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Note: Production of sharp gold tips with high surface quality

Max Eisele, Michael Krüger, Markus Schenk, Alexander Ziegler, and Peter Hommelhoff

Citation: Review of Scientific Instruments 82, 026101 (2011); doi: 10.1063/1.3534078


View online: http://dx.doi.org/10.1063/1.3534078
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REVIEW OF SCIENTIFIC INSTRUMENTS 82, 026101 (2011)

Note: Production of sharp gold tips with high surface quality


Max Eisele,1 Michael Krüger,1 Markus Schenk,1 Alexander Ziegler,2 and Peter
Hommelhoff1,a)
1
Max-Planck-Institut für Quantenoptik, Hans-Kopfermann-Str. 1, D-85748 Garching, Germany
2
Max-Planck-Institut für Biochemie, Am Klopferspitz 18, D-82152 Martinsried, Germany
(Received 9 November 2010; accepted 11 December 2010; published online 4 February 2011)
We present a simple method to produce sharp gold tips with excellent surface quality based on elec-
trochemical etching with potassium chloride. Radii of curvature lie in the range of 20–40 nm and the
surface roughness is measured to less than 0.8 nm. The tips are well suited for field emission, field ion
microscopy, and likely for tip-enhanced Raman scattering as well as tip-enhanced near-field imaging.
© 2011 American Institute of Physics. [doi:10.1063/1.3534078]

Gold tips exhibit a broad and strong plasmonic response ring serves for etching, the one in the lower ring for measur-
at visible and near-infrared frequencies, which together with ing when the wire is etched through. It triggers the switch-off
their chemical inertness have made them the preferred choice of the etching voltage.
for a variety of applications such as tip-enhanced Raman Before etching, we clean the rings by submerging them
spectroscopy, scanning near-field optical imaging, and laser- in the etchant and applying a voltage of +10 V to both rings
assisted field emission. Over the last 50 years a variety of until the adhesions at the rings are dissolved. Here another
methods has been developed to obtain sharp gold tips.1–13 All electrode (Ni) serves as ground. For etching we use 90%
but one rely on electrochemical etching of a thin gold wire. saturated aqueous solution of KCl [Alfa Aesar potassium
The results differ in the typical minimum tip radius obtain- chloride, 99.0%–100.5% (ACS)], prepared with in-house
able, in surface roughness, and in the general shape of the tip. deionized water or ultrapure water (Carl Roth H2 O Rotipu-
We found that either hazardous etchants like perchloric acid ran), both of which delivered good results. The gold wire
have to be used, that rather sophisticated multistep procedures (0.1 mm diameter, polycrystalline, 99.95% purity, Alfa Ae-
are required, that the method did either produce tips of too sar) to be etched is arranged vertically and centered through
poor quality, and/or that the method did not work reliably in the two platinum rings. About 20 mm of the wire extend be-
our (nonchemistry but physics) laboratory. low the bottom platinum ring.
Here we show that dc voltage electrochemical etching For etching, we briefly immerse the platinum rings into
with KCl combined with the lamella-drop-off technique pro- the KCl solution to form a lamella within each ring. The etch-
duces very sharp gold tips with small efforts. The method is ing process is started by applying a dc voltage of +10 V to the
simple, reliable, and fast and produces gold tips with excel- gold wire in reference to the upper platinum ring. During the
lent surface quality and tip radii in the range of 20–40 nm. etching process a strong bubble formation at the upper plat-
The etchant is benign and resistant to contamination as it can inum ring occurs as well as a separation of the dissolved KCl
be used and stored for several months in a closed plastic con- from the solution. Thus, KCl crystals form, leading to the rup-
tainer at regular laboratory atmosphere. ture of the upper lamella. Hence, the etching setup has to be
Although gold tips have been successfully produced with redipped into the etchant. This can happen between one and
KCl in a two-step ac voltage electropolishing process more eight times during a single tip etching process. We could not
than a decade ago,4 this process appears to be too com- observe any influence of the bubble formation or the rupture
plicated so that in many laboratories other techniques have of the lamella onto the quality of the etched tips. The cur-
been developed aiming at reducing the setup’s and process’s rent during etching is around 25–40 mA. After approximately
complexity. 10 min the wire is etched through, and the lower part drops
The method described here is based on the lamella-drop- down. While still in the mount, we rinse the tip first with ul-
off technique14–16 with a fast electronic switch-off of the trapure water and then with acetone to remove the remnants
applied voltage. We checked that the switching time is not of the etchant. (For applications that do not include another
critical up to a duration of roughly 100 ms, which is why we cleaning step [such as in field-ion microscope (FIM), see be-
consider it unnecessary to mention any details about the elec- low], it might be advisable to clean the tip with a more ag-
tronics. The setup comprises two 0.5 mm diameter platinum gressive procedure as described in, e.g.,5 .) We usually only
cathode wires bent into rings with diameters of 7 mm. The work with the upper part of the wire, which does not drop af-
ring axes are aligned vertically and the rings are arranged on ter etching, but the lower part of the wire can of course also
top of each other with a distance of 8 mm between them. Each be used.
wire ring holds an etchant lamella. The lamella in the upper Figure 1 shows images of a typical resulting tip. The ra-
dius of curvature is usually around 30 nm (20–40 nm) inferred
from scanning electron microscope (SEM) and transmission
a) Electronic mail: peter.hommelhoff@mpq.mpg.de. electron microscope (TEM) images. The shank opens into a

0034-6748/2011/82(2)/026101/2/$30.00 82, 026101-1 © 2011 American Institute of Physics

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23:30:58
026101-2 Eisele et al. Rev. Sci. Instrum. 82, 026101 (2011)

a) b)

100µm 60nm

c) d) FIG. 2. (Color online) (a) Field-ion microscope image. Bright spots indicate
protruding atoms at crystallographic kinks and edges. (b) Ball model of fcc
structure with one atom per lattice site at (100) orientation. The color map
indicates the deviation of the surface atoms from an ideal hemisphere.

7nm 100µm Summarizing, we have given a recipe for obtaining reli-


ably, fast, and with a benign etchant sharp gold tips with radii
FIG. 1. (Color online) (a) Scanning-electron microscope image of a gold tip of curvature of around 30 nm and with excellent surface qual-
etched with KCl. (b) TEM image. The transparent film seen on the surface ity. Field ion microscope images demonstrate the usefulness
arises from passivation layers. (c) TEM image of the tip’s apex. (d) Optical
and quality of the so produced gold tips.
microscope image.

We gratefully acknowledge A. Holleitner (WSI, Technis-


cone with ∼10◦ full opening angle, extending over ∼300 μm. che Universität München) for providing SEM access to us,
The surface roughness is estimated to be less than 0.8 nm in- and J. Hoffrogge for establishing contact. This project was
ferred from the TEM image shown in Fig. 1(c). Note that the partially supported by the EU (FP7 IRG) and by the Munich-
surface quality is excellent not only at the apex but also up to Centre for Advanced Photonics (MAP).
300 μm up the shank.
1 E.
We found that in order to judge if the tips are sharp and W. Müller, in Advances in Electronics and Electron Physics, edited by
smooth, it suffices to inspect them with an optical microscope L. Marton (Academic Press, Inc., New York, 1960), pp. 83–179.
2 A. J. Melmed, J. Vac. Sci. Technol. B 9, 601 (1991).
after etching. If the surface looks shiny and the tip ends in a 3 L. Libioulle, Y. Houbion, and J. M. Gilles, J. Vac. Sci. Technol. B 13, 1325
rotationally symmetric and undistorted cone [see Fig. 1(d)], (1995).
4 A. J. Nam, A. Teren, T. A. Lusby, and A. J. Melmed, J. Vac. Sci. Technol.
the tip turned out to be sharp and smooth under SEM and
TEM inspection. We have not seen incremental effects, for ex- B 13, 1556 (1995).
5 T. Ito, P. Bühlmann, and Y. Umezawa, Anal. Chem. 70, 255 (1998).
ample, that the tip radius is larger than in other tips, but rather 6 B. Ren, G. Picardi, and B. Pettinger, Rev. Sci. Instrum. 75, 837
a bimodal distribution. If the tip looks good optically, the tip (2004).
7 L. Billot, L. Berguiga, M. L. de la Chapelle, Y. Gilbert, and R. Bachelot,
radius is around 30 nm with good surface quality. From ex-
Eur. Phys. J. Appl. Phys. 31, 139 (2005).
aminations with the optical microscope we infer that around 8 F. Bonaccorso, G. Calogero, G. Di Marco, O. M. Maragò, P. G. Gucciardi,
90% of etching attempts are successful. U. Giorgianni, K. Channon, and G. Sabatino, Rev. Sci. Instrum. 78, 103702
Figure 2(a) shows a typical room temperature FIM im- (2007).
9 D. Gingery and P. Bühlmann, Rev. Sci. Instrum. 78, 113703 (2007).
age of a gold tip with neon as image gas. Figure 2(b) 10 X. Wang, Z. Liu, M. D. Zhuang, H. M. Zhang, X. Wang, Z. X. Xie, D. Y.
shows a face-centered-cubic (fcc) ball model image. Clearly, Wu, B. Ren, and Z. Q. Tian, Appl. Phys. Lett. 91, 101105 (2007).
a fourfold symmetry is visible in the FIM image as well 11 C. Williams and D. Roy, J. Vac. Sci. Technol. B 26, 1761 (2008).
12 L. Eligal, F. Culfaz, V. McCaughan, N. I. Cade, and D. Richards, Rev. Sci.
as several crystal facets. The same symmetry is visible in
the fcc ball model, indicating an atomically smooth tip sur- Instrum. 80, 033701 (2009).
13 D. Roy, C. M. Williams, and K. Mingard, J. Vac. Sci. Technol. B 28, 631
face. The radius of curvature of the Au tip of Fig. 2(a) is (2010).
∼65 nm measured with the Fowler–Nordheim method.17 The 14 M. Klein and G. Schwitzgebel, Rev. Sci. Instrum. 68, 3099 (1997).
15 A. D. Müller, F. Müller, M. Hietschold, F. Demming, J. Jersch, and K.
increase of the radius is due to field evaporation of the surface
atoms, which is a good cleaning method in FIM applications. Dickmann, Rev. Sci. Instrum. 70, 3970 (1999).
16 M. Kulawik, M. Nowicki, G. Thielsch, L. Cramer, H. P. Rust, H. J. Freund,
Interestingly, all of the five gold tips we inspected with FIM T. P. Pearl, and P. S. Weiss, Rev. Sci. Instrum. 74, 1027 (2003).
showed a crystallographic orientation of the apex in the (100) 17 G. Fursey, Field Emission in Vacuum Microelectronics (Kluwer

direction. Academic/Plenum, New York, 2005).

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