INTERFEROMETERS

1. Michelson Interferometer

Fig. No. 1: Michelson interferometer

The Michelson interferometer consists of a monochromatic light source, beam splitter,

moving mirror (i.e. measurement mirror) M1 and fixed mirror (reference mirror), M2. Beam
splitter is used to split light falling on it into two beams. Beam splitter transmits about 50%
and reflects about 50% of the light beam.

These two beams are reflected by mirror M1 and M2. Reflected beam mirror M1 and M2 are
recombined at the beam splitter before arriving at the detector.

The path difference of these two beams causes a phase difference which creates an
interference fringe pattern.

If path difference is equal to odd Number , phase difference between two reflected
rays is 180o therefore dark band is observed.

If path difference is equal to even Number , two reflected rays are in phase therefore
bright band is observed.

This pattern is then analysed by the detector to evaluate the wave characteristics, material
properties or the displacement of measurement mirrors.
1. NPL Flatness Interferometer

Fig. No. 2 : NPL Flatness Interferometer

It consists of a simple optical system, which produces a sharp image of the fringes. Such
fringes can be viewed conveniently by the operator.

The light from a mercury vapour lamp is focused using condenser. Light is passed through a
green filter for obtaining a green monochromatic light source.

The green monochromatic light passes through a pinhole, giving an intense point source of
monochromatic light. The pinhole is positioned at the focal plane of a collimating lens.

Collimating lens projects a parallel beam of light onto the face of the gauge to be tested via
an optical flat. Using optical flat interference fringes are produced.

The light beam, which carries an image of the fringes, is reflected back and directed by 90
using a glass plate reflector.

The entire optical system is enclosed in a metal or fibreglass body. It is provided with
adjustments to vary the angle of the optical flat. Base plate is designed to be rotated so that
the fringes can be oriented to the best advantage.
 Fig. No.3 Example of fringe patterns (a) Equal fringes on parallel surfaces
(b) Unequal fringes due to flatness error

Figure No.3 shows the fringe pattern that is typically observed on the gauge surface of
workpiece as well as the base plate. In Figure No.3 (a), the fringes are parallel and equal in
number on the two surfaces. It means the two surfaces are parallel and gauge surface of
workpiece is perfectly flat. On the other hand, in Figure No.3 (b), the number of fringes is
unequal. If we consider base plate surface is perfectly flat,. Due to the flatness error of gauge
surface of workpiece, the optical flat makes unequal angles with the workpiece and the base
plate, resulting in an unequal number of fringes.

Most of the times fringes will not be parallel lines, but will curve out in a particular fashion
depending on the extent of wear and tear of the upper surface of the work piece. In such
cases, the fringe pattern gives a clue about the nature and direction of wear.

Measuring Error in Parallelism using NPL Flatness Interferometer

The NPL flatness interferometer is used for checking flatness between gauge surfaces. The
gauge to be checked is placed on a base plate that has a high degree of flatness.

If the gauge length is smaller than 25 mm, the gauge is placed on the base plate and the fringe
pattern is observed. If the gauge being inspected is free from flatness error, then the fringes
formed on both the gauge surface and the base plate are equally spaced.

Figure No.4: Testing parallelism in gauges

For gauges longer than 25 mm, fringe pattern on the base plate is difficult to observe.
Therefore, the gauge is placed on a rotary table, as shown in Fig. No. 4. If the gauge surface
has flatness error, because of the angle it makes with the optical flat, a number of fringes are
seen on the gauge surface. Now the table is rotated through 180, and the surface of the gauge
becomes even less parallel to the optical flat. This results in more number of fringes
appearing on the gauge surface.

Let,
n1 = No. of fringes fringes along its length in the first position
n2 = No. of fringes fringes along its length in the second position.
= Wavelength of monochromatic light

As seen from figure, the distance between the gauge and the optical flat in the first position
has increased by a distance d1, over the length of the gauge, and in the second position by a
distance d2.

We know distance between the gauge and the optical flat changes by /2, between adjacent
fringes. Therefore, d1 = n1 /2 and d2 = n2 /2.

(12)
Error in parallelism =
2
(12) /2
=
2
= (n1 n2) /4.

2. Laser Interferometer

Fig. No. 5 : Laser Interferometer

The laser-based interferometer is as shown in Fig. 5. Laser head is a fixed unit and consists of
laser, a pair of semi-reflectors, and two photodiodes. The sliding unit has a corner cube
mounted on it. The corner cube reflects light at an angle of 180, regardless of the angle at
which light is incident on it. The photodiodes are used to measure the fringe intensity and
provide an accurate means for measuring displacement.
Laser light first falls on the semi-reflector P, is partially reflected by 90 and falls on the
other reflector S. A portion of light passes through P and strikes the corner cube. Light is
turned through 180 by the corner cube and recombines at the semi-reflector S.

If path difference between path PQRS and path PS is odd number of half wavelengths, then
interference will occur at S and the diode output will be at a minimum.

If path difference between path PQRS and path PS is even number of half wavelengths, then
the photodiodes will register maximum output.

When moving slide is displaced by a quarter wavelength, the path difference (i.e. PQRS
PS) becomes half a wavelength and the output from the photodiode will change from
maximum to minimum or vice versa.

This sinusoidal output from the photodiode is amplified and fed to a high-speed counter,
which is calibrated to give the displacement in terms of millimetres. The purpose of using a
second photodiode is to sense the direction of movement of the slide.

Laser interferometers are used to calibrate machine tables, slides, and axis movements of
coordinate measuring machines. The equipment is portable and provides a very high degree
of accuracy and precision.