JIS C 1806-1: 2010

Electrical equipment for measurement, control and laboratory use-

EMC requirements - Part 1: General requirements

Preface
This Japanese Industry Standard is prepared based on the 1st edition of IEC 61326-1 published in
2005 adding some modifications in technical aspects to fit for the situation in Japan.
Any dotted underlined words or sentences indicate the items changed from the corresponding
international standard. Refer to the list of changes with interpretation in Attachment JA.

1. Scope
This standard applies to the requirements of immunity and emission for the electromagnetic
compatibility (EMC) of electrical devices operating with less than AC 1000V or DC 1500V power or
battery operated electrical devices or from the circuit being measured. These devices are intended
for use in industrial and non-industrial areas, including the following equipment and computing
equipment:
• Measuring and testing equipment
• Control device
• Laboratory equipment
• Accompanying device which is intended to use with measuring and testing equipment, or
control equipment and laboratory equipment (for example, a device that handles samples)

Calculating equipment which complies with applicable ITE EMC standards, its assemblies and
similar devices that are within the scope of the Information Technology Equipment (ITE), no
additional testing is required to use in a system within the scope of this standard where the
equipment or devices are applicable to the intended electromagnetic environment.
This product group standard takes precedence over common standards.
Note 1: The International Electrotechnical Commission (IEC) defines EMC related standards as
four categories: product standards, product family standards, common standards and
basic standards. (Refer to Clause 6 of IEC Guide 107)
This standard applies to the following equipment:
a) Measuring and testing equipment: Measuring and testing equipment specifies devices that
measure, display or record one or more electrical or non-electrical quantities by electrical
 means, and non-measurement devices such as signal generators, measuring standards,
power supplies and transducers.
b) Control device: A control device controls one or more output quantities to a specific value by
manual setting, local or remote programming, or individual setting values determined from
one or more input variables. Industrial process measurement control (also called IPMC)
equipment consisting devices described below is included:
• Process controller and regulator
• Programmable controller
• Device and system power supply unit (Centralized or individualized)
• Analog or digital indicator and recorder
• Process instrument
• Transducer; positioner; intelligent actuator, etc.
c) Laboratory equipment: Laboratory equipment measures, displays, monitors or analyzes
substances, or devices used to pretreat materials. In vitro diagnostics medical devices (IVD
devices) are included. The equipment may be used outside laboratory. For example,
self-testing in vitro diagnostic medical devices may be used at home.

This standard is applicable to the following equipment:

• Equipment used in residential, commercial and light industrial environments as defined in JIS C
61000-6-1
• Equipment used in the industrial area
• Equipment used in laboratory or test and measurement areas where the electromagnetic
environment is controlled
• Portable test and measurement equipment
Note 2: The corresponding international standards and the symbols representing their degree of
correspondence are shown below:
IEC 61326-1: 2005: Electrical equipment for measurement, control and laboratory
use−EMC requirements−Part 1: General requirements (MOD)
The symbol “MOD”, describing the degree of correspondence, indicates as “being
corrected” based on ISO / IEC Guide 21-1.

2. Normative references
The following constitutes a part of requirements of this standard as being cited. These normative
references apply to the edition of the year described, and subsequent amendments (including
supplements) do not apply.
• JIS C 60050-161: 1997 - IEV terminology for EMC
Note: Supported International Standards - IEC 60050-161:1990，International
Electrotechnical Vocabulary (IEV)−Chapter 161: Electromagnetic compatibility (IDT)
• JIS C 61000-3-2:2005 - Electromagnetic compatibility-Part 3-2: Limit value-Harmonic
current generation limit value (A device whose input current is 20 A or less)
Note: Supported International Standards - IEC 61000-3-2:2000，Electromagnetic
compatibility (EMC)−Part 3-2: Limits− Limits for harmonic current emissions (equipment
input current≦16 A per phase)(MOD)
• JIS C 61000-4-2:1999 - Electromagnetic compatibility Test and measurement
technology-Section 2: Electrostatic Discharge Immunity Test
Note: Supported International Standards - IEC 61000-4-2:2001, Electromagnetic
compatibility (EMC) - Part 4-2: Testing and measurement techniques−Electrostatic
discharge immunity test (IDT)
• JIS C 61000-4-3:2005 - Electromagnetic compatibility Test and measurement
technology-Section 2: Electrostatic Discharge Immunity Test
Note: Supported International Standards IEC 61000-4-3:2002, Electromagnetic
compatibility (EMC) - Part 4-3: Testing and measurement techniques−Radiated,
radio-frequency, electromagnetic field immunity test (IDT)
• JIS C 61000-4-4:2007 - Electromagnetic compatibility -Part 4-4: Test and measurement
technology-Electrical fast transient / Burst immunity test
Note: Supported International Standards - IEC 61000-4-4:2004, Electromagnetic
compatibility (EMC) - Part 4-4: Testing and measurement techniques−Electrical fast
transient/burst immunity test (IDT)
• JIS C 61000-4-5:2009 - Electromagnetic compatibility Part 4-5 Test and Measurement
Technology-Surge Immunity Test
Note: Supported International Standards - IEC 61000-4-5:2001, Electromagnetic
compatibility (EMC) - Part 4-5: Testing and measurement techniques−Surge immunity
test（MOD）
• JIS C 61000-4-6:2006 - Electromagnetic compatibility-Part 4-6 Test and measurement
techniques-Immunity to conducted disturbances induced by radio frequency fields
Note: Supported International Standards - EC 61000-4-6:2003, Electromagnetic
compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to
conducted disturbances, induced by radio-frequency fields (MOD)
• JIS C 61000-4-8: 2003 - Electromagnetic compatibility-Part 4: Testing and measurement
techniques-Section 8: Power frequency magnetic field immunity testing
 Note: Supported International Standards - IEC 61000-4-8:1993, Electromagnetic
compatibility (EMC) - Part 4: Testing and measurement techniques−Section8: Power
frequency magnetic field immunity test and Amendment 1 (2000) (MOD)
• JIS C 61000-4-11: 2008 - Electromagnetic compatibility-part 4-11Test and measurement
techniques-voltage dips, short outages and immunity test for voltage fluctuation
Note: Supported International Standards - IEC 61000-4-11:2004, Electromagnetic
compatibility (EMC) - Part 4-11: Testing and measurement techniques−Voltage dips,
short interruptions and voltage variations immunity tests (IDT).
• JIS C 61000-6-1:2008 - Electromagnetic compatibility-Part 6-1: Common
standards-Immunity in residential, commercial and light industrial environments
Note: Supported International Standards: IEC 61000-6-1:2005, Electromagnetic
compatibility (EMC) - Part 6-2: Generic standards−Immunity for residential, commercial
and light-industrial environments (IDT)
• IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) −Part 4-3: Testing and
measurement techniques - Radiated, radio-frequency, electromagnetic field immunity
test
• CISPR 11:2003, Industrial, scientific and medical (ISM) radio-frequency equipment –
Electromagnetic disturbance characteristics−Limits and methods of measurement