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Features Reliability
MTTF: 1.2 million device hours3
Micron 20nm MLC NAND Flash Static and dynamic wear leveling
RoHS-compliant package Uncorrectable bit error rate (UBER): <1 sector
SATA 6 Gb/s interface per 1015 bits read
TCG/Opal 2.0-compliant self-encrypting drive Low power consumption
(SED) 150mW TYP 4
Hardware-based AES-256 encryption engine Endurance: Total bytes written (TBW) Up to
ATA modes supported 500TB5
PIO mode 3, 4 Capacity6 (unformatted): 120GB, 240GB, 480GB,
Multiword DMA mode 0, 1, 2 960GB
Ultra DMA mode 0, 1, 2, 3, 4, 5 Mechanical
Industry-standard, 512-byte sector size support SATA connector: 5V 10%
Hot-plug/hot-remove capable 2.5-inch drive: 100.45mm x 69.85mm x 7.0mm
Power loss protection for data-at-rest Weight: 70g (MAX)
Device Sleep (DEVSLP), extreme low-power mode Secure firmware update with digitally signed firm-
Native command queuing support with 32-com- ware image
mand slot support Operating temperature
ATA-8 ACS2 command set compliant Commercial (0C to +70C)7
ATA security feature command set and password
Notes: 1. Typical I/O performance numbers as meas-
login support
ured fresh-out-of-the-box (FOB) using Iome-
Secure erase (data page) command set: fast and se-
ter with a queue depth of 32 and write
cure erase cache enabled.
Sanitize device feature set support 2. 4KB transfers used for READ/WRITE latency
Self-monitoring, analysis, and reporting technology values.
(SMART) command set 3. The product achieves a mean time to failure
Windows 8 drive telemetry (MTTF) based on population statistics not
Adaptive thermal monitoring relevant to individual units.
Power loss protection for data-at-rest 4. Active average power measured during exe-
Performance1, 2 cution of MobileMark with DIPM (device-
PCMark Vantage (HDD test suite score): Up to initiated power management) enabled.
80,000 5. Endurance may depend highly on the na-
Sequential 128KB READ: Up to 500 MB/s ture of the data stream from the host com-
Sequential 128KB WRITE: Up to 400 MB/s puter. See Endurance section for more de-
Random 4KB READ: Up to 80,000 IOPS tails.
Random 4KB WRITE: Up to 80,000 IOPS 6. 1GB = 1 billion bytes; formatted capacity is
READ/WRITE latency: 5ms/25ms (MAX) less.
7. Drive onboard temperature sensor.
Warranty: Contact your Micron sales representative
for further information regarding the product,
including product warranties.
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m500_2_5_ssd.pdf - Rev. G 8/14 EN 1 Micron Technology, Inc. reserves the right to change products or specifications without notice.
2013 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are subject to change by Micron without notice.
M500 2.5-Inch NAND Flash SSD
Features
MT FD D AV 120 M AZ - 1 AE 1 2 AB HA ES
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M500 2.5-Inch NAND Flash SSD
General Description
General Description
Microns solid state drive (SSD) uses a single-chip controller with a SATA interface on
the system side and 8-channels of Micron NAND Flash internally. Packaged in an HDD
replacement enclosure, the SSD integrates easily in existing storage infrastructures.
The SSD is designed to use the SATA interface efficiently during both READs and
WRITEs while delivering bandwidth-focused performance. SSD technology enables en-
hanced boot times, faster application load times, reduced power consumption, and ex-
tended reliability.
The self-encypting drive (SED) features a FIPS-compliant, AES-256 encryption engine,
providing hardware-based, secure data encryption, with no loss of SSD performance.
This SED follows the TCG/Opal specification for trusted peripherals.
When TCG/Opal features are not enabled, the device can perform alternate data en-
cryption by invoking the ATA security command-set encryption features, to provide full-
disk encryption (FDE) managed in the host system BIOS. TCG/Opal and FDE feature
sets cannot be enabled simultaneously.
The data encryption is always running; however, encryption keys are not managed and
the data is not secure until either TCG/Opal or FDE feature sets are enabled.
NAND
SSD NAND
SATA
controller
NAND
NAND
NAND
DRAM
buffer
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M500 2.5-Inch NAND Flash SSD
Logical Block Address Configuration
User Available
Total LBA Max LBA Bytes
Capacity Decimal Hexadecimal Decimal Hexadecimal (Unformatted)
120GB 234,441,648 DF94BB0 234,441,647 DF94BAF 120,034,123,776
240GB 468,862,128 1BF244B0 468,862,127 1BF244AF 240,057,409,536
480GB 937,703,088 37E436B0 937,703,087 37E436AF 480,103,981,056
960GB 1,875,385,008 6FC81AB0 1,875,385,007 6FC81AAF 960,197,124,096
Physical Configuration
Value
Specification Nom Max Unit
Height 7.00 mm
Width 69.85 mm
Length 100.45 mm
Unit weight 70 g
Insertion rating (cabled) 50 insert/remove cycles
Insertion rating (backplane) 500 insert/remove cycles
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M500 2.5-Inch NAND Flash SSD
Interface Connectors
Interface Connectors
The SATA signal segment interface cable has four conductors and three ground connec-
tions. As shown in Package Dimensions, the cable includes a 7-pin signal segment and a
15-pin power segment arranged in a single row with a 1.27mm (0.050in) pitch.
P1 S1
Power Signal
segment segment
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M500 2.5-Inch NAND Flash SSD
Performance
Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the capacity of the drive and the interface of the host. Addition-
ally, overall system performance can affect the measured drive performance. When
comparing drives, it is recommended that all system variables are the same, and only
the drive being tested varies.
Performance numbers will vary depending on the host system configuration.
For SSDs designed for the client computing market, Micron specifies performance in
FOB ("fresh-out-of-box") state. Data throughput measured in "steady state" may be
lower than FOB state, depending on the nature of the data workload.
For a description of these performance states and of Micron's best practices for per-
formance measurement, refer to micron.com/ssd.
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M500 2.5-Inch NAND Flash SSD
Reliability
Reliability
Microns SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 7: MTTF
Note: 1. The product achieves a mean time to failure (MTTF) of 1.2 million hours, based on popu-
lation statistics not relevant to individual units.
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M500 2.5-Inch NAND Flash SSD
Reliability
Endurance
Endurance for the SSD can be predicted based on the usage conditions applied to the
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficiency of the drive. The tables below show the drive lifetime for each
SSD capacity by client computing and sequential input and based on predefined usage
conditions.
Notes: 1. Total bytes written calculated with the drive 90% full.
2. SSD volatile write cache is enabled.
3. Access patterns used during reliability testing are 25% sequential and 75% random and
consist of the following: 50% are 4KiB; 40% are 64KiB; and 10% are 128KiB.
4. Host workload parameters, including write cache settings, IO alignment, transfer sizes,
randomness, and percent full, that are substantially different than the described notes,
may result in varied endurance results.
5. GB/day can be calculated by dividing the total bytes written value by (365 number of
years). For example: 72TB/5 years/365 days = 40 GB/day for 5 years.
Notes: 1. Endurance of Client SSDs in some data center applications can be maximized by imple-
menting workloads which are sequential when writing, with read-intensive access. Mi-
cron recommends no higher than 20% of input/output operations be writes.
2. SSD volatile write cache is enabled.
3. Micron recommends sequential writes in transfer sizes of 128KiB or integer multiples of
128KiB which are 4KiB-aligned. Contact Micron for details.
4. Host workload parameters, including write cache settings, IO alignment, transfer sizes,
randomness, and percent full, that are substantially different than the described notes,
may result in varied endurance results.
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M500 2.5-Inch NAND Flash SSD
Electrical Characteristics
Electrical Characteristics
Environmental conditions beyond those listed may cause permanent damage to the de-
vice. This is a stress rating only, and functional operation of the device at these or any
other conditions above those indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect reliability.
Notes: 1. Temperature is best measured by reading the SSD's on-board temperature sensor, which
is recorded in SMART attribute 194 (or 0xC2).
2. Power-off sequence: When the SSD is shut down, the ATA STANDBY IMMEDIATE (STBI)
command should be the last command sent by the host and acknowledged by the SSD.
Failure to follow this process might result in a longer than normal time-to-ready (TTR)
during the subsequent power-on sequence. TTR is the time from power-on to drive
ready to accept SATA commands.
Parameter/Condition Specification
Non-operating shock 1500G/0.5ms
Non-operating vibration 5800Hz @ 3.13G
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M500 2.5-Inch NAND Flash SSD
Adaptive Thermal Monitoring
Register
Feature Set 7 6 5 4 3 2 1 0
Feature 10h
Sector count 08h
Sector number FFh
Cylinder low FFh
Cylinder high xx
Drive head xx
Command EFh
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M500 2.5-Inch NAND Flash SSD
Adaptive Thermal Monitoring
Register
Feature Set 7 6 5 4 3 2 1 0
Feature 0x90h
Sector count 0x8h
Sector number 0xFFh
Cylinder low 0xFFh
Cylinder high xx
Drive head xx
Command 0xEFh
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M500 2.5-Inch NAND Flash SSD
TCG/Opal Support
TCG/Opal Support
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M500 2.5-Inch NAND Flash SSD
TCG/Opal Support
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M500 2.5-Inch NAND Flash SSD
TCG/Opal Support
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M500 2.5-Inch NAND Flash SSD
TCG/Opal Support
IEEE1667
Probe Silo Supported
TCG Storage Silo Supported
Other than Probe and TCG Storage Silo Not Supported
IEEE1667 Major Version TBD As per current draft specification, major and minor
versions are not yet decided
IEEE1667 Minor Version TBD
Maximum P_OUT Transfer Size 131072 256 sectors (128K)
Others
FDE (ATA Security with Key Management) Yes
Secure Firmware Download Supported Firmware image is validated by using SHA256 and
RSA2048 algorithm (FIPS-compliant; certification
pending)
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M500 2.5-Inch NAND Flash SSD
Device ID
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
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Device ID
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M500 2.5-Inch NAND Flash SSD
Device ID
Note: 1. F = The content of the word is fixed and does not change.
V = The content of the word is variable and may change depending on the state of the
device or the commands executed by the device.
X = The content of the word may be fixed or variable.
R = The content of the word is reserved and will be zero.
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M500 2.5-Inch NAND Flash SSD
Commands
Commands
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M500 2.5-Inch NAND Flash SSD
Commands
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M500 2.5-Inch NAND Flash SSD
Commands
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M500 2.5-Inch NAND Flash SSD
Compliance
Compliance
Micron SSDs comply with the following:
RoHS green
CE (Europe): EN55022, 2006 Class B and EN55024, 1998 + A1: 2001 + A2:2003
FCC: CFR Title 47, Part 15, ICES-003, all Class B
UL (US): approval to UL-60950-1, 2nd Edition, 2007-03-27, IEC 60950-1:2005, 2nd Ed-
ition
BSMI (Taiwan): approval to CNS 13438
C-TICK (Australia, New Zealand): approval to AS/NZS CISPR22
KCC RRL (Korea): approval to KCC MU2-C30025, KCC MU2-C30018 Class B
W.E.E.E.: Compliance with EU WEEE directive 2002/96/EC. Additional obligations
may apply to customers who place these products in the markets where WEEE is en-
forced.
TUV (Germany): approval to IEC60950/EN60950
VCCI
IC (Canada):
- This Class B digital apparatus complies with Canadian ICES-003.
- Cet appareil numrique de la classe B est conforme la norme NMB-003 du Canada.
FCC Rules
This equipment has been tested and found to comply with the limits for a Class B digital
device, pursuant to part 15 of the FCC Rules. These limits are designed to provide rea-
sonable protection against harmful interference in a residential installation. This equip-
ment generates, uses, and can radiate radio frequency energy and, if not installed and
used in accordance with the instructions, may cause harmful interference to radio com-
munications. However, there is no guarantee that interference will not occur in a partic-
ular installation. If this equipment does cause harmful interference to radio or televi-
sion reception, which can be determined by turning the equipment off and on, the user
is encouraged to try to correct the interference by one or more of the following meas-
ures:
Reorient or relocate the receiving antenna.
Increase the separation between the equipment and the receiver.
Connect the equipment into an outlet on a circuit different from that to which the re-
ceiver is connected.
Consult the dealer or an experienced radio/TV technician for help.
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M500 2.5-Inch NAND Flash SSD
Package Dimensions
Package Dimensions
13.43mm/0.529in
for reference only
4.80mm 0.38
0.189in 0.015
6.90mm +0.10
0.40
0.272in +0.004
0.016
3.50mm 0.38 3.00mm
0.138in 0.015 14.00mm D&T M3X0.5
%CL connector %CL drive 0.551in (2 PLCS) 0.118in
(both sides) (both sides) (2 PLCS)
(both sides)
90.60mm
3.567in (both sides)
100.50mm/3.957in
for reference only
0.30mm/0.012in D&T M3X0.5 4.07mm
for reference only (4 PLCS) 0.160in
69.85mm 0.25
2.750in 0.010
61.72mm
2.430in
9.40mm
0.370in 2.6mm RAD
0.10in
14.00mm (4 PLCS)
0.551in
90.60mm
3.567in
100.20mm 0.25
3.945in 0.010
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M500 2.5-Inch NAND Flash SSD
References
References
Serial ATA: High-speed serialized AT attachment, Serial ATA working group, available
at www.sata-io.org
SATA 3.1 GOLD, and the following:
DEVSLP, SATA31_TPR_C108 rev. 1.0a 10/24/2011
SATA TP #37, Standard SATA Connector 3.3V Power Pin Assignments, Rev. 1.1
10/12/2011
SATA TP #39, DEVSLP Assignment on Standard SATA Connector, Rev. 01 01/02/12
ATA-8 ACS2 (T13/2015-D, Revision 4), and the following:
Device Internal Logs (supports SSD Telemetry)
IDFY Device Data Logs (supports DEVSLP)
TCG Storage Security Subsystem Class Opal; Specification 2.00 Revision 1.00, Feb 24,
2012
TCG Core Specification; Specification 2.00 Revision 2.00, Nov 4, 2011
TCG Storage Interface Interactions: Specification Version 1.02 Revision 1.00 30 De-
cember, 2011
IEEE-1667: "Standard Protocol for Authentication in Host Attachments of Transient
Storage Devices"
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M500 2.5-Inch NAND Flash SSD
Revision History
Revision History
Rev. G 8/14
Added note 2 and note 4 to Table 8: Drive Lifetime Client Computing
Added note 2 and note 4 to Table 9: Drive Lifetime Sequential Input
Rev. F 6/14
Removed the AW = 2.5-inch (5mm) drive form factor from the Part Number Chart
Rev. E 9/13
Added a power cycle note to thermal monitoring
Rev. D 7/13
Revised thermal monitoring.
Rev. C 5/13
Changed endurance data and added an endurance footnote on cover page.
Revised part number chart.
Revised and divided the drive lifetime table into two tables, a client computing table
and a sequential input table, with new data for these table categories.
Rev. B 2/13
Status changed from Preliminary to Production.
Updated Physical Configuration section.
Updated Electrical Characteristics section.
Rev. A 1/13
Initial release.
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