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1/31/18

Statistical Process Control Core Tools


n APQP and CP - Advanced Product Quality
Planning and Control Plan
n PPAP - Production Part Approval Process
n FMEA - Failure Mode & Effects Analysis
n SPC - Statistical Process Control
An Awareness Program by n MSA - Measurement System Analysis
C.Shanmuga sundaram
System Consultant

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Program Contents Statistical Process Control


n SPC - Introduction Ø Introduction
n Variation Ø What is Statistical Process Control (SPC) ?
n Initial process performance study ü Statistical – The taking of measurements and the arrangements of
those measurements in clear patterns to allow prediction to be made on
n Ongoing process performance study performance.
n X and R Chart ü Process – A process is considered as any activity involving a
combination of people, equipment and material, working together to
n Interpretation of process capability produce an end product.
ü Control – Comparing actual performance against a target and
identifying when and what corrective action is necessary to achieve
target.
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Benefits of SPC Variation - Common and Special causes


No two products or characteristics are exactly identical because
§ Prevention of defects ü
any process contains many sources of variability.
§ Reduced inspection ü The differences among products may be large or may be
immeasurably small, but they are always present.
§ Workflow improvement
ü For instance the diameter of a machined shaft would be subject
§ Disciplines to identify the problems to potential variation from:
q Machine - Clearances, bearing wear
§ Make improvement from the data
q Tool - Strength, rate of wear
q Material - diameter, hardness
q Operator - Part feed, accuracy of centering
q Maintenance - Lubrication, replacement of worn parts
q Environment - Temperature, Consistency of power supply
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Variation - Common and Special causes Variation - Common and Special causes
ü Some sources of variation in the process cause short-term, ü The first step is to take the distinction between common and
piece - to piece difference - eg, backlash and clearances with in special causes of variation.
a machine and its fixture.
ü While individual measured values may all be different, as a
ü Other sources of variation tend to cause changes in the output group they tend to form a pattern that can be described as a
only over a longer period of time, either gradually as with tool distribution.
or machine wear, step-wise as with procedural changes, or
irregular as with environmental changes such as power ü This distribution can be characterized by:
fluctuation. Ø Location (Process level or centering)

Ø Spread (Span of values from smallest to largest)


ü There fore the time period and conditions over which
Ø Shape (The pattern of variation whether it is symmetrical,
measurements are made will affect the amount of total variation
that will be present. skewed etc.,)

ü To manage any process and reduce any variation, the variation


must be tracked back to its sources.
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Common causes Special causes


ü Refer to the many sources of variation with in a process that ü Often called assignable causes - refer to any factors causing
has a stable and repeatable distribution over time. variation that are not always acting on the process.

This is called “ In a state of statistical control”, “ In statistical That is, where they occur, they make the (overall) process
control” or sometimes just “In control” distribution change.

- If only common causes of variation are present and do - If special causes of variation are present, the process output is
not change, the output of a process is predictable. not stable overtime.

- Unless all the special causes variation are identified and acted
upon, they will continue to affect the process output in
unpredictable ways.

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Common vs Special Causes Control Charts for variables


Common Causes Special/Assignable causes 1) Control chart for Process level (Average) and
1. Few in Nos. 1. Plenty in Nos. Variability (Range) called X-R Chart
2. Variation is Low 2. Variation is high
3. Part of the Process 3. Visitor to the Process 2) Control chart for individual (X) and moving range
4. Constant variation 4. Fluctuating variation (MR)
5. Predictable 5. Unpredictable
6. Statistics applicable 6. Statistics cannot apply 3) Control chart for median and Range (R)
7. Management controllable 7. Operator Controllable
Eg - Pressure Variation, Eg - Wrong Setting, 4) Control chart for average and Standard deviation
Environment Variation Wrong Master (X & S)
Reduction lead to improvement Elimination lead to maintenance

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Control Charts for attributes Initial process performance study


Description Type n Initial process performance study is a short-term study
conducted to obtain early information on the performance of a
Control Chart for proportion non p Chart new or revised process relative to internal or customer
conforming units requirements.
Control Chart for no. of non conforming np Chart n The symbols used for process performance indices are Pp and
units in a sample Ppk.
Control Chart for no. of non conformities c Chart
n Since process performance studies are short term, they will not
in a sample predict the effects of time and variation in people, material,
Control Chart for no. of non conformities u Chart method, equipment, measurement system and environment.
per unit Even for these short-term studies, it is important to collect and
analyse the data in the order in which they are produced using
control charts.

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Initial process performance study Initial process performance study


Normal Distribution –
n It is necessary to perform a measurement system analysis X
(Repeatability and reproducibility) to understand as to how
measurement error is affecting the study measurements.

n For those characteristics that can be studied using X – R chart


process performance study should be based on 25 or more sub
groups containing already a total of 125 readings.
n Before calculating process performance index, a histogram is to
be made using the data collected and the normality of the - 3s - 2s - 1s 68.26 % 1s 2s 3s
distribution is to be verified. If it is not normal, analyse and take
action. This method is applicable only for a normal distribution. 95.45 %

99.73 %
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Initial process performance study Initial process performance study


n The estimate of sigma for the process performance index is n Ppk (Process Performance Index) is calculated as
based on total variations. The formula used for standard
deviation X – LSL USL - X
Ppk = or whichever is smaller.
3S 3S
∑(Xi - X)2
S= n-1 n The acceptable value of Ppk is 1.67 min.

n Pp (Process Performance Potential) is calculated as

Tolerance USL - LSL


Pp = =
6S 6S

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Ongoing process performance study Ongoing process performance study


n Ongoing process performance study is to be done only for a n Cp (Process Capability Potential) is calculated as
stable process, which is to be verified for control charts.
Tolerance USL - LSL
n The data is to be collected from control chart. Cp = =
6S 6S

n At least 25 sub groups data are required. n Cpk (Process Capability Index) is calculated as

n The Standard Deviation (S) is to be calculated using the formula X – LSL USL - X
Cpk = or whichever is smaller.
3S 3S
R
S = n The acceptable value of Cpk is 1.33 min.
d2
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X – R chart X – R chart
Pre-study Requirements Homogenisation of data
n Identify the characteristics to be controlled using X – R chart. n Calculate X and R for each sub group.

n Select a suitable measuring equipment to be used for measuring X1 + X2 + ….. + Xn


the characteristics. The least Count of the instrument should be X= where n = no. of samples
1/10th of the tolerance. n in a sub group

n Carryout R & R study on the instruments as per the procedure. R = X Max – X Min (within each sub group)
If R & R had been performed for a similar application using the
same instrument, that value may be considered as surrogate n Calculate R, UCLR & LCLR (UCLR = D4R & LCLR = D3R)
information for this study. R & R% should not exceed 30%
n After calculating R, UCLR & LCLR homogenise for R.

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X – R chart X – R chart
n Check whether any of the R value falls outside UCLR & LCLR. If n Calculate X, UCLX & LCLX (UCLX = X+A2R & LCLX = X-A2R).
yes, eliminate such group and recalculate UCLR & LCLR. Check Check whether all the X values are within the UCLX & LCLX. If
whether all R values are within the new UCLR & LCLR. Repeat
any X value is outside UCLX and LCLX, then eliminate such group
this until you find all R values fall within UCLR & LCLR. In this
process, if more than 20% of the sub groups (5 sub groups) are and recalculate X and then UCLX & LCLX. This is to be continued
eliminated, then collect fresh data. until all the X values fall within UCLX and LCLX.

n After homogenising the data for R, then homogenise for X. n During homogenisation (X & R), if more than 20% of the data
are eliminated, discard all the data and collect fresh data.

n The control limits for X and R are to be calculated using


homogenised data as below:
UCLX = X+A2R and LCLX = X-A2R
UCLR = D4R and LCLR = D3R
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X – R chart X – R chart
Table of Constants for Control Charts Plotting X – R Control Charts
Sub Group Standard Table Values n With the control limits drawn on X – R control chart, proceed
Size (n) A2 d2 D3 D4 plotting as below.
2 1.880 1.128 0 3.267 n The sub group size can be 3 ~ 5 consecutive samples.
3 1.023 1.693 0 2.574
4 0.729 2.059 0 2.282 n The sub group frequency will depend upon the process, time
5 0.577 2.326 0 2.114 span of production and process stability. As default, a sub group
6 0.483 2.534 0 2.004 of every 2 hours interval (4 times a shift) is recommended.
7 0.419 2.704 0.076 1.924
Significant process events (for example tool change, machine
8 0.373 2.847 0.136 1.864
n

9 0.337 2.970 0.184 1.816 repair) should be noted on the control chart.
10 0.308 3.078 0.223 1.777 n Whenever any assignable cause is identified, the process should
be stopped, the cause is to be investigated and the corrective
actions are to be taken.
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AVERAGE AND RANGE (X & R ) CONTROL CHART AVERAGE AND RANGE (X & R ) CONTROL CHART

Cell Name : SOLID CELL Process / Opn : Ball Sph.hard turningSample size: 5 Nos./hour Specification limits: 232.79 ± 0.20 Cell Name : SOLID CELL Process / Opn : Ball Sph.hard turningSample size: 5 Nos./hour Specification limits: 232.79 ± 0.20
Date : 19.08.07 Machine : SI 70 Frequency : 2 hour once Instrument : Control Length gauge Date : 19.08.07 Machine : SI 70 Frequency : 2 hour once Instrument : Control Length gauge
Part No : 3057139 Iss No: Description : Production Characteristics: Control Length Date control limits calculated : Part No : 3057139 Iss No: Description : Production Characteristics: Control Length Date control limits calculated :
Control limit established UCL X = 232.86 UCL R = 0.20 Control limit established UCL X = 232.86 UCL R = 0.20
X = 232.80 UCLX = X + A 2R = 232.86 LCLX = X - A 2R = 232.74 LCL X = 232.74 LCL R =0 X = 232.80 UCLX = X + A 2R = 232.86 LCLX = X - A 2R = 232.74 LCL X = 232.74 LCL R =0

232.88 232.88

UCLX = 232.86 UCLX = 232.86

232.84 232.84

232.82 232.82

X = 232.80 X = 232.80

232.78 232.78

232.76 232.76

LCLX = 232.74 LCLX = 232.74

232.72 232.72

232.70 232.70

R = 0.10 UCLR = D 4R = 0.20 LCLR = D 4R = 0 RANGE (R CHART) R = 0.10 UCLR = D 4R = 0.20 LCLR = D 4R = 0 RANGE (R CHART)

UCLR = 0.20 UCLR = 0.20

X = 0.10 X = 0.10

LCLR = 0 LCLR = 0

1 2 3 4 5 6 7 8 9 10 11 1 2 3 4 5 6 7 8 9 10 11
Date /Shift 19.8.07/D.S Date /Shift 19.8.07/D.S 19.8.07/D.S
Time 9.00 Time 9.00 11.00
X1 232.78 X1 232.78 232.76
READINGS
READINGS

X2 232.86 232.80
SAMPLE

X2 232.86
SAMPLE

X3 232.90 X3 232.90 232.84


X4 232.85 X4 232.85 232.86
X5 232.88 X5 232.88 232.82
Sum of Samples (SX) 1164.27 Sum of Samples (SX) 1164.27 1164.08
X= SX / no. of samples 232.85 X= SX / no. of samples 232.85 232.82
R= Highesh -low est 0.12 R= Highesh -low est 0.12 0.10

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Signature Signature

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AVERAGE AND RANGE (X & R ) CONTROL CHART AVERAGE AND RANGE (X & R ) CONTROL CHART

Cell Name : SOLID CELL Process / Opn : Ball Sph.hard turningSample size: 5 Nos./hour Specification limits: 232.79 ± 0.20 Cell Name : SOLID CELL Process / Opn : Ball Sph.hard turningSample size: 5 Nos./hour Specification limits: 232.79 ± 0.20
Date : 19.08.07 Machine : SI 70 Frequency : 2 hour once Instrument : Control Length gauge Date : 19.08.07 Machine : SI 70 Frequency : 2 hour once Instrument : Control Length gauge
Part No : 3057139 Iss No: Description : Production Characteristics: Control Length Date control limits calculated : Part No : 3057139 Iss No: Description : Production Characteristics: Control Length Date control limits calculated :

Control limit established UCL X = 232.86 UCL R = 0.20 Control limit established UCL X = 232.86 UCL R = 0.20

X = 232.80 UCLX = X + A 2R = 232.86 LCLX = X - A2R = 232.74 LCL X = 232.74 LCL R =0 X = 232.80 UCLX = X + A 2R = 232.86 LCLX = X - A2R = 232.74 LCL X = 232.74 LCL R =0

232.88 232.88

UCLX = 232.86 UCLX = 232.86

232.84 232.84

232.82
232.82
X = 232.80
X = 232.80
232.78
232.78
232.76
232.76
LCLX = 232.74
LCLX = 232.74
232.72
232.72
232.70
232.70

R = 0.10 UCLR = D 4R = 0.20 LCLR = D 4R = 0 RANGE (R CHART)


R = 0.10 UCLR = D 4R = 0.20 LCLR = D 4R = 0 RANGE (R CHART)

UCLR = 0.20
UCLR = 0.20

X = 0.10
X = 0.10

LCLR = 0
LCLR = 0

1 2 3 4 5 6 7 8 9 10 11
1 2 3 4 5 6 7 8 9 10 11 Date /Shift 19.8.07/D.S 19.8.07/D.S 19.8.07/D.S 19.8.07/D.S 20.8.07/N.S 20.8.07/N.S 20.8.07/N.S 20.8.07/N.S 20.8.07/N.S 20.8.07/N.S 20.8.07/N.S
Date /Shift 19.8.07/D.S 19.8.07/D.S 19.8.07/D.S Time 9.00 11.00 1.00 3.00 9.00 11.00 10.00 12.00 2.00 4.00 6.00
Time 9.00 11.00 1.00
X1 232.78 232.76 232.75 232.86 232.79 232.80 232.75 232.86 232.74 232.84 232.74
X1 232.78 232.76 232.75

READINGS
X2 232.86 232.80 232.84 232.8 232.80 232.79 232.84 232.80 232.81 232.86 232.82

SAMPLE
READINGS

X2 232.86 232.80 232.84


SAMPLE

X3 232.90 232.84 232.79 232.79 232.81 232.78 232.79 232.79 232.78 232.82 232.76
X3 232.90 232.84 232.79
X4 232.85 232.86 232.8 232.85 232.83 232.81 232.80 232.85 232.79 232.80 232.79
X4 232.85 232.86 232.8
X5 232.88 232.82 232.82 232.84 232.80 232.74 232.82 232.84 232.80 232.76 232.82
X5 232.88 232.82 232.82 Sum of Samples (SX) 1164.27 1164.08 1164 1164.14 1164.03 1163.92 1164 1164.14 1163.92 1164.08 1163.93
Sum of Samples (SX) 1164.27 1164.08 1164 X= SX / no. of samples 232.85 232.82 232.80 232.83 232.81 232.78 232.80 232.83 232.78 232.82 232.79
X= SX / no. of samples 232.85 232.82 232.80 R= Highesh -low est 0.12 0.10 0.09 0.07 0.04 0.07 0.09 0.07 0.07 0.1 0.08

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R= Highesh -low est 0.12 0.10 0.09 Signature
Signature

PROCESS LOG SHEET


ANY CHANGE IN PEOPLE, MATERIALS, EQUIPMENT,METHODS ,ENVIRONMENT, OR MEASUTEMENT SYSTEMS SHOULD BE NOTED.
THESE NOTES WILL HELP YOU TO TAKE CORRECTIVE OR PROCESS IMPROVEMENT ACTION WHEN SIGNALLED BY
THE CONTROL CHART.

DATE TIME COMMENTS DATE TIME COMMENTS Interpretation of Process Capability


Note : Any capability analysis, no matter how precise it appears,
can give only appropriate results. This happens because,
1) There is always some sampling variation.

2) No Process is ever “fully” in statistical control, and


3) No actual output “exactly” follows the normal distribution
(or any other simple distribution).

Final results should always be used with caution and interpreted


conventionally.

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SPC - X R CHART OVER ADJUSTMENT SPC - X R CHART OVER ADJUSTMENT

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Q&A Thank you

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