Journal of Manufacturing Processes 26 (2017) 5766

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Journal of Manufacturing Processes

journal homepage: www.elsevier.com/locate/manpro

Technical Paper

Experimental investigation of aluminiumcopper wire crimping with

electromagnetic process: Its advantages over conventional process
Ashish Kumar Rajak , Sachin D. Kore
Department of Mechanical Engineering, Indian Institute of Technology, Guwahati 781 039, India

a r t i c l e i n f o a b s t r a c t

Article history: Crimping of lugs to wire strands is a crucial part in electrical power transmission process. Improper design
Received 9 July 2016 increases the resistance of current ow through terminals and causes problems like power loss, spark
Received in revised form and heating in the joint. Which affect many industries like shipping, automobile, aerospace, satellite
24 December 2016
and communication where cable connections are used in large quantities. Electricity distribution boards
Accepted 20 January 2017
faces similar problems during generation due to improper connection. To overcome these problems in
conventional crimping process a new novel technique for effective wire crimping has been proposed in
Keywords:
this paper. A strong pulsed electromagnetic (EM) eld is used in wire crimping of aluminium connector
Electromagnetic (EM)
Wire crimping
terminal with copper wire. Experiments are carried out at different discharge voltages to demonstrates
Aluminium the feasibility of EM wire crimping process and to study the properties. With developed method, positive
Copper results were found from EM crimped samples. The gap between aluminium connector terminal and
Connector terminals copper wire was reduced by 70% than conventional process. The electrical resistance of EM process
was decreased by 34% than conventional one. Its pullout strength is 978 N higher. The surface nish is
improved as mean roughness value of 0.8 m. The hardness was reached up to 47 HV0.1 . X- ray diffraction
(XRD) technique was used to nd the residual stresses in EM and conventional crimped samples. Thermal
behavior is improved over conventional crimped process.
2017 The Society of Manufacturing Engineers. Published by Elsevier Ltd. All rights reserved.

1. Introduction Crimped connector terminals under various applications are

Reduction of weight with the help of cables and cable systems
in a car to further reduce the car weight besides using lightweight
car body materials will be a worthy challenge. Since, in a hybrid
power car, cables and cable systems can reduce the total weight of
the car upto 15 to 45 kg. The average length of copper cables used in
light weight cars is approximately 1650 m [1]. To make light weight
construction one can make use of aluminum lug instead of existing
copper lug in contact sites. This will help in reduction of weight and
it is an economical method without compromising the power loss.
Crimping is a process where cable is stripped and the strands of
the wire are placed into a common metal terminal. The terminal is
then compressed around the wire stands to ensure good electrical
contact between the terminal and the wire. Crimping of dissimilar
materials in order to achieve a durable joint is a difcult process and
important challenges for electricity boards, electrical industries,
shipping, automobiles, aviation, satellite and communication.
Corresponding author.
E-mail addresses: a.rajak@iitg.ac.in (A.K. Rajak), sdk@iitg.ac.in (S.D. Kore).
exposed to various types vibrations, temperature gradients and
different electrical environment. Study carried out on electrical
problems shows that more than 60% problems occurs in contact
area of connectors than any other technical problem [2]. The fatigue
and fracture failure, wear tear, increase in stress and energy losses
are caused on the terminal connectors when exposed to most of
the vibrations. Some important sources of vibrations in a vehicle
are mostly due to powertrain consisting of engine, differential sec-
tion and gear box. This severely affects the connector resistance
stability and durability [3].
The compression using conventional crimping tool deteriorates
the material due to relaxation or partly releasing. This results in
increase in resistivity and high amount of losses in wiring system
and battery power system [4,5]. An inhomogeneous stress distri-
bution is found in materials thereby increasing the critical notch
stresses, which reduces the transferable load [6].
Therefore, there is need to develop a new technique to make
contact joints between aluminum and copper in wiring system that
can give us a required strength with minimum power loss, more
uniform with no radial nor longitudinal misalignment so that it
can be benecial for industries where cable connections are used
in large numbers.

http://dx.doi.org/10.1016/j.jmapro.2017.01.009
1526-6125/ 2017 The Society of Manufacturing Engineers. Published by Elsevier Ltd. All rights reserved.
58 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766

Fig. 1. Equivalent circuit diagram for EM wire crimping process.

Table 1 in the overdamped condition [12]. The total energy that is stored
Geometry set-up and working conditions.
within the capacitor bank is given by:
Workpiece Outer diameter of terminal connector 12 mm
1
Inner diameter of terminal connector 10 mm Ec (t) = CV (t)2 (1)
Length of terminal connector 27 mm 2
Al conductivity 35 106 S/m where Ec (t)is the total energy stored in the capacitor bank (Joules)
Density 2.70 g/cm3
and C is the equivalent capacitance of the capacitor bank (farads)
Circuit condition Capacitor bank 90 F and E(t) is the charge voltage (volts). The stored energy of the capac-
Maximum voltage 15 kV itors is suddenly discharged by closing the high current switch
Circuit inductance 20 H
Circuit resistance 23 m
between the charged capacitors and the inductor. This generates a
current I(t), which is a damped sinusoidal oscillation [14]. The cur-
rent generates an electromagnetic eld that can be found according
to the rst of Maxwells Equations:
 H
 = J (2)
In comparison to other widely used joining techniques, like con-
ventional mechanical crimping, electromagnetic crimping shows where J is the current density and H is the electric eld. In Eq. (2),
interesting characteristics which results in uniform forming pres-  represents the curl operator. According to the second Maxwells
sure distribution [6,7]. The advantage of EM process including no Equations, a current is induced on the workpiece due to the elec-
contact, low mould cost, no lubrication and less spring back makes tromagnetic eld caused by the high frequency current on the coil.
it more suitable for materials that are difcult to form [8]. The ear- The magnetic ux density can be given as:
liest applications of electromagnetic crimping originate from the  B
=0
(3)
electrical industry. Examples are swaging of copper tubes to coax-

ial cables and joining of metal ttings to ceramic insulators [9]. where B is the magnetic ux density and B  = H.
 Also, is the
In 1996 Belvy et al. [10] found that the electrical resistance of EM curl operator. The induced current due to the ux density ows in
crimped cable connectors is up to 50% lower than those of pro- reverse direction to the coil current according to Lenzs law. The
duced by mechanical crimping. Since then no further published induced current generates Lorentz force on the workpiece which
research paper has been found in this eld. Although a large number may be expressed as:
of studies present EM forming as having a tremendous application
potential [8,11], but no research has been carried out in the eld of F = J B
 (4)
EM wire crimping process. For a particular number of turns (N), length of the coil (l), the
In this paper EM wire crimping is carried out with different developed magnetic eld increases with the increase in the dis-
parameters and analyzed with conventional crimping process. The charge coil current as illustrated in equation below.
intension of the present work is to develop a new method for wire
crimping that can be an alternative option for existing conventional NI
B= (5)
wire crimping method. The aim of this experiment is to give advan- l
tages in uniform lug deformation, minimum electrical resistance, For lesser skin depth magnetic pressure (P) is calculated by the
high pullout strength, good surface nish, increased hardness num- simplied equation as:
1 
ber and improved thermal property.
2
p (t) = Hgap (t) (6)
2
Which is deduced from the damped coil current from the
2. Theoretical background: electromagnetic crimping sinusoidal current. But when skin depth is considered magnetic
process pressure (P) is calculated using magnetic eld for various discharge
voltage using the equation illustrated below:
A high energy system that can discharge its energy within a very   
short period of time is required for Electromagnetic (EM) crimping B2 2t
P= 1e (7)
process. This is achieved using a high voltage capacitor bank which 2
is connected in series with the inductor (coil) as shown in Fig. 1. The 1
circuit parameters (the total inductance, capacitance and resistance =  (8)
of the circuit) should be selected such that, the RLC circuit operates f
 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766 59

Fig. 2. Different types of experimental coil used for the optimization process. (a) Coil 1, (b) Coil 2, (c) Coil 3 and (d) Coil 4.

The mentioned magnetic pressure distribution depends on the

skin depth as could be seen from Eq. (7). Discharge voltage (V) is
given by,

I C
V= (9)
k L
where (K) is the reversal factor, C and L are the machine capacitance
and inductance in RLC circuit.

3. Experimental work

3.1. Optimization of EM wire crimping coil

The EM wire crimping process utilizes a helical coil of copper

material in order to concentrate the magnetic eld. For carrying out
the experiments, dimensions of workpiece and EM specications
are included in Table 1.
It is very important to predict the optimal parameters of the
crimping coil to control the quality of wire crimp joints. Opti-
mization of parameters like pitch, coil length, number of turns Fig. 3. Change in radial deformation on variation of discharge energy for different
and diameter of cross-section of copper wire used are included in types of helical coil.

Table 2. Different coils used for optimization of the EM wire crimp-

ing process are shown in Fig. 2. High voltage insulation sleeve of
0.4 mm and 0.5 mm over the copper wires diameter of 4 mm and
5 mm was used for manufacturing of coil to maintain required gap
between to turns for optimization process.
Experiments were conducted using four different coil geome-
tries keeping all other process paramters constant as shown in
Fig. 3. The radial deformation was found to be maximum for coil
4, where maximum radial deformation of 3.4 mm was obtained for
9.6 kV discharge voltage. While for coil 1, coil 2, coil 3, maximum
radial deformation was found to be 3 mm, 3.1 mm and 2.9 mm for
the same discharge voltage.
It was found that the coil 4 produced the maximum deforma-
tion with uniformity along the axis. Hence, coil 4 which provided

Fig. 4. Five turn solenoidal coil used for carrying out experiments. (a) side view of the coil (b) sectional view of coil assembly consisting of Al lug and Cu strands.
60 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766
Table 2
Variation done in coil geometry and pitch for the optimization of coil.
Coil No. of turns Gap (mm) Standoff
Crossection distance (mm)
Dimater (mm)
Coil 1 4 4 1 0.5
Coil 2 4 5 0.8 0.6
Coil 3 5 4 1 0.6
Coil 4 5 5 0.8 0.5
Fig. 5. Variation in discharge energy for different discharge voltage.
the best results was used to carry out further experiments and
compared to conventional crimped samples.
After the optimization of coil, experiments were carried out at
various discharge energy to study the inuence of EM high strain
rate deformation process on wire crimping applications on various
parameters which are discussed in results and discussion section.
3.2. Experimental work carried out on optimized coil
A ve turn solenoidal copper coil 4 was used to carry out the
experiments. The side view of coil with xtures is shown in Fig. 4(a)
and cross-section view of assembled aluminum lug and copper wire
strands inside the copper coil as shown in Fig. 4(b).
Experiments were carried out at different voltages from 8.1 kV
to 9.6 kV for crimping the samples. The standoff distance of 0.5 mm
between the coil and the terminal connectors was kept constant
for different iterations of the experiment. Effective crimping of alu-
minium lugs over the copper wire strands was carried out between
the calculated (using Eq. (1)) processed energy of 2.9 kJ to 4.1 kJ.
Discharge energy for various discharge voltages is calculated and
shown in Fig. 5. And crimped samples are shown in Fig. 6.
With the increases in discharge voltage deformation of ter-
minal connector kept increasing due to increase in magnetic
pressure (Eqs. (5), (7), (9)). For 2.9 kJ, 3.0 kJ, 3.2 kJ, 3.4 kJ, 3.6 kJ,
3.9 kJ and 4.1 kJ of discharge energy outer diameter was found to
be 11.2 mm, 11.1 mm, 10.8 mm, 10.6 mm, 9.3 mm and 8.4 mm. At
discharge energy of 4.1 kJ maximum radial deformation of 3.4 mm
was obtained and as per the standard [13] of crimping of 35 mm2
a deformation of 3.34 mm is required to avoid damage inside the
terminal.
Coil length Inner diameter Maximum Remarks
(mm) of coil (mm) deformation
(mm)
20 13 3.0 Non uniform
24 13 3.1 Non uniform
25 13 2.9 Less deformation
and non uniform
29 13 3.4 Uniformity and
maximum
deformation
Variation of current with time was obtained from Cathode Ray
Oscilloscope which is shown in Fig. 7. The current wave form mea-
sures different parameters such as amplitude, frequency, rise time
and time interval. Frequency measured was calculated to be 20 kHz
which remained constant throughout the experiments and value of
current was found to be 127 kA for discharge energy of 2.8 kJ.
3.3. Conventional crimping
The commonly used crimp shape for cable lugs and connec-
tors is the hexagonal shaped crimp as this crimp prole is best
suitable for copper and aluminium conductors. The advantage of
a hexagonal shaped crimp is the uniformity of radial forces which
are applied consistently from all directions and over a whole area
during the crimping operation. Due to the uniform compression,
the hexagonal shaped crimp is mainly used for medium and high
voltage applications [15]. Hence, EM wire crimping process is
compared with standard hexagonal shaped crimping conventional
tool. Crimped samples for both processes were of same materials.
Crimped samples using conventional crimping tool are shown in
Fig. 8.
4. Results and discussions
4.1. Cross section analysis
Comparison of the cross section of electromagnetic and conven-
tional crimping process was done using upright optical microscope
at 20x. Images of the cross section are shown Fig. 9.
It was found that compression done using electromagnetic pro-
cess was more effective than conventional crimping process as
compression of wire strands was higher, giving denser compaction
of wire strands compared to conventional crimping where large gap
was observed. A gap of 50 m between the copper wire strand and
the aluminium lug exists, while in conventional crimping usually
a gap of 174 m exists between the wire strands and aluminium
lug contact surface. It was also observed that, due to uniform pres-
sure by EM process a uniform deformation of aluminium lug was
obtained compared to a conventional process.
4.2. Electrical characterization
It was important to know the type of circuit bridge to be used for
nding low resistance value. Modications in Wheatstone bridge
was done to obtain a Kelvin bridge, which was not only suitable for
measuring low value of resistance in microns but gave more precise
value compared to other available circuits [16,17].
As shown in Fig. 10, it was found that EM crimped samples gave
lower resistance value by 4.4  compared to conventional crimp-
ing samples. Increase in the discharge energy, resistance value kept
decreasing and became constant after 4.0 kJ due to denser com-
paction of copper wire and a minimum gap between the contact
surface. The effect of high impact velocity may result in cleaning
 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766 61

Fig. 6. Electromagnetic crimped samples at various discharge energy.

of oxide layer and moisture content between the contact surfaces.

Conventional crimped samples process had high value of resistance
comparatively as complete compression of wire strands using a
hexagonal crimp or standard crimping dies is not possible [15].
As the moisture and oxides always remain between the lug and
wire due to quasi static die compression process which results in
increase in the resistance.

4.3. Mechanical pull out testing

Comparison of pull out load value between electromagnetic and

Fig. 7. Damped current graph obtained in experiments (value of current was calcu-
lated as 127 kA for 2.8 kJ energy).
conventional crimping was carried out. Arrangement of pull out
process of a wire crimped sample is shown in Fig. 11.
Standard procedure for wire pull out test was carried out where
a transverse speed of 50 mm/min was maintained [18]. The length
of wire beyond the crimp terminal (a = 165 mm) and gripping length
(b = 15 mm) was maintained. For holding wire at one end, insulation
over the wire was stripped for effective gripping to prevent any slip.
A maximum pull-out load was obtained for EM crimped and con-
ventional crimped samples. Pull out value as shown in Fig. 12, for
2.9 kJ, 3.0 kJ and 3.2 kJ of discharge energy was found to be 685 N,
750 N and 913 N. These values are below the load value of 980 N
obtained for conventional crimping process. As per the crimping
standard [19] minimum pullout value for 35 mm2 crimped sample
is 801 N. The crimped samples obtained for 2.9 kJ and 3.0 kJ of dis-
charge energy due to lesser deformation are below the required
pullout value. As the discharge energy increases above 3.4 kJ to
4.1 kJ, value of pullout exceeds the conventional crimped sample.
Maximum value obtained for 4.1 kJ was found to be 1958 N which
is 978 N more than conventional crimped sample. This is due to the
increase in deformation with the increase in discharge energy and
uniform radial compaction as shown in Fig. 13. While in conven-
tional crimping process only terminal coming in contact with die
get crimp resulting in lesser pullout strength.

4.4. Surface roughness

The surface roughness was measured on the outer diameter of

the connector terminals which was deformed on the application of
magnetic pressure and conventional tool die pressure in crimping
process. It was measured using a surface prole meter. As shown in
Fig. 14, an average roughness value of 0.8 m on EM crimped sam-
ples while 2.4 m on conventional crimped sample. This improved
surface nish.
Fig. 8. Samples crimped using crimping tool. Since EM crimping is a contact less process whereas conven-
tional crimping is a die contact process where deterioration of the
62 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766

Fig. 9. Cross section images are taken under optical microscope for crimped samples. (a) compressed wire strands of conventional crimped sample (b) conventional sample
(c) gap between wire strands and compressed lug of conventional sample. (d) compressed wire strands of EM crimped sample. (e) EM sample (f) gap between wire strands
and compressed lug of EM sample.

Fig. 12. Comparison of pull out value between EM crimped sample and convention-
ally crimped sample.

Fig. 10. Comparison of resistance value for EM crimped and conventionally crimped
samples.

Fig. 11. Conguration of pullout test for connector terminal crimped over wires.
Fig. 13. Comparison of deformation of tube of EM crimped sample and conventional
crimped sample to initial sample.
surface results in increase in roughness value. It was found that
conventional crimping process leads to increases in surface rough-
ness due to contact between crimping tool and terminal connector. erated Lorentz force leading to a smoother surface with lower value
EM crimping process being contactless crimping process uses gen- of average surface number of 0.8 m.
 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766 63

Fig. 14. Surface roughness of the area exposed to crimping (a) EM crimped sample. (b) conventional crimped.

Fig. 15. Cross-section area for measuring Vickers hardness test (a) EM crimped sample. (b) conventional crimped.

Fig. 16. Vickers hardness value carried over the various points as shown in gure on EM and conventional crimped cross-section sample.

4.5. Hardness analysis
By adjusting the parameters of the EM eld compressive resid-
ual stress can be introduced along the surface to get peening effects
[20,21]. This compressive residual stresses due to electromagnetic
peening (EMP) keeps varying with the thickness of the workpiece.
The Vickers hardness test was carried across the cross sectioned
sample of EM and conventional crimped sample on different loca-
tions as shown in Fig. 15. For testing 100-g force is chosen.
It was observed from Fig. 16(a), in EM crimped sample the
hardness of connector terminal increases with the increase of the
discharge voltage. The hardness has a drastic rise moving away
from the contact surface. A largest value of 47 HV0.1 was obtained
for 4.14 kJ of discharge energy. In conventional process as shown in
Fig. 16(b) maximum value of 39.6 HV0.1 is obtained. Hardness value
was found to be higher by 7.4 HV0.1 for EM crimped value compared
to conventional crimped sample. Increase in hardness along the
thickness is due to more compressive residual stresses developed
by EM process compared to conventional crimped sample [16].
To nd the compressive residual stresses X-ray diffraction (XRD)
technique was used [22]. Residual stress analysis is determined
where only the peak shift occurs. As shown in Fig. 17 any change in
64 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766

Fig. 17. (a) XRD analysis of EM and conventional crimped sample and (b) enlarged image of 2 from 64 to 87 to distinguish the pick shift of EM and conventional sample
exposed to X Rays.

Fig. 18. Stress calculation from the slope obtained from the peak points from XRD data for (a) EM crimped sample and (b) Conventionally crimped sample.

Fig. 19. EM crimped lug and conventional crimped lug connected to a high power consumption source to study the variation of temperature over the lug surface. Temperature
reading was conducted using industrial infrared thermometer.

the lattice spacing, d, results in a corresponding shift in the diffrac- of the sample lying in the plane of diffraction, which contains the
tion angle 2. Measuring the change in the angular position of the incident and diffracted X-ray beams.
diffraction peak provides the data for calculation of residual stress
 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766
Williamson Hall method [23] was used to calculate induces
strain using the equation:
 k   
cos = + 4sin
d
Where d is the particle size, is the wavelength of radiation, is the
constant with value of 0.94, is the peak width, is strain induced
due to crystal distortion and is peak position. Here residual strain
was given by Y intercept and the value for EM crimped sample
and conventional crimped sample was found to be 0.00184 and
0.00162.
Applying Hookes law approximations residual stress was calcu-
lated:
 k   4sin 
cos = + (11)
d Y
Where is the stress of the crystal and Y is the modulus of elastic-
ity. This equation slope represents residual stress [22,23] as shown
in Fig. 18. Value of residual stresses for EM crimped sample and
conventional crimped sample was calculated to be 3.97259 MPa
and 3.02922 MPa. This increases in compressive residual stresses
Due to the higher compressive residual stress along the thickness
in EM crimping process it will improve the mechanical property
compared to conventional crimped sample.
4.6. Temperature measurement
In a circuit too high electrical current passage can cause over-
heated. This additional heat is detrimental to the integrity of the
termination means, conductor insulation and even the overcur-
rent protective device which transfers into the devices through the
terminals.
Excess heat could cause integrity issues. If there were loose ter-
minal connections, then:
a) The conductor might overheat and the conductor insulation
might break down. This could lead to a fault; typically line to
ground. Conductors of different potential were touching, the
insulation of both may deteriorate and a phase-to-neutral or
phase-to-phase fault might occur.
b) Arcing could occur between the conductor and lug. Since a poor
connection is not an overload or a short circuit, the overcurrent
protective device does not operate.
To conrm the temperature, rise in the terminals, test was car-
ried on EM crimped lug and conventional crimped lug, where both
the lugs were connected to a high power consumption device as
shown in Fig. 19. Test was carried out for 12 h where tempera-
ture of the terminals was measured periodically after 30 min using
infrared thermometer with a precision of 0.5 C.
Experiment was carried at controlled room temperature of
25 C. It was observed that temperature rise in both the terminal
connector took place as shown in Fig. 20. Near room temperature
the electrical resistance of the material increased linearly with ris-
ing temperature and the resistance equation is given by,
R = R0 (1 + C ( T ))
Where Ro is the initial resistance of the metal, C is temperature
coefcient of resistance (for Al it is 3.9 103 / C) and
T is the tem- EM crimped sample while in conventional process the value is
perature change. A rise in temperature was observed continuously
at an interval of 0.5 h, for EM crimped and conventional crimped
sample. It was found that after 12 h, the conventionally crimped
terminal connector surface temperature of 35 C was observed and
for EM crimped sample it was found to be 31 C. As the resistance
value is higher for conventionally crimped sample, it resulted in
higher heat (Hr ) dissipation compared to EM crimped sample with
65
(10)
Fig. 20. Temperature reading of EM crimped lug and conventional crimped connec-
tor terminal.
lower resistance value using. Heat produces in circuit is given by
Eq. (6).
Hr = I 2 Rt (13)
Where I is the current passing through wire and R is the resistance.
As rise in temperature even by 0.1 C is important in electronic,
power consumption circuit as it may lead to fatal. Temperature over
the EM crimped sample was found to be lower than the convention-
ally crimped sample due to the minimum change in resistance in
the contact area and lower heat dissipation making it more attrac-
tive option to conventional crimping process.
5. Conclusions
In present study comparison of electromagnetic crimping and
conventional crimping of aluminium lugs to copper wire was car-
ried out. The main summarized points are:
I Deformation of aluminium lug increased with the increased
discharge voltage but after 9.6 kV remains constant as further
radial deformation of aluminium lug is restricted by copper
strands.
II With this method of EM wire crimping average gap was reduced
by 70% as the conventional crimping was more up to 170 m.
However, the new method reduced this gap to 50 m.
III The resistance of EM crimped samples keep on decreasing with
the increased discharge energy and after 4.0 kJ, it remained
constant as 8.1 , which was lower by 34% compared to con-
ventional process.
IV The pullout strength increased with discharge energy and
further increased when energy is increased. A maximum of
1.958 kN had been observed for 4.14 kJ discharge energy while
conventionally crimped sample maximum value was found to
(12)
be 0.98 kN.
V The mean surface roughness value of 0.8 m was obtained in
more as 2.4 m. Lower value of surface roughness minimizes
power loss.
VI The hardness increased upto 47 HV0.1 for EM process while
the conventional process it was 39 HV0.1 . While in conven-
tional die crimping contact area exposed hardened with value
lower than EM crimped. XRD analysis of compressive residual
stresses which increases the hardness along the thickness of
66 A.K. Rajak, S.D. Kore / Journal of Manufacturing Processes 26 (2017) 5766
the crimped sample was found to be 23.7% more in EM crimped
samples.
VII Temperature over the EM crimped sample shows 30.5 C lower
than conventionally crimped process that is 34.5 C due to the
minimum change in resistance of the contact area and lower
heat dissipation. This is very important for high power trans-
mission applications.
Further work will be carried out for different materials for com-
mercial applications by numerical simulations to comprehend the
mechanism in detailed.
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