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Lecture 2:
Reflections
Prof Eric Bogatin, Dean, Signal Integrity Academy
Teledyne LeCroy www.beTheSignal.com, eric@beTheSignal.com
Adjunct Prof, ECEE Dept CU, Boulder
And
Prof Melinda Piket-May
Assoc. Prof, ECEE Dept, CU, Boulder
Spring 2016 Feb 2016
Slide -2
Topic Schedule
1. Jan 19: Intro and the 5 most important principles
2. Jan 26: reflections, driver models, power dissipation
3. Feb 2: routing topologies, eyes and terminations
4. Feb 9: cross talk, guard traces, ground bounce
5. Feb 16: Differential pairs
6. Feb 23: via to via cross talk and cavities
7. Mar 2: S-parameters
8. Mar 9: Attenuation and loss, serial links
9. Mar 16: HFSS intro
10. Mar 23 current distributions
11. Mar 30: spring break
12. April 6: signal and return path discontinuities
13. April 13: vias
14. April 20 measurement and simulation
15. April 27: project presentations
16. May 5: reading day, no class
17. May 9: final exam are the projects (due April 27)
• Problem set:
Characterize two driver models: 74AC11, TDR, IDT 74FCT
Build a transmission line circuit. How long can it be without termination?
Engineer five different termination schemes and optimize each one. Do some have
advantages?
Calculate the power dissipation in each approach, assuming driver output resistance is 0.
Slide -4
Vsignal
V Frozen in time
Signal path
Vin V
Return path GROUND
The dV/dt
The dI/dt V
Z
I
ECEN 5224 High Speed Digital Design
Slide -5
Telegraphers’ equation V x, t L Ix, t Ix, t C V x, t
x t x t
2 1 2 2 1 2
Wave equation V x, t V x, t Ix, t Ix, t
t 2
LC x 2 t 2
LC x 2
L 1
derive Z0 v
C LC
ECEN 5224 High Speed Digital Design
Slide -6
Voltage applied
Z
Current through
C = C L x
I I = Qt Q = CV,
x
C every t = v
vCL x V
x V I = Qt = x = vCLV
V V 1
instantaneous impedance of the transmission line Z
I vCL V vCL
The characteristic impedance of a transmission line:
The one value of instantaneous impedance in a uniform transmission line
ECEN 5224 High Speed Digital Design
Slide -7
signal
+++ +++
= I
displacement
current
--- +++
Slide -8
Slide -10
Current Distributions
50 Ohm microstrip, FR4
t = 3 mils
1 MHz
10 MHz
100 MHz
=
Rsource Z0
Z0 Z0 Vlaunched Vunloaded
Z 0 R source
• What’s missing?
Coupled transmission lines (diff pairs, multiple lines)
Lossy transmission lines (impact on rise time degradation)
Slide -12
Slide -14
Most important distinction: signals are dynamic! don’t confuse the signal that
propagates with the measured voltage at a node
Vincident = 1 v Vincident = 1 v
Vmeasured = 2 v Vmeasured = 0
Vreflected = 1 v Vreflected = -1 v
Z1 Z2 = open Z1 Z2 = short
Vr Z1 Vr 0 Z1
rho 1 rho 1
Vi Z1 Vi 0 Z1
Iincident(cw) Iincident(cw)
Ireflected(ccw) Ireflected(cw)
Net current is 0- it’s an open! Net current is twice- they add
Slide -16
50 75
Vt 2 x Z2
If the instantaneous impedance is constant,
the signal continues undistorted.
Vincident Vtransmitted t
Vi Z 2 Z1
Vr Z 2 Z1
Vreflected rho
Vi Z 2 Z1
50
10
Slide -18
Slide -20
Acceptable Performance:
Noise Margins
U1.1 TL1 U2.1
VOH VIH Margin VIL VOL Margin
TTL [5volt] 2.4V 2.0V 400mV 0.8v 0.5v 300mV
50.0 ohms
ELB_10_Ohms_0p...
500.000 ps
ELB_10_Ohms_0p...
FCT [5volt] 2.5V 2.0V 500mV 0.8v 0.5v 300mV
Simple
Noise margin, lo CMOS [1.8V] 1.35V 1.1V 250mV 0.66v 0.45v 210mV
VOLmax
For 5 V CMOS, noise margin-hi/lo ~ 1/5 ~ 20%
For 2.5 V CMOS, noise margin-hi/lo ~ 0.3/2 ~ 15%
For 1.8 V CMOS, noise margin-hi/lo ~ 0.25/1.35 ~ 18%
Typical noise margin for single-ended CMOS technology ~ 15% of signal swing
Noise budget allocation: ~ 1/3 to reflection noise, ~1/3 to xtk, ~1/3 to PDN noise
ECEN 5224 High Speed Digital Design
Slide -21
Acceptable Performance:
Timing Margin for “Valid” Level
tset-up ~ thold ~ (0.05 nsec and 0.125 nsec for 800 Mbps DDR2)
2.0
Set-up Hold
1.5 time time
data Data @RX must
1.0 be “valid” within
setup and hold
Voltage
0.5
interval
0.0
-0.5 clock
Clock to data
-1.0 skew, jitter,
decrease timing
-1.5 margins on both
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 sides
time, nsec
At 1 Gbps, UI = 1 nsec, time when level needs to be valid: ~ 40% of UI
jitter can be ~30% on each edge
ECEN 5224 High Speed Digital Design
Slide -22
data mask
1 unit interval
clock
If ALL RX voltage is outside the mask, bit
error rate will be acceptable
4. Problem: discontinuities
Solution: keep them short, match to line impedance
Slide -24
ISI
Probed 2 inches
from RX
Slide -26
Vsource
Rload = 15 Ω Rsource
Rload
Vout Vsource
Rsource Rload
Rload
Slide -28
Demo
RT = Z0
RC termination
Rterm = Z0
C ~ 1-100 nF
Far End Thevenin Vtt Termination
Termination
R1 || R2 = RT = Z0
Slide -30
1 02 3.32
Power consumed by far end termination (50% duty cycle) = P 100mW
2 50 50
Much less power if << 50% duty cycle, or >> 50% duty cycle and Vcc termination
R = 100Ω R = 50Ω
R = 100Ω
1 21 3.3 1 3.3
2 2
1 V V
2 2 P 2 50mW
P lo hi 2 50 50
2 R R
1 3.3 2 3.32
P 100mW
2 100 100
Slide -32
Power Consumed in RC
Voltage across
capacitor “charges up”
1 Vlo 2 Vhi2
P
2 R R
A few time constants later ~
initially 50 x 10 nF ~ 1000 nsec
1 21 3.3 1 3.3
2 2
P 2 50mW
2 50 50
Power consumed in RC
termination is ½ as much as
far-end single-resistor
Slide -34
Problem Set #2
Slide -36