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Module: I

Interference
(Topics)
Introduction, interference in thin films due to reflected
light interference in wedge shaped film,
light, film Newton
Newton'ss rings
rings,
Michelson's interferometer, Applications: To find the
diameter of a wire,, to find the wavelength
g of light
g and
refractive index of liquids and thin transparent sheets,
flatness of surface, thickness of thin-film coating, anti-
reflection coatings
Module I
(Interference)

Introduction Thin films Michelson's Interferometer


Introduction
Construction, Working and
related equations
Applications #

Introduction about thin films Interference due to reflected light in thin films of

Constant thickness
Introduction
Conditions for constructive and Varying thickness
destructive interference
Applications #

Uniformly varying thickness Non-uniformlyy varying


y g thickness
Ex: Wedge shaped film Ex: thin film that can form Newton's
rings
Introduction
Introduction
Conditions for constructive and destructive
interference Conditions for constructive and
destructive interference
Applications #
Applications #
# Applications
(1) Anti-reflection (or non-reflective) coatings
(2) Determination of
 wavelength of a monochromatic light
 diameter of a wire
 refractive index of liquids
 flatness of a surface
 refractive index of a material in the form of a thin sheet
 thickness of a thin sheet
(3) Distinguish between two wavelengths differed by small value

 
 
Module I – Interference  Page 2 of 24 
 
Introdu
uction

Thee term interfference” reffers to any situation


s in which two or more waaves overlap
p in space

Connditions for a recognizaable (or easiily observabble) and stabble (sustain


ned) interferrence
pattern are that thee waves unddergoing inteerference shhould
 have the saame/comparrable wavellengths
 have the saame amplitu ude
 be coherentt
Note:
 If two or more
m waves of the samee frequency y overlap at a point, the total effectt depends
on the phasses of the waves as welll as their ammplitudes
 When interrference occcurs the totaal wave at any a point at any instantt of time is governed
g
by the princciple of sup
perposition
 Two wavess are said to be coheren nt if they haave a definitte and consttant phase relationship
r

Con nterferencee is any situaation in whiich the amp


nstructive in plitude of the resultant wave
w is the
sum of the amplitu
udes of the individual waves
w that are
a undergoiing interfereence

Desstructive intterference is any situattion in whicch the ampliitude of the resultant wave
w is the
differen
nce between n the amplituudes of the individual w waves that are undergo oing interferrence

 
 
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Module I – Interferen Page 3 of 24 
 
A laayer of anyy material whose
w thickn
ness ranges from sub-n
nanometre tto a few miicrometre iss
called a thin film

Note:
Now onwarrds if the teerm “wave” is used it iss meant to represent
r a “light wavee” and “thin
n
film” iss used it is m
meant to ind
dicate “thin film of optiically transp
parent material”

Whyy a steady interference


i e pattern caan be obtain
ned due to light
l reflectted only fro
om the top
and botttom faces oof a thin film
lm but not of
o a thick fillm?

 In order
o for twoo waves to cause
c a steaady interfereence patternn, the wavess must be cooherent
 Thee sun and liight bulbs emit
e light i..e., ordinaryy light is em
mitted in a stream of short
s bursts,
eachh of which isi only a feww micrometters long
 If light
l reflectts from thee two (top and bottom m) surfaces of a thin ffilm, the tw wo reflected
d
wavves are part of the samee burst
 Hen nce these waves
w are co
oherent and a steady intterference pattern
p occu
urs
 If th
he film is tooo thick, ho
owever, the two reflecteed waves willw belong too different bursts
b
 Theere is no deefinite phasse relationsh hip between n different light
l bursts,, so the two
o waves aree
inco
oherent and there is no fixed interfference patttern

For example oone can see interferen nce colors in light reeflected froom an oil slick
s a few
w
micrommeters thick,, but cannott see such colors
c in thee light refleccted from a pane of wiindow glasss
with a thickness
t off a few milliimeters (a th
housand tim
mes greater))

In
nterferen
nce in thin films due to reeflected llight
(Condittions for connstructive interference
i e and destruuctive interfference due to light refflected from
m
the top and bottomm faces of a thin
t film)
 
 
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Module I – Interferen Page 4 of 24 
 
Suppose ‘μ
μ2 ( = μ)’ be the refractiive index off the materiaal forming a thin film of
o thicknesss
‘t’ betw
ween two otther transpaarent materials with reffractive indiices ‘μ1’ annd ‘μ3’ as sh
hown in thee
figure below.
b

Let the top p interface of the thiin film be illuminated d by a lighht of waveelength ‘λ’.
Interferrence takes place when n light refleected from the
t top inteerface (at B) and botto om interfacee
(at C) combine to ogether. Heere, since, light
l wavess of the sam me frequenncy and am mplitude aree
overlappping; the tootal effect deepends only y on the totaal phase diff
fference betwween them
This total pphase differrence betweeen the wavves is goverrned by thee effective optical
o path
h
differennce between n them and the phase shift
s of the rreflected waves
w relativve to the inccident wavee
at interffaces, if any
y, as followss

Effectivve optical paath difference


Effective opptical path difference (Δ ( effective ) = Extra opticcal path travvelled by Raay 1 - Extraa
optical path travellled by Ray 2
i.e.
Δeffective = µ1 (BF) ~ µ2 (BC + CD D)
From th he two rightt angled triaangles BGC C and DGC,
 t 
BC = CD D=  
 cos r 
and
B = GD = t tan r
BG
From th he right ang
gled trianglee BFD,
 2t
2 sin 2 r
F = 2t tan r sin r = 
BF 
 cos r 
Thus,  2t sin
s 2 r  2t 
 effectivee  µ1   ~ µ 2  
 cos r   cos r   
 
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Module I – Interferen Page 5 of 24 
 
If r = 0 i.e., if light were incident along the normal (or) under normal incidence condition

 effective  2µ 2 t  2µt
Relative phase shift
Suppose a light wave with electric-field amplitude Ei is traveling in an optical material
with index of refraction µa. It strikes, at normal incidence, an interface with another optical
material with index µb .The amplitude Er of the wave reflected from the interface is proportional
to the amplitude of the incident wave and is given by
 µ -µ  (normal incidence)
Er =  a b  Ei
 µa + µb 
Case 1: If µa > µb (i.e., speed of lighta < speed of lightb)
In this case, Er and Ei have the same sign, and the phase shift of the reflected wave
relative to the incident wave is zero
Case 2: If µa = µb (i.e., speed of lighta = speed of lightb) the amplitude of the reflected wave is
zero i.e., there is no reflected wave
Case 3: If µa < µb (i.e., speed of lighta > speed of lightb)
In this case, Er and Ei have opposite signs, and the phase shift of the reflected wave
relative to the incident wave is π rad (or 1800 or a half-cycle)

If neither or both of the reflected waves from the top and bottom surfaces have a half-
cycle reflection phase shift,
the condition for constructive interference is 2μt = mλ (m = 0, 1, 2, 3, ….)
the condition for destructive interference is 2μt = (m + (½) ) λ (m = 0, 1, 2, 3, ….)

If only one of the reflected waves from the top and bottom surfaces have a half-cycle
reflection phase shift,
the condition for constructive interference is 2μt = (m + (½) ) λ (m = 0, 1, 2, 3, ….)
the condition for destructive interference is 2μt = mλ (m = 0, 1, 2, 3, ….)

Note:
If the media forming a thin film are having the same refractive index i.e., μ1 = μ3 and
light undergoes reflection from the top and bottom surfaces of the thin film, only one of the two
reflected waves undergoes a reflection phase shift

 
 
Module I – Interference  Page 6 of 24 
 
Inteerferencee in thin films du
ue to refllected ligght - wedg
dge shapeed film

(Fringe widdth of the interference


i e fringes forrmed due too light refleected from the top andd
bottom surfaces off a wedge shaped thinn air film - a thin airr film with its thicknesss changingg
linearlyy with distannce)
Suppose a wedge shapped air (μthiin film = 1) film
f is form
med betweenn two glass slides (AC C
and ABB) kept in coontact as shoown in the figure
f below
w

Let the length ofo each glasss slide be ‘L’ that can be the maximum lengtth of the thin n film
Let ‘h’ be the thickness
t off the uniform
mly thick obbject separaating the twoo slides
If a monochroomatic lightt of waveleength ‘λ’ iss incident normally
n onn to the fillm, parallell
straightt interferencce fringes (as
( shown in i the figure below) arre formed ddue to refleected wavess
from thhe top and boottom interffaces of the air film

Let mth darrk fringe bee formed at a distance of ‘xm’ from m the edgee of the film
m where thee
two glaass slides aree in direct contact
c with
h each other i.e., where t = 0
 
 
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Module I – Interferen Page 7 of 24 
 
Let ‘tm’ be the thickness of the film at ‘xm’ then from the figure it can be written as
h t
slope, tan    m
L xm
tm L
x m               ( Int  1)
h

When light reflects from the top and bottom surfaces this wedge shaped air thin film,
only one of the two reflected waves undergoes a half-cycle reflection phase shift
Thus, under normal incidence, condition for destructive interference i.e., for mth dark fringe is
that
2tm = mλ (m = 0, 1, 2, 3, ……)
or

From (1) and (2) tm                 ( Int  2)
2
mλ L Lλ
xm   xm  m
2 h 2h
Similarly, it can be shown that for an nth dark fringe

xn  n          ( Int  3)
2h
Similarly, it can also be shown that for a pth bright fringe and a qth bright fringe

Lλ  1
xp   p            ( Int  4)
2h  2
and
Lλ  1
xq   q            ( Int  5)
2h  2

The distance between any two successive dark fringes or two successive bright fringes,
called “fringe width (β)”, can be obtained as follows

xm  xn  x p  xq  Lλ
β        ( Int  6)
m  n   p  q  2h

Thus, fringe width, β 
2h
Where
β → fringe width
L → Length of the glass slide (or total length of the thin film)
λ → Wavelength of the incident light
h → Thickness of the uniformly thick object separating the two glass slides

 
 
Module I – Interference  Page 8 of 24 
 
In
nterferen
nce in thiin films due
d to ref
eflected liight – Ne
Newton’s rings
r

(Newtonn’s rings – IInterferencee fringes forrmed due too light refleccted from thhe top and bottom
b
surfacess of a thin film
f whose thickness
t is changing nnon-linearlyy with distannce)

Suppose a thin
t film off refractive index
i ‘μ’ is formed bettween the coonvex surfaace of a
plano-cconvex lens and a flat suurface whenn they are inn contact with
w each othher as shownn in the
figure below
b

If a monocchromatic liight of wavelength ‘λ’ is incidentt normally oon to the film, circularr
interference fringes called ‘Neewton’s ringgs’ are form
med (as show
wn in the figgure below))

med due to light refleccted from thhe top and bottom facess
These interrference frinnges are form
of the thin
t film. T
These fringees are conceentric circlees with theirr centre at tthe point off contact off
the con
nvex surfacee of the lenns with the flat surfacee i.e., wheree the thicknness of the thin film iss
zero.
Suppose ‘RR’ be the raddius of curvvature of thee lens and mth dark fringe of radiuss ‘rm’ is duee
to the interference
i e of the refflected wavves from thhe bottom and a top surrfaces of thhe thin film m
portion of thicknesss ‘tm’.
From the fiigure it can be written as
a
 
 
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Module I – Interferen Page 9 of 24 
 
AC = AO = R
BC = r
and
BO = CP = t
Also, using Pythagoras theorem, from the right angle triangle ABC, it can be written as
AC2 = AB2 + BC2
⟹ AC2 = (AO – BO)2 + BC2
⟹ R = (R − ) + r
⟹ R = R − 2R + + r

Since, tm is very small, can be neglected


∴ R = R − 2R + r
On rearranging the terms
R − R + 2R = r
2R = r or r = 2R

4rm2
= 2 Rt m
4
(2rm )2 = 8Rtm
D m2 = 8Rt m − − − − − − − − − − − − − (1)

where ‘Dm’ is the diameter of the mth dark fringe

If the media forming a thin film are having the same refractive indices and light
undergoes reflection from the top and bottom surfaces of the thin film, only one of the two
reflected waves undergoes a relative phase shift equal to half cycle. So, under normal incidence,
condition for destructive interference i.e., for mth dark fringe is that

2μtm = mλ (m = 0, 1, 2, 3, …)

Or mλ
tm = − − − − − − − − − − − − − − − −(2)

Thus, 8Rmλ
D 2m =

4λRm
 D 2m = − − − − − − − − (3)
μ

Similarly, it can be shown for nth dark fringe that

Module I – Interference Page 10 of 24


4λRn
 D 2n          (4)
μ
Similarly, it can also be shown for pth and qth bright fringes that

 1
4λR  p  
 2
D 2p          (5)
μ
and
 1
4λR  q  
 2
D 2q          ( 6)
μ
From either (3) and (4) or (5) and (6) it can be written as
4λR
D m2  D n2  m  n   D 2p  D 2q  4λR  p  q        (7)
μ μ
On rearranging the terms

R

μ D 2m  D 2n

 
μ D 2p  D 2q  (units of length)       (8)
Where
4λ m  n  4λ  p  q 
R → Radius of curvature
μ → Refractive index of the thin film
Dm and Dn → the diameters of the mth and nth dark fringes respectively
Dp and Dq → the diameters of the pth and qth bright fringes respectively
λ → Wavelength of the incident light

 
 
Module I – Interference  Page 11 of 24 
 
Types of th
hin films based on theeir thicknesss and interference – A compariison

 
 
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Module I – Interferen Page 12 of 24 
 
 
 
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Module I – Interferen Page 13 of 24 
 
Michelson’s interferometer

Introduction

Michelson interferometer is an experimental device used to make precise and accurate


measurements of very small lengths

Ex: It is used to measure the minute changes in thickness of an axon when a nerve
impulse propagates along its length

Construction

The principal components of a Michelson interferometer are


 a beam splitter
 a compensator and
 two mirrors
The beam splitter is a glass plate with a thin coating of silver on one side. It splits the
light, falling on it from the source, into two portions

The compensator is a plate cut from the same piece of glass as beam splitter i.e., beam
splitter and compensator are made up of the same glass material and their thicknesses are
identical to within a fraction of a wavelength

 
 
Module I – Interference  Page 14 of 24 
 
The purposse of the com mpensator plate
p D is too ensure thatt both the portions of th
he split
light paass through tthe same thhickness of glass
g
Two mirrorrs perpendiccular to each h other are arranged inn the paths oof the two spplit light
portionss. They refllect the splitt light portio
ons back. O
Only one of them is movvable and th he other is
fixed.
The whole apparatus iss mounted on o a very rig gid frame

Workin
ng

Michelson interferomeeter works ono the princciple of “interference”.


A monochhromatic lig ght from a single so ource (A), on enteriing into a Michelson n
interferometer, is divided intto two wav ves by means of beaam splitter (C). Part ofo the lightt
(represeented by “1” in the fig
gure) passess through th
he silvered surface
s and the compen
nsator platee
 
 
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Module I – Interferen Page 15 of 24 
 
D and is reflected from mirror M1. It then returns through D and is reflected from the silvered
surface of C to the observer. The remaining portion of the light (represented by “2” in the figure)
is reflected from the silvered surface at point P to the mirror M2 and back through C to the
observer’s eye. Interference occurs when these two waves followed different paths are
recombined.
The position of mirror M2 can be adjusted with a fine, very accurate micrometer screw.
If the distances L1and L2 are exactly equal and the mirrors M1 and M2 are exactly at right
angles, the virtual image of M1 formed by reflection at the silvered surface of plate C coincides
with mirror M2
If L1 and L2 are not exactly equal, the image of M1 is displaced slightly from M2;if the
mirrors are not exactly perpendicular, the image of M1 makes a slight angle with M2. Then the
mirror M2 and the virtual image of M1 play the same roles as the two surfaces of a wedge-shaped
thin film and light reflected from these surfaces forms the same sort of interference fringes.
Thus, depending on the difference in the distances of the two mirrors (L1 ~L2) and the
inclination between them the fringe pattern may contain a set of alternate dark and bright,
parallel – straight/curved/circular – localized/non-localized fringes

Note:
1
Every move of movable mirror by  4 λ causes a shift by half a fringe i.e., each dark fringe shifts
to where the adjacent bright fringe had been
Every move of  1 λ movable mirror by causes a shift by one fringe i.e., each dark fringe shifts
2
to where the adjacent dark fringe had been

Applications

Determination of the diameter of a wire

A wedge shaped thin air film is formed by placing two glass slides, each of length ‘L’ cm,
one over other such that they are in direct contact with each other at one end and separated by a
thin wire of diameter (h cm – to be determined) at the other end as shown in the figure below.

 
 
Module I – Interference  Page 16 of 24 
 
If a monochhromatic ligght of know wn wavelenggth ‘λ cm’ iss incident nnormally on to the film,,
parallell straight altternate brighht and dark interference fringes arre formed duue to reflectted light
from thhe top and boottom facess of the air film.
f
The fringe width, β cm m, is measurred by usingg a microscoope.
By using thhe relation

β
2h
the diam
meter of thee wire is dettermined
Where
β → friinge width in cm
L → lenngth of the gglass slide (or
( total len
ngth of the thhin film) inn cm
λ → waavelength off the incidennt light in cm
h → diaameter of thhe thin wire separating the two glaass slides in cm

Deeterminatioon of the waavelength of


o light

Wave leength of a m
monochrom
matic light caan be determ
mined by vaarious technniques based
d on
interference phenomenon of liight

mination of wavelength
Determ h using inteerference in wedge sh
haped thin ffilm

A wedge
w med by placcing two glass slides, eeach of length ‘L’ cm,
shapeed thin air film is form
one oveer other succh that they are in direcct contact with
w each otther at one eend and sep parated by a
thin wirre (or a thinn sheet) whhose diametter (or thickkness) is ‘h’’ cm at the other end as
a shown in n
the figuure below.

 
 
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Module I – Interferen Page 17 of 24 
 
If a light off unknown wavelength
w ‘λ cm’ is inncident norm
mally on to the film, paarallel
straightt alternate bright and daark interfereence fringess are formedd due to refl
flected light from the
top and
d bottom facces of the airr film.
The fringe width, β cm m, is measurred by using g a microscoope.
By using thhe relation

β
2h
velength of tthe incidentt light is dettermined
the wav
Where
β → friinge width in cm
L → lenngth of the gglass slide (or
( total len ngth of the th
hin film) in
n cm
λ → waavelength off the inciden nt light in cm
h → diaameter of thhe thin wire or thicknesss of the thinn sheet sepaarating the ttwo glass sllides in cm

Determ
mination of wavelength
h using New
wton’s ringgs experiment

A thin film
m of air is forrmed betweeen the convvex surface of a plano-cconvex lenss and a flat
glass slaab when theey are in contact with each
e other aas shown in the figure bbelow

If a light of
o unknown n wavelengtth ‘λ cm’ iis incident normally oon to the film, parallell
circularr alternate dark
d and briight interferrence fringees called ‘N
Newton’s rinngs’ are forrmed due to
o
 
 
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Module I – Interferen Page 18 of 24 
 
light reflected from the top and bottom faces of the thin film. These fringes are concentric circles
with their centre at the point of contact of the convex surface of the lens with the flat surface i.e.,
where the thickness of the thin film is zero.
Let ‘R’ be the radius of curvature of the lens in cm.
The diameters of a series of dark fringes (or bright fringes) are measured by using a
microscope. A graph is plotted between the number of the dark fringes (or bright fringes) on x-
axis and the squares of their corresponding diameters on y-axis. The resultant curve is going to
be a straight line passing through the origin as shown in the figure below
Y

2
Dm

2 2
D / cm
2
Dn

(0,0) th th X
n m
Number of the ring  

The slope of the curve


D  D 2n
2
m  and R are substituted in the following equation to
obtain the value of λ m  n 

R
D  D 2n
2
m
cm

4λ m  n 
Where
R → Radius of curvature in cm
Dm and Dn → the diameters of the mth and nth dark (or bright) fringes in cm respectively
λ → Unknown wavelength of the incident light in cm

Determination of wavelength using Michelson interferometer

Wavelength of a given source of light can be determined using a Michelson


interferometer. The working principle of the interferometer is shown the figure.
Light, whose wavelength λ to be determined, is sent from light source to the beam splitter
while the mirrors M1 and M2 are exactly at right angles with each other. Circular fringes formed
due to interference are projected on to a screen. Now the distance ‘d cm’ moved by the movable
mirror M2 is noted for crossing a reference point by ‘m’ fringes. By using the following relation
2d
2d  mλ  λ 
the wavelength of the light is determined. m
 
 
Module I – Interference  Page 19 of 24 
 
Deteermination
n of refractiive index off liquids

m of air is forrmed betweeen the convvex surface of a plano-cconvex lenss and a flat
A thin film
glass slaab when theey are in contact with each
e other aas shown in the figure bbelow.

If light is incident noormally on to the film m, parallel circular


c alteernate darkk and brightt
interference fringees called ‘NNewton’s rinngs’ are forrmed due too light refleected from the top andd
bottom faces of thee thin film. These fringges are conccentric circlles with theiir centre at the point off
contact of the convvex surface of the lens with the flaat surface i.e., where thhe thicknesss of the thinn
film is zero.
z
The diametter of a darkk fringe (or bright fringge) is measuured by usinng a microsccope.
Now air fillm is replaaced with a liquid whoose refractivve index (μ μ) is to be determinedd
while maintaining
m all other exxperimental conditions the same.

 
 
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Module I – Interferen Page 20 of 24 
 

liquid 
 D
air
film

 D
liquid
film

Once again the diameter of the same dark fringe (or bright fringe) is measured by using a
microscope
The refractive index (μ) of the liquid is determined by using the following equation

Where
D air film and Dliquid film represent the diameters of the same dark (or bright) fringe with air film and
liquid film respectively
Determination of refractive index of thin transparent sheets

Refractive index of a thin transparent sheet can be determined using a Michelson


interferometer.

The interferometer is set up to produce straight line fringes. To do this, first circular
fringes are obtained using sodium (Na) light source and then turn the micrometer screw so that
fewer and fewer rings are visible. When one large indistinct fringe occupies the entire field - this
is the situation where M2’ coincides exactly with M1, i.e. the two light beams received at the eye
has zero optical path difference (OPD), tilt M2 slightly (finely adjust the micrometer if
necessary) until the fringes become straightest and sharpest.
Now substitute white light for the Na light and look for white light fringes. White light
fringes are localized fringes with a dark fringe at the centre and 5 or 6 coloured fringes on both

 
 
Module I – Interference  Page 21 of 24 
 
sides. Turn the micrometer slowly until white light fringes appear at the centre of the field of
view. Note down the reading of the micrometer and then insert a transparent sheet in the beam
GM2. The transparent sheet increases the optical path of one of the light beams and hence
destroys the zero OPD condition. As a result, white light fringes disappear. To get back to the
zero OPD condition, turn the micrometer until the white light fringes return to the centre of the
field of view. Note down again the reading of the micrometer.
If n is the number of Na fringes corresponding to the distance D moved by the
micrometer to restore the OPD condition, then
2tμ - 2t = nλ
2t(μ -1) = nλ
or μ = [nλ/(2t)] + 1
where t is the thickness of the transparent sheet and μ its refractive index.
Measure t with a micrometer gauge and obtaining n from graph of experiment meant for
the calibration of the micrometer screw of the interferometer and hence determine the refractive
index of the material from which the transparent sheet is made of.

Flatness of surface

Using Newton’s rings experiment

If a given transparent optical element replaces the plano convex lens in the Newton’s
rings experiment and the radius of curvature obtained is infinite for it then the optical element is
perfectly flat.

Using Michelson interferometer

The flatness of the surface of a transparent plate can be tested using a Michelson
interferometer. If the placement of the plate to be tested in the path of the one of the two beams
does not disturb the ring pattern then the plate is perfectly flat.

Note:
If a lens is of good quality it forms perfect rings without any distortion in the Newton’s
rings experiment.

Determination of thickness of thin-film coating

Monochromatic light is illuminated onto the thin-film coating whose thickness to be determined.

 
 
Module I – Interference  Page 22 of 24 
 
By varyingg the waveleength of thee light, the wavelength
w λ that refleects most strrongly from
m
m
the film or absorbs
s strongly by
y the film is
s found.
t = λ/((2μcoating) in the caase of strong
g reflection or
t = λ/((4μcoating) in the casse of strong absorption

he thicknesss of the thin-film coatin


gives th ng.

Antireflectiion coatingg (or) non-rreflective cooating is a coating


A c depoosited on a glass
g (or a
transparrent substraate) surface to reduce th
he overall reeflection fro
om the surfaace from 4 - 5% to lesss
than 1%
%

Non-reflecttive coatinggs for lens su urfaces makke use of thiin-film interference.


A thin layeer or film of hard traansparent m material with h an index of refractiion (μcoating)
smaller than that oof the glasss (μsubstrate) is depositeed on the leens surface.. Light (inccident underr
normal incidence ccondition) is reflected d from both surfaces off the layer. In both refflections thee
 
 
nce 
Module I – Interferen Page 23 of 24 
 
light is reflected from a medium of greater index than that in which it is traveling, so the same
phase change occurs in both reflections. If the film thickness (t) is a quarter of the wavelength (λ)
in the film, the total path difference is a half wavelength. Light reflected from the top surface of
the coating is then a half-cycle out of phase with that from the bottom surface of the coating and
as a result there is destructive interference
If μ air
< μ coating < μ substrate the thickness of the non-reflective coating
2μcoatingt = λ/2
Thus, t = λ/(4μcoating)
for only one particular wavelength (λ)

 
 
Module I – Interference  Page 24 of 24 
 

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