CSELT, where he is currently
working in developing test methods and design
guidelines for protecting telecommunications sys-
tems from high-voltage and high-current phenom-
ena. His research interests concem electrical con-
figurations for equipotentialbonding and earthing in
telecommunication plants. Since 1993 he has been a
member of the technical staff in the Protection and Safety Laboratory, where
is responsible for con )liance tests on telecommunication and information
technology equipment ai:cording to ITU-T, ETSI, and IEC requirements.