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Thermoelectric properties and efficiency measurements under large temperature

differences
A. Muto, D. Kraemer, Q. Hao, Z. F. Ren, and G. Chen

Citation: Review of Scientific Instruments 80, 093901 (2009); doi: 10.1063/1.3212668


View online: http://dx.doi.org/10.1063/1.3212668
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REVIEW OF SCIENTIFIC INSTRUMENTS 80, 093901 2009

Thermoelectric properties and efficiency measurements under large


temperature differences
A. Muto,1 D. Kraemer,1 Q. Hao,1 Z. F. Ren,2 and G. Chen1
1
Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge,
Massachusetts 02139, USA
2
Department of Physics, Boston College, Chestnut Hill, Massachusetts 02467, USA
Received 26 June 2009; accepted 4 August 2009; published online 1 September 2009
The maximum efficiency of a thermoelectric generator is determined by the materials
dimensionless figure of merit ZT. Real thermoelectric material properties are highly temperature
dependent and are often measured individually using multiple measurement tools on different
samples. As a result, reported ZT values have large uncertainties. In this work we present an
experimental technique that eliminates some of these uncertainties. We measure the Seebeck
coefficient, electrical conductivity, and thermal conductivity of a single element or leg, as well as the
conversion efficiency, under a large temperature difference of 2 160 C. The advantages of this
technique include 1 the thermoelectric leg is mounted only once and all measurements are in the
same direction and 2 the measured properties are corroborated by efficiency measurements. The
directly measured power and efficiency are compared to the values calculated from the measured
properties and agree within 0.4% and 2%, respectively. The realistic testing conditions of this
technique make it ideal for material characterization prior to implementation in a real thermoelectric
generator. 2009 American Institute of Physics. doi:10.1063/1.3212668

I. INTRODUCTION The second method is very time consuming, and both meth-
ods can result in large uncertainties in ZTT, often greater
Recent years have witnessed a trend of rising electricity than 10%.10
costs and an emphasis on energy efficiency. Thermoelectric TE power generators usually operate under large tem-
TE devices can be used either as heat pumps for localized perature differences up to hundreds of degrees centigrade. If
environmental control or heat engines for harvesting waste
ZT is temperature independent, the maximum efficiency max
heat, and such usages can potentially increase the overall of a TE element can be expressed as3,11
efficiency in many systems. For TE power generators to be
successful, research progress at the device level must be
made to validate materials and to guide system design.1
The performance of a TE material is characterized most TH TC
1 + ZT 1
max = 1
commonly by its so-called dimensionless figure of merit TH
1 + ZT + TC/TH
,

ZT = 2T / k or intrinsic ZT. The three temperature-


dependent properties or intrinsic properties T, T, and
kT are the Seebeck coefficient, electrical resistivity, and where TH is the hot side temperature and TC is the cold side
thermal conductivity, respectively, and T is the mean abso- temperature. However, since the intrinsic properties vary
lute temperature. The intrinsic properties are highly tempera- strongly with temperature along the length of the element or
ture dependent, and to measure each represents a formidable leg, Eq. 1 is not applicable and often numerical solutions
task. must be used to obtain the actual device efficiency.12 Further-
Typically one of two methods is used to characterize a more, in real TE applications additional effects must also be
TE material over a small temperature difference: 1 the Har- considered such as electrical contact resistance at the junc-
man method2 and 2 the three intrinsic properties are mea- tions of the TE legs and radiation losses from the leg side
sured independently over small temperature differences.3 walls.13,14
The original Harman method is used to measure T and In this work we develop methods to characterize a single
ZTT over small temperature differences.2,4 This technique TE leg operating under a large temperature difference. We
has many variations and has been applied to bulk modules aim to extract the three intrinsic properties of a single leg and
and thin films alike.5,6 The drawbacks are that it only works verify the results by comparing the predicted power conver-
over small temperature differences and requires adiabatic sion efficiency from the property measurements to the actual
boundary conditions that can be difficult to satisfy.7 The sec- measured efficiency. Such testing conditions provide a more
ond method uses different measurement systems for each realistic examination of actual TE device performance and
individual property.3,8,9 Often, all three properties are not should thus support the development and design of future TE
measured on the same sample or along the same direction. power generators.

0034-6748/2009/809/093901/7/$25.00 80, 093901-1 2009 American Institute of Physics


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093901-2 Muto et al. Rev. Sci. Instrum. 80, 093901 2009

QH I
A
d dT
k
dx dx
IT
d 2
dx
+ I sbPT4 T4 = 0,
A
4

TH x=0
with four terms on the left hand side representing the heat
- conduction, the Thompson heat, the Joule heat, and the ra-
diation loss. Here A is the cross sectional area, is the emis-
sivity, sb is the StephanBoltzmann constant, P is the pe-
VTE TE rimeter, and T is the ambient temperature. The leg is kept
Material under high vacuum 5 105 Torr such that natural convec-
tion and air conduction can be neglected.
+ x=L
TC
B. Device properties measurement under large T
QC I The measured device properties are the open circuit See-
beck voltage VS, the open circuit heat transfer rates QH,OC,
FIG. 1. Illustration of a p-type TE leg under working conditions.
QC,OC, and the electrical resistance of the leg R. Measuring
these device properties directly as a function of temperature
II. MATHEMATICAL FORMULATION enables us to determine the effective properties, and finally
solve for the intrinsic properties. In general VTE is composed
A. Governing equation of a Seebeck voltage and an Ohmic voltage drop. During the
Figure 1 is a general schematic of a p-type TE sample properties measurement I = 0, it follows from Eq. 3 that
under test, where the hot side heat transfer rate QH enters VTE = VS and is related to effTH , TC and T by
from the top at TH and the cold side heat transfer rate QC
exits the bottom at TC. The temperature is measured by ther-
mocouples, and T ranges from 2 C to 160 C. The elec- VSTH,TC = effTH,TCT = TC
TH
TdT. 5
trical current I enters from the top and exits through the
bottom of the sample, and VTE is the TE voltage measured
across the leg at the position of the thermocouples. We will Equation 4 is reduced to only the heat conduction and the
directly measure the energy balance over the sample, which radiation terms and can be solved to give expressions for
includes QH, QC, and the electric power Pe = IVTE. It will be keffTH , TC and kT
shown that since the temperature difference across the leg is
large it is useful to characterize the TE leg in terms of its
effective properties, resulting in an effective ZT, QH,OCTH,TC =
A
L
keffTH,TCT =
A
L

TC
TH
kdT + Qrad ,
ZTeffTH , TC. We define three classes of interrelated proper-
6
ties.


Device properties are the directly measurable values, in- TH
cluding the heat transfer rates, Seebeck voltage, and elec- A
QC,OCTH,TC = QH,OC Qrad,side = kdT + Qrad
trical resistance. L TC
Effective properties effTH , TC, keffTH , TC, and
Qrad,side . 7
effTH , TC are obtained directly from device properties
measurement when the hot side is at TH and cold side at
TC, or can be calculated by integrating the intrinsic prop- Here, Qrad is the additional heat transfer rate on the hot side
erties over the temperature interval. due to radiation from the side walls and Qrad,side is the total
Intrinsic properties T, T, and kT are properties of radiation loss from the side walls see Appendix. The geom-
the materials at each temperature as previously defined, etry of the leg was chosen to minimize the effects of radia-
which will be extracted from the effective properties. tion, where Qrad,side 2% of QH,OC and Qrad Qrad,side. The
heat transfer rates QH,OC and QC,OC are measured by a cali-
The constitutive relations for one-dimensional heat flux brated heater on the hot side and a heat flux sensor on the
q and current density J are as follows:15 cold side, which will be described in more detail in Sec. III.
dT The electrical resistance is measured by a four-wire ac
q = JT k , 2 method where VTE is the sense voltage.3 The resistance mea-
dx surement is applied in the limit that the current is small such
that the Joule heat term can be neglected and the modulation
1 dVTE dT
J= . 3 frequency is high such that the Peltier heat alternates sign
dx dx and cancels due to periodic heating and cooling at the junc-
An energy balance over a one-dimensional differential ele- tion. The electrical resistance R, is related to effTH , TC and
ment of a TE leg yields T by
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093901-3 Muto et al. Rev. Sci. Instrum. 80, 093901 2009


D. Effective ZT
dT L TC kdT
TC TH
L 1
RTH,TC = effTH,TC = , If we approximate TH TC = eff, then the Thomp-
A A TH dT A TTHkdT
C son heat term drops out and Eq. 9 can be written in terms
dx
of the effective properties. In the same way ZTT was de-
8
rived for intrinsic properties3,11 we can define ZTeffTH , TC
whereby we have neglected the radiation term to approxi- based on the effective properties,
mate the temperature gradient as dT / dx Q / kA, where Q
= A / LTTHkdT is the conducted heat, which is constant. eff
2
T V2ST/T
ZTeff = = . 14
effkeff
C
RQH
It can be used to solve for the maximum conversion effi-
C. Efficiency ciency Eq. 1 and maximum coefficient of performance of
a real device by using the conventional ZT formulas. Thus
Unlike the device properties measurement which is con-
ZTeff is a useful concept for the design engineer because it is
ducted under the open circuit condition, the efficiency
a measure of the TE material quality over a large T.
must be measured when electrical current flows through the
leg. The efficiency is defined as
Pe Pe III. EXPERIMENTAL SYSTEM
= = , 9
QH QC + Qrad,side + Pe Conceptually the experimental system is similar to that
shown in Fig. 1 but a few complications exist. One require-
where the electrical power output Pe can be obtained from ment for testing a TE sample is that the sample must be a
Eq. 3, device-ready leg with metallization on both ends. For
Pe = IVS I2R = IVTE . 10 Bi2Te3-based TE elements, the metallization material most
commonly used is Ni, and its purpose is to allow soldering
Power is produced when the voltage has increased in the with low electrical and thermal contact resistances while act-
direction of current flow. In this way we use a current source ing as a diffusion barrier.13 In the following analysis, no
to control I and measure VTE, another method would be to distinction is made between the intrinsic properties of the
measure the power dissipated over an adjustable resistor.16,17 bulk and the properties of the contact. If significant contact
Both methods are equally valid, but experimentally the cur- resistances are present, they will be automatically lumped
rent source method has many advantages. We integrate Eq. into the effective properties. Most samples that were mea-
4 twice with respect to x and apply the boundary conditions sured had electrical contact resistances estimated to be 5%
illustrated in Fig. 1 to solve for the temperature gradient. The of the total resistance. The sample was a Bi2Te3 p-type leg
temperature gradient is then used to evaluate QH and QC from Marlow Industries with dimensions of approximately
from Eq. 2, 1.6 1.6 1.6 mm3.
1 1 Figure 2a illustrates the system designed to measure
QC = ITCTC + QC,OC + I2R + I , 11 the device properties and energy conversion efficiency of the
2 2 TE leg. The system is composed of the following elements:
the hot assembly, the TE leg, the cold assembly, and the
1 1
QH = ITHTH + QH,OC I2R I , 12 surrounding vacuum chamber. The hot assembly is soldered
2 2 to the top of the leg and consists of a calibrated electrical
where the Thompson heat is written as heater providing QH, a thermocouple measuring TH, and an
electrode conducting I. The cold assembly is soldered to the
TH,TC = TC
TH
T
d
dT
dT. 13
cold side of the leg and consists of a copper heat spreader, a
thermocouple measuring TC, an electrode, a calibrated ther-
mopile type heat flux sensor measuring QC, and a heater used
Equations 11 and 12 appear similar to the constant prop- for calibration. The bottom side of the heat flux sensor is
erty heat transfer rate equations3,11,18 but remember that in mounted to a TE cooler module which was used in the effi-
this case, R and are the temperature integrated quantities ciency measurement to control TC independent of T in order
described above and QH,OC, QC,OC include the effects of to reduce heat losses at the cold assembly. The electrodes
sidewall radiation. The factors of 21 in front of the Joule heat supply current to the TE leg for the resistance and efficiency
and Thompson heat terms are the result of an approximation measurements and are controlled by an external power sup-
that assumes both heating terms are distributed uniformly ply. The entire assembly is contained in a vacuum chamber
throughout the material such that half goes to the hot side at a pressure of 5 105 Torr and a uniform ambient tem-
and half goes to the cold side. If , Td / dT are independent perature, T of 22 24 C.
of temperature then the factors of 21 are exact see Appendix. Prior to mounting the leg, the hot assembly was sus-
When solving for R during power generation we make a pended Fig. 2b and calibrated for heat loss. In this case
second approximation that the temperature gradient is de- the Joule heating IVHeater will be balanced by the radiation
fined by the intrinsic thermal conductivity alone as we have and conduction losses. The hot assembly electrode is very
done in Eq. 8. thin to minimize heat conduction losses but this means it
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093901-4 Muto et al. Rev. Sci. Instrum. 80, 093901 2009

Cryostat Chamber at T Cryostat Chamber at T


a) b) Hot Assembly
IVHeater IVHeater
Hot Assembly
TH TH
VTE I
TE IVHeater
TE TE
TC TC

HEATER
HEATER
HEATER
Cu Spreader I IVHeater Cu Spreader I
I
Cold Assembly Flux Sensor Cold Assembly Flux Sensor
Cu Spreader II Cu Spreader II
TE Cooler VFlux TE Cooler VFlux

Cold Finger Cold Finger

FIG. 2. Color online A schematic diagram of the a property and efficiency measurement system and b calibration procedure for the hot side heater and
the cold side heat flux sensor.

produces a relatively large unknown Joule heating term for complexity. Due to temperature drifts in the system, QC,OC
I 0 and thus QH cannot be accurately measured during the had larger uncertainties than QH,OC for small temperature
efficiency measurement. Radiation losses at the cold assem- differences where QC,OC 0.1 W. Therefore, during the
bly are negligibly small. The primary heat loss is from con- properties measurement, in order to capture the entire tem-
duction along the electrode, which is much thicker than the perature range from T of 2 C to 160 C, we use QH,OC
hot assembly electrode. In order to calibrate the flux sensor instead of QC,OC and allow TC to rise with increasing TH
the cold assembly electrode was disconnected from the out- Fig. 3.
side circuit. The voltage response of the flux sensor was Based on the integral relationship between the intrinsic
measured for different heat fluxes imposed by the calibration properties and the device properties, the intrinsic properties
heater, which is mounted to the side of the cold assembly. can be solved for by regression fitting or taking the numeri-
After the flux sensor calibration, the thermal conductance of cal derivative of the device properties. We found that the
the electrode was measured by mounting another heater to latter method was more accurate. The process can be under-
the end of the electrode and measuring the temperatures TE stood by considering an arbitrarily measured device property
and TC Fig. 2b, in which the radiation loss of the elec- YTH , TC and an intrinsic property yT related by


trode is negligible compared with the heat conduction along TH
the electrode. The electrical resistance between the positions YTH,TC = yTdT = fTH fTC, 15
of TE and TC was measured, which allows us to solve for the TC
Joule heating inside the electrode when I 0. We correct for where fT / T = yT. We take the derivative with respect to
Joule heating in QC but not in QH, therefore we rely only on T H,


QC during the efficiency measurement.
In our calibration it was found that heat losses from the dYTH,TC dfTH fTC dTC
= = yTH
hot assembly constituted about 10% of QH. At the cold as- dTH dTH TC TH dTH
sembly heat conduction loss was dominant to Joule heating
dTC
in the electrode, and the combined correction value consti- yTC , 16
tuted 3% of QC. We performed an energy balance over the dTH
leg such that Qrad,side = QH,OC QC,OC with T = 75 C and and evaluate the derivatives numerically. Taking the centered
solved for the emissivity. The obtained emissivity of = 0.6 40
agrees reasonably with Fourier transform infrared spectros-
Cold Side Temperature TC (C)

38
copy measurements from similar samples and in addition is
evidence that the heater and flux sensor have been accurately 36
calibrated. 34
32
IV. PROPERTY DATA ANALYSIS 30
The procedure for the properties measurement is to set a 28
constant heater power, wait for the system to reach steady 26
state, and then measure VS, QH,OC, and R from Sec. II B.
24
Then the heater power is reset and the properties are mea- 20 40 60 80 100 120 140 160 180 200
sured again for different values of TH and TC. Although it is
Hot Side Temperature TH (C)
possible to control the cooler module for each successive
heater power setting to keep TC constant, this increases FIG. 3. Cold side temperature vs hot side temperature during the device
steady state settling times considerably and adds unnecessary properties measurement.
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093901-5 Muto et al. Rev. Sci. Instrum. 80, 093901 2009

a) b)
250 2.6

Thermal Conductivity (W/mK)


keff(TH,TC)
Seebeck Coefficient (V/K)
240 2.4
k(T)
230
2.2
220
2.0
210
1.8
200
190 1.6
eff(TH,TC)
180 (T) 1.4

170 1.2
20 40 60 80 100 120 140 160 180 200 20 40 60 80 100 120 140 160 180 200
Temperature TH, T (C) Temperature TH, T (C)

c) d)
22
effTH,TC 1.0
20
(T)
Resistivity m

18 0.8

ZT
16
0.6
14
0.4 ZTeff(TH,TC)
12
ZT(T)

10 0.2
20 40 60 80 100 120 140 160 180 200 20 40 60 80 100 120 140 160 180 200

Temperature TH, T (C) Temperature TH, T (C)

FIG. 4. The four TE properties vs temperature and their respective effective properties vs hot side temperature: a Seebeck coefficient, b thermal
conductivity, c electrical resistivity, and d dimensionless TE figure of merit.

difference, we solve for the arbitrary property as a function ZT drops off with increasing temperature more rapidly than
of temperature
ZTeff due to the integral relationship between the intrinsic
Y TC and effective properties. This graph can be used by the de-
yTH = + yTC , 17
TH TH sign engineer to quickly determine the performance of a TE
generator made with this leg. For instance, given TH
where TH = TH,2 + TH,1 / 2 is the mean temperature of two
= 198 C and TC = 39 C Fig. 3, the leg should operate as a
consecutive measurements. We observe from Fig. 3 that
TC / TH 0.08 so it is important to evaluate the properties ZT = 0.64 material. To verify that the intrinsic property curves
accurately in the low temperature range because they will have been differentiated correctly we used the intrinsic prop-
also affect the higher temperature range. A linear regression
fit was applied to the first few measurement points in the
lower temperature range. 6
Maximum Efficiency (%)

5
V. PROPERTY RESULTS
4
Each of the intrinsic properties from Sec. II was evalu-
ated by taking the numerical derivative of the device prop- 3
erties following the procedures described in Sec. IV. Figures
2
4a4d plot T, T, kT, and ZTT as well as their
calculated Eq. (9)
respective effective properties as a function of TH. The mea- 1 calculated Eq. (1)
measured
sured effective properties are plotted as discrete points with
error bars while the intrinsic properties have been plotted as 0
0 20 40 60 80 100 120 140 160 180
linearly interpolated curves. The uncertainty was estimated
Temperature Difference T (C)
individually for each effective property point. The maximum
uncertainty values for eff, keff, and eff are approximately FIG. 5. Color online Maximum efficiency vs temperature difference across
0.7%, 0.9%, and 0.4%, respectively. Figure 4d shows that the leg for a cold side temperature of 24.5 C.
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093901-6 Muto et al. Rev. Sci. Instrum. 80, 093901 2009

a) b)
3.3 7.5 5.5 30

3.1 7.0 5.4 29

Efficiency (%)
Efficiency (%)

Power (mW)

Power (mW)
5.3 28
2.9 6.5

5.2 27
2.7 6.0

5.1 26
2.5 5.5
0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.2 1.3 1.4 1.5 1.6 1.7
Current (A) Current (A)

FIG. 6. Color online Efficiency and power vs current, the points with error bars are the measured values, the lines are calculated from the measured
properties using Eqs. 9 and 10. a Hot side temperature is 86 93 C, cold side is 24 25 C. b Hot side temperature is 169 172 C.

erties to solve for ZTeff at the same measured temperature VII. CONCLUSION
points as in Fig. 4d and found the relative difference to be In this work, we employ an effective property approach
0.2%. to model a single TE leg for power generation. We apply a
one-dimensional model considering temperature-dependent
material properties and side wall radiation loss. Using effec-
VI. EFFICIENCY RESULTS
tive properties, we are able to write approximate solutions
The goal of the efficiency measurement is to firmly es- for the power and efficiency, which are mathematically simi-
tablish what performance can be expected from the particular lar to the well-known constant property formulas. If the See-
leg and to compare these results to the calculated power and beck coefficient varies strongly over the operating tempera-
efficiency from the intrinsic properties measurement. The tures, the Thompson heat should be included in the efficiency
procedure was to apply a constant heater power and current, calculation for most accurate results.
measure the steady state QC, Pe, and then repeat for another We developed an experimental technique capable of di-
current setting. The efficiency was measured at two different rectly measuring an energy balance over a single leg, with a
temperature ranges, the estimated uncertainty was less than large temperature difference ranging from 2 C to 160 C.
0.6%. The technique measures all three TE properties of a single
Figure 5 plots the maximum efficiency versus T for leg, in the same direction, with significantly less uncertainty
TC = 24.5 C. The solid curve is the calculated value from the than other methods. The measurements include the effects of
intrinsic property data using Eq. 9, the dotted curve is using temperature dependent properties, side wall radiation, and
Eq. 1 with the calculated ZTeff from Eq. 14 and the dis- contact resistance. Side wall radiation loss constituted 2%
crete points are measured values. Equations 1 and 9 show of the hot side heat transfer rate, but it is still a significant
excellent agreement for T 120 C, which confirms that it part of the energy balance considering that the power con-
is appropriate to characterize a material by ZTeff. The small version efficiency was 2.8%5.5%. The power and efficiency
divergence at high T reflects that T drops rapidly at high were directly measured and are within 0.4% and 2% of the
temperature and the assumption TH TC = eff, Eq. values calculated based on the property measurements.
14, is not well satisfied.
Figures 6a and 6b plot the measured and calculated ACKNOWLEDGMENTS
efficiency Eq. 9 versus current at both temperature The authors acknowledge financial support from MAS-
ranges. The calculated and measured powers are in excellent DAR for the efficiency measurement, DOE Grant No. DE-
agreement for both cases with a relative difference of 0.4% FG02-08ER46516 for the property measurement, and
for all measured points. The relative difference of measured KFUPM for modeling.
to calculated efficiency in Fig. 6a is 0.5%2.0% while that
for Fig. 6b is 0.1%0.3%. The larger relative difference of
efficiency in Fig. 6a is likely an indication of the larger APPENDIX
uncertainty in QC at small heat transfers rates. Integrating Eq. 4 once with respect to x gives


Recall that QH,OC and QC are independently measured x T x
quantities with independent calibrations. The property mea- dT I2
kA + dx I dT sbP T4 T4 dx
surement uses QH,OC and the efficiency measurement uses dx A 0 TH 0
QC. Therefore, the fact that the measured power and effi-
ciency are in excellent agreement with each other is convinc- + C1 = 0, A1
ing evidence that both have been measured accurately. This where = Td / dT is the Thompson coefficient and C1 is a
independent check feature is an important advantage of the constant of integration. We integrate a second time with re-
described technique. spect to x and apply the boundary conditions T x=0 = TH and
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093901-7 Muto et al. Rev. Sci. Instrum. 80, 093901 2009

T x=L = TC to solve for the integration constants


Qrad,side = sbP TC
T4 T4
dT
sbPL
TH
T4
dT I2
kA =
dx A
0
x
dx I T

TH
dT sbP 0
x
T4
TH dT
dx
T TC

T4 dx
A
L
TC

TH
kdT +
sbP
L

0
L x

0
T4
T4 dT. A5

T4 dxdx
I2

LA
0
L x

0
dxdx Both radiation quantities have been approximated by assum-
ing a linear temperature gradient.

+
I
L
TC

TH
T

TH
dTdT. A2
1
T. Hendricks, Engineering Scoping Study of Thermoelectric Generator
Systems for Industrial Waste Heat Recovery, U.S. Department of Energy,
2006.
After rearranging terms we solve for the temperature gradi- 2
T. C. Harman, J. H. Cahn, and M. J. Logan, J. Appl. Phys. 30, 1351
ent at the hot side 1959.


3
H. J. Goldsmid, Electronic Refrigeration Pion, London, 1986.
dT A TH
sbP L x
4
H. Iwasaki, M. Koyano, and H. Hori, Jpn. J. Appl. Phys., Part 1 41, 6606
kA = kdT + T4
dx TH L TC L 0 0
2002.


5
A. Satake, H. Tanaka, T. Ohkawa, T. Fujii, and I. Terasaki, J. Appl. Phys.
L0 x0dxdx 96, 931 2004.
T4 dxdx I2R 6
R. Venkatasubramanian, E. Siivola, T. Colpitts, and B. OQuinn, Nature
LL0 dx


London 413, 597 2001.
7
TTC TT dTdT
H. Iwasaki and H. Hori, Proceedings of the 24th International Conference
on Thermoelectrics (ICT 2005) IEEE, New York, 2005, pp. 513516.
I A3
H H
, 8
L. J. v. d. Pauw, Philips Res. Rep. 13, 1 1958.
LTTC dT 9
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10
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11
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14
T. Caillat, J. P. Fleurial, G. J. Snyder, and A. Borshchevsky, Proceedings
sbP TH TH
T4 T4 of the 20th International Conference on Thermoelectrics (ICT 2001),
Qrad = dTdT IEEE, New York, 2001, pp. 282285.
L TC T dT dT 15
N. W. Ashroft and N. D. Mermin, Solid State Physics Brooks/Cole Th-
dx dx omson Learning, 1976.


16
R. W. Diller and L. E. Bell, Proceedings of the 22nd International Con-
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17
P. M. Mayer, Department of Electrical Engineering and Computer Science
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