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Jianping Zhang, Chao Liu, Guoliang Cheng, Xiao Chen, Jionglei Wu, Qunzhi
Zhu & Laichang Zhang
To cite this article: Jianping Zhang, Chao Liu, Guoliang Cheng, Xiao Chen, Jionglei Wu, Qunzhi
Zhu & Laichang Zhang (2014) Constant-stress accelerated life test of white organic light-emitting
diode based on least square method under Weibull distribution, Journal of Information Display,
15:2, 71-75, DOI: 10.1080/15980316.2014.889613
Constant-stress accelerated life test of white organic light-emitting diode based on least square
method under Weibull distribution
Jianping Zhanga∗ , Chao Liub , Guoliang Chengc , Xiao Chenc , Jionglei Wua , Qunzhi Zhua and Laichang Zhangd
a College of Energy and Mechanical Engineering, Shanghai University of Electric Power, Shanghai 200090, People’s Republic of China;
b Department of Automation Science and Technology, Xi’an Jiaotong University, Xi’an 710049, People’s Republic of China; c Shanghai
Tianyi Electric Co., Ltd., Shanghai 201611, People’s Republic of China; d School of Engineering, Edith Cowan University, 270
Joondalup Drive, Joondalup, Perth, WA 6027, Australia
(Received 9 November 2013; accepted 21 January 2014 )
It is currently hard to estimate the reliability parameters of organic light-emitting diodes (OLEDs) when conducting a life test
at normal stress, due to the remarkably improved life of OLEDs to thousands hours. This work adopted three constant-stress
accelerated life tests (CSALTs) to predict the life of white OLEDs in a short time. The Weibull function was applied to describe
the life distribution, and the shape and scale parameters were estimated using the least square method. The experimental test
data were statistically analyzed using a self-developed software. The life of white OLEDs predicted via this software is in
good agreement with that reported from the customers. The numerical results indicated that the assumptions of CSALT are
correct, and that CSALT can be used to predict the life of white OLEDs. This work confirmed that the life of white OLEDs
meets the Weibull distribution, and that the accelerated life equation conforms to the inverse power law. Furthermore, the
precise accelerated parameters were shown to be particularly useful in enabling the rapid estimation of white OLEDs’ life.
Keywords: white OLED; accelerated life test; LSM; Weibull distribution; constant stress
several categories [12]: constant-stress accelerated life test 2.3. Failure criterion and test end time
(CSALT), step stress accelerated life test, and progressive The life of the OLED device can be defined as the amount
stress accelerated life test. Among these three categories of time until the OLED luminance decreases to below 50%
of ALTs, CSALT is the most accurate and is also a bet- of the initial luminance. Based on this criterion, the failure
ter option if the amounts of the test samples and stresses time of each test sample was recorded. When all the samples
are quite small. Liu et al. [13] presented a design approach at the three stress levels failed, the tests were terminated.
for the sequential CSALT with an auxiliary acceleration
factor, which can further amplify the failure probability
of highly reliable test items at low stress levels while 3. OLED CSALT theory model
maintaining an acceptable degree of extrapolation for reli- 3.1. Basic assumptions
ability inference. Liu et al. [14] selected the accelerated Assumption 1 For each stress level Ii (i = 0, 1, 2, 3), the
mode and accelerated stress level in pneumatic solenoid white OLED life follows the Weibull distribution, and the
valve ALT by analyzing the sensitive stress in three kinds distribution function can be expressed as
of failure mechanisms (wear, fatigue, and aging), carried
m i
out ALT, and concluded that the mechanical performance t
of the solenoid valve is more stable than its electrical Fi (t) = 1 − exp − , t > 0, (1)
ηi
performance.
In this study, CSALT was performed to obtain the where mi is the shape parameter, which affects the geomet-
failure time and cumulative failure probabilities of white ric shape of the Weibull probability density curve, and ηi
OLED samples, and the least square method (LSM) was is the scale parameter that directly determines the curve’s
used to fit the curves at each stress level. Afterwards, the smoothness.
Kolmogorov–Smirnov tests were employed to determine if
the OLED life follows the Weibull distribution. The OLED Assumption 2 The OLED failure mechanism remains
curve of the life characteristic pattern can be obtained via unchanged while the stress ranges from I0 to I3 . As the
LSM, and it was confirmed that the OLED life characteris- mechanism of the white OLED is reflected by the shape
tic pattern meets the inverse power law. In addition, white parameter m of the Weibull distribution, the shape parame-
OLED life information can be acquired. ter at each stress level Ii should be unchanged, which means
m0 = m1 = m2 = m3 . (2)
2. OLED CSALT plan Assumption 3 The inverse power law can be used to
2.1. Selection of accelerated stress estimate the working life characteristics of electrical com-
OLED is a current-driving device, and current is the most ponents. The white OLED accelerated model satisfies the
important factor influencing the OLED life [8]. Therefore, inverse power law, namely that the relationship between
current was selected as the accelerated stress of ALT in scale parameter η and current stress level I is written as
this work.
ln η = α + β ln I , (3)
Table 1. Failure time of the tested samples under constant stress at different currents.
Failure time/h
Current stress/mA t1 t2 t3 t4 t5 t6 t7 t8 t9 t10
I1 = 9.64 1691.50 2084.67 2100.32 2374.50 2421.50 2586.00 2621.50 2680.50 2868.00 2879.50
I2 = 17.09 601.50 689.67 697.33 716.50 785.50 854.50 889.50 1115.67 1131.33 1251.50
I3 = 22.58 406.00 440.50 463.50 532.50 555.50 643.67 651.33 716.50 762.50 –
calculated using the following median rank formula: According to Assumption 2 (Section 3.1), shape param-
eter m is obtained as the weighted average of mi , as follows:
k − 0.3
F(tk,i ) = , k = 1, 2, . . . , ni , (7) 3
ni + 0.4 ni mi
m = i=1 . (14)
where n1 = n2 = 10 and n3 = 9. Therefore, the test data 3
i=1 ni
can be written as
Combining Equations (5) and (10), shape parameter mi 5.1. Data processing for CSALT
and scale parameter ηi at Ii are, respectively, expressed as The constant-stress test data listed in Table 1 were processed
by a self-developed software, and the statistics curves fit-
bi
mi = ai , ηi = exp − . (11) ted by LSM are plotted in Figure 1. Shape parameter mi ,
ai
2
n
n .
ni i 2
ni i 2
xk,i −
2
xk,i ni yk,i −
2
yk,i ni
k=1 k=1 k=1 k=1
(12)
scale parameter ηi , and determination coefficient R2i of the Table 2. mi , ηi , and R2i at each stress.
fitting curve at each current stress level can be obtained
Current
using Equations (10)–(12). These results are presented in stress (mA) I1 = 9.64 I2 = 17.09 I3 = 22.58
Table 2. It was found that the R2i calculated at each current
stress Ii (i = 1, 2, 3) approached 1, which demonstrated that mi 6.5764 4.2754 4.8350
ηi 2600.7568 959.9457 625.9725
the degree of linear fitting was high. R2i 0.9690 0.8909 0.9518
Funding
This study was financially sponsored by the Shanghai Subject
Chief Scientist Program (type B) [13XD1425200]; the Founda-
tion of Shanghai’s Committee of Science and Technology, China
[11160500600], [11dz2281700], and [09DJ1400204]; the Innova-
tion Program of the Shanghai Municipal Education Commission
[14ZZ154] and [13ZZ130]; the Key Fund of the Shanghai Science
Technology Committee [13160501000]; and the National Natural
Figure 2. Curve of the OLED life characteristic pattern. Science Foundation of China [50706025] and [51201097].
J. Inf. Disp. 75
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