JOMO KENYATTA UNIVERSITY

OF
AGRICULTURE AND TECHNOLOGY

DEPARTMENT OF MECHATRONIC ENGINEERING

P. O. BOX 62000 - 00200  NAIROBI KENYATEL: 07290440800701883903.

NAME: WARUTERE EMMANUEL WACHIRA

REG. NO: EN292-2930/2013

UNIT: ELECTRONIC CIRCUIT DESIGN

UNIT CODE: EMT 2532

TITLE: YIELD MODELS

TASK: ASSIGNMENT 1
Yield models relate the process steps, defect density and chip (die) size parameters to the
wafer-sort yield. They include;
i. Poisson Yield model
Where;
𝑌 = 𝑒 −𝐴𝐷
ii. Murphy’s Yield model; A=Area of a circuit (die)
First equation is given by: D=Defect density

1 − 𝑒 −2𝐴𝐷
𝑌=( )
2𝐴𝐷
Second equation is given by:
2
1 − 𝑒 −𝐴𝐷
𝑌=( )
𝐴𝐷

iii. Negative Binomial Yield model

𝐴𝐷 −𝛼
𝑌 = [1 + ]
𝛼
(α =factor that ranges from 0.3 – 3.

iv. Seed Yield model

𝑌 = 𝑒 −√𝐴𝐷
Taking a die with sides of 14mm and defect density of 0.84/cm2,
A= (14x14) x10-6= 196 x 10-6𝑚2
0.84
D= 1 𝑥 10−4 = 0.84 x 104 /m2 = 8.4 x 103 /𝑚2

𝐴𝐷 =196 x 10-6 x 8.4 x 103 =600 x 103 =1.6464

i. Using Poisson’s model,

𝑌 = 𝑒 −𝐴𝐷 = 𝑒 −1.6464 = 0.1927 = 19.27%

ii. Using Murphy’s Yield model

First equation:

1 − 𝑒 −2𝐴𝐷 1 − 𝑒 −2(1.6464)
𝑌=( )=( ) = 0.2360 = 23.6%
2𝐴𝐷 2(1.6464)

Second equation:
2 2
1 − 𝑒 −𝐴𝐷 1 − 𝑒 −1.6464
𝑌=( ) =( ) = 0.2404 = 24.04%
𝐴𝐷 1.6464

iii. Using Negative binomial model

𝐴𝐷 −𝛼 1.6464 −0.383
𝑌 = [1 + ] = [1 + ] = 0.5286 = 52.86%
𝛼 0.383

Using Seed’s model

𝑌 = 𝑒 −√𝐴𝐷 = 𝑒 −√0.6 = 0.2772 = 27.72%

Conclusion
The most optimistic model is Negative binomial (Y=52.86%) when 𝛼=0.383.
The least optimistic model is the Poisson’s model (Y=46.09%).
Graphical representations using Matlab showing relationship between yield and area/defect
density.
i. Poisson Yield model
𝑌 = 𝑒 −𝐴𝐷
Matlab code
Area = [1:0.1:2.9];

Defects = [0.1:0.1:2.0];

W = Area.*Defects;

Yield = exp(-W);

plot (Area, Yield, Defects, Yield);

title (' Poisson’s Yield Model Graph');

xlabel('Area'); % x-axis label

ylabel('Yield'); % y-axis label

ii. Murphy’s Yield model;
First equation is given by:

1 − 𝑒 −2𝐴𝐷
𝑌=( )
2𝐴𝐷
Second equation is given by:
2
1 − 𝑒 −𝐴𝐷
𝑌=( )
𝐴𝐷

Matlab code
Area = [1:0.1:2.8];
Defects = [0.1:0.1:2.0];

W = Area.*Defects;

Yield=(1-exp(-2W))/(2.*W);
plot (Area, X, Defects, X);

title (' Murphy’s Yield Model Graph');

xlabel('Area'); % x-axis label

ylabel('Yield'); % y-axis label

 ii. Negative Binomial Yield model
𝐴𝐷 −𝛼
𝑌 = [1 + ]
𝛼
Matlab code
Area = [0.1:0.1:2.1];
Defects = [1:21];
Alpha = [0.3: 0.135:3];
A = 1. + ((Area.*Defects)./Alpha);
Yield = A.^(-Alpha);
plot (Area, Yield, Defects, Yield, Alpha, Yield);
title ('Negative Binomial Yield Model Graph');
xlabel('Area, Defects and Alpha'); % x-axis label
ylabel('Yield'); % y-axis label
 iii. Seed Yield model

𝑌 = 𝑒 −√𝐴𝐷
Matlab code
%Seed Yield
Area = [0.1:0.1:2];
Defect = [1:0.2:4.8];
W = - (sqrt(Area.*Defect));
Yield = exp(W);
plot (Area, Yield, Defect, Yield);
title (' Seed Yield model graph');
xlabel('Area and Defect');
ylabel('Seed Yield');