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1 Purpose
The purpose of this procedure is to provide general guidelines for printed circuit board design with the
intent to optimize for efficient, economical manufacturing, and testing techniques.
2 Scope
This procedure applies to all employees and outside sources who design printed circuit boards for
manufacturing at Inservco, Inc.
Component pad design should conform to the following standards (in order of precedence)and should be
collaborative between the customer and Inservco:
Inservcos General Design Recommendations
IPC-SM-782 standards
Manufacturer standards
3 Responsibility
It is the responsibility of the Test and Manufacturing Engineering Department to maintain this procedure.
4. 0. General :
4.0.1 Solder mask clearance around board features (such as SMT pads, vias, and plated through holes)
should be .003 inches.
4.0.2 SMT passive component spacing should be at least 0.8 mm (.030) from one component to another.
.050 preferred.
4.0.3 Via holes should not be located under the body of chip caps and resistors that are 1206 or smaller.
4.0.4 Component-to-board edge clearance should be .197 inches minimum. Inservco prefers .250 inches.
4.0.5 Component orientation should be clearly indicated on the PC substrate.
4.0.6 Component pad design should conform to the standards as outlined in Supplement 1 Land
Pattern design.
4.0.7 Provide non-plated tooling holes as outlined in section 4.6.
4.0.8 Provision for three global fiducial targets for vision alignment should be accommodated.
Dimensions should be .050 inch solid round pad with 0.100 inch solder mask clearance.
4.0.9 For each fine pitch device, provide a local fiducial.
4.0.10 Retain consistent orientation on components when possible.
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INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.1.1.2 One test probe contact node per net for in-circuit test, minimum.
4.1.1.7 Do not rely on component, lead or land pattern for test, probe contact. The pressure of the
spring-loaded probe pin can add just enough pressure to a substandard solder connection to
mask a solder defect, when the pressure is released, the component lead is allowed to open
and electrical continuity is broken.
4.1.1.8 Placement of Probe Targets for Bed-of-Nails Testing should be evenly distributed over the
surface of the PCB (assembly).
4.1.1.9 The Printed Circuit Board should be designed such that there are test pads or vias (probe
targets) available for probing all electrical nodes, including unused pins and no-connects,
from one side of the board. SMT component leads should not be used for probing.
4.1.2 Bottom side probe targets should be at least 0.040 diameter and should have solder as the
contact surface. 0.035 is the absolute minimum. Top side probe targets should be 0.045
diameter minimum.
4.1.3 Probe targets should be 0.100 apart if possible, but at least 0.075 apart.
0.050 unacceptable
0.100 preferred
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INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.1.4 Probe targets should be located at least 0.200 from tall components (greater than 0.250
tall).
4.1.5 Probe targets should be located such that their centerline is 0.060 away from the edges of
other components (less than 0.250 tall).
4.1.6 Probe targets should be evenly distributed over the PC board surface.
4.3.2 External pad size should be at least 0.018 greater than the finished hole size. Internal
signal layer pad size should be at least 0.022 greater than the finished hole size.
4.3.3 Internal power/ground clearance pads should be at least 0.026 greater than the finished
hole size.
4.3.4 Vias should be isolated from component pads by at least 0.025 and never located within a
surface mount pad.
4.3.5 Vias should be filled with solder if possible to prevent vacuum leaks on bed-of-nails testers.
4.3.6 SMT passive component spacing should be at least 0.8 mm (.030) from one component to
another .050 preferred.
4.4.1 In general, SMT pads should be 0.010 to 0.020 larger than the contact area of the
components foot. Conformance to IPC-SM-782 is highly recommended.
4.4.2 The width of a trace entering a surface mount pad should be no more than 0.010 and
should enter the pad at the center. This provides a thermal barrier for solderability. Wide traces
may be narrowed as shown below.
Component Pads
0.010
0.010
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INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.4.3 Surface mount pads should never be placed directly in contact with other pads.
Acceptable Unacceptable
4.5.1 The minimum recommended line width and spacing is 0.006 assuming ounce
copper. Use a minimum of 0.010 for 1 ounce copper.
4.6.1 There should be at least three 0.125 diameter non-plated tooling holes located as
in the following diagram:
Preferred Acceptable
SMT
0.125 clearance
from board edge to
Thru-hole technology
tooling hole.
free area = 0.375 radius from
center of tooling hole
to components, component
leads, thru holes, or vias.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
Chip
Body
Solder Land
Chip
Body SOT Body
0.050 min
Solder Land
Solder Land
0.050 min
Chip
Body
Solder Land
Chip
Body Solder Land
SOIC Comp.
Body
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.7.3 All components, thru-hole or surface mount, should be placed such that they are not
in direct contact with another components body or leads.
Both ends are soldered at once. One end of the component enters
the solder before the other.
4.8 Soldermask
4.8.1 Use Liquid Photo Imagable (LPI) soldermask for fine pitch designs.
4.8.2
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.9.1 Component silkscreen must include at least a unique reference designator for each
component to be installed on the board (top and bottom).
4.9.4 All test pads must be free of silkscreen markings to enable test probe contact with
the pad.
4.10.1 There should be a free area, no components or test pads, within 0.125 of the edge
of the board. Component-to-board edge clearance should be .197 inches minimum.
Inservco prefers .250 inches
4.10.2 Component lead protrusion on the solder side of the PC board should be 0.062 or
less.
5.1.2 The size of the fiducial on the same printed circuit board must not vary by more
than 0.001 inch diameter.
5.1.3 Clearance around a fiducial mark must be twice the radius of the fiducial mark.
This area must be clear of any conductive material, markings, or coatings
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
5.1.4 The fiducial mark should be made of bare or covered copper. The covering may be
a clear anti-oxidation coating, nickel plating, or tin plating. Hot-air leveled solder may
also be used for plating. The thickness of the coating should be from 0.0002 to 0.0004
inch. If solder is used, the thickness should never be greater than 0.001 inch.
Local Fiducial -
required for large
(84 pins or greater) ,
fine-pitch ICs (0.025
inch or less). 2 per IC.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
The clearance from a fiducial mark to the edge of the printed circuit board or panel must be no less
than 0.187 inch.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
Thoughtful
placement of the
perforations can
make depanelization
quick and easy.
Routed panels
provide a smooth,
precise edge on the
finished piece. The
break-away tabs can
be designed such
that no further
processing is
necessary to dress up
the edge after Inconsistent orientation
depanelization. should be avoided.
0.093 routing
is preferred.
or
good better
The number of break-away tabs required is a function of the size of the panel, the weight of the
parts being installed, and the stiffness required for the manufacturing process. It is good practice
to discuss this with a manufacturing engineer.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
Please refer to IPC-SM-782 for details on the design of break-away tabs and for more information
on routed and scored panels.
6.2.1 The previous illustration shows a routed board with perforations. In many cases it
may be more cost effective to score the panels. The major stipulation for using a scored
panel is that no components overhang the edge of any one of the individual assemblies.
Inconsistent orientation
should be avoided.
25
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
7 Electrical Considerations
7.1 Functional blocks should be partitioned such that they may be tested separately.
7.2 Control lines must be accessible for external and independent control by test equipment.
(Preset, Clear, Reset, Enable, Chip Select, etc.) One way to accomplish this is to connect them
through a resistor. For example, a control line that would normally be tied to VCC would be
connected through a resistor as in the following example:
VCC
Test Point
D PR
CLK
CLR Test Point CE
Test Point
VCC
7.3 PALS and similar ICs should have their equations written such than
an input line may be used to tri-state the device for testing upstream devices.
7.4 Provisions should be made so that long timers/delays may be sped up for testing.
7.5 Clocks/oscillators must be designed such that they may be disabled or tri-stated for
testing.
7.6 There must be a testpad on the ground net for every three ICs and one on the power net for
every 5 ICs. These ground and power test pads should be distributed evenly across the circuit
board.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
7.7 Closed loop systems should be designed such that they may be opened easily for
troubleshooting.
Instead of this
VCC
8.1 When making a design change it is desirable that any through-holes, testpads, or vias being
used for probe points remain at the same locations. This will minimize changes to the test fixture.
8.2 All wires that are added to the board should be dressed on the top side of the circuit board.
8.3 Connected pins that are isolated and tied together with modification wiring should be
connected also to an unused via for in-circuit test access.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
The following suggestions SMT land pattern design on passive chip resistors and capacitors
.
C
Y G
A land pattern that too large for chip will encourage an excess of solder build up. When wave soldering
discrete components, it is possible to adapt an optional narrow pad geometry to limit the amount of solder
volume at the component connection.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
INDUCTORS
Y G
SOT-23 Geometry
.040
.080
Square
.040 .075
.050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
SOT-89 Geometry
.087 .045
.035
.087
.035
.059
.045
.039 .039 .039
.020 .020
SOT-143 Geometry
.080 .040
Square
.040
.040 .080
.040
.050
.030
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
Small outline IC
The SOP (EIAJ) of devices , generally wider body than the JEDEC SOIC packages, includes 8-lead
through 42 lead package standard. The wider format, referred to as SO-L, SO-W or SO-X extends from 8
leads up to 36 leads. Carefully check manufacturers before beginning the design. The following
suggestions SMT land pattern design on SOIC and SOIC-W.
SO-8, 14, 16
.060 - .090
.050 typical
.200
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
JEDEC MS-012XX
Small out line package family. .150 inch body width.
.1497 - .1574
.050 typical
.013 - .020
.2284- .244
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Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
.225
.050 typical
.024
.150
.300
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Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
MO-120
Plastic small outline with .350 inch body width
.350 Nom.
.050 typical
.016 Mon.
.472 Mon.
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
.050 typical
.024
.532
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.3mm - 4.5mm
..65mm
.19 - .30mm
6.1mm - 6.7mm
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
4.3mm
.65mm
.40mm
7.72mm
20 Pin PLCC
Component Dimensions
5.78 - 6.53 mm
.33 - .53mm
9.78 - 10.03 mm
1.27mm
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
6.4mm
.60mm
10.8 mm
1.27mm
18.3mm
.3mm
.50mm
21.2mm
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
C
.
A .e1
Dim. VQ44 VQ64 HQ160 HQ208 VQ100 TQ144 TQ176 HQ240 HQ304
A .543 .530 1.258 1.258 .677 .914 1.071 1.386 1.702
B .401 .378 1.110 1.110 .535 .772 .929 1.244 1.560
C .20 .012 .016 .012 .012 .012 .012 .012 .012
Pitch .0315 .0197 .0256 .0197 .0197 .0197 .0197 .0197 .0197
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
JEDEC MO-150
Plastic Shrink Small Outline package (SSOP) 5.3 mm body width .65mm pitch.
5.3 mm/ .209
.65 mm / .0255
7.8 mm / .308
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
5.08mm / .200
.65 mm / .0255
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
MO-118
Plastic Shrink Small Outline package ; 48, 56 leads; body width 7.6 mm; .635 pitch.
7.6 mm / .299
.635 mm / .025
.3mm/.012
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Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
7.2mm/ .284
.635 mm / .025
11.94mm/ 470
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
.050 typical
.375
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
When routing one trace between pads, the manufacturers preferred line width and spacing technology
become a limiting factor.
When routing two traces between pads, 5 mil traces and 5mil spaces are required for 24 mil pad size.
For a 20-mil pad size, 6 mil traces and 6-mil spacing can be used. Either pad size is acceptable, so the
decision is primarily determined by the manufacturers preferred line width and spacing technology.
When larger trace widths are desired, another alternative is to route 5/5 or 6/6 (mil space/mil trace)
within the BGA pads, and then neck up to the larger trace widths once you have cleared the BGA
component.
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Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
usually beneficial to perform a paste inspection step, especially during early manufacturing runs. Whether
to use visual/microscope inspection, manual measurement, or invest in an automated system depends on
the volume to be run and the overall manufacturing philosophy.
7- Solder Stencil
The stencil thickness, as well as the etched pattern geometry, determines the precise volume of solder
alloy deposit onto the device land pattern. Stencil alignment accuracy and consistent solder volume
transfer is critical for uniform reflow-solder processing. Stencils are made of brass or stainless steel, with
stainless steel being more durable. Hole designs are dependent on the solder ball size, squeegee type,
board lay out and the paste used. There appears to be no single hole style that is used by everyone. There
are companies that are using square, diamond, round and oval shaped holes. Round holes are definitely
the dominant design. Many companies are promoting a stencil with a rounded corner, square hole with 5
tapered opening has been shown to be a good hole design to use BGAs 20 mil or smaller solder balls.
Thickness of stencils are usually in the 6 to 8 mil (.15 to .20mm) range. A squeegee durometer of 95 or
harder should be used. The blade angle and speed must be fine-tuned to ensure even paste transfer.
Ensuring proper stencil application is the most important factor with regards to reflow yields further on in
the process. The paste materials tend to dry out when not properly environmentally controlled.
It is also beneficial to use an opening at least as large as the mounting pad to give a wide placement
window. A typical design might be a 0.028 opening in a .006 thick stencil, going over a .024 pad on the
PCB with 30 mil solder balls.
The printing of small amounts of paste onto solder mask surrounding the pad had not proven to be a
problem in either yield or reliability.
8- Alignment
The pick and place accuracy governs the package placement and rotational alignment. Slightly misaligned
parts (less than 50% off the pad) typically automatically self-align during reflow> Self centering on the
pads is greatly reduced for grossly misaligned packages (greater than 50% off the pads) and may develop
electrical shorts, as a result of solder bridges, if they are subjected to reflow.
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Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
13- Underfill
The primary reason for underfill adhesive is to reduce the impact of mismatches in global thermal
expansion characteristics between the silicon die and underlying substrate. In more traditional chip on
board designs, these differences in coefficient of thermal expansion (CTE) are absorbed by the bond
wires and the die-attach adhesive. In direct attach designs, like flip chip, the stress are concentrated on the
solder balls.
Because the ball-array solder joints represent the weakest points in the die-attach structure, they are
inherently susceptible to failures during thermal expansion, which can result in functional failures of the
assembly. The use underfill adhesive can greatly reduce the incidence of such failures by simultaneously
adhering to the chip, solder balls and subtrate, thereby redistributing the thermal expansion tresses over
the entire chip area. By underfill the area between the chip and subtrate, the direct stresses on the solder
bump interconnects can be reduced significantly.
Secondary benefits from using underfill include increased mechanical stiffness to protect against
externally induced stress and strains such as flexing sharp impacts on the finished assembly. In addition,
voidless underfill encapsulation can provide added protection against moisture or other contaminants and
make assemblies easier to handle.
Thus far, underfill dispensing technologies have involved to provide solid process capabilities for a
variety of interconnect strategies, such as flip-chip and chip-scale packaging (CSP)
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Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
7- Reference Conditions for Drying Components That were Exposed to Conditions 60% RH
Package Thickness Level Bake @ 125C Bake @ 40C 5% RH
2a 4 hours 5 days
3 7 hours 11 days
1.4 mm 4 9 hours 13 days
5 10 hours 14 days
5a 14 hours 19 days
2a 18 hours 21 days
3 24 hours 33 days
2.0 mm 4 31 hours 43 days
5 37 hours 52 days
5a 48 hours 68 days
2a 48 hours 67 days
3 48 hours 67 days
4.0 mm 4 48 hours 68 days
5 48 hours 68 days
5a 48 hours 68 days
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TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
8- Default Baking Times Used Prior to Dry-Pack That were Exposed to Conditions 60% RH
Package Thickness Level Bake @ 125C Bake @ 150C
2a 8 hours 4 hours
3 16 hours 8 hours
1.4 mm 4 21 hours 10 hours
5 24 hours 12 hours
5a 28 hours 14 hours
2a 23 hours 11 hours
3 43 hours 21 hours
2.0 mm 4 48 hours 24 hours
5 48 hours 24 hours
5a 48 hours 24 hours
2a 48 hours 24 hours
3 48 hours 24 hours
4.0 mm 4 48 hours 24 hours
5 48 hours 24 hours
5a 48 hours 24 hours
Bake out times start when all components reach the specified temperature
Oxidation risk
Baking components may cause solder oxidation and/ or intermetallic growth, which excessive can result in
solderability problems during board assembly. The temperature and time for baking components are
therefore limited by solderability considerations. Unless otherwise indicated by supplier, one bake cycle is
allowable on finished component. If more than one bake cycle is needed, the supplier should be consulted.
INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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Released
TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
scale packages because there are no bond wires or interstitial laminates. The principle advantage of the
UCSP is that IC-to-PC board inductance is minimized. Secondary benefits are reduction in package size
and manufacturing cycle time and enhanced thermal conduction characteristics.
6 X 6 UCSP
SMD NSMD
Better control of the copper etch process, as compared to the solder-mask etch process in the SMD pad
definition, makes NSMD preferable. The SMD pad definition introduces stress concentration near the
solder-mask overlap region that result in the solder joints cracking under extreme fatigue conditions.
Smaller pad size in the NSMD definition provides more room for escape routing on PCB.
The NSMD design circular copper pad size should be .010 +2/-0 mils and solder mask openings should
be .013 +2/-0 mils. The PCB layout assumes 0.1mm (.004) trace width and 1oz copper layer thickness.
Copper pads should be finished with organic solderability preservative coating (OPS). For electroplated
nickel-immersion gold-finish pads, the gold thickness must be less than 0.5 micron to avoid making the
solder joints brittle.
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INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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Released
TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
X-Rays Inspection
Solder paste deposition using a stencil printing process involves pressurized application of solder paste
through predefined apertures. Three general methods exist for stencil fabrication
1- Chemical etching.
2- Laser cutting
3- Nickel plate-up.
While all three have advantages in stencil PCB component-attach manufacturing, not all are suitable for
generating fine pitch (0.5mm) bump-attach stencils. Chemical etching cannot support the fine geometries
and tolerances required for UCSP stencils and is not considered a viable process for producing them.
For laser-cut stencils a thin stainless steel foil is held flat while the apertures are cut with high powered
laser. The observed tight tolerances on aperture dimensions, combined with smooth sidewalls, makes laser
cutting stencils a desirable and popular process.
In the nickel plate-up process, the stencil is grown by plating nickel onto a mandrel through a patterned
dry film resist. This process also produces smooth sidewalls with tight shape and size tolerances.
However, this process requires patterning and plating equipment that may increase the cost of stencil
manufacturing.
The aperture design can be either square or round. In the case of square aperture openings the corners
must have at least a 50 micron radius. Temperature cycling board aperture design from .010 +2/-0 mils in
diameter. Stencil thickness was optimized to .005. It is recommended to offset apertures from the copper
pad to maximize separation between deposited solder paste to avoid bridging.
Component Placement.
UCSPs can be picked up and placed using standard Pick & place equipment. Minimum requirements of a
P&P system include a vision system to recognize and position the part and a mechanical system to
perform P&P operations. The placement accuracy of the system is dependent on either its vision system
that locates chip edges or on individual bump of the UCSP. Using the bump as the placement and
orientation reference tends to be accurate but is expensive and time consuming.
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INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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Released
TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
Both methods are acceptable because during solder reflow, the UCSP aligns due to the self-centering
feature of the solder joints. The maximum placement offset allowable during assembly is +/- 0.150mm
(.006) in the X and Y directions.
Why Underfill?
The primary reason for considering the use of underfill encapsulant is to reduce the impact of mismatches
in global thermal expansion characteristics between the silicon die and the underlying substrate to which it
is attached. With conventional chip packaging, these stresses are typically absorbed by the natural
flexibility of the wire leads. However, with direct-attach methods such as solder ball arrays, the solder
joints themselves represent the weakest points in the structure and therefore are the most susceptible to
stress failures. Unfortunately, they are also the most critical because a failure at any interconnect point
destroys the functionality of the circuit. By tightly adhering to the chip, solder balls and substrate, the
underfill material redistributes the stresses and strains from the coefficient of thermal expansion (CTE)
mismatch and mechanical shock over the entire chip area.
Secondary benefits from underfilling are protection against moisture and other forms of contamination.
On the negative side, the use of underfill adds cost to the manufacturing operation and makes rework
difficult. Because of this, many manufacturers conduct a quick functional test after reflow and prior to the
underfill operation.
INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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Released
TEP-005 - Design for Manufacturability/ Testability Guidelines INSERVCO, INC.
Rev: 6 P.O. Box 106,
Date: 5/15/01 110 Commerce Drive,
LaGrange, Ohio 44050
use underfill. However, there are a number of key factors that should be taken into account when
designing PCBs. Some of the critical factors include:
Differences in CTE between the die and substrate. Silicon has a CTE of 2.4 ppm; typical PCB
material has a CTE of 16 ppm. Ceramic materials can be designed to have a matching CTE but 95
percent Alumina ceramic has a CTE of 6.3 ppm. The need for underfill is greater on PCB-based
packages, although increased reliability has also been demonstrated on ceramic substrates. An
alternative approach is to use an interposer substrate, such as a high-CTE ceramic or flexible
material, as a shock absorber between the chip and the main substrate, which can mitigate the CTE
differences between PCB and silicon die.
Die size. Generally, the larger the die area, the greater the strain-induced problems. For example,
one study has shown that when die size increased from 6.4 to 9.5 mm, the number of temperature
2
cycles from -40 to 125C that the interconnect could tolerate decreased from 1,500 to 900 cycles.
Solder ball size and layout play a key role in the underfill evaluation because larger ball sizes, such
as those 300 in diameter that are typically used with CSPs, are more robust and can handle strain
better than the 75 diameter balls used with flip chips. Assuming the relative sheer strain
displacement of a two-member joint is similar for CSP and flip chip, then strain experienced by the
CSP solder joint is approximately a quarter of that experienced by a flip chip. Therefore, CSP
designers originally thought that the solder ball structure itself could handle the mechanical strains
associated with substrate and die thermal expansion. Subsequent studies 2 have shown underfill
offers a significant reliability benefit with CSPs, particularly in portable applications. On the
layout issue, some designers have found that increasing the size of the lands at the chip corners can
increase strain resistance, but this option is not always practical or sufficient to achieve reliability
goals.
System PCB thickness. Experience has shown that thicker PCBs are stiffer and resist bending
forces from impact shock more than thinner boards. For example, one analysis has demonstrated
that an increase of FR-4 substrate thickness from 0.6 to 1.6 mm could improve cycles-to-failure
from 600 to 900 cycles.3 Unfortunately, the reality in many of today's ultra-small devices is that it
is often impractical to increase substrate thickness. In practice, each doubling of substrate
thickness provides approximately a 2X improvement in reliability, but a doubling of die size
imposes a 4X degradation. 4
Use environment. In the final analysis, the overriding factors generally have to do with increasing
expectations for survivability. For example, it is becoming common for the specifications for hand-
held devices (cell phones, pagers, etc.) to call for normal functioning after thermal cycling between
-40 to 125C for 1,000 cycles and survivability after 20 to 30 drops from 1 m onto a concrete
floor.
Research on thermal cycling has shown that the use of underfill can provide a 2 to 4X increase in
the number of -40 to 125C temperature cycles that can be handled prior to exhibiting failure
modes, with some underfilled assemblies still not failing after as many as 2,000 cycles.5 When
weighed against the actual costs of field failures (e.g. returns, loss of reputation, etc.) for devices
exposed to increasingly harsh environments, many manufacturers are actively turning to underfill
as a reliability insurance policy.
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INSERVCO, INC, P.O. Box 106, 110 Commerce Drive, LaGrange, Ohio 44050
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