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PRIYANKA K. P.1, BABITHA K. K.1, SHEENA XAVIER2,
MOHAMMED E. M.2, and THOMAS VARGHESE1*
Department of Physics, Nanoscience Research Centre (NSRC),
1
CONTENTS
Abstract.......................................................................................................62
7.1 Introduction........................................................................................62
7.2 Experimental......................................................................................63
7.3 Results and Discussion......................................................................64
7.4 Conclusions........................................................................................66
Acknowledgment........................................................................................66
Keywords....................................................................................................67
References...................................................................................................67
ABSTRACT
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tions in microelectronics and optics.
7.1 INTRODUCTION
7.2 EXPERIMENTAL
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For TEM studies, the CeO2 powder was dispersed in ethanol using an
ultrasonic bath. A drop of suspension was placed on a copper grid coated
with carbon film. After drying, the copper grid containing nanoparticles was
placed on the holder for the imaging process. The powder was then consoli-
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dated in the form of cylindrical pellets of diameter 11 mm and thickness d =
1.2 mm at a pressure of ~7 GPa using a hydraulic press for dielectric studies.
Both the faces of the pellets were coated with air-drying silver paste. Dielec-
tric measurements as a function of frequency in the range from 100 Hz to
10 MHz are measured at various selected temperatures from 303 to 423 K
using a four-probe LCR meter (Wayne Kerr H-6500B model) in conjunction
with a portable furnace and temperature controller (±1 K). The dielectric
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constant was calculated by using the formula έ = Cd/ε0 A, where A is the
surface area and C, the measured capacitance of the pellet. AC conductivity
(σac) is obtained from the data of dielectric constant (έ) and loss (tanδ) using
the relation σac = έε0 ωtanδ, where ε0 is the permittivity of vacuum and ω the
angular frequency.15
Figure 7.2(a) displays the XRD pattern of the cubic CeO2 samples annealed
at 400°C for 3 h. From XRD patterns, the average size of the particles
corresponding to annealing temperature estimated using Scherrer equation
was 9 nm. The principal d values taken from the JCPDS file No. 75-0076
for CeO2 are in close agreement with the observed d values. Figure 7.2(b)
shows the TEM image of the synthesized CeO2 particles. The particle size
obtained from TEM images is about 10 nm, which is in agreement with the
XRD analyzed value. The TEM image reveals that particles are not exactly
spherical in shape. Selected area electron diffraction is shown in the inset of
Figure 7.2(b), which clearly indicates that the CeO2 nanoparticles are highly
crystalline in nature.
Figure 7.3(a) shows the variation of dielectric constant with frequency
for temperatures from 303 K to 423 K. It can be seen that the real part of
dielectric constant έ for all temperatures has high values at low frequen-
cies which decrease rapidly as frequency increases and attains a constant
value at higher frequencies. In dielectric nanostructured materials, inter-
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faces with large volume fractions contain a large number of defects, such as
dangling bonds, vacancies, vacancy clusters, and microporosities, which can
cause a change of positive and negative space charge distribution in inter-
faces. When subjected to an electric field, these space charges move. When
Synthesis, Characterization, and Electrical Properties 65
they are trapped by defects, a lot of dipole moments are formed. At low-
frequency region, these dipole moments easily follow the variation of elec-
tric field11 (Rao et al., 1997). So the dielectric loss and hence the dielectric
constant show large values at low frequency. As temperature is increased,
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more and more dipoles are oriented, resulting in an increase in the value of
dielectric constant for a given value of frequency9. At very high-frequency
(MHz) region, the charge carriers would have started to move before the
field reversal occurs and έ falls to a small value at higher frequencies. Space
charge polarization and reversal of the direction of polarization contribute
much to the έ.6
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FIGURE 7.2 (a) XRD pattern and (b) TEM image of CeO2 nanoparticles.
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FIGURE 7.3 Variation of (a) dielectric constant with frequency, (b) tanδ with frequency,
and (c) σac with frequency of CeO2 for temperatures from 303 to 423 K.
7.4 CONCLUSIONS
ACKNOWLEDGMENT
For Non-Commercial Use
The authors are grateful to KSCSTE, Thiruvananthapuram for providing
financial support.
Synthesis, Characterization, and Electrical Properties 67
KEYWORDS
•• nanoparticles
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•• cerium nitrate
•• dielectric constant
•• frequency
•• conductivity
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