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Abstract
In this work, we report on the successfully growing Hg1xMnxSe bulk crystals using a mixed, travelling heater method and Bridgman
method, two-step procedure. Firstly, and with the aim of reducing Hg high pressure related to the high temperature synthesis reaction
between the components in elemental form, HgSe crystals were synthesized and grown by the cold travelling heater method. Secondly,
previously sublimated Mn and Se were incorporated to complete the desired composition. Then, the Bridgman growth was carried out by
heating the alloy at a temperature of about 880 1C and lowering it at rate of 1 mm/h through a gradient of 25 1C/cm. The Hg1xMnxSe
crystals were characterized by scanning electron microscopy, energy dispersive X-ray analysis, X-ray diffractometry, Fourier transform
infrared spectroscopy and magnetic susceptibility measurements. The summary of the experimental results allows us to be optimistic with
the potential of Hg1xMnxSe as regards using Hg1xMnxTe and Hg1xCdxTe for infrared photodetection.
r 2007 Elsevier Ltd. All rights reserved.
0026-2692/$ - see front matter r 2007 Elsevier Ltd. All rights reserved.
doi:10.1016/j.mejo.2007.01.016
ARTICLE IN PRESS
328 C. Reig et al. / Microelectronics Journal 38 (2007) 327–331
1.5 mm/h through a 25 1C/cm temperature gradient to grow homogeneous material. After this initial region, the Mn
Hg1xMnxSe. This way, ingots of 6–8 cm length were concentration is roughly constant for the remainder ingot,
obtained. except the end part of the ingot (i.e., the last to freeze zone
Several growths with different nominal compositions of about 20% ingot length, which is not shown in Fig. 2).
were grown and analyzed, as mentioned above. The The radial composition uniformity was also checked by
Hg1xMnxSe crystals were characterized by scanning cutting several Hg1xMnxSe crystals, perpendicular to the
electron microscopy (SEM), energy-dispersive X-ray ana- growth axis, in slices of 1 mm thickness. These samples
lysis (EDAX), X-ray diffractometry (XRD), Fourier were then mechanically and chemically polished, and
transformed infrared (FTIR) spectroscopy and magnetic- further EDAX measurements were carried out. The areas
susceptibility measurements. closer to the axis of the ingot were found to have a very
good homogeneity. The edges showed a slightly upper Mn
concentration (1–3 at%) probably related to radial tem-
3. Characterization results and discussion perature gradients into the ingot and the interaction
between the material and the ampoule during growth.
In order to evaluate the morphological quality of the The same behavior has also been reported for the growth
material, SEM studies were performed over a significant of Hg1xMnxTe crystals [14].
number of regions, taken from different ingots. So, the In order to, firstly, check the single phase morphology of
Hg1xMnxSe ingots were axially cut with a wire saw, then crystals and, secondly, to determine the lattice parameter
mechanically slandered with SiC powder and mechanic- as a function of Mn concentration, homogeneous zones,
chemically polished in a 5% bromine-in-methanol solution. which had been characterized by EDAX measurements,
Over the cleaned surface, both secondary and backscat- were powdered and used to perform standard y–2y X-ray
tered modes were used. No inclusions or defects were powder diffraction scans. Measurements were carried out
observed at a magnification which ranged from 150 to in a Seifert XRD-3000TT two axis diffractometer. About
15000. the former studies, no other phases but the cubic one
For the EDAX axial compositional characterization, Hg corresponding to the HgSe host was detected. Conse-
and Mn percentage was determined by detecting the Hg La quently, there is no need of post-annealing processes to
and Mn Ka radiation lines. Typical profiles of Mn force phase transitions. On the other hand, the dependence
concentration throughout the Hg1xMnxSe ingot length, of the lattice parameter with the composition in the range
for nominal composition of x ¼ 0.09, are shown in Fig. 2. x ¼ 0–0.20 is shown in Fig. 3. As with the other
With this composition, the band gap is expected to coincide semimagnetic semiconductors, we found a linear Vergard
with that of Hg1xMnxTe for x ¼ 0.11, used in far-infrared relationship in the cubic phase region [2]. We include in
specific applications. Due to the intrinsic segregation of the Fig. 3 the linear fit from the experimental data. Specifically,
Bridgman method, there is a compositional gradient near Hg1xMnxSe lattice parameter could be used as a substrate
the first frozen end zone end of the ingot. From local fitting in the range 6.085–5.937 Å.
calculations using the static Pfann model [2], the Mn For the analysis of the evolution of band gap energy with
segregation coefficient was found to be about 2–2.5 at this Mn composition, far infrared transmittance measurements
starting region. These values are slightly less than those were performed on samples from different regions of the
reported for the Hg1xMnxTe growth with comparable ingot. So, room temperature transmittance measurements
composition and growth conditions [14], and leads to more were performed with the help of a Pelkin Elmer FTIR
Fig. 2. Axial distribution of the mole fraction of MnSe along the Fig. 3. Lattice parameter of Hg1xMnxSe crystals as function of MnSe
Hg1xMnxSe ingot. mole fraction.
ARTICLE IN PRESS
330 C. Reig et al. / Microelectronics Journal 38 (2007) 327–331
References