Você está na página 1de 8

a High Performance 4/8 Channel

Fault-Protected Analog Multiplexers


ADG438F/ADG439F*
FEATURES FUNCTIONAL BLOCK DIAGRAMS
Fast Switching Times
tON 250 ns max
ADG438F ADG439F
tOFF 150 ns max
Fault and Overvoltage Protection (40 V, +55 V) S1 S1A
All Switches OFF with Power Supply OFF DA
S4A
Analog Output of ON Channel Clamped Within Power
Supplies If an Overvoltage Occurs D
Latch-Up Proof Construction
S1B
Break Before Make Construction
DB
TTL and CMOS Compatible Inputs S8 S4B

APPLICATIONS 1 OF 8 1 OF 4
Data Acquisition Systems DECODER DECODER

Industrial and Process Control Systems


Avionics Test Equipment
A0 A1 A2 EN A0 A1 EN
Signal Routing Between Systems
High Reliability Control Systems

GENERAL DESCRIPTION PRODUCT HIGHLIGHTS


The ADG438F/ADG439F are CMOS analog multiplexers, the 1. Fault Protection.
ADG438F comprising 8 single channels and the ADG439F The ADG438F/ADG439F can withstand continuous volt-
comprising four differential channels. These multiplexers pro- age inputs up to 40 V or +55 V. When a fault occurs due
vide fault protection. Using a series n-channel, p-channel, n- to the power supplies being turned off, all the channels
channel MOSFET structure, both device and signal source are turned off and only a leakage current of a few nano-
protection is provided in the event of an overvoltage or power amperes flows.
loss. The multiplexer can withstand continuous overvoltage 2. ON channel turns OFF while fault exists.
inputs from 40 V to +55 V. During fault conditions, the multi-
3. Low RON.
plexer input (or output) appears as an open circuit and only a
few nanoamperes of leakage current will flow. This protects not 4. Fast Switching Times.
only the multiplexer and the circuitry driven by the multiplexer, 5. Break-Before-Make Switching.
but also protects the sensors or signal sources which drive the Switches are guaranteed break-before-make so that input
multiplexer. signals are protected against momentary shorting.
The ADG438F switches one of eight inputs to a common out- 6. Trench Isolation Eliminates Latch-up.
put as determined by the 3-bit binary address lines A0, A1 and A dielectric trench separates the p- and n-channel MOSFETs
A2. The ADG439F switches one of four differential inputs to a thereby preventing latch-up.
common differential output as determined by the 2-bit binary
address lines A0 and A1. An EN input on each device is used to 7. Improved OFF Isolation.
enable or disable the device. When disabled, all channels are Trench isolation enhances the channel-to-channel isolation
switched OFF. of the ADG438F/ADG439F.

*Patent Pending.

REV. D
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
which may result from its use. No license is granted by implication or Tel: 781/329-4700 World Wide Web Site: http://www.analog.com
otherwise under any patent or patent rights of Analog Devices. Fax: 781/326-8703 Analog Devices, Inc., 2000

This datasheet has been downloaded from http://www.digchip.com at this page


ADG438F/ADG439FSPECIFICATIONS1
Dual Supply (VDD = +15 V, VSS = 15 V, GND = 0 V, unless otherwise noted)
B Version
40C to 40C to
Parameter +25C +85C +105C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range VSS + 1.2 VSS + 1.2 V min
VDD 0.8 VDD 0.8 V max
RON 400 400 max 10 V < VS < +10 V, IS = 1 mA;
RON 5 5 % max 5 V < VS < +5 V, IS = 1 mA;
RON Drift 0.6 %/C typ VS = 0 V, IS = 1 mA
RON Match 3 3 3 % max VS = 10 V, IS = 1 mA
LEAKAGE CURRENTS
Source OFF Leakage IS (OFF) 0.01 nA typ VD = 10 V, VS = 10 V;
0.5 2 5 nA max Test Circuit 2
Drain OFF Leakage ID (OFF) 0.01 nA typ VD = 10 V, VS = 10 V;
ADG438F 0.5 5 30 nA max Test Circuit 3
ADG439F 0.5 5 15 nA max
Channel ON Leakage ID , IS (ON) 0.01 nA typ VS = VD = 10 V;
ADG438F 0.5 5 30 nA max Test Circuit 4
ADG439F 0.5 5 15 nA max
FAULT
Output Leakage Current 0.02 nA typ VS = 33 V, +33 V or +50 V, VD = 0 V, Test Circuit 3
(With Overvoltage) 0.1 2 10 A max
Input Leakage Current 0.005 A typ VS = 25 V, VD = 10 V, Test Circuit 5
(With Overvoltage) 0.1 1 2 A max
Input Leakage Current 0.001 A typ VS = 25 V, VD = V EN = A0, A1, A2 = 0 V
(With Power Supplies OFF) 0.1 1 4 A max Test Circuit 6
DIGITAL INPUTS
Input High Voltage, VINH 2.4 2.4 V min
Input Low Voltage, VINL 0.8 0.8 V max
Input Current
IINL or IINH 1 1 A max VIN = 0 or V DD
CIN, Digital Input Capacitance 5 pF typ
DYNAMIC CHARACTERISTICS2
tTRANSITION 170 ns typ RL = 1 M, C L = 35 pF;
220 300 320 ns max VS1 = 10 V, V S8 = 10 V; Test Circuit 7
tOPEN 10 10 10 ns min RL = 1 k, CL = 35 pF;
VS = +5 V; Test Circuit 8
tON (EN) 200 ns typ RL = 1 k, CL = 35 pF;
250 300 300 ns max VS = +5 V; Test Circuit 9
tOFF (EN) 110 ns typ RL = 1 k, CL = 35 pF;
150 180 180 ns max VS = +5 V; Test Circuit 9
tSETT, Settling Time
0.1% 0.5 0.5 s typ RL = 1 k, CL = 35 pF;
0.01% 1.7 1.7 s typ VS = +5 V
Charge Injection 4 pC typ VS = 0 V, RS = 0 , CL= 1 nF; Test Circuit 10
OFF Isolation 80 dB typ RL = 1 k, CL = 15 pF, f = 100 kHz;
VS = 7 V rms; Test Circuit 11
Channel-to-Channel Crosstalk 85 dB typ RL = 1 k, CL = 15 pF, f = 100 kHz;
VS = 7 V rms; Test Circuit 12
CS (OFF) 5 pF typ
CD (OFF)
ADG438F 50 pF typ
ADG439F 25 pF typ
POWER REQUIREMENTS
IDD 0.05 mA typ VIN = 0 V or 5 V
0.15 0.25 0.25 mA max
ISS 0.01 mA typ
0.02 0.04 0.04 mA max
NOTES
1
Temperature range is as follows: B Version: 40C to +105C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.

2 REV. D
ADG438F/ADG439F
ABSOLUTE MAXIMUM RATINGS* Table I. ADG438F Truth Table
(TA = +25C unless otherwise noted)
VDD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44 V A2 A1 A0 EN ON SWITCH
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +25 V X X X 0 NONE
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to 25 V 0 0 0 1 1
VEN, VA Digital Input . . . . . . . 0.3 V to VDD + 2 V or 20 mA, 0 0 1 1 2
Whichever Occurs First 0 1 0 1 3
0 1 1 1 4
VS, Analog Input Overvoltage with Power ON . . . . . VSS 25 V
1 0 0 1 5
to VDD + 40 V 1 0 1 1 6
VS, Analog Input Overvoltage with Power OFF 1 1 0 1 7
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40 V to +55 V 1 1 1 1 8
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 20 mA
X = Dont Care
Peak Current, S or D
(Pulsed at 1 ms, 10% Duty Cycle max) . . . . . . . . . . . 40 mA
Table II. ADG439F Truth Table
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . 40C to +105C A1 A0 EN ON SWITCH PAIR
Storage Temperature Range . . . . . . . . . . . . . 65C to +150C
X X 0 NONE
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150C 0 0 1 1
Plastic Package 0 1 1 2
JA, Thermal Impedance . . . . . . . . . . . . . . . . . . . . 117C/W 1 0 1 3
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +260C 1 1 1 4
SOIC Package X = Dont Care
JA, Thermal Impedance
Narrow Body . . . . . . . . . . . . . . . . . . . . . . . . . . . 125C/W
Wide Body . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90C/W
ADG438F/ADG439F PIN CONFIGURATIONS
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215C DIP/SOIC DIP/SOIC
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220C
*Stresses above those listed under Absolute Maximum Ratings may cause perma- A0 1 16 A1 A0 1 16 A1
nent damage to the device. This is a stress rating only; functional operation of the EN 2 15 A2 EN 2 15 GND
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating VSS 3 14 GND VSS 3 14 VDD
conditions for extended periods may affect device reliability. Only one absolute S1 4 ADG438F 13 VDD S1A 4 ADG439F 13 S1B
maximum rating may be applied at any one time. TOP VIEW TOP VIEW
S2 5 (Not to Scale) 12 S5 S2A 5 (Not to Scale) 12 S2B
S3 6 11 S6 S3A 6 11 S3B
S4 7 10 S7 S4A 7 10 S4B
ORDERING GUIDE
D 8 9 S8 DA 8 9 DB

Model Temperature Range Package Option*


ADG438FBN 40C to +105C N-16
ADG438FBR 40C to +105C R-16N
ADG439FBN 40C to +105C N-16
ADG439FBR 40C to +105C R-16N
ADG439FBRW 40C to +105C R-16W
*N = Plastic DIP; R-16N = 0.15" Small Outline IC (SOIC); R-16W = 0.3"
Small Outline IC (SOIC).

CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. WARNING!
Although the ADG438F/ADG439F features proprietary ESD protection circuitry, permanent
damage may occur on devices subjected to high energy electrostatic dischar ges. Therefore, proper
ESD SENSITIVE DEVICE
ESD precautions are recommended to avoid performance degradation or loss of functionality.

REV. D 3
ADG438F/ADG439F
TERMINOLOGY
Typical Performance Graphs
VDD Most positive power supply potential.
VSS Most negative power supply potential.
2000
GND Ground (0 V) reference.
TA = +258C
1750
RON Ohmic resistance between D and S.
RON RON variation due to a change in the analog 1500
input voltage with a constant load current.
1250
VDD = +5V
RON Drift Change in RON when temperature changes

RON V
VSS = 5V
1000
by one degree Celsius.
RON Match Difference between the RON of any two 750

channels.
500 VDD = +10V
IS (OFF) Source leakage current when the switch is VSS = 10V
250
off. VDD = +15V
VSS = 15V
ID (OFF) Drain leakage current when the switch is off. 0
15 10 5 0 5 10 15
VD (VS) Volts
ID, IS (ON) Channel leakage current when the switch is
on. Figure 1. On Resistance as a Function of VD (VS)
VD (VS ) Analog voltage on terminals D, S.
CS (OFF) Channel input capacitance for OFF 1m
condition. VDD = 0V
100m VSS = 0V
CD (OFF) Channel output capacitance for OFF VD = 0V
10m
condition.
IS INPUT LEAKAGE A

CD, CS (ON) ON switch capacitance. 1m

100n
CIN Digital input capacitance.
OPERATING RANGE
tON (EN) Delay time between the 50% and 90% points 10n

of the digital input and switch ON 1n


condition.
100p
tOFF (EN) Delay time between the 50% and 90% points
10p
of the digital input and switch OFF
condition. 1p
50 40 30 20 10 0 10 20 30 40 50 60
tTRANSITION Delay time between the 50% and 90% points VIN INPUT VOLTAGE Volts

of the digital inputs and the switch ON Figure 2. Input Leakage Current as a Function of VS
condition when switching from one address (Power Supplies OFF) During Overvoltage Conditions
state to another.
tOPEN OFF time measured between 80% points of
both switches when switching from one 1m
address state to another. 100m
VDD = +15V
VSS = 15V
VINL Maximum input voltage for Logic 0. 10m VD = 0V
ID OUTPUT LEAKAGE A

VINH Minimum input voltage for Logic 1.


1m
IINL (IINH) Input current of the digital input.
100n
Off Isolation A measure of unwanted signal coupling OPERATING RANGE
10n
through an OFF channel.
1n
Charge Injection A measure of the glitch impulse transferred
from the digital input to the analog output 100p

during switching. 10p


IDD Positive supply current. 1p
50 40 30 20 10 0 10 20 30 40 50 60
ISS Negative supply current. VIN INPUT VOLTAGE Volts

Figure 3. Output Leakage Current as a Function of V S


(Power Supplies ON) During Overvoltage Conditions

4 REV. D
ADG438F/ADG439F
2000 100

1750
VDD = +15V
VDD = +15V VSS = 15V
1500 VSS = 15V 10

LEAKAGE CURRENTS nA
VD = +10V
VS = 10V
1250 ID (OFF)
RON V

1000 1

750 IS (OFF)

500 +1058C 0.1


+858C
ID (ON)
250
+258C
0 0.01
15 10 5 0 5 10 15 25 35 45 55 65 75 85 95 105
VD (VS) Volts TEMPERATURE 8C

Figure 4. On Resistance as a Function of VD (VS) for Figure 7. Leakage Currents as a Function of Temperature
Different Temperatures

1m 260

VDD = +15V VIN = +2V


100m 240
VSS = 15V
VD = 0V
10m
220
IS INPUT LEAKAGE A

1m tON (EN)
200
100n
t ns
180
10n
OPERATING RANGE 160 tTRANSITION
1n
140
100p tOFF (EN)
10p 120

1p 100
50 40 30 20 10 0 10 20 30 40 50 60 10 11 12 13 14 15
VS INPUT VOLTAGE Volts VSUPPLY Volts

Figure 5. Input Leakage Current as a Function of VS Figure 8. Switching Time vs. Power Supply
(Power Supplies ON) During Overvoltage Conditions

0.3 280
VDD = +15V
VDD = +15V 260
VSS = 15V
0.2 VSS = 15V VIN = +5V
240
LEAKAGE CURRENTS nA

TA = +258C tON (EN)


IS (OFF) 220
0.1
ID (OFF) 200
t ns

tTRANSITION
180
0.0
160
ID (ON)
140
0.1
120
tOFF (EN)
0.2 100
14 10 6 2 2 6 10 14 25 45 65 85 105
VS, VD Volts TEMPERATURE 8C

Figure 6. Leakage Currents as a Function of V D (V S) Figure 9. Switching Time vs. Temperature

REV. D 5
ADG438F/ADG439F
THEORY OF OPERATION n-channel threshold voltage (VTN). When a voltage more nega-
The ADG438F/ADG439F multiplexers are capable of with- tive than VSS is applied to the multiplexer, the p-channel
standing overvoltages from 40 V to +55 V, irrespective of MOSFET will turn off since the analog input is more negative
whether the power supplies are present or not. Each channel of than the difference between VSS and the p-channel threshold
the multiplexer consists of an n-channel MOSFET, a p-channel voltage (VTP).
MOSFET and an n-channel MOSFET, connected in series. When the power supplies are present but the channel is off,
When the analog input exceeds the power supplies, one of the again either the p-channel MOSFET or one of the n-channel
MOSFETs will switch off, limiting the current to sub-microamp MOSFETs will remain off when an overvoltage occurs.
levels, thereby preventing the overvoltage from damaging any
circuitry following the multiplexer. Figure 12 illustrates the Finally, when the power supplies are off, the gate of each
channel architecture that enables these multiplexers to with- MOSFET will be at ground. A negative overvoltage switches on
stand continuous overvoltages. the first n-channel MOSFET but the bias produced by the
overvoltage causes the p-channel MOSFET to remain turned
When an analog input of VSS + 1.2 V to VDD 0.8 V is applied off. With a positive overvoltage, the first MOSFET in the series
to the ADG438F/ADG439F, the multiplexer behaves as a will remain off since the gate to source voltage applied to this
standard multiplexer, with specifications similar to a standard MOSFET is negative.
multiplexer, for example, the on-resistance is 180 typically.
However, when an overvoltage is applied to the device, one of During fault conditions, the leakage current into and out of the
the three MOSFETs will turn off. ADG438F/ADG439F is limited to a few microamps. This pro-
tects the multiplexer and succeeding circuitry from over stresses
Figures 10 to 13 show the conditions of the three MOSFETs for as well as protecting the signal sources which drive the multi-
the various overvoltage situations. When the analog input ap- plexer. Also, the other channels of the multiplexer will be
plied to an ON channel approaches the positive power supply undisturbed by the overvoltage and will continue to operate
line, the n-channel MOSFET turns OFF since the voltage on normally.
the analog input exceeds the difference between VDD and the

Q1 Q2 Q3 Q1 Q2 Q3
+55V +55V
OVERVOLTAGE OVERVOLTAGE

n-CHANNEL n-CHANNEL
MOSFET IS MOSFET IS
OFF OFF

VDD VSS

Figure 10. +55 V Overvoltage Input to the ON Channel Figure 12. +55 V Overvoltage with Power OFF

Q1 Q2 Q3 Q1 Q2 Q3
40V 40V
OVERVOLTAGE OVERVOLTAGE

n-CHANNEL
n-CHANNEL MOSFET IS
MOSFET IS ON p-CHANNEL
ON p-CHANNEL
MOSFET IS MOSFET IS
VSS VDD OFF OFF

Figure 11. 40 V Overvoltage on an OFF Channel with Figure 13. 40 V Overvoltage with Power OFF
Multiplexer Power ON

Test Circuits
IDS VDD VSS
VDD VSS

VDD VSS
VDD VSS
V1 IS (OFF) S1
S1 ID (OFF)
A
S2 D
S2 D A
VS S8
S D S8 VD
EN +0.8V
EN +0.8V
VS
VD
VS

R ON = V1 /I DS

Test Circuit 1. On Resistance Test Circuit 2. I S (OFF) Test Circuit 3. ID (OFF)

6 REV. D
ADG438F/ADG439F
VDD VSS 0V 0V
VDD VSS

VDD VSS
VDD VSS
VDD VSS ID (ON) VS
0V A2 S1 A
S1 D S1
A A1
A ADG438F*
S2 S2 D A0
VD S8
S8 S8 EN
VD D
+2.4V EN +0.8V
VS EN GND
VS

* SIMILAR CONNECTION FOR ADG439F

Test Circuit 4. ID (ON) Test Circuit 5. Input Leakage Current Test Circuit 6. Input Leakage Current
(with Overvoltage) (with Power Supplies OFF)

VDD VSS
3V

VDD VSS ADDRESS 50% 50%


A2 DRIVE (VIN)
S1 VS1
VIN 50V A1
S2 THRU S7
A0
S8 VS8
ADG438F* 90%
+2.4V EN D VOUT VOUT
GND RL CL
90%
1MV 35pF

tTRANSITION tTRANSITION
* SIMILAR CONNECTION FOR ADG439F

Test Circuit 7. Switching Time of Multiplexer, tTRANSITION

VDD VSS

VDD VSS 3V
A2 S1 VS ADDRESS
VIN 50V A1 DRIVE (VIN)
S2 THRU S7
A0
ADG438F*
S8
+2.4V EN
D VOUT
GND RL 80% 80%
CL VOUT
1kV 35pF

tOPEN
* SIMILAR CONNECTION FOR ADG439F

Test Circuit 8. Break-Before-Make Delay, tOPEN

VDD VSS
3V

VDD VSS ENABLE 50% 50%


A2 DRIVE (VIN)
S1 VS
A1
S2 THRU S8 0V
A0
tOFF (EN)
ADG438F*
VO
EN D VOUT 0.9VO 0.9VO
VIN 50V RL CL OUTPUT
GND 1kV 35pF
0V
tON (EN)
* SIMILAR CONNECTION FOR ADG439F

Test Circuit 9. Enable Delay, t ON (EN), t OFF (EN)

REV. D 7
ADG438F/ADG439F
VDD VSS

3V
VDD VSS
A2 LOGIC
A1 ADG438F* INPUT (VIN)
A0
RS S D 0V
VOUT
EN CL
VS
1nF VOUT D VOUT

C1992c02/00 (rev. D)
VIN GND
Q INJ = CL 3 DVOUT

* SIMILAR CONNECTION FOR ADG439F

Test Circuit 10. Charge Injection


VDD VSS
VDD
VDD VSS 2.4V
VDD A0 EN
S1 A1
A2 ADG438F*
S8 A2
A1 VS S1 D
ADG438F* VOUT
A0 VOUT
D S2
1kV 1kV
EN RL
S8 GND
GND VSS 1kV VS

VSS CROSSTALK = 20 LOG VOUT/VIN


* SIMILAR CONNECTION FOR ADG439F * SIMILAR CONNECTION FOR ADG439F

Test Circuit 11. OFF Isolation Test Circuit 12. Channel-to-Channel Crosstalk

OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).

16-Lead Plastic (N-16)


0.840 (21.34)
0.745 (18.92)

16 9
0.280 (7.11)
0.240 (6.10)
1 8 0.325 (8.26)
0.300 (7.62) 0.195 (4.95)
PIN 1 0.060 (1.52) 0.115 (2.93)
0.015 (0.38)
0.210 (5.33)
MAX 0.130
0.160 (4.06) (3.30)
0.115 (2.93) MIN
0.015 (0.381)
0.022 (0.558) 0.100 0.070 (1.77) SEATING 0.008 (0.204)
0.014 (0.356) (2.54) 0.045 (1.15) PLANE
BSC

16-Lead SOIC (R-16W) 16-Lead SOIC (R-16N)


(Wide Body) (Narrow Body)
0.4133 (10.50) 0.3937 (10.00) PRINTED IN U.S.A.
0.3977 (10.00) 0.3859 (9.80)

16 9 16 9
0.1574 (4.00) 0.2440 (6.20)
0.4193 (10.65)
0.3937 (10.00)
0.2992 (7.60)
0.2914 (7.40)

0.1497 (3.80) 1 8 0.2284 (5.80)

PIN 1 0.0688 (1.75) 0.0196 (0.50)


1 8
0.0532 (1.35) 3 458
0.0098 (0.25) 0.0099 (0.25)
0.0040 (0.10)

PIN 1 0.1043 (2.65) 0.0291 (0.74)


0.0118 (0.30) 0.0926 (2.35) x 45 88
0.0098 (0.25) 0.0500 0.0192 (0.49) 08
0.0040 (0.10) SEATING (1.27) 0.0099 (0.25) 0.0500 (1.27)
PLANE 0.0138 (0.35)
BSC 0.0075 (0.19) 0.0160 (0.41)
8 0.0500 (1.27)
0.0500 0.0192 (0.49) 0 0.0157 (0.40)
(1.27) SEATING 0.0125 (0.32)
0.0138 (0.35) PLANE
BSC 0.0091 (0.23)

8 REV. D

Você também pode gostar