Teradyne FLEX

BASIC OPERATION
 TRAINING OBJECTIVES
• At the end of the course the attendees should be able to
perform basic operation of the equipment.

 In order to do this, attendees should:

• Understand the system capabilities.
• Identify major section of the test system, and describe the
function of each major section.
• Perform proper power up and shutdown procedure of the system.
• Operate the Tester User Interface.
• Understand safety precaution when operating the equipment.
 TRAINING OUTLINE
• System Description
• Installing the DIB
• Proper Power Up and Power Down Procedure
• User Interface Operating Guidelines
• System Diagnostics
• Safety Precautions
• System Description
• Installing the DIB
• Proper Power Up and Power Down Procedure

LESSON 1
 FLEX TEST SYSTEM

INTEGRA FLEX MICRO FLEX

ULTRA FLEX
 SYSTEM OVERVIEW
 FLEX Series values performance for linear, mixed-signal and
VLSI (SOC per pin) testing
 Tester in a test head architecture, with more integrated analog
instrumentation
 Architectured for multisite testing
 Can be configured.
 Hyperflex DSP for scalable processing requirements
 Digital speed up to 200 MHz
 SYSTEM REQUIREMENT
• AC SUPPLY REQUIREMENT: 208VAC TO 480VAC
– (208V - 50/60Amps)
• OPERATING TEMPERATURE: 5 ºC – 40 °C
• HUMIDITY: 50 RH
SYSTEM MAJOR COMPONENT
SYSTEM MAJOR COMPONENT
SYSTEM MAJOR COMPONENT
System Description
Ultra FLEX
Support
Manipulator Cabinet

Computer

Test Head
SYSTEM MAJOR SECTIONS

ULTRA
 COMPUTER
• Sample IG-XL file
SUPPORT CABINET

• For INTEGRA & ULTRA FLEX

Test Systems only.
• Contains some of the
electronics needed to test
devices on the heads,
cabling from the support
cabinet connects to the test
head.
SUPPORT CABINET
-monitors the
temperature and
can trigger the
system to
shutdown if the
temp is out of
range
 SUPPORT CABINET
• POWER
1. Power Distribution Unit (PDU)
- Converts, filters and distributes AC and DC power to the entire system.
Distributes and balances power to the system.
- 3 OUTPUT VOLTAGES: 48VDC, 120VAC, 208VAC

2. EMO, Indicators
- EMOs shuts down the system in an emergency.
- Various indicators are used to indicate the system status of various functions.
- Interfaces are used so that the user can communicate with the system.

3. DC Power Supply
- It is located in the support cabinet and contains a +48 VDC module and two
+24VDC modules.
 SUPPORT CABINET
• System Monitor/Controller (SMC)
Controls system turn-on/off and monitoring functions
with the intent of protecting the test system. Monitors
signals and DC voltages.
• Cooling
- The iFLEX/mFLEX test systems are air-cooled.
- uFLEX is cooled by water and air.
- Plenum mounts to the test head
- The impeller (cooling system) is located in manipulator
cabinet
- Cooling fans located in the PDU
COOLING
MANIPULATOR

• Electromechanical
hardware that supports the
test head.
• Positions the test head to
the customer’s
handler/prober interface for
docking.
• Allows the test head to be
moved in seven axes.
 MANIPULATOR
• Z-travel is motor-driven for i-FLEX.
• It is manually-driven for mFLEX and uFLEX.
TEST HEAD
• Holds the device interface
board (DIB), which holds
the device under test.
• Interface to a customer
supplied handler/prober.
• Contains some of the
electronics needed to test
devices
TEST HEAD

Ultra FLEX
 TEST HEAD OVERVIEW

INTEGRA FLEX MICRO FLEX

 TEST HEAD (INTEGRA FLEX)
• The test head card cage has 26 slots that contains
analog/digital hardware.

• Slots 7 and 20 are dedicated slots that contain the two

(2) support boards, the rest are universal slots that are
populated with the instrument boards that test the
customer’s devices,
 TEST HEAD (INTEGRA FLEX)
• A center card guide partition divides the test head into two
hemispheres.
• Each hemisphere has 13 slots.
• Two +48 VDC bus bar assemblies reside in the test head: one
supplies +48V for the boards in slots 1 through 13, and the
other for slots 14 through 26.
• At the end of each instrument board and support board is one
power tab, with two contact pads, that make contact with two
forks in the +48 VDC bus bar assembly.
• The +48 VDC bus bars receive power from the power
distribution unit (PDU) via two power cables.
TEST HEAD (INTEGRA FLEX)
 TEST HEAD (INTEGRA FLEX)
• There are two support boards in the FLEX test system.
• One is designated as the master support board (MSB)
and the other is the slave support board (SSB).
• The support boards are in the center slots of the system
hemispheres.
– The MSB is located in slot 7 and the SSB is located in slot
20. These positions allow for optimal routing of signals to
and from instrument slots, because the furthest
instrument is only six slots away from the support board.
– The support board slots are keyed so that only support
boards can be inserted into them.
 TEST HEAD (MICRO FLEX)
• Use only one hemisphere of instrument slots.
• Contains 13 slots, slot 7 dedicated for Master Support
Board, while the Universal Support Module or SSB do not
occupy any tester slot.
• Each Micro FLEX system includes a single board computer
in a custom chassis
– Note: For latest Micro FLEX Tester (i.e. 52MFLEX above) the
computers are installed outside the test head on the
anthro cart.
TEST HEAD (INTEGRA FLEX)
TEST HEAD (MICRO FLEX)
TEST HEAD (ULTRA FLEX)
 TEST HEAD SUMMARY
iFLEX mFLEX uFLEX
2 hemispheres 1 hemisphere 1 hemisphere
26 slots 13 slots 13 slots
48V supply – 2pcs 48V supply – 1 pc 48V supply – 4 pc
Dedicated slots :
7 – MSB 7 – MSB 24 – Primary Support Brd
20 – SSB (MSB)
Pogo Pin Pogo Pin Interposer
FLEX CONFIG
 INSTALLING THE DIB
(Device Interface Board)
 INSTALLING THE DIB
(INTEGRA FLEX)
1. Rotate the test head to the DUT UP position using twist
controls.
 INSTALLING THE DIB
(INTEGRA FLEX)
2. To adjust height of the test head, while holding in the
side button on the docking control panel press the
appropriate “UP” and “DN” (down). The speed of the
”UP” or “DN” action can be altered by pressing the “HI”
(fast) or “LO” (slow) button.
 INSTALLING THE DIB
(INTEGRA FLEX)
3. To remove a DIB from the test head, press the
undocked button. The DIB is ready to be removed
from the test head when the undocked stated LED is
steady.
 INSTALLING THE DIB
(INTEGRA FLEX)
4. When placing the required DIB on the test head, the
DIB is keyed so that it can only be installed in one
orientation. The DIB status LED is green constantly
on when the DIB is placed on the test head indicating
that the inner pull down function is available. To
complete the inner pull down, press the “Docked
State” button. The LED will flash green until the
process is complete. When the light is a solid green
the DIB is completely latched.
 INSTALLING THE DIB
(MICRO FLEX)
1. Rotate the test head to the DUT Up position using the Twist
Adjustment as illustrated below.
2. To adjust height of test head, unlock the locking knob by
pulling it out, pull out the stop pin then slowly push the test
head up/down. When the stop pin is line up with the hole on
the manipulator, push it in then lock the locking knob.
 INSTALLING THE DIB
(MICRO FLEX)
3. To remove a DIB from the test head, press the UP button on
the pendant pictured below.
4. When placing the required DIB on the test head, the DIB is
keyed so that it can only be installed in one orientation. To
complete the inner pull down, press “Down” state Button.
The LED will flash green until the process is completed.
When the light is a solid green the DIB is completely latched.

UNDOCKED
STATE
BUTTON

DOCKED
STATE
BUTTON
 INSTALLING THE DIB
(ULTRA FLEX)
1. Rotate the test head to the DUT Up position using the Twist
Adjustment. (like micro FLEX)
2. To adjust height of test head, unlock the locking knob by
pulling it out, pull out the stop pin then slowly push the test
head up/down. When the stop pin is line up with the hole on
the manipulator, push it in then lock the locking knob.
 INSTALLING THE DIB
(ULTRA FLEX)
3. To remove a DIB from the test head, press the undocked
button. The DIB is ready to be removed from the test head
when the undocked stated LED is steady.
4. When placing the required DIB on
the test head, the DIB is keyed so that
it can only be installed in one orientation.
To complete the inner pull down,
press the “Docked State” button.
The LED will flash green until the
process is complete. When the
light is a solid green the DIB is completely latched.
POWER UP AND POWER
DOWN PROCEDURE
 POWER UP PROCEDURE
(iFLEX/ mFLEX)
1. Make sure that all EMOs are in depressed position.
2. Turn ON the Main Power Switch of the tester.
3. Turn ON the Tester Power.
4. Turn ON the User Computer.
5. Login to the user computer.
• Username: prod
• Password: Tes+er
 SHUTDOWN PROCEDURE
(iFLEX/ mFLEX)
1. Close all running applications.
2. Shutdown the user computer same as shutting down
an ordinary PC.
3. Wait for the computer to fully shutdown, before
turning OFF the tester power.
4. Turn OFF the main power switch.
 POWER UP PROCEDURE
(uFLEX)
1. Unlatch the EMO, turn on Main Breaker and Test System Power
2. Power on the user computer and wait for the log in prompt
3. Log in user name is (prod) and password is (Tes+er)
4. Turn on the DSP Computer . (figure 3)

(figure 3)
- press the DSP Computer switch (other LED should turn on) and wait for approx 10 seconds to boot up
- Indication of DSP computer boot up is upon detection of 1.0Gbps network connection

3. Open Maintenance UI, there should be no error manifestation

Note: Computer and DSP Checker can be performed on Full Check, not available on Quick Check
 SHUTDOWN PROCEDURE
(uFLEX)
1. Close all applications and program
2. Shutdown the DSP Computer Module
- Locate the executable file named DspPcShutdownTool.exe shortcut at the desktop
- Note: File is located at C:\Program Files\Teradyne\IG-XL\7.30.00_uflx\bin
- A GUI window will pop up (figure 1)

(figure 1) (figure 2)
- Click the Shutdown All DSP PC’s icon to execute shutdown
- Message will prompt to wait for 30s to finish the shutdown
- Indication of shutdown DSP is when the DSP LED indicators turns-off (only one LED remains on).
(figure 2)

3. Shutdown the User Computer, steps is similar to that of I/MFLEX.

4. Turn off the tester power off and hit the EMO for full shutdown
• User Interface Operating Guidelines

LESSON 2
 LOG-IN PROCEDURE
• To login to the Integra Flex tester, the following steps should
be followed:
– On the Compaq computer, press simultaneously the keyboard buttons,
“CTRL”, “ALT”, “DELETE”.
– At the “Log on to windows” combo box logon on to the system using:
• USERNAME: prod
• PASSWORD: Tes+er
– And Click “OK” button using computer mouse.
Use this
computer
 USER INTERFACE
• The user interface or production UI give operators
maximum control in selecting program to load, in
specifying a job, part number, channel map, and
environment to use, in specifying which site to test, in
selecting a handler or prober and in setting up data
logging.
• To start production lot testing, double click on the User
interface icon on the desktop to activate it.
PRODUCTION USER INTERFACE

Use this ICON for

NON-STRIP area

Use this ICON for

Tapestry area
 USER INTERFACE PREVIEW

1. Binning and Lot Summary 6. Test/Lot Configuration

2. Lot Device Details 7. Load Options
3. Type of Handler/Prober Connected 8. Current User logon
4. Program Status 9. Test Program Output Window
5. Tool Bar 10. Lot Management Section
MANIPULATING THE UI
• Selecting Handler or Manual Test
• Loading a Test Program
• Entering LOT ID Information
• Start Testing
• Datalogging
• Lot Summary
 SELECTING MANUAL TEST OR
HANDLER MODE
• Enabling the handler on a Flex/MicroFlex Systems needs to be
performed manually by the Technician or Setup Specialist
prior to starting a test lot. The “Technician” button is
password protected (configurable by your local IS
administrator).
 SELECTING MANUAL TEST OR
HANDLER MODE
1. Click on the “Technician” button on the ADI Production UI.

2. Enter the password for technician account which is

“Teradyne”.
 SELECTING MANUAL TEST OR
HANDLER MODE
3. Click the Handler/ Prober Icon.

4. For Manual Test mode uncheck the check box, else check
for Handler Mode.
 SELECTING MANUAL TEST OR
HANDLER MODE
5. By checking the box , the pull-down menu at the bottom of the
window will now be enabled and will display a list of ADI supported
handler for production selection.
Select the correct handler driver to be used and
press the OK button.
 SELECTING MANUAL TEST OR
HANDLER MODE
• After the Technician or Setup Specialist has completed
the selection between “Manual Test” or “Handler”
modes, they are required to click on the “Production”
button on the UI Tool Bar to complete the handler setup
and enable production testing.
 LOADING A TEST PROGRAM
1. Click Load File button in the Load Options Window in the
User Interface.

2. After clicking the Load File button, All of the Program Vspec
names will be listed on the right side of the window. Double click
on the Program Vspec. Choose the correct program. “Process
this File” button should then be highlighted.
 LOADING A TEST PROGRAM

3. Click on “Process this file” button and the program will

start loading.
Once loading is completed, a “Program Loaded” message should be visible on
the status bar on the UI.
 Entering LOT ID Information
Example of properly filled
up Data lot parameters.
*Part name of the device is automatically loaded based from the program load file.
After loading a Test
Program a Test Lot
can be started by
clicking on the
“Start Lot” button in
the Lot
Management
section of the UI.
 ENTERING LOT ID INFORMATION
• TEST TYPE: Following options can be seen on the drop
down. Leave this field empty.
a) PQ – Product Qualification
b) SA – Samples
c) YA – Yield Analysis
• LOT ID: (ex. AE12345.1_2nd_partial)
After typing the LOT ID, please follow them with
description (Ex. std_ver, class, ils, eval, etc.). Use underscore
“_” instead of space in between words.
– Note: Do not use any of the ff. character i.e. (\; * >< “ / |?). This will cause
Tester Hang Up and cause error during STDF creation. If space is use instead
of “_” underscore the STDF file will not open in unix base DATATOOL.
 ENTERING LOT ID INFORMATION
• Error will now be triggered if any invalid characters has
been detected on the field box after clicking OK button.
 ENTERING LOT ID INFORMATION
• STAGE: Provide the actual Class Test Temperature or you
can refer to PRODs for required class temperature.
• TEST CODE: Following options can be seen on the drop
down. Please use them based on the type of the program.
FT – choose this if using FT or PD program
QA – choose this if using ILS/QC/QA program.
QART – choose this if retesting Lot using ILS/QC/QA program.
QART2 – choose this if retesting Lot to ILS/QC/QA the 2nd time.
– Note: Providing correct data on the “Test Code” will ease up STDF
classification.

• Once Data Entry Completed hit “OK”.

 TDR AND DIB CALIBRATION
• When the “OK” button is clicked in the “Data lot
Parameters” window, the User Interface
automatically performs TDR calibration.
• Please take note the two are different in nature.
1. TDR (Time Domain Reflectometry) calibration measures
the signal path on the DIB for the digital channels needed
for edge placement for the digital patterns.
2. DIB calibration is needed to negate the effect of board
leakage with the actual leakage measurements. To
automatically do DIB calibration.
 TDR AND DIB CALIBRATION
• Once the test program is loaded, the system will
automatically launch the calibration TDR. If the
calibration fails the following message will be
displayed:

• If DIB Calibration failed, the program will not be

loaded by the system. Proceed to setup verification.
 START TESTING
• To start the testing click on the “Resume” button on the
ADI User Interface. The “Resume” button must be
pressed before the SOT button on the handler is pressed.
If not, the handler will not start testing.
 MANUAL TEST
• To perform manual test of device, click “Manual Test”
button on the Tool Bar Menu of the UI.

• A pop-up window will appear once this button is clicked.

Click “RUN” button to toggle manual test.
 MANUAL TEST OPTIONS
Number of Loop Test a
device will be tested

Select all Site

Deselect all
Force Thru Site

Interrupt
Loop Test
Close
Window

Check or uncheck Loop Testing will

this box to enable or stop if failure is
disable contact site encountered
 DATALOGGING
• To enable datalog window, click “Enable Dat Window”
Button on the Tool Bar Menu of the UI.

• During testing a datacollect output window will appear

showing the datalog of tested devices.
 DATALOGGING
• Sample Datalog Output Window

Test Parameter
Name Low Limit

Site Number Measured

Test Parameter High Limit

Number
 LOT SUMMARY
• Partial Lot Summary
– A Partial summary can be acquired anytime between the
starting and ending of a test lot by clicking on the “Partial
Summary” button located on the UI Tool Bar.
 LOT SUMMARY
• Final Lot Summary and End Lot
– A Final summary is generated and can be printed
automatically when ending a test lot by clicking on the
“End Lot” button in the Lot Management section of the UI.
A copy of the summary is also stored on the local drive in
the C:\Data directory for the “Prod” account.
 UNLOAD TEST PROGRAM
• After completing a test lot, prior to loading a different
test program or closing the ADI Production UI, the
operator is required to properly unload the program
currently loaded into the test system. This can be
accomplished by clicking on the “Unload” bottom on the
UI Tool Bar.
• System Diagnostics
• Safety Orientation Practices

LESSON 3
 SYSTEM CHECKER
• HOW TO OPEN IG-XL MAINTENANCE
• On the standard toolbar:
– Select the test mode (Quick Check, Full Check, or
Performance Check).
– Select the loop count (1, 5, 10, or 20) or enter any number.
 SAFETY ORIENTATION/PRACTICES
• Identify parts and locations that are potentially
hazardous both to the equipment and personnel.
• Never attempt to defeat a switch or interlock in any way.
This includes Main power switch, Test system power
switch and Emergency off (EMO).
• Always observe and read all equipment labels. This
includes mechanical hazard label, electrical Hazard Label
and other cautions, danger and warning labels.