Escolar Documentos
Profissional Documentos
Cultura Documentos
Date : 3/13/2017
Resolution : 256 x 192
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Instrument : 6490(LA)
Acc. Volt. : 15 kV
Magnification : x 5,000
Dwell Time : 0.1 msec.
Sweep Count : 10
10 µm IMG1 10 µm Ni K
10 µm Cu K 10 µm Sn L
3600
Acquisition Parameter
Instrument : 6490(LA)
3200 Acc. Voltage : 15.0 kV
Probe Current: 1.00000 nA
2800
NiLa CuLl CuLa
PHA mode : T1
Real Time : 49.15 sec
2400 Live Time : 48.89 sec
Dead Time : 0 %
Counting Rate: 2146 cps
2000
Counts
CuKa
1200
NiLl
SnLa
SnLb2
SnLr2,
CuKb
NiKb
NiKa
800
SnLl
400
0
0.00 1.00 2.00 3.00 4.00 5.00 6.00 7.00 8.00 9.00 10.00
keV
ZAF Method Standardless Quantitative Analysis
Fitting Coefficient : 0.8546
Element (keV) Mass% Error% Atom% Compound Mass% Cation K
Ni K 7.471 10.45 3.90 11.41 10.9890
Cu K 8.040 85.74 5.63 86.53 85.8402
Sn L 3.442 3.81 1.86 2.06 3.1708
Total 100.00 100.00
JED-2300 AnalysisStation